Synchronous calibration method and system based on magnetic modulation direct current transformer
By acquiring multiple sets of test datasets and generating calibration results using gain coefficients, the data reliability problem of magnetically modulated DC transformers was solved, enabling active monitoring and anomaly detection of magnetically modulated DC transformers, thus improving data reliability and measurement accuracy.
Patent Information
- Application Number
- CN202511213247.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-28
- Publication Date
- 2025-11-28
AI Technical Summary
As existing magnetically modulated DC transformers age over time, their internal materials deteriorate, leading to decreased measurement accuracy and low data reliability. Furthermore, maintenance is only performed when serious anomalies occur, further complicating the issue of data reliability.
By acquiring multiple sets of test datasets, determining the theoretical DC current information using a preset gain coefficient, and generating calibration results, the system can actively monitor and detect anomalies in magnetically modulated DC transformers, thereby improving data reliability.
It enables rapid and accurate calibration of magnetically modulated DC transformers, timely detection of anomalies, significantly improved data reliability, and ensured measurement accuracy.
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Figure CN121027963A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the technical field of instrument transformer control, and more specifically, to a synchronous calibration method and system based on a magnetically modulated DC instrument transformer. Background Technology
[0002] A magnetically modulated DC transformer is a high-precision device for measuring DC current. It has good isolation performance and anti-interference ability, and can convert DC signals into AC signals for subsequent processing.
[0003] Currently, with the increase in usage time, the internal materials of magnetically modulated DC transformers may age, leading to a decrease in measurement accuracy. Typically, maintenance is only performed when the magnetically modulated DC transformer exhibits serious data anomalies, resulting in low data reliability, which needs further improvement. Summary of the Invention
[0004] Based on this, this application provides a synchronous calibration method and system based on a magnetically modulated DC transformer to solve the problem of low data reliability in the prior art.
[0005] In a first aspect, embodiments of this application provide a synchronous calibration method based on a magnetically modulated DC transformer, the method comprising:
[0006] Based on a preset number of samples, multiple sets of first test dataset information of the transformer to be tested are obtained. Each set of first test dataset information includes a first reference DC current information and a first measured DC current information. The first reference DC current information of each set of first test dataset information is different from each other.
[0007] Based on the preset gain coefficient, the theoretical DC current information corresponding to each of the first reference DC current information is determined;
[0008] Based on the theoretical DC current information and the first measured DC current information, calibration result information is generated.
[0009] Compared with existing technologies, the beneficial effects are as follows: The synchronous calibration method based on magnetically modulated DC transformers provided in this application allows the terminal device to quickly acquire multiple sets of first test dataset information of the transformer under test based on a preset sampling quantity. Then, through a preset gain coefficient, it accurately determines the theoretical DC current information corresponding to each first reference DC current information. Finally, by comparing the theoretical DC current information and the first measured DC current information, it effectively generates calibration result information, thereby realizing proactive intervention to monitor the data reliability of the magnetically modulated DC transformer, efficiently detecting abnormalities in the magnetically modulated DC transformer, significantly improving data reliability, and to a certain extent solving the problem of low data reliability in the current system.
[0010] Secondly, embodiments of this application provide a synchronous calibration system based on a magnetically modulated DC transformer, the system comprising:
[0011] First test dataset information acquisition module: used to acquire multiple sets of first test dataset information of the transformer to be tested based on a preset number of samples. Each set of first test dataset information includes a first reference DC current information and a first measured DC current information. The first reference DC current information of each set of first test dataset information is different from each other.
[0012] Theoretical DC current information determination module: used to determine the theoretical DC current information corresponding to each of the first reference DC current information based on a preset gain coefficient;
[0013] Calibration result information generation module: used to generate calibration result information based on the theoretical DC current information and the first measured DC current information.
[0014] Thirdly, embodiments of this application provide a terminal device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the method described in the first aspect above.
[0015] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the method described in the first aspect above.
[0016] It is understood that the beneficial effects of the second to fourth aspects mentioned above can be found in the relevant descriptions in the first aspect mentioned above, and will not be repeated here. Attached Figure Description
[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.
[0018] Figure 1 This is a schematic flowchart of a synchronous calibration method provided in an embodiment of this application;
[0019] Figure 2 This is a flowchart illustrating step S300 in a synchronous calibration method provided in an embodiment of this application;
[0020] Figure 3 This is a flowchart illustrating the process before step S300 in a synchronous calibration method provided in an embodiment of this application;
[0021] Figure 4 This is a flowchart illustrating the process after step S304 in a synchronous calibration method provided in an embodiment of this application;
[0022] Figure 5 This is a flowchart illustrating the process after step S300 in a synchronous calibration method provided in an embodiment of this application;
[0023] Figure 6 This is a block diagram of a synchronous calibration system provided in one embodiment of this application;
[0024] Figure 7 This is a schematic diagram of a terminal device provided in an embodiment of this application. Detailed Implementation
[0025] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.
[0026] In the description of this application and the appended claims, the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0027] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.
[0028] To illustrate the technical solution described in this application, specific embodiments are provided below.
[0029] Please see Figure 1 , Figure 1 This is a flowchart illustrating the synchronous calibration method based on a magnetically modulated DC transformer provided in this application embodiment. In this embodiment, the execution subject of the synchronous calibration method is a terminal device. It is understood that the types of terminal devices include, but are not limited to, mobile phones, tablets, laptops, Ultra-Mobile Personal Computers (UMPCs), netbooks, Personal Digital Assistants (PDAs), etc. This application embodiment does not impose any restrictions on the specific type of terminal device.
[0030] Please see Figure 1 The synchronous calibration method provided in this application includes, but is not limited to, the following steps:
[0031] In S100, based on a preset number of samples, multiple sets of first test dataset information of the current transformer to be tested are obtained.
[0032] Specifically, the terminal device can first acquire multiple sets of first test dataset information of the current transformer under test based on a preset number of samples. The specific value of the number of samples can be customized by the testing personnel. The higher the number of samples, the higher the accuracy of the test results. For example, the specific value of the number of samples can be 10 or 20. The current transformer under test is a magnetically modulated DC current transformer used to describe the accuracy of the data to be tested. Each set of first test dataset information includes a first reference DC current information and a first measured DC current information. The first reference DC current information of each set of first test dataset information is different from each other.
[0033] In S200, the theoretical DC current information corresponding to each first reference DC current information is determined based on the preset gain coefficient.
[0034] Specifically, after the terminal device acquires multiple sets of first test dataset information, the terminal device can determine the theoretical DC current information corresponding to each first reference DC current information based on a preset gain coefficient. The specific value of the gain coefficient can be determined by the specific model of the current transformer under test. For example, the value of the theoretical DC current information can be the product calculated by multiplying the first reference DC current information by the gain coefficient.
[0035] In S300, calibration result information is generated based on theoretical DC current information and first measured DC current information.
[0036] Specifically, after the terminal device determines the theoretical DC current information, it can generate calibration result information based on the theoretical DC current information and the first measured DC current information. The calibration result information can be either correct test result information or abnormal test result information. Correct test result information is used to describe that the current data accuracy is qualified, while abnormal test result information is used to describe that the current data accuracy is unqualified.
[0037] For some possible implementations, please refer to [link to relevant documentation] for generating accurate calibration results. Figure 2 Step S300 includes, but is not limited to, the following steps:
[0038] In S310, it is determined in turn whether the first measured DC current information of each group of first test dataset information is equal to the theoretical DC current information corresponding to the first measured DC current information.
[0039] Specifically, after the terminal device determines the theoretical DC current information, the terminal device can sequentially determine whether the first measured DC current information of each group of first test datasets is equal to the theoretical DC current information corresponding to the first measured DC current information.
[0040] In S320, if the first measured DC current information of each group of first test datasets is equal to the theoretical DC current information corresponding to the first measured DC current information, then the calibration result information is determined to be the correct test result information; otherwise, the calibration result information is determined to be the abnormal test result information.
[0041] Specifically, if the first measured DC current information of each group's first test dataset is equal to the theoretical DC current information corresponding to the first measured DC current information, it indicates that the current data accuracy is qualified, and the terminal device can accurately determine the calibration result information as the correct test result information; otherwise, it indicates that the current data accuracy is abnormal, and the terminal device can accurately determine the calibration result information as the abnormal test result information.
[0042] For further improvements in data reliability, please refer to some possible implementations. Figure 3 Prior to step S300, the method further includes, but is not limited to, the following steps:
[0043] In S301, real-time ambient temperature information is obtained.
[0044] Specifically, the terminal device can acquire real-time ambient temperature information, which is used to describe the ambient temperature when the current transformer under test is being tested.
[0045] In S302, based on the number of samples, multiple sets of second test dataset information of the current transformer to be tested are obtained.
[0046] Specifically, after the terminal device acquires the real-time ambient temperature information, the terminal device can acquire multiple sets of second test dataset information of the current transformer under test based on the same number of samples, so as to determine whether there is data drift through the completely identical test environment. Each set of second test dataset information includes a second reference DC current information and a second measured DC current information, and the second reference DC current information is the same between the sets of second test dataset information.
[0047] In S303, based on the same real-time ambient temperature information and the same second reference DC current information, it is determined whether the second measured DC current information is the same among the second test dataset information of each group.
[0048] Specifically, after the terminal device acquires multiple sets of second test dataset information, the terminal device can determine whether the second measured DC current information is the same among the sets of second test dataset information based on the same real-time ambient temperature information and second reference DC current information.
[0049] In S304, if the second measured DC current information is the same among the second test dataset information of each group, test qualification information is generated; otherwise, test data drift information is generated.
[0050] Specifically, if the second measured DC current information is the same among the second test datasets of each group, it indicates that the data measured by the current transformer under test in the same test environment does not drift, so the terminal device can generate test pass information; otherwise, it indicates that the data measured by the current transformer under test in the same test environment does drift, so the terminal device can generate test data drift information.
[0051] For a better understanding of the possible implementation methods and to improve data accuracy, please refer to [link / reference]. Figure 4 If test data drift information is generated, then after step S304, the method further includes, but is not limited to, the following steps:
[0052] In S305, based on the number of samples, multiple sets of third test dataset information of the current transformer to be tested are obtained.
[0053] Specifically, the terminal device can acquire multiple sets of third test dataset information of the current transformer under test based on the same number of samples, which is beneficial to accurately determine the data drift. The real-time ambient temperature information corresponding to each set of third test dataset information is different. Each set of third test dataset information includes a third reference DC current information and a third measured DC current information. The third reference DC current information is the same among the sets of third test dataset information.
[0054] In S306, for each group of third test dataset information: based on the third measured DC current information and the third reference DC current information, data drift value information is generated.
[0055] Specifically, after the terminal device acquires multiple sets of third test dataset information, the terminal device can perform the following processing for each set of third test dataset information: generate data drift value information based on the difference between the third measured DC current information and the third reference DC current information, wherein the data drift value information is the difference between the third measured DC current information and the third reference DC current information.
[0056] In S307, reference compensation factor value information is generated based on the data drift value information.
[0057] Specifically, after the terminal device generates data drift value information, it can generate reference compensation factor value information based on the data drift value information. The reference compensation factor value information is used to describe the compensation factor value for reference by the testing personnel. In one possible implementation, the terminal device can determine the value of the data drift value information as the reference compensation factor value information.
[0058] In S308, the reference compensation factor value information and the real-time ambient temperature information are bound together.
[0059] Specifically, after the terminal device generates the reference compensation factor value information, it can bind the reference compensation factor value information with the real-time ambient temperature information, thereby accurately determining the compensation factor value corresponding to various test environments.
[0060] In some possible implementations, to help ensure the accuracy of the current transformer under test during long-term operation, please refer to [link to relevant documentation]. Figure 5 If the calibration result information is abnormal test result information, then after step S300, the method further includes, but is not limited to, the following steps:
[0061] In S400, obtain the test result generation time information and the historical abnormal result generation time information.
[0062] Specifically, the terminal device can obtain the test result generation time information and the historical abnormal result generation time information. The test result generation time information describes the generation time of the calibration result information, and the historical abnormal result generation time information describes the time when the most recent abnormal test result information appeared in history.
[0063] In S410, the time information for generating test results and the time information for generating historical abnormal results are generated, and the cumulative qualified running time information is generated.
[0064] Specifically, after the terminal device obtains the test result generation time information and the historical abnormal result generation time information, the terminal device can set the historical abnormal result generation time information as the start time and the test result generation time information as the end time to generate cumulative qualified running time information. The cumulative qualified running time information is used to describe the duration consisting of the historical abnormal result generation time information as the start time and the test result generation time information as the end time.
[0065] In S420, in response to the maintenance completion command, the command response time information is obtained.
[0066] Specifically, after the terminal device generates the cumulative qualified running time information, the terminal device can respond to the maintenance completion command and obtain the command response time information. The maintenance completion command describes the completion of the maintenance work on the magnetic modulation DC transformer by the inspection personnel, and the command response time information describes the response time of the maintenance completion command.
[0067] In S430, recommended maintenance time information is generated based on instruction response time information and cumulative qualified runtime information.
[0068] Specifically, after the terminal device obtains the instruction response time information, it can generate recommended maintenance time information based on the instruction response time information and the cumulative qualified runtime information, thereby accurately recommending the most suitable maintenance time for maintenance personnel. The recommended maintenance time information describes the time calculated with the instruction response time information as the starting time and the cumulative qualified runtime information as the interval.
[0069] The implementation principle of the synchronous calibration method for magnetically modulated DC transformers in this application embodiment is as follows: The terminal device can first quickly acquire multiple sets of first test dataset information of the transformer under test based on a preset number of samples. Then, through a preset gain coefficient, it accurately determines the theoretical DC current information corresponding to each first reference DC current information. Finally, by comparing the theoretical DC current information and the first measured DC current information, it effectively generates calibration result information, thereby realizing active monitoring of the data reliability of the magnetically modulated DC transformer, timely detection of abnormal conditions of the magnetically modulated DC transformer, and significantly improving data reliability.
[0070] It should be noted that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.
[0071] Embodiments of this application also provide a synchronous calibration system based on a magnetically modulated DC transformer. For ease of explanation, only the parts relevant to this application are shown, such as... Figure 6 As shown, the system 60 includes:
[0072] First test dataset information acquisition module 61: used to acquire multiple sets of first test dataset information of the transformer under test based on a preset number of samples, wherein each set of first test dataset information includes a first reference DC current information and a first measured DC current information, and the first reference DC current information of each set of first test dataset information is different from each other.
[0073] Theoretical DC current information determination module 62: used to determine the theoretical DC current information corresponding to each first reference DC current information based on a preset gain coefficient;
[0074] Calibration result information generation module 63: used to generate calibration result information based on theoretical DC current information and first measured DC current information.
[0075] Optionally, the calibration result information can be either correct test result information or abnormal test result information; the calibration result information generation module 63 includes:
[0076] First measured DC current information judgment submodule: used to sequentially judge whether the first measured DC current information of each group of first test datasets is equal to the theoretical DC current information corresponding to the first measured DC current information;
[0077] The calibration result information determination submodule is used to determine the calibration result information as correct test result information if the first measured DC current information of each group's first test dataset is equal to the theoretical DC current information corresponding to the first measured DC current information; otherwise, it is determined as abnormal test result information.
[0078] Optionally, the system 60 also includes:
[0079] Real-time ambient temperature information acquisition module: used to acquire real-time ambient temperature information;
[0080] The second test dataset information acquisition module is used to acquire multiple sets of second test dataset information of the transformer under test based on the number of samples. Each set of second test dataset information includes a second reference DC current information and a second measured DC current information. The second reference DC current information is the same in each set of second test dataset information.
[0081] The second measured DC current information judgment module is used to determine whether the second measured DC current information is the same among the second test datasets based on the same real-time ambient temperature information and the second reference DC current information.
[0082] Test pass information generation module: If the second measured DC current information is the same among the second test datasets of each group, test pass information is generated; otherwise, test data drift information is generated.
[0083] Optionally, if test data drift information is generated, the system 60 further includes:
[0084] The third test dataset information acquisition module is used to acquire multiple sets of third test dataset information of the transformer under test based on the number of samples. The real-time ambient temperature information corresponding to each set of third test dataset information is different. Each set of third test dataset information includes a third reference DC current information and a third measured DC current information. The third reference DC current information is the same between each set of third test dataset information.
[0085] Data drift value information generation module: used to generate data drift value information for each group of third test dataset information, based on the third measured DC current information and the third reference DC current information;
[0086] Reference compensation factor value information generation module: used to generate reference compensation factor value information based on data drift value information;
[0087] Reference compensation factor value information binding module: used to bind reference compensation factor value information and real-time ambient temperature information.
[0088] Optionally, if the calibration result information is abnormal test result information, the system 60 further includes:
[0089] Test result generation time information acquisition module: used to acquire test result generation time information and historical abnormal result generation time information;
[0090] The cumulative qualified runtime information generation module is used to generate time information based on test results and historical abnormal results, and to generate cumulative qualified runtime information.
[0091] Command response time information acquisition module: used to acquire command response time information in response to maintenance completion commands;
[0092] Recommended maintenance time information generation module: Used to generate recommended maintenance time information based on instruction response time information and cumulative qualified runtime information.
[0093] It should be noted that the information interaction and execution process between the above modules are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, which will not be repeated here.
[0094] This application also provides a terminal device, such as... Figure 7 As shown, the terminal device 70 of this embodiment includes: a processor 71, a memory 72, and a computer program 73 stored in the memory 72 and executable on the processor 71. When the processor 71 executes the computer program 73, it implements the steps in the above-described synchronous calibration method embodiment, for example... Figure 1 Steps S100 to S300 are shown; or, when processor 71 executes computer program 73, it implements the functions of each module in the above-described device, for example... Figure 6 The functions of modules 61 to 63 are shown.
[0095] The terminal device 70 can be a desktop computer, laptop, handheld computer, cloud server, or other computing device, and includes, but is not limited to, a processor 71 and a memory 72. Those skilled in the art will understand that... Figure 7 This is merely an example of terminal device 70 and does not constitute a limitation on terminal device 70. It may include more or fewer components than shown, or combine certain components, or different components. For example, terminal device 70 may also include input / output devices, network access devices, buses, etc.
[0096] The processor 71 can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.; the general-purpose processor can be a microprocessor or any conventional processor, etc.
[0097] The memory 72 can be an internal storage unit of the terminal device 70, such as a hard disk or memory of the terminal device 70. The memory 72 can also be an external storage device of the terminal device 70, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the terminal device 70. Furthermore, the memory 72 can include both internal storage units and external storage devices of the terminal device 70. The memory 72 can also store computer program 73 and other programs and data required by the terminal device 70. The memory 72 can also be used to temporarily store data that has been output or will be output.
[0098] One embodiment of this application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable file, or some intermediate form. The computer-readable medium can include any entity or device capable of carrying computer program code, a recording medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium, etc.
[0099] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the methods, principles and structures of this application should be covered within the scope of protection of this application.
Claims
1. A synchronous calibration method for a magnetically modulated DC transformer, characterized in that, The method includes: Based on a preset number of samples, multiple sets of first test dataset information of the transformer to be tested are obtained. Each set of first test dataset information includes a first reference DC current information and a first measured DC current information. The first reference DC current information of each set of first test dataset information is different from each other. Based on the preset gain coefficient, the theoretical DC current information corresponding to each of the first reference DC current information is determined; Based on the theoretical DC current information and the first measured DC current information, calibration result information is generated.
2. The method according to claim 1, characterized in that, The calibration result information is either correct test result information or abnormal test result information; the step of generating calibration result information based on the theoretical DC current information and the first measured DC current information includes: Sequentially determine whether the first measured DC current information of the first test dataset information in each group is equal to the theoretical DC current information corresponding to the first measured DC current information; If the first measured DC current information of the first test dataset information in each group is equal to the theoretical DC current information corresponding to the first measured DC current information, then the calibration result information is determined to be the correct test result information; otherwise, the calibration result information is determined to be the abnormal test result information.
3. The method according to claim 1, characterized in that, Before generating calibration result information based on the theoretical DC current information and the first measured DC current information, the method further includes: Obtain real-time ambient temperature information; Based on the sampling quantity, multiple sets of second test dataset information of the transformer under test are obtained. Each set of second test dataset information includes a second reference DC current information and a second measured DC current information. The second reference DC current information is the same among the sets of second test dataset information. Based on the same real-time ambient temperature information and second reference DC current information, determine whether the second measured DC current information is the same among the second test dataset information of each group; If the second measured DC current information is the same among the second test dataset information of each group, test qualification information is generated; otherwise, test data drift information is generated.
4. The method according to claim 3, characterized in that, If test data drift information is generated, then if the second measured DC current information is the same among the second test dataset information in each group, test qualification information is generated; otherwise, after generating test data drift information, the method further includes: Based on the sampling quantity, multiple sets of third test dataset information of the transformer under test are obtained. The real-time ambient temperature information corresponding to each set of third test dataset information is different. Each set of third test dataset information includes a third reference DC current information and a third measured DC current information. The third reference DC current information is the same among the sets of third test dataset information. For each group of third test dataset information: based on the third measured DC current information and the third reference DC current information, generate data drift value information; Based on the data drift value information, a reference compensation factor value is generated; The reference compensation factor value information is bound to the real-time ambient temperature information.
5. The method according to claim 1, characterized in that, If the calibration result information is abnormal test result information, then after generating the calibration result information based on the theoretical DC current information and the first measured DC current information, the method further includes: Obtain information on the time when test results were generated and the time when historical abnormal results were generated; Based on the test results, the time information for generating time information of historical abnormal results is generated, and the cumulative qualified runtime information is generated. In response to the maintenance completion command, obtain the command response time information; Based on the instruction response time information and the cumulative qualified runtime information, recommended maintenance time information is generated.
6. A synchronous calibration system based on a magnetically modulated DC transformer, characterized in that, The system includes: First test dataset information acquisition module: used to acquire multiple sets of first test dataset information of the transformer to be tested based on a preset number of samples. Each set of first test dataset information includes a first reference DC current information and a first measured DC current information. The first reference DC current information of each set of first test dataset information is different from each other. Theoretical DC current information determination module: used to determine the theoretical DC current information corresponding to each of the first reference DC current information based on a preset gain coefficient; Calibration result information generation module: used to generate calibration result information based on the theoretical DC current information and the first measured DC current information.
7. The system according to claim 6, characterized in that, The calibration result information may be either correct test result information or abnormal test result information; The calibration result information generation module includes: First measured DC current information judgment submodule: used to sequentially judge whether the first measured DC current information of each group of the first test dataset is equal to the theoretical DC current information corresponding to the first measured DC current information; The calibration result information determination submodule is used to determine that the calibration result information is correct test result information if the first measured DC current information of the first test dataset information in each group is equal to the theoretical DC current information corresponding to the first measured DC current information; otherwise, the calibration result information is abnormal test result information.
8. A terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method as described in any one of claims 1 to 5.
9. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method as described in any one of claims 1 to 5.