An optical displacement measurement system for high pressure environments

Abstract

The application discloses an optical displacement measurement system for a high-pressure environment, comprising a computer (22), an optical displacement tester (1), a data acquisition card (2), a multimeter (8), a high-voltage amplifier (5) and an operational amplifier (7), wherein the optical displacement tester (1) is provided with a load frame (4), a temperature adjusting part (21) and a pressurizing mechanism (3); the load frame (4) is used for applying radial pressure to a sample; the temperature adjusting part (21) is used for adjusting the environmental temperature of the sample position; and the pressurizing mechanism (3) is used for applying axial pressure to the sample; the application can be used for measuring the axial displacement of a piezoelectric ceramic sample under radial high-pressure environment, and has the characteristics of not being easily affected by the environment and high measurement precision.

Description

Technical Field

[0001] This invention relates to the field of measurement systems, and in particular to an optical displacement measurement system for high-pressure environments. Background Technology

[0002] In recent years, with the continuous development and maturation of piezoelectric materials and theories, various measuring devices for measuring the electromechanical, elastic, and dielectric parameters of piezoelectric ceramics have been developed. However, new displacement measuring devices under high electric field and high pressure environments have not yet been commercially developed. In the process of axial strain measurement of piezoelectric ceramic samples, ferroelectric analyzers are usually used for detection. This is easily affected by factors such as interference from the test environment and signal loss, which may lead to errors in the test results. Data processing is cumbersome, and because there is no pressurization mechanism and the voltage is limited by the power supply, it is impossible to apply pressure and high voltage electric field to the sample, making it difficult to conduct data testing on the sample under high pressure and high voltage electric field environments. Summary of the Invention

[0003] The purpose of this invention is to provide an optical displacement measurement system for high-pressure environments. This invention can be used to measure the axial displacement of piezoelectric ceramic samples under radial high pressure conditions, and features low susceptibility to environmental influences and high measurement accuracy.

[0004] The technical solution of this invention is as follows: An optical displacement measurement system for high-pressure environments, comprising a computer, an optical displacement tester, a data acquisition card, a multimeter, a high-voltage amplifier, and an operational amplifier. The optical displacement tester is equipped with a load frame, a temperature regulating component, and a pressurizing mechanism. The load frame is used to apply radial pressure to the sample; the temperature regulating component is used to regulate the ambient temperature at the sample position; the pressurizing mechanism is used to apply axial pressure to the sample; the high-voltage input terminal of the optical displacement tester is connected to the high-voltage amplifier, and the charge signal output terminal of the optical displacement tester is connected to the operational amplifier; the pressure signal input terminal of the pressurizing mechanism is connected to the multimeter; the data acquisition card is connected to the signal transmission terminals of the computer, multimeter, temperature regulating component, displacement signal output terminal of the optical displacement tester, radial pressure signal transmission terminal of the load frame, signal output terminal of the operational amplifier, and signal input terminal of the high-voltage amplifier.

[0005] In the aforementioned optical displacement measurement system for high-pressure environments, the pressurizing mechanism includes an upper sample holder and a lower sample holder, which are mounted on an optical displacement tester and connected to a multimeter. The top of the optical displacement tester is equipped with a fiber optic displacement sensor connected to a data acquisition card, and the fiber optic displacement sensor has a contact pin located between the upper and lower sample holders. The temperature regulating component includes a crucible mounted on the lower sample holder and corresponding to the contact pin, and a temperature controller connected to the data acquisition card is mounted on the crucible.

[0006] In the aforementioned optical displacement measurement system for high-pressure environments, the optical displacement tester is provided with a high-voltage input interface connected to a contact pin and a high-voltage output interface connected to a crucible. The high-voltage input interface and the high-voltage output interface are connected to a high-voltage amplifier.

[0007] In the aforementioned optical displacement measurement system for high-pressure environments, a reference capacitor connected to an operational amplifier is attached to the contact pin. The reference capacitor is used to store charge in place of the sample.

[0008] In the aforementioned optical displacement measurement system for high-pressure environments, the load frame includes a fixing block disposed on the side of the contact pin, and a piezoelectric actuator, a piezoelectric sensor, and a loading mold are sequentially disposed on the fixing block; the piezoelectric sensor is connected to a data acquisition card.

[0009] In the aforementioned optical displacement measurement system for high-pressure environments, the computer includes a data analysis module and a virtual parameter actuation module. The data analysis module analyzes the received detection data, and the virtual parameter actuation module establishes relationships with the elements in the data analysis module and modifies the parameters within a specified range, thereby driving various simulation analysis methods to calculate and solve for different parameters.

[0010] In the aforementioned optical displacement measurement system for high-pressure environments, the testing method involves placing the sample inside the pressurizing mechanism of the optical displacement tester, adjusting the clamping force of the pressurizing mechanism to keep the multimeter at a fixed value, and using a high-voltage amplifier controlled by a computer via a data acquisition card to amplify the AC current with the received function signal before it enters the optical displacement tester to form an electric field. The load frame, controlled by the computer via the data acquisition card, applies radial pressure to the sample, and a temperature regulator controls the ambient temperature inside the optical displacement tester. During the test, the displacement signal and charge signal of the optical displacement tester are collected and processed by the computer via the data acquisition card.

[0011] Compared with existing technologies, this invention places the sample within the pressurization mechanism of an optical displacement tester during testing. The clamping force of the pressurization mechanism is adjusted to maintain a fixed multimeter reading. A high-voltage amplifier, controlled by a computer via a data acquisition card, amplifies the AC current using a received function signal before it enters the optical displacement tester to form an electric field. A load frame, also controlled by the computer via the data acquisition card, applies radial pressure to the sample. A temperature regulator controls the ambient temperature within the optical displacement tester. During testing, the displacement and charge signals from the optical displacement tester are collected and processed by the computer via the data acquisition card. A high-pressure testing environment is obtained by applying axial pressure to the sample through the pressurization mechanism, and a high-voltage electric field testing environment is obtained through the high-voltage amplifier. This allows for data testing under both high-pressure and high-voltage electric field environments. The pressurization mechanism, temperature regulator, and high-voltage amplifier are all computer-controlled, enabling accurate control of test variables and reducing susceptibility to environmental influences. Simultaneously, the operational amplifier improves signal quality reliability, thereby enhancing measurement accuracy. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the structure of the present invention;

[0013] Figure 2 This is a schematic diagram of the optical displacement tester of the present invention;

[0014] Figure 3 This is a schematic diagram of the load frame structure of the present invention.

[0015] The labels in the attached diagram are as follows: 1-Optical displacement tester; 2-Data acquisition card; 3-Pressure mechanism; 4-Load frame; 5-High voltage amplifier; 6-Temperature controller; 7-Operational amplifier; 8-Multimeter; 9-Upper sample holder; 10-Lower sample holder; 11-Fiber optic displacement sensor; 12-Contact pin; 13-Crucible; 14-High voltage input interface; 15-High voltage output interface; 16-Reference capacitor; 17-Fixed block; 18-Piezoelectric actuator; 19-Piezoelectric sensor; 20-Loading mold; 21-Temperature regulator; 22-Computer. Detailed Implementation

[0016] The present invention will be further described below with reference to the accompanying drawings and embodiments, but this should not be construed as limiting the present invention.

[0017] Example: An optical displacement measurement system for high-pressure environments, as shown in the attached figure. Figure 1 and attached Figure 2As shown, the system includes a computer 22, an optical displacement tester 1, a data acquisition card 2, a multimeter 8, a high-voltage amplifier 5, and an operational amplifier 7. The optical displacement tester 1 is equipped with a load frame 4, a temperature regulating component 21, and a pressurizing mechanism 3. The load frame 4 is used to apply radial pressure to the sample. The temperature regulating component 21 is used to regulate the ambient temperature at the sample position. The pressurizing mechanism 3 is used to apply axial pressure to the sample. The high-voltage input terminal of the optical displacement tester 1 is connected to the high-voltage amplifier 5, and the charge signal output terminal of the optical displacement tester 1 is connected to the operational amplifier 7. The pressure signal input terminal of the pressurizing mechanism 3 is connected to the multimeter 8. The data acquisition card 2 is connected to the signal transmission terminals of the computer 22, the multimeter 8, the temperature regulating component 21, the displacement signal output terminal of the optical displacement tester 1, the radial pressure signal transmission terminal of the load frame 4, the signal output terminal of the operational amplifier 7, and the signal input terminal of the high-voltage amplifier 5. The pressurizing mechanism 3 includes an upper sample clamping component 9, which is mounted vertically on the optical displacement tester 1 and connected to the multimeter 8. The upper sample holder 9 and the lower sample holder 10 are connected to an optical displacement tester via a motor. The motor provides axial pressure and is connected to a multimeter. A fiber optic displacement sensor 11, connected to a data acquisition card 2, is fixedly connected to the top of the optical displacement tester 1. A contact pin 12, located between the upper sample holder 9 and the lower sample holder 10, is fixedly connected to the fiber optic displacement sensor 11. The contact pin generates an electric field. The temperature regulating component includes a crucible 13, located on the lower sample holder 10 and corresponding to the contact pin 12. A temperature controller 6, connected to the data acquisition card 2, is connected to the crucible 13. The crucible and the contact pin together clamp the sample. The crucible is an electrically heated crucible capable of self-heating. The optical displacement tester 1 has a high-voltage input interface 14 connected to the contact pin 12 and a high-voltage output interface 15 connected to the crucible 13. The high-voltage input interface 14 and the high-voltage output interface 15 are connected to a high-voltage amplifier 5. A reference capacitor 16, connected to an operational amplifier 7, is connected to the contact pin 12. The reference capacitor 16 is used to store charge instead of the sample. (See attached...) Figure 3 As shown, the load frame 4 includes a fixing block 17 disposed on the side of the contact pin 12. A piezoelectric actuator 18, a piezoelectric sensor 19, and a loading mold 20 are sequentially disposed on the fixing block 17. The piezoelectric actuator controls the mechanical stress, and the piezoelectric sensor detects the mechanical stress. The piezoelectric sensor 19 is connected to the data acquisition card 2. The computer includes a data analysis module and a virtual parameter actuation module. The data analysis module analyzes the received detection data through LabVIEW. The virtual parameter actuation module is used to establish relationships with each element in the data analysis module and change the parameters within a specified range, thereby driving various simulation analysis methods to calculate and solve for different parameters.

[0018] Working principle: The sample is placed between the bottom electrical contact and the spring-loaded and electrically isolated pins on the contact pin inside the crucible. The clamping force of the pressurizing mechanism is adjusted to keep the multimeter at a fixed value. The high-voltage amplifier is controlled by the computer via the data acquisition card. The received function signal amplifies the AC current with a gain of 1000 and then enters the optical displacement tester to form an electric field. The load frame is controlled by the computer via the data acquisition card to apply radial pressure to the sample. The temperature regulator controls the ambient temperature inside the optical displacement tester. During the test, the displacement signal and charge signal of the optical displacement tester are entered into the computer via the data acquisition card for aggregation and processing.

[0019] The above embodiments merely illustrate implementation methods of the present invention, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. Furthermore, in these embodiments, "up," "down," "left," "right," "front," and "back" represent relative positions only, not absolute positions. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention patent should be determined by the appended claims.

Claims

1. An optical displacement measurement system for high-pressure environments, comprising a computer (22), an optical displacement tester (1), a data acquisition card (2), a multimeter (8), a high-voltage amplifier (5), and an operational amplifier (7), characterized in that: The optical displacement tester (1) is equipped with a load frame (4), a temperature regulating component (21), and a pressurizing mechanism (3); the load frame (4) is used to apply radial pressure to the sample; the temperature regulating component (21) is used to regulate the ambient temperature of the sample position; the pressurizing mechanism (3) is used to apply axial pressure to the sample; the high-voltage input interface (14) and the high-voltage output interface (15) of the optical displacement tester (1) are connected to the high-voltage amplifier (5), and the charge signal output terminal of the optical displacement tester (1) is connected to the operational amplifier (7); the pressure signal input terminal of the pressurizing mechanism (3) is connected to the multimeter (8); the data acquisition card (2) is connected to the signal transmission terminals of the computer (22), the multimeter (8), the temperature regulating component (21), the displacement signal output terminal of the optical displacement tester (1), the radial pressure signal transmission terminal of the load frame (4), the signal output terminal of the operational amplifier (7), and the signal input terminal of the high-voltage amplifier (5).

2. The optical displacement measurement system for high-pressure environments according to claim 1, characterized in that: The pressurizing mechanism (3) includes an upper sample holder (9) and a lower sample holder (10) which are set on the optical displacement tester (1) and connected to the multimeter (8). The top of the optical displacement tester (1) is provided with an optical fiber displacement sensor (11) connected to the data acquisition card (2). The optical fiber displacement sensor (11) is provided with a contact pin (12) located between the upper sample holder (9) and the lower sample holder (10). The temperature regulating component includes a crucible (13) set on the lower sample holder (10) and corresponding to the contact pin (12). A temperature controller (6) connected to the data acquisition card (2) is connected to the crucible (13).

3. The optical displacement measurement system for high-pressure environments according to claim 2, characterized in that: The high-voltage input interface (14) is connected to the contact pin (12), and the high-voltage output interface (15) is connected to the crucible (13).

4. The optical displacement measurement system for high-pressure environments according to claim 2, characterized in that: A reference capacitor (16) connected to the operational amplifier (7) is connected to the contact pin (12). The reference capacitor (16) is used to store charge in place of the sample.

5. The optical displacement measurement system for high-pressure environments according to claim 2, characterized in that: The load frame (4) includes a fixing block (17) disposed on the side of the contact pin (12), and a piezoelectric actuator (18), a loading mold (20) and a piezoelectric sensor (19) are disposed on the fixing block (17) in sequence; the piezoelectric sensor (19) is connected to the data acquisition card (2).

6. The optical displacement measurement system for high-pressure environments according to any one of claims 1-5, characterized in that: The testing method for an optical displacement measurement system used in high-pressure environments involves placing the sample inside the pressurization mechanism of the optical displacement tester. The clamping force of the pressurization mechanism is adjusted to keep the multimeter reading at a fixed value. A high-voltage amplifier, controlled by a computer via a data acquisition card, amplifies the AC current using the received function signal before it enters the optical displacement tester to form an electric field. The load frame, also controlled by the computer via the data acquisition card, applies radial pressure to the sample. A temperature regulator controls the ambient temperature inside the optical displacement tester. During the test, the displacement and charge signals from the optical displacement tester are collected and processed by the computer via the data acquisition card.

Images