Research and test system and method suitable for various high-resistance materials and devices

Abstract

The invention discloses a research and test system and method suitable for various high-resistance materials and devices, and the system comprises a setting module which is used for setting test parameters and filtering parameters; the test starting and stopping module is used for starting or stopping the test; the data acquisition module comprises a high-resistance meter / electrometer and a high-speed universal meter / data acquisition card; the filtering module is used for filtering the data acquired by the data acquisition module according to the filtering parameters; the test data display module is used for displaying the acquired data in a dynamic waveform curve form in real time; the data storage module is used for storing the data acquired by the data acquisition module and the filtering data of the filtering module in real time; and the report output module is used for generating and outputting a data test report. According to the invention, the defects of the existing testing technology in the aspects of testing micro current and power signals, testing real-time data recording and abnormal signal capturing for a long time, dynamically and visually presenting data and the like are effectively overcome.

Description

Technical Field

[0001] The present invention relates to the technical field of high-resistance material and device testing, and in particular to a system and method for researching and testing a variety of high-resistance materials and devices. Background Art

[0002] With the rapid development of nanomaterial technology, the application of high-resistance materials such as zinc oxide nanowires in the field of energy conversion has become increasingly widespread. Due to their unique physical and chemical properties, these materials have shown great potential in the research of devices such as triboelectric nanogenerators. As an important device in the field of nanopower generation, triboelectric nanogenerators convert mechanical energy into electrical energy, providing new energy solutions for fields such as microelectronic devices and wireless sensor networks. However, existing testing technologies have the following difficulties in testing high-resistance materials and devices: 1. Difficulty in accurately testing tiny current and power signals: The electrical signals generated by high-resistance materials are often very weak, with voltages as low as millivolts, currents as low as nanoamperes, and power as low as microwatts. These weak signals are easily interfered with by environmental noise during transmission and acquisition, resulting in inaccurate test results. Traditional test instruments have limited anti-interference capabilities, making it difficult to achieve high-precision acquisition and unable to meet the needs of weak signal testing of high-resistance materials. 2. Lack of real-time data recording and abnormal signal capture capabilities during long-term testing: Long-term testing is essential for the research of devices such as nanogenerators. However, existing testing technologies often lack the ability to record data in real time and capture abnormal signals. This results in an inability to detect and address abnormalities during testing, affecting the accuracy and reliability of test results.

[0003] 3. Data presentation is limited and lacks dynamic visualization: Existing testing technologies often present data in a limited format, primarily displaying test results in numerical or tabular form. This lacks intuitiveness and dynamism, making it difficult to directly reflect signal trends and characteristics. This requires researchers to spend considerable time and effort analyzing and interpreting this data, reducing both efficiency and accuracy. Summary of the Invention

[0004] The purpose of the present invention is to provide a testing system and method suitable for the research of various high-resistance materials and devices, so as to address the shortcomings of existing testing technologies in testing small current and power signals, long-term testing, real-time data recording and abnormal signal capture, and dynamic visualization of data.

[0005] The technical solution of the present invention is as follows: In one aspect, the present invention provides a system for researching and testing a variety of high-resistance materials and devices, comprising: Setting module, used to set test parameters and filtering parameters; Test start and stop module, used to start or stop the test; A data acquisition module, comprising a high resistance meter / electrostat and a high-speed multimeter / data acquisition card, wherein the high resistance meter / electrostat is used to acquire data of the object under test according to the test parameters, and the high-speed multimeter / data acquisition card is used to cooperate with the high resistance meter / electrostat to acquire data of the object under test at high speed according to the test parameters; A filtering module, configured to filter the data collected by the data collection module according to the filtering parameters; Test data display module, used to present the collected data in real time in the form of dynamic waveform curves; A data storage module, used for storing the data collected by the data collection module and the filtered data of the filtering module in real time; Report output module, used to generate and output data test reports.

[0006] As a preferred solution of the present invention, the setting module includes: A parameter setting module is used to set the test parameters and the filtering parameters. The test parameters include test time, test mode, range, display accuracy, NPLC value, whether to enable the high-speed multimeter / data acquisition card, whether to enable mathematical operations, whether to enable relative values, and upper and lower data limits. The test modes include DC voltage test, DC current test, charge test, and material resistance test. The filtering parameters include whether to enable the filtering module. Reset the module to initialize the test.

[0007] As a preferred solution of the present invention, the report output module outputs a custom data test report in PDF format based on the test data and pictures selected by the user.

[0008] As a preferred embodiment of the present invention, it also includes: The waveform auxiliary tool module is used to customize the color and curve style of the waveform curve.

[0009] As a preferred embodiment of the present invention, it also includes: The cursor measurement module is used to observe the change in the performance index of the device in a certain period of time, including at least one of the interval value, maximum value, minimum value and average value.

[0010] As a preferred embodiment of the present invention, it also includes: The video recording module is used to record the dynamic waveform curve displayed by the test data display module.

[0011] As a preferred embodiment of the present invention, it also includes: The configuration retention module is used for users to configure and store several new test parameter templates, and to apply or delete configured test parameter templates.

[0012] As a preferred embodiment of the present invention, it also includes: The historical data viewing module is used for allowing users to view and analyze the data stored in the data storage module.

[0013] As a preferred solution of the present invention, the filtering module includes a digital filter and a median filter, and the digital filter and the median filter respectively perform filtering processing on the data collected by the data collection module according to the corresponding filtering parameters.

[0014] In another aspect, the present invention provides a method for researching and testing various high-resistance materials and devices, which is applied to the system for researching and testing various high-resistance materials and devices described in any of the above solutions, comprising: Connect the object under test to the data acquisition module; Set the test parameters and filter parameters through the setting module; Start testing through the test module; The data acquisition module collects data from the object under test according to the test parameters; The filtering module performs filtering processing on the data collected by the data collection module according to the filtering parameters; The collected data is presented in real time in the form of dynamic waveform curves through the test data display module; The data collected by the data collection module and the filtered data of the filtering module are stored in real time through the data storage module.

[0015] Compared with the prior art, the present invention has the following beneficial effects: 1. The high input impedance and wide range design of the high resistance meter / electrometer in the data acquisition module can directly match weak signals such as millivolt voltage, nanoampere current, and microwatt power generated by high-resistance materials. Combined with the filtering module to suppress environmental noise, the accuracy of signal acquisition is significantly improved, solving the problem of insufficient anti-interference ability of traditional instruments. 2. The high-speed multimeter / data acquisition card (high sampling frequency) in the data acquisition module is linked with the test data display module to achieve real-time data acquisition and dynamic waveform updates. Combined with the real-time recording function of the data storage module, transient abnormal signals (such as sudden noise and signal jumps) during the test process can be discovered in a timely manner, solving the problem of missed abnormal signal detection during long-term testing. 3. The test data display module converts data into dynamic waveform curves to intuitively present signal change trends (such as periodic fluctuations and attenuation characteristics). Combined with the historical data backtracking of the data storage module and the comprehensive report generation capabilities of the report output module, it significantly reduces researchers' data interpretation time and improves analysis efficiency and accuracy. 4. Supports multiple test modes such as DC voltage, current, charge, and resistance, covering the main test scenarios of high-resistance materials in devices such as friction nanogenerators. By setting the module, the range, filtering parameters, display accuracy, etc. can be flexibly adjusted to adapt to different material properties and test requirements, enhancing the versatility of the system. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 This is a structural block diagram of a system for researching and testing various high-resistance materials and devices according to an embodiment of the present invention; Figure 2 This is a structural block diagram of a system for researching and testing various high-resistance materials and devices according to another embodiment of the present invention; Figure 3 This is a flow chart of a research and testing method applicable to various high-resistance materials and devices in one embodiment of the present invention; Figure 4 This is a structural block diagram of a test device suitable for researching and testing various high-resistance materials and devices in one embodiment of the present invention. DETAILED DESCRIPTION

[0018] To make the technical problems, technical solutions, and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be noted that similar reference numerals and letters represent similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings. It should also be noted that the embodiments described below are intended only to illustrate the present invention and are not intended to limit the present invention.

[0019] It should be noted that the terms "including" and "having" and any variations thereof in the specification and claims of the present invention are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to the process, method, product, or apparatus.

[0020] See also Figure 1 This embodiment provides a research and testing system suitable for a variety of high-resistance materials and devices, including a setting module 1, a test start and stop module 2, a data acquisition module 3, a filtering module 4, a test data display module 5, a data storage module 6 and a report output module 7.

[0021] Setup Module 1 is used to set test and filtering parameters. Test parameters include test time, test mode, range, display accuracy, NPLC value, whether the high-speed multimeter / data acquisition card is enabled, whether math operations are enabled, whether relative values ​​are enabled, and upper and lower data limits. Test modes include DC voltage, DC current, charge, and material resistance. DC voltage / current testing is suitable for device electrical performance analysis, charge testing is suitable for monitoring triboelectric charging processes, and material resistance testing supports high-resistance characterization, covering the full range of high-resistance material research. These four test modes provide different insights into material properties and achieve experimental objectives. The DC voltage test has a voltage range of 1µV to 200V, the DC current test has a current range of 10aA to 20mA, and the charge test has a charge range of 1fC to 2µC. Filtering parameters include whether filter module 4 is enabled. By setting parameters such as test time, range, and NPLC value (integration time), you can optimize the acquisition strategy for different material signal strengths. For example, the low-range mode is used for nanoampere current testing, while a high NPLC value reduces AC noise interference. By enabling filter module 4, mathematical operations (such as mean filtering), and relative value mode, you can pre-correct the signal before acquisition to further improve the quality of the raw data.

[0022] The test start and stop module 2 is used to start or stop the test.

[0023] Data acquisition module 3 includes a high-resistance meter / electrometer and a high-speed multimeter / data acquisition card. The high-resistance meter / electrometer is used to collect data from the DUT based on test parameters, such as voltage, current, charge, and impedance. The high-speed multimeter / data acquisition card works with the high-resistance meter / electrometer to quickly acquire data based on test parameters. The high-resistance meter / electrometer has an input impedance of 200 TΩ and supports voltage measurements from 1 μV to 200 V, current measurements from 10 aA to 20 mA, and charge measurements from 1 fC to 2 μC. The high-speed multimeter / data acquisition card has a sampling rate of 2 M / s, enabling real-time tracking of transient signals (such as the pulsed power generation process of a triboelectric nanogenerator), addressing the signal distortion issues often associated with traditional instruments due to their limited sampling rate.

[0024] The filtering module 4 is used to filter the data collected by the data collection module 3 according to the filtering parameters to filter out noise and interference signals in the data, so as to improve the test accuracy.

[0025] The test data display module 5 is used to present the collected data in real time in the form of dynamic waveform curves, such as the instantaneous curve of current IT, the instantaneous curve of voltage VT, the instantaneous curve of charge CT and the instantaneous curve of impedance RT, etc., and to display the maximum and minimum values ​​of the data in real time.

[0026] The data storage module 6 is used to store the data collected by the data collection module 3 and the filtered data of the filtering module 4 in real time, and to set a path for data storage.

[0027] The report output module 7 is used to integrate test parameters, waveforms, and statistical data (such as average value, standard deviation, maximum value, and minimum value) to generate and output data test reports, reducing manual sorting time and improving the efficiency of results delivery.

[0028] This embodiment is applicable to a variety of high-resistance materials and devices research and testing system. Through the high input impedance and wide range design of the high resistance meter / electrometer in the data acquisition module 3, it can directly match the weak signals such as millivolt voltage, nanoampere current, and microwatt power generated by the high-resistance material. Combined with the filter module 4 to suppress environmental noise, the accuracy of signal acquisition is significantly improved, and the problem of insufficient anti-interference ability of traditional instruments is solved. Through the high-speed multimeter / The data acquisition card (high sampling frequency) is linked to the test data display module 5 to realize real-time data acquisition and dynamic waveform updating. In conjunction with the real-time recording function of the data storage module 6, transient abnormal signals (such as sudden noise and signal jumps) in the test process can be discovered in time, solving the problem of missed detection of abnormal signals in long-term tests. The test data display module 5 converts data into dynamic waveform curves to intuitively present signal change trends (such as periodic fluctuations and attenuation characteristics). Combined with the historical data backtracking of the data storage module 6 and the comprehensive report generation capability of the report output module 7, the data interpretation time of researchers is greatly reduced, and the analysis efficiency and accuracy are improved. It supports multiple test modes such as DC voltage, current, charge, and resistance, covering the main test scenarios of high-resistance materials in devices such as friction nanogenerators, and the range, filtering parameters, display accuracy, etc. can be flexibly adjusted through the setting module 1 to adapt to different material properties and test requirements, thereby enhancing the versatility of the system.

[0029] In one embodiment, the setup module 1 includes a parameter setup module and a reset module. The parameter setup module is used to set test parameters and filter parameters. The reset module is used to initialize the test, restore the system default configuration, prevent residual parameters from interfering with the new test, and ensure consistency of the initial test conditions.

[0030] In one embodiment, filtering module 4 includes a digital filter and a median filter. Each filter filters the data collected by data acquisition module 3 according to corresponding filtering parameters. Depending on different filtering requirements, users can select only one of the digital filter and the median filter to filter the collected data during testing, or they can select both filters to filter the collected data during testing, enabling flexible adaptation to various noise scenarios. Digital filters (such as low-pass and high-pass filters) target periodic noise (such as 50Hz power frequency interference) by filtering out interference in specific frequency bands through frequency domain analysis, making them suitable for scenarios with stable noise sources. For example, in a laboratory environment, a digital low-pass filter can effectively attenuate high-frequency electromagnetic noise while preserving the low-frequency characteristics of nanoampere current signals. A median filter is highly robust against random pulse noise (such as transient spikes). By using a sorting and median algorithm, it can eliminate outliers without blurring signal edges. For example, in testing pulse signals from a triboelectric nanogenerator, median filtering can preserve pulse peaks while smoothing out glitches, avoiding the signal amplitude attenuation caused by traditional mean filtering.

[0031] In one embodiment, the report output module 7 outputs a customized data test report in PDF format or other formats based on the test data selected by the user (such as the voltage curve in a specific time period, comparison data before and after filtering) and pictures (such as waveform screenshots, device micrographs), focusing on the research focus.

[0032] See also Figure 2 In one embodiment, the system for researching and testing various high-resistance materials and devices further includes a waveform assistant module 8 for customizing the color and style of waveform curves. This module allows users to assign unique colors (e.g., voltage - blue, current - red) and styles (e.g., solid line, dashed line) to different tests, thereby better distinguishing or highlighting the waveform curves of a particular test.

[0033] See also Figure 2 In one embodiment, the research and testing system for various high-resistance materials and devices also includes a cursor measurement module 9 for observing the numerical changes in the device's performance indicators over a specific time period, including at least one of an interval value, a maximum value, a minimum value, and an average value. This allows for more precise and detailed testing and improves the accuracy and reliability of data analysis. For example, by measuring the maximum and minimum voltage values ​​within a specific time period, the voltage fluctuation range can be understood and the stability of the device can be determined. By calculating the average value, the average level of the performance indicator within that time period can be obtained, providing basic data for further analysis.

[0034] See also Figure 2In one embodiment, the system for researching and testing various high-resistance materials and devices further includes a video recording module 10 for recording the dynamic waveform curve displayed by the test data display module 5. This module can record the signal changes during the test in a video format, making it convenient for researchers to review and analyze the changes at any time.

[0035] See also Figure 2 In one embodiment, the research and testing system applicable to a variety of high-resistance materials and devices also includes: a configuration maintenance module 11, which is used for users to configure and store a number of new test parameter templates, and to apply or delete configured test parameter templates. In actual testing, it is often necessary to test different types of high-resistance materials and devices. If the test parameters need to be reset for each test, this is not only a waste of time but also prone to errors. By maintaining the configuration module 11, users can save commonly used test parameters as templates and directly apply them the next time they test, greatly improving test efficiency. At the same time, this module also facilitates users to manage test parameters. Users can delete test parameter templates that are no longer used at any time as needed to keep the parameter settings neat and orderly.

[0036] See also Figure 2 In one embodiment, the research and testing system for various high-resistance materials and devices further includes a historical data viewing module 12 for allowing users to view and analyze data stored in the data storage module 6. During the research process of high-resistance materials and devices, a large amount of test data is generated, and this data contains a wealth of information. Through the historical data viewing module 12, researchers can conduct in-depth research on this data, discovering correlations and patterns between the data, and providing new ideas and methods for optimizing materials and devices. For long-term research projects, the historical data viewing module 12 can help researchers track performance trends of materials and devices and evaluate the impact of different factors on performance.

[0037] See also Figure 2 In one embodiment, the system for researching and testing various high-resistance materials and devices further includes a remote control module 13 for connecting to a remote control terminal via the internet to enable remote control testing. Remote control module 13 allows users to perform testing operations at any time and from any location, regardless of geographic location. For example, researchers can use the remote control terminal to start or stop tests and view test data from their home or office, greatly improving the convenience and flexibility of testing and facilitating user testing at any time and from any location.

[0038] See also Figure 3 In one embodiment, the present invention provides a method for researching and testing various high-resistance materials and devices, and a system for researching and testing various high-resistance materials and devices applicable to any of the above embodiments, including: Step S1, connecting the object to be tested to the data acquisition module 3; Step S2: setting test parameters and filtering parameters through setting module 1; Step S3: Start the test through the test module; Step S4: the data acquisition module 3 collects data on the object under test according to the test parameters; Step S5: The filtering module 4 performs filtering processing on the data collected by the data collection module 3 according to the filtering parameters to filter out noise and interference signals in the data; Step S6: The test data display module 5 presents the collected data in real time in the form of a dynamic waveform curve; Step S7 : The data storage module 6 stores the data collected by the data collection module 3 and the filtered data by the filtering module 4 in real time.

[0039] This embodiment is applicable to a variety of high-resistance materials and devices research and testing methods, providing a standardized operating process for testing high-resistance materials and devices. From connecting the object under test to the data acquisition module 3, to setting test parameters and filtering parameters, to initiating the test, data acquisition, filtering processing, data presentation, and data storage, each step has clear definitions and operational requirements, ensuring the standardization and repeatability of the test process. This testing method, through standardized processes, reduces test differences caused by different operators, reduces the impact of human error on test results, and improves the reliability and consistency of test results.

[0040] See also Figure 4 In one embodiment, the present invention provides a research and testing device for various high-resistance materials and devices, including a housing 14, a PC 15 is provided at the front end of the housing 14, a data acquisition module 3 connected to the PC 15 is provided inside the housing 14, and the PC 15 includes at least one processing unit 16 and at least one storage unit 17. The storage unit 17 stores program code, and when the program code is executed by the processing unit 16, the processing unit 16 executes the steps of the research and testing method for various high-resistance materials and devices according to the above exemplary embodiment of the present invention described above in this specification. For example, the processing unit 16 can execute the following steps: Figure 3 The data acquisition module 3 includes a high resistance meter / electrostat 301 and a high-speed multimeter / data acquisition card 302.

[0041] In this example, by integrating PC 15, data acquisition module 3, and other components within housing 14, a compact test device is formed. This makes the device easy to carry and move, facilitating testing and research of high-resistance materials and devices in various laboratories or workspaces. This also reduces the complexity and number of external connection lines, lowering the risk of test failures caused by improper or loose connections, and improving the stability and reliability of the device.

[0042] Furthermore, PC15 is connected to the high resistance meter / electrometer 301 through the GPIB / RS232 interface 18, and PC15 is connected to the high-speed multimeter / data acquisition card 302 through the USB / LAN interface 19. The high resistance meter / electrometer 301 is also connected to the high-speed multimeter / data acquisition card 302. The shell 14 is provided with a test interface 20, a power extension interface 21, a LAN extension interface 22 and several USB extension interfaces 23. The test interface 20 is respectively connected to the high resistance meter / electrometer 301 and the test lead 24 for connecting to the object to be measured. The PC15 is provided with a power interface 25 connected to the power extension interface 21, a LAN interface 26 connected to the LAN extension interface 22 and several USB interfaces 27 connected to the corresponding USB extension interfaces 23.

[0043] In this embodiment, the housing 14 is provided with a test interface 20, a power extension interface 21, a LAN extension interface 22, and several USB extension interfaces 23, and corresponding interfaces are provided on the PC 15 to connect to these interfaces, making it easier for users to connect and operate the device. For example, the test interface 20 directly connects to the megohmmeter / electrometer 301 and the test leads 24 used to connect to the device under test, allowing the device to be quickly and accurately connected to the test system. The power extension interface 21, LAN extension interface 22, and USB extension interface 23 facilitate the connection of the device to external power sources, networks, and other external devices to meet different testing needs.

[0044] It should be understood that those skilled in the art can make improvements or changes based on the above description, and all such improvements and changes should fall within the scope of protection of the appended claims of the present invention.

[0045] The above is an exemplary description of the patent of the present invention in conjunction with the accompanying drawings. It is obvious that the implementation of the patent of the present invention is not limited to the above-mentioned method. As long as various improvements are made by adopting the method concept and technical solution of the patent of the present invention, or the concept and technical solution of the patent of the present invention are directly applied to other occasions without improvement, they are all within the scope of protection of the present invention.

Claims

1. A research and testing system suitable for a variety of high-resistance materials and devices, characterized in that: include: Setting module, used to set test parameters and filtering parameters; Test start and stop module, used to start or stop the test; A data acquisition module, comprising a high resistance meter / electrostat and a high-speed multimeter / data acquisition card, wherein the high resistance meter / electrostat is used to acquire data of the object under test according to the test parameters, and the high-speed multimeter / data acquisition card is used to cooperate with the high resistance meter / electrostat to acquire data of the object under test at high speed according to the test parameters; A filtering module, configured to filter the data collected by the data collection module according to the filtering parameters; Test data display module, used to present the collected data in real time in the form of dynamic waveform curves; A data storage module, used for storing the data collected by the data collection module and the filtered data of the filtering module in real time; Report output module, used to generate and output data test reports.

2. The system for researching and testing various high-resistance materials and devices according to claim 1, characterized in that: The setting module includes: A parameter setting module is used to set the test parameters and the filtering parameters. The test parameters include test time, test mode, range, display accuracy, NPLC value, whether to enable the high-speed multimeter / data acquisition card, whether to enable mathematical operations, whether to enable relative values, and upper and lower data limits. The test modes include DC voltage test, DC current test, charge test, and material resistance test. The filtering parameters include whether to enable the filtering module. Reset the module to initialize the test.

3. The system for researching and testing various high-resistance materials and devices according to claim 1, characterized in that: The report output module outputs a custom data test report in PDF format based on the test data and pictures selected by the user.

4. The system for researching and testing various high-resistance materials and devices according to claim 1, characterized in that: Also includes: The waveform auxiliary tool module is used to customize the color and curve style of the waveform curve.

5. The research and testing system for various high-resistance materials and devices according to claim 1, characterized in that: Also includes: The cursor measurement module is used to observe the change in the performance index of the device in a certain period of time, including at least one of the interval value, maximum value, minimum value and average value.

6. The system for researching and testing various high-resistance materials and devices according to claim 1, characterized in that: Also includes: The video recording module is used to record the dynamic waveform curve displayed by the test data display module.

7. The research and testing system for various high-resistance materials and devices according to claim 1, characterized in that: Also includes: The configuration retention module is used for users to configure and store several new test parameter templates, and to apply or delete configured test parameter templates.

8. The research and testing system for various high-resistance materials and devices according to claim 1, characterized in that: Also includes: The historical data viewing module is used for allowing users to view and analyze the data stored in the data storage module.

9. The system for researching and testing various high-resistance materials and devices according to claim 1, characterized in that: The filtering module includes a digital filter and a median filter. The digital filter and the median filter respectively perform filtering processing on the data collected by the data collection module according to the corresponding filtering parameters.

10. A method for researching and testing various high-resistance materials and devices, applied to the system for researching and testing various high-resistance materials and devices as claimed in any one of claims 1 to 9, characterized in that: include: Connect the object under test to the data acquisition module; Set the test parameters and filter parameters through the setting module; Enable testing through the test module; The data acquisition module collects data from the object under test according to the test parameters; The filtering module performs filtering processing on the data collected by the data collection module according to the filtering parameters; The collected data is presented in real time in the form of dynamic waveform curves through the test data display module; The data collected by the data collection module and the filtered data of the filtering module are stored in real time through the data storage module.

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