Container electronic tag test equipment and test method thereof
By conducting radio frequency and electrical performance tests on container electronic tags, and combining deep learning models and dynamic parameter adjustments, the stability issues of electronic tags under strong electromagnetic interference and low temperature environments were resolved, resulting in more efficient data processing and a reduced false positive rate.
Patent Information
- Application Number
- CN202510887938.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-30
- Publication Date
- 2025-12-02
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
Existing technologies cannot effectively verify the signal stability and circuit reliability of electronic tags under strong electromagnetic interference and low temperature environments, resulting in decreased test stability.
By conducting radio frequency communication and electrical performance tests on container electronic tags, deep learning models are used to analyze test data, and frame length dynamic tolerance, dynamic frame length tolerance threshold, and batch data packet quantity are adjusted according to false positive rate, buffer occupancy rate, and buffer fill rate to improve test stability.
It enhances the testing stability and compatibility of electronic tags in complex environments, reduces false positives of non-fatal errors, and improves data processing efficiency.
Smart Images

Figure CN121049600A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of electronic tag testing technology, and in particular to a container electronic tag testing device and its testing method. Background Technology
[0002] With the rapid development of global trade, container shipping has become a core carrier of international logistics. Electronic tags, as key devices for intelligent container management, play a crucial role in cargo tracking, status monitoring, and information exchange. However, complex application scenarios such as ports and freight hubs place stringent demands on the performance of electronic tags. Traditional testing methods struggle to meet the high-precision and intelligent quality control requirements. Deep learning technology, with its powerful feature extraction and pattern recognition capabilities, has brought a new breakthrough to electronic tag testing. By constructing a deep learning model that fuses multimodal data, it is possible to automatically analyze the performance of tags in complex environments, achieving a shift from an "experience-driven" to a "data-driven" testing model. This effectively improves testing efficiency and accuracy, meeting the high-performance and high-reliability application requirements of intelligent logistics for electronic tags.
[0003] Chinese Patent Publication No. CN120105034A discloses a method, apparatus, electronic device, and storage medium for generating test data tags. The method includes: receiving at least one piece of test user identification information data and corresponding input tag data sent by a tester; identifying at least one type of business system corresponding to the target test user in a target business system based on the test user identification information data; matching a corresponding preset system tag type based on the input tag data, wherein the preset system tag type corresponds to the type of the business system; if the matched preset system tag type is not empty, generating a test user data tag corresponding to the target test user under the at least one type of business system based on the input tag data and the matched preset system tag type. Therefore, the method, apparatus, electronic device, and storage medium for generating test data tags suffer from a decrease in the test stability of electronic tags due to the inability to verify the signal stability of the electronic tags under strong electromagnetic interference or the circuit reliability under low temperature environments. Summary of the Invention
[0004] To address this issue, the present invention provides a container electronic tag testing device and its testing method, which overcomes the problem in the prior art where the signal stability of electronic tags decreases due to the inability to verify the circuit reliability of electronic tags under strong electromagnetic interference or low temperature environments.
[0005] To achieve the above objectives, the present invention provides a testing method for electronic tags for containers, comprising:
[0006] The container freight electronic tags were subjected to radio frequency communication tests and electrical performance tests in sequence, and the test data of the electronic tags were collected.
[0007] The test data is preprocessed to output optimized data, the optimized data is analyzed using a deep learning model to output analysis results, and a test report is generated based on the analysis results.
[0008] The number of times the tag status was misjudged and the total number of tests were obtained during the test, and the misjudgment rate of the electronic tag was calculated.
[0009] The test stability of the electronic tag is determined based on the false positive rate of the electronic tag.
[0010] If the test stability of the electronic tag does not meet the requirements, then determine whether to increase the dynamic tolerance of the frame length of the electronic tag;
[0011] If it is not necessary to increase the dynamic tolerance of the frame length of the electronic tag, the test robustness of the electronic tag is determined based on the occupancy rate of the buffer area.
[0012] If the robustness of the electronic tag does not meet the requirements, determine whether it is necessary to increase the dynamic frame length tolerance threshold.
[0013] If it is not necessary to increase the dynamic frame length tolerance threshold, then determine whether it is necessary to increase the number of batch data packets for test data based on the cache fill rate.
[0014] Furthermore, determining whether the test stability of the electronic tag meets the requirements based on the false positive rate of the electronic tag includes:
[0015] The false positive rate of the electronic tag is compared with the preset first false positive rate;
[0016] If the false positive rate of the electronic tag is less than or equal to the preset first false positive rate, then the test stability of the electronic tag is determined to meet the requirements.
[0017] If the false positive rate of the electronic tag is greater than the preset first false positive rate, then the test stability of the electronic tag is determined to be unsatisfactory.
[0018] Further, determine whether it is necessary to increase the dynamic tolerance of the electronic tag's frame length, including:
[0019] The false positive rate of the electronic tag is compared with the preset first false positive rate and the preset second false positive rate, respectively;
[0020] If the false positive rate of the electronic tag is greater than the preset second false positive rate, then it is determined that the frame length dynamic tolerance of the electronic tag needs to be increased, and the frame length dynamic tolerance of the electronic tag is increased.
[0021] If the false positive rate of the electronic tag is greater than a preset first false positive rate and less than or equal to a preset second false positive rate, then it is determined that there is no need to increase the dynamic tolerance of the frame length of the electronic tag.
[0022] Furthermore, the increase in the frame length dynamic tolerance of the electronic tag is determined by the difference between the false judgment rate of the electronic tag and the preset second false judgment rate.
[0023] Furthermore, the robustness of the electronic tag test is determined based on the cache occupancy rate, including:
[0024] Compare the cache occupancy rate with the preset first occupancy rate;
[0025] If the occupancy rate of the buffer is less than or equal to the preset first occupancy rate, then it is determined that the test robustness of the electronic tag meets the requirements, and it is determined whether the frame length dynamic tolerance of the electronic tag meets the requirements.
[0026] If the occupancy rate of the buffer area is greater than the preset first occupancy rate, then the test robustness of the electronic tag is determined to be unsatisfactory.
[0027] Further, determine whether it is necessary to increase the dynamic frame length tolerance threshold, including:
[0028] The occupancy rate of the cache area is compared with the preset first occupancy rate and the preset second occupancy rate, respectively;
[0029] If the occupancy rate of the buffer is greater than the preset first occupancy rate and less than or equal to the preset second occupancy rate, then it is determined that the dynamic frame length tolerance threshold needs to be increased, and the dynamic frame length tolerance threshold is increased accordingly.
[0030] If the occupancy rate of the buffer is greater than the preset second occupancy rate, then it is determined that there is no need to increase the dynamic frame length tolerance threshold.
[0031] Furthermore, the increase in the dynamic frame length tolerance threshold is determined by the difference between the buffer occupancy rate and the preset first occupancy rate.
[0032] Furthermore, based on the cache fill rate, it is determined whether the batch size of test data packets needs to be increased, including:
[0033] Compare the cache fill rate with the preset rate;
[0034] If the cache fill rate is less than or equal to the preset rate, it is determined that there is no need to increase the number of batch data packets for the test data, and it is determined whether the dynamic frame length tolerance threshold meets the requirements.
[0035] If the cache fill rate is greater than the preset rate, then it is determined that the number of batch data packets for test data needs to be increased, and the number of batch data packets for test data needs to be increased.
[0036] Furthermore, the increase in the number of batch data packets of the test data is determined by the difference between the cache fill rate and the preset rate.
[0037] The present invention also provides a container electronic tag testing device, comprising:
[0038] The radio frequency communication testing module includes a conformity testing unit for performing conformity testing on container freight electronic tags and a full-performance testing unit for performing full-performance automatic testing on the electronic tags.
[0039] The compliance testing unit is used to send command signals to the electronic tag under different radio frequency parameters and protocol parameters, and the full performance testing unit is used to automatically complete various tests of the electronic tag and generate test reports.
[0040] The electrical performance testing module is used to test the power, field strength, and distance of the forward link of the electronic tag.
[0041] Compared with the prior art, the beneficial effects of the present invention are as follows: The method of the present invention dynamically adjusts the frame length tolerance of the electronic tag according to the false judgment rate of the electronic tag. Due to the lack of abnormal frame processing logic for the dedicated protocol of container electronic tags, the tag status is misjudged. By increasing the dynamic tolerance of the frame length of the electronic tag by the testing equipment, more frame length fluctuations caused by interference or protocol differences can be accommodated, reducing the probability of misjudgment and avoiding misjudgment caused by non-fatal errors. This improves the compatibility of the testing equipment with abnormal frames. The dynamic frame length tolerance threshold is adjusted according to the occupancy rate of the buffer. Since the tag carries sensors to collect container status data in real time when transmitting container status data, the method can be more flexible and adaptable to the data. Additional data such as temperature, humidity, and vibration may cause frame lengths to exceed protocol specifications, leading to buffer overflow. By increasing the dynamic frame length tolerance threshold, longer frames can be received, bringing excessively long frames into the normal processing range instead of discarding or reporting errors directly. The number of batch data packets for test data is adjusted according to the buffer fill rate. When sudden traffic arrives, communication tasks cannot obtain sufficient CPU time, resulting in increased data processing latency and a faster buffer accumulation rate. By increasing the number of batch data packets for test data, the latency of accessing main memory can be reduced, allowing more time to be used for actual data processing, thereby processing batch data more efficiently and improving the testing stability of electronic tags.
[0042] Furthermore, the method of the present invention adjusts the dynamic tolerance of the frame length of the electronic tag by setting a preset first misjudgment rate and a preset second misjudgment rate. Due to the lack of abnormal frame processing logic for the dedicated protocol of container electronic tags, the tag status is misjudged. By increasing the dynamic tolerance of the frame length of the electronic tag by the test equipment, more frame length fluctuations caused by interference or protocol differences can be accommodated, reducing the probability of misjudgment and avoiding misjudgment caused by non-fatal errors. This improves the compatibility of the test equipment with abnormal frames and further enhances the test stability of the electronic tag.
[0043] Furthermore, the method described in this invention adjusts the dynamic frame length tolerance threshold by setting a preset first occupancy rate and a preset second occupancy rate. Since the frame length may exceed the protocol specification when the tag carries additional data such as temperature, humidity, and vibration collected in real time by the sensor when transmitting container status data, resulting in buffer overflow, by increasing the dynamic frame length tolerance threshold, longer frames can be received, and the excessively long frames can be included in the normal processing range instead of being directly discarded or reported as errors, which further improves the testing stability of electronic tags.
[0044] Furthermore, the method of the present invention adjusts the number of batch data packets of test data by setting a preset rate. Since communication tasks cannot obtain enough CPU time when sudden traffic arrives, the data processing delay increases and the cache accumulation rate increases. By increasing the number of batch data packets of test data, the latency of accessing main memory can be reduced, and more time can be used for actual data processing, thereby processing batch data more efficiently and further improving the testing stability of electronic tags. Attached Figure Description
[0045] Figure 1 This is an overall flowchart of the testing method for container electronic tags according to an embodiment of the present invention;
[0046] Figure 2 This is an overall structural block diagram of the container electronic tag testing equipment according to an embodiment of the present invention;
[0047] Figure 3 The flowchart below shows the process of determining whether to increase the frame length dynamic tolerance of the electronic tag in the test method of the container electronic tag according to an embodiment of the present invention.
[0048] Figure 4 The flowchart below shows the process of determining whether to increase the dynamic frame length tolerance threshold in the testing method for container electronic tags according to an embodiment of the present invention. Detailed Implementation
[0049] To make the objectives and advantages of the present invention clearer, the present invention will be further described below with reference to embodiments; it should be understood that the specific embodiments described herein are merely for explaining the present invention and are not intended to limit the present invention.
[0050] Preferred embodiments of the present invention will now be described with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are merely illustrative of the technical principles of the present invention and are not intended to limit the scope of protection of the present invention.
[0051] It should be noted that in the description of this invention, the terms "upper", "lower", "left", "right", "inner", "outer", etc., which indicate directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings. This is only for the convenience of description and is not intended to indicate or imply that the device or element must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation of this invention.
[0052] Furthermore, it should be noted that, in the description of this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0053] Please see Figure 1 , Figure 2 , Figure 3 as well as Figure 4 The diagrams shown are, respectively, an overall flowchart, an overall structural block diagram, a detailed flowchart of the process for determining whether to increase the dynamic tolerance of the electronic tag frame length, and a detailed flowchart of the process for determining whether to increase the dynamic frame length tolerance threshold. The present invention provides a testing method for a container electronic tag, comprising:
[0054] Step S1: Perform radio frequency communication test and electrical performance test on the container freight electronic tag in sequence, and collect the test data of the electronic tag;
[0055] Step S2: Preprocess the test data to output optimized data, analyze the optimized data using a deep learning model to output analysis results, and generate a test report based on the analysis results;
[0056] Step S3: Obtain the number of times the tag status was misjudged and the total number of tests during the test, and calculate the misjudgment rate of the electronic tag.
[0057] Step S4: Determine whether the test stability of the electronic tag meets the requirements based on the false judgment rate of the electronic tag;
[0058] Step S5: If the test stability of the electronic tag does not meet the requirements, determine whether to increase the dynamic tolerance of the frame length of the electronic tag.
[0059] Step S6: If it is not necessary to increase the frame length dynamic tolerance of the electronic tag, then determine whether the test robustness of the electronic tag meets the requirements based on the occupancy rate of the buffer area.
[0060] Step S7: If the robustness of the electronic tag does not meet the requirements, determine whether it is necessary to increase the dynamic frame length tolerance threshold.
[0061] Step S8: If it is not necessary to increase the dynamic frame length tolerance threshold, then determine whether it is necessary to increase the number of batch data packets of test data based on the cache fill rate.
[0062] Specifically, radio frequency (RF) communication testing includes technical indicators such as frequency, bandwidth, spectrum, modulation / demodulation, and encoding / decoding of the RF layer of electronic tags and readers, as well as technical indicators such as communication data, logic state, and communication timing of the protocol layer.
[0063] Specifically, the RF communication test parameters for electronic tags and readers are shown in the table below:
[0064]
[0065]
[0066] Specifically, electrical performance testing includes technical indicators such as power, field strength, and distance of the forward link and power, cross-sectional area, and distance of the reverse link, as well as the trends of these technical indicators as a function of factors such as frequency, angle, and interference. In addition, reader electrical performance testing also includes technical indicators such as power, frequency, and channel occupancy as required by radio management regulations.
[0067] Specifically, the electrical performance test indicators for electronic tags and readers are shown in the table below:
[0068] Electronic tag electrical performance testing Reader electrical performance test electric field strength threshold Carrier frequency tolerance Reading distance Channel bandwidth usage Reading sensitivity Channel center frequency Radar cross-sectional area change rate Adjacent channel power leakage ratio Scattering distance Transmit power Scattering power Channel dwell time Orientation tolerance stray emission Interference tolerance Receiver sensitivity Activation field strength Energy generation Response amplitude Field strength and power transmission Load modulation amplitude Modulation coefficient and waveform Backscattering Sensitivity Degradation
[0069] Specifically, the test data includes the container's master code, equipment identification code, and data storage location.
[0070] Specifically, preprocessing includes cleaning, noise reduction, and integration.
[0071] Specifically, the optimized data includes the cleaned equipment identification code, the noise-reduced main code of the container, and the integrated data storage location.
[0072] Specifically, deep learning models can be convolutional neural networks, recurrent neural networks, or generative adversarial networks.
[0073] Specifically, the analysis results include the recognition accuracy of electronic tags, the types of data anomalies, and the results of anomaly location.
[0074] Specifically, the test report includes the test items of the electronic tag, the anomaly analysis of the electronic tag, and the test conclusions of the electronic tag.
[0075] Specifically, the dynamic tolerance of frame length of electronic tags is the characteristic that allows the frame length to fluctuate within a certain range during the data transmission process of electronic tags without affecting the correct transmission and interpretation of data.
[0076] Specifically, the cache occupancy rate is the ratio of the portion of the electronic tag's internal cache space that has been occupied by data to the total capacity of the cache area.
[0077] Specifically, the dynamic frame length tolerance threshold is the maximum allowable deviation value set for the fluctuation range of the electronic tag data frame length.
[0078] Specifically, the cache fill rate is the speed at which data is written to the electronic tag cache area, that is, the amount of data that is filled into the cache area per unit time.
[0079] In implementation, the method of this invention adjusts the dynamic tolerance of the frame length of the electronic tag based on the false judgment rate. Due to the lack of abnormal frame processing logic for the dedicated protocol of container electronic tags, misjudgments of tag status occur. By increasing the dynamic tolerance of the test equipment for the frame length of the electronic tag, more frame length fluctuations caused by interference or protocol differences can be accommodated, reducing the probability of misjudgments and avoiding misjudgments due to non-fatal errors. This improves the compatibility of the test equipment with abnormal frames. The dynamic frame length tolerance threshold is adjusted based on the buffer occupancy rate. Since the tag carries sensors that collect real-time temperature, humidity, and vibration data when transmitting container status data... Additional data may cause frame lengths to exceed protocol specifications, leading to buffer overflow. By increasing the dynamic frame length tolerance threshold, longer frames can be received, bringing excessively long frames into the normal processing range instead of discarding or reporting errors. The number of batch data packets for test data is adjusted according to the buffer fill rate. When sudden traffic arrives, communication tasks cannot obtain sufficient CPU time, resulting in increased data processing latency and a faster buffer accumulation rate. Increasing the number of batch data packets for test data can reduce the latency of accessing main memory, allowing more time to be used for actual data processing, thereby processing batch data more efficiently and improving the testing stability of electronic tags.
[0080] Specifically, determining whether the test stability of the electronic tag meets the requirements based on the false positive rate of the electronic tag includes:
[0081] The false positive rate of the electronic tag is compared with the preset first false positive rate;
[0082] If the false positive rate of the electronic tag is less than or equal to the preset first false positive rate, then the test stability of the electronic tag is determined to meet the requirements.
[0083] If the false positive rate of the electronic tag is greater than the preset first false positive rate, then the test stability of the electronic tag is determined to be unsatisfactory.
[0084] The reasons why the electronic tag's test stability does not meet the requirements may be that the electronic tag's test robustness meets the requirements, or that the electronic tag's frame length dynamic tolerance does not meet the requirements. The next step is to determine which specific cause it is, which is also the process of determining whether the electronic tag's frame length dynamic tolerance needs to be increased.
[0085] Specifically, determining whether the dynamic tolerance for the frame length of electronic tags needs to be increased includes:
[0086] The false positive rate of the electronic tag is compared with the preset first false positive rate and the preset second false positive rate, respectively;
[0087] If the false positive rate of the electronic tag is greater than the preset second false positive rate, then it is determined that the frame length dynamic tolerance of the electronic tag needs to be increased, and the frame length dynamic tolerance of the electronic tag is increased.
[0088] If the false positive rate of the electronic tag is greater than a preset first false positive rate and less than or equal to a preset second false positive rate, then it is determined that there is no need to increase the dynamic tolerance of the frame length of the electronic tag.
[0089] Specifically, when the false positive rate of the electronic tag exceeds the preset second false positive rate, it is determined that the reason for the electronic tag's failure to meet the test stability requirements is that the dynamic tolerance of the electronic tag's frame length does not meet the requirements. Therefore, it is necessary to increase the dynamic tolerance of the electronic tag's frame length. When the false positive rate of the electronic tag exceeds the preset second false positive rate, it can be preliminarily determined that the electronic tag's test robustness does not meet the requirements. Next, it is necessary to make a final determination on whether the electronic tag's test robustness meets the requirements based on the buffer occupancy rate, that is, to determine whether the reason for the electronic tag's failure to meet the test stability requirements is that the electronic tag's test robustness does not meet the requirements.
[0090] Understandably, the preset first false positive rate is lower than the preset second false positive rate. The three intervals divided by the preset first and second false positive rates correspond to three different scenarios:
[0091] The first interval is when the false positive rate of the electronic tag is less than or equal to the preset first false positive rate. The corresponding situation is that the test stability of the electronic tag meets the requirements, and no adjustment is required.
[0092] The second range is when the false judgment rate of the electronic tag is greater than the preset first false judgment rate and less than or equal to the preset second false judgment rate. The corresponding situation is: when the tag is transmitting container status data, if it carries additional data such as temperature, humidity and vibration collected in real time by the sensor, the frame length may exceed the protocol specification, resulting in buffer overflow. At this time, it is necessary to further judge whether the test robustness of the electronic tag meets the requirements.
[0093] The third range is when the false judgment rate of the electronic tag is greater than the preset second false judgment rate. The corresponding situation is: due to the lack of abnormal frame processing logic for the dedicated protocol of container electronic tags, the tag status is misjudged. In this case, it is necessary to adjust the dynamic tolerance of the frame length of the electronic tag.
[0094] It is understandable that using a first and second false positive rate to characterize stability during the testing of electronic tags is essentially a way to balance testing accuracy and engineering efficiency through threshold-based management. The first false positive rate serves as the minimum standard for industrial applications, ensuring the usability of electronic tags in normal scenarios. The second false positive rate is a key threshold for distinguishing between occasional errors and design flaws; exceeding the second false positive rate indicates insufficient adaptability of the tag in dynamic interference scenarios. The preset first and second false positive rates can be set according to actual working conditions. The setting of the preset first and second false positive rates aims to improve the testing stability and usability of the electronic tags. Optionally, the preset first and second false positive rates are determined through a limited number of experiments by evaluating the testing effect of different numbers of false positives on the electronic tags. The determined preset first and second false positive rates should be neither too high nor cause excessive interference to the testing of the electronic tags. For example, the preset first false positive rate is generally selected in the range of [0.2%, 0.4%], and the preset second false positive rate is generally selected in the range of [0.5%, 0.7%].
[0095] Preferably, the first false positive rate is 0.3% in a preferred embodiment, and the second false positive rate is 0.6% in a preferred embodiment.
[0096] Specifically, the false positive rate of electronic tags is the ratio of the number of times the tag status is incorrectly determined during the test to the total number of tests.
[0097] In practice, the method of the present invention determines the test stability of electronic tags by setting a preset first false positive rate and a preset second false positive rate, thereby reducing the impact of the decrease in test accuracy of electronic tags due to inaccurate determination of test stability and further improving the test stability of electronic tags.
[0098] Specifically, the increase in the frame length dynamic tolerance of the electronic tag is determined by the difference between the false judgment rate of the electronic tag and the preset second false judgment rate.
[0099] Specifically, when the difference between the false positive rate of the electronic tag and the preset second false positive rate is within 0.1%, the dynamic tolerance of the frame length of the electronic tag increases to 1.1 times the original value. When the difference between the false positive rate of the electronic tag and the preset second false positive rate exceeds 0.1%, in addition to increasing to 1.1 times the original value, the dynamic tolerance of the frame length of the electronic tag increases by 2 μs for every 0.05% exceeding the original value. For example, if the difference between the false positive rate of the electronic tag and the preset second false positive rate is 0.2%, and the current dynamic tolerance of the frame length of the electronic tag is 20 μs, the increased dynamic tolerance of the frame length of the electronic tag will be 20 × 1.1 + 2 × 2 = 26 μs.
[0100] In practice, the method of the present invention adjusts the dynamic tolerance of the frame length of the electronic tag by setting a preset first misjudgment rate and a preset second misjudgment rate. Due to the lack of abnormal frame processing logic for the dedicated protocol of container electronic tags, the tag status is misjudged. By increasing the dynamic tolerance of the test equipment for the frame length of the electronic tag, more frame length fluctuations caused by interference or protocol differences can be accommodated, reducing the probability of misjudgment and avoiding misjudgment caused by non-fatal errors. This improves the compatibility of the test equipment with abnormal frames and further enhances the test stability of the electronic tag.
[0101] Specifically, the robustness of the electronic tag's test is determined based on the cache occupancy rate; that is, it is determined whether the reason for the electronic tag's failure to meet the test stability requirements is due to a failure in the electronic tag's test robustness. This includes:
[0102] Compare the cache occupancy rate with the preset first occupancy rate;
[0103] If the occupancy rate of the buffer is less than or equal to the preset first occupancy rate, then it is determined that the test robustness of the electronic tag meets the requirements, and it is determined whether the frame length dynamic tolerance of the electronic tag meets the requirements.
[0104] If the occupancy rate of the buffer area is greater than the preset first occupancy rate, then the test robustness of the electronic tag is determined to be unsatisfactory.
[0105] Specifically, when the occupancy rate of the buffer is less than or equal to the preset first occupancy rate, it is determined that the test robustness of the electronic tag meets the requirements. However, if it has been previously determined that the test stability of the electronic tag does not meet the requirements, then it is necessary to further determine whether the dynamic tolerance of the frame length of the electronic tag meets the requirements.
[0106] In practice, the frame length dynamic tolerance of the actual electronic tag is compared with the predetermined dynamic tolerance threshold to determine whether the frame length dynamic tolerance of the electronic tag meets the requirements. If the frame length dynamic tolerance of the actual electronic tag is less than or equal to the predetermined dynamic tolerance threshold, the frame length dynamic tolerance of the electronic tag is determined to be non-compliant. The predetermined dynamic tolerance threshold is the average value of the frame length dynamic tolerance of the electronic tags monitored in the previous three months of the historical period.
[0107] If the dynamic tolerance of the frame length of the electronic tag does not meet the requirements, the dynamic tolerance of the frame length of the electronic tag will be increased; if the dynamic tolerance of the frame length of the electronic tag meets the requirements, the false judgment rate of the electronic tag will be re-collected, and the test stability of the electronic tag will be re-evaluated.
[0108] When the buffer occupancy rate exceeds a preset first occupancy rate, the cause of the electronic tag's unsatisfactory test stability can be identified as the electronic tag's unsatisfactory test robustness. The reasons for this unsatisfactory robustness might be that the dynamic frame length tolerance threshold is not met, or that the electronic tag's test reliability is not met. The next step is to determine which specific cause it is, which is essentially the process of deciding whether to increase the dynamic frame length tolerance threshold.
[0109] Specifically, determining whether the dynamic frame length tolerance threshold needs to be increased includes:
[0110] The occupancy rate of the cache area is compared with the preset first occupancy rate and the preset second occupancy rate, respectively;
[0111] If the occupancy rate of the buffer is greater than the preset first occupancy rate and less than or equal to the preset second occupancy rate, then it is determined that the dynamic frame length tolerance threshold needs to be increased, and the dynamic frame length tolerance threshold is increased accordingly.
[0112] If the occupancy rate of the buffer is greater than the preset second occupancy rate, then it is determined that there is no need to increase the dynamic frame length tolerance threshold.
[0113] Specifically, when the buffer occupancy rate is greater than a preset first occupancy rate but less than or equal to a preset second occupancy rate, it is determined that the reason for the electronic tag's failure to meet the test robustness requirements is that the dynamic frame length tolerance threshold does not meet the requirements, thus requiring an increase in the dynamic frame length tolerance threshold. When the buffer occupancy rate is greater than the preset second occupancy rate, it can be preliminarily determined that the electronic tag's test reliability does not meet the requirements. The next step is to determine, based on the buffer fill rate, whether the electronic tag's test reliability meets the requirements, i.e., to determine whether the reason for the electronic tag's failure to meet the test robustness requirements is indeed the electronic tag's failure to meet the test reliability requirements.
[0114] It is understandable that the preset first occupancy rate is lower than the preset second occupancy rate. The three intervals divided by the preset first occupancy rate and the preset second occupancy rate correspond to three different scenarios:
[0115] The first interval is when the occupancy rate of the buffer is less than or equal to the preset first occupancy rate. The corresponding situation is: the test robustness of the electronic tag is determined to meet the requirements. At this time, it is necessary to further determine whether the dynamic tolerance of the frame length of the electronic tag meets the requirements.
[0116] The second interval is when the occupancy rate of the buffer is greater than the preset first occupancy rate and less than or equal to the preset second occupancy rate. The corresponding situation is: when the tag is transmitting container status data, if it carries additional data such as temperature, humidity and vibration collected in real time by the sensor, the frame length may exceed the protocol specification, resulting in buffer overflow. In this case, it is necessary to adjust the dynamic frame length tolerance threshold.
[0117] The third interval is when the cache occupancy rate is greater than the preset second occupancy rate. The corresponding situation is that when a sudden surge in traffic arrives, the communication task cannot obtain enough CPU time, resulting in increased data processing latency and increased cache accumulation rate. At this time, it is necessary to further determine whether the test reliability of the electronic tag meets the requirements.
[0118] Understandably, in electronic tag testing, using a dual threshold of first and second occupancy rates to characterize test robustness essentially achieves a refined assessment of the system's anti-interference capability through a hierarchical fault location mechanism. The first occupancy rate ensures that the tag does not experience buffer overflow under normal data traffic, while the second occupancy rate ensures that the tag can still avoid buffer collapse through parameter adjustments under extreme scenarios such as intensive reading and signal interference. The preset first and second occupancy rates can be set according to actual operating conditions. The setting of the preset first and second occupancy rates aims to ensure the stability and practicality of electronic tag testing. Optionally, the preset first and second occupancy rates are determined through a limited number of experiments by evaluating the test effects of different occupancy conditions on the electronic tag. The determined preset first and second occupancy rates should satisfy the condition of being neither too high nor causing excessive interference to the electronic tag test. For example, the preset first occupancy rate is generally selected within the range of [65%, 75%], and the preset second occupancy rate is generally selected within the range of [80%, 90%].
[0119] Preferably, the first occupancy rate is 70% in the preferred embodiment, and the second occupancy rate is 85% in the preferred embodiment.
[0120] In practice, the method of the present invention determines the test robustness of electronic tags by setting a preset first occupancy rate and a preset second occupancy rate, thereby reducing the impact of decreased test stability of electronic tags due to inaccurate determination of test robustness and further improving the test stability of electronic tags.
[0121] Specifically, the increase in the dynamic frame length tolerance threshold is determined by the difference between the buffer occupancy rate and the preset first occupancy rate.
[0122] Specifically, when the difference between the buffer occupancy rate and the preset first occupancy rate is within 3%, the dynamic frame length tolerance threshold is increased to 1.2 times the original value. When the difference between the buffer occupancy rate and the preset first occupancy rate exceeds 3%, in addition to increasing to 1.2 times the original value, the dynamic frame length tolerance threshold is increased by 3 bytes for every 1% exceeding the original value. For example, if the difference between the buffer occupancy rate and the preset first occupancy rate is 5%, the current dynamic frame length tolerance threshold is 10 bytes, and the increased dynamic frame length tolerance threshold is 10 × 1.2 + 3 × 2 = 18 bytes.
[0123] In practice, the method of the present invention adjusts the dynamic frame length tolerance threshold by setting a preset first occupancy rate and a preset second occupancy rate. Since the frame length may exceed the protocol specification when the tag carries additional data such as temperature, humidity and vibration collected in real time by the sensor when transmitting container status data, resulting in buffer overflow, by increasing the dynamic frame length tolerance threshold, longer frames can be received, and the excessively long frames can be included in the normal processing range instead of being directly discarded or reported as errors, which further improves the testing stability of electronic tags.
[0124] Specifically, the decision on whether to increase the batch size of test data packets is based on the cache fill rate; that is, to determine whether the failure of the electronic tag's robustness to meet the requirements is due to a failure of the electronic tag's reliability to meet the requirements, including:
[0125] Compare the cache fill rate with the preset rate;
[0126] If the cache fill rate is less than or equal to the preset rate, it is determined that there is no need to increase the number of batch data packets for the test data, and it is determined whether the dynamic frame length tolerance threshold meets the requirements.
[0127] If the cache fill rate is greater than the preset rate, then it is determined that the number of batch data packets for test data needs to be increased, and the number of batch data packets for test data needs to be increased.
[0128] When the cache fill rate is less than or equal to the preset rate, it is determined that the test reliability of the electronic tag meets the requirements. However, if the test robustness of the electronic tag has been determined to be unsatisfactory, it is necessary to further determine whether the dynamic frame length tolerance threshold meets the requirements.
[0129] In practice, the dynamic frame length tolerance threshold is determined to meet the requirements based on the comparison between the actual dynamic frame length tolerance threshold and the predetermined dynamic frame length tolerance threshold. If the actual dynamic frame length tolerance threshold is less than or equal to the predetermined dynamic frame length tolerance threshold, the dynamic frame length tolerance threshold is determined to not meet the requirements. The predetermined dynamic frame length tolerance threshold is the average value of the dynamic frame length tolerance threshold monitored in the previous three months of the historical period.
[0130] If the dynamic frame length tolerance threshold does not meet the requirements, the dynamic frame length tolerance threshold is increased; if the dynamic frame length tolerance threshold meets the requirements, the buffer occupancy rate is re-collected, and the robustness of the electronic tag test is re-evaluated.
[0131] When the cache fill rate exceeds the preset rate, it can be determined that the reason why the test robustness of the electronic tag does not meet the requirements is that the test reliability of the electronic tag does not meet the requirements. Therefore, it is necessary to increase the number of batch data packets of test data.
[0132] It is understandable that the two intervals of the preset rate division correspond to two different situations:
[0133] The first interval is when the buffer fill rate is less than or equal to the preset rate. The corresponding situation is: the test reliability of the electronic tag is determined to meet the requirements. At this time, it is necessary to further determine whether the dynamic frame length tolerance threshold meets the requirements.
[0134] The second interval is when the cache fill rate is greater than the preset rate. The corresponding situation is that when a sudden surge in traffic arrives, the communication task cannot obtain enough CPU time, resulting in increased data processing latency and increased cache accumulation rate. In this case, it is necessary to adjust the number of batch data packets for the test data.
[0135] Understandably, in electronic tag testing scenarios, using cache fill rate to characterize test reliability stems from the core logic of the direct correlation between data processing pressure and system stability. The preset rate is essentially a threshold for the electronic tag's data processing capability. During testing, comparing the actual fill rate with the threshold directly determines the electronic tag's stability under specific pressure. The preset rate can be set according to actual working conditions. The purpose of setting the preset rate is to determine the electronic tag's test stability and practicality. Optionally, the preset rate is determined through a limited number of trials by evaluating the test effects of electronic tags at different rates. The determined preset rate should be neither too high nor cause excessive interference to the electronic tag test. For example, the preset rate is generally selected within the range of [70KB / s, 80KB / s].
[0136] Preferably, the preset rate is 75KB / s in a preferred embodiment.
[0137] In practice, the method of the present invention determines the test reliability of electronic tags by setting a preset rate, thereby reducing the impact of inaccurate determination of the test reliability of electronic tags on the test stability of electronic tags and further improving the test stability of electronic tags.
[0138] Specifically, the increase in the number of batch data packets of the test data is determined by the difference between the cache fill rate and the preset rate.
[0139] Specifically, when the difference between the cache fill rate and the preset rate is within 5KB / s, the number of batch data packets for the test data increases to 1.2 times the original value. When the difference between the cache fill rate and the preset rate exceeds 5KB / s, in addition to increasing to 1.2 times the original value, the number of batch data packets for the test data increases by 2 for every 2KB / s exceeding the original value. For example, if the difference between the cache fill rate and the preset rate is 9KB / s, and the current number of batch data packets for the test data is 25, the increased number of batch data packets for the test data will be 25×1.2+2×2=34.
[0140] In practice, the method of the present invention adjusts the number of batch data packets of test data by setting a preset rate. When a sudden surge in traffic occurs, the communication task cannot obtain enough CPU time, which leads to increased data processing latency and increased cache accumulation rate. By increasing the number of batch data packets of test data, the latency of accessing main memory can be reduced, and more time can be used for actual data processing, thereby processing batch data more efficiently and further improving the testing stability of electronic tags.
[0141] A container electronic tag testing device, comprising:
[0142] The radio frequency communication testing module includes a conformity testing unit for performing conformity testing on container freight electronic tags and a full-performance testing unit for performing full-performance automatic testing on the electronic tags.
[0143] The compliance testing unit is used to send command signals to the electronic tag under different radio frequency parameters and protocol parameters, and the full performance testing unit is used to automatically complete various tests of the electronic tag and generate test reports.
[0144] The electrical performance testing module is used to test the power, field strength, and distance of the forward link of the electronic tag.
[0145] The technical solution of the present invention has been described above with reference to the preferred embodiments shown in the accompanying drawings. However, it will be readily understood by those skilled in the art that the scope of protection of the present invention is obviously not limited to these specific embodiments. Without departing from the principles of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will all fall within the scope of protection of the present invention.
Claims
1. A testing method for electronic tags on containers, characterized in that, include: The container freight electronic tags were subjected to radio frequency communication tests and electrical performance tests in sequence, and the test data of the electronic tags were collected. The test data is preprocessed to output optimized data, the optimized data is analyzed using a deep learning model to output analysis results, and a test report is generated based on the analysis results. The number of times the tag status was misjudged and the total number of tests were obtained during the test, and the misjudgment rate of the electronic tag was calculated. The test stability of the electronic tag is determined based on the false positive rate of the electronic tag. If the test stability of the electronic tag does not meet the requirements, then determine whether to increase the dynamic tolerance of the frame length of the electronic tag; If it is not necessary to increase the dynamic tolerance of the frame length of the electronic tag, the test robustness of the electronic tag is determined based on the occupancy rate of the buffer area. If the robustness of the electronic tag does not meet the requirements, determine whether it is necessary to increase the dynamic frame length tolerance threshold. If it is not necessary to increase the dynamic frame length tolerance threshold, then determine whether it is necessary to increase the number of batch data packets for test data based on the cache fill rate.
2. The testing method for container electronic tags according to claim 1, characterized in that, Determining whether the test stability of the electronic tag meets the requirements based on the false positive rate of the electronic tag includes: The false positive rate of the electronic tag is compared with the preset first false positive rate; If the false positive rate of the electronic tag is less than or equal to the preset first false positive rate, then the test stability of the electronic tag is determined to meet the requirements. If the false positive rate of the electronic tag is greater than the preset first false positive rate, then the test stability of the electronic tag is determined to be unsatisfactory.
3. The testing method for container electronic tags according to claim 2, characterized in that, Determine whether the dynamic tolerance for the frame length of the electronic tag needs to be increased, including: The false positive rate of the electronic tag is compared with the preset first false positive rate and the preset second false positive rate, respectively; If the false positive rate of the electronic tag is greater than the preset second false positive rate, then it is determined that the frame length dynamic tolerance of the electronic tag needs to be increased, and the frame length dynamic tolerance of the electronic tag is increased. If the false positive rate of the electronic tag is greater than a preset first false positive rate and less than or equal to a preset second false positive rate, then it is determined that there is no need to increase the dynamic tolerance of the frame length of the electronic tag.
4. The testing method for container electronic tags according to claim 3, characterized in that, The increase in the frame length dynamic tolerance of the electronic tag is determined by the difference between the false judgment rate of the electronic tag and the preset second false judgment rate.
5. The testing method for container electronic tags according to claim 3, characterized in that, Determining the robustness of electronic tags based on buffer occupancy rates to meet requirements includes: Compare the cache occupancy rate with the preset first occupancy rate; If the occupancy rate of the buffer is less than or equal to the preset first occupancy rate, then it is determined that the test robustness of the electronic tag meets the requirements, and it is determined whether the frame length dynamic tolerance of the electronic tag meets the requirements. If the occupancy rate of the buffer area is greater than the preset first occupancy rate, then the test robustness of the electronic tag is determined to be unsatisfactory.
6. The testing method for container electronic tags according to claim 5, characterized in that, Determine whether the dynamic frame length tolerance threshold needs to be increased, including: The occupancy rate of the cache area is compared with the preset first occupancy rate and the preset second occupancy rate, respectively; If the occupancy rate of the buffer is greater than the preset first occupancy rate and less than or equal to the preset second occupancy rate, then it is determined that the dynamic frame length tolerance threshold needs to be increased, and the dynamic frame length tolerance threshold is increased accordingly. If the occupancy rate of the buffer is greater than the preset second occupancy rate, then it is determined that there is no need to increase the dynamic frame length tolerance threshold.
7. The testing method for container electronic tags according to claim 6, characterized in that, The increase in the dynamic frame length tolerance threshold is determined by the difference between the cache occupancy rate and the preset first occupancy rate.
8. The testing method for container electronic tags according to claim 7, characterized in that, Determining whether to increase the batch size of test data packets based on the cache fill rate includes: Compare the cache fill rate with the preset rate; If the cache fill rate is less than or equal to the preset rate, it is determined that there is no need to increase the number of batch data packets for the test data, and it is determined whether the dynamic frame length tolerance threshold meets the requirements. If the cache fill rate is greater than the preset rate, then it is determined that the number of batch data packets for test data needs to be increased, and the number of batch data packets for test data needs to be increased.
9. The testing method for container electronic tags according to claim 8, characterized in that, The increase in the number of batch data packets for the test data is determined by the difference between the cache fill rate and the preset rate.
10. A testing device using the testing method for container electronic tags according to any one of claims 1-9, characterized in that, include: The radio frequency communication testing module includes a conformity testing unit for performing conformity testing on container freight electronic tags and a full-performance testing unit for performing full-performance automatic testing on the electronic tags. The compliance testing unit is used to send command signals to the electronic tag under different radio frequency parameters and protocol parameters, and the full performance testing unit is used to automatically complete various tests of the electronic tag and generate test reports. The electrical performance testing module is used to test the power, field strength, and distance of the forward link of the electronic tag.
Citation Information
Patent Citations
Test data tag generation method and device, electronic equipment and storage medium
CN120105034A