A kind of thick film resistance TCR performance testing device

Abstract

The application discloses a kind of thick film resistance TCR performance testing device of electric variable test technical field, to solve the problem of low efficiency of changing ambient temperature to measure thick film resistance TCR performance in prior art.It includes test line for conveying carrier, the carrier is carried with thick film resistance sheet, a plurality of drive assemblies are arranged in the conveying direction of test line on the side of test line, the output end of each drive assembly is provided with driving rod, the drive assembly can at least drive driving rod to move in vertical direction, the lower end of each driving rod is fixedly installed with heat exchange block, the temperature of multiple heat exchange blocks gradually increases along the conveying direction of test line, the position above heat exchange block is also provided with adjusting plate, the detection needle capable of penetrating heat exchange block is slidably arranged on adjusting plate in vertical direction;The application is used for efficiently and quickly measuring the performance of TCR aspect of thick film resistance, can quickly realize temperature control detection to the surface of thick film resistance, save energy.

Description

TECHNICAL FIELD

[0001] The present application relates to a kind of thick film resistance TCR performance testing device, belong to electric variable testing technical field. BACKGROUND

[0002] Thick film resistance is printed on ceramic substrate by screen printing technology, and is formed by high temperature sintering solidification, and the resistance chip is changed by laser engraving to make it can be applied to various application scenarios.The stability of thick film resistance product is guaranteed, and the resistance produced usually needs to be detected by power-on, to ensure that the performance of resistance meets the application requirements.

[0003] In addition to the resistance value of qualified thick film resistance, its TCR (temperature coefficient) performance at different temperatures, that is, the resistance value at different temperatures, needs to be measured.The traditional way is to use a temperature control cavity to measure the resistance value of thick film resistance at corresponding temperature by changing the temperature of cavity environment, but at least two groups of resistance value changes at different environmental temperatures need to be measured in TCR performance test, so the temperature of cavity internal environment needs to be changed in this way, which is extremely time-consuming in automatic assembly line detection work, and the ceramic substrate of resistance chip has large specific heat capacity, which is extremely energy-consuming in heat conduction process and affects the time of environmental temperature, which affects the efficient test of thick film resistance TCR performance. SUMMARY

[0004] The present application aims to overcome the deficiencies in the prior art, and provides a kind of thick film resistance TCR performance testing device, for efficiently and quickly measure the performance of thick film resistance TCR, can quickly realize the surface of thick film resistance to temperature control detection, save energy.

[0005] To achieve the above object, the present application is realized by using the following technical scheme:

[0006] The application provides a kind of thick film resistance TCR performance testing device, including the test line for conveying carrier, the carrier is carried with thick film resistance sheet, the test line is arranged with multiple drive components along the conveying direction of test line on one side, the output end of each drive component is provided with drive rod, the drive component can at least drive drive rod to move in vertical direction, the lower end of each drive rod is fixedly installed with heat exchange block, the temperature of multiple heat exchange blocks gradually increases along the conveying direction of test line, the position above heat exchange block is also provided with adjusting plate, the detection needle capable of penetrating heat exchange block is slidably arranged on adjusting plate along vertical direction, the detection needle is not less than two groups, the positioning disc between adjusting plate and heat exchange block is fixedly installed on the detection needle, the bottom of adjusting plate is provided with pressure sensor, the first spring is sleeved on the detection needle, and the first spring is respectively abutted on positioning disc and pressure sensor on both sides.

[0007] Specifically, the base is fixedly installed above the heat exchange block, and the adjusting plate is slidably installed on the base in the vertical direction.

[0008] Specifically, the temperature of the heat exchange block located at the most upstream of the test line is not higher than-45 DEG C, and the temperature of the heat exchange block located at the most downstream of the test line is not lower than 125 DEG C.

[0009] Specifically, the heat exchange block is divided into refrigeration block and heating block according to functionality, refrigeration medium and heating medium are respectively arranged in the refrigeration block and the heating block, a temperature sensor is arranged on the surface of the heat exchange block, a positioning frame is arranged below the refrigeration block and the heating block, the bottom of the positioning frame is provided with an opening, and an elastic sealing film is arranged at the opening position, the positioning frame is filled with heat-conducting silicone grease, and guide holes are respectively arranged between the refrigeration block, the heating block, the positioning frame and the elastic sealing film for the detection needle to pass through.

[0010] Specifically, it further includes a connecting piece, an overflow pipe is arranged on one side of the positioning frame in communication, a U-shaped bracket is arranged on one side of the heat exchange block, a piston rod and a movable rod are respectively arranged at two ends of the connecting piece, the piston rod is slidably arranged in the overflow pipe, the movable rod is slidably penetrated through the U-shaped bracket, and a sliding piece is arranged at the other end of the movable rod, a second spring is sleeved on the movable rod and abutted on the sliding piece and the wall surface of the U-shaped bracket on both sides, a U-shaped photoelectric sensor is arranged on the U-shaped bracket, and the sliding piece can be detected by the U-shaped photoelectric sensor.

[0011] Specifically, the U-shaped photoelectric sensor is arranged in not less than two groups, and the second spring can drive the movable sliding piece to move to a position outside the two groups of U-shaped photoelectric sensors after the elastic sealing film is separated from the surface of the thick film resistance sheet.

[0012] Specific, the inside of the refrigeration block is divided into two cavities by a partition, a labyrinth heat exchange plate is arranged in the upper cavity, refrigeration gas is introduced into the upper cavity, and cooling liquid is arranged in the lower cavity.

[0013] Specifically, the first and second air inlet pipes are connected to the main air inlet pipe of the refrigeration block at the downstream side, the first air inlet pipe is used for connecting high-pressure cooling gas, the second air inlet pipe is connected to the exhaust port of the adjacent upstream refrigeration block, and the electromagnetic flow valves are arranged on the first and second air inlet pipes.

[0014] Specifically, the internal cavity of the heating block is filled with heat-conducting oil, and the heating block is provided with an electric heating pipe for heating the heat-conducting oil.

[0015] Specifically, the test line is further provided with a return line on one side, a sorting device is arranged between the test line and the return line, and a blowing assembly is arranged on the test line between the refrigeration block and the heating block, and the blowing assembly is used for blowing air to the surface of the thick film resistor sheet.

[0016] Compared with the prior art, the present application has the following advantages:

[0017] The present application sets multiple detection modules on the circumferential side of the detection line, each detection module has a heat exchange block with different temperatures for directly contacting the surface of the thick film resistor, and the detection needle is used to contact the test point through the heat exchange block after contacting to measure the resistance under the corresponding environmental temperature. At the same time, the pressure sensor is arranged to detect the pressure of the detection needle, so as to avoid the error caused by the excessive pressure on the test point position to expand the detection resistance value. The detection line uses a stepping mode to convey the thick film resistor sheet for measurement, which can directly and quickly measure the resistance value under different environmental temperatures at each different station, so that the TCR performance data of the thick film resistor can be quickly obtained. The device does not need to configure a heat preservation cavity environment, and does not need to heat exchange the ceramic substrate, which saves energy, has a simple structure, and is convenient, efficient and fast in action. The TCR performance of the measured resistor can be quickly obtained.

[0018] The present application improves the contact surface of the resistor, uses fluid heat-conducting silicone grease to contact the surface of the thick film resistor, which can avoid the excessive pressure of the heat exchange block on the surface of the thick film resistor to affect the accurate measurement of the resistance value of the thick film resistor, and is beneficial to reduce the measurement error and ensure the accuracy of the test results. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 is the overall structure schematic diagram of the TCR performance test device provided by the embodiment of the present application;

[0020] Figure 2 is the overall structure schematic diagram of the TCR performance test device provided by the embodiment of the present application;Figure 1 Enlarged view of section A of the TCR performance testing device provided in the embodiment;

[0021] Figure 3 This is the present invention. Figure 1 Enlarged view of section B of the TCR performance testing device provided in the embodiment;

[0022] Figure 4 This is a schematic diagram of the structure of the refrigeration component provided in an embodiment of the present invention;

[0023] Figure 5 This is the present invention. Figure 4 Enlarged view of the structure at point C of the refrigeration component provided in the embodiment;

[0024] Figure 6 This is a top view of the refrigeration component provided in an embodiment of the present invention;

[0025] Figure 7 This is the present invention. Figure 6 A DD-direction cross-sectional view of the cooling component provided in the embodiment;

[0026] Figure 8 This is the present invention. Figure 7 An enlarged view of the structure at point E of the refrigeration component provided in the embodiment;

[0027] Figure 9 This is the present invention. Figure 7 Enlarged view of the structure at point F of the refrigeration component provided in the embodiment;

[0028] Figure 10 This is a top view of the heating component provided in an embodiment of the present invention;

[0029] Figure 11 This is the present invention. Figure 10 A cross-sectional view of the heating component provided in the embodiment;

[0030] Figure 12 This is the present invention. Figure 11 Enlarged view of the structure at point H of the heating component provided in the embodiment;

[0031] 1, test line; 2, carrier; 3, driving assembly; 4, driving rod; 5, heat exchange block; 6, adjusting plate; 7, probe needle; 8, positioning disc; 9, first spring; 10, pressure sensor; 11, base; 12, temperature sensor; 13, positioning frame; 14, elastic sealing film; 15, overflow pipe; 16, U-shaped frame; 17, connecting sheet; 18, piston rod; 19, movable rod; 20, second spring; 21, U-shaped photoelectric sensor; 22, sliding sheet; 23, replenishment pipe; 24, sealing head; 25, partition plate; 26, labyrinth heat exchange plate; 27, heat preservation layer; 28, main air inlet pipe; 29, first air inlet pipe; 30, second air inlet pipe; 31, electromagnetic flow valve; 32, electric heating pipe; 33, blowing assembly; 34, return line; 35, sorting device. DETAILED DESCRIPTION

[0032] The application will be further described below with reference to the drawings. The following examples are only used to more clearly illustrate the technical solutions of the application, and cannot be used to limit the protection scope of the application.

[0033] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only used to facilitate the description of the present application and simplify the description, and therefore cannot be understood as indicating or implying that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. In addition, the terms "first", "second" and the like are only used for description purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined with "first", "second" and the like can explicitly or implicitly include one or more features. In the description of the present application, unless otherwise specified, the meaning of "a plurality of" is two or more.

[0034] In the description of the present application, it should be noted that, unless otherwise explicitly specified and limited, the terms "mounting", "connection" and "connection" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium, or it can be connected inside two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0035] The embodiment of the application provides a kind of thick film resistance TCR performance testing device, for efficiently and quickly measure the TCR performance of thick film resistance, can quickly realize the temperature control detection to the surface of thick film resistance, save energy, in order to realize the structure function of device, here setting device includes the test line 1 for conveying carrier 2, test line 1 preferably adopts the structure of conveyer belt with limiting function, to be used for positioning the detection position of carrier 2, configuration carrier 2 is carried with thick film resistance sheet, so as to realize the positioning of thick film resistance sheet detection position by limiting the position of carrier 2, in order to quickly obtain the TCR performance of the resistance to be measured, here can be arranged multiple drive assemblies 3 on the side of test line 1 along the conveying direction of test line 1, as shown in Figure 1 And Figure 4 Etc., the output end of each drive assembly 3 is provided with drive rod 4, and drive assembly 3 can at least drive drive rod 4 to move in vertical direction, preferably, in order to prevent the position deviation of measured thick film resistance sheet from causing inaccurate detection point position, here can be configured as shown in Figure 4 Drive rod 4 can be self-rotating and transversely moving in space range by multi-directional rotation and lifting movement, so that detection needle 7 arranged on drive rod 4 can accurately move to detection position (need to cooperate with recognition camera to regulate position), and specific structure composition will not be described here, in order to quickly let the surface of thick film resistance sheet reach measured temperature, here heat exchange block 5 is fixedly installed at the lower end of each drive rod 4, and the surface of measured resistance is contacted directly by heat exchange block 5 to realize direct cooling or heating of resistance film, the temperature of multiple heat exchange blocks 5 gradually increases along the conveying direction of test line 1, and heat exchange block 5 is not less than two groups, for measuring the difference of resistance when temperature changes to obtain related TCR performance parameters, during testing, heat exchange block 5 does not deviate from the surface of thick film resistance sheet, so as to obtain the data of resistance under stable temperature, and in order to realize the contact test of detection needle 7 when heat exchange block 5 is pressed, here adjusting plate 6 is further provided above heat exchange block 5, here can refer to Figure 8 Detection needle 7 is arranged on adjusting plate 6 and can penetrate heat exchange block 5 in vertical direction, and detection needle 7 is not less than two groups for connecting and contacting corresponding contact points on thick film resistance, in order to avoid that the pressure of detection needle 7 or heat exchange block 5 on thick film resistance sheet is too large, here positioning disc 8 is fixedly installed on detection needle 7 between adjusting plate 6 and heat exchange block 5, and pressure sensor 10 is arranged at the bottom of adjusting plate 6, and finally first spring 9 is sleeved on detection needle 7 and abuts on positioning disc 8 and pressure sensor 10 on both sides, as shown in Figure 8As shown, through the connection of the structure, when the device works, the detection needle 7 will first contact the test point of the measured thick film resistor sheet, and then the heat exchange block 5 will continue to press down, the detection needle 7 will rebound through the force of the first spring 9 until the lower end of the heat exchange block 5 contacts the surface of the thick film resistor sheet, the first spring 9 is compressed to the working position to measure the current pressure value, the lower end of the heat exchange block 5 can adopt an elastic layer, so that it has a certain height fine tuning ability, so that the pressure of the detection needle 7 during detection can be changed, so as to avoid the influence on the measurement of the resistor due to excessive pressure, or when the heat exchange block 5 moves to the contact position, if the pressure sensor 10 detects that the pressure is too large, manual adjustment can be performed in the form of warning, so as to improve the pressure range of the detection needle 7 during work. Through the design of the above structure, the device can quickly realize the measurement of resistance value under different temperature environments during the conveying of the thick film resistor sheet, so as to efficiently obtain the resistance parameter and TCR performance of the corresponding thick film resistor sheet, so as to quickly detect the defective products for secondary adjustment or scrap, without the need of preparing an additional temperature control environment, which is beneficial to guarantee the energy utilization efficiency and reduce energy loss.

[0036] The thick film resistor TCR performance testing device provided by the embodiment of the present application can conveniently adjust the pressure of the detection needle 7 during work, as shown, a base 11 is fixedly installed above the heat exchange block 5, the adjusting plate 6 is slidably installed on the base 11 in the vertical direction, and a positioning mechanism for positioning the adjusting plate 6 is further arranged on the base 11. Figure 8 As shown, when the heat exchange block 5 contacts the surface of the thick film resistor sheet, if the compression length of the first spring 9 is too large, it indicates that the detection needle 7 has considerable pressure acting on the test point, when the pressure of the measured point is too large, by adjusting the adjusting plate 6 to be adjusted by a certain position distance, the compression amount of the first spring 9 can be shortened, so that the pressure of the detection needle 7 on the measured point is reduced, until the pressure range is adjusted to the allowable range during testing.

[0037] This invention provides a thick-film resistor TCR performance testing device. To improve the accuracy of the measured TCR data and to assess the resistance performance of the thick-film resistor under different ambient temperatures, the temperature of the heat exchange block 5 located at the upstream end of test line 1 is set not higher than -45℃, and the temperature of the heat exchange block 5 located at the downstream end of test line 1 is set not lower than 125℃. This increases the temperature difference between the upstream and downstream sides to obtain more accurate TCR data. To accommodate this temperature difference, the heat exchange block 5 can be functionally divided into a cooling block and a heating block. The cooling block and heating block are respectively equipped with a cooling medium and a heating medium. The cooling medium is preferably propylene glycol (freezing point -60℃ to -50℃) to avoid damage to the structure due to solidification expansion. The heating medium is preferably heat-conducting oil. A temperature sensor 12 is provided on the surface of the heat exchange block 5 to detect the temperature of the cooling and heating media. To avoid excessive pressure on the thick-film resistor from the heat exchange block 5 itself, flexible contact can be used to further reduce the pressure on the thick-film resistor. For details, please refer to... Figure 8 As shown, a positioning frame 13 is installed below both the cooling block and the heating block. The bottom of the positioning frame 13 is set as an opening, and an elastic sealing membrane 14 is provided at the opening position. Thermally conductive silicone grease is filled inside the positioning frame 13. After the thermally conductive silicone grease is filled, the elastic sealing membrane 14 protrudes from the bottom surface of the positioning frame 13. At this time, the thermally conductive silicone grease exchanges heat with the heat exchange block 5 above, and contacts the surface of the thick film resistor below through the elastic sealing membrane 14. Since the thermally conductive silicone grease can maintain a fluid state in the test range of -50℃ to 125℃, the actual pressure is lower than that of other elastic materials, and it has a high deformation capacity, which can also ensure good contact with the thick film resistor sheet. During the test, guide holes are provided at the positions between the cooling block, the heating block, the positioning frame 13 and the elastic sealing membrane 14 for the probe 7 to pass through. This structural design utilizes the excellent thermal conductivity of thermally conductive silicone grease to achieve precise temperature transfer. Furthermore, being in a fluid state, it can provide lower pressure while maintaining significant deformation capacity, thereby reducing data measurement errors. It also avoids irreversible pressure damage to the resistor sheet caused by impurities on its surface during downward pressure. In addition, the bottom of the probe 7 preferably features a 45° bend, which, compared to directly placing the elastic layer at the bottom of the heat exchange block 5, provides better compatibility with the elastic sealing membrane 14, preventing situations where the bottom of the probe 7 contacts the thick-film resistor sheet but the elastic layer fails to make proper contact. In some preferred embodiments, refer to... Figure 12 As shown, by providing a supply pipe 23 on one side of the positioning frame 13, the thermal grease inside can be easily replaced and refilled. A sealing head 24 is provided on the open side of the supply pipe 23 to ensure a closed environment when the thermal grease is working.

[0038] The embodiment of the present application provides a kind of thick film resistance TCR performance testing device, such as Figure 4 、 Figure 5 And Figure 9As shown, in the way of contacting the measured thick film resistor sheet with the heat-conducting silicone grease and the elastic sealing film 14, it is difficult to determine whether the elastic sealing film 14 is well held on the surface of the thick film resistor sheet, so it is necessary to provide a parameter for convenient measurement to determine the contact condition of the elastic sealing film 14. In order to facilitate the conversion of this inconvenient parameter, the device is also provided with a connecting piece 17. Specifically, an overflow pipe 15 is provided on one side of the positioning frame 13 in communication, and a U-shaped bracket 16 is provided on one side of the heat exchange block 5. A piston rod 18 and a movable rod 19 are respectively installed at both ends of the connecting piece 17. The piston rod 18 is slidingly arranged in the overflow pipe 15. The movable rod 19 is slidingly penetrated through the U-shaped bracket 16, and the other end of the movable rod 19 is provided with a sliding sheet 22. A second spring 20 is sleeved on the movable rod 19 and abuts against the sliding sheet 22 and the wall surface of the U-shaped bracket 16 on both sides. Through this configuration, the second spring 20 abuts against the sliding sheet 22 to drive the piston rod 18 to extrude the heat-conducting silicone grease under normal conditions, so that the pressure of the heat-conducting silicone grease in the positioning frame 13 is increased, causing the elastic sealing film 14 to have a downward protruding tendency. When the elastic sealing film 14 contacts the surface of the measured resistor sheet, with the increase of the contact surface and the increase of the extrusion condition, the piston rod 18 drives the sliding sheet 22 to abut against the second spring 20 to move to the other side, so that whether the elastic sealing film 14 realizes reliable contact can be determined by monitoring the offset of the moving position. Therefore, a U-shaped photoelectric sensor 21 is provided on the U-shaped bracket 16, and the sliding sheet 22 can be detected by the U-shaped photoelectric sensor 21, so that the deformation of the elastic sealing film 14 can be measured. According to the surface area of the overflow pipe 15 and the pressure obtained from the position of the second spring 20, the pressure of the heat-conducting silicone grease can be roughly calculated, and the pressure of the heat-conducting silicone grease is preferably controlled within 0.02 Mpa. In addition to detecting the deformation of the elastic sealing film 14, it is also necessary to consider avoiding the potential risk of the positioning frame 13 directly contacting the surface of the thick film resistor sheet due to excessive movement amplitude. Therefore, it is necessary to configure the U-shaped photoelectric sensor 21 to be not less than two groups, and the second spring 20 can drive the sliding sheet 22 to move to a position outside the two groups of U-shaped photoelectric sensors 21 after the elastic sealing film 14 is separated from the surface of the thick film resistor sheet. The first U-shaped photoelectric sensor 21 is arranged at a position where the elastic sealing film 14 and the thick film resistor sheet realize reliable contact, and the second U-shaped photoelectric sensor 21 is arranged at a position where the elastic sealing film 14 is extruded to the limit. When the sliding sheet 22 is located between the two U-shaped photoelectric sensors 21, it belongs to the normal working state. When an abnormality occurs, an alarm is given and manual maintenance is carried out.It should be noted that when regulating the pressure of the probe needle 7, the appropriate pressure range of the probe needle 7 should be matched with the normal working range of the elastic sealing film 14, if the probe needle 7 cannot work at the appropriate pressure when the sliding sheet 22 is located between the two U-shaped photoelectric sensors 21, that is, the driving rod 4 cannot meet the pressure control requirements of the probe needle 7 at the corresponding height position, the position of the adjusting plate 6 needs to be re-regulated so that the probe needle 7 and the elastic sealing film 14 can be matched at the same time.

[0039] The embodiment of the present application provides a kind of TCR performance test device of thick film resistance, specifically provides a kind of operation structure of refrigeration block and its principle, specifically, here is configured to be divided into two cavities by partition 25 in refrigeration block, as shown in Figure 8 As shown, labyrinth heat exchange plate 26 can be provided in the upper cavity, and refrigeration gas is introduced into the upper cavity, cooling liquid (such as propylene glycol) is provided in the lower cavity, during operation, the refrigeration gas (such as liquid nitrogen) is rapidly cooled by the labyrinth heat exchange plate 26, and the low temperature is radiated to the cooling liquid in the lower cavity through the heat conduction of the labyrinth heat exchange plate 26, the temperature of the cooling liquid is detected by the temperature sensor 12, so that the cooling liquid is in contact with the surface of the thick film resistor in the appropriate temperature range to realize heat exchange, the cooling capacity is adjusted by controlling the flow rate of the refrigeration gas, the specific heat capacity of the cooling liquid and the relatively stable temperature change are used to avoid large temperature difference during testing, in order to avoid the influence of environmental heat exchange, a heat preservation layer 27 can be provided on the outside of the heat exchange block 5 to prevent the cold source from dissipating quickly and increase the application cost.

[0040] The embodiment of the present application provides a kind of TCR performance test device of thick film resistance, considering that the required temperature of the refrigeration block located downstream is higher than that of the upstream refrigeration block, therefore in some other embodiments, in order to further effectively utilize the refrigeration source, the first gas inlet pipe 29 and the second gas inlet pipe 30 can be further connected to the main gas inlet pipe 28 on the refrigeration block located downstream, the first gas inlet pipe 29 is configured to connect high-pressure cold gas, and the second gas inlet pipe 30 is configured to connect the exhaust port of the adjacent upstream refrigeration block, at this time, the cold gas source of the refrigeration block located downstream can be mainly supplied by the exhaust pipe of the upstream refrigeration block, when the low-temperature requirement cannot be met, the mixed cooling can be realized by the high-pressure cold gas connected by the first gas inlet pipe 29, so that the mixed gas can meet the use requirement, in order to facilitate the regulation of the flow rate ratio of the first gas inlet pipe 29 and the second gas inlet pipe 30 according to the feedback of the temperature sensor 12, electromagnetic flow valves 31 are arranged on the first gas inlet pipe 29 and the second gas inlet pipe 30 to control the relative flow rates of the two pipes.

[0041] The thick film resistor TCR performance testing device provided by the embodiment of the present application can fill the heat-conducting oil in the internal cavity of the heat exchange block 5 under the heating demand of the heat exchange block 5, directly realize the temperature rising of the heat-conducting oil by arranging the electric heating pipe 32 for heating the heat-conducting oil in the internal cavity of the heat exchange block, and control the temperature range by the corresponding temperature sensor 12.

[0042] In some other preferred embodiments, in order to facilitate the rejection of defective thick film resistor sheets, the return line 34 is arranged on one side of the test line 1, the sorting device 35 or sorting mechanical hand is arranged between the test line 1 and the return line 34, the products of different qualities are sorted in the return line 34 for classification, the products are placed in different width positions of the return line 34 according to the quality difference and flow out, the accurate screening is realized, in order to avoid the water droplets condensed on the surface of the thick film resistor sheet after the low-temperature test, the blowing assembly 33 is arranged on the test line 1 between the refrigeration block and the heat exchange block, the blowing assembly 33 is used for blowing the thick film resistor sheet on the surface of the test line 1, the air source can be the heated air source, and the surface of the resistor sheet is quickly dried. However, the test environment is preferably the dry factory workshop, which is used for avoiding the ice crystals condensed on the surface of the elastic sealing film 14 for a long time and needs to be cleaned in time.

[0043] The above only describes the preferred embodiments of the present application, and it should be pointed out that, for ordinary skilled in the art, without departing from the technical principles of the present application, a number of improvements and modifications can be made, and these improvements and modifications should be considered as the protection scope of the present application.

Claims

1. A thick film resistor TCR performance test apparatus, characterized by, The utility model provides a test line (1) for conveying carrier (2), the carrier (2) is loaded with thick film resistance sheet, the test line (1) is arranged with a plurality of drive assemblies (3) on one side along the conveying direction of test line (1), and the output end of each drive assembly (3) is provided with drive rod (4), the drive assembly (3) can at least drive drive rod (4) to move in vertical direction, the lower end of each drive rod (4) is fixedly installed with heat exchange block (5), the temperature of a plurality of heat exchange blocks (5) gradually increases along the conveying direction of test line (1), the upper position of heat exchange block (5) is also provided with adjusting plate (6), the detecting needle (7) capable of penetrating heat exchange block (5) is slidably arranged on adjusting plate (6) along the vertical direction, the detecting needle (7) is not less than two groups, the locating disc (8) between adjusting plate (6) and heat exchange block (5) is fixedly installed on the detecting needle (7), the bottom of adjusting plate (6) is provided with pressure sensor (10), the detecting needle (7) is sleeved with first spring (9) that is abutted on the locating disc (8) and pressure sensor (10) respectively on both sides. The heat exchange block (5) is divided into refrigeration block and heating block according to functionality, refrigeration medium and heating medium are respectively arranged in the refrigeration block and the heating block, a temperature sensor (12) is arranged on the surface of the heat exchange block (5), a locating frame (13) is arranged below the refrigeration block and the heating block, the bottom of the locating frame (13) is provided with an opening and an elastic sealing film (14) is arranged at the opening position, the locating frame (13) is filled with heat-conducting silicone grease, and guide holes are arranged between the refrigeration block, the heating block, the locating frame (13) and the elastic sealing film (14) for the detecting needle (7) to pass through.

2. A thick film resistor TCR performance test apparatus as defined in claim 1, wherein, A pedestal (11) is fixedly installed above the heat exchange block (5), the adjusting plate (6) is slidably installed on the pedestal (11) in the vertical direction, and a positioning mechanism for positioning the adjusting plate (6) is further arranged on the pedestal (11).

3. A thick film resistor TCR performance test apparatus as defined in claim 1, wherein, The temperature of the heat exchange block (5) located at the most upstream of the test line (1) is not higher than-45 DEG C, and the temperature of the heat exchange block (5) located at the most downstream of the test line (1) is not lower than 125 DEG C.

4. A thick film resistor TCR performance test apparatus as claimed in claim 3, wherein, A connecting piece (17) is further arranged, an overflow pipe (15) is arranged on one side of the locating frame (13), a U-shaped bracket (16) is arranged on one side of the heat exchange block (5), a piston rod (18) and a movable rod (19) are respectively arranged at two ends of the connecting piece (17), the piston rod (18) is slidably arranged in the overflow pipe (15), the movable rod (19) slidably penetrates the U-shaped bracket (16), and a sliding plate (22) is arranged at the other end of the movable rod (19), a second spring (20) is sleeved on the movable rod (19) and abuts on the sliding plate (22) and the wall surface of the U-shaped bracket (16) respectively on both sides, a U-shaped photoelectric sensor (21) is arranged on the U-shaped bracket (16), and the sliding plate (22) can be detected by the U-shaped photoelectric sensor (21).

5. A thick film resistor TCR performance test apparatus as claimed in claim 4, wherein, The U-shaped photoelectric sensor (21) is arranged in not less than two groups, and the second spring (20) can drive the sliding sheet (22) to move to a position outside the two groups of U-shaped photoelectric sensors (21) after the elastic sealing film (14) is separated from the surface of the thick film resistor sheet.

6. A thick film resistor TCR performance test apparatus as defined in claim 4, wherein, The inside of the refrigeration block is divided into two cavities by a partition (25), the upper cavity is provided with a labyrinth heat exchange plate (26), the upper cavity is filled with refrigeration gas, the lower cavity is filled with cooling liquid, and the outside of the heat exchange block (5) is provided with a heat preservation layer (27).

7. A thick film resistor TCR performance test apparatus as claimed in claim 6, wherein, The first air inlet pipe (29) is used for connecting high-pressure cold gas, the second air inlet pipe (30) is connected with the exhaust port of the adjacent upstream refrigeration block, and the first air inlet pipe (29) and the second air inlet pipe (30) are both provided with electromagnetic flow valves (31).

8. The thick film resistor TCR performance test apparatus of claim 4, wherein, The inside of the heating block is filled with heat-conducting oil, and the heating block is provided with an electric heating pipe (32) for heating the heat-conducting oil.

9. The thick film resistor TCR performance test apparatus of claim 4, wherein, The test line (1) is also provided with a return line (34) on one side, and the test line (1) and the return line (34) are also provided with a sorting device (35), the test line (1) is also provided with a blowing assembly (33) between the refrigeration block and the heating block, and the blowing assembly (33) is used for blowing gas to the thick film resistor sheet on the surface of the test line (1).

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