OBC testing systems, methods, apparatuses, devices, and storage media

Abstract

The application provides an OBC test system, method, device, equipment and storage medium, relates to the new energy automobile technical field, solves the problems of poor OBC test flexibility and low test efficiency in the related art, and the measured product is tested through the OBC test system, the flexible automatic test scheme can be provided on the industrial computer, and the corresponding test script is generated to control the OBC test system and drive the measured product, so that the test of the measured product can adapt to different working conditions, the industrial computer controls other equipment in the OBC test system during the test, and automatic test is carried out by using the script, so that the test can be automatically and efficiently carried out, which helps to improve the test efficiency and helps to efficiently complete different OBC test processes.

Description

Technical Field

[0001] This application relates to the field of new energy vehicle technology, and in particular to an OBC testing system, method, apparatus, equipment and storage medium. Background Technology

[0002] With the development of the new energy vehicle industry, the On-Board Charger (OBC) plays a crucial role in power system management, including controlling charging and discharging, DC-DC conversion, and battery management. Therefore, OBC testing is essential. Furthermore, testing standards are continuously updated annually, necessitating corresponding updates to OBC testing methods. However, the inventors have found in practical applications that the industry lacks systematic, automated, and precise testing solutions. Manual testing by testers is required, which incurs significant manpower costs, and each standard update necessitates manual adjustments to the testing procedures, resulting in low efficiency. Alternatively, testing can be conducted on platforms customized for a single standard. However, these platforms are limited in functionality, only adapting to a single standard and failing to flexibly accommodate OBC testing requirements using other standards. This necessitates adjustments to the platform's testing standards or platform replacement each time, further reducing testing efficiency. Summary of the Invention

[0003] This application provides an OBC testing system, method, apparatus, equipment, and storage medium, which solves the problems of poor flexibility and low efficiency in OBC testing in related technologies. This solution can provide a flexible automatic testing scheme, which helps to adapt to testing under different working conditions and can also improve testing efficiency.

[0004] In one aspect, this application provides an OBC testing system, which includes a measuring instrument cabinet, a power load cabinet, and a temperature control cabinet.

[0005] The measuring instrument cabinet includes an industrial control computer, a power measuring instrument, an oscilloscope, and a programmable logic controller. The industrial control computer is connected to the power measuring instrument, the oscilloscope, and the programmable logic controller. The industrial control computer is also connected to a first line panel to transmit and receive signals through the first line panel. The first line panel includes a communication interface for connecting to the product under test.

[0006] The power load cabinet includes a bidirectional AC power supply, a bidirectional DC power supply, a low-voltage load, and a load power supply. The power load cabinet is connected to the bidirectional AC power supply, the bidirectional DC power supply, the low-voltage load, and the load power supply through a second line panel. The second line panel is also connected to the first line panel. The second line panel also includes an input port and an output port, both of which are used to connect to the product under test.

[0007] The temperature control cabinet includes a temperature control box and a water chiller. The temperature control cabinet is connected to the first circuit panel via a third circuit panel, and the temperature control cabinet also includes a water cooling pipe port for connecting to the product under test.

[0008] Secondly, this application also provides an OBC testing method, applied to an industrial control computer in the OBC testing system as described in claim 1, the OBC testing method comprising:

[0009] Run the preset verification script to perform a self-check on the wiring connection between the OBC test system and the product under test;

[0010] Once the line connection is confirmed to be complete, obtain the set of commands configured by the user in the visual interface and the product parameters entered to determine the corresponding test script;

[0011] The test script is invoked, and the OBC test system is controlled to run according to the product parameters through the test script, so as to drive the product under test to charge and discharge and interact with the OBC test system.

[0012] In response to the completion of the OBC testing system, the acquired test data is displayed on the industrial control computer.

[0013] Thirdly, this application also provides an OBC testing device, which is applied to an industrial control computer in the OBC testing system as described in claim 1. The device includes a circuit detection module, a script configuration module, a script execution module, and a data acquisition module.

[0014] The line detection module is configured to run a preset verification script to perform a self-check on the line connection between the OBC test system and the product under test.

[0015] The script configuration module is configured to, upon confirming that the line connection has been completed, obtain the set of commands configured by the user in the visual interface and the product parameters entered, in order to determine the corresponding test script;

[0016] The script execution module is configured to call the test script and control the OBC test system to run according to the product parameters, so as to drive the product under test to charge and discharge and interact with the OBC test system.

[0017] The data acquisition module is configured to display the acquired test data on the industrial control computer in response to the completion of the OBC test system.

[0018] Fourthly, this application also provides an electronic device comprising:

[0019] One or more processors;

[0020] Storage device for storing one or more programs.

[0021] When one or more programs are executed by one or more processors, the one or more processors implement the OBC test method of this application.

[0022] Fifthly, this application also provides a storage medium for storing computer-executable instructions, which, when executed by a processor, are used to execute the OBC testing method of this application.

[0023] This application uses an OBC testing system to test the product under test. The industrial control computer can provide flexible automatic testing schemes and generate corresponding test scripts to control the OBC testing system and drive the product under test, so that the testing of the product under test can adapt to different working conditions. During the testing process, the industrial control computer controls other devices in the OBC testing system and uses scripts to perform automatic testing, so that the testing can be automated and efficient, which helps to improve testing efficiency and help to efficiently complete different OBC testing processes. Attached Figure Description

[0024] Figure 1 This is a schematic diagram of the system structure of an OBC testing system provided in an embodiment of this application;

[0025] Figure 2 This is a schematic diagram of the steps of an OBC testing method provided in an embodiment of this application;

[0026] Figure 3 This is a schematic diagram illustrating the steps involved in generating a test script according to an embodiment of this application.

[0027] Figure 4 This is a schematic diagram illustrating the steps of constructing an XML index according to an embodiment of this application;

[0028] Figure 5 A schematic diagram illustrating the steps of script execution provided in an embodiment of this application;

[0029] Figure 6 This is a schematic diagram of the structure of an OBC testing device provided in an embodiment of this application;

[0030] Figure 7 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0031] The embodiments of this application will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the embodiments of this application and are not intended to limit the scope of this application. Furthermore, it should be noted that, for ease of description, the accompanying drawings only show the parts related to the embodiments of this application, not all structures. Those skilled in the art, after reading this specification, should be able to conceive that any combination of technical features can constitute an optional implementation method, provided that the technical features do not contradict each other.

[0032] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects, not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class, not limited in number; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship. In the description of this application, "multiple" means two or more, and "several" means one or more.

[0033] On-board batteries (OBCs) play a crucial role in power system management, including charging / discharging, DC-DC conversion, and battery management. With the rapid development of the new energy vehicle industry and its short product update cycles, OBC testing is paramount, leading to numerous new and updated testing standards each year, such as GB / T24347-2021, GB / T40432-2021, QC / T1088-2017, and QC / T895-2011. However, the inventors have found a lack of systematic, automated, and precise testing solutions in the industry. Manual testing by personnel is necessary, but this approach incurs significant manpower costs, and each standard update necessitates manual adjustments to the testing procedures, resulting in low efficiency. Alternatively, testing can be conducted on platforms customized for a single standard, but these platforms are limited in functionality, only adapting to a single standard and failing to flexibly accommodate complete OBC testing, further contributing to low efficiency.

[0034] To address this, this application provides an OBC testing system. This system connects to the product under test (OBC) to perform testing on the OBC and interacts with the OBC during the testing process to collect test data from the OBC. For example... Figure 1 As shown, Figure 1This is a schematic diagram of the system structure of an OBC testing system provided in an embodiment of this application. The OBC testing system includes a measuring instrument cabinet 100, a power load cabinet 200, and a temperature control cabinet 300. The measuring instrument cabinet 100, power load cabinet 200, and temperature control cabinet 300 are connected via wiring panels. It can be understood that the measuring instrument cabinet 100, power load cabinet 200, and temperature control cabinet 300 are all connected to their internal components via wiring panels, and are also connected to external devices (such as the product under test, other devices in the OBC testing system, etc.) via wiring panels to achieve electrical and / or communication connections. For ease of distinction, the measuring instrument cabinet 100 is connected to external devices via a first wiring panel 105, the power load cabinet 200 is connected to external devices via a second wiring panel 205, and the temperature control cabinet 300 is connected to external devices via a third wiring panel 303.

[0035] The measuring instrument cabinet 100 includes an industrial control computer 101, a power measuring instrument 102, an oscilloscope 103, and a programmable logic controller (PLC) 104. The industrial control computer 101 is connected to the power measuring instrument 102, oscilloscope 103, and PLC 104, and is also connected to a first line panel 105 for signal transmission and reception. The industrial control computer 101 is used to run the test script to send corresponding control commands to other devices. The power measuring instrument 102 and oscilloscope 103, as testing devices, are used to test the product under test and collect test data. The PLC 104 is used to implement functions such as logic control, sequential control, timing, counting, and arithmetic operations, such as controlling actuators (e.g., relays, motors, valves) to start or stop based on logical judgment results. Furthermore, the first line panel 105 includes a communication interface for connecting to the product under test, enabling the OBC testing system to transmit and receive communication signals with the product under test.

[0036] The power load cabinet 200 includes a bidirectional AC power supply 201, a bidirectional DC power supply 202, a low-voltage load 203, and a load power supply 204. The power load cabinet 200 connects to the bidirectional AC power supply 201, bidirectional DC power supply 202, low-voltage load 203, and load power supply 204 via a second line panel 205. The second line panel 205 is also connected to a first line panel 105. The second line panel 205 includes input ports and output ports, both used for connection to the product under test (DUT). It can be understood that the power load cabinet 200 serves as a device providing power and load to the DUT. The bidirectional AC power supply 201 and bidirectional DC power supply 202 are used to provide power to the DUT according to the power requirements of different testing scenarios, while the low-voltage load 203 and load power supply 204 act as the load side, thus forming a corresponding charging and discharging circuit with the DUT.

[0037] The temperature control cabinet 300 includes a temperature control box 301 and a water-cooled unit 302. The temperature control cabinet 300 also includes a water-cooled pipe port for connecting to the product under test. It can be understood that the temperature control cabinet 300 is used to control the temperature, raising and lowering it to provide a suitable test temperature environment and to dissipate heat from the product under test, facilitating testing. Furthermore, the temperature control cabinet 300 is connected to the first circuit panel 105 via a third circuit panel 303, thereby receiving control signals sent by the industrial control computer 101 through the first circuit panel 105.

[0038] The OBC testing system is used to test the product under test. During the testing process, the industrial control computer controls other devices in the OBC testing system, which enables the testing to be carried out automatically and efficiently, thus helping to improve testing efficiency.

[0039] Figure 2 This is a schematic diagram illustrating the steps of an OBC testing method provided in an embodiment of this application. The OBC testing method is applied to an industrial control computer in the aforementioned OBC testing system. As shown in the figure, the industrial control computer executes the OBC testing method to control the OBC testing process, thereby completing the testing of the product under test. The specific steps include:

[0040] Step S110: Run the preset verification script to perform a self-check on the circuit connection between the OBC test system and the product under test.

[0041] It is conceivable that after the OBC testing system and the product under test (DUT) are connected, in response to the device powering on, the industrial control computer (ICC) can execute a verification script. This script performs a self-check on the connection between the OBC testing system and the DUT. The ICC completes the detection of the connection status by executing the verification script. Understandably, by running the verification script, the ICC can trigger the sending of a detection signal to the corresponding device. The ICC then determines whether the connection is complete by listening to the device's response to the detection signal. For example, regarding the connection between the first and second wiring panels, a specific waveform signal (such as a square wave or sine wave) can be sent, and a feedback signal can be waited for to determine the wiring status.

[0042] Optionally, in one embodiment, the industrial control computer can also continuously run a verification script to detect whether the OBC testing system and the product under test have been properly connected, that is, to realize the automatic detection function.

[0043] Step S120: If the line connection is confirmed to be complete, obtain the set of commands configured by the user in the visual interface and the product parameters entered, so as to determine the corresponding test script.

[0044] To make the testing process more flexible, the industrial control computer provides a visual interface to display the corresponding functional test commands. These commands control the OBC system to execute the appropriate test functions. Several selectable functional test commands allow users to configure a set of commands and construct a test process. Furthermore, relevant product parameters such as voltage and output power can be set by the user, allowing testing to proceed according to these parameters. Additionally, in some embodiments, the industrial control computer may have pre-set test scripts for corresponding national standard tests for user selection. After the user selects the appropriate national standard test, an output window is provided for inputting product parameters, enabling testing to proceed according to the corresponding test script.

[0045] Optionally, in one embodiment, the visual interface displays functional test commands corresponding to a set of functional test commands, a set of exception handling commands, and a set of data processing commands. It is understood that the commands in the functional test command set are used to control the device to perform corresponding test functions. For example, when controlling the device to perform an overvoltage test, there are corresponding commands to gradually adjust the load resistance value according to test requirements (such as the product parameters mentioned above) and detect the voltage at the output port. The commands in the exception handling command set are used to control the device to perform corresponding processing operations when abnormal situations occur. For example, when an abnormal power outage occurs, there are corresponding commands to control the shutdown of the load and the load power supply. Similarly, the commands in the data processing command set are used to control the device to process the collected test data, such as storing the data according to a preset storage path after acquiring the test data.

[0046] Figure 3 This is a schematic diagram illustrating the steps of generating a test script according to an embodiment of this application. Multiple functional test commands are displayed on a visual interface for the user to select, thereby configuring the corresponding test process to generate a test script. The specific steps are as follows:

[0047] Step S210: In response to the user's configuration operation on any functional test command on the visual interface, select the general control command associated with the functional test command from the general control command set.

[0048] Step S220: Based on the selected general control command, determine the device SCPI command associated with the general control command in the basic device command set.

[0049] Step S230: Extract the device SCPI commands as control commands to be configured in the test script, and use the product parameters as test parameters to be set in the test script.

[0050] It is understandable that the functional test commands in the functional test command set, the exception handling command set, and the data processing command set are all related to the general control commands in the general control command set. The test functions to be implemented by each functional test command are achieved by combining several general control commands. For example, for a functional test command that implements overvoltage testing, the associated general control commands include at least commands to adjust the load resistance, commands to detect the voltage at the output port, and commands to control the power output.

[0051] Furthermore, the basic equipment command set includes several device SCPI (Standard Commands for Programmable Instruments) commands. These SCPI commands serve as the fundamental commands for controlling the equipment within the OBC test system. They can directly control the equipment to perform corresponding operations, such as controlling the resistance of low-voltage loads in the power load cabinet, switching between bidirectional AC and bidirectional DC power supplies, etc. Moreover, device SCPI commands are associated with general control commands; by combining several device SCPI commands, the operations required by each general control command can be achieved. It is conceivable that different functional test commands could also be associated with the same general control commands to meet the requirements of implementing some identical operations during the test function process.

[0052] In response, the industrial control computer determines the selected functional test command based on the user's configuration operation on the visual interface. It then selects the associated general control command from the set of general control commands to achieve the desired test function. Furthermore, after determining the general control command, it extracts the associated device SCPI command from the set of basic device commands to perform the corresponding operation. The device SCPI command is then used as the control command to be configured in the test script, and the product parameters are used as the test parameters to be set in the test script, facilitating the construction of the corresponding test script. In other words, the user can select the appropriate functional test command to flexibly configure the test process. From the user's perspective, testing can be automatically started with only simple configuration.

[0053] Therefore, this solution can flexibly configure the test process and provide corresponding test scripts, so that the OBC test system can provide a corresponding test environment, thereby effectively improving the flexibility of OBC testing and helping to better test OBC.

[0054] Step S130: Call the test script and control the OBC test system to run according to the product parameters through the test script, so as to drive the product under test to charge and discharge and interact with the OBC test system.

[0055] By calling scripts, the industrial control computer runs test scripts to control the operation of other devices in the OBC testing system, that is, to run according to product parameters. For example, if the product parameters set the output power type to AC and the voltage to 220V, then the bidirectional AC power supply is called and its output voltage to 220V is controlled accordingly. Therefore, the OBC testing system starts running, establishing a corresponding charge and discharge circuit with the product under test for testing. It can be expected that during the testing process, the OBC testing system and the product under test will also interact with each other based on the test scripts. For example, the industrial control computer can control the product under test or obtain data from the product under test by sending corresponding CAN frame data.

[0056] Step S140: In response to the end of the OBC test system's operation, the acquired test data is displayed on the industrial control computer.

[0057] The OBC testing system operates along with the testing process. When the testing process ends, the OBC testing system stops running, and the test data collected during the testing process is displayed on the industrial control computer, such as on a visual interface.

[0058] As can be seen from the above solutions, the industrial control computer can provide flexible automatic testing solutions and generate corresponding test scripts to control the OBC testing system and drive the product under test, so that the testing of the product under test can adapt to different working conditions. Furthermore, using scripts for automatic testing can improve testing efficiency and help to efficiently complete different OBC testing processes.

[0059] In one embodiment, the industrial control computer has pre-set test scripts corresponding to national standard tests. Accordingly, when the configured functional test command belongs to the test script of the corresponding national standard test, the user can be provided with corresponding configuration guidance, such as displaying the relevant functional test command through a window or highlighting the relevant functional test command. The relevant functional test command is the functional test command in the test script of the corresponding national standard test. Specifically, after determining that the user has configured a functional test command, it is determined whether the currently configured functional test command is associated with any national standard test.

[0060] If it is determined that a functional test command is associated with a national standard test, all functional test commands associated with the national standard test are displayed in another window for user configuration. Optionally, in one embodiment, this window can be displayed as a floating window on the visual interface, thereby showing the user the functional tests contained in the test script corresponding to the national standard test for quick selection.

[0061] Furthermore, after determining the selected functional test command, the system obtains the first association data corresponding to the functional test command and each general control command. This first association data includes the command identifier of the general control command associated with the functional test command. It can be understood that the industrial control computer stores corresponding first association data for each functional test command, recording all general control commands associated with that functional test command. Then, based on the command identifier, the corresponding general control command is selected from the set of general control commands. That is, in the set of general control commands, each general control command is configured with a corresponding command identifier. By searching for the corresponding general control command through the command identifier, the general control command corresponding to the configured functional test command can be determined, which helps to quickly and efficiently configure test scripts and improve testing efficiency.

[0062] In some embodiments, device SCPI commands are stored in the industrial control computer in XML format, and are encapsulated into several basic device command sets. Each basic device command set corresponds to a different device in the OBC testing system. After determining the selected general control command, second association data is obtained between the general control command and each device SCPI command. This second association data includes the XML index of the device SCPI command associated with the general control command. It can be understood that the second association data identifies the association between each device SCPI command and the general control command, and also records the corresponding XML index. Furthermore, based on the XML index, the corresponding device SCPI command is selected from the basic device command sets; that is, the industrial control computer can find the device SCPI command corresponding to the currently selected general control command according to the XML index.

[0063] Figure 4 The figure illustrates the steps for constructing an XML index according to an embodiment of this application. The corresponding XML index is constructed by parsing the XML document of the storage device SCPI command. Specific steps include:

[0064] Step S310: Determine the structural information corresponding to the device SCPI commands by parsing all XML documents that store device SCPI commands.

[0065] Step S320: Based on the preset index type, construct the XML index corresponding to each device SCPI command according to the node relationship recorded in the structure information.

[0066] Understandably, each device in the OBC testing system has its own corresponding XML document to store device SCPI commands. Therefore, all XML documents storing device SCPI commands are parsed to determine the structural information of the device SCPI commands. Different device SCPI commands correspond to different nodes, and the structural information is used to identify the relationships between these nodes. Furthermore, the XML index has pre-defined index types; for example, a structural index is selected. Based on the relationships between nodes recorded in the structural information, an XML index is constructed for each device SCPI command, associating each device SCPI command with its corresponding XML index. Therefore, this solution uses XML indexing to find device SCPI commands, which helps to quickly locate the corresponding commands, thereby efficiently configuring test scripts and improving testing efficiency.

[0067] Optionally, in one embodiment, a path index can be used as the XML index. After parsing the device SCPI commands stored in XML format, such as using DOM parsing or SAX parsing, the path of each node is recorded, where each node corresponds to a different command, to construct the corresponding path index. It should be noted that a structure index can also be constructed as the XML index to facilitate recording the relationships between the device SCPI commands.

[0068] For example, when performing a short-circuit test on the product under test, if the user selects a corresponding short-circuit test functional test command from the functional test command set, data processing command set, and exception handling command set, such as a device initialization command, short-circuit test command, data storage processing command, or abnormal power-off command, the industrial control computer will obtain the corresponding general control command from the general control commands. Taking the short-circuit test command as an example, the selected general control commands will include at least a command to set the short-circuit state, a command to read OBC fault information, and a command to read data from the oscilloscope. Then, the computer will select the device SCPI command associated with the aforementioned general control command from the basic device command set to construct the corresponding test script, thereby performing the OBC test.

[0069] Figure 5 This is a schematic diagram illustrating the steps of script execution according to an embodiment of this application. In one embodiment, an industrial control computer controls the operation of the OBC testing system by executing a test script and interacts with the product under test (DUT) for data exchange. It is conceivable that during the testing process, the OBC testing system and the DUT have already established a circuit connection and formed a corresponding charging and discharging circuit. The OBC testing system then further drives the DUT to charge and discharge. Specific steps include:

[0070] Step S410: Based on the first control instruction output by the test script, control the program logic controller to close the relay switch to complete the boot process and be in a ready state.

[0071] Step S420: In response to the product being tested being in a ready state, control the water chiller to enter the internal and external circulation state according to the temperature, pressure and flow rate in the product parameters.

[0072] Step S430: According to the output voltage and output frequency in the product parameters, turn on the load power supply and the bidirectional AC power supply or bidirectional DC power supply to provide power to the product under test.

[0073] Step S440: If it is determined that the product under test is started, send a second control command corresponding to the functional test command to the product under test so that the product under test can execute the second control command.

[0074] Step S450: Real-time acquisition of test data using a power measuring instrument and oscilloscope. The test data is the data output by the product under test during the execution of the second control command.

[0075] Understandably, during testing, the equipment within the OBC testing system needs to cooperate to provide the necessary testing environment for the product under test (DUT). The industrial control computer (ICC), executing the test script, outputs corresponding control commands to the equipment to drive its actions, such as controlling the programmable logic controller (PLC) to close a relay switch. For example, in one test scenario, the ICC controls the PLC to close the relay switch, enabling the second circuit panel to output a PWM signal to the DUT, allowing it to complete the boot process and enter the ready state. After the DUT is in the ready state, the ICC controls the water chiller to enter internal and external circulation mode. It's conceivable that the parameters of the water chiller during operation are set according to the product parameters; for example, the ICC controls the water chiller based on the temperature, pressure, and flow rate parameters in the product parameters, thereby regulating the temperature of the DUT.

[0076] Furthermore, a power supply needs to be provided to the product under test (DUT). The industrial control computer then activates the power supply equipment according to the output voltage and frequency specified in the product parameters, such as turning on a bidirectional AC or DC power supply, and activating the load power supply, thereby providing a charging and discharging circuit for the DUT. Subsequently, after the DUT is powered on, a second control command corresponding to the functional test command is output and sent to the DUT for execution. It is conceivable that the second control command corresponds to the configured functional test command, enabling the DUT to perform the required operations or provide corresponding data feedback when executing the second control command. Additionally, power measuring instruments and oscilloscopes are activated to acquire test data in real time. This test data, as the output data during the execution of the second control command by the DUT, can be acquired through equipment within the measuring instrument cabinet. For example, in the current-limiting characteristic test of the DUT, the acquired test data includes at least current and power values.

[0077] Figure 6 This is a schematic diagram of the structure of an OBC testing device provided in one embodiment of this application. The device is applied to an industrial control computer in the OBC testing system provided in the above embodiment, and is used to execute the OBC testing method provided in the above embodiment. It possesses corresponding functional modules and beneficial effects for executing the method. As shown in the figure, the device includes a line detection module 401, a script configuration module 402, a script execution module 403, and a data acquisition module 404.

[0078] The line detection module 401 is configured to run a preset verification script to perform a self-check on the line connection between the OBC test system and the product under test.

[0079] The script configuration module 402 is configured to, when it is determined that the line connection has been completed, obtain the set of commands configured by the user in the visual interface and the product parameters entered, so as to determine the corresponding test script;

[0080] The script execution module 403 is configured to call the test script and control the OBC test system to run according to the product parameters through the test script, so as to drive the product under test to charge and discharge and interact with the OBC test system.

[0081] The data acquisition module 404 is configured to display the acquired test data on the industrial control computer in response to the completion of the OBC test system.

[0082] Based on the above embodiments, the visualization interface displays functional test commands corresponding to the functional test command set, exception handling command set, and data processing command set. The script configuration module 402 is specifically configured as follows:

[0083] In response to the user's configuration operation on any functional test command on the visual interface, select the general control command associated with the functional test command from the general control command set;

[0084] Based on the selected general control command, determine the device SCPI command associated with the general control command from the basic device command set;

[0085] Extract the device SCPI commands as control commands to be configured in the test script, and use the product parameters as test parameters to be set in the test script.

[0086] Based on the above embodiments, the script configuration module 402 is specifically configured as follows:

[0087] Determine whether the currently configured functional test commands are associated with any national standard test;

[0088] If it is determined that a functional test command is associated with a national standard test, all functional test commands associated with the national standard test will be displayed in another window for users to configure.

[0089] Obtain the first association data corresponding to the functional test command and each general control command. The first association data includes the command identifier of the general control command associated with the functional test command.

[0090] Based on the command identifier, the corresponding general control command is selected from the set of general control commands.

[0091] Based on the above embodiments, multiple device SCPI commands are stored in XML format on the industrial control computer, and the device SCPI commands are encapsulated into several basic device command sets to correspond to different devices in the OBC testing system. The script configuration module 402 is specifically configured as follows:

[0092] Obtain the second association data corresponding to the general control command and the SCPI command of each device. The second association data includes the XML index of the device SCPI command associated with the general control command.

[0093] Based on the XML index, the corresponding device SCPI command is selected from the basic device command set.

[0094] Based on the above embodiments, the script configuration module 402 is specifically configured as follows:

[0095] By parsing all XML documents that store device SCPI commands, the structural information corresponding to the device SCPI commands is determined;

[0096] Based on the preset index type, an XML index corresponding to each device's SCPI command is constructed according to the relationship between nodes recording the SCPI commands of each device in the structure information.

[0097] Based on the above embodiments, the script execution module 403 is specifically configured as follows:

[0098] Based on the first control instruction output by the test script, the control program logic controller closes the relay switch to complete the boot process and enter the ready state;

[0099] In response to the product being tested being in a ready state, the water chiller is controlled to enter the internal and external circulation state according to the temperature, pressure and flow rate in the product parameters;

[0100] According to the output voltage and output frequency in the product parameters, turn on the load power supply and the bidirectional AC power supply or bidirectional DC power supply to provide power to the product under test.

[0101] Once it is confirmed that the product under test has started, a second control command corresponding to the functional test command is sent to the product under test so that the product under test can execute the control command.

[0102] Test data is acquired in real time using a power measuring instrument and an oscilloscope. The test data is the output data of the product under test during the execution of the second control command.

[0103] It is worth noting that in the embodiments of the above-mentioned device, the modules included are only divided according to functional logic, but are not limited to the above division, as long as the corresponding functions can be achieved; in addition, the specific names of each module are only for easy differentiation and are not used to limit the protection scope of the embodiments of this application.

[0104] Figure 7 This is a schematic diagram of an electronic device provided in an embodiment of this application. The device is used to execute the OBC testing method provided in the above embodiment and has corresponding functional modules and beneficial effects for executing the method. As shown in the figure, the device includes a processor 501, a memory 502, an input device 503, and an output device 504. The number of processors 501 can be one or more; one processor 501 is shown as an example in the figure. The processor 501, memory 502, input device 503, and output device 504 can be connected via a bus or other means; a bus connection is shown as an example in the figure. The memory 502, as a computer-readable storage medium, can be used to store software programs, computer-executable programs, and modules, such as the program instructions / modules corresponding to the OBC testing method in the embodiments of this application. The processor 501 executes various corresponding functional applications and data processing by running the software programs, instructions, and modules stored in the memory 502, thereby implementing the above-mentioned OBC testing method.

[0105] The memory 502 may primarily include a program storage area and a data storage area. The program storage area may store the operating system and applications required for at least one function; the data storage area may store data recorded or created during use. Furthermore, the memory 502 may include high-speed random access memory and non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 502 may further include memory remotely configured relative to the processor 501, which can be connected to the device via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0106] The input device 503 can be used to input corresponding digital or character information to the processor 501, and to generate key signal inputs related to the user settings and function control of the device; the output device 504 can be used to send or display key signal outputs related to the user settings and function control of the device.

[0107] This application also provides a storage medium storing computer-executable instructions, which, when executed by a processor, are used to perform relevant operations in the OBC testing method provided in any embodiment of this application.

[0108] Computer-readable storage media include both permanent and non-permanent, removable and non-removable media, and information storage can be achieved by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.

[0109] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0110] Note that the above description is merely a preferred embodiment and the technical principles employed in this application. Those skilled in the art will understand that this application is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of this application. Therefore, although this application has been described in detail through the above embodiments, this application is not limited to the above embodiments. Many other equivalent embodiments may be included without departing from the concept of this application, and the scope of this application is determined by the scope of the appended claims.

Claims

1. An OBC testing method, characterized in that, An industrial control computer used in an OBC testing system, wherein the OBC testing system includes: A measurement instrument cabinet includes an industrial control computer, a power measuring instrument, an oscilloscope, and a programmable logic controller (PLC). The industrial control computer is connected to the power measuring instrument, the oscilloscope, and the PLC. The industrial control computer is also connected to a first line panel to transmit and receive signals through the first line panel. The first line panel includes a communication interface for connecting to the product under test. A power load cabinet includes a bidirectional AC power supply, a bidirectional DC power supply, a low-voltage load, and a load power supply. The power load cabinet is connected to the bidirectional AC power supply, the bidirectional DC power supply, the low-voltage load, and the load power supply via a second line panel. The second line panel is also connected to the first line panel. The second line panel also includes an input port and an output port, both of which are used to connect to the product under test. A temperature control cabinet, comprising a temperature control box and a water chiller, wherein the temperature control cabinet is connected to the first circuit panel via a third circuit panel, and the temperature control cabinet further comprises a water cooling pipe port for connecting to the product under test. The OBC testing method includes: Run the preset verification script to perform a self-check on the wiring connection between the OBC test system and the product under test; Once the line connection is confirmed to be complete, obtain the set of commands configured by the user in the visual interface and the product parameters entered to determine the corresponding test script; The test script is invoked, and the OBC test system is controlled to run according to the product parameters through the test script, so as to drive the product under test to charge and discharge and interact with the OBC test system. In response to the completion of the OBC testing system, the acquired test data is displayed on the industrial control computer. The visualization interface displays functional test commands corresponding to the functional test command set, exception handling command set, and data processing command set. Once the line connection is confirmed to be complete, the process of obtaining the set of commands configured by the user in the visual interface and the product parameters input to determine the corresponding test script includes: In response to the user's configuration operation on any functional test command on the visual interface, a general control command associated with the functional test command is selected from the general control command set; Based on the selected general control command, determine the device SCPI command associated with the general control command in the basic device command set; Extract the device SCPI commands as control commands to be configured in the test script, and use the product parameters as test parameters to be set in the test script; Furthermore, multiple device SCPI commands are stored in XML format on the industrial control computer, and the device SCPI commands are encapsulated into several basic device command sets to correspond to different devices in the OBC testing system; The step of retrieving the device SCPI command associated with the selected general control command from the basic device command set includes: Obtain the second association data corresponding to the general control command and each of the device SCPI commands, wherein the second association data includes the XML index of the device SCPI command associated with the general control command; Based on the XML index, the corresponding device SCPI command is selected from the basic device command set; And, the acquisition of second association data between the general control command and each of the device SCPI commands, the second association data including the XML index of the device SCPI commands associated with the general control command, including: By parsing all XML documents that store the device's SCPI commands, the structural information corresponding to the device's SCPI commands is determined; Based on the preset index type, an XML index corresponding to each device SCPI command is constructed according to the relationship between nodes recording each device SCPI command in the structure information; And, the step of calling the test script and controlling the OBC test system to run according to the product parameters through the test script to drive the product under test to charge and discharge and interact with the OBC test system includes: Based on the first control instruction output by the test script, the program logic controller is controlled to close the relay switch to complete the boot process and be in a ready state; In response to the product being tested being in a ready state, the water chiller is controlled to enter an internal and external circulation state according to the temperature, pressure and flow rate in the product parameters; According to the output voltage and output frequency in the product parameters, turn on the load power supply and the bidirectional AC power supply or bidirectional DC power supply to provide power to the product under test. When it is determined that the product under test has been started, a second control instruction corresponding to the functional test command is sent to the product under test so that the product under test can execute the second control instruction; The power measuring instrument and the oscilloscope collect test data in real time. The test data is the data output by the product under test during the execution of the second control command.

2. The OBC testing method according to claim 1, characterized in that, The step of responding to a user's configuration operation on any functional test command on the visual interface, selecting a general control command associated with the functional test command from a set of general control commands, includes: Determine whether the currently configured functional test commands are associated with any national standard test; If it is determined that the functional test command is associated with the national standard test, all functional test commands associated with the national standard test will be displayed in another window for the user to configure. Obtain first association data corresponding to the functional test command and each of the general control commands, wherein the first association data includes the command identifier of the general control command associated with the functional test command; Based on the command identifier, the corresponding general control command is selected from the set of general control commands.

3. An OBC testing device, characterized in that, An industrial control computer used in an OBC testing system, wherein the OBC testing system includes: A measurement instrument cabinet includes an industrial control computer, a power measuring instrument, an oscilloscope, and a programmable logic controller (PLC). The industrial control computer is connected to the power measuring instrument, the oscilloscope, and the PLC. The industrial control computer is also connected to a first line panel to transmit and receive signals through the first line panel. The first line panel includes a communication interface for connecting to the product under test. A power load cabinet includes a bidirectional AC power supply, a bidirectional DC power supply, a low-voltage load, and a load power supply. The power load cabinet is connected to the bidirectional AC power supply, the bidirectional DC power supply, the low-voltage load, and the load power supply via a second line panel. The second line panel is also connected to the first line panel. The second line panel also includes an input port and an output port, both of which are used to connect to the product under test. A temperature control cabinet, comprising a temperature control box and a water chiller, wherein the temperature control cabinet is connected to the first circuit panel via a third circuit panel, and the temperature control cabinet further comprises a water cooling pipe port for connecting to the product under test. The OBC testing device includes: The line detection module is configured to run a preset verification script to perform a self-check on the line connection between the OBC test system and the product under test; The script configuration module is configured to, when the line connection is confirmed to be complete, obtain the set of commands configured by the user in the visual interface and the product parameters entered, so as to determine the corresponding test script; The script execution module is configured to call the test script and control the OBC test system to run according to the product parameters through the test script, so as to drive the product under test to charge and discharge and interact with the OBC test system. The data acquisition module is configured to display the acquired test data on the industrial control computer in response to the completion of the OBC test system. The visualization interface displays functional test commands corresponding to the functional test command set, exception handling command set, and data processing command set. The script configuration module is specifically configured as follows: In response to the user's configuration operation on any functional test command on the visual interface, a general control command associated with the functional test command is selected from the general control command set; Based on the selected general control command, determine the device SCPI command associated with the general control command in the basic device command set; Extract the device SCPI commands as control commands to be configured in the test script, and use the product parameters as test parameters to be set in the test script; Furthermore, multiple device SCPI commands are stored in XML format on the industrial control computer, and the device SCPI commands are encapsulated into several basic device command sets to correspond to different devices in the OBC testing system. The script configuration module is also configured as follows: Obtain the second association data corresponding to the general control command and each of the device SCPI commands, wherein the second association data includes the XML index of the device SCPI command associated with the general control command; Based on the XML index, the corresponding device SCPI command is selected from the basic device command set; Furthermore, the script configuration module is also configured as follows: By parsing all XML documents that store the device's SCPI commands, the structural information corresponding to the device's SCPI commands is determined; Based on the preset index type, an XML index corresponding to each device SCPI command is constructed according to the relationship between nodes recording each device SCPI command in the structure information; Furthermore, the script execution module is specifically configured as follows: Based on the first control instruction output by the test script, the program logic controller is controlled to close the relay switch to complete the boot process and be in a ready state; In response to the product being tested being in a ready state, the water chiller is controlled to enter an internal and external circulation state according to the temperature, pressure and flow rate in the product parameters; According to the output voltage and output frequency in the product parameters, turn on the load power supply and the bidirectional AC power supply or bidirectional DC power supply to provide power to the product under test. When it is determined that the product under test has been started, a second control instruction corresponding to the functional test command is sent to the product under test so that the product under test can execute the second control instruction; The power measuring instrument and the oscilloscope collect test data in real time. The test data is the data output by the product under test during the execution of the second control command.

4. An electronic device, characterized in that, include: One or more processors; Storage device for storing one or more programs, when said one or more programs are accessed by said one Or multiple processors may execute such that the one or more processors implement the OBC test method as described in any one of claims 1-2.

5. A storage medium for storing computer-executable instructions, characterized in that, The computer-executable instructions, when executed by a processor, are used to perform the OBC test method as described in any one of claims 1-2.

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