Sensor automatic spot inspection method and device, electronic equipment and storage medium
By automatically acquiring the test and real-time data of the sensor, determining the benchmark and fault information, and realizing automatic spot inspection of the sensor, the problem of difficult fault finding of hot metal detectors is solved, and the efficiency of steel rolling production is improved.
Patent Information
- Application Number
- CN202510808911.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-17
- Publication Date
- 2025-09-09
AI Technical Summary
It is difficult to find faults with hot metal detectors on steel rolling production lines, which affects production efficiency.
By acquiring the test data and real-time data of the sensor, determining the baseline data and fault information, using the timer and counter for automatic inspection, and combining the alarm module and resetter, automatic fault detection of the sensor can be achieved.
The efficiency of sensor fault detection is improved, and the working efficiency and output of the steel rolling production line are increased.
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Figure CN120609310A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of steel rolling production, and in particular to a sensor automatic inspection method, device, electronic equipment and storage medium. Background Art
[0002] Hot metal detectors are widely used and crucial components for measuring workpiece position on steel rolling lines. Abnormal detection signals can cause serious malfunctions. For example, miscalculation of workpiece position can lead to inaccurate cutting, steel accumulation, and abnormal equipment operation. Common hot metal detector malfunctions include intermittent signals, constant on signals, and channel interference such as iron oxide and channel overheating. Identifying the causes of these malfunctions is difficult and time-consuming, significantly impacting production efficiency.
[0003] Therefore, a new solution is needed to solve the above technical problems. Summary of the Invention
[0004] The present invention provides a sensor automatic spot inspection method, device, electronic equipment and storage medium to solve the technical problem that the cause of a hot metal detector failure is difficult to find.
[0005] The present invention provides a sensor automatic spot inspection method, which includes:
[0006] Acquire test data and real-time data of the sensor, wherein the test data includes the normal operating time of a single tie and the normal interval time between two adjacent ties, and the real-time data includes the real-time operating time of a single tie, the real-time interval time between two adjacent tie, and the number of sensing times of the sensor within the reference operating time;
[0007] Determining the reference data of the sensor based on the test data, wherein the reference data includes a reference running time of a single sensor and a reference interval time between two adjacent sensors;
[0008] Fault information of the sensor is determined according to the reference data and the real-time data.
[0009] In one embodiment of the present invention, determining the baseline data of the sensor based on the test data includes:
[0010] Monitoring a plurality of continuously normally operating components to obtain a plurality of sets of test data;
[0011] Performing average processing on a plurality of the normal operating times to obtain the benchmark operating time;
[0012] A plurality of normal interval times are compared to determine a minimum value of the normal interval times, and the interval time with the minimum value is used as the reference interval time.
[0013] In one embodiment of the present invention, the method further includes:
[0014] When monitoring a plurality of continuously normally operating tying members, if any one of the plurality of continuously operating tying members experiences an abnormality in operation, the sensor is reset.
[0015] In one embodiment of the present invention, determining the fault information of the sensor based on the baseline data and the real-time data includes:
[0016] Comparing the benchmark running time with the real-time running time to determine an absolute value of a difference between the two;
[0017] If the absolute value is less than a first preset value and the number of sensing times is less than or equal to 1, it is determined that the sensor is normal;
[0018] If the number of sensing times is greater than or equal to 2, it is determined that the sensor is at a first fault;
[0019] If the absolute value is greater than or equal to a second preset value, determining that the sensor is at a second fault;
[0020] If the real-time interval is less than the reference interval, and the number of sensing times is greater than or equal to 1, or the absolute value is greater than or equal to a third preset value, it is determined that the sensor has a third fault;
[0021] If the real-time interval time is greater than or equal to a fourth preset value, the sensor is reset.
[0022] The present invention also provides an automatic spot inspection device for sensors, the automatic spot inspection device for sensors comprising:
[0023] The bundle conveying line is used to convey bundles;
[0024] A sensor is provided on the bundle conveying line and is used to detect the bundle;
[0025] The spot inspection module is electrically connected to the sensor and is used to perform spot inspection on the sensor to determine fault information of the sensor.
[0026] In one embodiment of the present invention, the inspection module includes a timer and a counter. The timer measures the time between two adjacent sensing signals of the sensor; and the counter counts the number of times the sensor senses the signal.
[0027] In one embodiment of the present invention, the automatic spot inspection device for sensors further comprises an alarm module electrically connected to the spot inspection module, wherein the spot inspection module is configured to control the alarm module to issue alarm signals for the first fault, the second fault and the third fault of the sensor.
[0028] In one embodiment of the present invention, the inspection module further includes a resetter, and the resetter is electrically connected to the sensor to reset the sensor.
[0029] The present invention further provides an electronic device, comprising:
[0030] one or more processors;
[0031] The storage device is used to store one or more programs. When the one or more programs are executed by the one or more processors, the one or more processors implement the sensor automatic inspection method as described in the above embodiment.
[0032] The present invention also provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor of a computer, the computer is caused to execute the automatic sensor inspection method as described in the above embodiment.
[0033] Beneficial effects of the present invention: The present invention proposes a sensor automatic inspection method, device, electronic device and storage medium, which obtains the sensor's test data to obtain the sensor's baseline data; and obtains the sensor's real-time data, and then determines the sensor's fault information based on the sensor's baseline data and real-time data, avoiding manual sensor fault detection, which is beneficial to improving the work efficiency of the binding production line and further beneficial to increasing the output of binding parts. BRIEF DESCRIPTION OF THE DRAWINGS
[0034] The accompanying drawings are incorporated into and constitute a part of the specification, illustrate embodiments consistent with the present application, and together with the specification, are used to explain the principles of the present application. Obviously, the drawings described below are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be derived from these drawings without inventive effort.
[0035] In the attached figure:
[0036] Figure 1 Flowchart of a sensor automatic inspection method provided by an embodiment of the present invention;
[0037] Figure 2 A schematic structural diagram of an automatic sensor inspection device provided in one embodiment of the present invention;
[0038] Figure 3A schematic diagram of the structure of a computer system provided in one embodiment of the present invention and suitable for implementing an electronic device of the embodiment of the present invention.
[0039] The reference numerals are as follows:
[0040] 1-Bundle conveyor line;
[0041] 2-Sensor;
[0042] 3- Tie the pieces together. DETAILED DESCRIPTION
[0043] The following describes the embodiments of the present invention through specific examples. Those skilled in the art will readily understand the other advantages and benefits of the present invention from the disclosure herein. The present invention may also be implemented or applied through various other specific embodiments. The details in this specification may be modified or altered based on different viewpoints and applications without departing from the spirit of the present invention. The following embodiments and features therein may be combined with one another without conflict.
[0044] It should be noted that the illustrations provided in the following embodiments are merely schematic illustrations of the basic concept of the present invention. The drawings only show components related to the present invention and are not drawn according to the number, shape, and size of components in actual implementation. In actual implementation, the type, quantity, and proportion of each component may be changed arbitrarily, and the component layout may also be more complex.
[0045] In the following description, numerous details are discussed to provide a more thorough explanation of the embodiments of the present invention. However, it will be apparent to those skilled in the art that the embodiments of the present invention may be practiced without these specific details. In other embodiments, well-known structures and devices are shown in block diagram form rather than in detail to avoid obscuring the embodiments of the present invention.
[0046] See Figure 1 , Figure 1 This is a flow chart of a sensor automatic inspection method provided by an embodiment of the present invention, as shown in FIG. Figure 1 As shown, in an exemplary embodiment, the automatic inspection method for sensors of the present invention may include steps S110 to S130, which are described in detail as follows:
[0047] Step S110: Acquire test data and real-time data of sensor 2.
[0048] Specifically, sensor 2's test data includes the normal operating time of a single tie 3 and the normal interval between two adjacent tie 3s. Sensor 2's real-time data includes the real-time operating time of a single tie 3, the real-time interval between two adjacent tie 3s, and the number of sensing times by sensor 2 during the benchmark operating time. It should be noted that each time sensor 2 detects a tie 3, it emits a sensing signal, and the inspection module records the number of sensing times.
[0049] In one embodiment of the present invention, before spot checking the sensors 2 on the production line, test data of the sensors 2 is first obtained. To obtain the test data, the sensors 2 are required to monitor the normally operating tie pieces 3, thereby obtaining the normal operating time of a single tie piece 3 and the normal interval time between two adjacent tie pieces 3.
[0050] In one embodiment of the present invention, after the test data collection of the sensor 2 is completed, the real-time data of the sensor 2 can be collected, that is, the spot inspection operation of the sensor 2 begins.
[0051] For example, the sensor 2 may be configured as a hot metal detector or the like.
[0052] Step S120 : determining the reference data of sensor 2 based on the test data.
[0053] Specifically, the reference data of the sensor 2 includes a reference running time of a single tying member 3 and a reference interval time between two adjacent tying members 3 .
[0054] In one embodiment of the present invention, first, in order to improve the reliability of the test data of the sensor 2, it is necessary to monitor a plurality of continuously normally operating components 3, thereby obtaining a plurality of test data. Subsequently, the average value of the normal operating time of the plurality of components 3 is calculated, and the average value is used as the reference operating time of the component 3. At the same time, the plurality of normal intervals of the plurality of normally operating components 3 are compared, and the minimum value of the plurality of normal intervals is determined, and the normal interval time of the minimum value is used as the reference interval time of the component 3. It should be noted that when monitoring a plurality of continuously normally operating components 3, if any of the plurality of continuously normally operating components 3 has an abnormal operation, in order to improve the reliability and accuracy of the test data of the sensor 2, the sensor 2 needs to be reset and a new round of data collection needs to be carried out again.
[0055] For example, when collecting the test data of the sensor 2 , at least three or more continuously running binding members 3 are monitored.
[0056] Step S130: determining the fault information of the sensor 2 according to the reference data and the real-time data.
[0057] In one embodiment of the present invention, after the baseline data of the binding member 3 is determined, the sensor 2 can be inspected. In this process, the real-time data of the sensor 2 is obtained, and then the real-time data of the sensor 2 is compared with the baseline data to determine the fault information of the sensor 2.
[0058] In one example, the benchmark running time and the real-time running time are compared to obtain the difference between the two, and further obtain the absolute value of the difference. If the absolute value is less than the first preset value and the number of sensing times is less than or equal to 1, it indicates that sensor 2 is operating normally. If the number of sensing times is greater than or equal to 2, it is determined that sensor 2 has a first fault. Exemplarily, the first fault may be a flash fault of sensor 2. If the absolute value is greater than or equal to the second preset value, it is determined that sensor 2 has a second fault. Exemplarily, the second fault may be a long-light fault of sensor 2. If the real-time interval time is less than the benchmark interval time, and the number of sensing times is greater than or equal to 1, or the absolute value is greater than or equal to the third preset value, it is determined that sensor 2 has a third fault. Exemplarily, the third fault may be an interference fault in the detection channel of sensor 2. If the real-time interval time is greater than or equal to the fourth preset value, sensor 2 is reset.
[0059] For example, a range of 1%-5% of the reference operating time of the tie 3 is used as the base value, wherein the first preset value can be set to the base value, the second preset value can be set to 10 times the base value, the third preset value can be set to 8 times the base value, and the fourth preset value can be set to 10 times the base interval time.
[0060] To sum up, the solution of this embodiment obtains the sensor's test data to obtain the sensor's baseline data; and obtains the sensor's real-time data, and then determines the sensor's fault information based on the sensor's baseline data and real-time data, avoiding manual sensor fault detection, which is beneficial to improving the work efficiency of the binding production line and thus helping to increase the output of binding parts.
[0061] See Figure 2 In an exemplary embodiment, the present invention further provides a sensor-based automatic spot inspection device, comprising a piece-binding conveyor line 1, a sensor 2, and a spot inspection module. The piece-binding conveyor line 1 is configured to convey pieces 3. The sensor 2 is mounted on the piece-binding conveyor line 1 and configured to inspect the pieces 3 on the piece-binding conveyor line 1. The spot inspection module is electrically connected to the sensor 2 and configured to inspect the sensor 2 to determine any faults in the sensor 2, thereby ensuring the normal operation of the pieces 3 on the piece-binding conveyor line 1 and improving the production efficiency of the pieces 3.
[0062] In one embodiment of the present invention, the inspection module includes a timer and a counter. The timer measures the time between two adjacent sensing signals from sensor 2, thereby determining the normal operating time, normal interval time, real-time operating time, and real-time interval time of two adjacent binding members 3. The counter counts the number of sensing signals from sensor 2, thereby determining the number of sensing times by sensor 2 within the reference operating time.
[0063] In one embodiment of the present invention, the inspection module is electrically connected to the alarm module. When the inspection module determines the first fault, the second fault and the third fault of the sensor 2, the inspection module controls the alarm module to issue an alarm signal for the first fault, the second fault and the third fault respectively.
[0064] In one embodiment of the present invention, the inspection module further includes a resetter mounted on the bundle conveyor line 1, the resetter being electrically connected to the sensor 2. When any bundle 3 among the plurality of bundles 3 operating continuously and normally experiences an abnormality, or when the sensor 2 detects that the real-time interval between bundles 3 is greater than or equal to a fourth preset value, the inspection module controls the resetter to reset the sensor 2.
[0065] See Figure 3 In an exemplary embodiment, the present invention further provides an electronic device 300, comprising a memory 310, a processor 320, and a computer program stored in the memory and executable on the processor. When the processor 320 executes the computer program, the steps of the automatic sensor inspection method of any of the above embodiments are implemented.
[0066] In this embodiment, the memory 310 may include random access memory (RAM) and may also include non-volatile memory (NVM), such as at least one disk storage. The processor 320 may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.
[0067] The present invention also provides a computer-readable storage medium having a computer program stored thereon. When executed by a computer processor, the computer program causes the computer to perform the aforementioned automatic sensor inspection method. The computer-readable storage medium may be included in the electronic device described in the above embodiments, or may exist independently and not be incorporated into the electronic device.
[0068] It should be noted that the computer-readable medium shown in the embodiments of the present invention may be a computer-readable signal medium or a computer-readable storage medium, or any combination thereof. The computer-readable storage medium may, for example, be an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or component, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to, an electrical connection having one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a flash memory, an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, a computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, which carries a computer-readable computer program. Such a propagated data signal may take a variety of forms, including, but not limited to, an electromagnetic signal, an optical signal, or any suitable combination thereof. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium that can transmit, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. A computer program embodied on a computer-readable medium may be transmitted using any suitable medium, including but not limited to wireless, wired, or any suitable combination thereof.
[0069] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions and operations of the systems, methods and computer program products according to various embodiments of the present invention. Each box in the flowchart or block diagram can represent a module, program segment, or part of the code, and the above-mentioned module, program segment, or part of the code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the boxes can also occur in an order different from that marked in the accompanying drawings. For example, two boxes shown in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, and the combination of boxes in the block diagram or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or operation, or can be implemented using a combination of dedicated hardware and computer instructions.
[0070] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the present invention. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical principles disclosed herein are intended to be covered by the claims of the present invention.
Claims
1. A sensor automatic inspection method, characterized in that: The method comprises: Acquire test data and real-time data of the sensor, wherein the test data includes the normal operating time of a single tie and the normal interval time between two adjacent ties, and the real-time data includes the real-time operating time of a single tie, the real-time interval time between two adjacent tie, and the number of sensing times of the sensor within the reference operating time; Determining the reference data of the sensor based on the test data, wherein the reference data includes a reference running time of a single sensor and a reference interval time between two adjacent sensors; Fault information of the sensor is determined according to the reference data and the real-time data.
2. The automatic inspection method for sensors according to claim 1, characterized in that: Determining the reference data of the sensor based on the test data includes: Monitoring a plurality of continuously normally operating components to obtain a plurality of sets of test data; Performing average processing on a plurality of the normal operating times to obtain the benchmark operating time; A plurality of normal interval times are compared to determine a minimum value of the normal interval times, and the interval time with the minimum value is used as the reference interval time.
3. The automatic inspection method for sensors according to claim 2, characterized in that: The method further comprises: When monitoring a plurality of continuously normally operating tying members, if any one of the plurality of continuously operating tying members experiences an abnormality in operation, the sensor is reset.
4. The automatic inspection method for sensors according to claim 2 or 3, characterized in that: The determining, based on the reference data and the real-time data, fault information of the sensor includes: Comparing the benchmark running time with the real-time running time to determine an absolute value of a difference between the two; If the absolute value is less than a first preset value and the number of sensing times is less than or equal to 1, it is determined that the sensor is normal; If the number of sensing times is greater than or equal to 2, it is determined that the sensor is at a first fault; If the absolute value is greater than or equal to a second preset value, determining that the sensor is at a second fault; If the real-time interval is less than the reference interval, and the number of sensing times is greater than or equal to 1, or the absolute value is greater than or equal to a third preset value, it is determined that the sensor has a third fault; If the real-time interval time is greater than or equal to a fourth preset value, the sensor is reset.
5. A sensor automatic inspection device, characterized in that: include: The bundle conveying line is used to convey bundles; A sensor is provided on the bundle conveying line and is used to detect the bundle; The spot inspection module is electrically connected to the sensor and is used to perform spot inspection on the sensor to determine fault information of the sensor.
6. The automatic sensor inspection device according to claim 5, characterized in that: The inspection module includes a timer and a counter. The timer measures the time between two adjacent sensing signals of the sensor; and the counter counts the number of times the sensor senses the signal.
7. The automatic sensor inspection device according to claim 5, characterized in that: The automatic spot inspection device for sensors further comprises an alarm module electrically connected to the spot inspection module, wherein the spot inspection module is used to control the alarm module to send alarm signals for the first fault, the second fault and the third fault of the sensor.
8. The automatic sensor inspection device according to claim 5, characterized in that: The inspection module further includes a resetter, which is electrically connected to the sensor to reset the sensor.
9. An electronic device, characterized in that: The electronic device comprises: one or more processors; A storage device for storing one or more programs, which, when executed by the one or more processors, enables the electronic device to implement the sensor automatic inspection method according to any one of claims 1 to 4.
10. A computer-readable storage medium, characterized in that A computer program is stored thereon, and when the computer program is executed by a processor of a computer, the computer is caused to execute the sensor automatic inspection method according to any one of claims 1 to 4.