Self-adaptive configuration method, device and equipment for test parameters of mutual inductor

Abstract

The invention discloses a mutual inductor test parameter self-adaptive configuration method, device and equipment, and relates to the technical field of mutual inductors. The method comprises the following steps: acquiring real-time data corresponding to a mutual inductor; performing dynamic characteristic analysis processing according to the power supply frequency nominal value, the current signal and the voltage signal to obtain processed data; obtaining a preset saturation condition, determining a working state mode according to the preset saturation condition and the processed data, and processing the real-time data according to the working state mode to obtain a corresponding feature vector; and acquiring a preset test target of the mutual inductor, determining a parameter configuration result according to the test target, the environment temperature value and the feature vector, and adjusting and configuring the parameters of the mutual inductor according to the parameter configuration result to obtain the configured mutual inductor. According to the invention, the voltage set value and the target sampling rate can be dynamically determined according to the real-time data of the mutual inductor, the measurement precision is rapidly balanced, and adaptive data acquisition guarantee is provided for the mutual inductor test.

Description

TECHNICAL FIELD

[0001] The embodiment of the present application relates to the technical field of mutual inductor, and particularly relates to a mutual inductor test parameter adaptive configuration method, device and equipment. BACKGROUND

[0002] In the factory test, type test and field test of mutual inductor (including current transformer, voltage transformer, etc.), the traditional test method seriously depends on manual experience for parameter configuration, for example, voltage step setting in excitation characteristic test, current amplitude selection in transformation ratio test, frequency resolution adjustment in harmonic test, etc. The manual dependence can cause problems of low efficiency, insufficient accuracy, safety risk and standardization difficulty. In addition, in the prior art, although part of the automatic test equipment can realize fixed process control, the preset fixed step or excitation mode is adopted, and the real-time state adjustment cannot be realized according to the mutual inductor, for example, the voltage is still boosted according to the linear zone step when the core is close to saturation, at this time, data distortion is caused, and dynamic adaptability is lacked. Even though the development of intelligent algorithm and real-time monitoring technology in recent years provides a solution path for the above problems. However, the existing scheme focuses on a single link, and cannot systematically solve the adaptive configuration requirement of the whole process of mutual inductor test, especially in the aspect of multi-parameter collaborative optimization (voltage and sampling rate, etc.), there is still a technical blank.

[0003] Therefore, a new mutual inductor test parameter adaptive configuration method is urgently needed to break through the limitation of the traditional manual mode, and realize the efficiency, accuracy and automation of the test process. SUMMARY

[0004] The purpose of the present application is to at least solve one of the above technical defects.

[0005] In one aspect, the embodiment of the present application provides a mutual inductor test parameter adaptive configuration method, which comprises the following steps:

[0006] Obtaining real-time data corresponding to the mutual inductor, the real-time data comprising an environmental temperature value, a power frequency nominal value, a current signal and a voltage signal;

[0007] Performing dynamic characteristic analysis processing according to the power frequency nominal value, the current signal and the voltage signal to obtain processed data, the processed data comprising an absolute value of a maximum current change rate, a magnetic flux density change rate and a total harmonic distortion rate;

[0008] Obtaining a preset saturation condition, and determining a working state mode according to the preset saturation condition and the processed data, and processing the real-time data according to the working state mode to obtain a corresponding feature vector;

[0009] The test target of the mutual inductor is acquired, and a parameter configuration result is determined according to the test target, an environmental temperature value and a feature vector, and the parameter of the mutual inductor is adjusted and configured according to the parameter configuration result, so as to obtain the mutual inductor after configuration. The parameter configuration result includes a voltage setting value and a target sampling rate.

[0010] Optionally, before the dynamic characteristic analysis and processing according to the real-time data, the method further includes:

[0011] The time scales of the current signal and the voltage signal are aligned, and the aligned current signal and voltage signal are filtered to obtain filtered current signal and voltage signal.

[0012] The current effective value is determined according to the filtered current signal, and the voltage effective value is determined according to the filtered voltage signal.

[0013] The dynamic characteristic analysis and processing are performed according to the power frequency nominal value, the current signal and the voltage signal to obtain processed data, including:

[0014] The dynamic characteristic analysis and processing are performed according to the filtered current signal and voltage signal, the voltage effective value and the current effective value to obtain processed data.

[0015] Optionally, the dynamic characteristic analysis and processing are performed according to the filtered current signal and voltage signal, the voltage effective value and the current effective value to obtain processed data, including:

[0016] The current effective value is differentiated to determine the absolute value of the maximum current change rate.

[0017] The effective voltage is numerically integrated to obtain a magnetic flux integral value, and the magnetic flux density change rate is determined according to the magnetic flux integral value.

[0018] The fast Fourier transform is performed on the filtered current signal and voltage signal to obtain a transform value, and the total harmonic distortion rate is calculated according to the transform value to obtain the total harmonic distortion rate.

[0019] Optionally, the maximum current change rate threshold, the magnetic flux density change rate threshold and the total harmonic distortion rate threshold are preset, and the working state mode is determined according to the preset saturation condition and the processed data, including:

[0020] The first weight score is determined according to the size relationship between the absolute value of the maximum current change rate and the maximum current change rate threshold.

[0021] The second weight score is determined according to the size relationship between the magnetic flux density change rate and the magnetic flux density change rate threshold.

[0022] The third weight score is determined according to the size relationship between the total harmonic distortion rate and the total harmonic distortion rate threshold.

[0023] The working state mode is determined according to a sum value between the first weight score, the second weight score and the third weight score.

[0024] Optionally, the working state mode includes a saturation state working mode and a linear state working mode, and the real-time data is processed according to the working state mode to obtain a corresponding feature vector, including:

[0025] If the working state mode is the saturation state working mode, a saturation voltage and a saturation current corresponding to a saturation coordinate point are determined, and a saturation curvature is determined according to circuit parameter values within a range of the saturation coordinate point, and the feature vector includes an identifier of the saturation state working mode, the saturation voltage, the saturation current and the saturation curvature.

[0026] If the working state mode is the linear state working mode, an excitation inductance is calculated according to a voltage effective value, a power supply frequency nominal value and a frequency, and a phase difference and a winding resistance are obtained, an iron loss is determined according to the voltage effective value, a current effective value, the phase difference and the winding resistance, and the feature vector includes an identifier of the linear state working mode, the saturation voltage and the iron loss.

[0027] Optionally, a parameter configuration result is determined according to the test target, an environmental temperature value and the feature vector, including:

[0028] A mapping relationship between temperature and magnetic permeability is obtained, a magnetic permeability corresponding to the environmental temperature value is determined according to the mapping relationship, and a temperature compensation coefficient is obtained according to the magnetic permeability corresponding to the environmental temperature value.

[0029] The parameter configuration result is determined according to the test target, the feature vector and the temperature compensation coefficient.

[0030] Optionally, the parameter configuration result is determined according to the test target, the feature vector and the temperature compensation coefficient, including:

[0031] A current working state of the mutual inductor is determined according to an identifier of the working state mode in the feature vector, and a parameter value corresponding to the current working state is extracted from the feature vector.

[0032] A voltage calculation mode corresponding to the current working state is determined, and a voltage setting value is obtained according to the voltage calculation mode, the temperature compensation coefficient and the parameter value corresponding to the current working state.

[0033] A reference sampling rate is determined from a preset rule library according to the test target, and the reference sampling rate is adjusted according to the current working state to obtain a target sampling rate.

[0034] Optionally, parameters of the mutual inductor are adjusted and configured according to the parameter configuration result to obtain a configured mutual inductor, including:

[0035] Adjust a voltage value corresponding to a programmable power supply of the transformer to a voltage setting value;

[0036] Adjust a sampling rate corresponding to a data acquisition card of the transformer to a target sampling rate.

[0037] In another aspect, an embodiment of the present application provides a device for adaptive configuration of test parameters of a transformer, comprising:

[0038] a data acquisition module configured to acquire real-time data corresponding to the transformer, the real-time data including an ambient temperature value, a power supply frequency nominal value, a current signal, and a voltage signal;

[0039] a characteristic analysis module configured to perform dynamic characteristic analysis processing based on the power supply frequency nominal value, the current signal, and the voltage signal, to obtain processed data, the processed data including an absolute value of a maximum current change rate, a magnetic flux density change rate, and a total harmonic distortion rate;

[0040] a data processing module configured to acquire a preset saturation condition, and determine a working state mode based on the preset saturation condition and the processed data, and process the real-time data based on the working state mode to obtain a corresponding feature vector;

[0041] a parameter configuration module configured to acquire a test target preset for the transformer, and determine a parameter configuration result based on the test target, the ambient temperature value, and the feature vector, and adjust and configure parameters of the transformer based on the parameter configuration result to obtain a configured transformer, the parameter configuration result including a voltage setting value and a target sampling rate.

[0042] In another aspect, an embodiment of the present application provides an electronic device, comprising a processor and a memory:

[0043] The memory is configured to store machine-readable instructions, which, when executed by the processor, cause the processor to perform any one of the methods for adaptive configuration of test parameters of a transformer.

[0044] The technical solutions provided by the embodiments of the present application have at least the following beneficial effects:

[0045] In the present application, the ambient temperature value, the power supply frequency nominal value, the current signal, and the voltage signal of the transformer can be acquired, and then the test parameters can be dynamically adjusted based on the acquired ambient temperature value, power supply frequency nominal value, current signal, and voltage signal in combination with an intelligent algorithm to obtain the voltage setting value and the target sampling rate of the transformer. It can be seen that the scheme in the present application realizes full automation and high-precision control of the test process. Compared with the traditional manual method, the scheme in the present application can significantly shorten the test time, reduce the recognition error of the saturation point, and significantly improve the efficiency, accuracy, and reliability of the transformer test, and can be applied to scenarios such as high-precision metering, smart substation, and evaluation of old equipment. Attached Figure Description

[0046] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 A flowchart illustrating an adaptive configuration method for instrument transformer test parameters provided in this application embodiment;

[0048] Figure 2 A schematic diagram of the structure of an adaptive configuration device for test parameters of a current transformer provided in this application embodiment;

[0049] Figure 3 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0050] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting the invention.

[0051] Those skilled in the art will understand that, unless specifically stated otherwise, the singular forms “a,” “an,” “the,” and “the” used herein may also include the plural forms. It should be further understood that the term “comprising” as used in this application means the presence of the stated features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. It should be understood that when we say an element is “connected” or “coupled” to another element, it can be directly connected or coupled to the other element, or there may be intermediate elements. Furthermore, “connected” or “coupled” as used herein can include wireless connections or wireless coupling. The term “and / or” as used herein includes all or any units and all combinations of one or more associated listed items.

[0052] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0053] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0054] Specifically, such as Figure 1 As shown, the method may include:

[0055] Step S101: Obtain the real-time data corresponding to the current transformer. The real-time data includes the ambient temperature value, the nominal power frequency value, the current signal, and the voltage signal.

[0056] Optionally, during transformer testing, real-time data from the transformer can be acquired, specifically including ambient temperature, nominal power frequency, current signal, and voltage signal. The voltage signal in this real-time data can be either primary-side voltage waveform data containing instantaneous voltage values ​​or secondary-side voltage waveform data containing instantaneous voltage values, with a sampling rate of at least 10kHz. The current signal can be either primary-side current waveform data containing instantaneous current values ​​or secondary-side current waveform data containing instantaneous current values, and it is sampled synchronously with the voltage data.

[0057] Step S102: Perform dynamic characteristic analysis and processing based on the nominal power supply frequency, current signal, and voltage signal to obtain processed data. The processed data includes the absolute value of the maximum rate of change of current, the rate of change of magnetic flux density, and the total harmonic distortion rate.

[0058] Optionally, after acquiring real-time data, dynamic characteristic analysis can be performed on the nominal power frequency, current signal, and voltage signal in the real-time data. At this time, the absolute value of the maximum rate of change of current, the rate of change of magnetic flux density, and the total harmonic distortion rate can be obtained.

[0059] In an optional embodiment of this application, before performing dynamic characteristic analysis processing based on real-time data, the method further includes:

[0060] The current and voltage signals are time-aligned, and then filtered to obtain the filtered current and voltage signals.

[0061] Based on the filtered current signal, determine the effective value of the current, and based on the filtered voltage signal, determine the effective value of the voltage.

[0062] Dynamic characteristic analysis is performed based on the nominal power supply frequency, current signal, and voltage signal to obtain processed data, including:

[0063] According to the filtered current signal and voltage signal, voltage effective value and current effective value, dynamic characteristic analysis processing is performed to obtain processed data.

[0064] Optionally, before performing dynamic characteristic analysis processing on real-time data, because the obtained current signal and voltage signal can have a delay, at this time, the current signal and voltage signal can be time scale aligned to realize delay compensation, to obtain aligned current signal and voltage signal. Further, for the aligned current signal and voltage signal, 50Hz notch filter can be used for filtering to obtain filtered current signal and voltage signal. Further, the voltage effective value can be determined by the following formula:

[0065]

[0066] Wherein, U rms is the voltage effective value, N is the number of sampling points, U i is the filtered voltage value of the i-th sampling point.

[0067] At the same time, the current effective value can be determined according to the filtered current signal by the following formula:

[0068]

[0069] Wherein, I rms is the current effective value, N is the number of sampling points, I i is the filtered current value of the i-th sampling point.

[0070] Further, dynamic characteristic analysis processing can be performed according to the filtered current signal and voltage signal, voltage effective value and current effective value to obtain processed data.

[0071] In an optional embodiment of the present application, according to the filtered current signal and voltage signal, voltage effective value and current effective value, dynamic characteristic analysis processing is performed to obtain processed data, including:

[0072] The current effective value is differentiated and calculated to determine the absolute value of the maximum current change rate;

[0073] The effective voltage is numerically integrated to obtain a magnetic flux integral value, and the magnetic flux density change rate is determined according to the magnetic flux integral value;

[0074] According to the filtered current signal and voltage signal, fast Fourier transform processing is performed to obtain a transform value, and harmonic distortion rate calculation is performed according to the transform value to obtain total harmonic distortion rate.

[0075] Optionally, the current effective value can be differentiated to obtain the current difference of each sampling point, and then the reciprocal of the sampling current signal can be taken as the calculated time interval, and finally the quotient value of the current difference of each sampling point and the time interval can be taken as the current change rate of each sampling point. Further, by comparing the current change rate of each sampling point, the absolute value of the maximum current change rate is determined. As for the effective voltage, the effective voltage of each sampling point can be numerically integrated to obtain the magnetic flux integral value of the sampling point, and the difference between the maximum magnetic flux integral value and the minimum magnetic flux integral value is taken as the magnetic flux density change rate.

[0076] Further, the fundamental wave and the 2-15th harmonic wave in the filtered current signal and voltage signal can be respectively subjected to fast Fourier transform processing, at which time the transform value (i.e. the voltage total harmonic distortion rate and the current total harmonic distortion rate) can be obtained, at which time the fundamental wave phase difference in the voltage total harmonic distortion rate and the current total harmonic distortion rate can be extracted respectively, and then the sum of the extracted fundamental wave phase difference is taken as the total harmonic distortion rate.

[0077] In step S103, a preset saturation condition is obtained, and the working state mode is determined according to the preset saturation condition and the processed data, and the real-time data is processed according to the working state mode to obtain the corresponding feature vector.

[0078] Optionally, the preset saturation condition includes the current maximum change rate threshold, the magnetic flux density change rate threshold and the total harmonic distortion rate threshold, at which time the absolute value of the current maximum change rate, the magnetic flux density change rate and the total harmonic distortion rate are compared with the corresponding threshold in the preset saturation condition respectively, and the working state mode of the current transformer is determined according to the comparison result. Further, the real-time data is processed according to the processing mode corresponding to the determined working state mode to obtain the corresponding feature vector.

[0079] In the optional embodiment of the present application, the preset saturation condition includes the current maximum change rate threshold, the magnetic flux density change rate threshold and the total harmonic distortion rate threshold, and the working state mode is determined according to the preset saturation condition and the processed data, including:

[0080] The first weight score is determined according to the size relationship between the absolute value of the current maximum change rate and the current maximum change rate threshold;

[0081] The second weight score is determined according to the size relationship between the magnetic flux density change rate and the magnetic flux density change rate threshold;

[0082] The third weight score is determined according to the size relationship between the total harmonic distortion rate and the total harmonic distortion rate threshold;

[0083] The working state mode is determined according to the sum of the first weight score, the second weight score and the second weight score.

[0084] Optionally, it is determined whether the absolute value of the maximum current change rate is greater than a maximum current change rate threshold value, and if so, the first weight score is set to a predetermined score (e.g., 0.4), otherwise the first weight score is 0. It is determined whether the magnetic flux density change rate is less than a magnetic flux density change rate threshold value, and if so, the second weight score is set to a predetermined score (e.g., 0.3), otherwise the second weight score is 0. It is further determined whether the total harmonic distortion rate is greater than a total harmonic distortion rate threshold value, and if so, the third weight score is set to a predetermined score (e.g., 0.3), otherwise the third weight score is 0. Further, the first weight score, the second weight score and the third weight score are superimposed to obtain a total value, and the obtained total value is compared with the condition of the working state mode, so as to determine the current working state mode of the mutual inductor.

[0085] The working state mode includes a saturation state working mode and a linear state working mode. Optionally, when the obtained total value is greater than a preset saturation threshold value (e.g., 0.5), it is determined that the current working state of the mutual inductor is the saturation state working mode, otherwise it is determined that the current working state of the mutual inductor is the linear state working mode.

[0086] In an optional embodiment of the present application, the working state mode includes a saturation state working mode and a linear state working mode. The real-time data is processed according to the working state mode to obtain a corresponding feature vector, including:

[0087] If the working state mode is the saturation state working mode, the saturation voltage and the saturation current corresponding to the saturation coordinate point are determined, and the saturation curvature is determined according to the circuit parameter values within the range of the saturation coordinate point. The feature vector includes the identification of the saturation state working mode, the saturation voltage, the saturation current and the saturation curvature.

[0088] If the working state mode is the linear state working mode, the excitation inductance is calculated according to the voltage effective value, the power frequency nominal value and the current effective value, and the phase difference and the winding resistance are obtained. The iron loss is determined according to the voltage effective value, the current effective value, the phase difference and the winding resistance. The feature vector includes the identification of the linear state working mode, the saturation voltage and the iron loss.

[0089] Optionally, if it is determined that the working state of the transformer is a saturation state working mode, a saturation coordinate point (i.e. a position where the current rate of change is lower than a threshold value) can be determined at this time, and the saturation voltage and saturation current of the position are recorded. Further, the circuit parameter values in the range of the position setting are taken, such as the current and voltage of 10 sampling points before and after the saturation point, and then the circuit parameter values in the range of the position setting are subjected to quadratic derivative fitting to obtain a saturation curvature, which reflects the severity of saturation. Finally, the identification of the saturation state working mode, the saturation voltage, the saturation current, and the saturation curvature are generated into a feature vector.

[0090] Optionally, if it is determined that the working state of the transformer is a linear state working mode, the excitation inductance can be calculated according to the existing calculation formula of inductance according to the voltage effective value, the power frequency nominal value, and the current effective value. Further, the phase difference and the winding resistance can be obtained, and the iron loss can be determined according to the voltage effective value, the current effective value, the phase difference, and the winding resistance through the following formula:

[0091] P core =U rms ×I rms ×I 2 R

[0092] wherein, P core is the iron loss, I rms is the current effective value, U rms is the voltage effective value, I is the current of the sampling point, and R is the winding direct current resistance.

[0093] Correspondingly, the identification of the linear state working mode, the saturation voltage, and the iron loss can be generated into a feature vector.

[0094] In step S104, the test target preset for the transformer is obtained, the parameter configuration result is determined according to the test target, the environmental temperature value, and the feature vector, and the parameters of the transformer are adjusted and configured according to the parameter configuration result to obtain the configured transformer. The parameter configuration result includes the voltage setting value and the target sampling rate.

[0095] Optionally, the preset test target refers to the running state that the transformer wants to reach, such as the specific parameter value of the transformer. Further, the environmental temperature value and the feature vector can be processed according to the running state that the transformer wants to reach to determine the parameter configuration result, which can specifically include the voltage setting value and the target sampling rate of the transformer. Correspondingly, the parameters of the transformer are adjusted and configured according to the determined voltage setting value and the target sampling rate of the transformer to obtain the configured transformer.

[0096] In an optional embodiment of the present application, the parameter configuration result is determined according to the test target, the environmental temperature value, and the feature vector, including:

[0097] obtain a mapping relationship between temperature and permeability, determine the permeability corresponding to the ambient temperature value according to the mapping relationship, and obtain the temperature compensation coefficient according to the permeability corresponding to the ambient temperature value;

[0098] determine the parameter configuration result according to the test target, the eigenvector, and the temperature compensation coefficient.

[0099] Optionally, the mapping relationship between temperature and permeability can be obtained in advance, which can be determined by experiment. Further, the permeability corresponding to the temperature value in the obtained real-time data is determined based on the mapping relationship, and then the temperature compensation coefficient is determined based on the permeability corresponding to the ambient temperature value. For example, the mapping relationship between the temperature compensation coefficient and the permeability can be stored in advance, and then the temperature compensation coefficient of the permeability corresponding to the temperature value in the real-time data is obtained based on the mapping relationship between the temperature compensation coefficient and the permeability. Correspondingly, the parameter configuration result can be determined according to the test target, the eigenvector, and the determined temperature compensation coefficient.

[0100] In an optional embodiment of the present application, the parameter configuration result is determined according to the test target, the eigenvector, and the temperature compensation coefficient, including:

[0101] determine the current operating state of the transformer according to the operating state mode identifier in the eigenvector, and extract the parameter value corresponding to the current operating state from the eigenvector;

[0102] determine the voltage calculation mode corresponding to the current operating state, and obtain the voltage set value according to the voltage calculation mode, the temperature compensation coefficient, and the parameter value corresponding to the current operating state;

[0103] determine the reference sampling rate from the preset rule library according to the test target, and adjust the reference sampling rate according to the current operating state to obtain the target sampling rate.

[0104] Optionally, the eigenvector includes an identifier representing the operating state mode and a parameter value corresponding to the current operating state, at this time, the current operating state of the transformer can be determined from the identifier, and the parameter value corresponding to the current operating state can be extracted from the eigenvector. For example, the operating state mode of the current transformer can be determined according to the `operating_mode` field in the eigenvector. The operating state mode is usually divided into linear region and saturation region, the linear region represents that the transformer works in the linear region, at this time, the current is proportional to the voltage, and the saturation region represents that the core of the transformer enters the saturation state, and the current increases sharply.

[0105] Further, the corresponding voltage calculation mode can be determined according to the determined current working state, and then the voltage setting value can be calculated based on the temperature compensation coefficient and the extracted parameter value corresponding to the determined current working state according to the determined voltage calculation mode.

[0106] For example, if the identification in the feature vector represents that the working state mode is a saturation state working mode, the extracted parameter values are saturation voltage, saturation current and saturation curvature, at this time, small step back or forward can be used near the saturation point based on the saturation current and the saturation curvature. Generally, a range (for example, ±2%) is set near the saturation voltage, and a very small step is used for scanning in the range, and the voltage setting value is determined through the following formula:

[0107] U new = [U sat *(1±Δ)]*K T

[0108] wherein, U new is the voltage setting value, U sat is the saturation voltage, K T is the temperature compensation coefficient, and Δ is the back sweep amplitude (for example, 0.01-0.02, i.e., 1%-2%).

[0109] If the identification in the feature vector represents that the working state mode is a linear state working mode, the extracted parameter values are saturation voltage and iron loss, at this time, an acceleration step strategy can be used, and the new voltage setting value is increased by a step on the basis of the current voltage, and the step is proportional to the distance from the current voltage to the predicted saturation point, and the specific formula is

[0110] U new = [U current +K*(U sat -U current )]*K T

[0111] wherein, U new is the voltage setting value, U sat is the saturation voltage, U current is the current voltage of the transformer, K T is the temperature compensation coefficient, and K is an acceleration factor, which can be determined according to the iron loss.

[0112] Further, for the final sampling rate of the transformer, the reference sampling rate can be determined from the preset rule library according to the test target, and then the reference sampling rate is adjusted according to the determined current working state to obtain the target sampling rate. For example, if the working state of the transformer is determined to be a linear state working mode, the reference sampling rate is maintained, and the reference sampling rate is taken as the target sampling rate. If the working state of the transformer is determined to be a saturation state working mode, the target sampling rate is 3 times the reference sampling rate, which can better handle the saturation details.

[0113] In the present application, the voltage setting value and the target sampling rate can be dynamically determined according to the real-time data of the transformer, which can quickly balance the measurement accuracy, system load and safety, and provide adaptive data acquisition guarantee for the transformer test.

[0114] In the optional embodiment of the present application, the parameters of the transformer are adjusted and configured according to the parameter configuration result, and the configured transformer includes:

[0115] The voltage value corresponding to the programmable power supply of the transformer is adjusted to the voltage setting value;

[0116] The sampling rate corresponding to the data acquisition card of the transformer is adjusted to the target sampling rate.

[0117] Optionally, after the voltage setting value and the target sampling rate are determined, the voltage value corresponding to the programmable power supply of the transformer can be adjusted to the voltage setting value, and the sampling rate corresponding to the data acquisition card of the transformer can be adjusted to the target sampling rate, thereby providing adaptive data acquisition guarantee for the transformer test.

[0118] In the present application, the ambient temperature value, the power supply frequency nominal value, the current signal and the voltage signal of the transformer can be obtained, and then the test parameters are dynamically adjusted based on the obtained ambient temperature value, the power supply frequency nominal value, the current signal and the voltage signal combined with intelligent algorithm to obtain the voltage setting value and the target sampling rate of the transformer. It can be seen that the scheme in the present application realizes full automation and high precision control in the test process. Compared with the traditional manual method, the scheme in the present application can greatly shorten the test time, reduce the recognition error of the saturation point, and significantly improve the efficiency, accuracy and reliability of the transformer test, which can be applied to high-precision measurement, intelligent substation and old equipment evaluation scenes.

[0119] The embodiment of the present application provides a device for adaptive configuration of transformer test parameters, as shown in Figure 2 The device can include a data acquisition module 201, a characteristic analysis module 202, a data processing module 203 and a parameter configuration module 204, wherein,

[0120] The data acquisition module is configured to acquire real-time data corresponding to the transformer, the real-time data including an ambient temperature value, a power frequency nominal value, a current signal, and a voltage signal.

[0121] The characteristic analysis module is configured to perform dynamic characteristic analysis processing on the power frequency nominal value, the current signal, and the voltage signal, to obtain processed data, the processed data including an absolute value of a maximum current change rate, a magnetic flux density change rate, and a total harmonic distortion rate.

[0122] The data processing module is configured to acquire a preset saturation condition, determine a working state mode according to the preset saturation condition and the processed data, and process the real-time data according to the working state mode, to obtain a corresponding feature vector.

[0123] The parameter configuration module is configured to acquire a preset test target of the transformer, determine a parameter configuration result according to the test target, the ambient temperature value, and the feature vector, and adjust and configure parameters of the transformer according to the parameter configuration result, to obtain a configured transformer, the parameter configuration result including a voltage set value and a target sampling rate.

[0124] Optionally, before performing the dynamic characteristic analysis processing on the real-time data, the characteristic analysis module is further configured to:

[0125] align time scales of the current signal and the voltage signal, and filter the aligned current signal and voltage signal, to obtain filtered current and voltage signals;

[0126] determine a current effective value according to the filtered current signal, and determine a voltage effective value according to the filtered voltage signal;

[0127] perform the dynamic characteristic analysis processing on the power frequency nominal value, the current signal, and the voltage signal, to obtain the processed data, including:

[0128] perform the dynamic characteristic analysis processing on the filtered current and voltage signals, the voltage effective value, and the current effective value, to obtain the processed data.

[0129] Optionally, when performing the dynamic characteristic analysis processing on the filtered current and voltage signals, the voltage effective value, and the current effective value, to obtain the processed data, the characteristic analysis module is specifically configured to:

[0130] perform differential calculation processing on the current effective value, to determine the absolute value of the maximum current change rate;

[0131] perform numerical integral processing on the effective voltage, to obtain a magnetic flux integral value, and determine the magnetic flux density change rate according to the magnetic flux integral value;

[0132] The filtered current signal and the voltage signal are subjected to fast Fourier transform processing to obtain a transform value, and the total harmonic distortion rate is calculated according to the transform value to obtain the total harmonic distortion rate.

[0133] Optionally, the preset saturation condition current maximum change rate threshold, the magnetic flux density change rate threshold and the total harmonic distortion rate threshold are used to determine the working state mode according to the preset saturation condition and the processed data.

[0134] The first weight score is determined according to the size relationship between the absolute value of the current maximum change rate and the current maximum change rate threshold.

[0135] The second weight score is determined according to the size relationship between the magnetic flux density change rate and the magnetic flux density change rate threshold.

[0136] The third weight score is determined according to the size relationship between the total harmonic distortion rate and the total harmonic distortion rate threshold.

[0137] The working state mode is determined according to the sum of the first weight score, the second weight score and the third weight score.

[0138] Optionally, the working state mode includes a saturation state working mode and a linear state working mode, and the data processing module is specifically configured to:

[0139] If the working state mode is the saturation state working mode, the saturation voltage and the saturation current corresponding to the saturation coordinate point are determined, and the saturation curvature is determined according to the circuit parameter values within the range of the saturation coordinate point, and the feature vector includes the identification of the saturation state working mode, the saturation voltage, the saturation current and the saturation curvature.

[0140] If the working state mode is the linear state working mode, the excitation inductance is calculated according to the voltage effective value, the power frequency nominal value and the frequency, the phase difference and the winding resistance are obtained, the iron loss is determined according to the voltage effective value, the current effective value, the phase difference and the winding resistance, and the feature vector includes the identification of the linear state working mode, the saturation voltage and the iron loss.

[0141] Optionally, the parameter configuration module is specifically configured to:

[0142] The mapping relationship between the temperature and the magnetic permeability is obtained, the magnetic permeability corresponding to the environmental temperature value is determined according to the mapping relationship, and the temperature compensation coefficient is obtained according to the magnetic permeability corresponding to the environmental temperature value.

[0143] The parameter configuration result is determined according to the test target, the feature vector and the temperature compensation coefficient.

[0144] Optionally, the parameter configuration module, when determining the parameter configuration result according to the test target, the feature vector and the temperature compensation coefficient, is specifically configured to:

[0145] determine the current working state of the transformer according to the working state mode identifier in the feature vector, and extract the parameter value corresponding to the current working state from the feature vector;

[0146] determine the voltage calculation mode corresponding to the current working state, and obtain the voltage set value according to the voltage calculation mode, the temperature compensation coefficient and the parameter value corresponding to the current working state;

[0147] determine the reference sampling rate from the preset rule library according to the test target, and adjust the reference sampling rate according to the current working state to obtain the target sampling rate.

[0148] Optionally, the parameter configuration module, when adjusting and configuring the parameters of the transformer according to the parameter configuration result to obtain the configured transformer, is specifically configured to:

[0149] adjust the voltage value corresponding to the programmable power supply of the transformer to the voltage set value;

[0150] adjust the sampling rate corresponding to the data acquisition card of the transformer to the target sampling rate.

[0151] The transformer test parameter adaptive configuration device of the embodiment can execute the transformer test parameter adaptive configuration method shown in the embodiments of the present application, and the implementation principles are similar, which will not be described here.

[0152] The electronic device provided in the embodiments of the present application includes a processor and a memory. The memory is configured to store machine-readable instructions. When the instructions are executed by the processor, the processor executes a transformer test parameter adaptive configuration method.

[0153] The electronic device provided in the embodiments of the present application includes a processor and a memory. The memory is configured to store machine-readable instructions. When the instructions are executed by the processor, the processor executes a transformer test parameter adaptive configuration method. Figure 3 As shown in FIG. 8, Figure 3 The electronic device shown in FIG. 8 includes a processor 2001 and a memory 2003. The processor 2001 and the memory 2003 are connected, for example, through a bus 2002. Optionally, the electronic device 2000 can also include a transceiver 2004. It should be noted that the transceiver 2004 is not limited to one in actual application, and the structure of the electronic device 2000 does not constitute a limitation on the embodiments of the present application.

[0154] The processor 2001 can be a CPU, a general-purpose processor, a DSP, an ASIC, an FPGA, or other programmable logic device, transistor logic device, hardware component, or any combination thereof. It can implement or execute the various exemplary logical blocks, modules, and circuits described in connection with the disclosure. The processor 2001 can also be a combination of implementing computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like.

[0155] The bus 2002 can include a path for transmitting information between the above-mentioned components. The bus 2002 can be a PCI bus, an EISA bus, or the like. The bus 2002 can be divided into an address bus, a data bus, a control bus, and the like. For convenience of representation, Figure 3 In the drawings, only one thick line is used to represent the bus, but it does not mean that there is only one bus or only one type of bus.

[0156] The memory 2003 can be a ROM or other type of static storage device that can store static information and instructions, a RAM or other type of dynamic storage device that can store information and instructions, an EEPROM, a CD-ROM or other optical disk storage, an optical disk storage (including a compact disk, a laser disk, an optical disk, a digital versatile disk, a Blu-ray disk, and the like), a magnetic disk storage medium or other magnetic storage device, or any other medium capable of carrying or storing desired program code in the form of instructions or data structures and capable of being accessed by a computer, but not limited thereto.

[0157] The memory 2003 is used to store application program code for implementing the scheme of the present application, and is controlled by the processor 2001 to execute. The processor 2001 is used to execute the application program code stored in the memory 2003 to implement Figure 2 The embodiment shown provides an action of a mutual inductor test parameter adaptive configuration device.

[0158] It should be understood that although each step in the flowchart of the drawings is shown in sequence according to the direction of the arrow, these steps are not necessarily executed in sequence according to the direction of the arrow. Unless otherwise specified herein, the execution of these steps is not strictly limited in sequence, and they can be executed in other orders. Moreover, at least part of the steps in the flowchart of the drawings can include multiple sub-steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order is not necessarily sequential, but can be executed alternately or alternately with at least part of other steps or other steps, sub-steps or stages.

[0159] The above merely describes some embodiments of the present application, and it should be pointed out that, for those skilled in the art, some improvements and refinements can be made without departing from the principles of the present application, and these improvements and refinements should also be considered as falling within the protection scope of the present application.

Claims

1. A method for adaptive configuration of test parameters for a current transformer, characterized in that, include: Acquire real-time data corresponding to the current transformer, including ambient temperature value, nominal power frequency value, current signal and voltage signal; Dynamic characteristic analysis is performed based on the nominal power frequency, the current signal, and the voltage signal to obtain processed data, which includes the absolute value of the maximum rate of change of current, the rate of change of magnetic flux density, and the total harmonic distortion rate. Obtain a preset saturation condition, and determine the working state mode based on the preset saturation condition and the processed data, and process the real-time data according to the working state mode to obtain the corresponding feature vector; The preset test target of the current transformer is obtained, and the parameter configuration result is determined according to the test target, the ambient temperature value and the feature vector. The parameters of the current transformer are adjusted and configured according to the parameter configuration result to obtain the configured current transformer. The parameter configuration result includes the voltage setting value and the target sampling rate.

2. The method according to claim 1, characterized in that, Before performing dynamic characteristic analysis based on the real-time data, the process further includes: The current signal and the voltage signal are time-aligned, and the aligned current signal and voltage signal are filtered to obtain the filtered current signal and voltage signal; Based on the filtered current signal, the effective value of the current is determined, and based on the filtered voltage signal, the effective value of the voltage is determined. The process of performing dynamic characteristic analysis based on the nominal power supply frequency, the current signal, and the voltage signal to obtain processed data includes: Dynamic characteristic analysis is performed on the filtered current and voltage signals, the effective voltage value, and the effective current value to obtain the processed data.

3. The method according to claim 2, characterized in that, The process of performing dynamic characteristic analysis based on the filtered current and voltage signals, the effective voltage value, and the effective current value to obtain processed data includes: The effective value of the current is differentiated to determine the absolute value of the maximum rate of change of the current; The effective voltage is numerically integrated to obtain the magnetic flux integral value, and the rate of change of magnetic flux density is determined based on the magnetic flux integral value. The filtered current and voltage signals are processed by Fast Fourier Transform to obtain the transformed values, and the harmonic distortion rate is calculated based on the transformed values ​​to obtain the total harmonic distortion rate.

4. The method according to claim 1, characterized in that, The preset saturation conditions include the maximum rate of change threshold of current, the rate of change threshold of magnetic flux density, and the total harmonic distortion rate threshold. The step of determining the operating mode based on the preset saturation conditions and the processed data includes: The first weight score is determined based on the relationship between the absolute value of the maximum rate of change of current and the threshold value of the maximum rate of change of current. The second weight score is determined based on the relationship between the rate of change of magnetic flux density and the threshold value of the rate of change of magnetic flux density. The third weight score is determined based on the relationship between the total harmonic distortion rate and the total harmonic distortion rate threshold. The working state mode is determined based on the sum of the first weight score, the second weight score, and the third weight score.

5. The method according to claim 4, characterized in that, The operating mode includes a saturation mode and a linear mode. The step of processing the real-time data according to the operating mode to obtain the corresponding feature vector includes: If the operating mode is the saturated operating mode, then the saturated voltage and saturated current corresponding to the saturated coordinate point are determined, and the saturated curvature is determined according to the circuit parameter values ​​within the set range of the saturated coordinate point. The feature vector includes the identifier of the saturated operating mode, the saturated voltage, the saturated current, and the saturated curvature. If the operating mode is the linear operating mode, the magnetizing inductance is calculated based on the effective voltage value, the nominal power supply frequency value, and the frequency, and the phase difference and winding resistance are obtained. The iron loss is determined based on the effective voltage value, the effective current value, the phase difference, and the winding resistance. The feature vector includes the identifier of the linear operating mode, the saturation voltage, and the iron loss.

6. The method according to claim 1, characterized in that, The step of determining the parameter configuration result based on the test objective, the ambient temperature value, and the feature vector includes: Obtain the mapping relationship between temperature and permeability, determine the permeability corresponding to the ambient temperature value based on the mapping relationship, and obtain the temperature compensation coefficient based on the permeability corresponding to the ambient temperature value. The parameter configuration results are determined based on the experimental objective, the feature vector, and the temperature compensation coefficient.

7. The method according to claim 6, characterized in that, The step of determining the parameter configuration result based on the test objective, the feature vector, and the temperature compensation coefficient includes: The current operating state of the current transformer is determined based on the operating state mode identifier in the feature vector, and the parameter value corresponding to the current operating state is extracted from the feature vector. Determine the voltage calculation method corresponding to the current working state, and obtain the voltage setpoint based on the voltage calculation method, the temperature compensation coefficient, and the parameter value corresponding to the current working state; The baseline sampling rate is determined from the preset rule base according to the experimental objective, and the baseline sampling rate is adjusted according to the current working state to obtain the target sampling rate.

8. The method according to claim 1, characterized in that, The step of adjusting and configuring the parameters of the current transformer according to the parameter configuration result to obtain the configured current transformer includes: Adjust the voltage value corresponding to the programmable power supply of the current transformer to the voltage setting value; Adjust the sampling rate corresponding to the data acquisition card of the current transformer to the target sampling rate.

9. A device for adaptive configuration of test parameters for a current transformer, characterized in that, include: The data acquisition module is used to acquire real-time data corresponding to the current transformer, including ambient temperature value, nominal power frequency value, current signal and voltage signal; The characteristic analysis module is used to perform dynamic characteristic analysis processing based on the nominal value of the power supply frequency, the current signal and the voltage signal to obtain processed data. The processed data includes the absolute value of the maximum rate of change of current, the rate of change of magnetic flux density and the total harmonic distortion rate. The data processing module is used to obtain a preset saturation condition, determine the working state based on the preset saturation condition and the processed data, and process the real-time data according to the working state to obtain the corresponding feature vector. The parameter configuration module is used to obtain the preset test target of the current transformer, and determine the parameter configuration result based on the test target, the ambient temperature value and the feature vector, and adjust the parameters of the current transformer according to the parameter configuration result to obtain the configured current transformer. The parameter configuration result includes the voltage setting value and the target sampling rate.

10. An electronic device, characterized in that, Including the processor and memory: The memory is configured to store a computer program that, when executed by the processor, causes the processor to perform the method according to any one of claims 1-8.

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