LED large screen power supply overload test method, device and medium

Abstract

The invention discloses an LED large screen power supply overload test method and device and a medium, and relates to the technical field. The method comprises the following steps: presetting a rated voltage, a rated current and an overload protection threshold value of a tested power supply; gradually increasing the initial current value at a preset rate until the initial current value exceeds an overload protection threshold value, collecting current and voltage data in real time in the rising process of the current value, recording the moment when the current reaches the overload protection threshold value as an overload triggering moment, and recording the moment when the voltage suddenly drops to zero as a protection starting moment; calculating the time difference between the overload triggering moment and the protection starting moment as the overload protection response time of the power supply system; and changing the temperature value of the test environment, obtaining overload protection response time, and evaluating the protection performance of the power supply system according to the overload protection response time. According to the method, various test scenes such as normal temperature, high and low temperature and dynamic jump are integrated, and comprehensive and systematic qualification judgment is made on the overload protection performance of the power supply system.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field, and particularly relates to a test method, device and medium for overload of an LED large screen power supply. BACKGROUND

[0002] The power supply system of an LED large screen is the core of stable operation, and the response speed of the overload protection function is directly related to the safety and reliability of the entire display device. At present, the test of the response time of the overload protection of the LED power supply mostly adopts a test method under static load or single working condition. For example, an overload state is simulated by a fixed resistance load, or a test is performed by using a programmable electronic load in a normal temperature environment.

[0003] However, these existing test methods have significant limitations. First, the load change rate of the LED large screen in actual application due to dynamic start and stop of a module cannot be accurately simulated. Second, the test is usually performed in a normal temperature environment, and the influence of temperature change in an outdoor or extreme environment on the performance of the power supply protection circuit is ignored. In addition, the concurrent overload scene when multiple power supply modules work cooperatively cannot be effectively reproduced, and the collection precision and processing method of the test data are insufficient, which leads to deviation of the test result from the real working condition and makes it difficult to comprehensively and objectively evaluate the protection performance of the power supply system.

[0004] Through the above analysis, the problems and defects of the prior art are as follows:

[0005] The actual dynamic working condition of the LED large screen in the prior art cannot be truly simulated, and the power supply system overload protection response time cannot cover extreme environmental temperature and realize high-precision measurement and evaluation. SUMMARY

[0006] The embodiments of the present application provide a test method, device and medium for overload of an LED large screen power supply, which can solve the problem that the actual dynamic working condition of the LED large screen in the prior art cannot be truly simulated, and the power supply system overload protection response time cannot cover extreme environmental temperature and realize high-precision measurement and evaluation.

[0007] In a first aspect, the embodiments of the present application provide a test method for an overload of an LED large-screen power supply, which comprises: setting a rated voltage, a rated current and an overload protection threshold of a power supply to be tested in advance, and presetting an initial current value of a simulation load based on the rated current; gradually increasing the initial current value to exceed the overload protection threshold at a preset rate, collecting current and voltage data in real time during the rising of the current value, recording a time when the current reaches the overload protection threshold as an overload triggering time, and recording a time when the voltage suddenly drops to zero as a protection starting time; calculating a time difference between the overload triggering time and the protection starting time as an overload protection response time of the power supply system; changing a temperature value of a test environment, obtaining the overload protection response time, and evaluating a protection performance of the power supply system according to the overload protection response time.

[0008] In an implementation manner of the present application, the changing of the temperature value of the test environment, the obtaining of the overload protection response time, and the evaluation of the protection performance of the power supply system according to the overload protection response time specifically comprise: adjusting the temperature of the test environment to a first low temperature and keeping the first low temperature for a first duration, so that the temperature of the test environment reaches a stable state; gradually increasing the initial current value of the simulation load at the first low temperature at a preset rate, and obtaining an overload protection response time at the first low temperature; adjusting the temperature of the test environment to a first high temperature and keeping the first high temperature for a second duration, so that the temperature of the test environment reaches a stable state; gradually increasing the initial current value of the simulation load at the first high temperature at a preset rate, and obtaining an overload protection response time in a first high temperature environment.

[0009] In an implementation manner of the present application, the collecting of the current and voltage data in real time during the rising of the current value, and the recording of the time when the current reaches the overload protection threshold as the overload triggering time and the time when the voltage suddenly drops to zero as the protection starting time specifically comprise: setting the current of the simulation load to periodically change between the initial current value and a jump current value higher than the overload protection threshold, and setting a jump period and a jump holding time; recording a corresponding overload protection response time each time the current exceeds the overload protection threshold within a plurality of continuous jump periods; and selecting a maximum value from the plurality of recorded protection response times as a response time evaluation value in a multi-module concurrent starting working condition.

[0010] In an implementation manner of the present application, the method further comprises: collecting the overload protection response time, calculating a mean value and a standard deviation; eliminating data points deviating from the mean value by more than a preset proportion to obtain an effective data set; calculating a fluctuation coefficient of the effective data set, and determining that a current test result is valid if the fluctuation coefficient does not exceed a preset threshold.

[0011] In an implementation form of the present application, the temperature value of the test environment is changed, the overload protection response time is obtained, and the protection performance of the power supply system is evaluated according to the overload protection response time, specifically comprising: comparing the overload protection response times obtained at the first low temperature and the first high temperature environments respectively; if the response time differences are all within the allowable deviation range, it is determined that the power supply system has environmental adaptability.

[0012] In an implementation form of the present application, before setting the jump period and the jump holding time, the method further comprises: setting the range of the jump current value and the value range of the jump period according to the actual module quantity in the LED large screen and the power change characteristics; and monitoring the power output voltage waveform in real time in the jump process to identify whether there is a protection delay.

[0013] In an implementation form of the present application, the method further comprises: performing normality test on the effective data set, and calculating the confidence interval of the overload protection response time; evaluating the reliability level of the test result according to the width of the confidence interval, and generating a test report containing the response time statistical characteristics and the effectiveness judgment.

[0014] In an implementation form of the present application, the method further comprises: setting an overload protection response time threshold value and an environmental difference tolerance value; calculating the maximum difference value of the overload protection response time; confirming that the maximum difference value does not exceed the environmental difference tolerance value; and determining that the product overload protection performance is qualified when the overload protection response time requirement and the environmental difference tolerance value are both met.

[0015] In a second aspect, the embodiments of the present application also provide a test device for overload of an LED large screen power supply, comprising at least one processor; and a memory in communication connection with the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to: preset the rated voltage, the rated current and the overload protection threshold value of the measured power supply in advance, and preset the initial current value of the simulated load based on the rated current; gradually increase the initial current value to exceed the overload protection threshold value at a preset rate, collect current and voltage data in real time in the process of increasing the current value, and record the time when the current reaches the overload protection threshold value as the overload triggering time, and the time when the voltage suddenly drops to zero as the protection starting time; calculate the time difference between the overload triggering time and the protection starting time as the overload protection response time of the power supply system; change the temperature value of the test environment, obtain the overload protection response time, and evaluate the protection performance of the power supply system according to the overload protection response time.

[0016] In a third aspect, the embodiments of the present application further provide a nonvolatile computer storage medium for testing overload of an LED large-screen power supply, which stores computer executable instructions, and the computer executable instructions are configured to: set a rated voltage, a rated current and an overload protection threshold of the power supply to be tested in advance, and preset an initial current value of a simulation load based on the rated current; gradually increase the initial current value to exceed the overload protection threshold at a preset rate, collect current and voltage data in real time during the current value rising process, and record a time when the current reaches the overload protection threshold as an overload triggering time and a time when the voltage suddenly drops to zero as a protection starting time; calculate a time difference between the overload triggering time and the protection starting time as an overload protection response time of the power supply system; change a temperature value of a test environment, obtain the overload protection response time, and evaluate protection performance of the power supply system according to the overload protection response time.

[0017] The embodiments of the present application provide an LED large-screen power supply overload testing method, device and medium, which effectively simulates a real load change process of LED large-screen multi-module start-stop by dynamically increasing the load at a preset rate and setting a periodic jump current. The protection performance of the power supply system under different temperature conditions is comprehensively evaluated by introducing high and low temperature environment tests, and the problem that the existing test method is disconnected with the actual working condition is solved. The accurate time of overload triggering and protection starting is accurately captured by using high-precision real-time data acquisition technology. The effectiveness and repeatability of the test results are strictly checked by introducing a data screening mechanism and a fluctuation coefficient calculation, and the accuracy and reliability of the test results are significantly improved. The method not only tests a single working condition, but also comprehensively considers various test scenes such as normal temperature, high and low temperature and dynamic jump, and can make a comprehensive and systematic qualification judgment on the overload protection performance of the power supply system according to the clear judgment standard, thereby providing a strong guarantee for product reliability. BRIEF DESCRIPTION OF DRAWINGS

[0018] The accompanying drawings, which are included to provide a further understanding of the present application and constitute a part of this application, illustrate certain illustrative embodiments of the present application and together with the description serve to explain the present application. In the drawings:

[0019] Figure 1 A flowchart of an LED large-screen power supply overload testing method provided by the embodiments of the present application;

[0020] Figure 2 An internal structure schematic diagram of an LED large-screen power supply overload testing device provided by the embodiments of the present application. DETAILED DESCRIPTION

[0021] In order to make the purposes, technical solutions and advantages of the present application clearer, the technical solutions of the present application will be described below in connection with specific embodiments of the present application and corresponding drawings. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application.

[0022] The embodiments of the present application provide a test method, device and medium for LED large screen power overload, which solve the problem that the actual dynamic working condition of the LED large screen in the prior art cannot be simulated truly, cannot cover extreme environmental temperature, and cannot realize high-precision measurement and evaluation of power system overload protection response time.

[0023] The technical solutions provided by the embodiments of the present application will be described in detail below with reference to the drawings.

[0024] Figure 1 A flowchart of a test method for LED large screen power overload provided by the embodiments of the present application is shown in FIG. 1. As shown in FIG. 1, the test method for LED large screen power overload provided by the embodiments of the present application specifically includes the following steps: Figure 1

[0025] Step 10: based on the rated voltage, rated current and overload protection threshold of the measured power source preset in advance, and based on the rated current, presetting the initial current value of the simulated load;

[0026] In this step, a test platform composed of a simulated load module, a data acquisition module, a temperature control module and a control terminal is constructed. The simulated load module adopts a programmable electronic load, which supports 0-50A current and 0-60V voltage adjustment. The data acquisition module includes a current sensor, a voltage sensor and a time recorder. The temperature control module is used to control the test environment temperature, and the adjustment range is-10℃-50℃. The control terminal communicates with each module to realize load parameter setting, data recording and analysis.

[0027] The rated parameters of the measured LED power source system are input, including the rated voltage U0, the rated current I0 and the nominal overload protection threshold I1. According to the actual module quantity of the LED large screen, the initial load value of the simulated load is set to 0.8I0 to simulate the normal working state.

[0028] Step 20: gradually increasing the initial current value to exceed the overload protection threshold at a preset rate, in the process of rising of the current value, real-time acquisition of current and voltage data, and recording the time when the current reaches the overload protection threshold as the overload triggering time, and the time when the voltage suddenly drops to zero as the protection starting time;

[0029] ​In this step, assuming the preset rate is 5A / s, the initial current is 0.8I0, where I0 is the rated current of the power supply, and it is gradually increased to 1.5I1, where I1 is the overload protection threshold. Current and voltage data are collected in real time. The moment when the current reaches I1 is the overload trigger moment, and the moment when the voltage drops to 0 is the protection start moment.

[0030] Step 30: Calculate the time difference between the overload trigger time and the protection start time, as the overload protection response time of the power system;

[0031] In this step, the difference between the overload trigger time and the protection start time is calculated, which is the overload protection response time. The same working condition needs to be tested 5 times and the average value is taken. Subsequently, outliers with deviations exceeding the average value by ±20% need to be removed to ensure data reliability.

[0032] Step 40: Change the temperature of the test environment, obtain the overload protection response time, and evaluate the protection performance of the power supply system based on the overload protection response time.

[0033] As an optional embodiment, changing the temperature value of the test environment to obtain the overload protection response time, and evaluating the protection performance of the power supply system based on the overload protection response time, may specifically include: Step 401: Adjusting the test environment temperature to a first low temperature and maintaining it for a first duration to make the test environment temperature reach a stable state; Step 402: At the first low temperature, gradually increasing the initial current value of the simulated load at a preset rate to obtain the overload protection response time at the first low temperature; Step 403: Adjusting the test environment temperature to a first high temperature and maintaining it for a second duration to make the test environment temperature reach a stable state; Step 404: At the first high temperature, gradually increasing the initial current value of the simulated load at a preset rate to obtain the overload protection response time under the first high temperature environment.

[0034] In this step, the temperature control module is activated to stabilize the ambient temperature at 25℃. The control terminal gradually increases the load current at a rate of 5A / s through the simulated load module, from the initial load value to 1.5I1, exceeding the protection threshold. The data acquisition module simultaneously records the current change curve and the power system output voltage curve, marking the overload trigger time t0 and the moment when the current reaches I1. The overload protection activation time t1 and the moment when the voltage suddenly drops to 0 are captured, and the response time Δt1 = t1 - t0 is calculated. The temperature control module is adjusted to -10℃ and stabilized for 30 minutes. The load loading process in step 3 is repeated, and the response time Δt2 is recorded. The temperature control module is adjusted to 50℃ and stabilized for 30 minutes. The load loading process in step 3 is repeated, and the response time Δt3 is recorded. A multi-module concurrent startup scenario is simulated: the load current is set to periodically jump between 0.8I0 and 1.2I1 with a period of 10 seconds, and the maximum protection response time Δt4 is recorded in 100 cycles.

[0035] As an optional embodiment, during the current rise, current and voltage data are collected in real time, and the moment when the current reaches the overload protection threshold is recorded as the overload trigger moment, and the moment when the voltage drops to zero is recorded as the protection start moment. Specifically, this may include: Step 201: Setting the simulated load current to periodically change between the initial current value and the jump current value higher than the overload protection threshold, and setting the jump period and jump hold time; Step 202: Recording the corresponding overload protection response time each time the current exceeds the overload protection threshold within multiple consecutive jump periods; Step 203: Selecting the maximum value among the recorded multiple protection response times as the response time evaluation value under the multi-module concurrent start-up condition.

[0036] In this step, the current fluctuations during multi-module startup are simulated, and the overload protection response time is measured multiple times. The maximum value is taken to evaluate the protection performance under the worst-case scenario, preventing equipment damage due to untimely protection. Multi-module startup may cause current peaks to overlap; the maximum value reflects the protection speed under the worst-case scenario, ensuring safety redundancy. The test is repeated 5 times, and the average value of Δt1 is taken as the response time under normal temperature conditions.

[0037] As an optional embodiment, the method may further include: collecting overload protection response times, calculating the average value and standard deviation; removing data points that deviate from the average value by more than a preset proportion to obtain a valid data set; calculating the fluctuation coefficient of the valid data set, and determining the current test result to be valid if the fluctuation coefficient does not exceed a preset threshold.

[0038] In this step, the test data is screened to remove outliers caused by sensor delay; the fluctuation coefficient of response time under different operating conditions is calculated: standard deviation or average value. If the fluctuation coefficient is less than or equal to 5%, the test result is considered valid.

[0039] As an optional embodiment, the temperature value of the test environment is changed to obtain the overload protection response time, and the protection performance of the power supply system is evaluated based on the overload protection response time. Specifically, it may include: Step 405: Compare the overload protection response times obtained under the first low temperature and the first high temperature environments respectively; Step 406: If the difference in response time is within the allowable deviation range, it is determined that the power supply system has environmental adaptability.

[0040] Overload protection response times were measured under two conditions: a first low temperature simulating cold regional operating conditions and a first high temperature simulating hot or poorly ventilated enclosed operating conditions. The differences between the two were then compared. Low temperature data: 0.32s, 0.34s, 0.33s, 0.35s, 0.34s (mean 0.336s); High temperature data: 0.31s, 0.33s, 0.32s, 0.34s, 0.33s (mean 0.326s); The difference between the two was 0.01s. An allowable deviation range was set according to the power supply design requirements. If the difference in response time between high and low temperatures falls within this range, it indicates that temperature has little impact on protection performance, and the system possesses environmental adaptability.

[0041] As an optional embodiment, before setting the switching period and switching hold time, the method may further include: setting the range of switching current value and the range of switching period value according to the actual number of modules and power change characteristics in the LED screen; and monitoring the power supply output voltage waveform in real time during the switching process to identify whether there is a protection delay.

[0042] In this step, we first analyze the actual number of LED modules in the large LED screen, the impact on total power and power variation characteristics, and the peak power fluctuation range, then determine the reasonable range for the switching current value and switching period. Example: A large LED screen has 100 modules, each with a power of 50W, and a total power fluctuation of ±10%. Therefore, we set the following: Switching current range: 41.2-42.2A; Switching period range: 5-15 seconds, matching the actual start-stop interval of the LED screen modules. During the current switching process, we monitor the power supply output voltage waveform in real time. If the voltage does not immediately drop after the current exceeds the load threshold, and the delay is greater than 0.05s, it is determined that there is a protection delay, and the protection circuit needs to be optimized.

[0043] As an optional embodiment, the method may further include: performing a normality test on the valid dataset and calculating a confidence interval for the overload protection response time; assessing the reliability level of the test results based on the width of the confidence interval, and generating a test report containing statistical characteristics of the response time and a validity judgment.

[0044] In this step, a normality test is first performed on the response time data of the valid dataset. If it conforms to a normal distribution, the confidence interval is then calculated. Example: Valid data are 0.29s, 0.31s, 0.30s, 0.32s, 0.31s, 0.30s, and 0.31s: Normality test: Shapiro-Wilk test p-value = 0.85 > 0.05, indicating the data conforms to a normal distribution; 95% confidence interval: The calculated mean is 0.306s, standard deviation is 0.009s, and the confidence interval is [0.298, 0.314s]. The report must include the statistical characteristics of the response time, including the mean, standard deviation, maximum value, confidence interval, and validity assessment. If the data is normally distributed and the confidence interval is narrow, the test results are reliable.

[0045] As an optional embodiment, the method may further include: setting an overload protection response time threshold and an environmental difference tolerance value; calculating the maximum difference value of the overload protection response time; confirming that the maximum difference value does not exceed the environmental difference tolerance value; and determining that the overload protection performance of the product is qualified when both the overload protection response time requirement and the environmental difference tolerance value are met simultaneously.

[0046] In this step, if the response time in all valid tests is ≤10ms and the difference in response time between extreme conditions and normal temperature conditions is ≤5ms, then the overload protection performance of the tested power supply system is deemed to meet the standard.

[0047] The following specific embodiments further illustrate this application: A power supply system for a certain model of outdoor LED screen was tested; the parameters of the power supply under test were: rated voltage 5V, rated current 40A, overload protection threshold 50A; the test system configuration was as follows: the electronic load was an IT8511 programmable load, the current sensor was an ACS712, and the time recorder was a TDS2024C oscilloscope; the dynamic test process was as follows: the initial load was set to 32A (0.8×40A), and increased to 75A (1.5×50A) at a rate of 5A / s; Record t0 as the moment the current reaches 50A and t1 as the moment the voltage drops to 0. The Δt1 values ​​for the five tests were 3.2ms, 3.1ms, 3.3ms, 3.2ms, and 3.2ms, with an average of 3.2ms. In extreme environment tests: at a low temperature of -10℃, the average Δt2 value was 3.5ms; at a high temperature of 50℃, the average Δt3 value was 3.3ms. In the dynamic jump test, the maximum value of Δt4 was 3.6ms. All response times were ≤10ms, and the fluctuation coefficient was 2.1%, indicating that the overload protection performance of the power supply system met the standards.

[0048] The above are embodiments of the method proposed in this application. Based on the same inventive concept, embodiments of this application also provide a test device for LED large screen power supply overload, the structure of which is as follows: Figure 2 As shown.

[0049] Figure 2 This is a schematic diagram of the internal structure of a power supply overload testing device for an LED large screen, provided as an embodiment of this application. Figure 2 As shown, the device includes:

[0050] At least one processor 201;

[0051] And a memory 202 that is communicatively connected to at least one processor;

[0052] The memory 202 stores instructions executable by at least one processor. These instructions are executed by at least one processor 201 to enable the at least one processor 201 to: based on a pre-set rated voltage, rated current, and overload protection threshold of the power supply under test, and based on the rated current, preset the initial current value of the simulated load; gradually increase the initial current value at a preset rate until it exceeds the overload protection threshold; during the current increase, collect current and voltage data in real time, and record the moment when the current reaches the overload protection threshold as the overload trigger moment and the moment when the voltage suddenly drops to zero as the protection start moment; calculate the time difference between the overload trigger moment and the protection start moment as the overload protection response time of the power supply system; change the temperature value of the test environment to obtain the overload protection response time, and evaluate the protection performance of the power supply system based on the overload protection response time.

[0053] Some embodiments of this application provide corresponding to Figure 1 A non-volatile computer storage medium for testing LED large screen power supply overload stores computer-executable instructions. These instructions are configured to: based on pre-set rated voltage, rated current, and overload protection threshold of the power supply under test, and based on the rated current, preset the initial current value of the simulated load; gradually increase the initial current value at a preset rate until it exceeds the overload protection threshold; during the current increase, collect current and voltage data in real time, and record the moment the current reaches the overload protection threshold as the overload trigger moment, and the moment the voltage suddenly drops to zero as the protection activation moment; calculate the time difference between the overload trigger moment and the protection activation moment as the overload protection response time of the power supply system; change the temperature of the test environment to obtain the overload protection response time, and evaluate the protection performance of the power supply system based on the overload protection response time.

[0054] The various embodiments in this application are described in a progressive manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, the embodiments for IoT devices and media are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions of the method embodiments.

[0055] The systems, media, and methods provided in this application are one-to-one correspondences. Therefore, the systems and media also have similar beneficial technical effects as their corresponding methods. Since the beneficial technical effects of the methods have been described in detail above, the beneficial technical effects of the systems and media will not be repeated here.

[0056] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0057] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0058] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0059] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0060] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0061] Memory may include non-persistent storage in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0062] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0063] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0064] The above description is merely an embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principle of this application should be included within the scope of the claims of this application.

Claims

1. A test method for LED large screen power supply overload, characterized in that, The method includes: Based on the pre-set rated voltage, rated current and overload protection threshold of the power supply under test, and based on the rated current, the initial current value of the simulated load is preset. The initial current value is gradually increased at a preset rate until it exceeds the overload protection threshold. During the current value increase, current and voltage data are collected in real time, and the moment when the current reaches the overload protection threshold is recorded as the overload trigger moment, and the moment when the voltage suddenly drops to zero is recorded as the protection start moment. Calculate the time difference between the overload triggering time and the protection activation time, and use it as the overload protection response time of the power system; The temperature of the test environment is changed to obtain the overload protection response time, and the protection performance of the power supply system is evaluated based on the overload protection response time.

2. The method for testing LED large screen power supply overload according to claim 1, characterized in that, The process of changing the temperature of the test environment, obtaining the overload protection response time, and evaluating the protection performance of the power supply system based on the overload protection response time specifically includes: The test environment temperature is adjusted to a first low temperature and maintained for a first duration to bring the test environment temperature to a stable state. At the first low temperature, the initial current value of the simulated load is gradually increased at a preset rate to obtain the overload protection response time at the first low temperature; The test environment temperature is adjusted to a first high temperature and maintained for a second duration, so that the test environment temperature reaches a stable state. Under the first high temperature, the initial current value of the simulated load is gradually increased at a preset rate to obtain the overload protection response time under the first high temperature environment.

3. The method for testing LED large screen power supply overload according to claim 2, characterized in that, During the rise of the current value, current and voltage data are collected in real time, and the moment when the current reaches the overload protection threshold is recorded as the overload trigger moment, and the moment when the voltage suddenly drops to zero is recorded as the protection start moment. Specifically, this includes: The current of the simulated load is set to periodically change between the initial current value and the tripping current value that is higher than the overload protection threshold, and the tripping period and tripping hold time are set. Within multiple consecutive switching cycles, the overload protection response time is recorded each time the current exceeds the overload protection threshold. The maximum value among the recorded protection response times is selected as the response time evaluation value under the condition of concurrent startup of multiple modules.

4. The method for testing LED large screen power supply overload according to claim 3, characterized in that, The method further includes: Collect the overload protection response times and calculate the average and standard deviation; Data points that deviate from the average value by more than a preset proportion are removed to obtain a valid data set; Calculate the fluctuation coefficient of the valid data set. If the fluctuation coefficient does not exceed a preset threshold, the current test result is determined to be valid.

5. The method for testing LED large screen power supply overload according to claim 2, characterized in that, The process of changing the temperature of the test environment, obtaining the overload protection response time, and evaluating the protection performance of the power supply system based on the overload protection response time specifically includes: Compare the overload protection response times obtained under the first low temperature and the first high temperature environments; If the differences in response time are all within the allowable deviation range, the power supply system is determined to have environmental adaptability.

6. The method for testing LED large screen power supply overload according to claim 3, characterized in that, Before setting the transition period and transition hold time, the method further includes: Based on the actual number of modules and power variation characteristics in the LED screen, the range of the switching current value and the range of the switching period are set. During the transition process, the power supply output voltage waveform is monitored in real time to identify whether there is a protection delay.

7. The method for testing LED large screen power supply overload according to claim 4, characterized in that, The method further includes: Perform a normality test on the valid dataset and calculate the confidence interval for the overload protection response time; The reliability level of the test results is assessed based on the width of the confidence interval, and a test report containing response time statistics and validity judgments is generated.

8. The method for testing LED large screen power supply overload according to claim 4, characterized in that, The method further includes: Set the overload protection response time threshold and environmental difference tolerance value; Calculate the maximum difference in the overload protection response time; Confirm that the maximum difference value does not exceed the environmental difference tolerance value; The product is deemed to have qualified overload protection performance if it simultaneously meets the overload protection response time requirement and the environmental difference tolerance value.

9. A testing device for LED large screen power supply overload, characterized in that, The device includes: At least one processor; And, a memory communicatively connected to the at least one processor; The memory stores instructions executable by the at least one processor, which, when executed by the at least one processor, enable the at least one processor to: Based on the pre-set rated voltage, rated current and overload protection threshold of the power supply under test, and based on the rated current, the initial current value of the simulated load is preset. The initial current value is gradually increased at a preset rate until it exceeds the overload protection threshold. During the current value increase, current and voltage data are collected in real time, and the moment when the current reaches the overload protection threshold is recorded as the overload trigger moment, and the moment when the voltage suddenly drops to zero is recorded as the protection start moment. Calculate the time difference between the overload triggering time and the protection activation time, and use it as the overload protection response time of the power system; The temperature of the test environment is changed to obtain the overload protection response time, and the protection performance of the power supply system is evaluated based on the overload protection response time.

10. A non-volatile computer storage medium for testing the power supply overload of an LED large screen, storing computer-executable instructions, characterized in that, The computer-executable instructions are set as follows: Based on the pre-set rated voltage, rated current and overload protection threshold of the power supply under test, and based on the rated current, the initial current value of the simulated load is preset. The initial current value is gradually increased at a preset rate until it exceeds the overload protection threshold. During the current value increase, current and voltage data are collected in real time, and the moment when the current reaches the overload protection threshold is recorded as the overload trigger moment, and the moment when the voltage suddenly drops to zero is recorded as the protection start moment. Calculate the time difference between the overload triggering time and the protection activation time, and use it as the overload protection response time of the power system; The temperature of the test environment is changed to obtain the overload protection response time, and the protection performance of the power supply system is evaluated based on the overload protection response time.

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