Novel BMS test method

Abstract

The invention discloses a novel BMS (Battery Management System) test method, which comprises the following steps that 200 groups of data packets are preset, each group of data packets comprises 200 pieces of 16-bit data, and the data comprises a DEC value of the number of guard plate strings; a quiescent current maximum value DEC value; the HEX value is selected as the test action, the Bit 0 to the Bit 6 are calibration 0, static 1, overcharge protection 2, over-discharge protection 3, overcurrent protection 4, charge recovery test 5 and discharge recovery test 6 in sequence, and the Bit 7 to the Bit 15 are reserved; statically testing a platform voltage DEC value; testing the voltage DEC value of the platform through overcharging; and over-discharging the voltage DEC value of the test platform. The invention belongs to the field of novel BMS test methods, and particularly relates to a novel BMS test method. The problems of low efficiency, complicated operation and poor flexibility are solved by presetting a large number of data packets and performing test action selection and parameter setting in a specific coding mode.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of new BMS test methods, and particularly relates to a new BMS test method. BACKGROUND

[0002] With the continuous evolution of BMS control technology, most BMSs have adopted program control mode, and the control logic, parameter threshold and functional requirements of different manufacturers are significantly different, which makes the test difficulty continue to rise. At the same time, the market has increasingly high requirements for the compatibility of test equipment, and the traditional protection board test equipment is difficult to adapt to the diversified test requirements of new BMSs due to design fixation, and gradually falls into the predicament of "unable to test".

[0003] The traditional test process has many drawbacks: on the one hand, it relies on manual configuration of voltage, current and other parameters, and in the face of multi-link test tasks including calibration, static, overcharge protection and the like, it not only takes a long time, but also is easy to be affected by human operation errors to affect the accuracy of the results; on the other hand, the equipment is deeply bound with a specific BMS model, and for BMS boards of different specifications, hardware and programs need to be repeatedly developed, resulting in high equipment investment cost and long response period to market demand.

[0004] In addition, the traditional method lacks standardized programming and control mode, and professional personnel need to modify the underlying code to adjust the test logic, which has high operation threshold and poor expansibility. In the batch test scene, the equipment debugging and switching are time-consuming and laborious, which seriously restricts the efficiency improvement. SUMMARY

[0005] In view of the above situation, in order to overcome the defects of the prior art, the application provides a new BMS test method, which effectively solves the problems of low efficiency, complicated operation and poor flexibility in the current market.

[0006] The technical scheme adopted by the application is as follows: the application provides a new BMS test method, which comprises: 200 groups of data packets are pre-set, each group of data packets contains 200 16-bit data, and the data includes:

[0007] a protection board string number DEC value;

[0008] a maximum static current DEC value;

[0009] a test action selection HEX value, wherein Bit0-6 are calibration 0, static 1, overcharge protection 2, over-discharge protection 3, over-current protection 4, charge recovery test 5, discharge recovery test 6 in turn, and Bit7-15 are reserved;

[0010] a static test platform voltage DEC value;

[0011] an overcharge test platform voltage DEC value;

[0012] Over-discharge test platform voltage DEC value;

[0013] Over-charge test cell number selection HEX value, Bit0-14 selects the single cell voltage to be tested, and the number of over-charge is the maximum number of strings, and Bit15 is not set.

[0014] Over-charge lower limit voltage DEC value, unit MV, not protected;

[0015] Over-charge upper limit voltage DEC value, unit MV, protected;

[0016] Recovery upper limit voltage DEC value, unit MV, not recovery, not test recovery, this voltage can not be set;

[0017] Recovery lower limit voltage DEC value, unit MV, recovery, not test recovery, this voltage can not be set;

[0018] Over-discharge test cell number selection HEX value, Bit0-14 selects the single cell voltage to be tested, and the number of over-charge is the maximum number of strings, and Bit15 is not set.

[0019] Over-discharge upper limit voltage DEC value, unit MV, not protected;

[0020] Over-discharge lower limit voltage DEC value, unit MV, protected;

[0021] Over-discharge test current DEC value, unit Ma;

[0022] Recovery lower limit voltage DEC value, unit MV, not recovery, not test recovery, this voltage can not be set;

[0023] Recovery upper limit voltage DEC value, unit MV, recovery, not test recovery, this voltage can not be set;

[0024] Over-current lower limit current DEC value, unit MA, not protected;

[0025] Over-current upper limit current DEC value, unit MA, protected;

[0026] Over-current protection delay DEC value, unit MS;

[0027] Calibration voltage DEC value, write 0 for non-calibration voltage;

[0028] Calibration current DEC value, write 0 for non-calibration current;

[0029] According to the pre-set steps, first, the calibration voltage and current are carried out, and then the static, over-charge, over-discharge and over-current tests are carried out in turn.

[0030] Further, the data packet can save 200 groups, and each group of data packet can store 200 16-bit data.

[0031] Further, the test action selection selects different test actions through Bit0-6 of the HEX value.

[0032] Further, the overcharge test number selection and the overdischarge test number selection select the single battery voltage to be tested through Bit0-14 of the HEX value, and when the number of strings exceeds, the maximum number of strings is processed.

[0033] Further, when the recovery is not tested, the upper limit voltage of the recovery and the lower limit voltage of the recovery can not be set;

[0034] When the calibration voltage is not calibrated, the calibration voltage is written as 0; when the calibration current is not calibrated, the calibration current is written as 0.

[0035] Further, the test device is fixedly arranged with a test part, and the test part is arranged with a measured board;

[0036] A display screen is fixedly arranged on one side of the test device, for displaying the market value, and one side of the display screen is further fixedly arranged with a display screen for linking the data line.

[0037] Further, the test part further comprises: a handle rotatably arranged on the test part, and a moving rod fixedly arranged below the handle;

[0038] One end of the moving rod away from the handle is fixedly arranged with a moving plate, and a plurality of groups of measuring assemblies are arranged below the moving plate, and a measured board is arranged below the measuring assemblies, for testing the measured board;

[0039] The handle is pressed to drive the moving rod to move downward, thereby driving the measuring assemblies to press onto the measured board.

[0040] The beneficial effects obtained by the above structure are as follows:

[0041] 1. The preset 200 groups of data packets contain multi-dimensional parameters of 16-bit data, which can comprehensively cover the calibration, static, various protection and recovery test scenarios of the BMS, accurately select the test action and single battery voltage test object through the Bit of the HEX value, and ensure that each test is performed within the controllable parameter range by combining the clear voltage and current threshold setting, thereby effectively verifying the protection logic and response accuracy of the BMS under different working conditions.

[0042] 2, data packet support 200 group storage and call, can quickly switch different test parameter combination, meet the test demand of different specifications BMS;Test action is selected independently through Bit, and no test item can be skipped through specific value, reducing invalid operation. Cooperate with the mechanical structure of the test device, realize the integrated process of parameter setting-mechanical triggering-data feedback, greatly shorten the test preparation time, improve the batch test efficiency, suitable for BMS research and development debugging, production quality inspection and other scenes BRIEF DESCRIPTION OF DRAWINGS

[0043] Fig. 1 The overall schematic diagram of a novel BMS test method proposed in the application is shown in the figure.

[0044] Fig. 2 The electrical structure schematic diagram of a novel BMS test method proposed in the application is shown in the figure.

[0045] Fig. 3 The overall equipment combination schematic diagram of a novel BMS test method proposed in the application is shown in the figure.

[0046] Among them, 1, test device, 2, test part, 21, handle;22, moving rod;23, measured plate;24, measurement assembly;4, display screen;5, connection port.

[0047] The accompanying drawings are used to provide further understanding of the application, and constitute a part of the specification, together with the embodiments of the application, to explain the application, and do not constitute a limitation on the application. DETAILED DESCRIPTION

[0048] The technical solutions in the embodiments of the application will be described clearly and completely below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, not all the embodiments. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the application.

[0049] In the description of the application, it should be understood that the terms "up", "down", "front", "back", "left", "right", "top", "bottom", "inner", "outer" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the application and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, therefore it cannot be understood as a limitation on the application.

[0050] As Figs. 1-3 shown, the application proposes a novel BMS test method,

[0051] The data packet includes: 200 groups of preset data, each group of data packet contains 200 16-bit data, and the data includes: protection plate string number DEC value; maximum static current DEC value; test action selection HEX value, wherein Bit0-6 are calibration 0, static 1, overcharge protection 2, overdischarge protection 3, overcurrent protection 4, charge recovery test 5, discharge recovery test 6, and Bit7-15 are reserved; static test platform voltage DEC value; overcharge test platform voltage DEC value; overdischarge test platform voltage DEC value; overcharge test cell number selection HEX value, wherein Bit0-14 selects the single cell voltage to be tested, and the exceeding string number is the maximum string number, and Bit15 is not set; overcharge lower limit voltage DEC value, unit: MV, no protection; overcharge upper limit voltage DEC value, unit: MV, protection; recovery upper limit voltage DEC value, unit: MV, no recovery, no recovery test, and the voltage can not be set; recovery lower limit voltage DEC value, unit: MV, recovery, no recovery test, and the voltage can not be set; overdischarge test cell number selection HEX value; wherein Bit0-14 selects the single cell voltage to be tested, and the exceeding string number is the maximum string number, and Bit15 is not set; overdischarge upper limit voltage DEC value, unit: MV, no protection; overdischarge lower limit voltage DEC value, unit: MV, protection; overdischarge test current DEC value, unit: Ma; recovery lower limit voltage DEC value, unit: MV, no recovery, no recovery test, and the voltage can not be set; recovery upper limit voltage DEC value, unit: MV, recovery, no recovery test, and the voltage can not be set; overcurrent lower limit current DEC value, unit: MA, no protection; overcurrent upper limit current DEC value, unit: MA, protection; overcurrent protection delay DEC value, unit: MS; calibration voltage DEC value, no calibration voltage is written as 0; calibration current DEC value, no calibration current is written as 0.

[0052] According to the preset steps, the calibration voltage and current are first performed, and then the static, overcharge, overdischarge and overcurrent tests are sequentially performed.

[0053] In specific use, through the preset multiple groups of data, the functions of the BMS are sequentially tested, the performance of the BMS is comprehensively tested, the BMS test is systematically and comprehensively completed, and it is ensured that the functions meet the standards.

[0054] The data packet can be saved in 200 groups, and each group of data packet can store 200 16-bit data.

[0055] In specific use, sufficient storage space is provided, data packets in different test scenes are conveniently stored, various test requirements are met, and data storage and calling are facilitated.

[0056] The test action selection is selected through Bit0-6 of the HEX value.

[0057] Specific use, by setting the specific position of the HEX value, select the corresponding test action, accurate selection of test items, convenient operation and efficient.

[0058] The overcharge test node number selection and the overdischarge test node number selection select the single-node voltage to be tested by Bit0-14 of the HEX value, and when the string number exceeds, the maximum string number is processed;

[0059] When not testing recovery, the upper limit voltage of recovery and the lower limit voltage of recovery can not be set;

[0060] When not calibrating voltage, the calibration voltage is written as 0;

[0061] When not calibrating current, the calibration current is written as 0.

[0062] Specific use, according to the test requirements, flexible setting of test parameters, simplifying unnecessary setting steps, improving test flexibility, reducing invalid operation.

[0063] The test device 1 is fixedly arranged with a test part 2, and the test part 2 is arranged with a measured board 3;

[0064] The display screen 4 is fixedly arranged on one side above the test device 1, used for displaying the market value, and one side of the display screen 4 is also fixedly arranged with a display screen 4, used for linking the data line.

[0065] Specific use, the measured board 3 receives test on the test part 2, the display screen 4 displays test data, the data line interface realizes data transmission, constitutes the test device basic structure, realizes the display and transmission of test data.

[0066] The test part 2 further comprises: a handle 21 rotatably arranged on the test part 2, and a moving rod 22 fixedly arranged below the handle 21;

[0067] The moving rod 22 is fixedly arranged with a moving plate 23 at one end away from the handle 21, and a plurality of groups of measuring assemblies 24 are arranged below the moving plate 23, and the measured board 3 is arranged below the measuring assembly 24, used for testing the measured board 3;

[0068] Pressing the handle 21 drives the moving rod 22 to move downward, and then drives the measuring assembly 23 to press on the measured board 3.

[0069] Specific use, by pressing the handle to transmit power, the measuring assembly and the measured board are in contact for testing, realizing the precise butt joint of the measuring assembly and the measured board, and ensuring the smooth testing.

[0070] The test method is suitable for various BMSs with string numbers within the compatible range of the device, and for different BMS boards, different program data can be used for control expansion.

[0071] The above is the overall workflow of the present application, and the steps can be repeated next time.

[0072] It should be noted that the relational terms herein such as first and second and the like are used solely to distinguish one from another entity or action without necessarily requiring or implying any actual relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can also include other elements not expressly listed or inherent to such process, method, article, or apparatus.

[0073] Although embodiments of the present application have been shown and described, it would be appreciated by those skilled in the art that changes can be made in these embodiments without departing from the principles and spirit of the application, the scope of which is defined in the claims and their equivalents.

[0074] The above describes the present application and its embodiments, which are not limited, and the embodiments shown in the drawings are only one of the embodiments of the present application, and the actual structure is not limited thereto. In general, if a person skilled in the art is inspired by it, without departing from the purpose of the present application, without creative design, similar structure and embodiments of the technical solution should belong to the protection scope of the present application.

Claims

1. A novel BMS test method characterized in that: Pre-set 200 groups of data packets, each group of data packets containing 200 16-bit data, the data including: The number of protection board strings DEC value; The maximum value of static current DEC value; Test action selection HEX value, wherein Bit0~6 are calibration 0, static 1, overcharge protection 2, overdischarge protection 3, overcurrent protection 4, charge recovery test 5, discharge recovery test 6, and Bit7~15 are reserved; Static test platform voltage DEC value; Overcharge test platform voltage DEC value; Overdischarge test platform voltage DEC value; Overcharge test cell number selection HEX value, wherein Bit0~14 select the single cell voltage to be tested, and the number of strings exceeding the maximum string number; Overcharge lower limit voltage DEC value, unit MV, no protection; Overcharge upper limit voltage DEC value, unit MV, protection; Recovery upper limit voltage DEC value, unit MV, no recovery, no recovery test, and this voltage can not be set; Recovery lower limit voltage DEC value, unit MV, recovery, no recovery test, and this voltage can not be set; Overdischarge test cell number selection HEX value, wherein Bit0~14 select the single cell voltage to be tested, and the number of strings exceeding the maximum string number; Overdischarge upper limit voltage DEC value, unit MV, no protection; Overdischarge lower limit voltage DEC value, unit MV, protection; Overdischarge test current DEC value, unit Ma; Recovery lower limit voltage DEC value, unit MV, no recovery, no recovery test, and this voltage can not be set; Recovery upper limit voltage DEC value, unit MV, recovery, no recovery test, and this voltage can not be set; Overcurrent lower limit current DEC value, unit MA, no protection; Overcurrent upper limit current DEC value, unit MA, protection; Overcurrent protection delay DEC value, unit MS; Calibration voltage DEC value, write 0 for no calibration voltage; Calibration current DEC value, write 0 for no calibration current; According to the pre-set steps, the calibration voltage and current are first performed, and then the static, overcharge, overdischarge and overcurrent tests are sequentially performed.

2. The novel BMS test method according to claim 1, characterized in that: The data packets can be saved in 200 groups, and each group of data packets can store 200 16-bit data.

3. The novel BMS test method according to claim 1, characterized in that: The test action selection is selected by Bit0~6 of the HEX value.

4. The novel BMS test method according to claim 1, characterized in that: The overcharge test cell number selection and the overdischarge test cell number selection are selected by Bit0~14 of the HEX value, and when the number of strings exceeds, the maximum string number is processed.

5. The novel BMS test method according to claim 1, characterized in that: When the recovery is not tested, the recovery upper limit voltage and the recovery lower limit voltage can not be set; When the voltage is not calibrated, the calibration voltage is written as 0; When the current is not calibrated, the calibration current is written as 0. It includes:

6. A novel BMS testing device according to any one of claims 1-5, characterized by: A test device (1), a test part (2) is fixedly arranged on the test device (1), and a measured board (3) is arranged on the test part (2). ​ A display screen (4) is fixedly arranged on one side of the test device (1) for displaying the vehicle market value, and one side of the display screen (4) is also fixedly arranged with a display screen (4) for linking the data line.

7. The novel BMS test device according to claim 6, characterized in that: The test part (2) further comprises a handle (21) rotatably arranged on the test part (2), and a moving rod (22) is fixedly arranged below the handle (21); One end of the moving rod (22) away from the handle (21) is fixedly arranged with a moving plate (23), and a plurality of groups of measuring assemblies (24) are arranged below the moving plate (23), and a measured plate (3) is arranged below the measuring assemblies (24) for testing the measured plate (3); Pressing the handle (21) drives the moving rod (22) to move downward, and in turn drives the measuring assembly (23) to press onto the measured plate (3).

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