Automatic Faraday and polaroid insertion loss scanning test process

Abstract

The invention belongs to the technical field of polaroid insertion loss testing, and particularly relates to an automatic Faraday polaroid insertion loss scanning testing process, according to the scheme, an upper collimator and a lower collimator are kept still, the whole face of a product is scanned and tested through movement of a displacement platform, the whole face of the product can be tested, and a document is produced according to the test data, so that the test data can be stored in a database. An operator can judge whether a product is qualified or not and identify the specific position of a defective product by checking data in a test document, the test process can detect the performance uniformity of the whole large Faraday and polaroid, can identify local poor performance, saves manpower, facilitates and faster data analysis, and improves the test efficiency. The test process can perform insertion loss automatic scanning test on the whole surface of the Faraday polaroid, so that the test efficiency is improved, and the detection control range is enhanced.

Description

Technical Field

[0001] This invention belongs to the field of polarizer insertion loss testing technology, specifically relating to Faraday and automatic scanning testing technology for polarizer insertion loss. Background Technology

[0002] Traditionally, Faraday rotators were tested by gluing them to polarizers and performing single-point performance tests on a platform, focusing on parameters such as insertion loss and isolation. However, localized defects may exist within the Faraday rotator, and single-point testing cannot identify these defective areas in advance, leading to material and manpower waste in subsequent processes. Furthermore, due to limitations in growth processes, commercially available Faraday rotators are typically manufactured as large, fixed-size sheets. Downstream optical isolators require further cutting into smaller sheets. Testing the large sheets cannot objectively reflect the quality of the smaller sheets, while the small size and large quantity of the smaller sheets make performance testing difficult. Currently, performance can only be evaluated by cutting the large sheets and assembling them into finished isolators, consuming significant resources and increasing downstream costs. Summary of the Invention

[0003] To address the aforementioned technical problems, this invention provides an automated scanning test process for Faraday crystal and polarizer insertion loss, comprising the following steps:

[0004] Step (1): Place the Faraday or polarizer on the test fixture, and then place the test fixture on the displacement stage.

[0005] Step (2): The light source is connected to the polarization controller. After the light passes through the polarization controller, it is connected to the collimator one above the displacement stage. The light exits through the collimator one.

[0006] In step (3), the light passes through the product and is collected by collimator II below the displacement stage, and the collected light is transmitted to the optical power unit.

[0007] Step (4) involves controlling the movement of the displacement stage to perform a test and scanning the entire surface of the product for insertion loss.

[0008] Furthermore, the light emitted by the light source passes sequentially through a polarization controller, collimator one, a detection fixture, and collimator two.

[0009] Furthermore, the test fixture is flat and has one test position, which includes a test hole and a permanent magnet ring. The permanent magnet ring is coaxially arranged outside the test hole and fixedly embedded in the test fixture. The test hole is used to place the Faraday chip to be tested.

[0010] Furthermore, the displacement stage includes an X-axis transmission unit, a Y-axis transmission unit, and a load platform. Two adjacent sides of the load platform are fixedly connected to the moving nuts of the X-axis transmission unit and the Y-axis transmission unit, respectively. The test fixture is placed on the load platform and moves with the load platform.

[0011] Furthermore, the process is also equipped with a displacement stage controller and a computer. The displacement stage controller is electrically connected to the motors of the X-axis transmission unit and the Y-axis transmission unit, and the displacement stage controller is electrically connected to the computer.

[0012] Furthermore, the collimator 1 is fixedly equipped with a five-dimensional adjustment frame 1, and the collimator 2 is fixedly equipped with a five-dimensional adjustment frame 2.

[0013] Furthermore, both the X-axis and Y-axis transmission units are screw drive devices. The screw drive device includes a motor, a screw, a movable nut, and a hollow cylindrical housing. The movable nut is an external hexagonal nut, and its inner side is provided with threads that match the screw. The movable nut is threaded onto the screw. The internal cross-sectional shape of the housing matches the outer side of the movable nut. The movable nut and the screw are placed inside the housing, and both ends of the screw are rotatably connected to both ends of the housing. One end of the screw protrudes from the housing and is fixedly connected to the output end of the motor. The motor housing is fixedly connected to the housing, and the motor drives the screw to rotate. The side of the housing has a long strip-shaped opening. The movable nut has a fixing rod that passes through the opening, and both ends of the fixing rod are fixedly connected to the movable nut and the load platform, respectively.

[0014] This invention also includes other devices or components that enable the automatic scanning test process for Faraday crystal and polarizer insertion loss to be performed normally, all of which are conventional techniques in the art. Furthermore, the collimator and five-dimensional adjustment frame not specified in this invention all employ conventional techniques in the art.

[0015] The working principle of this invention is as follows: the device aligns collimator one and collimator two vertically, places the optical sheet to be tested on the displacement stage, controls the displacement stage to move the optical sheet, starts the test, performs insertion loss scanning on the entire surface of the product, and the light will have different losses after passing through different parts of the optical sheet. The received light is transmitted to the optical power unit, and after the test is completed, the test data is observed to confirm whether the product has any performance defects.

[0016] The beneficial effects of this invention are that conventional insertion loss testing can only be performed on a single point and cannot test the insertion loss of the entire surface, resulting in low efficiency. This solution keeps the two collimators stationary and scans the entire surface of the product by moving the displacement platform. This allows for testing of the entire surface and generates a document containing the test data. Operators can review the data in the document to determine product quality and identify the specific location of defective products. This testing process can solve the problem of identifying the uniformity of performance of the entire Faraday crystal and polarizer, and can identify localized performance defects, saving manpower and facilitating faster data analysis. This testing process can automatically scan and test the insertion loss of the entire surface of the Faraday crystal and polarizer, improving testing efficiency and strengthening the scope of detection and control. Attached Figure Description

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0018] Figure 1 This is a schematic diagram of the overall structure of the testing equipment used in this invention.

[0019] Figure 2 This is a schematic diagram of the displacement stage in this invention.

[0020] Figure 3 This is a schematic diagram of the test fixture in this invention.

[0021] Figure 4 This is a schematic diagram of the cross-sectional structure of the lead screw drive device in this invention. Detailed Implementation

[0022] The present invention will now be clearly described with reference to the accompanying drawings and specific embodiments. This description is merely illustrative and is not intended to limit the scope of the invention. Any modifications, equivalent substitutions, or improvements made by those skilled in the art based on the embodiments of the present invention without inventive effort to obtain all other embodiments should be included within the scope of protection of the present invention.

[0023] Example

[0024] like Figures 1-4 As shown, this invention provides an automated scanning test process for Faraday crystal and polarizer insertion loss, comprising the following steps:

[0025] Step (1): Place the Faraday or polarizer on the test fixture 7, and then place the test fixture 7 on the displacement stage.

[0026] Step (2): Light source 1 is connected to polarization controller 2. After the light passes through polarization controller 2, it is connected to collimator 3 above the displacement stage. The light exits through collimator 3.

[0027] In step (3), the light passes through the product and is collected by collimator 4 below the displacement stage, and the collected light is transmitted to the optical power unit 5.

[0028] Step (4) involves controlling the movement of the displacement stage to perform a test and scanning the entire surface of the product for insertion loss.

[0029] As a further measure of the present invention, the light emitted by the light source 1 passes sequentially through the polarization controller 2, collimator 1 3, detection component, and collimator 2 4. The test fixture 7 is flat and has one test position, which includes a test hole 11 and a permanent magnet ring 12. The permanent magnet ring 12 is coaxially arranged outside the test hole 11 and fixedly embedded in the test fixture 7. The test hole 11 is used to place the Faraday crystal to be tested. The displacement stage includes an X-axis transmission unit 8, a Y-axis transmission unit 9, and a load platform 10. The two adjacent sides of the load platform 10 are fixedly connected to the moving nuts of the X-axis transmission unit 8 and the Y-axis transmission unit 9, respectively. The test fixture 7 is placed on the load platform 10 and moves with the load platform 10.

[0030] The process also includes a displacement stage controller and a computer. The displacement stage controller 15 is electrically connected to the motors of the X-axis transmission unit 8 and the Y-axis transmission unit 9, and is also electrically connected to the computer 6. A five-dimensional adjustment frame 13 is fixedly mounted on the collimator 1 3, and a five-dimensional adjustment frame 2 14 is fixedly mounted on the collimator 2 4. Both the X-axis transmission unit 8 and the Y-axis transmission unit 9 are screw drive devices. The screw drive device includes a motor 16, a screw 17, a moving nut 18, and a hollow cylindrical housing 19. The moving nut 18 is an external hexagonal nut, and its inner side has threads that match those of the screw 17. The moving nut 18 is threaded onto the screw 17, and the internal cross-sectional shape of the housing 19 matches the outer side of the moving nut 18. The movable nut 18 and the screw 17 are placed inside the housing 19, and the two ends of the screw 17 are rotatably connected to the two ends of the housing 19 respectively. One end of the screw 17 extends out of the housing 19 and is fixedly connected to the output end of the motor 16. The housing of the motor 16 is fixedly connected to the housing 19, and the motor 16 drives the screw 17 to rotate. The side of the housing 19 is provided with a long strip-shaped opening. The movable nut is provided with a fixing rod 20, which passes through the opening, and the two ends of the fixing rod 20 are fixedly connected to the movable nut 18 and the load platform 10 respectively.

[0031] The working principle of this invention is as follows: the collimator 3 and collimator 4 are aligned vertically, the optical sheet to be tested is placed on the displacement stage, the displacement stage is controlled to move the optical sheet, the test is started, the insertion loss is scanned on the entire surface of the product, the light will have different losses after passing through different parts of the optical sheet, the received light is transmitted to the optical power unit, and after the test is completed, the test data is observed to confirm whether the product has any performance defects.

[0032] The embodiments of the present invention have been described above. These descriptions are exemplary and not exhaustive, nor are they limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments.

Claims

1. An automatic scanning test process for Faraday crystal and polarizer insertion loss, characterized by: Includes the following steps: S1, place the Faraday crystal or polarizer on the test fixture, and then place the test fixture on the displacement stage; S2, the light source is connected to the polarization controller. After the light passes through the polarization controller, it is connected to collimator one above the displacement stage. The light exits through collimator one. S3, the light passes through the product, is collected by collimator two below the displacement stage, and the received light is transmitted to the optical power unit; S4 performs testing by controlling the movement of the displacement stage, scanning the entire surface of the product for insertion loss.

2. The automatic scanning test process for Faraday crystal and polarizer insertion loss according to claim 1, characterized in that: The light emitted by the light source passes sequentially through a polarization controller, collimator one, a test fixture, and collimator two.

3. The automatic scanning test process for Faraday crystal and polarizer insertion loss according to claim 2, characterized in that: The test fixture is flat and has one test position. The test position includes a test hole and a permanent magnet ring. The permanent magnet ring is coaxially arranged outside the test hole and fixedly embedded in the test fixture. The test hole is used to place the Faraday chip to be tested.

4. The automatic scanning test process for Faraday crystal and polarizer insertion loss according to claim 3, characterized in that: The displacement stage includes an X-axis transmission unit, a Y-axis transmission unit, and a load platform. Two adjacent sides of the load platform are fixedly connected to the moving nuts of the X-axis transmission unit and the Y-axis transmission unit, respectively. The test fixture is placed on the load platform and moves with the load platform.

5. The automatic scanning test process for Faraday crystal and polarizer insertion loss according to claim 4, characterized in that: The process is also equipped with a displacement stage controller and a computer. The displacement stage controller is electrically connected to the motors of the X-axis transmission unit and the Y-axis transmission unit, and the displacement stage controller is electrically connected to the computer.

6. The automatic scanning test process for Faraday crystal and polarizer insertion loss according to claim 5, characterized in that: The collimator 1 is fixedly equipped with a five-dimensional adjustment frame 1, and the collimator 2 is fixedly equipped with a five-dimensional adjustment frame 2.

7. The automatic scanning test process for Faraday crystal and polarizer insertion loss according to claim 6, characterized in that: Both the X-axis and Y-axis transmission units are screw drive devices. The screw drive device includes a motor, a screw, a movable nut, and a hollow cylindrical housing. The movable nut is an external hexagonal nut, and its inner side is provided with a thread that matches the screw. The movable nut is threaded onto the screw. The internal cross-sectional shape of the housing matches the outer side of the movable nut. The movable nut and the screw are placed inside the housing, and both ends of the screw are rotatably connected to both ends of the housing. One end of the screw protrudes from the housing and is fixedly connected to the output end of the motor. The motor housing is fixedly connected to the housing, and the motor drives the screw to rotate. The side of the housing has a long strip-shaped opening. The movable nut has a fixing rod that passes through the opening, and both ends of the fixing rod are fixedly connected to the movable nut and the load platform, respectively.

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