Method and system for testing potentiometer

Abstract

The invention belongs to the technical field of performance testing of potentiometers, and particularly relates to a potentiometer testing method which comprises the steps that testing information is acquired, and the testing information comprises a plurality of electrical characteristic data acquired by testing a plurality of potentiometers of a current testing batch according to a preset testing strategy; the electrical characteristic data comprises a plurality of test node identifiers and corresponding test voltages; according to the test information, acquiring a potentiometer test result of the current test batch, and sending prompt information to the user equipment when the test result indicates that the test is abnormal; wherein the preset test strategy means that different states of the potentiometer are used as different test nodes; and adjusting test parameters of subsequent test nodes according to the test result of the previous test node, wherein the test parameters comprise a test voltage, a sampling frequency or a test angle range. By dynamically adjusting the test parameters, the test is highly matched with the actual performance of the potentiometer.

Description

Technical Field

[0001] This invention relates to the technical field of potentiometer performance testing, specifically to a potentiometer testing method and system. Background Technology

[0002] Potentiometers, as fundamental electronic components, play a crucial role in various control and feedback applications, ranging from adjusting desk lamp brightness to providing steering feedback in vehicles. Performance testing is a key aspect of potentiometer production and quality control. However, traditional potentiometer testing methods have several shortcomings. Typically, testers need to manually record data and waveforms for each test parameter and analyze the measurement results. This method is inefficient, labor-intensive, and prone to errors in data recording and analysis, leading to low test quality.

[0003] Therefore, we propose a potentiometer testing method and system to solve the above problems. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides a potentiometer testing method and system, which solves the problems mentioned in the background section.

[0005] To achieve the above objectives, the present invention specifically adopts the following technical solution: On the one hand, a method for testing a potentiometer is provided, the method comprising: Acquire test information, which includes multiple electrical characteristic data obtained from testing multiple potentiometers in the current test batch according to a preset test strategy; the electrical characteristic data includes multiple test node identifiers and their corresponding test voltages; Based on the test information, obtain the potentiometer test results for the current test batch, and send a prompt message to the user device when the test results indicate a test abnormality; The preset test strategy refers to using different states of the potentiometer as different test nodes. The test parameters of subsequent test nodes are adjusted based on the test results of the previous test node. The test parameters include test voltage, sampling frequency, or test angle range.

[0006] The beneficial effects are as follows: Dynamically adjusting test parameters ensures the test closely matches the actual performance of the potentiometer. Fine-tuning the test voltage accurately measures the resistance change of the potentiometer under different voltages, avoiding deviations. Multiple test nodes comprehensively evaluate potentiometer performance, covering various actual operating conditions. Combined with dynamic parameter adjustments, in-depth analysis of performance changes improves test accuracy. Adjusting subsequent tests based on test node results optimizes resource allocation. Reducing test resources for nodes with stable performance and increasing sampling or test items for nodes with large fluctuations improves efficiency and reduces costs. The dynamic adjustment mechanism makes the testing process efficient and flexible. Timely identification and adjustment of problems avoids redundant or excessive testing, shortening time and improving efficiency. This method can be considered suitable for multi-potentiometer production scenarios, considering performance differences between different batches and process conditions. Dynamically adjusting parameters adapts to the testing needs of new potentiometer models or improved products, reducing additional development costs.

[0007] Furthermore, the test parameters for subsequent test nodes are adjusted based on the test results of the previous test node, including: If the number of potentiometers whose test voltage deviates from the preset threshold range at the previous test node meets its corresponding proportion, then the sampling frequency of subsequent nodes is increased; or, If the number of potentiometers whose linearity error at the previous test node exceeds the preset tolerance meets its corresponding proportion, then the test voltage at subsequent nodes is reduced and the test angle range is expanded.

[0008] The beneficial effects are as follows: For voltage deviation adjustments, increasing the sampling frequency and narrowing the test angle range allows for more precise focusing on specific areas of potentiometer performance abnormalities. This centralized testing strategy effectively increases the probability of discovering potential fault points and reduces missed detections due to excessively large test ranges or insufficient sampling, thus more accurately assessing the actual performance of the potentiometer. For linearity error adjustments, reducing the test voltage and expanding the test angle range allows for a more comprehensive examination of the potentiometer's linearity characteristics. Reducing the voltage helps avoid misjudgments of potentiometer performance due to improper test conditions, while expanding the angle range fully exposes the potentiometer's linearity performance across its entire operating range, providing more comprehensive data support for accurately assessing whether it meets usage requirements. By dynamically adjusting the test parameters of subsequent nodes based on the test results of the previous node, test resources can be allocated more rationally. For areas with normal performance, the investment of test resources can be appropriately reduced; while for areas with potential problems, resources can be concentrated for in-depth testing. This ensures both the comprehensiveness and accuracy of the test while avoiding unnecessary resource waste and improving test efficiency. Simultaneously, the dynamic adjustment mechanism avoids unnecessary repetition of tests at subsequent test nodes. If the test parameters for subsequent nodes are not adjusted according to the actual situation, it may lead to repeated testing of areas with known problems or over-testing of normal areas. Targeted adjustments can effectively reduce these redundant testing steps, shorten the testing cycle, and lower testing costs.

[0009] Furthermore, the test parameters for subsequent test nodes are adjusted based on the test results of the previous test node, including: If the number of potentiometers whose test voltage deviates from the preset threshold range in the previous test node meets its corresponding proportion, the adjustment coefficient is updated according to the proportion of linearity error; the proportion of linearity error is the proportion of the number of potentiometers whose linearity error in the previous test node exceeds the preset tolerance. Based on the sampling frequency, contact resistance change, total resistance, and updated adjustment coefficient of the current test node, obtain the sampling frequency of the subsequent test nodes; at the same time, determine whether the number of linearity errors is its corresponding proportion. If the voltage exceeds the limit, the test voltage of subsequent nodes will be reduced and the test angle range will be expanded.

[0010] The beneficial effects are as follows: based on the test results of the previous node, parameters such as sampling frequency, test voltage, and angle range of subsequent test nodes can be adjusted in a targeted manner. For areas with relatively stable performance or where voltage deviation and linearity error are not significant, the investment of test resources can be reasonably reduced; while for areas with potential problems or large performance fluctuations, resources can be concentrated for more in-depth testing. This flexible resource allocation method avoids unnecessary redundant testing, improves testing efficiency, reduces testing costs, and achieves efficient utilization of test resources while ensuring test quality.

[0011] Furthermore, adjusting the test parameters specifically includes: based on the change in contact resistance of the previous test node, calculating the sampling frequency of the subsequent node according to the following formula: fn+1=fn×(1+k·ΔRc / Rt) where fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the change in contact resistance, Rt is the total resistance, and k is the adjustment coefficient.

[0012] The beneficial effects are as follows: Dynamically adjusting the sampling frequency based on changes in contact resistance allows the sampling process to better adapt to the actual performance variations of the potentiometer. When contact resistance changes significantly, appropriately increasing the sampling frequency can capture subtle performance changes in the potentiometer under different conditions, thereby obtaining richer and more accurate data, reducing data loss due to insufficient sampling, and improving the accuracy of test results. Optimizing the sampling frequency based on contact resistance changes allows test resources to be more effectively concentrated in areas where potentiometer performance changes are significant. This helps in in-depth analysis of the potentiometer's performance in these key areas, more accurately identifying potential quality problems or performance fluctuations. Different potentiometers may have different contact resistance variation characteristics due to factors such as materials and manufacturing processes. This method of adjusting the sampling frequency based on contact resistance changes can flexibly adapt to potentiometers with various characteristics. Whether the contact resistance change is relatively gradual or fluctuates significantly, appropriate test data can be obtained through corresponding sampling frequency adjustments, improving the versatility and flexibility of the testing method.

[0013] Furthermore, the step of sending a prompt message to the user device when the test result indicates a test abnormality includes: When the test results indicate an anomaly, the relevant parameters in the historical test database are retrieved based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters; An anomaly analysis report is generated based on the associated parameters and synchronized to the user equipment along with the location identifier and deviation data of the abnormal potentiometer as a prompt.

[0014] The beneficial effects are as follows: In-depth analysis based on correlated parameters can penetrate the surface of problems to uncover their essence, generating detailed reports that clearly present the full picture of anomalies. Users can then accurately grasp the severity, scope of impact, and development trend of anomalies, enabling them to formulate precise and effective solutions. Anomaly alerts are simultaneously sent to user devices, achieving real-time feedback on quality issues. Users no longer need to wait for the testing process to complete before viewing the report; they can immediately be aware of anomalies occurring on the production line, intervene promptly, avoid mass production of defective products, reduce production costs, and improve overall quality control efficiency. The organic combination of historical data and real-time anomaly information provides strong support for quality control decisions. Based on rich data resources, users can accurately assess the stability of production processes and the reliability of product quality, specifically optimizing processes and strengthening weak links to improve product quality from the root.

[0015] Furthermore, obtain test information, including: The potentiometer shaft is controlled by a direct-drive motor to rotate at a preset speed, and the following operations are performed synchronously during the rotation: Collect data on the change in contact resistance and rotational torque between the moving contact of the potentiometer and the resistive element; The test voltage loading position is dynamically adjusted based on the change in contact resistance, so that the test voltage is always loaded at the critical point of contact between the moving contact and the resistive element. The test voltage corresponding to each test node is used as multiple electrical characteristic data and saved; when the rotational torque deviates from the preset threshold range, an abnormal contact pressure alarm is triggered and the current rotation angle coordinates are recorded.

[0016] The beneficial effects are as follows: By dynamically adjusting the test voltage application position, the test voltage is ensured to always act on the actual contact point between the moving contact and the resistive element. This precise voltage application method can more accurately reflect the electrical performance of the potentiometer under actual working conditions, avoiding measurement errors caused by voltage application position deviations, thereby significantly improving the accuracy and reliability of test results. Simultaneous acquisition of contact resistance changes and rotational torque data enables comprehensive monitoring of the potentiometer's mechanical and electrical performance. Multi-dimensional data acquisition methods can more completely assess the potentiometer's quality status, discovering potential problems that cannot be detected by single data acquisition, further improving test accuracy and reliability. Real-time monitoring and abnormal alarm functions for rotational torque can promptly detect contact pressure problems that may occur during potentiometer rotation. This helps to quickly locate the fault location, take corresponding repair or adjustment measures, reduce the defect rate in the production process, and improve product quality control.

[0017] Furthermore, dynamically adjusting the application position of the test voltage based on the change in contact resistance includes: Obtain the critical point detection threshold for the change in contact resistance; when the real-time collected change in contact resistance exceeds the critical point detection threshold, determine that the moving contact and the resistive body are at the contact critical point; The test voltage application path is dynamically switched to the electrode position corresponding to the critical point; after the voltage application position is adjusted, the change in contact resistance is re-detected to verify the critical point state, thus forming a closed-loop feedback control.

[0018] The beneficial effects are as follows: By accurately identifying the critical point of contact resistance change and dynamically adjusting the test voltage application position, it ensures that the test voltage is always applied at the actual contact critical point between the moving contact and the resistive element. This avoids measurement errors caused by deviations in the application position, improves the accuracy of potentiometer electrical performance testing, and makes the test results more accurately reflect the actual performance of the potentiometer. The introduction of a closed-loop feedback control mechanism ensures the accuracy of each voltage application position adjustment, avoiding repeated adjustments and unnecessary test steps. Real-time monitoring of contact resistance changes and rapid response to critical point states ensure precise control of the potentiometer contact state during testing. Closed-loop feedback control further enhances stability and reliability, ensuring the accuracy of test results and the smooth operation of the test process even in complex testing environments, reducing the risk of misjudgment due to errors.

[0019] On the other hand, a potentiometer testing system is provided, the testing system including a driving module, a data acquisition module and a controller; The drive module includes a direct drive motor and its corresponding reducer, used to synchronously control the potentiometer angle of multiple potentiometers in the current test batch; The acquisition module is used to acquire the voltage, current and rotation angle signals of each potentiometer in the current test batch; The controller, the drive module, and the acquisition module are electrically connected, and the controller is configured to: Acquire test information, which includes multiple electrical characteristic data obtained from testing multiple potentiometers in the current test batch according to a preset test strategy; the electrical characteristic data includes multiple test node identifiers and their corresponding test voltages; Based on the test information, obtain the potentiometer test results for the current test batch, and send a prompt message to the user device when the test results indicate a test abnormality; The preset test strategy refers to using different states of the potentiometer as different test nodes. The test parameters of subsequent test nodes are adjusted based on the test results of the previous test node. The test parameters include test voltage, sampling frequency, or test angle range.

[0020] Furthermore, the test parameters for subsequent test nodes are adjusted based on the test results of the previous test node, including: If the number of potentiometers whose test voltage deviates from the preset threshold range at the previous test node meets its corresponding proportion, then the sampling frequency of subsequent nodes is increased; or, If the number of potentiometers whose linearity error at the previous test node exceeds the preset tolerance meets its corresponding proportion, then the test voltage at subsequent nodes is reduced and the test angle range is expanded.

[0021] Furthermore, if the number of potentiometers whose test voltage deviates from the preset threshold range in the previous test node meets its corresponding proportion, the adjustment coefficient is updated according to the proportion of linearity error; the proportion of linearity error is the proportion of the number of potentiometers whose linearity error in the previous test node exceeds the preset tolerance. Based on the sampling frequency, contact resistance change, total resistance, and updated adjustment coefficient of the current test node, obtain the sampling frequency of the subsequent test nodes; at the same time, determine whether the number of linearity errors is its corresponding proportion. If the voltage exceeds the limit, the test voltage of subsequent nodes will be reduced and the test angle range will be expanded.

[0022] Furthermore, the step of sending a prompt message to the user device when the test result indicates a test abnormality includes: When the test results indicate an anomaly, the relevant parameters in the historical test database are retrieved based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters; An anomaly analysis report is generated based on the associated parameters and synchronized to the user equipment along with the location identifier and deviation data of the abnormal potentiometer as a prompt. Attached Figure Description

[0023] Figure 1 A flowchart illustrating the potentiometer testing method provided in an embodiment of the present invention; Figure 2 This is a schematic diagram of the process for sending notification information provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the process for obtaining test information provided in an embodiment of the present invention; Figure 4 This is a schematic diagram of the process for adjusting the loading position of the test voltage according to an embodiment of the present invention. Detailed Implementation

[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0025] Existing technologies suffer from inefficiencies in potentiometer testing methods, complex test parameter settings, and a lack of intelligent data analysis. This is because traditional manual or single-machine static testing is trapped in a vicious cycle of efficiency, accuracy, and cost: production line cycle times require thousands of units per hour, while the time required for manual single-unit testing becomes a bottleneck; fixed test parameters for multi-potentiometer samples cannot adapt to process batch fluctuations, leading to falsely low yields or missed detections.

[0026] Compared with existing technologies, this invention provides a potentiometer intelligent testing method based on a preset testing strategy and dynamically adjusted testing parameters. It can synchronously drive multiple stations for parallel testing using a direct-drive motor, compressing the testing time for a single device. Based on the results of the previous node, it adjusts voltage, sampling frequency, and angle range in real time, transforming process fluctuations into algorithm optimization. Rotational torque and contact resistance are monitored synchronously, instantly capturing critical point anomalies. At the moment of an anomaly, it links to a historical process database to generate a report with location coordinates, achieving localization and closed-loop improvement. The method will be described first, followed by the system. Example 1

[0027] See Figure 1 This embodiment provides a method for testing a potentiometer, the method comprising: S101, Obtain test information, which includes multiple electrical characteristic data obtained by testing multiple potentiometers in the current test batch according to a preset test strategy; the electrical characteristic data includes multiple test node identifiers and their corresponding test voltages; S102, Based on the test information, obtain the potentiometer test results for the current test batch, and send a prompt message to the user equipment when the test results indicate a test abnormality; The preset test strategy refers to using different states of the potentiometer as different test nodes; adjusting the test parameters of subsequent test nodes based on the test results of the previous test node for multiple potentiometers in the current test batch. These test parameters include test voltage, sampling frequency, or test angle range. The previous test node can be understood as the node preceding the subsequent test node, i.e., the current test node.

[0028] In the potentiometer testing process, test information containing multiple electrical characteristic data of the potentiometer is first collected. This test information is acquired according to a preset test strategy and reflects the electrical performance of the potentiometer under different conditions. The test information includes test node identifiers and corresponding test voltages. Test node identifiers distinguish different test states of the potentiometer, while the test voltages (data) directly reflect the voltage output of each potentiometer in the same batch under specific conditions. Different states of the potentiometer are set as different test nodes, which can cover states such as rotation angle and load conditions, comprehensively evaluating potentiometer performance. Based on the results of the previous test node, the test parameters of subsequent nodes are adjusted. For example, if the resistance value of the previous test node is close to the upper limit, the test voltage range of subsequent nodes is narrowed; if the voltage fluctuation is large, the sampling frequency is increased; if the performance fluctuates within a specific angle range, the angle range is narrowed. Adjustments can be obtained through system calculation and analysis based on preset rules.

[0029] For each potentiometer, after integrating the electrical characteristic data of all test nodes, the potentiometer test results can be calculated according to a preset algorithm and standards. The test results are compared with preset thresholds or standards to determine if the potentiometer is abnormal. If an abnormality is detected, details are recorded (potentiometer identity, abnormal node, electrical characteristics, etc.), and a prompt message is sent to the user device for quick location and resolution of the problem. The user device can be, for example, a laptop or tablet.

[0030] Therefore, dynamic adjustment of test parameters ensures that the test results closely match the actual performance of the potentiometer. Multiple test nodes comprehensively evaluate potentiometer performance, covering various actual operating conditions. Combined with dynamic parameter adjustments, this allows for in-depth analysis of performance changes and improves test accuracy. Adjusting subsequent tests based on test node results facilitates optimized resource allocation; for example, reducing test resources for nodes with stable performance and increasing sampling or test items for nodes with large fluctuations, improving efficiency and reducing costs. This dynamic adjustment mechanism makes the testing process highly efficient and flexible. It allows for timely identification and adjustment of problems, avoiding redundant or excessive testing, shortening time, and improving efficiency. This method can be considered as taking into account performance differences between different batches and process conditions, adapting to production testing scenarios for multiple potentiometer samples. Dynamic parameter adjustment adapts to the testing needs of improved products, reducing additional development costs.

[0031] In some embodiments, adjusting the test parameters of subsequent test nodes based on the test results of the previous test node includes: If the number of potentiometers whose test voltage deviates from the preset threshold range at the previous test node meets its corresponding proportion, then the sampling frequency of subsequent nodes is increased; or, If the number of potentiometers whose linearity error at the previous test node exceeds the preset tolerance meets its corresponding proportion, then the test voltage at subsequent nodes is reduced and the test angle range is expanded.

[0032] As an example, when the test voltage deviates from the preset threshold range, at the current test node, the acquired test voltage is monitored in real time and compared with the preset threshold range. The preset threshold range is a reasonable range determined based on the potentiometer's specifications and normal operating performance. If the test voltage deviates from the preset threshold range, triggering an adjustment mechanism to increase the sampling frequency of subsequent nodes can more precisely capture the changes in the potentiometer's electrical characteristics under different operating conditions. Because a higher sampling frequency can acquire more data points in the same amount of time, it helps to more accurately depict the potentiometer's performance curve, thus making it more likely to discover potential anomalies or performance fluctuations. It can also narrow the test angle range of subsequent nodes. If the voltage deviates from the normal range at the current node, the potentiometer's performance may be problematic within a larger angle range. Narrowing the test angle range allows for the concentration of test resources to conduct a more in-depth evaluation of the potentiometer's performance within a smaller angle range, helping to quickly pinpoint the specific angle causing the voltage anomaly.

[0033] To address situations where linearity error exceeds the preset tolerance, a linearity analysis is performed on the potentiometer's output characteristics at the current test node. The deviation between the actual output and the ideal linear output is calculated, representing the linearity error. The preset tolerance is a maximum permissible error range set according to the potentiometer's design standards and usage requirements. When the linearity error exceeds the preset tolerance, the test voltage at subsequent nodes is adjusted. Lowering the test voltage allows the potentiometer to operate under relatively milder conditions, helping to distinguish whether the poor linearity is inherent to the potentiometer itself or due to excessively stringent test conditions leading to an excessively large apparent linearity error. Simultaneously, a lower test voltage can prevent excessive voltage stress from further exacerbating the potentiometer's nonlinear characteristics. Expanding the test angle range at subsequent nodes allows for the acquisition of more data points to comprehensively evaluate the potentiometer's linearity changes across the entire operating angle range. This helps determine whether the potentiometer has linearity issues within a local angle range or struggles to meet linearity requirements across the entire operating range.

[0034] Therefore, adjusting the sampling frequency to address voltage deviation allows for more precise focusing on specific areas of potentiometer performance abnormality. This centralized testing strategy effectively increases the probability of detecting potential faults and reduces missed detections due to excessively large test ranges or insufficient sampling, thus providing a more accurate assessment of the potentiometer's actual performance. Regarding linearity error adjustment, reducing the test voltage and expanding the test angle range allows for a more comprehensive examination of the potentiometer's linearity characteristics. Reducing the voltage helps avoid misjudging potentiometer performance due to improper test conditions, while expanding the angle range fully exposes the potentiometer's linearity performance across its entire operating range, providing more comprehensive data support for accurately assessing whether it meets usage requirements.

[0035] By dynamically adjusting the test parameters of subsequent nodes based on the test results of the previous node, test resources can be allocated more rationally. For areas with normal performance, the investment of test resources can be appropriately reduced; while for areas with potential problems, resources can be concentrated for in-depth testing. This ensures both the comprehensiveness and accuracy of the tests while avoiding unnecessary resource waste and improving testing efficiency. Simultaneously, the dynamic adjustment mechanism can prevent unnecessary repetition of tests in subsequent test nodes. If the test parameters of subsequent nodes are not adjusted according to the actual situation, it may lead to repeated testing of areas with known problems or over-testing of normal areas. Through targeted adjustments, these redundant testing steps can be effectively reduced, the testing cycle shortened, and testing costs lowered.

[0036] In some embodiments, adjusting the test parameters of subsequent test nodes based on the test results of the previous test node includes: If the number of potentiometers whose test voltage deviates from the preset threshold range in the previous test node meets its corresponding proportion, the adjustment coefficient is updated according to the proportion of linearity error; the proportion of linearity error is the proportion of the number of potentiometers whose linearity error in the previous test node exceeds the preset tolerance. Based on the sampling frequency, contact resistance change, total resistance, and updated adjustment coefficient of the current test node, obtain the sampling frequency of the subsequent test nodes; at the same time, determine whether the number of linearity errors is its corresponding proportion. If the voltage exceeds the limit, the test voltage of subsequent nodes will be reduced and the test angle range will be expanded.

[0037] This technical solution monitors whether the test voltage of the potentiometer deviates from a preset threshold range in the previous test node. If the proportion of the number of potentiometers deviating from the threshold (i.e., the voltage deviation percentage) reaches a preset condition, an adjustment mechanism is triggered. Simultaneously, the proportion of potentiometers with excessive linearity error in the previous node (i.e., the linearity error percentage) is calculated, and the adjustment coefficient is updated based on this proportion. The adjustment coefficient is used to dynamically optimize the sampling frequency of subsequent test nodes, ensuring accurate allocation of test resources.

[0038] Specifically, the adjustment coefficient can be updated based on the proportion of linearity errors. If the proportion of linearity errors increases, the adjustment coefficient is increased.

[0039] Unlike the previous embodiment, this approach considers that a test voltage deviation from the preset threshold range is a significant anomaly that greatly impacts the overall performance of the potentiometer. By first determining the percentage of test voltage deviations, a widespread voltage problem can be quickly identified. If a large number of potentiometers exhibit test voltage deviations, it indicates an instability in the testing system itself or a change in the batch characteristics of the potentiometers. After identifying the voltage problem, determining the percentage of linearity errors further focuses on the potentiometer's linearity. This tiered screening approach gradually narrows the problem scope, from an overall voltage issue to specific linearity error problems, allowing for more targeted adjustments to subsequent test parameters. Furthermore, the sequential judgment method avoids wasting resources on unnecessary calculations.

[0040] Therefore, based on the test results of the previous node, parameters such as sampling frequency, test voltage, and angle range of subsequent test nodes can be adjusted accordingly. For areas with relatively stable performance or where voltage deviation and linearity error are not significant, the investment of test resources can be reasonably reduced; while for areas with potential problems or large performance fluctuations, resources are concentrated for more in-depth testing. This flexible resource allocation method avoids unnecessary redundant testing, improves testing efficiency, reduces testing costs, and achieves efficient utilization of test resources while ensuring test quality.

[0041] In some embodiments, based on the change in contact resistance of the previous test node (potentiometer), the sampling frequency of the subsequent node is calculated according to the following formula: fn+1=fn×(1+k·ΔRc / Rt) where fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the change in contact resistance, Rt is the total resistance, k is the adjustment coefficient, and k is initially set to 1.

[0042] Therefore, by dynamically adjusting the sampling frequency based on changes in contact resistance, the sampling process can better adapt to the actual performance variations of the potentiometer. When the contact resistance changes significantly, appropriately increasing the sampling frequency can capture subtle performance changes of the potentiometer under different conditions, thereby obtaining richer and more accurate data, reducing data loss due to insufficient sampling, and improving the accuracy of test results.

[0043] By optimizing the sampling frequency based on changes in contact resistance, testing resources can be more effectively focused on areas where potentiometer performance changes significantly. This helps in-depth analysis of the potentiometer's performance in these critical areas, and more accurately identifies potential quality problems or performance fluctuations.

[0044] Different potentiometers may exhibit varying contact resistance characteristics due to factors such as materials and manufacturing processes. This method, which adjusts the sampling frequency based on the change in contact resistance, can flexibly adapt to potentiometers with diverse characteristics. Whether the potentiometer shows a relatively smooth contact resistance change or significant fluctuations, appropriate test data can be obtained by adjusting the sampling frequency accordingly, thus improving the versatility and flexibility of the testing method.

[0045] See Figure 2 In some embodiments, sending a notification message to the user device when the test result indicates a test anomaly includes: S201, When the test result indicates an abnormality, retrieve the relevant parameters from the historical test database based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters; S202, an anomaly analysis report is generated based on the associated parameters and synchronized to the user equipment along with the location identifier and deviation data of the abnormal potentiometer as a prompt message.

[0046] During potentiometer testing, various test results are monitored in real time, and the performance of the potentiometer is judged to be abnormal according to preset standards. The test results cover various aspects such as electrical characteristic data, which are compared with the pass / fail standards. Once a deviation exceeds the allowable range, the test is considered abnormal, triggering the subsequent process. After an abnormality is triggered, the model information of the potentiometer is extracted, and then the historical test database is opened. The historical test database includes process fluctuation data of different batches of potentiometers, as well as the corresponding environmental adaptability parameters.

[0047] The system precisely locates process fluctuation data and environmental adaptability parameters closely related to the current abnormal potentiometer model from the database. The process fluctuation data reconstructs the fluctuations in key process stages experienced by this potentiometer model during production, such as raw material fluctuations and changes in processing precision. Environmental adaptability parameters encompass the impact of environmental factors such as temperature and humidity on the model's performance. A trained model can be used to generate corresponding anomaly analysis reports. These reports, along with the location markers and deviation data of the abnormal potentiometer, are then systematically integrated. The location markers accurately pinpoint the abnormal potentiometer, and the deviation data quantifies the degree of performance deviation, providing a comprehensive description of the anomaly.

[0048] Therefore, in-depth analysis based on correlation parameters can penetrate the surface of phenomena to pinpoint the essence of the problem, generating detailed reports that clearly present the full picture of the anomaly. Users can then accurately grasp the severity, scope of impact, and development trend of the anomaly, and formulate precise and effective solutions. Anomaly alerts are simultaneously sent to user devices, enabling real-time feedback on quality issues. Users do not need to wait for the testing process to complete before viewing the report; they can immediately be aware of anomalies occurring on the production line, intervene promptly, avoid mass production of defective products, reduce production costs, and improve overall quality control efficiency. The organic combination of historical data and real-time anomaly information provides strong support for quality control decisions. Based on rich data resources, users can accurately assess the stability of production processes and the reliability of product quality, specifically optimize process flows, strengthen weak links, and improve product quality from the root.

[0049] See Figure 3 In some embodiments, obtaining test information includes: The potentiometer shaft is controlled by a direct-drive motor to rotate at a preset speed, and the following operations are performed synchronously during the rotation: S301, collects data on the change in contact resistance and rotational torque between the moving contact of the potentiometer and the resistive element; S302, dynamically adjust the application position of the test voltage based on the change in contact resistance, so that the test voltage is always applied at the critical point of contact between the moving contact and the resistive body; It can be assumed that when the moving contact slides on the resistive element, the contact resistance is not constant, but changes rapidly within a small angle just before contact or discontinuation, meaning the contact is in a critical contact state. Real-time monitoring of the resistance change allows for the determination of a true contact point once the change exceeds a set value. Because the potentiometer rotates, the position of the moving contact is constantly changing, continuously performing a closed-loop action of detection, determination, and switching, thus avoiding measurement errors caused by applying voltage to a loose connection position.

[0050] S303 saves the test voltage corresponding to each test node as multiple electrical characteristic data; when the rotational torque deviates from the preset threshold range, it triggers an abnormal contact pressure alarm and records the current rotation angle coordinates.

[0051] The direct-drive motor drives the potentiometer shaft to rotate at a preset speed. This uniform rotation provides stable test conditions for subsequent data acquisition, ensuring that the moving contact of the potentiometer slides on the resistive element at a uniform speed, thereby enabling uniform sampling of the potentiometer's performance at different rotational positions.

[0052] Data acquisition is performed synchronously during the potentiometer's rotation. On one hand, the change in contact resistance between the moving contact and the resistive element is acquired in real time. A high-precision resistance measuring instrument accurately captures these minute changes in contact resistance during rotation. On the other hand, rotational torque data is also acquired simultaneously. A torque sensor monitors the magnitude of the torque experienced by the potentiometer shaft during rotation, reflecting the rotational resistance of the potentiometer at different rotational positions.

[0053] Based on the collected changes in contact resistance, the critical contact point between the moving contact and the resistive element is determined in real time. When a change in contact resistance is detected, the application position of the test voltage is rapidly adjusted to ensure that the test voltage is always applied at the actual critical contact point between the moving contact and the resistive element. This process is achieved through a fast-response control circuit and a precise voltage regulation module, enabling the test voltage to be accurately applied to the new critical contact point the instant the position of the moving contact changes, thereby ensuring the effectiveness and accuracy of the test voltage.

[0054] The collected rotational torque data is monitored in real time and compared with a preset torque threshold range. When the rotational torque exceeds or falls below this preset range, an abnormal contact pressure alarm mechanism is immediately triggered. The alarm information is quickly generated and sent to relevant monitoring equipment or operators for timely action. Simultaneously, the rotational angle coordinates are recorded to accurately pinpoint the exact location of the torque anomaly, providing crucial information for subsequent troubleshooting and analysis.

[0055] The test voltage corresponding to each test node is used as electrical characteristic data and integrated with information such as contact resistance change, rotational torque data, and rotation angle coordinates. This data is systematically saved to a database or data storage device, forming a complete test data record. This not only provides detailed data support for the quality assessment of the current batch of potentiometers, but also provides historical data resources for subsequent quality traceability, process optimization, and product improvement.

[0056] Therefore, by dynamically adjusting the test voltage application position, it is ensured that the test voltage always applies to the actual contact point between the moving contact and the resistive element. This voltage application method accurately reflects the electrical performance of the potentiometer under actual operating conditions, avoiding measurement errors caused by voltage application position deviations, thereby significantly improving the accuracy and reliability of the test results.

[0057] By simultaneously acquiring data on changes in contact resistance and rotational torque, comprehensive monitoring of the potentiometer's mechanical and electrical performance is achieved. This multi-dimensional data acquisition method enables a more complete assessment of the potentiometer's quality, uncovering potential problems that cannot be detected by single data acquisition methods, and further improving the accuracy and reliability of the test.

[0058] Real-time monitoring of rotational torque and abnormal alarms can promptly detect potential contact pressure problems in the potentiometer during rotation. This helps to quickly locate the fault, take appropriate repair or adjustment measures, reduce the defect rate in the production process, and improve product quality control.

[0059] See Figure 4 In some embodiments, dynamically adjusting the application position of the test voltage based on the change in contact resistance includes: S401, Obtain the critical point detection threshold for the change in contact resistance; When the real-time collected change in contact resistance exceeds the critical point detection threshold, determine that the moving contact and the resistive body are at the contact critical point. S402 dynamically switches the test voltage loading path to the electrode position corresponding to the critical point; after adjusting the voltage loading position, it re-detects the change in contact resistance to verify the critical point state, forming a closed-loop feedback control.

[0060] A critical point detection threshold for the change in contact resistance is preset. This threshold, determined through experiments and data analysis, reflects changes in the contact state between the moving contact and the resistive element. The change in contact resistance is collected in real-time during potentiometer rotation. Once the collected real-time change in contact resistance exceeds the preset critical point detection threshold, the moving contact is determined to be at a critical contact point with the resistive element.

[0061] Based on the above determination result, a control signal is triggered to dynamically switch the application path of the test voltage, so that the test voltage is precisely applied to the electrode position corresponding to the contact critical point. This process relies on a fast-response control circuit and a precise voltage regulation module to ensure that the test voltage can complete the adjustment of the application position in a very short time.

[0062] After adjusting the voltage loading position, the contact resistance change detection program is restarted to verify the adjusted contact critical point state. By re-detecting and comparing the new contact resistance change with the critical point detection threshold, it is confirmed whether the moving contact and the resistive element are truly at the contact critical point. This closed-loop feedback control mechanism ensures the accuracy and reliability of the test voltage loading position and avoids test errors caused by loading position deviations.

[0063] Therefore, by accurately identifying the critical point of contact resistance change and dynamically adjusting the test voltage application position, it is ensured that the test voltage is always applied at the actual contact critical point between the moving contact and the resistive element. This avoids measurement errors caused by deviations in the application position, improves the accuracy of potentiometer electrical performance testing, and makes the test results more accurately reflect the actual performance of the potentiometer. The introduction of a closed-loop feedback control mechanism ensures the accuracy of each voltage application position adjustment, avoiding repeated adjustments and unnecessary test steps. Real-time monitoring of contact resistance changes and rapid response to critical point states ensure precise control of the potentiometer contact state during testing. Closed-loop feedback control further enhances stability and reliability, ensuring the accuracy of test results and the smooth operation of the test process even in complex testing environments, reducing the risk of misjudgment due to errors.

[0064] As an example, a method for testing a potentiometer is provided, and the specific implementation steps are as follows: Step 1: Acquire Test Information. First, control the potentiometer shaft to rotate at a preset speed using a direct-drive motor, with a speed range of 100-1000 rpm, preferably 500 rpm. During rotation, collect data on the change in contact resistance between the potentiometer's moving contact and the resistive element, as well as the rotational torque. The measurement range for the change in contact resistance is 0-100Ω, and the torque range is 0-10 N·m. Based on the change in contact resistance, dynamically adjust the application position of the test voltage to ensure that the test voltage is always applied at the critical contact point between the moving contact and the resistive element. Through real-time calculation, obtain the test voltage corresponding to each test node as electrical characteristic data and save it.

[0065] Step 2: Obtain test results. When the rotational torque deviates from the preset threshold range of 0.5-2 N·m, a contact pressure anomaly alarm is triggered, and the current rotation angle coordinates are recorded. When the test results indicate an anomaly, relevant parameters from the historical test database are retrieved based on the potentiometer model. This database contains process fluctuation data for different batches of potentiometers and their corresponding environmental adaptability parameters. An anomaly analysis report is generated based on the relevant parameters and synchronized to the user equipment along with the location identifier and deviation data of the abnormal potentiometer as a prompt.

[0066] Step 3: Determine if test parameters need adjustment. First, calculate whether the absolute value of the test voltage deviation at the previous test node exceeds the preset threshold of 0.1V. If it does, proceed to Step 1 to reacquire test information; if it does not, proceed to Step 4 to adjust the test parameters.

[0067] Step 4: Adjust the test parameters of subsequent test nodes based on the test results of the previous test node. If the test voltage of the previous test node deviates from the preset threshold range of ±0.5V, increase the sampling frequency of the subsequent node from 100kHz to 200kHz, or reduce the test angle range from ±15° to ±10°. If the linearity error of the previous test node exceeds 5%, decrease the test voltage of the subsequent node from 5V to 3V, and expand the test angle range from ±15° to ±25°. Based on the change in contact resistance of the previous test node, calculate the sampling frequency of the subsequent node according to the formula: The sampling frequency fn+1 = fn × (1 + 0.1 × ΔRc / Rt). Where fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the change in contact resistance, Rt is the total resistance of 100Ω, and the adjustment coefficient k is 0.05.

[0068] This potentiometer testing method uses a direct-drive motor to control the potentiometer shaft to rotate at a constant speed, simultaneously collecting data on changes in contact resistance and rotational torque during rotation. Based on the changes in contact resistance, the test voltage application position is dynamically adjusted to ensure it is always applied at the critical contact point between the moving contact and the resistive element. The test voltage corresponding to each test node is saved as electrical characteristic data. When the rotational torque deviates from a preset threshold range, a contact pressure anomaly alarm is triggered, and the current rotation angle coordinates are recorded. When test results are abnormal, relevant parameters from the historical test database are retrieved to generate an anomaly analysis report, which, along with the location identifier and deviation data of the abnormal potentiometer, is synchronized to the user equipment. Furthermore, based on the test results of the previous test node, the test parameters of subsequent test nodes, such as test voltage, sampling frequency, or test angle range, are adjusted to optimize the test process and improve test accuracy. Simultaneously, based on the contact resistance change of the previous test node, the sampling frequency of subsequent nodes is calculated using a formula, achieving dynamic optimization of test parameters.

[0069] The technical solution provided in this embodiment ensures that the test voltage is always applied at the actual contact position between the moving contact and the resistive element, thereby effectively avoiding measurement errors caused by voltage application position deviations. Compared with existing technologies, this dynamic adjustment mechanism significantly improves the accuracy of potentiometer electrical performance testing, making the test results more accurately reflect the actual performance of the potentiometer and providing a more reliable basis for potentiometer quality evaluation.

[0070] The introduced closed-loop feedback control mechanism ensures the accuracy of each voltage application position adjustment. By re-detecting the change in contact resistance after adjustment to verify the critical point state, redundant adjustments and unnecessary testing steps are avoided. This innovative design enables the system to efficiently and stably complete the dynamic switching and verification of the test voltage application position, reducing time waste and resource consumption during the testing process, and effectively improving the efficiency of the overall testing process. Compared with traditional methods, this feedback-based dynamic adjustment mechanism can better adapt to the actual operating state of the potentiometer, ensuring the smooth progress of the testing process.

[0071] By monitoring changes in contact resistance in real time and responding quickly to critical point states, the problem of insensitivity to changes in potentiometer contact state in existing technologies is solved. The introduction of a closed-loop feedback control mechanism further enhances stability and reliability, ensuring the accuracy of test results and the smooth operation of the test process even in complex testing environments. This real-time monitoring and feedback control mechanism effectively reduces the risk of misjudgment due to errors, ensuring the stability and reliability of the potentiometer testing process.

[0072] Meanwhile, by combining historical test databases and anomaly analysis report generation mechanisms, the system provides more comprehensive and accurate data support for product quality assessment. When test results are abnormal, the system can retrieve relevant parameters from the historical test database based on the potentiometer model, generate a detailed anomaly analysis report, and synchronize the report, along with the location identifier and deviation data of the abnormal potentiometer, to the user's device. This innovative approach not only helps users quickly locate problems but also provides strong evidence for product quality improvement, thereby enhancing the company's market competitiveness and brand image. Compared with existing technologies, this analysis method combining historical data and real-time test results can more comprehensively evaluate the quality status of potentiometers, effectively improving the effectiveness of product quality assessment.

[0073] Example 2.

[0074] This embodiment provides a potentiometer testing system, which includes a driving module, a data acquisition module, and a controller. The drive module includes a direct drive motor and its corresponding reducer, used to synchronously control the potentiometer angle of multiple potentiometers in the current test batch; The acquisition module is used to acquire the voltage, current and rotation angle signals of each potentiometer in the current test batch; The controller, the drive module, and the acquisition module are electrically connected, and the controller is configured to: Acquire test information, which includes multiple electrical characteristic data obtained from testing multiple potentiometers in the current test batch according to a preset test strategy; the electrical characteristic data includes multiple test node identifiers and their corresponding test voltages; Based on the test information, obtain the potentiometer test results for the current test batch, and send a prompt message to the user device when the test results indicate a test abnormality; The preset test strategy refers to using different states of the potentiometer as different test nodes. The test parameters of subsequent test nodes are adjusted based on the test results of the previous test node. The test parameters include test voltage, sampling frequency, or test angle range.

[0075] In some embodiments, adjusting the test parameters of subsequent test nodes based on the test results of the previous test node includes: If the number of potentiometers whose test voltage deviates from the preset threshold range at the previous test node meets its corresponding proportion, then the sampling frequency of subsequent nodes is increased; or, If the number of potentiometers whose linearity error at the previous test node exceeds the preset tolerance meets its corresponding proportion, then the test voltage at subsequent nodes is reduced and the test angle range is expanded.

[0076] In some embodiments, if the number of potentiometers whose test voltage deviates from the preset threshold range in the previous test node meets its corresponding proportion, the adjustment coefficient is updated according to the proportion of linearity error; the proportion of linearity error is the proportion of the number of potentiometers whose linearity error in the previous test node exceeds the preset tolerance. Based on the sampling frequency, contact resistance change, total resistance, and updated adjustment coefficient of the current test node, obtain the sampling frequency of the subsequent test nodes; at the same time, determine whether the number of linearity errors is its corresponding proportion. If the voltage exceeds the limit, the test voltage of subsequent nodes will be reduced and the test angle range will be expanded.

[0077] In some embodiments, adjusting the test parameters specifically includes: based on the change in contact resistance of the previous test node, calculating the sampling frequency of the subsequent node according to the following formula: fn+1=fn×(1+k·ΔRc / Rt) where fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the change in contact resistance, Rt is the total resistance, and k is the adjustment coefficient.

[0078] In some embodiments, sending a notification message to the user device when the test result indicates a test anomaly includes: When the test results indicate an anomaly, the relevant parameters in the historical test database are retrieved based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters; An anomaly analysis report is generated based on the associated parameters and synchronized to the user equipment along with the location identifier and deviation data of the abnormal potentiometer as a prompt.

[0079] In some embodiments, obtaining test information includes: The potentiometer shaft is controlled by a direct-drive motor to rotate at a preset speed, and the following operations are performed synchronously during the rotation: Collect data on the change in contact resistance and rotational torque between the moving contact of the potentiometer and the resistive element; The test voltage loading position is dynamically adjusted based on the change in contact resistance, so that the test voltage is always loaded at the critical point of contact between the moving contact and the resistive element. The test voltage corresponding to each test node is used as multiple electrical characteristic data and saved; when the rotational torque deviates from the preset threshold range, an abnormal contact pressure alarm is triggered and the current rotation angle coordinates are recorded.

[0080] In some embodiments, dynamically adjusting the application position of the test voltage based on the change in contact resistance includes: Obtain the critical point detection threshold for the change in contact resistance; when the real-time collected change in contact resistance exceeds the critical point detection threshold, determine that the moving contact and the resistive body are at the contact critical point; The test voltage application path is dynamically switched to the electrode position corresponding to the critical point; after the voltage application position is adjusted, the change in contact resistance is re-detected to verify the critical point state, thus forming a closed-loop feedback control.

[0081] As an example, a potentiometer testing system is provided, including a drive module, a data acquisition module, and a controller. The drive module includes a direct-drive motor and a speed reducer. The data acquisition module is used to acquire the voltage, current, and rotation angle signals of the potentiometer. The controller uses an industrial control computer.

[0082] Install the testing software on the controller and set the test parameters through the software interface. Before the test begins, select the potentiometer model through the software interface, and the system will automatically retrieve the corresponding test strategy and database parameters. During the test, the controller collects and analyzes test data in real time. When an anomaly is detected, it automatically generates an anomaly report and sends it to the user's mobile phone via wireless network.

[0083] After the test, the system automatically generates a test report, including test results, anomaly analysis conclusions, and suggested parameter adjustment schemes. Users can adjust the test strategy according to the suggestions in the report to optimize the test parameters. This system automates and automates potentiometer testing, improving testing efficiency and accuracy.

[0084] As another example, an improved method for testing potentiometers is provided, applied to the aforementioned potentiometer testing system, to further optimize the parameter adjustment strategy during the testing process. The specific steps are as follows: Step 1: Obtain Test Information. Before the test begins, set the test parameters through the software interface, including a test voltage range of 1-10V, a sampling frequency range of 50-500kHz, and a test angle range of ±30°. During the test, the potentiometer shaft rotates at a constant speed of 500rpm. During rotation, collect data on the change in contact resistance, rotational torque, and potentiometer output voltage. The measurement range for the change in contact resistance is 0-200Ω, and the torque range is 0-5N·m.

[0085] Step 2: Obtain test results. When the torque deviates from the 1 N·m threshold, an abnormal alarm is triggered and the current rotation angle is recorded. When the test result is abnormal, the system automatically analyzes the cause of the abnormality and retrieves relevant parameters from the database according to the potentiometer model.

[0086] Step 3: Determine if test parameters need adjustment. First, calculate whether the voltage deviation of the current test node exceeds the 0.2V threshold. If it does, proceed to Step 1 to reacquire test information; if it does not, proceed to Step 4 to adjust the test parameters.

[0087] Step 4: Adjust the test parameters of subsequent test nodes based on the test results of the previous test node. If the voltage deviation of the previous node exceeds 0.3V, or the linearity error exceeds 10%, take corresponding adjustment measures: reduce the voltage by 1V or increase the frequency by 20kHz; if the torque is abnormal, adjust the angle range by ±20°. After adjustment, the system automatically calculates and sets new test parameters to continue the next round of testing.

[0088] This improved solution enhances testing accuracy and stability through a more precise parameter adjustment strategy, making it suitable for testing and evaluating various types of potentiometers. The user-friendly software interface allows users to adjust test parameters at any time, enabling flexible control of the testing process.

[0089] Finally, it should be noted that the above descriptions are merely preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for testing a potentiometer, characterized in that: The method includes: Acquire test information, which includes multiple electrical characteristic data obtained from testing multiple potentiometers in the current test batch according to a preset test strategy; the electrical characteristic data includes multiple test node identifiers and their corresponding test voltages; Based on the test information, obtain the potentiometer test results for the current test batch, and send a prompt message to the user device when the test results indicate a test abnormality; The preset test strategy refers to using different states of the potentiometer as different test nodes; adjusting the test parameters of subsequent test nodes based on the test results of the previous test node, wherein the test parameters include test voltage, sampling frequency or test angle range; Obtain test information, including: The potentiometer shaft is controlled by a direct-drive motor to rotate at a preset speed, and the following operations are performed synchronously during the rotation: Collect data on the change in contact resistance and rotational torque between the moving contact of the potentiometer and the resistive element; The test voltage loading position is dynamically adjusted based on the change in contact resistance, so that the test voltage is always loaded at the critical point of contact between the moving contact and the resistive element. The test voltage corresponding to each test node is used as multiple electrical characteristic data and saved; when the rotational torque deviates from the preset threshold range, an abnormal contact pressure alarm is triggered and the current rotation angle coordinates are recorded.

2. The potentiometer testing method according to claim 1, characterized in that, Adjust the test parameters of subsequent test nodes based on the test results of the previous test node, including: If the number of potentiometers whose test voltage deviates from the preset threshold range at the previous test node meets its corresponding proportion, then the sampling frequency of subsequent nodes is increased; or, If the number of potentiometers whose linearity error at the previous test node exceeds the preset tolerance meets its corresponding proportion, then the test voltage at subsequent nodes is reduced and the test angle range is expanded.

3. The potentiometer testing method according to claim 1, characterized in that, Adjust the test parameters of subsequent test nodes based on the test results of the previous test node, including: If the number of potentiometers whose test voltage deviates from the preset threshold range in the previous test node meets its corresponding proportion, the adjustment coefficient is updated according to the proportion of linearity error; the proportion of linearity error is the proportion of the number of potentiometers whose linearity error in the previous test node exceeds the preset tolerance. Based on the sampling frequency, contact resistance change, total resistance, and updated adjustment coefficient of the current test node, obtain the sampling frequency of the subsequent test nodes; at the same time, determine whether the number of linearity errors is its corresponding proportion. If the voltage exceeds the limit, the test voltage of subsequent nodes will be reduced and the test angle range will be expanded.

4. The test method for a potentiometer according to claim 2 or 3, characterized in that, The specific adjustment of test parameters includes: based on the change in contact resistance of the previous test node, the sampling frequency of the subsequent node is calculated according to the following formula: fn+1=fn×(1+k·ΔRc / Rt) where fn+1 is the sampling frequency of the subsequent test node, fn is the sampling frequency of the current test node, ΔRc is the change in contact resistance, Rt is the total resistance, and k is the adjustment coefficient.

5. The potentiometer testing method according to claim 1, characterized in that, The step of sending a prompt message to the user device when the test result indicates an abnormality includes: When the test results indicate an anomaly, the relevant parameters in the historical test database are retrieved based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters; An anomaly analysis report is generated based on the associated parameters and synchronized to the user equipment along with the location identifier and deviation data of the abnormal potentiometer as a prompt.

6. The potentiometer testing method according to claim 1, characterized in that, The dynamic adjustment of the test voltage application position based on the change in contact resistance includes: Obtain the critical point detection threshold for the change in contact resistance; when the real-time collected change in contact resistance exceeds the critical point detection threshold, determine that the moving contact and the resistive body are at the contact critical point; The test voltage application path is dynamically switched to the electrode position corresponding to the critical point; after the voltage application position is adjusted, the change in contact resistance is re-detected to verify the critical point state, thus forming a closed-loop feedback control.

7. A potentiometer testing system, characterized in that, The testing system includes a driver module, a data acquisition module, and a controller; The drive module includes a direct drive motor and its corresponding reducer, used to synchronously control the potentiometer angle of multiple potentiometers in the current test batch; The acquisition module is used to acquire the voltage, current and rotation angle signals of each potentiometer in the current test batch; The controller, the drive module, and the acquisition module are electrically connected, and the controller is configured to: Acquire test information, which includes multiple electrical characteristic data of multiple potentiometers in the current test batch obtained by testing according to a preset test strategy; Electrical characteristic data includes multiple test node identifiers and their corresponding test voltages; Based on the test information, obtain the potentiometer test results for the current test batch, and send a prompt message to the user device when the test results indicate a test abnormality; The preset test strategy refers to using different states of the potentiometer as different test nodes; adjusting the test parameters of subsequent test nodes based on the test results of the previous test node, wherein the test parameters include test voltage, sampling frequency or test angle range; Obtain test information, including: The potentiometer shaft is controlled by a direct-drive motor to rotate at a preset speed, and the following operations are performed synchronously during the rotation: Collect data on the change in contact resistance and rotational torque between the moving contact of the potentiometer and the resistive element; The test voltage loading position is dynamically adjusted based on the change in contact resistance, so that the test voltage is always loaded at the critical point of contact between the moving contact and the resistive element. The test voltage corresponding to each test node is used as multiple electrical characteristic data and saved; when the rotational torque deviates from the preset threshold range, an abnormal contact pressure alarm is triggered and the current rotation angle coordinates are recorded.

8. The potentiometer testing system according to claim 7, characterized in that, Adjust the test parameters of subsequent test nodes based on the test results of the previous test node, including: If the number of potentiometers whose test voltage deviates from the preset threshold range at the previous test node meets its corresponding proportion, then the sampling frequency of subsequent nodes is increased; or, If the number of potentiometers whose linearity error at the previous test node exceeds the preset tolerance meets its corresponding proportion, then the test voltage at subsequent nodes is reduced and the test angle range is expanded.

9. The potentiometer testing system according to claim 7, characterized in that, The step of sending a prompt message to the user device when the test result indicates an abnormality includes: When the test results indicate an anomaly, the relevant parameters in the historical test database are retrieved based on the potentiometer model; the database contains process fluctuation data of different batches of potentiometers and their corresponding environmental adaptability parameters; An anomaly analysis report is generated based on the associated parameters and synchronized to the user equipment along with the location identifier and deviation data of the abnormal potentiometer as a prompt.

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