Turnover alignment control method and system of single-face and double-face plate turnover machine

Through structural analysis of the flipping target and deviation prediction and compensation control, the problems of low flipping positioning accuracy and inability to compensate for deviations of traditional flipping machines on ultra-thin, high-density workpieces are solved, high-precision flipping and smooth connection between processes are achieved, and the degree of automation of the production line and product quality are improved.

CN120751604AActive Publication Date: 2025-10-03QIDONG DIJIE IND COMPLETE EQUIP CO LTD

Patent Information

Application Number
CN202511140853.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-08-15
Publication Date
2025-10-03
Estimated Expiration
2045-08-15

AI Technical Summary

Technical Problem

When faced with ultra-thin, high-density workpieces, traditional flip machines have problems with low flipping alignment accuracy and inability to effectively compensate for flipping deviations. Especially when multiple processes are connected, the systematic deviation is obvious, affecting the degree of automation of the production line and the consistency of product quality.

Method used

By analyzing the structure of the flip target, identifying the key points and structural features of the alignment, establishing the coordinate transformation relationship before/after flipping, predicting the flipping deviation and performing parameter compensation control, and using the timing process parameters for secondary alignment, the flipping accuracy and process connection are ensured.

Benefits of technology

It improves the flipping and positioning accuracy, realizes the smooth connection between working processes, and improves the automation level of the production line and the consistency of product quality.

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Abstract

The invention relates to the technical field of plate turnover machine alignment control, and provides a turnover alignment control method and system of a single-face and double-face plate turnover machine. The method comprises the following steps: carrying out structure analysis on a turnover target, and identifying an alignment key point and a structure feature; establishing a pre-overturning / post-overturning coordinate transformation relation, and calculating a post-overturning theoretical position based on the current pose; predicting the overturning deviation based on the theoretical position, and analyzing the compensation parameter and controlling the compensation when the deviation exists; and obtaining a time sequence process alignment parameter, carrying out secondary alignment on the overturning target by using the time sequence process alignment parameter, confirming completion and joining the next process. The technical problems that the alignment precision is low and the turnover deviation cannot be effectively compensated due to the structural difference or inaccurate target pose recognition when a traditional plate turnover machine performs single-face and double-face turnover are solved, and the technical effects that the turnover alignment precision is improved through secondary alignment and procedure connection treatment, and automatic procedure connection is achieved are achieved.
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Description

Technical Field

[0001] The present application relates to the technical field of positioning control of a flipping machine, and in particular to a flipping and positioning control method and system for a single-sided or double-sided flipping machine. Background Art

[0002] Single- and double-sided flip machines are core equipment for processes such as double-sided soldering of printed circuit boards (PCBs), double-sided coating of glass panels, and front and back processing of precision metal parts. The accuracy of their flipping and alignment directly affects product yield and production line efficiency. Traditional flipping machines generally use mechanical positioning pins and fixed program control to achieve flipping. However, when faced with new ultra-thin and high-density workpieces, three major technical bottlenecks are exposed: First, the increased complexity of the workpiece structure causes the failure of traditional mechanical positioning points, and changes in working conditions such as edge warping and thermal deformation cause cumulative errors in the fixed coordinate system mapping; second, the dynamic offset caused by inertial impact and transmission clearance during the flipping process is difficult to cover by the static parameter compensation model, and the error is gradually amplified when multiple processes are connected; third, the existing system lacks predictive coordination for the positioning requirements of subsequent processes, resulting in systematic deviations in the coordinate system matching of flipping and downstream equipment. Therefore, developing an intelligent flipping and alignment control system that integrates feature recognition, posture prediction, dynamic compensation, and process coordination is of great significance for improving the automation level of the production line and ensuring product quality consistency. Summary of the Invention

[0003] This application provides a flipping alignment control method and system for single- and double-sided flipping machines, aiming to solve the technical problems of low alignment accuracy and ineffective compensation of flipping deviations in traditional flipping machines due to structural differences or inaccurate target posture recognition during single- and double-sided flipping.

[0004] The first aspect disclosed in the present application provides a flipping alignment control method for a single- and double-sided flipping machine, the method comprising: performing structural analysis on the flipping target, identifying alignment key points and structural features; establishing a coordinate transformation relationship before / after flipping, and calculating the theoretical position after flipping based on the current identification posture and the alignment key points and structural features as targets; performing flipping deviation prediction based on the theoretical position after flipping, and when there is a deviation in the prediction result, performing flipping parameter compensation analysis according to the predicted deviation, and performing flipping deviation compensation control according to the compensation parameters; obtaining the timing process alignment parameters, and performing secondary alignment on the target after flipping using the timing process alignment parameters, and determining that the alignment target is completed so as to enter the next process connection processing.

[0005] Another aspect disclosed in the present application provides a flipping and alignment control system for a single- and double-sided flipping machine, the system comprising: a structural analysis module: performing structural analysis on the flipping target, identifying alignment key points and structural features; a theoretical position calculation module: establishing a coordinate transformation relationship before / after flipping, and calculating the theoretical position after flipping based on the current identification posture and the alignment key points and structural features as the target; a deviation compensation control module: performing flipping deviation prediction based on the theoretical position after flipping, and when there is a deviation in the prediction result, performing flipping parameter compensation analysis according to the predicted deviation, and performing flipping deviation compensation control according to the compensation parameters; a secondary alignment module: obtaining the timing process alignment parameters, and performing secondary alignment on the target after flipping using the timing process alignment parameters, and determining that the alignment target is completed to enter the next process connection processing.

[0006] One or more technical solutions provided in this application have at least the following technical effects or advantages: The above-mentioned flipping alignment control method of the single- and double-sided flipping machine first performs a structural analysis on the flipping target to identify key alignment points and structural features; then, a conversion relationship between the coordinates before and after flipping is established, and based on the current target posture, the ideal position after flipping is calculated; on this basis, possible deviations in the flipping process are predicted, and compensation adjustments are made to the flipping parameters based on the prediction results to correct the deviations; finally, the alignment parameters in the timing process are obtained, and these parameters are used to perform a second precise alignment on the flipped target to ensure that the target position after flipping meets the requirements, finally completing the alignment and preparing for the smooth connection of subsequent processes.

[0007] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0009] Figure 1 The figure is a flow chart of a method for controlling the flipping and alignment of a single-sided or double-sided flipping machine in one embodiment.

[0010] Figure 2 This is a diagram of the flipping and alignment control system architecture of a single-sided and double-sided flipping machine in one embodiment.

[0011] Explanation of reference numerals: structure analysis module 11 , theoretical position calculation module 12 , deviation compensation control module 13 , secondary alignment module 14 . DETAILED DESCRIPTION

[0012] The embodiments of the present application provide a flipping alignment control method and system for a single-sided or double-sided flipping machine, thereby solving the technical problems of low alignment accuracy and ineffective compensation for flipping deviations in traditional flipping machines due to structural differences or inaccurate target posture recognition during single-sided or double-sided flipping.

[0013] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0014] It should be noted that the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or server that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or modules that are not clearly listed or are inherent to these processes, methods, products or devices.

[0015] Example 1, as Figure 1 As shown, the present application provides a flipping and alignment control method for a single-sided and double-sided flipping machine, the method comprising: Perform structural analysis on the flipped target and identify key points and structural features.

[0016] In the embodiments of the present application, when performing structural analysis on a flipped target, structural information of the target object is first collected, including its edge contours and calibrated identification features (such as positioning holes and axes of symmetry). These features serve as positioning and guidance during the subsequent flipping process. Subsequently, by analyzing these structural features, the impact evaluation value of each point and the flipped structural stability are calculated to provide support for alignment accuracy during the flipping process. The calculated results are then filtered using a set threshold to obtain points that meet the threshold requirements. These points are then designated as key alignment points. The structural features corresponding to these points serve as the structural features of the key alignment points, providing a basis for subsequent deviation prediction and ensuring the accuracy of the target position during the flipping process.

[0017] Furthermore, the present application provides structural analysis of the flipped target, identification of alignment key points and structural features, including: Collect structural information of the flipped target; identify edge contour features in the structural information and calibrate identification feature coordinates, wherein the calibrated identification features include positioning holes, symmetry axes, identification marks, edge intersections, and color adjacencies; determine the alignment key points and structural features based on the edge contour features and calibrated identification feature coordinates.

[0018] Preferably, a sensor or imaging device (such as a laser scanner or stereo vision camera) is used to capture three-dimensional data and surface features of the flipped object, obtaining structural information of the flipped object. This information includes basic information such as the object's shape, size, and surface features (such as pattern and color). Subsequently, edge detection algorithms, such as Canny edge detection or the Sobel operator, are used to extract edge contour features from the captured structural information of the target object. Taking Canny edge detection as an example, the Sobel operator is used to calculate the gradient value of each data point in the structural information, obtaining the gradient magnitude in each direction (horizontal and vertical) of the structural information. After obtaining the gradient magnitude, a non-maximum suppression algorithm is used to suppress non-edge points, retaining the maximum edge strength. This makes the edge lines in the image clearer. High and low thresholds are then set to further filter out distinct edges. Data points above the high threshold are considered strong edges, while data points below the low threshold are considered non-edges. Data points in between are retained as edges if they connect to a strong edge, thereby obtaining complete object edges and forming edge contour features that reflect the object's geometric shape. In addition, the coordinates of calibrated identification features are also obtained from the object's structural information, including the coordinates of positioning holes, axes of symmetry, identification marks, edge intersections, and color adjacencies. The coordinates of positioning holes and identification marks can be obtained using template matching; the coordinates of axes of symmetry can be estimated using the least squares method; the coordinates of edge intersections can be obtained by analyzing the object's edge contours and identifying edge intersections using a corner detection algorithm (such as Harris corner detection); and the coordinates of color adjacencies can be obtained by extracting color regions using a set threshold and then obtaining the coordinates of the color region boundaries. Based on the identified edge contour features and calibrated identification feature coordinates, the impact on the flipped object's posture change and the stability of the flipped structure is analyzed. Based on the analysis results, key alignment points and structural features (such as shape, size, color, and logo patterns) are identified through threshold screening. These key alignment points and structural features serve as the basis for positioning during the flipping process, ensuring that the object maintains correct alignment and accurately adjusts the flip position.

[0019] Furthermore, the present application provides a method for determining the alignment key points and structural features based on the edge contour features and the calibration identification feature coordinates, including: Analyze the influence relationship between the edge contour features and the calibration identification feature coordinates on the flip target posture change to obtain the influence evaluation value of each structural feature; obtain the flip structure stability of the edge contour features and the calibration identification feature coordinates; use the influence evaluation value and the flip structure stability to screen key points according to a preset number threshold to obtain the alignment key points; determine the alignment key points and structural features based on the structural features corresponding to the alignment key points determined by the screening.

[0020] Optionally, after obtaining the edge contour features and the calibrated identification feature coordinates, the edge contour features and the calibrated identification feature coordinates will be processed through computer-aided design (CAD) software and three-dimensional modeling software, and these features will be converted into elements in three-dimensional space to form a virtual three-dimensional model. Then, the simulation software will be used to perform a flip simulation on this virtual three-dimensional model according to pre-defined flip parameters, such as flip axis, rotation angle, etc., and record the coordinates of each structural feature after flipping (such as inflection points, positioning holes, symmetry axes, identification marks, edge intersections, color adjacencies, etc., involved in contours, identification patterns, etc.). The error between the baseline flip template and the corresponding structural feature after flipping is calculated by Euclidean distance. The calculated error will be divided by the maximum allowable error, and then the calculated quotient will be subtracted from 1 to obtain the influence evaluation value of each structural feature. The larger the error, the smaller the influence evaluation value, indicating that the structural feature contributes less to the alignment effect. Among them, the baseline flip template is the most successful flip result that appears in the historical flip log. In addition, the actual rotation angle during flipping is recorded, and the pre-defined rotation angle is used to subtract the actual rotation angle. The calculated error is then divided by the maximum tolerance angle, and the calculated quotient is subtracted from 1. The calculated difference is weighted with the impact evaluation value of each structural feature to obtain the flipping structural stability. Subsequently, the calculated impact evaluation value of each structural feature and the flipping structural stability are used to calculate the comprehensive evaluation value of each structural feature in a weighted manner. The position coordinates corresponding to each structural feature are then sorted in descending order according to the comprehensive evaluation value, and the key points of the features are screened using a preset quantity threshold. The screened position coordinates are the alignment key points, which can provide the best stability and accuracy during the flipping process. Finally, based on the screened alignment key points, they are associated with the corresponding structural features to form complete alignment key point and structural feature data, thereby providing an accurate basis for subsequent flipping deviation prediction and alignment control.

[0021] Furthermore, the present application provides a method for determining the alignment key points and structural features, and then further includes: Configure the alignment exception case parameters, perform alignment recognition verification based on the alignment key points and structural features, and obtain a verification evaluation result; when the verification evaluation result meets the verification threshold, confirm the alignment key points and structural features; when the verification threshold is not met, perform auxiliary feature screening from the remaining edge contour features and calibrated recognition feature coordinates until the verification threshold is met.

[0022] Optionally, first configure the alignment anomaly case parameters, including the flip axis and rotation angle used during the historical flip. These parameters are recorded when large errors occurred during the historical flip. Subsequently, these alignment anomaly case parameters are input into the simulation software to perform a flip simulation. The position coordinates and structural features of each alignment key point after the flip is completed are recorded. The errors before and after the flip are calculated using Euclidean distance, and these errors are summarized as a verification evaluation result. The errors recorded in the verification evaluation result are then compared with the corresponding verification threshold. If all errors are less than or equal to the verification threshold, these key points and structural features are confirmed to be valid and can provide a basis for alignment control during the flip process. If any error is greater than the verification threshold, it means that the currently selected features cannot fully ensure sufficient alignment accuracy during the flip process. In this case, auxiliary features are selected from the remaining edge contour features and calibrated recognition feature coordinates. That is, according to the previous sorting, the largest position coordinate is extracted as an auxiliary feature to supplement the current alignment key point and corresponding structural feature. This process is iterative until a feature combination that meets the threshold requirements is found, ensuring that the selected alignment key points and structural features meet the accuracy requirements and successfully complete the alignment task.

[0023] A coordinate transformation relationship before and after flipping is established, and based on the current recognition posture, the theoretical position after flipping is calculated with the alignment key points and structural features as the target.

[0024] In one embodiment, after determining the key points and structural features of the alignment, a rigid body transformation matrix is ​​established based on the structural parameters of the flip mechanism and the origin coordinates of the workpiece before and after flipping to quantify the coordinate transformation relationship before and after flipping. Subsequently, based on the currently recognized posture (i.e., the position and orientation of the target before flipping), the original coordinates of the workpiece in three-dimensional space are determined. For each key point of alignment on the workpiece, the difference between the position of this key point and the flip axis is calculated, and the calculated difference is then multiplied by the rigid body transformation matrix to obtain the theoretical position of the key point after flipping. These calculation results provide a theoretical basis for subsequent deviation prediction, alignment adjustment, and compensation.

[0025] Furthermore, the present application provides a method for establishing a pre-flip / post-flip coordinate transformation relationship, including: Obtain the structural parameters of the flip mechanism, including the spatial position, rotation direction, and rotation angle of the flip axis; identify the origin coordinates of the workpiece before flipping and the origin coordinates of the workpiece after flipping; and establish a rigid body transformation matrix in three-dimensional space based on the offset of the origin coordinates of the workpiece before flipping and the origin coordinates of the workpiece after flipping, as well as the spatial position, rotation direction, and rotation angle of the flip axis to map the coordinate transformation relationship before / after flipping.

[0026] Preferably, the structural parameters of the flip mechanism are obtained, including the spatial position, rotation direction, and rotation angle of the flip axis. These parameters describe the specific position of the flip axis in three-dimensional space, as well as the axis's rotation direction and rotation angle during the flipping process. These parameters can be collected from mechanical design drawings to ensure that the axis's motion trajectory and the object's flipping behavior are known. Subsequently, the origin coordinates of the workpiece before and after flipping are identified from historical flipping logs. The origin coordinates of the workpiece before flipping are the reference position of the object before flipping, typically the object's geometric center or other designated reference point. After the object is flipped, the origin coordinates of the workpiece after flipping are the object's new position after flipping. After the flipping transformation, the object's origin position may change, so the coordinates after flipping are required. Next, a rigid body transformation matrix in three-dimensional space is established based on the offsets of the origin coordinates before and after flipping, combined with the spatial position, rotation direction, and rotation angle of the flip axis. This rigid body transformation matrix, based on the principles of rigid body motion, describes how the object before flipping is transformed into the coordinate system after flipping through rotation and displacement. Specifically, the offset reflects the change in the origin's position before and after flipping, while the position of the flip axis, the direction of rotation, and the angle of rotation determine how the object moves in three-dimensional space during the rotation process. By combining the rotation direction and angle, the Rodrigues formula is used to construct a rotation matrix. The translation transformation matrix is ​​then constructed using the origin coordinate offset. By combining the translation transformation matrix with the rotation matrix, the required rigid body transformation matrix is ​​constructed. This matrix can transform the coordinate system before flipping into the coordinate system after flipping. Finally, this rigid body transformation matrix is ​​used to map the coordinate transformation relationship before and after flipping, ensuring that the object can move accurately according to the predetermined trajectory during the flipping process, providing accurate data support for subsequent control and alignment.

[0027] A rollover deviation prediction is performed based on the theoretical position after rollover. When a deviation exists in the prediction result, a rollover parameter compensation analysis is performed according to the predicted deviation, and rollover deviation compensation control is performed according to the compensation parameter.

[0028] In one embodiment, deviations during the flipping process are assessed by comparing the theoretically calculated positions before and after flipping with the predicted flipping positions based on the actual monitored flipping trajectory. If a deviation exists between the two, flip parameter compensation analysis is performed based on the predicted deviation. The core of this step is to analyze the magnitude and direction of the deviation and determine which flipping parameters (such as angular velocity and acceleration) need to be adjusted to reduce or eliminate the deviation. In this way, compensation parameters are obtained to keep the target object as close as possible to the predetermined theoretical position. These compensation parameters are then applied to the flipping control system to adjust the control strategy during the flipping process in real time. By dynamically adjusting the parameters involved in rotation, the object is ensured to maintain the correct position during the flipping process and minimize deviation, thereby achieving more accurate flip alignment. This process can be performed in real time during the flipping process, ensuring that the object's final position is more consistent with the expected target position.

[0029] Furthermore, the present application provides a method for predicting rollover deviation based on the theoretical position after rollover, including: Flip tracking monitoring is performed based on the alignment key points and structural features, and real-time position and posture change information during the flipping process is collected to construct an actual monitoring flipping trajectory; flip timing transformation prediction is performed based on the actual monitoring flipping trajectory to obtain a predicted flipping position at the end of the flipping; and a predicted deviation is obtained based on the predicted flipping position and the theoretical position after the flipping.

[0030] Preferably, flip tracking monitoring is performed based on key alignment points and structural features, using sensors or imaging devices to collect real-time information on the workpiece's position and attitude changes during the flipping process. This information includes the spatial positions of the workpiece's key alignment points and the workpiece's orientation (e.g., rotation angle). By continuously monitoring this data, a real-time trajectory of the flipping process, known as the actual monitored flipping trajectory, can be generated. This trajectory reflects the changes in the object's position and attitude at each moment during the flipping process. Subsequently, the desired predicted moment in the actual monitored flipping trajectory is input into a flipping prediction model to predict the flipping temporal transformation. This flipping prediction model can be constructed based on a long short-term memory (LSTM) network. The spatial positions of the workpiece's key alignment points and the workpiece's orientation at each time point in the historical flipping trajectory are organized into an array according to a temporal relationship. This array is input into the LSTM as training data. Iterative training is performed through forward propagation, loss calculation, backpropagation, and parameter optimization until the maximum number of iterations is reached or the loss function converges. After receiving the actual monitored flipping trajectory, the flipping prediction model predicts the next moment based on the current moment, current spatial position, and current orientation. This prediction process continues until a predicted flipping position at the end of the flipping process, including the predicted spatial position and orientation, is obtained. Afterwards, the predicted flipping position is compared with the theoretical position after flipping, and the predicted deviation is obtained by difference calculation. This predicted deviation reflects the error that may occur during the flipping process and provides a basis for subsequent deviation compensation and control adjustment.

[0031] Furthermore, the present application provides a method for performing rollover parameter compensation analysis based on the predicted deviation and performing rollover deviation compensation control according to the compensation parameters, including: Based on the physical material characteristics of the workpiece, the influence relationship between the flip parameters and the flip position is established; a time series relationship chain of the flip transformation position trajectory is established, and the influence relationship is used to perform time series alignment compensation on the actual monitored flip trajectory. The predicted deviation is used as the compensation target to obtain the compensation parameters of each node in the flip transformation position trajectory; and the compensation parameters of each node in the flip transformation position trajectory are used to perform flip trajectory deviation compensation control.

[0032] Optionally, first, based on the physical material characteristics of the workpiece, establish the influence relationship between the flipping parameters and the flipping position. The physical properties of the workpiece, such as mass, density, rigidity, friction coefficient, etc., will affect its movement performance during the flipping process. By studying the influence of the workpiece material on the flipping process, it is possible to clarify the influence of the flipping parameters (such as angular velocity, angular acceleration) on the workpiece position, and thus establish a mathematical model. For example, angle = initial angular velocity × time + angular acceleration × time squared, it is used to describe the influence relationship between the flipping parameters and the flipping position. For harder or heavier workpieces, higher angular velocity or angular acceleration may be required to complete the flipping, while softer or lighter workpieces may have lower requirements for the parameters of the flipping process. Subsequently, the workpiece's position and posture change data are arranged in chronological order to establish a temporal relationship chain for the flip transformation position trajectory. This influence relationship is then used to perform temporal alignment compensation on the actual monitored flip trajectory. During this process, the predicted deviation is added to the corresponding flip position at the moment in the actual monitored flip trajectory. This result is then input into a mathematical model to generate theoretical flip parameters for each node in the flip transformation position trajectory. These theoretical flip parameters are then subtracted from the actual flip parameters to determine the compensation parameters required for each trajectory node, including adjustments to angular velocity and angular acceleration, to reduce deviation. Finally, the compensation parameters for each node in the flip transformation position trajectory are used to adjust the operating parameters of the flip control system, such as angular velocity and angular acceleration, to ensure that the flip trajectory at each stage is closer to the ideal trajectory, thereby reducing deviation and accurately flipping the workpiece to the desired position.

[0033] Acquire the alignment parameters of the sequential process, use the alignment parameters to perform secondary alignment on the flipped target, determine that the alignment target is completed, and enter the next process connection processing.

[0034] In one embodiment, the time sequence and process requirements related to the flipping target are extracted from the production or operating system. These parameters generally include the alignment requirements of the workpiece in different processes, the time intervals between the processes, the specific operational objectives of each process, etc. The timing process alignment parameters are key data to ensure the smooth connection and completion of each process during the flipping process. Subsequently, the flipped target is aligned twice using the timing process alignment parameters. The position of the target after flipping may be affected by deviations or external factors during the flipping process. Therefore, a secondary alignment is required to ensure the accuracy of the target position. When the secondary alignment is completed and the position and posture of the target object meet the process requirements, the alignment target is confirmed to be completed. At this point, the target object is ready to enter the next process, such as assembly, processing or testing. This connection process ensures the smooth transition of the workpiece between the various processes, avoiding the impact of inaccurate alignment on subsequent work.

[0035] Furthermore, the present application provides a method for determining alignment target completion, including: Based on the alignment key points and structural features, the flip platform alignment verification is performed to determine the platform alignment verification result; the process parameter target alignment is performed according to the timing process alignment parameters and the platform alignment verification result. When the alignment matches, the secondary alignment is completed and an alignment target completion signal is generated.

[0036] Preferably, after compensation is complete, the flip platform alignment of key alignment points and structural features is verified. This process compares the workpiece's position on the flip platform with pre-set ideal alignment key points and structural features. Sensors or imaging devices on the flip platform monitor the target object's position and posture in real time and compare them with the theoretical position. If the target object's position on the flip platform meets the pre-set alignment requirements, the verification is considered successful; otherwise, the verification is considered a failure. The verification result reflects the positioning accuracy of the object during the flipping process. Subsequently, the process parameter target alignment is performed based on the timing process alignment parameters and the platform alignment verification results. Specifically, the verification results are checked to determine whether a secondary alignment is required. If the verification result indicates a successful result, indicating that the flip target position has met the process requirements, the secondary alignment is skipped and a target alignment completion signal is generated. This signal indicates that the target alignment has been successfully completed, allowing smooth progress to the next process step. Conversely, if the verification result indicates a failure, fine-tuning is performed using the XY platform's fine-adjustment cylinder to ensure that the process requirements are met.

[0037] Furthermore, the present application provides for performing process parameter target alignment according to the timing process alignment parameters and the platform alignment verification results, and further includes: When the alignment is mismatched, the XY platform's fine-tuning electric cylinder is used to perform alignment and fine-tuning according to the alignment deviation to achieve the alignment target of the sequential process alignment parameters.

[0038] Optionally, if the verification result indicates a failure, it means that the workpiece's position or posture differs from the theoretical position. In this case, the alignment deviation is determined by calculating the difference in the workpiece's position along the X and Y axes. This deviation can be either positional or posture, depending on the workpiece's positioning requirements on the platform. The XY stage's fine-tuning electric cylinders, a two-dimensional platform capable of small displacement adjustments along the X and Y axes, are then used to make precise adjustments based on the alignment deviation. Depending on the deviation, the fine-tuning electric cylinders adjust the alignment by controlling their extension or rotation, ensuring that every key point and structural feature of the target object is aligned with the target position specified in the sequential process alignment parameters. This alignment error is reduced to an acceptable range, meeting the alignment target specified in the sequential process alignment parameters. After fine-tuning is complete, the workpiece's position and posture are rechecked to ensure that they fully meet the alignment requirements. If deviations remain, further adjustments are made until precise alignment is achieved.

[0039] In summary, the embodiments of the present application have at least the following technical effects: The embodiment of the present application first performs a structural analysis on the flip target and identifies the key points and structural features of the alignment; then, a coordinate transformation relationship before / after flipping is established, and based on the current identification posture, the theoretical position after flipping is calculated with the key points and structural features of the alignment as the target; then, a flip deviation prediction is performed based on the theoretical position after flipping, and when there is a deviation in the prediction result, a flip parameter compensation analysis is performed according to the predicted deviation, and the flip deviation compensation control is performed according to the compensation parameters; finally, the timing process alignment parameters are obtained, and the timing process alignment parameters are used to perform a secondary alignment on the flipped target, and it is determined that the alignment target is completed to enter the next process connection processing. These technical effects jointly solve the technical problems of low alignment accuracy and ineffective compensation of flip deviations in traditional flip machines due to structural differences or inaccurate recognition of target posture during single-sided and double-sided flipping, and achieve the technical effect of improving flip alignment accuracy and realizing automated process connection through secondary alignment and process connection processing.

[0040] The second embodiment is based on the same inventive concept as the flipping and alignment control method of the single-sided and double-sided flipping machine in the above embodiment. Figure 2 As shown, the present application provides a flipping and alignment control system for a single- and double-sided flipping machine, and the system includes: a structural analysis module 11: performing structural analysis on the flipping target, identifying alignment key points and structural features; a theoretical position calculation module 12: establishing a coordinate transformation relationship before / after flipping, and calculating the theoretical position after flipping based on the current identification posture and the alignment key points and structural features as the target; a deviation compensation control module 13: performing flipping deviation prediction based on the theoretical position after flipping, and when there is a deviation in the prediction result, performing flipping parameter compensation analysis according to the predicted deviation, and performing flipping deviation compensation control according to the compensation parameters; a secondary alignment module 14: obtaining the timing process alignment parameters, and performing secondary alignment on the target after flipping using the timing process alignment parameters, and determining that the alignment target is completed to enter the next process connection processing.

[0041] Furthermore, the structure analysis module 11 is also used to perform the following method: Collect structural information of the flipped target; identify edge contour features in the structural information and calibrate identification feature coordinates, wherein the calibrated identification features include positioning holes, symmetry axes, identification marks, edge intersections, and color adjacencies; determine the alignment key points and structural features based on the edge contour features and calibrated identification feature coordinates.

[0042] Furthermore, the structure analysis module 11 is also used to perform the following method: Analyze the influence relationship between the edge contour features and the calibration identification feature coordinates on the flip target posture change to obtain the influence evaluation value of each structural feature; obtain the flip structure stability of the edge contour features and the calibration identification feature coordinates; use the influence evaluation value and the flip structure stability to screen key points according to a preset number threshold to obtain the alignment key points; determine the alignment key points and structural features based on the structural features corresponding to the alignment key points determined by the screening.

[0043] Furthermore, the structure analysis module 11 is also used to perform the following method: Configure the alignment exception case parameters, perform alignment recognition verification based on the alignment key points and structural features, and obtain a verification evaluation result; when the verification evaluation result meets the verification threshold, confirm the alignment key points and structural features; when the verification threshold is not met, perform auxiliary feature screening from the remaining edge contour features and calibrated recognition feature coordinates until the verification threshold is met.

[0044] Furthermore, the theoretical position calculation module 12 is further configured to execute the following method: Obtain the structural parameters of the flip mechanism, including the spatial position, rotation direction, and rotation angle of the flip axis; identify the origin coordinates of the workpiece before flipping and the origin coordinates of the workpiece after flipping; and establish a rigid body transformation matrix in three-dimensional space based on the offset of the origin coordinates of the workpiece before flipping and the origin coordinates of the workpiece after flipping, as well as the spatial position, rotation direction, and rotation angle of the flip axis to map the coordinate transformation relationship before / after flipping.

[0045] Furthermore, the deviation compensation control module 13 is further configured to execute the following method: Flip tracking monitoring is performed based on the alignment key points and structural features, and real-time position and posture change information during the flipping process is collected to construct an actual monitoring flipping trajectory; flip timing transformation prediction is performed based on the actual monitoring flipping trajectory to obtain a predicted flipping position at the end of the flipping; and a predicted deviation is obtained based on the predicted flipping position and the theoretical position after the flipping.

[0046] Furthermore, the deviation compensation control module 13 is further configured to execute the following method: Based on the physical material characteristics of the workpiece, the influence relationship between the flip parameters and the flip position is established; a time series relationship chain of the flip transformation position trajectory is established, and the influence relationship is used to perform time series alignment compensation on the actual monitored flip trajectory. The predicted deviation is used as the compensation target to obtain the compensation parameters of each node in the flip transformation position trajectory; and the compensation parameters of each node in the flip transformation position trajectory are used to perform flip trajectory deviation compensation control.

[0047] Furthermore, the secondary alignment module 14 is further configured to perform the following method: Based on the alignment key points and structural features, the flip platform alignment verification is performed to determine the platform alignment verification result; the process parameter target alignment is performed according to the timing process alignment parameters and the platform alignment verification result. When the alignment matches, the secondary alignment is completed and an alignment target completion signal is generated.

[0048] Furthermore, the secondary alignment module 14 is further configured to perform the following method: When the alignment is mismatched, the XY platform's fine-tuning electric cylinder is used to perform alignment and fine-tuning according to the alignment deviation to achieve the alignment target of the sequential process alignment parameters.

[0049] It should be noted that the order in which the embodiments of the present application are presented is for illustrative purposes only and does not necessarily represent the superiority or inferiority of the embodiments. Furthermore, the foregoing descriptions of specific embodiments of this specification are provided. The processes depicted in the accompanying drawings do not necessarily require the specific order or sequential sequence shown to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0050] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

[0051] This specification and drawings are merely illustrative of the present application and are intended to cover any and all modifications, variations, combinations, or equivalents within the scope of this application. Obviously, those skilled in the art may make various modifications and variations to this application without departing from the scope of this application. Thus, this application is intended to include such modifications and variations as fall within the scope of this application and its equivalents.

Claims

1. A method for controlling the flipping and positioning of a single-sided or double-sided panel turning machine, characterized in that: include: Perform structural analysis on the flipped target to identify key points and structural features; Establishing a coordinate transformation relationship before and after flipping, and calculating the theoretical position after flipping based on the current recognition posture and the alignment key points and structural features; Performing a rollover deviation prediction based on the theoretical position after rollover, and when there is a deviation in the prediction result, performing a rollover parameter compensation analysis according to the predicted deviation, and performing rollover deviation compensation control according to the compensation parameter; Acquire the alignment parameters of the sequential process, use the alignment parameters to perform secondary alignment on the flipped target, determine that the alignment target is completed, and enter the next process connection processing.

2. The method for controlling the flipping and alignment of a single-sided or double-sided panel turning machine according to claim 1, characterized in that: Confirm alignment goals are achieved, including: Performing flip platform alignment verification based on the alignment key points and structural features, and determining a platform alignment verification result; The process parameter target alignment is performed according to the timing process alignment parameters and the platform alignment verification result. When the alignment matches, the secondary alignment is completed and an alignment target completion signal is generated.

3. The method for controlling the flipping and alignment of a single-sided or double-sided panel turning machine according to claim 2, wherein: Performing process parameter target alignment according to the timing process alignment parameters and the platform alignment verification result, and then further comprising: When the alignment is mismatched, the XY platform's fine-tuning electric cylinder is used to perform alignment and fine-tuning according to the alignment deviation to achieve the alignment target of the sequential process alignment parameters.

4. The method for controlling the flipping and alignment of a single-sided or double-sided panel turning machine according to claim 1, wherein: Perform structural analysis on the flipped target and identify key alignment points and structural features, including: Collect structural information of the flipped target; Identify edge contour features in the structural information and calibrate identification feature coordinates, wherein the calibrated identification features include positioning holes, symmetry axes, identification marks, edge intersections, and color adjacencies; The alignment key points and structural features are determined based on the edge contour features and the calibrated recognition feature coordinates.

5. The method for controlling the flipping and alignment of a single-sided or double-sided panel turning machine according to claim 4, characterized in that: Determining the alignment key points and structural features based on the edge contour features and the calibrated recognition feature coordinates includes: Analyze the influence relationship between the edge contour features and the calibration recognition feature coordinates on the flip target posture change to obtain the impact evaluation value of each structural feature; Obtaining the edge contour features and calibrating the flip structure stability of the recognition feature coordinates; Using the impact evaluation value and the flip structure stability to screen key points according to a preset number threshold, the alignment key points are obtained; The alignment key points and structural features are determined based on the structural features corresponding to the alignment key points determined through screening.

6. The method for controlling the flipping and alignment of a single-sided or double-sided panel turning machine according to claim 5, characterized in that: Determine the alignment key points and structural features, and then also include: Configure alignment exception case parameters, perform alignment identification verification based on the alignment key points and structural features, and obtain verification evaluation results; When the verification evaluation result meets the verification threshold, confirming the alignment key points and structural features; When the verification threshold is not met, auxiliary features are screened from the remaining edge contour features and the calibrated recognition feature coordinates until the verification threshold is met.

7. The method for controlling the flipping and alignment of a single-sided or double-sided panel turning machine according to claim 1, wherein: Establishing the coordinate transformation relationship before and after flipping, including: Obtain the structural parameters of the flip mechanism, including the spatial position, rotation direction, and rotation angle of the flip axis; Identify the origin coordinates of the workpiece before and after flipping; According to the origin coordinates of the workpiece before flipping, the offset of the origin coordinates of the workpiece after flipping, and the spatial position, rotation direction, and rotation angle of the flip axis, a rigid body transformation matrix in three-dimensional space is established to map the coordinate transformation relationship before / after flipping.

8. The method for controlling the flipping and alignment of a single-sided or double-sided panel turnover machine according to claim 1, wherein: Predicting the rollover deviation based on the theoretical position after the rollover includes: Perform flip tracking monitoring based on the alignment key points and structural features, collect real-time position and posture change information during the flip process, and construct an actual monitoring flip trajectory; Perform flip timing change prediction based on the actual monitored flip trajectory to obtain a predicted flip position at the end of the flip; A predicted deviation is obtained according to the predicted flipping position and the theoretical position after flipping.

9. The method for controlling the flipping and alignment of a single-sided or double-sided panel turning machine according to claim 8, wherein: Perform rollover parameter compensation analysis based on the predicted deviation, and perform rollover deviation compensation control according to the compensation parameters, including: Based on the physical material characteristics of the workpiece, the influence relationship between the flipping parameters and the flipping position is established; Establish a time series relationship chain of the flip transformation position trajectory, use the influence relationship to perform time series alignment compensation on the actual monitored flip trajectory, take the predicted deviation as the compensation target, and obtain the compensation parameters of each node in the flip transformation position trajectory; The compensation parameters of each node in the flip transformation position trajectory are used to perform flip trajectory deviation compensation control.

10. The flipping and positioning control system of the single-sided and double-sided flipping machine is characterized in that: The system is used to execute the flipping and alignment control method of the single-sided and double-sided flipping machine according to any one of claims 1 to 9, comprising: Structural analysis module: performs structural analysis on the flipped target and identifies key points and structural features; Theoretical position calculation module: establishes the coordinate transformation relationship before and after flipping, and calculates the theoretical position after flipping based on the current recognition posture and the alignment key points and structural features; Deviation compensation control module: performs rollover deviation prediction based on the theoretical position after rollover. When there is a deviation in the prediction result, rollover parameter compensation analysis is performed according to the predicted deviation, and rollover deviation compensation control is performed according to the compensation parameters; Secondary alignment module: obtains the alignment parameters of the sequential process, uses the alignment parameters of the sequential process to perform secondary alignment on the flipped target, determines that the alignment target is completed, and enters the next process connection processing.

Citation Information

Patent Citations

  • Cooperative control method and system for multi-pass rolling and annealing of copper wire based on intelligent network

    CN119620662A

  • Intelligent overturning control method and device based on machine vision

    CN119942001A

  • Optical alignment system and method for chip patch processing

    CN120070581A

  • Attitude determining method, electronic device, and readable storage medium

    WO2023016271A1

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