A clock drift test apparatus for a crystal oscillator

Abstract

The present application relates to the technical field of crystal testing equipment, and particularly relates to a clock drift testing equipment for a crystal oscillator, which comprises a rack, a feeding mechanism, a swing arm transfer mechanism, a rotating mechanism, a testing mechanism, a transfer and alignment mechanism and a receiving mechanism; the rotating mechanism and the receiving mechanism are linearly distributed; the swing arm transfer mechanism is arranged on the side of the feeding mechanism and the rotating mechanism; the transfer and alignment mechanism corresponds to the swing arm transfer mechanism and the testing mechanism; the transfer and alignment mechanism comprises a transfer unit and an alignment unit; the swing arm transfer mechanism is used to move the crystal supplied by the feeding mechanism to the rotating mechanism, and then move the crystal with the adjusted posture of the rotating mechanism to the alignment unit; the alignment unit aligns the crystal, and then the testing mechanism tests the crystal in the alignment unit; and then the swing arm transfer mechanism moves the tested crystal to the receiving mechanism. The present application improves the testing accuracy and efficiency of the crystal.

Description

Technical Field

[0001] This invention relates to the field of crystal testing equipment technology, and more particularly to a clock drift testing device for crystal oscillators. Background Technology

[0002] In the production of crystal oscillators, due to production errors, defective products with unstable frequencies and large frequency drifts may be produced. Therefore, it is necessary to add a process to the production process to test the frequency drift of the crystal oscillator, that is, to test the crystal clock oscillator with a clock drift test device and reject defective products.

[0003] Existing patent CN118289472A discloses a crystal oscillator electro-cleaning device, comprising: a frame; a feeding mechanism; a positioning mechanism; a transfer mechanism, the transfer mechanism including a transfer bracket, a transfer motor mounted on the transfer bracket, and a suction nozzle assembly driven and connected to the transfer motor; a transfer mechanism, the transfer mechanism including a linear motor module fixed to the frame and a alignment platform assembly driven and connected to the linear motor module, the suction nozzle assembly being used to transfer the crystal oscillator from the positioning mechanism to the alignment platform assembly; and an electro-cleaning mechanism. In this patent, the crystal is easily affected by vibrations from various mechanisms during detection, thus affecting the accuracy of crystal detection. Summary of the Invention

[0004] This invention aims to at least solve one of the technical problems existing in related technologies. To this end, this invention provides a clock drift testing device for crystal oscillators, which solves the technical problems of poor crystal testing stability and mutual interference of vibrations among various components in the prior art, thereby improving the testing accuracy and efficiency of crystals.

[0005] The present invention provides a clock drift testing device for crystal oscillators, including a frame and a feeding mechanism, a swing arm transfer mechanism, a rotation mechanism, a testing mechanism, a transfer and correction mechanism, and a storage mechanism disposed on the frame;

[0006] The rotating mechanism and the storage mechanism are linearly distributed, the swing arm transfer mechanism is disposed on the side of the feeding mechanism and the rotating mechanism, and the transfer and alignment mechanism corresponds to the swing arm transfer mechanism and the testing mechanism;

[0007] The transfer and correction mechanism includes a transfer unit and two sets of correction units slidably disposed on the transfer unit. The test mechanism is provided with two sets of correction units corresponding to the correction units.

[0008] The frame includes an upper frame, a middle frame and a lower frame arranged in sequence. Two sets of testing mechanisms are respectively set on the upper frame and the lower frame. The transfer and alignment mechanism is connected to the upper frame and the lower frame and spans across the middle frame. The feeding mechanism, the swing arm transfer mechanism, the rotating mechanism and the storage mechanism are set on the middle frame.

[0009] The swing arm transfer mechanism is used to move the crystal supplied by the feeding mechanism to the rotating mechanism, and then transfer the crystal with adjusted posture by the rotating mechanism to the normalizing unit, the crystal is normalized by the normalizing unit, and then the crystal in the normalizing unit is tested by the testing mechanism, and then the swing arm transfer mechanism transfers the tested crystal to the storage mechanism.

[0010] The further improvement of the clock drift test device for the crystal oscillator is that the swing arm transfer mechanism comprises:

[0011] A swing arm supporting vertical plate is installed on the top surface of the middle rack, a first sliding rail in a horizontal shape is fixed on the side of the swing arm supporting vertical plate close to the feeding mechanism, a first sliding block is slidably arranged on the first sliding rail, a swing arm follower block is connected to the first sliding block, a swing arm follower strip-shaped hole extending in the vertical direction is formed in the swing arm follower block, a second sliding rail extending in the vertical direction is arranged on the side of the swing arm follower block away from the first sliding rail, a second sliding block is slidably arranged on the second sliding rail, and a swing arm mounting plate is installed on the second sliding block.

[0012] A swing arm driving motor is arranged on the side of the swing arm supporting vertical plate away from the feeding mechanism, a swing arm driving shaft of the swing arm driving motor penetrates the swing arm supporting vertical plate, a swing arm driving connecting rod is connected to the swing arm driving shaft, a swing arm driving bearing is connected to the swing arm driving connecting rod, the swing arm driving bearing penetrates the swing arm follower strip-shaped hole, and the swing arm mounting plate is connected to the swing arm driving bearing.

[0013] A swing arm suction nozzle unit is connected to the swing arm mounting plate.

[0014] The further improvement of the clock drift test device for the crystal oscillator is that the swing arm suction nozzle unit comprises:

[0015] A suction nozzle connecting block is installed on the swing arm mounting plate.

[0016] A suction nozzle supporting plate is installed on the suction nozzle connecting block.

[0017] A suction nozzle sliding rail extending in the vertical direction is installed on the suction nozzle supporting plate.

[0018] A suction nozzle mounting frame is slidably arranged on the suction nozzle sliding rail, a suction head is installed on the suction nozzle mounting frame, and the suction head is used to suck the crystal.

[0019] The further improvement of the clock drift test device for the crystal oscillator is that a plurality of camera mechanisms are arranged on the top of the swing arm supporting vertical plate.

[0020] The camera mechanism comprises:

[0021] A camera mounting bottom plate mounted on the top of the swing arm support stand;

[0022] A camera support column erected on the camera mounting bottom plate;

[0023] A camera mounting top plate mounted on the camera support column and in a horizontal state;

[0024] A camera main body mounted on the camera mounting top plate;

[0025] A light source mounting plate mounted on the camera support column, the light source mounting plate being located below the camera mounting top plate, the light source mounting plate being mounted with a light source main body, the light source main body and the camera main body being correspondingly arranged.

[0026] The further improvement of the clock drift test equipment for the crystal oscillator is that the rotating mechanism comprises:

[0027] A rotating adjusting base mounted on the middle rack;

[0028] A height adjusting stand mounted on the top surface of the rotating adjusting base, the rotating adjusting base being used to adjust the horizontal position of the height adjusting stand;

[0029] A height adjusting block slidingly arranged on the height adjusting stand;

[0030] A rotating motor fixing frame mounted on the top of the height adjusting block;

[0031] A rotating drive motor mounted on the bottom surface of the rotating motor fixing frame, a rotating drive shaft of the rotating drive motor penetrating through the rotating motor fixing frame, a top end of the rotating drive shaft being provided with a motor flange, the motor flange being located above the rotating motor fixing frame, the motor flange being connected with a rotating block, a top portion of the rotating block being provided with a crystal rotating groove for placing a crystal;

[0032] A material discharging detection unit mounted on the rotating motor fixing frame, the material discharging detection unit being used to detect the crystal position condition and the crystal placing condition of the crystal rotating groove.

[0033] The further improvement of the clock drift test equipment for the crystal oscillator is that the material transferring unit comprises a material transferring guide rail fixed to the upper rack and the lower rack, two material transferring motors mounted on two ends of the material transferring guide rail, and a material transferring sliding block slidingly arranged on the material transferring guide rail and drivingly connected to the material transferring motors.

[0034] The further improvement of the clock drift test equipment for the crystal oscillator is that the returning unit comprises:

[0035] A correction adapter plate installed on the transfer slider;

[0036] A correction vertical plate erected on the correction adapter plate;

[0037] A correction base plate connected to the correction vertical plate, the correction base plate is horizontally arranged, a correction sliding rail is arranged on the top surface of the correction base plate, a correction sliding block is slidably arranged on the correction sliding rail, a correction sliding rail connecting plate is arranged on the top surface of the correction sliding block, and a correction push bearing is arranged on the bottom surface of the correction sliding rail connecting plate;

[0038] A correction motor installed on the bottom surface of the correction base plate, a correction driving shaft of the correction motor penetrates the correction base plate, a correction cam is connected to the correction driving shaft, the correction cam is located above the correction base plate, the correction cam is drivingly connected to the correction push bearing, and the correction motor drives the correction cam to rotate, so as to push the correction push bearing and move the correction sliding rail connecting plate;

[0039] A correction lower bottom plate installed on the correction base plate, a plurality of correction adsorption holes are arranged at intervals on the correction lower bottom plate, the correction adsorption holes are communicated with a vacuum device, a plurality of first positioning blocks are arranged at intervals on the top of the correction lower bottom plate, the first positioning blocks and the correction adsorption holes are arranged in one-to-one correspondence, the correction sliding rail connecting plate is provided with a second positioning block corresponding to the position of each first positioning block, the second positioning block is slidably arranged on the top surface of the correction lower bottom plate, and a correction groove is formed between the first positioning block and the second positioning block.

[0040] A further improvement of the clock drift test device for the crystal oscillator is that the receiving mechanism comprises:

[0041] A sliding rail mounting plate installed on the middle rack, a sliding rail cylinder is mounted on the sliding rail mounting plate, and the sliding rail cylinder has a cylinder plunger;

[0042] A receiving adapter plate connected to the cylinder plunger and slidably arranged on the sliding rail cylinder;

[0043] A receiving backstop plate vertically installed on the receiving adapter plate;

[0044] An OK box and an NG box rotationally connected to the receiving backstop plate, a first feeding port is formed in the top of the OK box, and a second feeding port is formed in the top of the NG box;

[0045] A material guiding unit installed on the receiving backstop plate and located above the OK box and the NG box, the material guiding unit is communicated with the first feeding port and the second feeding port.

[0046] The further improvement of the clock drift test equipment for the crystal oscillator is that the test mechanism comprises:

[0047] A test support column is mounted on the upper rack or the lower rack, and a test adjusting plate is mounted on the test support column.

[0048] A pressing plate is mounted on the test adjusting plate, a pressing driving motor is mounted on the top of the test adjusting plate, a pressing driving shaft of the pressing driving motor penetrates through the pressing plate, a pressing driving crankshaft is connected to the pressing driving shaft, a pressing guide rail extending in the vertical direction is mounted on the pressing plate, a pressing sliding block is slidably arranged on the pressing guide rail, a pressing follower plate is connected to the pressing sliding block, a pressing follower slot extending in the horizontal direction is formed in the pressing follower plate, and the pressing driving crankshaft is slidably arranged in the pressing follower slot.

[0049] A test mounting plate is mounted on the pressing follower plate, a test support plate is slidably connected to the test mounting plate, a test circuit board is arranged on the top surface of the test support plate, a probe mounting plate is arranged on the bottom surface of the test support plate, the probe mounting plate is connected to the test circuit board, a plurality of probes are mounted on the probe mounting plate, and the probes are used to detect the crystal.

[0050] The further improvement of the clock drift test equipment for the crystal oscillator is that the feeding mechanism comprises a feeding base mounted on the middle rack, a circular vibration feeding unit mounted on the feeding base, and a straight vibration feeding unit mounted on the circular vibration feeding unit, wherein the crystal of the circular vibration feeding unit is vibrated to the straight vibration feeding unit, an end of the straight vibration feeding unit is provided with a feeding port, and the feeding port corresponds to the swing arm transfer mechanism.

[0051] The present application sets three suction nozzle units on the swing arm mechanism, realizes the simultaneous operation of different materials from the discharge port of the hopper to the feeding rotating mechanism, from the feeding rotating mechanism to the alignment mechanism, and from the alignment mechanism to the product storage mechanism, i.e., simultaneous swing and cleaning, improves the operation speed, and sets two test benches, which improves the operation speed when one side is tested and the other side is swinging.

[0052] The present application sets a camera mechanism on the top of the swing arm mechanism, improves the synchronism of the crystal detection and transfer, sets a rotating mechanism and an alignment unit, improves the adjustment efficiency of the crystal, and facilitates the detection of the crystal by the test mechanism.

[0053] The application sets the rack as multiple rack bodies, sets the feeding mechanism, the swing arm transfer mechanism, the rotating mechanism, the testing mechanism, the transfer and correction mechanism and the storage mechanism in different racks respectively, avoids the vibration of the feeding mechanism, the swing arm transfer mechanism and the rotating mechanism from affecting the testing mechanism, and improves the detection accuracy of the crystal.

[0054] Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will become apparent to those skilled in the art upon examination of the following and / or can be learned by practice of the application. BRIEF DESCRIPTION OF DRAWINGS

[0055] In order to more clearly illustrate the technical solutions in the application or prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are some embodiments of the application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0056] Figure 1 is a schematic view of a clock drift test device for a crystal oscillator provided by the application.

[0057] Figure 2 is a schematic view of a feeding mechanism in a clock drift test device for a crystal oscillator provided by the application.

[0058] Figure 3 is a schematic view of a rotating mechanism in a clock drift test device for a crystal oscillator provided by the application.

[0059] Figure 4 is a schematic view of a swing arm transfer mechanism in a clock drift test device for a crystal oscillator provided by the application. Figure 1 .

[0060] Figure 5 is a schematic view of a swing arm transfer mechanism in a clock drift test device for a crystal oscillator provided by the application. Figure 2 .

[0061] Figure 6 is a schematic view of a swing arm driving motor in a clock drift test device for a crystal oscillator provided by the application.

[0062] Figure 7 is a schematic view of a swing arm suction nozzle unit in a clock drift test device for a crystal oscillator provided by the application.

[0063] Figure 8 is a schematic view of a camera mechanism in a clock drift test device for a crystal oscillator provided by the application.

[0064] Figure 9Figure 1 is a schematic diagram of a transfer and alignment mechanism in a clock drift test device for a crystal oscillator according to the present application.

[0065] Figure 10 Figure 2 is a schematic diagram of an alignment unit in a clock drift test device for a crystal oscillator according to the present application. Figure 1 .

[0066] Figure 11 Figure 3 is a schematic diagram of an alignment unit in a clock drift test device for a crystal oscillator according to the present application. Figure 2 .

[0067] Figure 12 Figure 4 is a schematic diagram of a test mechanism in a clock drift test device for a crystal oscillator according to the present application. Figure 1 .

[0068] Figure 13 Figure 5 is a schematic diagram of a test mechanism in a clock drift test device for a crystal oscillator according to the present application. Figure 2 .

[0069] Figure 14 Figure 6 is a schematic diagram of a test support plate in a clock drift test device for a crystal oscillator according to the present application.

[0070] Figure 15 Figure 7 is a schematic diagram of a storage mechanism in a clock drift test device for a crystal oscillator according to the present application. Figure 1 .

[0071] Figure 16 Figure 8 is a schematic diagram of a storage mechanism in a clock drift test device for a crystal oscillator according to the present application. Figure 2 .

[0072] Figure 17 Figure 9 is an exploded schematic diagram of a rotating mechanism in a clock drift test device for a crystal oscillator according to the present application.

[0073] Figure 18 Figure 10 is an exploded schematic diagram of a test support plate in a clock drift test device for a crystal oscillator according to the present application.

[0074] Reference signs:

[0075] 11, upper rack; 12, middle rack; 13, lower rack; 2, feeding mechanism; 3, swing arm transfer mechanism; 4, rotating mechanism; 5, test mechanism; 6, transfer and alignment mechanism; 7, storage mechanism;

[0076] 21, feeding base; 22, circular vibration feeding unit; 23, straight vibration feeding unit; 24, feeding port;

[0077] 301, swing arm support stand; 302, swing arm drive motor; 303, first slide rail; 304, first slide block; 305, first limit block; 306, swing arm follower block; 307, second slide rail; 308, second slide block; 309, swing arm mounting plate; 31, swing arm suction nozzle unit; 32, camera mechanism; 3021, swing arm drive connecting rod; 3022, swing arm drive bearing; 310, suction nozzle connecting block; 311, suction nozzle support plate; 312, suction nozzle buffer spring; 313, suction nozzle mounting bracket; 314, suction head; 315, suction nozzle detection sheet metal; 316, suction nozzle detection sensor; 321, camera support column; 322, camera mounting top plate; 323, camera main body; 324, light source mounting plate; 325, light source main body;

[0078] 401, rotation adjustment base plate; 402, bidirectional rotation adjustment cylinder; 403, rotation adjustment top plate; 404, height adjustment stand; 405, height adjustment block; 406, height adjustment limit sheet metal; 407, height adjustment limit plate; 408, rotation motor fixing bracket; 409, rotation drive motor; 410, rotation detection sensor; 411, motor flange; 412, rotation block; 413, rotation detection support; 414, rotation detection optical fiber;

[0079] 501, test support column; 502, test adjustment plate; 503, pressing stand; 504, pressing drive motor; 505, pressing guide rail; 506, pressing slide block; 507, pressing follower plate; 508, test mounting plate; 509, test drive cylinder; 510, test support plate; 511, test circuit board; 512, test probe support plate; 513, probe mounting plate; 514, test cylindrical pin; 515, test adjustment block; 516, test adjustment bolt; 518, test fixing block; 519, U-shaped groove;

[0080] 60, transfer unit; 601, transfer guide rail; 602, transfer motor; 603, transfer slide block; 61, alignment unit; 610, alignment adapter plate; 611, alignment stand; 612, alignment backing plate; 613, alignment motor; 614, alignment sensing sheet metal; 615, alignment sensing sensor; 616, alignment slide rail; 617, alignment slide block; 618, alignment slide rail connecting plate; 619, alignment limit block; 620, alignment top plate; 621, alignment lower bottom plate; 622, first positioning block; 623, first pressing plate; 624, alignment auxiliary plate; 625, second positioning block;

[0081] 701, slide rail mounting plate; 702, slide rail cylinder; 703, storage adapter plate; 704, storage back baffle; 705, storage sheet metal; 706, OK box; 707, NG box; 708, catheter support; 709, first feeding pipe; 710, second feeding pipe; 711, buckle seat; 712, spherical door buckle. DETAILED DESCRIPTION

[0082] In order to make the objects, technical solutions and advantages of the present application clearer, the technical solutions in the present application will be described clearly and completely below with reference to the drawings in the present application. Obviously, the described embodiments are only some, but not all of the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall into the protection scope of the present application. The following embodiments are used to illustrate the present application, but cannot be used to limit the scope of the present application.

[0083] The present application is described below with reference to the drawings Figure 1 and Figure 9 A clock drift test device for a crystal oscillator is described, which comprises a rack and a feeding mechanism 2, an arm transfer mechanism 3, a rotating mechanism 4, a test mechanism 5, a transfer and alignment mechanism 6 and a storage mechanism 7 arranged on the rack.

[0084] The rotating mechanism 4 and the storage mechanism 7 are linearly distributed, the arm transfer mechanism 3 is arranged on the side of the feeding mechanism 2 and the rotating mechanism 4, and the transfer and alignment mechanism 6 corresponds to the arm transfer mechanism 3 and the test mechanism 5.

[0085] The transfer and alignment mechanism 6 comprises a transfer unit 60 and two groups of alignment units 61 slidably arranged on the transfer unit 60, the test mechanism 5 is provided with two groups of alignment units 61, the arm transfer mechanism 3 is used to move the crystal supplied by the feeding mechanism 2 to the rotating mechanism 4, and then move the crystal with adjusted posture of the rotating mechanism 4 to the alignment units 61, the alignment units 61 align the crystal, and then the test mechanism 5 tests the crystal located in the alignment units 61, and then the arm transfer mechanism 3 transfers the tested crystal to the storage mechanism 7.

[0086] In a preferred embodiment, in order to avoid the influence of vibration of the feeding mechanism 2 on the detection of the crystal, the rack comprises an upper rack 11, a middle rack 12 and a lower rack 13 arranged in sequence, wherein the two groups of test mechanisms 5 are arranged on the upper rack 11 and the lower rack 13 respectively, the transfer and alignment mechanism 6 is connected to the upper rack 11 and the lower rack 13 and arranged across the middle rack 12, and the feeding mechanism 2, the arm transfer mechanism 3, the rotating mechanism 4 and the storage mechanism 7 are arranged on the middle rack 12, so that the vibration of the feeding mechanism 2, the arm transfer mechanism 3 and the rotating mechanism 4 can only be transmitted to the middle rack 12, and the upper rack 11 and the lower rack 13 can still remain stable, so that the crystal can remain stable during testing, and the testing accuracy of the crystal is improved.

[0087] Further, as shown in Figure 4 , Figure 5 and Figure 6 , the arm transfer mechanism 3 comprises:

[0088] The swing arm support stand 301 is installed on the top surface of the middle rack 12, and a first sliding rail 303 horizontally fixed on the side of the swing arm support stand 301 close to the feeding mechanism 2 is provided. A first sliding block 304 is slidably arranged on the first sliding rail 303, and a swing arm follower block 306 is connected to the first sliding block 304. The swing arm follower block 306 is provided with a swing arm follower strip hole extending in the vertical direction. A second sliding rail 307 extending in the vertical direction is arranged on the side of the swing arm follower block 306 away from the first sliding rail 303. A second sliding block 308 is slidably arranged on the second sliding rail 307, and a swing arm mounting plate 309 is installed on the second sliding block 308.

[0089] The swing arm driving motor 302 is arranged on the side of the swing arm support stand 301 away from the feeding mechanism 2. A swing arm driving shaft of the swing arm driving motor 302 penetrates the swing arm support stand 301. A swing arm driving connecting rod 3021 is connected to the swing arm driving shaft. A swing arm driving bearing 3022 is connected to the swing arm driving connecting rod 3021. The swing arm driving bearing 3022 penetrates the swing arm follower strip hole. The swing arm mounting plate 309 is connected to the swing arm driving bearing 3022.

[0090] The swing arm suction nozzle unit 31 is connected to the swing arm mounting plate 309.

[0091] Preferably, the swing arm support stand 301 is provided with two first limiting blocks 305 for limiting the swing range of the swing arm driving connecting rod 3021, thereby limiting the moving position of the swing arm mounting plate 309.

[0092] Further, as shown in Figure 4 and Figure 7 , the swing arm suction nozzle unit 31 comprises a suction nozzle connecting block 310 installed on the swing arm mounting plate 309, a suction nozzle support plate 311 installed on the suction nozzle connecting block 310, a suction nozzle sliding rail extending in the vertical direction installed on the suction nozzle support plate 311, and a suction nozzle mounting frame 313 slidably arranged on the suction nozzle sliding rail. A suction head 314 is installed on the suction nozzle mounting frame 313, and the suction head 314 is used to suck the crystal.

[0093] Preferably, a suction nozzle buffer spring 312 is arranged between the suction nozzle mounting frame 313 and the suction nozzle support plate 311 to avoid hard collision between the suction nozzle mounting frame 313 and the suction nozzle support plate 311, and to ensure the stability and accuracy of the suction head 314 when sucking and releasing the crystal.

[0094] Specifically, a suction nozzle detection metal plate 315 is installed on the suction nozzle mounting frame 313, and a suction nozzle detection sensor 316 is installed on the suction nozzle support plate 311. The position of the suction nozzle detection metal plate 315 is sensed by the suction nozzle detection sensor 316 to determine the position of the suction head 314.

[0095] Further, as shown in Figure 4 and Figure 8 The top of the swing arm support stand 301 is provided with several groups of camera mechanisms 32.

[0096] The camera mechanism 32 comprises a camera mounting bottom plate mounted on the top of the swing arm support stand 301, a camera support column 321 erected on the camera mounting bottom plate, a camera mounting top plate 322 mounted on the camera support column 321 in a horizontal state, a camera main body 323 mounted on the camera mounting top plate 322, and a light source mounting plate 324 mounted on the camera support column 321, below the camera mounting top plate 322, which is provided with a light source main body 325 corresponding to the camera main body 323.

[0097] Preferably, the swing arm suction nozzle unit 31 is provided with three groups, namely the feeding suction nozzle, the intermediate suction nozzle, and the normalizing suction nozzle; and the camera mechanism 32 is provided with two groups, namely the feeding camera and the secondary camera.

[0098] Further, as shown in Figure 3 and Figure 17 The rotation mechanism 4 comprises a rotation adjustment base mounted on the middle rack 12, a height adjustment stand 404 mounted on the top surface of the rotation adjustment base, the rotation adjustment base being used to adjust the horizontal position of the height adjustment stand 404, a height adjustment block 405 slidingly arranged on the height adjustment stand 404, a rotation motor fixing frame 408 mounted on the top of the height adjustment block 405, a rotation drive motor 409 mounted on the bottom surface of the rotation motor fixing frame 408, the rotation drive shaft of the rotation drive motor 409 penetrating the rotation motor fixing frame 408, the top end of the rotation drive shaft being provided with a motor flange 411 above the rotation motor fixing frame 408, the motor flange 411 being connected with a rotation block 412, the top of the rotation block 412 being provided with a crystal rotation groove for placing a crystal, and a feeding detection unit mounted on the rotation motor fixing frame 408, the feeding detection unit being used to detect the crystal position and the crystal placement of the crystal rotation groove.

[0099] Specifically, the feeding detection unit comprises a rotation detection bracket 413 mounted on the rotation motor fixing frame 408 and a rotation detection optical fiber 414 mounted on the rotation detection bracket 413, which is used to detect the position of the crystal at the rotation block 412, thereby improving the accuracy of the crystal position detection and the efficiency of the crystal position adjustment.

[0100] Specifically, the rotation adjusting base comprises a rotation adjusting base plate 401 mounted on the middle rack 12, a two-way rotation adjusting cylinder 402 mounted on the rotation adjusting base plate 401, and a rotation adjusting top plate 403 connected to the two-way rotation adjusting cylinder 402, and a height adjusting vertical plate 404 is erected on the rotation adjusting top plate 403 and is adjusted by the two-way rotation adjusting cylinder 402 to change the horizontal position of the crystal rotation groove so as to correspond the crystal rotation groove and the swing arm suction nozzle unit 31.

[0101] Preferably, the height adjusting vertical plate 404 is in U shape, the height adjusting block 405 is slidably arranged inside the U shape of the height adjusting vertical plate 404, the height adjusting vertical plate 404 is mounted with a height adjusting limiting plate 407 and a height adjusting limiting metal plate 406, and the height adjusting block 405 is located between the height adjusting limiting plate 407 and the height adjusting limiting metal plate 406 to avoid the height adjusting block 405 from being separated from the height adjusting vertical plate 404.

[0102] Preferably, the height adjusting limiting plate 407 is mounted with a rotation detecting sensor 410, and the rotation detecting sensor 410 is used to detect the rotating position of the rotation indicating piece of the rotation driving motor 409.

[0103] Further, as shown in Figure 1 and Figure 9 , the transfer unit 60 comprises a transfer guide rail 601 fixed on the upper rack 11 and the lower rack 13, two transfer motors 602 mounted on both ends of the transfer guide rail 601, and a transfer sliding block 603 slidably arranged on the transfer guide rail 601 and drivenly connected to the transfer motor 602.

[0104] Preferably, the transfer guide rail can be two unit segments, which are arranged on the upper rack and the lower rack respectively.

[0105] Specifically, as shown in Figure 10 and Figure 11As shown, the alignment unit 61 comprises: an alignment adapter plate 610 mounted on the transfer slider 603; an alignment vertical plate 611 erected on the alignment adapter plate 610; an alignment backing plate 612 connected to the alignment vertical plate 611, the alignment backing plate 612 is horizontally arranged, the top surface of the alignment backing plate 612 is provided with an alignment sliding rail 616, the alignment sliding rail 616 is slidably provided with an alignment sliding block 617, the top surface of the alignment sliding block 617 is provided with an alignment sliding rail connecting plate 618, the bottom surface of the alignment sliding rail connecting plate 618 is provided with an alignment push bearing; an alignment motor 613 mounted on the bottom surface of the alignment backing plate 612, the alignment drive shaft of the alignment motor 613 penetrates the alignment backing plate 612, the alignment drive shaft is connected with an alignment cam, the alignment cam is located above the alignment backing plate 612, the alignment cam is drivingly connected to the alignment push bearing, the alignment motor 613 drives the alignment cam to rotate, so as to push the alignment push bearing, thereby pushing the alignment sliding rail connecting plate 618 to move; an alignment lower bottom plate 621 mounted on the alignment backing plate 612, the alignment lower bottom plate 621 is provided with a plurality of alignment adsorption holes which are spaced apart, the alignment adsorption holes are communicated with a vacuum device, the top portion of the alignment lower bottom plate 621 is provided with a plurality of first positioning blocks 622 which are spaced apart, the first positioning blocks 622 and the alignment adsorption holes are arranged one by one in correspondence, the alignment sliding rail connecting plate 618 is provided with a second positioning block 625 corresponding to the position of each first positioning block 622, the second positioning block 625 is slidably arranged on the top surface of the alignment lower bottom plate 621, and the alignment groove is formed between the first positioning block 622 and the second positioning block 625.

[0106] Specifically, the top portion of the alignment sliding rail connecting plate 618 is provided with an alignment auxiliary plate 624, and the second positioning block 625 is mounted on the alignment auxiliary plate 624; the top portion of the alignment sliding rail connecting plate 618 is provided with an alignment top plate 620, the alignment lower bottom plate 621 is mounted on the alignment top plate 620, the alignment backing plate 612 is provided with an alignment limiting block 619 for limiting the movement position of the alignment sliding rail connecting plate 618, and the top portion of the alignment lower bottom plate 621 is provided with a first pressing plate 623, and the first positioning block is clamped between the alignment lower bottom plate 621 and the first pressing plate 623, so as to improve the positional stability of the first positioning block 622.

[0107] Specifically, the alignment vertical plate 611 is mounted with an alignment induction plate 614, the alignment induction plate 614 is connected with an alignment induction sensor 615, and the alignment induction sensor 615 is used to sense the position of the alignment indicator of the alignment motor 613, so as to facilitate detection of the movement position of the second positioning block 625.

[0108] Further, as shown in Figure 15 and Figure 16 , the receiving mechanism 7 comprises:

[0109] a sliding rail mounting plate 701 mounted on the middle rack 12, and a sliding rail air cylinder 702 mounted on the sliding rail mounting plate 701, the sliding rail air cylinder 702 having a cylinder plunger;

[0110] a receiving adapter plate 703 connected to the cylinder plunger and slidingly arranged in the slide rail cylinder 702;

[0111] a receiving backstop 704 vertically mounted on the receiving adapter plate 703;

[0112] an OK box 706 and an NG box 707 rotatably connected to the receiving backstop 704, the OK box 706 having a first feeding port formed on the top thereof, and the NG box 707 having a second feeding port formed on the top thereof;

[0113] a material guiding unit mounted on the receiving backstop 704 and above the OK box 706 and the NG box 707, the material guiding unit being in communication with the first feeding port and the second feeding port.

[0114] Specifically, the receiving backstop 704 is connected with a receiving panel 705, the receiving panel 705 surrounding the OK box 706 and the NG box 707, the receiving backstop 704 being connected with a buckle seat 711, the buckle seat 711 being formed with two ball grooves, two spherical door buckles 712 being arranged in the two ball grooves, the OK box 706 and the NG box 707 being respectively connected to the spherical door buckles 712, the OK box 706 or the NG box 707 being rotated by the spherical door buckles 712 in the ball grooves, so as to facilitate replacement of the OK box 706 and the NG box 707, the OK box 706 storing therein the crystals that pass the test of the test mechanism 5, and the NG box 707 storing therein the crystals that fail the test of the test mechanism 5.

[0115] Preferably, the material guiding unit comprises a pipe support 708 mounted on the receiving backstop 704 and above the OK box 706 and the NG box 707, a first feeding pipe 709 and a second feeding pipe 710 connected to the pipe support 708, the first feeding pipe 709 being connected to the first feeding port, and the second feeding pipe 710 being connected to the second feeding port.

[0116] Further, as shown in Figure 12 、 Figure 13 、 Figure 14 and Figure 18 , the test mechanism 5 comprises:

[0117] a test support column 501 mounted on the upper rack 11 and the lower rack 13, and a test adjusting plate 502 mounted on the test support column 501;

[0118] The lower pressing vertical plate 503 is installed on the test adjusting plate 502, the top of the test adjusting plate 502 is installed with a lower pressing driving motor 504, the lower pressing driving shaft of the lower pressing driving motor 504 penetrates through the lower pressing vertical plate 503, the lower pressing driving shaft is connected with a lower pressing driving crank, the lower pressing vertical plate 503 is installed with a lower pressing guide rail 505 extending in the vertical direction, the lower pressing guide rail 505 is slidably provided with a lower pressing sliding block 506, the lower pressing sliding block 506 is connected with a lower pressing follow-up plate 507, the lower pressing follow-up plate 507 is provided with a lower pressing follow-up strip-shaped hole extending in the horizontal direction, and the lower pressing driving crank slides in the lower pressing follow-up strip-shaped hole.

[0119] The test mounting plate 508 is installed on the lower pressing follow-up plate 507, the test mounting plate 508 is slidably connected with a test support plate 510, the top surface of the test support plate 510 is provided with a test circuit board 511, the bottom surface of the test support plate 510 is provided with a probe mounting plate 513 connected to the test circuit board 511, and the probe mounting plate 513 is installed with a plurality of probes for detecting the crystal.

[0120] Specifically, as shown in Figure 12 , Figure 13 , Figure 14 and Figure 18 , the bottom surface of the test mounting plate 508 is installed with a test driving cylinder 509, and the test support plate 510 is connected to the test driving cylinder 509; the bottom surface of the test support plate 510 is provided with a test cylindrical pin 514 and a test probe support plate 512, the test probe support plate 512 is connected with the probe mounting plate 513, and the test probe support plate 512 is connected to the test cylindrical pin 514.

[0121] Specifically, as shown in Figure 12 , Figure 13 , Figure 14 and Figure 18 , the bottom surface of the test support plate 510 is formed with a U-shaped groove 519, the U-shaped groove 519 is fixed with a test fixing block 518 and slidably provided with a test adjusting block 515, a test adjusting bolt 516 is screwed in the test fixing block 518 and the test adjusting block 515, the test adjusting block 515 is partially located at the bottom of the test probe support plate 512, the test adjusting block 515 is located at the bottom of the test probe support plate 512 to form an adjusting portion, the thickness of the adjusting portion close to the test fixing block 518 is smaller than the thickness of the adjusting portion away from the test fixing block 518, by screwing the test adjusting bolt 516, the position of the test adjusting block 515 in the U-shaped groove 519 is driven, so as to adjust the overlapping position of the adjusting portion and the test probe support plate 512, so as to drive the test probe support plate 512 to rotate around the test cylindrical pin 514, so as to drive the probe mounting plate 513 to rotate, so as to adjust the angle of the probe mounting plate 513.

[0122] Further, as shown in Figure 2As shown, the feeding mechanism 2 comprises: a feeding base 21 mounted on the middle rack 12; a circular vibration feeding unit 22 mounted on the feeding base 21; a straight vibration feeding unit 23 mounted on the circular vibration feeding unit 22, the crystal in the circular vibration feeding unit 22 is vibrated to the straight vibration feeding unit 23, the end of the straight vibration feeding unit 23 is provided with a feeding port 24 corresponding to the swing arm transfer mechanism 3, the crystal in the circular vibration feeding unit 22 is vibrated into the straight vibration feeding unit 23, and then the straight vibration feeding unit 23 vibrates the crystal to the feeding port 24, so that the swing arm suction nozzle unit 31 can suck the crystal.

[0123] In a specific implementation case, the feeding mechanism 2 vibrates the crystal to the feeding port 24;

[0124] The swing arm driving motor 302 rotates, so that the feeding suction nozzle reaches the feeding port, the suction head of the feeding suction nozzle sucks up the crystal, then the swing arm driving motor 302 continues to rotate, the feeding suction nozzle transfers the crystal to the crystal rotating groove of the rotating block 412, and the discharge detection unit detects whether the crystal is placed in the crystal rotating groove and whether the crystal is rotated in place; if the crystal placed in the crystal rotating groove is reversed, the rotating driving motor 409 rotates, thereby driving the rotating block 412 to rotate, so as to convert the reversed crystal into a forward one, and if the crystal is forward, the rotating block 412 does not rotate;

[0125] The swing arm driving motor 302 rotates, the suction head of the intermediate suction nozzle sucks up the crystal in the crystal rotating groove, and then transfers to the normalizing unit, and the normalizing unit normalizes the crystal;

[0126] When the normalizing unit is full of crystals, the test mechanism tests the crystals on the normalizing unit, after the test is completed, the other normalizing unit is also full of crystals, the transfer unit 60 drives the other normalizing unit to correspond to the other test mechanism to test; and the normalizing suction nozzle transfers the crystals detected by the secondary camera to the NG box or the OK box, so that the qualified products finally enter the OK box, and the defective products enter the NG box;

[0127] After all the tests are completed, the equipment is paused, and the operator quickly disassembles the OK box and the NG box through the spherical door buckle 712 to collect the materials.

[0128] According to the application, the rack is provided as three, and there is no hard connection between the upper rack 11, the middle rack 12 and the lower rack 13, so that the feeding mechanism 2, the swing arm transfer mechanism 3, the rotating mechanism 4 and the storage mechanism 7 run without affecting the test mechanism, and the vibration of the surrounding environment to the test is reduced.

[0129] The present application realizes the simultaneous movement of the crystal from the feeding port to the rotating mechanism, from the rotating mechanism to the normalizing unit, and from the normalizing unit to the storage mechanism, that is, the simultaneous swinging and cleaning of the material, thereby improving the operation speed, and the testing mechanism and the normalizing unit are provided with two, when testing on one side, the other side swings the material, thereby also improving the operation speed.

[0130] The present application provides a buffer for the crystal falling into the OK box 706 or the NG box 707, thereby avoiding the material from being hurt.

[0131] Finally, it should be noted that: the above examples are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing examples, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing examples, or make equivalent replacement for part of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A clock drift test apparatus for a crystal oscillator, characterized by, The machine frame comprises a rack and a feeding mechanism, a swing arm transfer mechanism, a rotating mechanism, a testing mechanism, a transfer and alignment mechanism and a storage mechanism arranged on the rack; The rotating mechanism and the storage mechanism are linearly distributed, the swing arm transfer mechanism is arranged on the side of the feeding mechanism and the rotating mechanism, and the transfer and alignment mechanism corresponds to the swing arm transfer mechanism and the testing mechanism; The transfer and alignment mechanism comprises a transfer unit and two groups of alignment units slidingly arranged on the transfer unit, and the testing mechanism is provided with two groups corresponding to the alignment units; The rack comprises an upper rack, a middle rack and a lower rack arranged in sequence, two groups of testing mechanisms are arranged on the upper rack and the lower rack respectively, the transfer and alignment mechanism is connected to the upper rack and the lower rack and is arranged across the middle rack, and the feeding mechanism, the swing arm transfer mechanism, the rotating mechanism and the storage mechanism are arranged on the middle rack; The swing arm transfer mechanism is used to move the crystal supplied by the feeding mechanism to the rotating mechanism, then transfer the crystal with adjusted posture by the rotating mechanism to the alignment unit, the alignment unit aligns the crystal, then the testing mechanism tests the crystal located on the alignment unit, and then the swing arm transfer mechanism transfers the tested crystal to the storage mechanism; The swing arm transfer mechanism comprises: A swing arm support vertical plate is installed on the top surface of the middle rack, a first sliding rail in a horizontal shape is fixed on the side surface of the swing arm support vertical plate close to the feeding mechanism, a first sliding block is slidingly arranged on the first sliding rail, a swing arm follower block is connected to the first sliding block, a swing arm follower strip-shaped hole extending in the vertical direction is formed in the swing arm follower block, a second sliding rail extending in the vertical direction is arranged on the side surface of the swing arm follower block away from the first sliding rail, a second sliding block is slidingly arranged on the second sliding rail, and a swing arm mounting plate is installed on the second sliding block; A swing arm driving motor is arranged on the side of the swing arm support vertical plate away from the feeding mechanism, a swing arm driving shaft of the swing arm driving motor penetrates the swing arm support vertical plate, a swing arm driving connecting rod is connected to the swing arm driving shaft, a swing arm driving bearing is connected to the swing arm driving connecting rod, the swing arm driving bearing penetrates the swing arm follower strip-shaped hole, and the swing arm mounting plate is connected to the swing arm driving bearing; A swing arm suction nozzle unit is connected to the swing arm mounting plate, and the swing arm suction nozzle unit is provided with three groups, i.e., an inlet suction nozzle, an intermediate suction nozzle and an alignment suction nozzle; The swing arm suction nozzle unit comprises: A suction nozzle connecting block installed on the swing arm mounting plate; A suction nozzle support plate installed on the suction nozzle connecting block; A suction nozzle sliding rail extending in the vertical direction and installed on the suction nozzle support plate; A suction nozzle mounting frame slidingly arranged on the suction nozzle sliding rail, a suction head is installed on the suction nozzle mounting frame, and the suction head is used to suck the crystal; A plurality of camera mechanisms are arranged on the top of the swing arm support vertical plate, and the camera mechanisms are provided with two groups, i.e., an inlet camera and a secondary camera; The camera mechanism comprises: A camera mounting bottom plate installed on the top of the swing arm support vertical plate; A camera support column vertically arranged on the camera mounting bottom plate; A camera mounting top plate horizontally mounted on the camera support column; A camera body mounted on the camera mounting top plate; A light source mounting plate mounted on the camera support column, the light source mounting plate being below the camera mounting top plate, the light source mounting plate mounting a light source body, the light source body and the camera body being correspondingly arranged.

2. A device for testing the drift of a crystal oscillator according to claim 1, characterized in that The rotating mechanism comprises: A rotating adjusting base mounted on the middle rack; A height adjusting vertical plate mounted on the top surface of the rotating adjusting base, the rotating adjusting base being used to adjust the horizontal position of the height adjusting vertical plate; A height adjusting block slidingly arranged on the height adjusting vertical plate; A rotating motor fixing frame mounted on the top of the height adjusting block; A rotating drive motor mounted on the bottom surface of the rotating motor fixing frame, a rotating drive shaft of the rotating drive motor penetrating through the rotating motor fixing frame, a top end of the rotating drive shaft being provided with a motor flange, the motor flange being above the rotating motor fixing frame, the motor flange being connected with a rotating block, a crystal rotating groove for placing a crystal being formed on the top of the rotating block; A material discharging detection unit mounted on the rotating motor fixing frame, the material discharging detection unit being used to detect the crystal position condition and the crystal placing condition of the crystal rotating groove.

3. The device for testing the clock drift of a crystal oscillator according to claim 1, characterized in that The transfer unit comprises a transfer guide rail fixed to the upper rack and the lower rack, two transfer motors mounted on both ends of the transfer guide rail, and a transfer sliding block slidingly arranged on the transfer guide rail and drivingly connected to the transfer motors.

4. A device for testing the drift of a crystal oscillator according to claim 3, characterized in that The alignment unit comprises: An alignment adapter plate mounted on the transfer sliding block; An alignment vertical plate vertically arranged on the alignment adapter plate; An alignment backing plate connected to the alignment vertical plate, the alignment backing plate being horizontally arranged, the top surface of the alignment backing plate being provided with an alignment sliding rail, an alignment sliding block slidingly arranged on the alignment sliding rail, the top surface of the alignment sliding block being provided with an alignment sliding rail connecting plate, the bottom surface of the alignment sliding rail connecting plate being provided with an alignment pushing bearing; An alignment motor mounted on the bottom surface of the alignment backing plate, an alignment drive shaft of the alignment motor penetrating through the alignment backing plate, the alignment drive shaft being connected with an alignment cam, the alignment cam being above the alignment backing plate, the alignment cam drivingly connected to the alignment pushing bearing, the alignment motor driving the alignment cam to rotate, so as to push the alignment pushing bearing, thereby moving the alignment sliding rail connecting plate; An alignment lower bottom plate mounted on the alignment backing plate, a plurality of alignment adsorption holes being spaced apart on the alignment lower bottom plate, the alignment adsorption holes being communicated with a vacuum device, a plurality of first positioning blocks being spaced apart on the top of the alignment lower bottom plate, the first positioning blocks and the alignment adsorption holes being one-to-one correspondingly arranged, the alignment sliding rail connecting plate being provided with a second positioning block corresponding to the position of each first positioning block, the second positioning block slidingly arranged on the top surface of the alignment lower bottom plate, the first positioning block and the second positioning block forming an alignment groove.

5. The device for testing the drift of a crystal oscillator according to claim 1, characterized in that, The storage mechanism comprises: A sliding rail mounting plate mounted on the middle rack, a sliding rail cylinder being mounted on the sliding rail mounting plate, the sliding rail cylinder having a cylinder plunger; A receiving adapter plate connected to the cylinder plunger and slidingly arranged in the slide rail cylinder; A receiving backstop vertically arranged in the receiving adapter plate; An OK box and an NG box rotationally connected to the receiving backstop, the OK box being provided with a first feeding port at the top thereof, and the NG box being provided with a second feeding port at the top thereof; A material guiding unit arranged above the OK box and the NG box and arranged in the receiving backstop, the material guiding unit being communicated with the first feeding port and the second feeding port.

6. The device for testing the clock drift of a crystal oscillator according to claim 1, characterized in that The testing mechanism comprises: A testing support column arranged in the upper rack or the lower rack, and a testing adjusting plate arranged in the testing support column; A pressing vertical plate arranged in the testing adjusting plate, a pressing driving motor being arranged at the top of the testing adjusting plate, a pressing driving shaft of the pressing driving motor penetrating through the pressing vertical plate, a pressing driving crankshaft being connected to the pressing driving shaft, a pressing guide rail extending in the vertical direction being arranged in the pressing vertical plate, a pressing sliding block slidingly arranged in the pressing guide rail, a pressing follower plate being connected to the pressing sliding block, a pressing follower slot extending in the horizontal direction being arranged in the pressing follower plate, and the pressing driving crankshaft slidingly arranged in the pressing follower slot; A testing mounting plate arranged in the pressing follower plate, a testing support plate being slidingly connected to the testing mounting plate, a testing circuit board being arranged at the top of the testing support plate, a probe mounting plate being arranged at the bottom of the testing support plate, the probe mounting plate being connected to the testing circuit board, and a plurality of probes being arranged in the probe mounting plate, the probes being used to detect the crystal.

7. The device for testing the clock drift of a crystal oscillator according to claim 1, characterized in that The feeding mechanism comprises: A feeding base arranged in the middle rack; A circular vibration feeding unit arranged in the feeding base; A straight vibration feeding unit arranged in the circular vibration feeding unit, the crystal of the circular vibration feeding unit being vibrated to the straight vibration feeding unit, an end of the straight vibration feeding unit being provided with a feeding port, and the feeding port corresponding to the swing arm transferring mechanism.

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