Metal dust analysis system and metal dust analysis method

Abstract

Disclosed herein is a metal dust analysis system according to an exemplary embodiment of the present disclosure, comprising: a dust analysis section wherein the dust analysis section is configured to: generate an X-ray transmission image of each sample and a reference sample; processing the X-ray transmission image of the sample to generate mapped image data of the sample in which metal dust having a diameter within a predetermined range is selectively displayed; and generating component analysis data for each of the metal dusts identified in the mapped image data.

Description

Technical Field

[0001] This application claims the benefit of Korean Patent Application No. 10-2024-0039773, filed on March 22, 2024, the disclosure of which is incorporated herein by reference.

[0002] This disclosure relates to a metal dust analysis system and method that can detect metal dust in various dusts dispersed in electrode manufacturing facilities or manufacturing sites, analyze the composition of the detected metal dust, quantitatively determine the distribution level of the metal dust, and qualitatively analyze the distribution level by type. Background Technology

[0003] In recent years, rechargeable batteries have been widely used as an energy source for wireless mobile devices. They have also gained attention as an energy source for electric vehicles and hybrid electric vehicles, which have been proposed as a way to address air pollution from conventional gasoline and diesel vehicles using fossil fuels. Therefore, the types of applications using rechargeable batteries are diversifying due to their advantages, and it is expected that they will be applied to even more fields and products in the future.

[0004] Based on the shape of the battery casing, these secondary batteries are classified as: cylindrical batteries and prismatic batteries, in which the electrode assembly is embedded in a cylindrical or prismatic metal can; and pouch batteries, in which the electrode assembly is embedded in a pouch-shaped casing of aluminum laminate, and the electrode assembly embedded in the battery casing is a power generation device capable of being charged and discharged and having a positive electrode, a negative electrode, and a separator structure between the positive and negative electrodes.

[0005] The positive and negative electrodes are manufactured through the following operations: applying a positive electrode slurry containing positive electrode active material and a negative electrode slurry containing negative electrode active material to a positive electrode current collector and a negative electrode current collector, respectively, to form a positive electrode active material layer and a negative electrode active material layer; a coating process of drying the positive electrode slurry and the negative electrode slurry; a rolling process of rolling the dried electrodes; and a grooving and cutting process of forming electrode sheets and stamping them into individual electrodes.

[0006] In various manufacturing facilities used in the series of processes for manufacturing electrodes, various types of dust, both metallic and non-metallic, may be present. This dust may be incorporated into the electrodes during the manufacturing process, and the inclusion of dust in the electrodes may lead to performance degradation of the battery. In particular, metallic dust may grow into dendrites, which can cause internal short circuits in the secondary battery, resulting in battery failure, damage, or even fire.

[0007] Therefore, it is necessary to quantitatively identify the distribution levels of metal dust, especially among the various types of dust present in manufacturing facilities such as coating facilities, drying facilities, rolling facilities, grooving facilities, and slitting and cutting facilities, and it is also necessary to manage the dust levels in manufacturing facilities. However, existing technologies for detecting or analyzing metal dust in the field of secondary batteries are limited to detecting and analyzing dust in products (batteries), and there is no standardized method for rapidly detecting and quantifying dust—especially metal dust—in electrode manufacturing facilities. Furthermore, conventional methods for detecting and analyzing dust require capturing them with tape and then analyzing them with scanning electron microscopy (SEM) or X-ray fluorescence (XRF), which is very time-consuming, unclear in identifying metallic components, and inaccurate in measuring dust size.

[0008] Therefore, there is a need to develop a standardized method for detecting metal dust, as well as analytical methods that include this method, to improve electrode quality.

[0009] Existing technology

[0010] (Patent Document 0001) Korean Patent Publication No. 10-2022-0111364 Summary of the Invention

[0011] Technical issues

[0012] The technical problem sought to be solved by this disclosure is to provide a standardized analysis system and method for selectively detecting, quantifying, and analyzing the composition of metal dust of a predetermined size range among various types of dust present in electrode manufacturing facilities or electrode manufacturing sites.

[0013] This disclosure also aims to provide an analytical system and method for automating the process of detecting and quantitatively / qualitatively analyzing metal dust.

[0014] Technical solution

[0015] According to an exemplary embodiment of the present disclosure, a metal dust analysis system is provided. The analysis system includes a dust analysis unit configured to: generate X-ray transmission images of each sample and a reference sample; generate mapping image data of the sample by processing the X-ray transmission images of the samples, selectively displaying metal dust particles with diameters within a predetermined range in the mapping image data; and generate component analysis data for each metal dust particle identified in the mapping image data.

[0016] In an exemplary embodiment, the dust analysis unit may be configured to utilize X-ray transmission image information of a reference sample when establishing a numerical range for the diameter of the metal dust to be detected in the sample.

[0017] In an exemplary embodiment, the dust analysis unit may be configured to perform image processing on the X-ray transmission image of the sample based on the size information of the X-ray transmission image of the reference sample.

[0018] In an exemplary embodiment, the dust analysis unit may be configured to filter out metallic dust with a diameter outside a predetermined range from the X-ray transmission image of the sample based on the size information of the X-ray transmission image of the reference sample.

[0019] In an exemplary embodiment, the dust analysis unit can be configured to generate high-magnification X-ray transmission images or high-magnification mapping image data.

[0020] In an exemplary embodiment, the dust analysis unit may be configured to assign an identification code to each metal dust particle selected from the mapped image data, and to generate component analysis data for each identification code.

[0021] In an exemplary embodiment, the dust analysis unit may be configured to automatically calculate the quantity and / or the corresponding size of the metal dust based on the mapped image data.

[0022] In an exemplary embodiment, the component analysis data may include X-ray fluorescence spectra.

[0023] Preferably, the dust analysis unit includes:

[0024] The stage is configured to hold the sample and the reference sample;

[0025] The X-ray transmission image generation module is configured to irradiate a sample and a reference sample fixed on a stage with X-rays, detect the X-ray transmission signal that passes through them, and generate an X-ray transmission image based on the detected signal.

[0026] An image processing module is configured to perform image processing on X-ray transmission images to generate mapped image data; and

[0027] The component analysis module is configured to generate component analysis data based on X-ray fluorescence analysis of each metal dust particle visible in the mapped image data.

[0028] The analysis system according to an exemplary embodiment may further include: a database unit for storing various data received from the dust analysis unit; an input unit configured to input various conditions for the dust analysis unit to detect, image process, analyze components, and process data of metal dust; and an output unit configured to output mapped image data and component analysis data.

[0029] In an exemplary embodiment, the reference sample is metal, wherein the sample is capture paper on which dust captured from the electrode manufacturing facility or manufacturing site has been transferred, wherein the inspection can be configured to be performed with the reference sample and the sample set in the same plane such that they do not overlap.

[0030] According to other embodiments of this disclosure, a method for analyzing metal dust is provided. The method includes: producing a sample by capturing dust from an electrode manufacturing facility or manufacturing site; generating a reference sample and corresponding X-ray transmission images of the sample using an X-ray dust analysis system; selecting metal dust particles with diameters within a predetermined range from the X-ray transmission images of the sample using information from the X-ray transmission images of the reference sample, and generating mapping image data of the sample in which the selected metal dust particles are identified; and performing component analysis on each metal dust particle identified in the mapping image data to collect component analysis data.

[0031] In an exemplary embodiment, the process of producing a sample may include: a primary capture process in which a dust-cleaning roller is rolled on the surface of a test article and dust present on the surface of the test article is captured onto the dust-cleaning roller; and a secondary capture process in which the dust adhering to the dust-cleaning roller is transferred to the capture paper by rolling the initially rolled dust-cleaning roller a second time onto the capture paper. Here, the adhesive component of the capture paper has a greater adhesive strength than the adhesive component of the dust-cleaning roller.

[0032] In an exemplary embodiment, the dust analysis system includes a dust analysis unit, which can be configured to: generate X-ray transmission images of each sample and a reference sample; generate mapping image data of the sample by processing the X-ray transmission images of the sample, selectively displaying metal dust with diameters within a predetermined range in the mapping image data; and generate component analysis data for each metal dust identified in the mapping image data.

[0033] In an exemplary embodiment, the dust analysis unit may be configured to perform image processing on the X-ray transmission image of the sample based on the size information of the X-ray transmission image of the reference sample.

[0034] In an exemplary embodiment, the component analysis data may include X-ray fluorescence spectra.

[0035] Beneficial effects

[0036] According to this disclosure, a dust analysis system and method are provided that automate the process of selecting metal dust particles of a predetermined size range from metal dust particles of various sizes, generating mapping image data indicating the location of the dust particles, and generating component analysis data for each metal dust particle in the metal dust particles based on the mapping image data.

[0037] According to this disclosure, a standardized method is provided for quantifying distribution levels and determining the composition of various types and sizes of metal dust present in electrode manufacturing facilities or manufacturing sites.

[0038] According to this disclosure, compositional analysis is performed only on metal dust with a predetermined size range, and the analysis can be completed quickly, which is beneficial for timely response when analyzing the cause of defects.

[0039] According to this disclosure, an identification code is assigned to each metal dust particle identified in the mapped image data, and compositional analysis data is generated and managed based on the identification code, thereby facilitating data management. Attached Figure Description

[0040] Figure 1 This is a schematic diagram of an analysis system according to an exemplary embodiment of the present disclosure.

[0041] Figure 2 This is a block diagram of a dust analysis unit according to an exemplary embodiment of the present disclosure.

[0042] Figure 3 It is an X-ray transmission image of a reference sample generated according to exemplary embodiments of the present disclosure.

[0043] Figure 4 yes Figure 3 Enlarged image.

[0044] Figure 5 Mapped image data according to an exemplary embodiment is shown.

[0045] Figure 6 This is a flowchart illustrating an analysis method according to an exemplary embodiment of the present disclosure.

[0046] Figure 7 This is a flowchart illustrating a process for preparing a sample according to an exemplary embodiment of the present disclosure.

[0047] Figure 8 This is a diagram illustrating the initial capture process according to an exemplary embodiment of the present disclosure.

[0048] Figure 9 This is a diagram illustrating a secondary capture process according to an exemplary embodiment of the present disclosure.

[0049] Figure 10This is a diagram illustrating how a sample and a reference sample, according to an exemplary embodiment of the present disclosure, are mounted on a stage.

[0050] [Description of reference numerals in the attached figures]

[0051] 10: Samples, capture paper

[0052] 20: Reference Sample

[0053] 100: Metal Dust Analysis System

[0054] 110: Dust Analysis Department

[0055] 120: Database Department

[0056] 130: Input Section

[0057] 140: Output Department Detailed Implementation

[0058] Preferred embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings. It should be noted that the terms and words used in this specification and claims should not be interpreted in their ordinary or dictionary sense, but rather are based on the principle that the inventor may define the concepts of the terms as needed to best describe the content of his disclosure, and are interpreted in a meaning and concept consistent with the technical spirit of the present disclosure.

[0059] Therefore, it should be understood that the embodiments described herein and the configurations shown in the accompanying drawings are merely the most preferred embodiments of this disclosure and are not an exhaustive list of the technical ideas of this disclosure, and various equivalents and modifications may exist to replace them at the time of submission.

[0060] Furthermore, in describing this disclosure, detailed descriptions of relevant known configurations or features are omitted where such descriptions would obscure the essence of this disclosure.

[0061] Because the embodiments of this disclosure are provided to explain the disclosure more fully to those skilled in the art, the shapes and dimensions of the components in the drawings may be exaggerated, omitted, or shown schematically for clarity. Therefore, the dimensions or proportions of each component do not necessarily indicate its actual size or proportion.

[0062] Metal dust analysis system

[0063] The metal dust analysis system (hereinafter referred to as the "analysis system") according to this disclosure will be described in detail below.

[0064] Figure 1 This is a schematic diagram of an analysis system according to an exemplary embodiment of the present disclosure. (Reference) Figure 1The analysis system 100 according to an exemplary embodiment of the present disclosure may include a dust analysis unit 110. The analysis system 100 may also include a database unit 120, an input unit 130, and an output unit 140.

[0065] The dust analysis unit 110 can be configured to generate corresponding X-ray transmission images of sample 10 and reference sample 20. The dust analysis unit 110 can be configured to generate a mapping image data of the sample by processing the X-ray transmission image of the sample, in which metallic dust particles with diameters within a predetermined range are selectively displayed. The dust analysis unit 110 can be configured to generate component analysis data for each metallic dust particle identified in the mapping image data. Here, sample 10 may include dust captured from an electrode manufacturing facility or manufacturing site.

[0066] As shown above, the analytical system 100 according to this disclosure may include a series of tests to detect metal dust present in a sample, quantitatively determine the distribution level of the detected metal dust, and qualitatively analyze each component of the metal dust. Furthermore, the analytical system 100 utilizes the transmission characteristics of X-rays, thus enabling it to accurately detect metal dust.

[0067] Furthermore, the analysis system 100 according to this disclosure can be configured to utilize X-ray transmission information of a reference sample to establish a numerical range for the diameter of the metal dust to be detected in the sample. That is, the reference sample 20 is used to provide reference values ​​for establishing the diameter range of the metal dust to be detected in the sample.

[0068] When the X-ray transmission image of sample 10 is unprocessed, it shows all the different types and diameters of metal dust, and it is not necessary to know the distribution level or composition of all sizes of metal dust. Instead, it is of interest to know the distribution level or corresponding composition of metal dust above a certain size or metal dust within a predetermined range of sizes.

[0069] The analytical system 100 of this disclosure detects metal dust in a sample based on X-ray transmission signals, but selectively detects metal dust with a specific size or a predetermined range of size, and performs component analysis only on these, making it possible to determine the distribution level of significant metal dust and its corresponding composition very quickly, and providing a standardized method for determining the type and distribution level of dust present in an electrode manufacturing facility or manufacturing site.

[0070] In an exemplary embodiment, sample 10 may be a capture paper onto which dust captured from an electrode manufacturing facility or manufacturing site has been transferred. Details of how such a capture paper is manufactured will be described later.

[0071] In an exemplary embodiment, the reference sample 20 is not particularly limited, as long as it is a metallic material. As a non-limiting example, the reference sample 20 may be a metal selected from the group consisting of iron (Fe), copper (Cu), chromium (Cr), nickel (Ni), manganese (Mn), cobalt (Co), and aluminum (Al), or an alloy comprising two or more metals.

[0072] In an exemplary embodiment, the reference sample 20 may include metals with diameters corresponding to the diameter range of the metal dust to be detected in the sample 20. Specifically, if it is desired to detect metal dust with a diameter of 20 μm or larger in the sample 10, the reference sample 20 may include metal with a diameter of 20 μm. Alternatively, if it is desired to detect metal dust in the range of 15 to 20 μm in the sample, the reference sample may include metals with diameters of 15 μm and 20 μm.

[0073] In an exemplary embodiment, the analysis system 100 may be configured to perform tests when the reference sample 20 and the sample 10 are positioned in the same plane such that they do not overlap.

[0074] Figure 10 This is a diagram illustrating a method of mounting a sample and a reference sample on a stage according to an exemplary embodiment of the present disclosure. (Reference) Figure 10 Sample 10 and reference sample 20 are positioned on stage 111, but in the same plane so that they do not overlap. This arrangement of sample 10 and reference sample 20 is intended to simultaneously acquire corresponding X-ray transmission images of reference sample 20 and sample 10. Therefore, the dust analysis unit 110 can quickly filter out metallic dust of the desired size from the X-ray transmission image of the sample based on the X-ray transmission information of the reference sample.

[0075] In an exemplary embodiment, the dust analysis unit 110 can be configured to generate an X-ray transmission image using a digital method that converts the X-ray transmission signal into an electrical signal to generate an image. Therefore, the analysis system 100 of this disclosure can rapidly filter out metallic dust that does not have the desired size to be detected based on the number of pixels of a reference sample in the digitized X-ray transmission image.

[0076] In an exemplary embodiment, the dust analysis unit 110 can be configured to perform image processing on the X-ray transmission image of the sample based on the size information of the X-ray transmission image of the reference sample. As a non-limiting example, the size information of the X-ray transmission image of the reference sample can be the number of pixels. Therefore, mapped image data of the sample can be generated, in which metal dust with a predetermined diameter range is selectively indicated. In other words, the dust analysis unit 110 can generate mapped image data of the sample by filtering out metal dust with diameters outside the predetermined range from the X-ray transmission image of the sample 10 based on the size information of the X-ray transmission image of the reference sample 20, in which metal dust with diameters within the predetermined range is selectively displayed.

[0077] In an exemplary embodiment, the dust analysis unit 110 can be configured to generate high-magnification X-ray transmission images or high-magnification mapping image data. The size of the metal dust to be detected is typically a few micrometers to tens of micrometers, and it is difficult to identify with the naked eye, but high-magnification images can allow the identification of metal dust.

[0078] In an exemplary embodiment, the dust analysis unit 110 can be configured to assign an identification code to each metal dust particle identified in the mapped image data, and generate component analysis data for each identification code. Therefore, the analysis system can collect and manage component analysis data via identification codes, thereby facilitating data processing.

[0079] In an exemplary embodiment, the dust analysis unit 110 can be configured to automatically calculate the quantity and / or the corresponding size of metal dust based on the mapped image data. Specifically, when a range in the mapped image data is specified via the input unit 130, the dust analysis unit 110 can be configured to automatically calculate the quantity and / or the corresponding size of metal dust included in the specified range. The size of the metal dust can be, for example, the area of ​​the metal dust, which can be calculated by the number of pixels. However, it is not limited to this.

[0080] Figure 2 This is a block diagram of a dust analysis unit 110 according to an exemplary embodiment of the present disclosure. (See also...) Figure 2 According to an exemplary embodiment, the dust analysis unit 110 may include a stage 111, an X-ray transmission image generation module 112, an image processing module 113, and a component analysis module 114.

[0081] In an exemplary embodiment, the stage 111 may be configured to hold the sample 10 and the reference sample 20.

[0082] In an exemplary embodiment, the X-ray transmission image generation module 112 may be configured to irradiate both the sample 10 and the reference sample 20 fixed on the stage 111 with X-rays, detect the X-ray transmission signal transmitted through them, and generate corresponding X-ray transmission images of the sample 10 and the reference sample 20 based on the detected signal.

[0083] In an exemplary embodiment, the X-ray transmission image generation module 112 may include: an X-ray generator (not shown) that irradiates both the sample 10 and the reference sample 20 with X-rays; and a detector (not shown) configured to collect the X-rays that have penetrated the sample 10 and the reference sample 20 and generate an X-ray transmission image that displays the collected energy corresponding to a position in a two-dimensional plane.

[0084] When sample 10 and reference sample 20 are irradiated with X-rays, the X-rays penetrate them, and the X-ray detector detects different energies depending on the type of material present in sample 10 and reference sample 20. These differences in the intensity of the X-ray transmission signal allow for the detection of metallic dust in the samples. The location, distribution, etc., of the metallic dust can then be determined using X-ray transmission images that visualize the detection results.

[0085] In some embodiments, X-ray transmission images can be distinguished by the contrast between black and white. In a preferred embodiment, the detector can digitally generate X-ray transmission images by converting X-ray transmission signals into electrical signals to generate an image. Specifically, the detector can generate X-ray transmission images using digital radiography.

[0086] Figure 3 It is an X-ray transmission image of a reference sample generated according to an exemplary embodiment, and Figure 4 yes Figure 3 Enlarged images are shown. The reference samples consist of two 15 μm diameter iron-chromium alloy pieces, two 20 μm diameter iron-chromium alloy pieces, and one 30 μm diameter iron-chromium alloy piece; their X-ray transmission images are shown in [the image / image]. Figure 4 In. Figure 3 and Figure 4 The right-angled triangles visible in the X-ray transmission image shown are markers used to visually label a reference sample.

[0087] In an exemplary embodiment, the image processing module 113 can be configured to perform image processing on the X-ray transmission image to generate mapped image data. That is, the mapped image data can be image processing of the X-ray transmission image of the sample under appropriate conditions. In an exemplary embodiment, the image processing module 113 can be configured to perform image processing on the X-ray transmission image of the sample based on X-ray transmission image information of a reference sample. Therefore, the dust analysis unit 110 according to this disclosure can generate mapped image data in which metallic dust with a diameter within a predetermined range or metallic dust with a size greater than or equal to the diameter of the reference sample in the X-ray transmission image of the sample can be selectively displayed. As a result, the image processing module 113 can generate mapped image data in which metallic dust that is undetectable in the X-ray transmission image of the sample is filtered out.

[0088] Furthermore, in an exemplary embodiment, the image processing module 113 can be configured to assign an identification code to each metal dust particle in a metal dust particle with a diameter having a predetermined range. The identification code can be letters, numbers, or symbols, or a combination of two or more of these. Therefore, the analysis system of this disclosure can facilitate the processing and management of analytical data for each component of the metal dust particles identified by the identification code in the mapped image data.

[0089] Figure 5 Mapped image data according to an exemplary embodiment is shown.

[0090] refer to Figure 5 Each of the multiple squares represents a sample, i.e. Figure 5 This displays mapped image data for each of multiple samples. Within each sample, multiple points are marked, and each point is assigned an identification code. Therefore, the operator can collect and manage component analysis data using these identification codes.

[0091] In an exemplary embodiment, the component analysis module 114 may be configured to generate component analysis data based on X-ray fluorescence analysis of each metal dust particle identified in the mapped image data.

[0092] X-ray fluorescence analysis (XRF) is a technique that utilizes the unique interaction between basic X-rays and matter, and it is an analytical technique already used in various fields such as metal and alloy analysis, forensics, food analysis, and environmental analysis. It is also known as XRF analysis. XRF analysis can analyze matter on an elemental basis. When a sample is analyzed by XRF, each element present emits a unique X-ray signal in a spectral form. The specific X-rays of different elements can be separated into complete fluorescence energy spectra. Therefore, compositional analysis data can include the corresponding X-ray fluorescence spectra of metal dust.

[0093] Database unit 120 can be configured to store various data received from dust analysis unit. These data may include mapped image data of the sample and compositional analysis data for each metal dust particle in the metal dust. The compositional analysis data may be X-ray fluorescence energy spectra matched with the corresponding identification codes of the metal dust particles.

[0094] Furthermore, in an exemplary embodiment, the database unit 120 can store the corresponding X-ray fluorescence energy spectra of various types of metal elements as reference data. Therefore, by comparing the corresponding X-ray fluorescence spectra of the metal dust detected in the sample with the reference data, the constituent elements of the metal dust can be determined.

[0095] The input unit 130 can be configured to input various conditions for the dust analysis unit to perform detection, image processing, composition analysis, and data processing of metal dust. For example, the input unit can be, but is not limited to, a keyboard, mouse, etc.

[0096] The output unit 140 can be configured to output mapped image data and component analysis data. For example, the output unit can be, but is not limited to, a monitor.

[0097] The analytical system disclosed herein provides a simple analytical process and standardized method for determining the distribution level of metal dust in electrode manufacturing facilities or manufacturing sites. Furthermore, because the analysis is performed only on dust within a predetermined size range, rather than on all dust particles, the analysis can be completed quickly, which facilitates timely response when analyzing the causes of defects.

[0098] Metal dust analysis methods

[0099] Figure 6 This is a flowchart illustrating a metal dust analysis method (hereinafter referred to as the "analysis method") according to an exemplary embodiment of the present disclosure.

[0100] refer to Figure 6 An analytical method according to an exemplary embodiment of the present disclosure may include preparing a sample (P110), generating corresponding X-ray transmission images of the sample and a reference sample (P120), generating mapping image data of the sample (P130), and collecting component analysis data (P140).

[0101] The sample preparation (P110) process can be a process of preparing a sample to capture dust from a test article to facilitate the detection of metal dust. The test article can refer to an electrode manufacturing facility or an electrode manufacturing site. An electrode manufacturing facility is any facility used to manufacture electrodes, including but not limited to facilities for manufacturing electrode slurries, facilities for coating electrode slurries, facilities for transferring current collector sheets, facilities for drying electrodes, facilities for rolling electrodes, facilities for grooving electrodes, and facilities for cutting electrodes.

[0102] Figure 7 This is a flowchart illustrating a process for preparing a sample according to an exemplary embodiment of the present disclosure. Reference Figure 7 The process of preparing sample P110 may include: the initial capture process P111; and the secondary capture process P112.

[0103] The initial capture process P111 can be the process of initially rolling a dust cleaning roller on the surface of the sample to capture dust present on the surface of the sample using the dust cleaning roller.

[0104] Figure 8 This is a diagram illustrating the initial capture process according to an exemplary embodiment of the present disclosure. (Reference) Figure 8 To capture dust present on the test item, the operator rolls a dust cleaning roller 2 positioned on the surface of the test item 1. The dust cleaning roller 2 can be configured to adhere dust present on the surface of the test item to its surface by rolling. For example, the surface of the dust cleaning roller 2 can be coated with an adhesive material so that dust present on the rolling portion of the test item can adhere to the surface of the dust cleaning roller 2.

[0105] The secondary capture process P112 can be a process of transferring dust adhering to the dust cleaning roller to the capture paper by rolling the dust cleaning roller that was rolled initially onto the capture paper a second time.

[0106] Figure 9 This is a diagram illustrating a secondary capture process according to an exemplary embodiment of the present disclosure. (Reference) Figure 9 When the dust cleaning roller 2 is rolled onto the capture paper 3, the dust adhering to the dust cleaning roller 2 is transferred to the capture paper 3 by the adhesive component of the capture paper 3. At this time, the dust is transferred to the capture paper 3 in a single layer.

[0107] To transfer dust adhering to the surface of the dust cleaning roller 2 to the trapping paper 3, the surface of the trapping paper 3 is coated with an adhesive component. This adhesive component is more viscous than the adhesive component of the dust cleaning roller. Therefore, when the dust cleaning roller 2 rolls over the surface of the trapping paper 3, the dust adhering to the dust cleaning roller 2 can be transferred to the trapping paper 3. The trapping paper 3, onto which dust has been transferred, can be kept closed by a trapping cover 4 to prevent contamination of the trapping paper. The trapping cover 4 may include a transparent window 4a, which comprises a transparent film.

[0108] The process of generating an X-ray transmission image (P120) can be a process of generating a reference sample and a corresponding X-ray transmission image of the sample using a dust analysis system that utilizes X-rays.

[0109] The dust analysis system can be as described previously. For example, the dust analysis system 100 may include a dust analysis unit 110. The dust analysis unit 110 may be configured to generate corresponding X-ray transmission images of a sample and a reference sample, including dust captured from an electrode manufacturing facility or manufacturing site, and may be configured to generate a mapping image data of the sample by processing the X-ray transmission image of the sample, in which metal dust having diameters within a predetermined range is selectively displayed, and may be configured to generate component analysis data for each metal dust identified in the mapping image data.

[0110] The dust analysis system 100 may also include the database unit 120, input unit 130 and output unit 130 described previously.

[0111] The dust analysis unit 110 can be configured to irradiate the sample 10 and the reference sample 20 with X-rays, detect the X-ray transmission signals that pass through them, and generate corresponding X-ray transmission images of the sample 10 and the reference sample 20 based on the detected signals. The method of detecting metal dust using X-ray transmission images achieves accurate and rapid detection.

[0112] The process of generating mapping image data (P130) can be a process of using X-ray transmission image information of a reference sample to select metal dust with a diameter of a predetermined range in the X-ray transmission image of the sample and generating mapping image data in which the selected metal dust is identified.

[0113] In an exemplary embodiment, the dust analysis unit 110 may be configured to perform image processing on the X-ray transmission image of the sample based on the size information of the X-ray transmission image of the reference sample. That is, the dust analysis unit 110 may generate mapped image data by filtering out metal dust with diameters outside a predetermined range through image processing, in which metal dust with diameters outside the predetermined range is selectively displayed in the X-ray transmission image of the sample.

[0114] The process of collecting component analysis data (P140) can be a process of collecting component analysis data by performing component analysis on each metal dust particle identified in the mapped image data. Component data may include X-ray fluorescence spectra.

[0115] The metal dust analysis system has been described in detail above and will not be repeated here.

[0116] The metal dust analysis method disclosed herein provides a standardized method for quantitatively determining the distribution level of metal dust in dust present in an electrode manufacturing facility or manufacturing site. Furthermore, generating X-ray transmission images of both a sample and a reference sample, and using the X-ray transmission image information of the reference sample to generate mapping image data of a sample in which metal dust of the size to be detected is selectively displayed, enables rapid and accurate detection of the distribution level of significant metal dust. Moreover, for each metal dust identified in the mapping image data, component analysis data is generated; an identification code is assigned to each metal dust identified in the mapping image data; and component analysis data is generated and managed through the identification code, thereby facilitating data management.

[0117] The present disclosure has been described in more detail above with reference to the accompanying drawings and embodiments. However, it should be understood that the configurations described in the drawings or embodiments are merely one embodiment of the present disclosure and do not represent all the technical ideas of the present disclosure, and various equivalents and modifications may exist at the time of filing this application.

Claims

1. A metal dust analysis system, comprising: A dust analysis unit, configured to generate X-ray transmission images of each sample and a reference sample; Mapping image data of the sample is generated by processing the X-ray transmission image of the sample, in which metal dust particles with diameters within a predetermined range are selectively displayed; and component analysis data is generated for each metal dust particle identified in the mapping image data.

2. The metal dust analysis system according to claim 1, wherein, The dust analysis unit is configured to utilize X-ray transmission image information of a reference sample when establishing a numerical range for the diameter of the metal dust to be detected in the sample.

3. The metal dust analysis system according to claim 1, wherein, The dust analysis unit is configured to perform image processing on the X-ray transmission image of the sample based on the size information of the X-ray transmission image of the reference sample.

4. The metal dust analysis system according to claim 1, wherein, The dust analysis unit is configured to filter out metallic dust with a diameter outside a predetermined range from the X-ray transmission image of the reference sample based on the size information of the X-ray transmission image of the reference sample.

5. The metal dust analysis system according to claim 1, wherein, The dust analysis unit is configured to generate high-magnification X-ray transmission images or high-magnification mapping image data.

6. The metal dust analysis system according to claim 1, wherein, The dust analysis unit is configured to assign an identification code to each of the metal dust particles selected from the mapped image data, and to generate the component analysis data for each identification code.

7. The metal dust analysis system according to claim 1, wherein, The dust analysis unit is configured to automatically calculate the quantity and / or corresponding size of the metal dust based on the mapped image data.

8. The metal dust analysis system according to claim 1, wherein, The component analysis data includes X-ray fluorescence spectra.

9. The metal dust analysis system according to claim 1, wherein, The dust analysis unit includes: A stage configured to hold the sample and the reference sample; An X-ray transmission image generation module is configured to irradiate the sample and the reference sample fixed on the stage with X-rays, detect the X-ray transmission signal that passes through them, and generate an X-ray transmission image based on the detected signal. An image processing module, configured to perform image processing on the X-ray transmission image to generate the mapped image data; and A component analysis module is configured to generate component analysis data based on X-ray fluorescence analysis of each metal dust particle visible in the mapped image data.

10. The metal dust analysis system according to claim 1, further comprising: A database unit is configured to store various data received from the dust analysis unit; An input unit is configured to input various conditions for the dust analysis unit to perform detection, image processing, composition analysis, and data processing of metal dust. as well as The output unit is configured to output the mapped image data and component analysis data.

11. The metal dust analysis system according to claim 1, wherein, The reference sample is a metal, wherein The sample is a trapping paper onto which dust captured from the electrode manufacturing facility or manufacturing site has been transferred. The inspection is configured to be performed with the reference sample and the sample positioned in the same plane such that they do not overlap.

12. A method for analyzing metal dust, comprising: Samples are produced by capturing dust from the electrode manufacturing facility or manufacturing site; A dust analysis system utilizing X-rays is used to generate reference samples and corresponding X-ray transmission images of the samples. Using the X-ray transmission image information of the reference sample, metal dust particles with a diameter of a predetermined range are selected from the X-ray transmission image of the sample, and mapping image data of the sample in which the selected metal dust particles are identified is generated. as well as Compositional analysis is performed on each metal dust particle identified in the mapped image data to collect compositional analysis data.

13. The method for analyzing metal dust according to claim 12, wherein, The process of producing the sample includes: The initial capture process involves rolling a dust cleaning roller on the surface of the test item and capturing dust present on the surface of the test item onto the dust cleaning roller. The secondary capture process involves transferring dust adhering to the dust cleaning roller to the capture paper by rolling the initially rotating dust cleaning roller a second time onto the capture paper. The adhesive component of the capture paper has a greater adhesive strength than the adhesive component of the dust cleaning roller.

14. The method for analyzing metal dust according to claim 12, wherein, The dust analysis system includes: A dust analysis unit is configured to: generate X-ray transmission images of each sample and a reference sample; generate mapping image data of the sample by processing the X-ray transmission images of the sample, selectively displaying metal dust particles with diameters within a predetermined range in the mapping image data; and generate component analysis data for each metal dust particle identified in the mapping image data.

15. The method for analyzing metal dust according to claim 11, wherein, The dust analysis unit is configured to perform image processing on the X-ray transmission image of the sample based on the size information of the X-ray transmission image of the reference sample.

16. The method for analyzing metal dust according to claim 11, wherein, The component analysis data includes X-ray fluorescence spectra.

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