Polymer waveguide loss test tool and test method

Abstract

The invention discloses a test tool and a test method for polymer waveguide loss. The polymer waveguide loss test tool comprises at least one probe and at least one radiation structure, the radiation structure comprises a radiator and a feed part, and the radiator is connected with the feed part; the first end of the probe is used for being in contact with the feed part, and the radiator is used for being coupled with the polymer waveguide; and the test equipment is connected with the second end of the probe and is used for testing the loss of the polymer waveguide. According to the invention, the accuracy of the polymer waveguide loss test and the comprehensiveness of frequency coverage can be improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of waveguide loss testing, and in particular to a polymer waveguide loss testing tool and method. BACKGROUND

[0002] Polymer waveguides can not only transmit light waves, but also millimeter waves, etc. Polymer waveguides are increasingly widely used in modern radio frequency technology, chips, and other fields due to their low cost. Testing of polymer waveguide loss is thus increasingly important.

[0003] In related technologies, when testing polymer waveguide loss, the connection mode of a vector network analyzer and a polymer waveguide is as follows: first, the vector network analyzer is connected with a WR-15 module, so that the vector network analyzer can output a V-band signal; then, the WR-15 module is connected with a circular waveguide converter, which is used to convert the rectangular waveguide interface of the WR-15 into a circular waveguide structure; then, the circular waveguide converter is connected with a customized waveguide converter, which is used to connect with the polymer waveguide and to realize impedance matching and mode conversion. However, the above-mentioned mode is sensitive to assembly and processing, and the modules need to be fixed by bolts, which has high assembly sensitivity, so that the measurement result does not completely match the actual situation and the accuracy is low. Moreover, the loss of low frequency bands (bands less than 55 GHz) cannot be accurately evaluated. SUMMARY

[0004] The present application provides a polymer waveguide loss testing tool and method to improve the accuracy of polymer waveguide loss testing and the comprehensiveness of frequency coverage.

[0005] According to an aspect of the present application, a polymer waveguide loss testing tool is provided, which comprises:

[0006] at least one probe and at least one radiation structure, the radiation structure comprising a radiator and a feed part, the radiator being connected with the feed part; a first end of the probe being used to contact the feed part, and the radiator being used to couple with the polymer waveguide;

[0007] a testing device connected with a second end of the probe, used to test the loss of the polymer waveguide.

[0008] Optionally, the at least one probe comprises a first probe and a second probe, and the at least one radiation structure comprises a first radiation structure and a second radiation structure;

[0009] a first end of the first probe being used to contact the feed part of the first radiation structure, and a radiator of the first radiation structure being used to couple with a first end of the polymer waveguide;

[0010] a first end of the second probe is configured to contact a feeding portion of the second radiating structure, and a radiator of the second radiating structure is configured to couple with a second end of the polymer waveguide;

[0011] the test device is connected with the second end of the first probe and the second end of the second probe.

[0012] Optionally, the radiating structure further comprises a first substrate and a ground layer, the radiator and the ground layer are located on two sides of the first substrate; the feeding portion is in the same layer as the radiator;

[0013] the first end of the probe comprises a signal pin and a ground pin, and the feeding portion comprises a signal portion and a ground portion, the signal portion is connected with the radiator, and the ground portion is connected with the ground layer.

[0014] Optionally, the radiating structure further comprises a microstrip line, the microstrip line is connected between the signal portion and the radiator.

[0015] Optionally, the radiating structure further comprises a tapered waveguide, a first end of the tapered waveguide is fixed on the first substrate and covers the radiator, and a second end of the tapered waveguide is configured to be connected with the polymer waveguide;

[0016] the tapered waveguide comprises a tapered section with a gradually changing cross-sectional area.

[0017] Optionally, the probe comprises a main body portion, a connecting frame and a connecting handle, the connecting handle is fixed to one end of the main body portion, the connecting frame is fixed to the other end of the main body portion, and a plurality of fixing holes are arranged on the connecting frame.

[0018] the first end of the probe and the second end of the probe are fixed on the connecting handle.

[0019] According to another aspect of the present application, there is provided a polymer waveguide loss testing method, which is performed by the polymer waveguide testing device as described above, and comprises the following steps:

[0020] testing the loss of at least two polymer waveguides to be tested;

[0021] determining the loss of the polymer waveguide with a preset length according to the loss of the at least two polymer waveguides to be tested;

[0022] wherein, the step of testing the loss of the polymer waveguide to be tested comprises:

[0023] controlling the radiator to couple with the polymer waveguide to be tested;

[0024] controlling the probe to contact the feeding portion.

[0025] controlling the test device to output a test signal, and testing loss of the polymer waveguide to be tested according to the feedback signal.

[0026] Optionally, the controlling the probe to contact the feeding part comprises:

[0027] controlling the probe to align with the feeding part in a first direction and a second direction, and to separate from the feeding part in a third direction;

[0028] controlling the probe to move along the third direction and contact the feeding part.

[0029] Optionally, the radiation structure further comprises a first substrate and a ground layer, the radiator and the ground layer are located on two sides of the first substrate; a first end of the probe comprises a signal pin and a ground pin, the feeding part comprises a signal part and a ground part, the signal part is connected with the radiator, and the ground part is connected with the ground layer;

[0030] the controlling the radiator to couple with the polymer waveguide to be tested comprises:

[0031] connecting the polymer waveguide to be tested with the radiator;

[0032] Alternatively, the radiation structure further comprises a tapered waveguide, a first end of the tapered waveguide is fixed on the first substrate and covers the radiator, and a second end of the tapered waveguide is used to connect with the polymer waveguide; the tapered waveguide comprises a tapered section with a gradually changing cross-sectional area;

[0033] the controlling the radiator to couple with the polymer waveguide to be tested comprises:

[0034] controlling the polymer waveguide to be tested to be connected to the second end of the tapered waveguide.

[0035] Optionally, the determining the loss of the polymer waveguide of the preset length according to the loss of the at least two polymer waveguides to be tested comprises:

[0036] determining a difference between the loss of the two polymer waveguides to be tested as the loss of the polymer waveguide of the preset length; wherein the preset length is a length difference between the two polymer waveguides.

[0037] The technical scheme of the embodiment of the present application adopts a polymer waveguide loss testing tool which comprises at least one probe and at least one radiation structure, the radiation structure comprises a radiator and a feeding portion, the radiator is connected with the feeding portion; the first end of the probe is used to contact with the feeding portion, and the radiator is used to couple with the polymer waveguide; a testing device is connected with the second end of the probe and is used to test the loss of the polymer waveguide. Since the mechanical connection is not needed, but the electrical connection of the probe and the radiation structure is used, the performance of the contact between the probe and the radiation structure can be ensured to be close each time of testing, so that the accuracy of the testing result is ensured. The probe and the radiation structure can excite a TEM mode electric field at the end face of the polymer waveguide, the electric field can excite a TE mode in the polymer waveguide at a low frequency band, a V wave band, a W wave band, a D wave band and a terahertz wave band, and the reflection and the loss are low, therefore, the testing tool of the embodiment can also improve the comprehensiveness of the frequency coverage.

[0038] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0040] Figure 1 A structural schematic diagram of a polymer waveguide loss testing tool provided by the embodiment of the present application is shown in the figure.

[0041] Figure 2 An exploded view of a radiation structure provided by the embodiment of the present application is shown in the figure.

[0042] Figure 3 A structural schematic diagram of a probe provided by the embodiment of the present application is shown in the figure.

[0043] Figure 4 A local enlarged schematic diagram of a probe provided by the embodiment of the present application is shown in the figure.

[0044] Figure 5 A structural schematic diagram of another polymer waveguide loss testing tool provided by the embodiment of the present application is shown in the figure.

[0045] Figure 6 A structural schematic diagram of a polymer waveguide testing tool when testing a second polymer waveguide to be tested provided by the embodiment of the present application is shown in the figure.

[0046] Figure 7 A test result schematic diagram of a test tool for polymer waveguide loss provided by the embodiment of the present application is shown in the figure;

[0047] Figure 8 A flow chart of a test method for polymer waveguide loss provided by the embodiment of the present application is shown in the figure. DETAILED DESCRIPTION

[0048] In order to make the person skilled in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, not all. Based on the embodiments in the present application, all other embodiments obtained by the person skilled in the art without creative labor should belong to the protection scope of the present application.

[0049] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a chronological sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device including a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0050] Figure 1 A structural schematic diagram of a test tool for polymer waveguide loss provided by the embodiment of the present application is shown in the figure, Figure 2 An exploded view of a radiation structure provided by the embodiment of the present application is shown in the figure, Figure 3 A structural schematic diagram of a probe provided by the embodiment of the present application is shown in the figure, Figure 4 A local enlarged schematic diagram of a probe provided by the embodiment of the present application is shown in the figure, Figures 1 to 4 The test tool includes at least one probe 1, at least one radiation structure 2 and a test device. The radiation structure 2 includes a radiator 21 and a feeding portion 22, and the radiator 21 is connected with the feeding portion 22; the first end of the probe 1 is used to contact with the feeding portion 22, and the radiator 21 is used to couple with the polymer waveguide 3; the test device is connected with the second end of the probe 1, and the test device is used to test the loss of the polymer waveguide.

[0051] Specifically, the test tool of the embodiment is used to test the loss of a polymer waveguide, and can be used to test the loss of the polymer waveguide at a preset waveband and a preset length. The polymer waveguide is, for example, a polymer waveguide that can transmit millimeter waves, the preset waveband is, for example, a V waveband, a W waveband, a D waveband, a terahertz waveband, or a low frequency band smaller than the V waveband, and the preset length is, for example, 5 millimeters, 1000 millimeters, 2000 millimeters, or 3000 millimeters, which are not limited in the embodiment. The polymer waveguide is a non-metal structure. When the polymer waveguide 3 is coupled with the radiator 21 during testing, the testing device can output a test signal, the test signal is transmitted to the radiating structure 2 through the probe 1, and is radiated through the radiator 21. The polymer waveguide receives the test signal radiated by the radiator 21, the test signal is transmitted in the polymer waveguide 3, and returns to the testing device through a return path, so that the testing device can calculate the insertion loss of the polymer waveguide according to the output test signal and the received return signal. In some embodiments, the test tool can include a radiating structure for radiating a test signal, and the radiator 21 in the radiating structure 2 can be understood as a transmitting antenna. In other embodiments, the test tool can also include a radiating structure for receiving a test signal transmitted by the polymer waveguide, and the radiator 21 in the radiating structure 2 can be understood as a receiving antenna. It can be understood that the test signal is a sweep signal with a certain power at a preset waveband.

[0052] The probe 1 is, for example, a coplanar waveguide probe. When the probe 1 is in contact with the radiating structure 2, the contact position of the probe 1 and the feeding portion 22 on the radiating structure 2 can be accurately controlled by using a microscope, and the contact pressure can be accurately controlled, so that the electrical performance consistency of the probe 1 and the radiating structure 2 is high during each test. When the electrical connection performance of the probe 1 and the radiating structure 2 is consistent, the consistency of the signal radiated by the radiator 21 is also high, and the consistency of the signal coupled into the polymer waveguide is also high. In addition, the probe 1 has low insertion loss (such as insertion loss less than 0.5 dB) and minimum parasitic effect, and micro-coaxial integration can be used to reduce signal reflection and radiation leakage, thereby further improving the repeatability. In contrast, in the related art, the WR-15 module and the circular waveguide converter are mechanically connected, and the circular waveguide converter and the custom waveguide converter are also mechanically connected. When mechanically connected, a small deviation will excite high-order modes, increasing the insertion loss and reflection. When repeatedly testing, it is difficult to ensure that the state of mechanical connection is consistent each time, and therefore, the related art has high sensitivity to assembly. In the embodiment, mechanical connection is not required, and the probe 1 and the radiating structure 2 are electrically connected, and the test signal is coupled into the polymer waveguide 3 by radiating electromagnetic waves through the radiator 21. The sensitivity of the probe 1 and the radiating structure 2 in contact is low, that is, the performance of the probe 1 and the radiating structure 2 in contact can be ensured to be close during each test, thereby ensuring the accuracy of the test results.

[0053] In addition, the related art custom waveguide converter converts the mode transmitted in the metal waveguide into the mode transmitted in the dielectric waveguide, and the conversion efficiency of the structure is good at a specific frequency. However, for a low frequency band, the wavelength of the electromagnetic wave is long, and the mode conversion effect is poor, which may excite high-order modes or radiation modes, so that the test result is inaccurate. In the embodiment, the probe 1 and the radiation structure 2 can excite an electric field of a TEM mode at the end face of the polymer waveguide, the electric field excites a TE mode in the polymer waveguide, and the reflection and loss are low. Even at a low frequency band, a stable TE mode can be excited in the polymer waveguide, and the high-order mode decays quickly and will not be transmitted in the polymer waveguide. Therefore, the test tool of the embodiment can also improve the comprehensiveness of the frequency coverage.

[0054] The technical scheme of the embodiment adopts a test tool for polymer waveguide loss, which includes at least one probe and at least one radiation structure. The radiation structure includes a radiator and a feeding portion, and the radiator is connected with the feeding portion. The first end of the probe is used to contact the feeding portion, and the radiator is used to couple with the polymer waveguide. A test device is connected with the second end of the probe and is used to test the loss of the polymer waveguide. Since the electrical connection of the probe and the radiation structure is used instead of mechanical connection, the performance of the contact between the probe and the radiation structure can be ensured to be close during each test, thereby ensuring the accuracy of the test result. The probe and the radiation structure can excite an electric field of a TEM mode at the end face of the polymer waveguide. The electric field can excite a TE mode in the polymer waveguide at a low frequency band, a V band, a W band, a D band, and a terahertz band, and the reflection and loss are low. Therefore, the test tool of the embodiment can also improve the comprehensiveness of the frequency coverage.

[0055] Optionally, Figure 5 Another structure schematic diagram of a test tool for polymer waveguide loss provided by the embodiment of the present application is shown in FIG. 3. Figure 5 In the polymer waveguide in Figure 5 The polymer waveguide in the embodiment is, for example, a first polymer waveguide to be tested 31. The at least one probe includes a first probe 1A and a second probe 1B, and the at least one radiation structure includes a first radiation structure 2A and a second radiation structure 2B. The first end of the first probe 1A is used to contact the feeding portion of the first radiation structure 2A, and the radiator of the first radiation structure 2A is used to couple with the first end of the polymer waveguide. The first end of the second probe 1B is used to contact the feeding portion of the second radiation structure 2B, and the radiator of the second radiation structure 2B is used to couple with the second end of the polymer waveguide. The test device is connected with the second end of the first probe 1A and the second end of the second probe 1B.

[0056] Specifically, in the embodiment, probes and radiation structures are used in both the transmission path and the return path of the test signal. For example, the first probe 1A is connected to the signal output end of the test device, and the signal output by the test device is coupled to the first radiation structure 2A through the first probe 1A, the radiators of the first radiation structure 2A excite a TEM mode electric field at the first end of the first polymer waveguide 31 to be tested, and then excite a TE mode inside the first polymer waveguide 31 to be tested. The TE mode at the second end of the first polymer waveguide 31 to be tested in turn excites a TEM mode electric field on the second radiation structure 2B, the TEM mode is transmitted in the second radiation structure 2B, and then transmitted to the signal input end of the test device through the second probe 1B, and the test device compares the output signal with the input signal to obtain the insertion loss of the first polymer waveguide 31 to be tested. In the embodiment, the transmission path and the return path of the test signal both include probes and radiation structures, which ensures that the repeatability and bandwidth of the transmission path and the return path are high. Of course, in other embodiments, the first probe 1A and the first radiation structure 2A can be used as the return path, and the second probe 1B and the second radiation structure 2B can be used as the transmission path.

[0057] Optionally, in the above-mentioned embodiments, the test device can be a vector network analyzer. The test device can test the S parameters of the polymer waveguide, and the S parameters can be S11 parameters or S21 parameters.

[0058] Optionally, in some embodiments, the loss of the polymer waveguide at a preset length can be obtained by testing the losses of at least two polymer waveguides with different lengths. The preset length is the length difference between the two polymer waveguides. By the above-mentioned method, the interference terms such as the coupling loss between the probe 1 and the radiation structure 2 can be eliminated, so that the final result is the loss of the polymer waveguide. More specifically, Figure 6 A structure diagram of a test tool for testing a polymer waveguide according to an embodiment of the present application when testing a second polymer waveguide to be tested, Figure 5 It can be understood that the structure diagram of the test tool when testing a first polymer waveguide to be tested. The lengths of the first polymer waveguide to be tested 31 and the second polymer waveguide to be tested 32 are different, for example, the length of the first polymer waveguide to be tested 31 is L1, and the length of the second polymer waveguide to be tested 32 is L2, and the length difference between the two is |L1-L2|. The loss of the first polymer waveguide to be tested 31 obtained by the test tool is S(1), and the loss of the second polymer waveguide to be tested 32 is S(2), and then the loss of the polymer waveguide when the length is |L1-L2| is |S(1)-S(2)|. In some embodiments, the losses of multiple polymer waveguides to be tested can be tested, and the losses of the polymer waveguide at different lengths can be fitted according to the length difference.

[0059] Optionally, referring to Figures 2 to 4 , the radiation structure 2 further comprises a first substrate 23 and a ground layer 24, the radiator 21 and the ground layer 24 are located on two sides of the first substrate 23, and the feeding part 22 is in the same layer as the radiator 21; the first end of the probe 1 comprises a signal pin 11 and a ground pin 12, the feeding part 22 comprises a signal part 221 and a ground part 222, the signal part 221 is connected with the radiator 21, and the ground part 222 is connected with the ground layer 24.

[0060] Specifically, the probe of the embodiment is, for example, a GSG probe, which comprises one signal pin 11 and two ground pins 12, the two ground pins 12 are respectively located on two sides of the signal pin 11, the signal pin 11 is used for transmitting a radio frequency or millimeter wave signal, and the two ground pins 12 are used for providing a ground path to reduce electromagnetic interference and parasitic capacitance, thereby ensuring signal integrity. The two ground pins 12 and the signal pin 11 form a triangular layout to constitute a coplanar waveguide structure. The GSG probe is a micro-coaxial structure, that is, the signal pin 11 and the two ground pins 12 are connected with corresponding structures in a coaxial line, and are all manufactured through a chip process, thereby realizing integration and miniaturization and reducing signal leakage. In some embodiments, the spacing between the signal pin 11 and the ground pin 12 can be 100 microns to 250 microns.

[0061] The first substrate 23 can play an insulating and supporting role to insulate the radiator 21 and the ground layer 24. The signal part 221 in the feeding part 22 can be a pad, and the ground part 222 can also be a pad. The signal part 221 is used for contacting the signal pin 11, and the ground part 222 is used for contacting the ground pin 12. The spacing between the signal part 221 and the ground part 222 can be the same as the spacing between the signal pin 11 and the ground pin 12. The signal part 221 and the ground part 222 can both be rectangular structures. The radiator 21 and the ground layer 24 are located on two sides of the substrate, so that the radiated signal has strong directivity, facilitating excitation of corresponding electromagnetic waves in a polymer waveguide. The first substrate 23 is, for example, a PTFE (Poly tetra fluoroethylene) substrate.

[0062] Optionally, in some embodiments, the radiation structure further comprises a second substrate 25, which is arranged on a side of the ground layer 24 away from the first substrate 23. The second substrate 25 plays a protective role to avoid damage caused by exposure of the ground layer. The second substrate 25 is, for example, a PTFE substrate.

[0063] In some embodiments, the radiation structure can adopt a PCB (Printed Circuit Board) structure.

[0064] Optionally, continuing to refer to Figure 2The radiation structure 2 further comprises a microstrip line 26 connected between the signal part and the radiator 21.

[0065] In particular, the microstrip line 26 can be used for impedance matching, matching the impedance of the whole after the polymer waveguide is coupled with the radiator 21 to the impedance of the probe, for example to 50 ohms, so as to ensure efficient transmission of the signal. In some embodiments, the coupling of the polymer waveguide and the radiation structure can be directly connecting the end face of the polymer waveguide with the radiator 21, for example aligning the two. The impedance of the radiator 21 and the impedance of the polymer waveguide can be matched by setting the size and shape of the radiator 21 and other parameters, so as to ensure efficient transmission of the signal. When the polymer waveguide and the radiator 21 are coupled, the impedance of the whole of the polymer waveguide and the radiator 21 and the impedance of the probe can not be matched, and therefore the impedance matching can be achieved by the microstrip line 26, so as to ensure efficient transmission of the test signal after the polymer waveguide is coupled. When the end face of the polymer waveguide is directly connected with the radiator 21 for testing the polymer waveguide, the influence of mechanical stress on the flexible polymer waveguide can be reduced due to the low contact between the polymer waveguide and the radiator 21, that is, no need to be fixed by bolts or the like.

[0066] Optionally, in some embodiments, as shown in Figure 2 The radiation structure 2 further comprises a tapered waveguide 27, a first end of the tapered waveguide 27 is fixed on the first substrate 23 and covers the radiator 21, and a second end of the tapered waveguide 27 is used for connecting with the polymer waveguide, the tapered waveguide 27 comprises a tapered section 271 with a gradually changing cross-sectional area.

[0067] In particular, the tapered waveguide 27 is a hollow tubular structure, and the impedance of the tapered section 271 is gradually changed, so as to achieve impedance matching between the radiator 21 and the polymer waveguide. As shown in Figure 2 and Figure 5 The tapered section 271 can be a bent structure, facilitating installation of the polymer waveguide. In addition, the tapered waveguide 27 also has the function of fixing, for fixing the polymer waveguide. In some embodiments, the material of the tapered waveguide 27 can be non-metallic, for example, it can also be a polymer waveguide. In other embodiments, the tapered waveguide 27 can also be a metal waveguide.

[0068] As shown in Figure 2As shown, the end of the tapered waveguide 27 connected with the first substrate 23 is provided with an opening 272 for isolating the tapered waveguide 27 from the radiator 21 or the microstrip line 26, so as to avoid the contact between the tapered waveguide 27 and the radiator 21 or the microstrip line 26. After the assembly is completed, the radiator 21 is located in the hollow part of the tapered waveguide 27, i.e. the radiator 21 is located in the orthographic projection of the tapered waveguide 27 on the first substrate 23. In this embodiment, the radiator does not need to be in contact with the polymer waveguide when the polymer waveguide is tested, the damage to the polymer waveguide is smaller, and the mechanical stress on the polymer waveguide is also smaller.

[0069] Optionally, referring to Figure 3 , the probe 1 comprises a main body 13, a connecting frame 14 and a connecting handle 15; the connecting handle 15 is fixed to one end of the main body 13, and the connecting frame 14 is fixed to the other end of the main body 13; the connecting frame 14 is provided with a plurality of fixing holes 141; the first end and the second end of the probe are fixed on the connecting handle 15.

[0070] Specifically, the main body 13 is used for fixing the signal needle 11 and the ground needle 12, and provides mechanical stability and fine adjustment capability. The main body 13 can be a rectangular or conical structure. The supporting frame 14 is, for example, a rectangular structure, and the fixing holes 141 therein can be used to fix the probe 1 on a probe table, so as to ensure the accurate movement of the probe in three directions in three-dimensional space. The connecting handle 15 is used for fixing the first end and the second end of the probe, and a coaxial line 16 can be arranged in the connecting handle 15, and the first end and the second end of the probe are electrically connected through the coaxial line 16. Of course, the first end and the second end of the probe can also be connected through a microstrip line. The connecting handle 15 can be arranged at an angle with the arrangement direction of the main body 13 and the connecting frame 14, and at this time, the signal needle and the ground needle also present a corresponding angle with the radiating structure, which reduces the damage to the radiating structure and can improve the stability of the contact; the angle can be 45 degrees.

[0071] Exemplarily, Figure 7 a test result schematic diagram of the test tool for the loss of the polymer waveguide provided by the embodiments of the present application is shown in Figure 7 , the corresponding loss when the length of the polymer waveguide is 5 mm, 1000 mm, 2000 mm and 3000 mm is shown, the actual test result is close to the simulation result; and the test can be performed in a wider frequency range.

[0072] Based on the same inventive concept, the present application also provides a test method for the loss of a polymer waveguide, which is executed by the test device provided by any of the embodiments of the present application, as shown in Figure 8 , a flow chart of the test method for the loss of a polymer waveguide provided by the embodiments of the present application is shown in Figure 8 . The test method comprises:

[0073] In step S101, the loss of at least two polymer waveguides to be tested is tested; wherein the loss of the at least two polymer waveguides to be tested is tested by: controlling the radiation body to be coupled with the polymer waveguide to be tested; controlling the probe to be in contact with the feeding portion; controlling the testing device to output a testing signal, and testing the loss of the polymer waveguide to be tested according to the feedback signal.

[0074] Specifically, the length of each polymer waveguide to be tested is different, the loss of the at least two polymer waveguides to be tested can be tested in turn, and each polymer waveguide to be tested can be tested multiple times. When testing, the radiation body can be coupled with the polymer waveguide to be tested by manual or machine. The probe can be controlled to be in contact with the feeding portion by manual or machine, for example, the probe is moved under a microscope to make the probe in precise contact with the feeding portion. The sequence of the step of controlling the radiation body to be coupled with the polymer waveguide to be tested and the step of controlling the probe to be in contact with the feeding portion is not limited, and the two steps can be performed simultaneously. When the coupling of the radiation body with the polymer waveguide to be tested is completed and the contact of the probe with the feeding portion is also completed, the polymer waveguide to be tested can be tested by using the testing device to obtain the loss of the polymer waveguide to be tested.

[0075] In step S102, the loss of the polymer waveguide with the preset length is determined according to the loss of the at least two polymer waveguides to be tested.

[0076] Specifically, by detecting the loss of the at least two polymer waveguides to be tested, the interference terms such as the coupling loss between the probe and the radiation structure are eliminated, so that the final result is the loss of the polymer waveguide.

[0077] The technical scheme of the embodiment adopts a testing method of a polymer waveguide, which includes: testing the loss of at least two polymer waveguides to be tested; determining the loss of the polymer waveguide with the preset length according to the loss of the at least two polymer waveguides to be tested; wherein the loss of the polymer waveguide to be tested is tested by: controlling the radiation body to be coupled with the polymer waveguide to be tested; controlling the probe to be in contact with the feeding portion; controlling the testing device to output a testing signal, and testing the loss of the polymer waveguide to be tested according to the feedback signal. Since mechanical connection is not required, but electrical connection of the probe and the radiation structure is utilized, the performance of the contact between the probe and the radiation structure can be ensured to be close during each test, thereby ensuring the accuracy of the test result. The probe and the radiation structure can excite a TEM mode electric field at the end face of the polymer waveguide, the electric field can excite a TE mode in the polymer waveguide at a low frequency band, a V wave band, a W wave band, a D wave band and a terahertz wave band, and the reflection and the loss are low, therefore, the testing tool of the embodiment can also improve the comprehensiveness of the frequency coverage.

[0078] Optionally, the controlling the probe to be in contact with the feeding portion includes:

[0079] controlling the probe to align with the feed in the first direction and the second direction and to separate in the third direction;

[0080] Specifically, the first direction and the second direction are horizontal directions, and the third direction is a vertical direction. This step can be understood as an initial alignment of the probe and the feed. As shown in FIG. 1, the main body 13 and the connecting frame 14 can control the probe 1 to be accurately positioned in the first direction, the second direction, and the third direction, thereby ensuring that the first end of the probe is aligned with the center of the feed. In this step, the probe can be quickly moved above the feed, thereby improving the testing efficiency. Figure 3

[0081] controlling the probe to move along the third direction and to contact the feed.

[0082] Specifically, this step can be understood as an accurate alignment, that is, the probe 1 is slowly moved in the third direction, and whether the probe contacts the feed is observed through a microscope. When the probe contacts the feed, the signal needle 11 and the ground needle 12 will be deformed to a certain extent, and whether the probe contacts the feed can be determined by judging whether the signal needle 11 and the ground needle 12 are deformed. In some embodiments, a spring or a fine adjustment control unit is arranged inside the probe to control the contact force between the probe and the feed (for example, adjusted in the range of 1 gram to 5 grams) to avoid damaging the radiation structure. When the contact is completed, signal transmission can be performed to test the S parameters of the polymer waveguide to be tested.

[0083] Optionally, in some embodiments, the method further comprises:

[0084] connecting the polymer waveguide to be tested to the radiator.

[0085] Specifically, this embodiment can be to directly align and connect the end face of the polymer waveguide to be tested to the radiator. The size and shape of the radiator 21 can be set to match the impedance of the radiator 21 and the impedance of the polymer waveguide, thereby ensuring efficient transmission of signals. Directly connecting the polymer waveguide to be tested to the radiator does not require the use of other fixing structures, and the connection method is simple, which is conducive to improving the testing efficiency.

[0086] Optionally, in other embodiments, the method further comprises:

[0087] controlling the polymer waveguide to be tested to be connected to the second end of the tapered waveguide.

[0088] ​Specifically, after the gradient waveguide is set, the polymer waveguide to be tested is fixedly connected with the gradient waveguide. The gradient waveguide can fix the polymer waveguide to be tested and also can position the polymer waveguide to be tested. That is, the relative position of the end face of the polymer waveguide to be tested and the radiator is relatively consistent each time of testing, so that the repeatability of the test can be further improved.

[0089] Optionally, determining the loss of the polymer waveguide of the preset length according to the losses of the at least two polymer waveguides to be tested comprises:

[0090] The difference between the losses of the two polymer waveguides to be tested is taken as the loss of the polymer waveguide of the preset length, and the preset length is the length difference between the two polymer waveguides to be tested.

[0091] Specifically, the length of the first polymer waveguide to be tested 31 is L1 for example, and the length of the second polymer waveguide to be tested 32 is L2 for example, and the length difference between the two is |L1-L2|. The loss of the first polymer waveguide to be tested 31 obtained by the test tool is S(1) for example, and the loss of the second polymer waveguide to be tested 32 is S(2) for example, and then the loss of the polymer waveguide of the length |L1-L2| is |S(1)-S(2)|. In some embodiments, the losses of multiple polymer waveguides to be tested can be tested, and the losses of the polymer waveguide at different lengths can be fitted according to the length difference. Of course, the loss of the polymer waveguide per unit length can also be obtained according to the loss difference and the length difference, that is, the ratio of the loss difference and the length difference represents the loss per unit length.

[0092] Optionally, the test method of the polymer waveguide further comprises:

[0093] The probe is calibrated. The calibration can specifically include SOLT (Short, Open, Load, Through) calibration. By calibrating the interface between the probe and the polymer waveguide, it is ensured that the measured S parameter reflects the characteristics of the polymer waveguide itself, rather than the parasitic effect of the probe or the connecting part. A corresponding standard can be used during calibration. It can be understood that the port spacing on the standard required for calibration is the same as the spacing between the signal pin and the ground pin in the probe.

[0094] When open calibration is performed, the probe is connected to an open standard, and the open reflectance is measured to calibrate for stray capacitance and radiation effects; when short calibration is performed, the probe is connected to a short standard to correct for reflection phase errors; when load calibration is performed, the near-zero reflectance is measured to correct for impedance mismatch and noise; and when through calibration is performed, the transmission response is measured to correct for insertion loss and phase delay. It is noted that the angle between the connecting stem and the calibration standard is the same as the angle between the connecting stem and the radiating body when the probe is calibrated. Calibration is performed prior to damage testing of the polymer waveguide under test.

[0095] It should be understood that the various forms of flow shown above can be reordered, added to, or deleted from without departing from the scope of the present application. For example, the steps recited in the application can be performed in parallel, in series, or in a different order, as long as the desired results of the technical solutions of the present application are achieved, which are not limited herein.

[0096] The above detailed description does not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A testing fixture for polymer waveguide loss, characterized in that, The test tool for the polymer waveguide loss comprises: at least one probe and at least one radiation structure, the radiation structure comprising a radiator and a feed part, the radiator being connected with the feed part; the first end of the probe being used to contact the feed part, and the radiator being used to couple with the polymer waveguide; a test device connected with the second end of the probe, and used to test the loss of the polymer waveguide.

2. The test tool for testing the loss of a polymer waveguide according to claim 1, wherein, The at least one probe comprises a first probe and a second probe, and the at least one radiation structure comprises a first radiation structure and a second radiation structure; the first end of the first probe is used to contact the feed part of the first radiation structure, and the radiator of the first radiation structure is used to couple with the first end of the polymer waveguide; the first end of the second probe is used to contact the feed part of the second radiation structure, and the radiator of the second radiation structure is used to couple with the second end of the polymer waveguide; the test device is connected with the second end of the first probe and the second end of the second probe.

3. The test tool for testing the loss of a polymer waveguide according to claim 1, wherein The radiation structure further comprises a first substrate and a ground layer, the radiator and the ground layer being located on both sides of the first substrate; and the feed part is in the same layer as the radiator; the first end of the probe comprises a signal pin and a ground pin, and the feed part comprises a signal part and a ground part, the signal part being connected with the radiator, and the ground part being connected with the ground layer.

4. The test tool for testing the loss of a polymer waveguide according to claim 3, wherein The radiation structure further comprises a microstrip line, which is connected between the signal part and the radiator.

5. The test tool for testing the loss of a polymer waveguide according to claim 3, wherein The radiation structure further comprises a tapered waveguide, the first end of the tapered waveguide being fixed on the first substrate and covering the radiator, and the second end of the tapered waveguide being used to connect with the polymer waveguide; the tapered waveguide comprises a tapered section with a gradually changing cross-sectional area.

6. The test tool for testing loss of a polymer waveguide according to claim 1, wherein The probe comprises a main body part, a connecting frame and a connecting handle; the connecting handle is fixed on one end of the main body part, and the connecting frame is fixed on the other end of the main body part; and a plurality of fixing holes are arranged on the connecting frame. The first end of the probe and the second end of the probe are fixed on the connecting handle.

7. A method of testing the loss of a polymer waveguide, performed by the testing device of any one of claims 1-6, characterized in that, The test method for the polymer waveguide comprises: testing the loss of at least two polymer waveguides to be tested; determining the loss of the polymer waveguide with a preset length according to the loss of the at least two polymer waveguides to be tested; wherein the testing of the loss of the polymer waveguide to be tested comprises: controlling the coupling of the radiator with the polymer waveguide to be tested; controlling the contact of the probe with the feed part; controlling the test device to output a test signal and test the loss of the polymer waveguide to be tested according to a feedback signal.

8. The test method for the polymer waveguide loss according to claim 7, wherein the controlling of the contact of the probe with the feed part comprises: controlling the alignment of the probe with the feed part in a first direction and a second direction, and the separation of the probe from the feed part in a third direction; controlling the movement of the probe along the third direction and the contact of the probe with the feed part.

9. The method of claim 7, wherein the polymer waveguide loss is measured by, The radiation structure further comprises a first substrate and a ground layer, the radiator and the ground layer are located on two sides of the first substrate; the first end of the probe comprises a signal pin and a ground pin, the feeding part comprises a signal part and a ground part, the signal part is connected with the radiator, and the ground part is connected with the ground layer; The control of the coupling of the radiator and the polymer waveguide to be tested comprises: connecting the polymer waveguide to be tested with the radiator; Alternatively, the radiation structure further comprises a tapered waveguide, a first end of the tapered waveguide is fixed on the first substrate and covers the radiator, and a second end of the tapered waveguide is used for connecting with the polymer waveguide; the tapered waveguide comprises a tapered section with a gradually changing cross-sectional area; The control of the coupling of the radiator and the polymer waveguide to be tested comprises: controlling the polymer waveguide to be tested to be connected to the second end of the tapered waveguide.

10. The method of claim 7, wherein, The determination of the loss of the polymer waveguide of the preset length according to the losses of the at least two polymer waveguides to be tested comprises: the difference between the losses of the two polymer waveguides to be tested is taken as the loss of the polymer waveguide of the preset length; wherein, the preset length is the length difference of the two polymer waveguides.

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