A method of time error determination for a surveying instrument

Abstract

The application provides a time error determination method of a measuring instrument, belonging to the technical field of data processing, to improve the accuracy of time error determination. The test system comprises a processing device, a synchronizer and a time pulse generator, the processing device, the synchronizer and the time pulse generator are connected with M measuring instruments to be tested, the synchronizer is connected with the time pulse generator, and the method comprises the following steps: the synchronizer triggers the test process to start; under the condition that the test process starts, the time pulse generator sends a first pulse signal to the M measuring instruments at t1, and sends a second pulse signal to the M measuring instruments at t2 after t1, and the interval between t1 and t2 is a preset time length t; under the condition that the test process starts, the processing device determines the time error of each of the M measuring instruments according to the time of the first pulse signal received by each of the M measuring instruments, the time of the second pulse signal received by each of the M measuring instruments and the preset time length t.

Description

Technical Field

[0001] This application relates to the field of data processing technology, and in particular to a method for determining the time error of a measuring instrument. Background Technology

[0002] With the development of experimental technology, various testing methods are used in detonation experiments, and the accuracy of the measurement results of the testing system directly affects the success of the experiment.

[0003] According to regulations, all testing instruments and equipment used in the experiment must be sent to the calibration center for calibration periodically in accordance with national calibration procedures, and calibration certificates must be issued. This ensures that the calibration and usage periods of the testing instruments and equipment used in the experiment are within their validity periods, guaranteeing the accuracy, reliability, and traceability of the experimental data. After the testing system is built, a system self-test of the instruments and the entire testing system is still required.

[0004] However, factors such as cable transmission and system errors inevitably affect the instrument, impacting the accuracy and reliability of the test. Summary of the Invention

[0005] This application provides a method for determining the time error of a measuring instrument, thereby improving the accuracy of time error determination.

[0006] To achieve the above objectives, this application adopts the following technical solution:

[0007] Firstly, a method for determining the time error of measuring instruments is provided, applied to a testing system. The testing system includes a processing device, a synchronizer, and a time pulse generator. The processing device, synchronizer, and time pulse generator are all connected to M measuring instruments under test, where M is an integer greater than 1. The synchronizer is connected to the time pulse generator. The method includes: the synchronizer triggers the start of the test process; when the test process is started, the time pulse generator sends a first pulse signal to the M measuring instruments at time t1, and sends a second pulse signal to the M measuring instruments at time t2 after time t1, with a preset time interval t between time t1 and time t2; when the test process is started, the processing device determines the time error of each of the M measuring instruments based on the time of the first pulse signal received by each of the M measuring instruments, the time of the second pulse signal received by each of the M measuring instruments, and the preset time interval t.

[0008] Therefore, by introducing a synchronizer and a time pulse generator, the synchronous start of the testing process is achieved, ensuring that multiple measuring instruments are tested simultaneously and improving testing efficiency. The time pulse generator sends two pulse signals at precise moments, and the processing equipment calculates the time error based on the moment the measuring instrument receives the signal and the preset duration. This method reduces the impact of external interference and delays, improving the accuracy of time error determination. Simultaneously, this method supports batch testing of multiple measuring instruments, reducing testing costs and time, and enhancing the system's scalability and practicality.

[0009] Optionally, for the i-th measuring instrument among the M measuring instruments, the time when the i-th measuring instrument receives the first pulse signal is t3i, the time when the i-th measuring instrument receives the second pulse signal is t4i, and the time error T of the i-th measuring instrument satisfies the following relationship: T=t4i-t3i-t.

[0010] Therefore, by providing a specific formula for calculating time error, the calculation process is simplified, making time error determination more intuitive and easier to implement. By directly using the timing and preset duration of the pulse signal received by the measuring instrument, complex calibration steps are avoided, improving calculation efficiency. This formula ensures that the time error of each measuring instrument is calculated independently, avoiding mutual interference between instruments, improving the reliability and repeatability of the results, and laying the foundation for subsequent error analysis.

[0011] Optionally, the method further includes: the processing device determines the uncertainty of the i-th measuring instrument based on the measurement time T0i, where T0i = t4i - t3i; wherein, if the time error T of the i-th measuring instrument is within a first preset range and the uncertainty is within a second preset range, it indicates that the time error of the i-th measuring instrument meets the experimental requirements.

[0012] Therefore, introducing uncertainty assessment provides a more comprehensive error analysis. By simultaneously considering time error and uncertainty, it is possible to more accurately determine whether the measuring instrument meets the experimental requirements, avoiding the limitations of evaluation based on a single indicator. This helps improve the rigor and reliability of testing, ensuring that only instruments meeting accuracy requirements are used, reducing the risk of misjudgment, and enhancing quality control.

[0013] Optionally, the measurement time T0i and the uncertainty satisfy the following relationship:

[0014]

[0015] in, Indicates uncertainty, Let be the sampling interval time of the i-th measuring instrument. This is for interpolation error. Let be the clock error of the i-th measuring instrument. To trigger the jitter, This is due to the external triggering time deviation.

[0016] Therefore, the detailed formula for calculating uncertainty covers a variety of error sources, such as sampling interval, interpolation error, and clock error. These error sources include the influence of environmental factors such as cable transmission and the impact of bumps and shaking during transportation on the test system. Therefore, by determining the uncertainty, it is possible to further determine whether environmental factors and the impact of bumps and shaking during transportation on the test system.

[0017] Optionally, time t1 and time t2 are generated by the local crystal oscillator of the time pulse generator. The method further includes: the time pulse generator requesting the wireless network device to provide time synchronization for the time pulse generator; the time pulse generator determining the deviation values ​​between the local clock of the time pulse generator and the local clock of the wireless network device corresponding to the multiple time synchronizations provided by the wireless network device, with a total of multiple deviation values; and the time pulse generator correcting the local crystal oscillator of the time pulse generator based on the multiple deviation values.

[0018] Therefore, wireless network time synchronization improves the time accuracy of the time pulse generator. Multiple time synchronizations and deviation calculations allow the time pulse generator to calibrate its local crystal oscillator, reducing clock drift and ensuring the accuracy of pulse signal transmission. This enhances the reliability of the time base of the entire test system, improves the overall accuracy of time error determination, and reduces system errors caused by local clock instability.

[0019] Optionally, the time pulse generator requests the wireless network device to provide time synchronization, including: the time pulse generator sending a time synchronization request to the wireless network device, the time synchronization request including the identity information of the user corresponding to the time pulse generator; the time pulse generator receiving time synchronization information from the wireless network device multiple times through a beam specifically configured for use by the time pulse generator; the wireless network device verifying the identity information to determine that the user's beam opening permission is a dedicated permission, the dedicated permission indicating that the wireless network device needs to configure a beam only for communication between the time pulse generator and the wireless network device; each received time synchronization information is used to determine a corresponding deviation value.

[0020] Optionally, dedicated beams and authentication ensure the security and exclusivity of the time synchronization process. Dedicated beams reduce interference and improve the quality of the time synchronization signal, thereby increasing time synchronization accuracy. Authentication prevents unauthorized access, enhances system security, ensures the time pulse generator operates in a controlled environment, and avoids the impact of external malicious attacks or interference on test results.

[0021] Optionally, the time pulse generator corrects its local crystal oscillator based on multiple deviation values, including: the time pulse generator determining a first frequency deviation based on two adjacent deviation values; the time pulse generator performing adaptive filtering on the first frequency deviation to obtain a second frequency deviation, wherein the adaptive filtering is performed as follows: when the local crystal oscillator of the time pulse generator is unstable or the signal quality of the beam is greater than the signal quality threshold, a large bandwidth is used for filtering; when the local crystal oscillator of the time pulse generator is stable or the signal quality of the beam is less than or equal to the signal quality threshold, a narrow bandwidth is used for filtering; the time pulse generator converts the second frequency deviation into an analog voltage value; and the time pulse generator corrects its local crystal oscillator based on the analog voltage value.

[0022] Therefore, it can be seen that by employing adaptive filtering to handle frequency deviations and adjusting the filter bandwidth based on the stability of the local crystal oscillator and signal quality, the response speed and accuracy of frequency correction are optimized. Converting the frequency deviation into an analog voltage value for correction achieves hardware-level calibration, improving the long-term stability of the local crystal oscillator. This method adapts to dynamic environmental changes, ensuring that the time pulse generator maintains high-precision time output under various conditions.

[0023] Optionally, after the wireless network device completes the time synchronization cycle for the time pulse generator, the method further includes: the time pulse generator determining the frequency deviation corresponding to the current environmental information from an environmental frequency characteristic model based on the current environmental information; the environmental frequency characteristic model includes a one-to-one correspondence between different environmental information and different frequency deviations; one frequency deviation corresponds to one piece of environmental information, which is the information of the environment in which the time pulse generator is located when the time pulse generator determines a frequency deviation through the time synchronization of the wireless network device; the time pulse generator converts the frequency deviation corresponding to the current environmental information into an estimated analog voltage value; and the time pulse generator corrects its local crystal oscillator based on the estimated analog voltage value.

[0024] Therefore, by predicting frequency deviation using an environmental frequency characteristic model after the time synchronization period ends, continuous calibration is achieved even without network time synchronization. This reduces dependence on external time synchronization and improves the system's autonomy and reliability. The environmental model considers factors such as temperature and humidity, making the calibration more adaptable to actual working conditions and ensuring that the time pulse generator maintains an accurate time reference even in harsh environments.

[0025] Optionally, after the time synchronization period for the time pulse generator by the wireless network device ends, the method further includes: the time pulse generator starting a timer at the end of the period; the time pulse generator determining a time uncertainty based on the timing duration of the timer; the time pulse generator determining a time health status of the timing duration of the timer based on the time uncertainty; and if the time health status does not meet preset requirements, the time pulse generator requesting the wireless network device to start the next time synchronization period, which the wireless network device then uses to synchronize the time pulse generator in the next time synchronization period.

[0026] Therefore, by monitoring time uncertainty and assessing time health status through a timer, the reliability of the system during the time synchronization interval is ensured. When the health status does not meet the requirements, the system automatically requests the next time synchronization cycle, achieving dynamic time synchronization management and avoiding accuracy degradation under prolonged unattended operation. This improves the system's adaptability and robustness, ensuring the continuity and accuracy of the testing process.

[0027] Optionally, the time uncertainty and the timing duration of the timer satisfy the following relationship: U(t) = U_initial + (frequency stability × t) + (model residual × t); U(t) is the time uncertainty, U_initial is the start time of the timer, and t is the timing duration of the timer.

[0028] Therefore, a specific formula for calculating time uncertainty is provided, making the assessment of time health status a reliable basis. By considering frequency stability and model residuals, the formula reflects the actual sources of error, improving the accuracy of the assessment. This helps to trigger time synchronization in a timely manner, maintain system time accuracy, and provides quantitative indicators for system maintenance and fault diagnosis.

[0029] Thirdly, a computer-readable storage medium is provided, comprising: a computer program or instructions; when the computer program or instructions are executed on a computer, the computer causes the computer to perform the method described in the first aspect. Attached Figure Description

[0030] Figure 1 This is a schematic diagram of the test system provided in an embodiment of this application.

[0031] Figure 2 A flowchart illustrating the method for determining the time error of a measuring instrument provided in an embodiment of this application;

[0032] Figure 3 This is a schematic diagram of the pulse signal in the time error determination method of the measuring instrument provided in the embodiments of this application. Detailed Implementation

[0033] The technical solutions in this application will now be described with reference to the accompanying drawings.

[0034] This application will present various aspects, embodiments, or features relating to systems that may include multiple devices, components, modules, etc. It should be understood and appreciated that individual systems may include additional devices, components, modules, etc., and / or may not include all the devices, components, modules, etc. discussed in conjunction with the accompanying drawings. Furthermore, combinations of these approaches are also possible.

[0035] Furthermore, in the embodiments of this application, the words "exemplary," "for example," etc., are used to indicate that they are examples, illustrations, or descriptions. Any embodiment or design scheme described as "exemplary" in this application should not be construed as being more preferred or advantageous than other embodiments or design schemes. Specifically, the use of the term "exemplary" is intended to present the concept in a concrete manner.

[0036] In the embodiments of this application, the terms "information," "signal," "message," "channel," and "singaling" may sometimes be used interchangeably. It should be noted that, without emphasizing their distinction, their intended meanings are consistent. Similarly, "of," "corresponding (relevant)," and "corresponding" may sometimes be used interchangeably. It should be noted that, without emphasizing their distinction, their intended meanings are consistent. Furthermore, the " / " mentioned in this application can be used to indicate an "or" relationship.

[0037] The network architecture and business scenarios described in the embodiments of this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided in the embodiments of this application. As those skilled in the art will know, with the evolution of network architecture and the emergence of new business scenarios, the technical solutions provided in the embodiments of this application are also applicable to similar technical problems.

[0038] For example, Figure 1 This is a schematic diagram of a test system provided in an embodiment of this application. The test system includes a processing device, a synchronizer, and a time pulse generator. The processing device, synchronizer, and time pulse generator are all connected to M measuring instruments to be tested, where M is an integer greater than 1. The synchronizer and the time pulse generator are connected to the measuring instruments.

[0039] In one example, the measuring instrument could be a digital oscilloscope used for the detonation experiment. In another example, M=25, meaning that the M measuring instruments could be digital oscilloscope 1, digital oscilloscope 2, and so on, up to digital oscilloscope 25.

[0040] The processing device can be a terminal. The terminal can be a terminal with communication functions, or a chip or chip system that can be installed on the terminal. The terminal can also be called user equipment (UE), access terminal, subscriber unit, user station, mobile station (MS), mobile station, remote station, remote terminal, mobile device, user terminal, terminal, wireless communication equipment, user agent, or user equipment. The terminals in the embodiments of this application may be mobile phones, cellular phones, smartphones, tablets, wireless data cards, personal digital assistants (PDAs), wireless modems, handsets, laptop computers, machine-type communication (MTC) terminals, computers with wireless transceiver capabilities, virtual reality (VR) terminals, augmented reality (AR) terminals, wireless terminals in industrial control, wireless terminals in self-driving, wireless terminals in remote medical care, wireless terminals in smart grids, wireless terminals in transportation safety, wireless terminals in smart cities, wireless terminals in smart homes, vehicle-mounted terminals, roadside units (RSUs) with terminal functions, etc. The terminal of this application may also be an on-board module, on-board unit, on-board component, on-board chip or on-board unit that is built into a vehicle as one or more components or units.

[0041] The time pulse generator can contain 32 independent time pulse output channels, allowing users to output time pulse signals with different times and intervals as needed. The time pulse generator is high-precision, and the time interval for each sample point can be determined by setting the pulse frequency. It has 32 pulse output ports, numbered sequentially from 0 to 31. The time pulse generator output frequency is 50 MHz. Channel 0 directly outputs a single pulse signal as the zero-time signal for the entire test system. Channels 1 to 25 divide the output channel length into three thousand parts, from 0 to 2999. The output length T1 of each single pulse is:

[0042] T1=1 / 50000000 s=0.00000002 s=20 ns,

[0043] Therefore, the number of portions L corresponding to 50 s is:

[0044] L=50 / T1=50000 / 20=2500.

[0045] The details are shown in Table 1:

[0046] Table 1

[0047]

[0048] like Figure 1 As shown, channel 0 of the time pulse generator is connected to channel CH2 of digital oscilloscope 1, with the pulse output time set to time 0, i.e., time t1, used as a reference comparison signal for time analysis. The time pulse generator channels 1-25 are set to pulse output time at time t2, 50µs after time t1, and their pulse output ports are connected to the test channel CH1 of the digital oscilloscope, used by the digital oscilloscope to record the pulse signal output at time t2. The output channels 1-25 of the synchronizer are respectively connected to the external trigger ports AUX of the 25 digital oscilloscopes, and the output channel 26 of the synchronizer is connected to the external trigger port TRIGGER IN of the time pulse generator.

[0049] The settings for a digital oscilloscope are shown in Table 2:

[0050]

[0051] The digital oscilloscope is connected to a network switch via an RJ-45 universal network interface, and then connected to the processing device via a network cable, so that the processing device can acquire data.

[0052] For example, Figure 2 This application provides a flowchart illustrating a method for determining the time error of a measuring instrument. This method can be applied to the aforementioned testing system.

[0053] like Figure 2 As shown, the flowchart of the method for determining the time error of this measuring instrument is as follows:

[0054] S101, the synchronous machine triggers the start of the test process.

[0055] For example, a synchronizer can simultaneously send trigger signals to the processing equipment, the time pulse generator, and M test devices to trigger the start of the test process.

[0056] S102, when the test process is started, the time pulse generator sends a first pulse signal to M measuring instruments at time t1, and sends a second pulse signal to M measuring instruments at time t2 after time t1.

[0057] The time interval between time t1 and time t2 is a preset duration t, such as 50us as mentioned above.

[0058] In one example, the first pulse signal is a reference signal, and the waveform of the reference signal can be as follows: Figure 3 As shown, the second pulse signal is the probe signal, and the waveform of the probe signal can be seen as follows. Figure 3 As shown.

[0059] S103, when the test process is started, the processing device determines the time error of each of the M measuring instruments based on the time of the first pulse signal received by each of the M measuring instruments, the time of the second pulse signal received by each of the M measuring instruments, and the preset duration t.

[0060] For example, for the i-th measuring instrument among M measuring instruments, the time when the i-th measuring instrument receives the first pulse signal is t3i, the time when the i-th measuring instrument receives the second pulse signal is t4i, and the time error T of the i-th measuring instrument satisfies the following relationship: T=t4i-t3i-t.

[0061] In one example, using 25 digital oscilloscopes, the test results can be shown in Table 3.

[0062] Table 3

[0063]

[0064] Optionally, the method further includes:

[0065] The processing equipment determines the uncertainty of the i-th measuring instrument based on the measurement time T0i, where T0i = t4i - t3i. The uncertainty mainly comes from the uncertainty introduced by the sampling interval time, the uncertainty introduced by the clock error, the uncertainty introduced by the trigger jitter, and the uncertainty introduced by the external trigger time deviation.

[0066] Wherein, if the time error T of the i-th measuring instrument is within a first preset range and the uncertainty is within a second preset range, it means that the time error of the i-th measuring instrument meets the experimental requirements. For example, the measurement time T0i and the uncertainty satisfy the following relationship:

[0067]

[0068] in, Indicates uncertainty, Let be the sampling interval time of the i-th measuring instrument. This is for interpolation error. Let be the clock error of the i-th measuring instrument. To trigger the jitter, This is due to the external triggering time deviation.

[0069] Therefore, for the i-th measuring instrument, if its time error is within ±1ns and its uncertainty is less than 5ns, it means that the i-th measuring instrument can be excluded from the influence of environmental factors such as test cable transmission and the bumps and shaking during transportation on the oscilloscope in the test system, thus meeting the experimental requirements; otherwise, it does not meet the experimental requirements.

[0070] It should also be understood that times t1 and t2 are generated by the local crystal oscillator of the time pulse generator, and the method further includes:

[0071] Step S1: The time pulse generator requests the wireless network device to provide time synchronization for the time pulse generator.

[0072] For example, a time pulse generator can send a timing request to a wireless network device (such as a 5G or 6G base station). This timing request includes the user's identity information, such as the user's identity token (ATUN). The wireless network device can then verify this identity information to determine that the user's beam sharing permission is dedicated. Dedicated permission means that the wireless network device needs to configure a beam solely for communication between the time pulse generator and the wireless network device, and this beam cannot be shared by other users. Then, the time pulse generator receives the timing information from the wireless network device multiple times through the beam specifically configured for its use. Each received timing information is used to determine a corresponding deviation value. For example, for any given reception of timing information from the wireless network device, this timing information may include the time information when the wireless network device sent the timing information, denoted as Ts1. The time pulse generator can determine the time information when it received the timing information based on its local clock, denoted as Ts2. If the transmission delay of the timing information over the air interface is Δt, then the deviation value can be Ts2 - Ts1 - Δt.

[0073] Step S2: The time pulse generator determines the deviation value between the local clock of the time pulse generator and the local clock of the wireless network device based on the multiple time synchronizations provided by the wireless network device. There are multiple deviation values ​​in total.

[0074] Step S3: The time pulse generator corrects its local crystal oscillator based on multiple deviation values.

[0075] For example, the time pulse generator determines the first frequency deviation based on two adjacent deviation values ​​among multiple deviation values. The first frequency deviation is denoted as ΔF[n], where ΔF[n] = (ΔT[n] - ΔT[n-1]) / T_measure, and ΔT[n] is the deviation value determined by the latter time signal in two adjacent time signals, ΔT[n-1] is the deviation value determined by the former time signal in the two adjacent time signals, and T_measure is the interval between two adjacent time signals, such as 1 second.

[0076] The time pulse generator can adaptively filter the first frequency deviation to obtain the second frequency deviation, denoted as ΔF_estimated[n]. The adaptive filtering is as follows: when the local crystal oscillator of the time pulse generator is unstable or the signal quality of the beam is greater than the signal quality threshold, a large bandwidth is used for filtering; when the local crystal oscillator of the time pulse generator is stable or the signal quality of the beam is less than or equal to the signal quality threshold, a narrow bandwidth is used for filtering.

[0077] The time pulse generator can convert the second frequency deviation into an analog voltage value (i.e., a DAC signal). This allows the time pulse generator to adjust its local crystal oscillator based on the analog voltage value. For example, when the voltage tuning terminal of the time pulse generator's local crystal oscillator (such as a VC-TCXO / VC-OCXO) receives this signal, its output frequency will change slightly to compensate for the deviation ΔF_estimated[n].

[0078] Optionally, after the period for the wireless network device to time the time pulse generator has ended, the method further includes:

[0079] The time pulse generator determines the frequency deviation corresponding to the current environmental information (such as current ambient temperature and humidity) from the environmental frequency characteristic model. This model includes a one-to-one correspondence between different environmental information and different frequency deviations. Each frequency deviation corresponds to a specific piece of environmental information (i.e., the temperature and humidity) in the environment where the time pulse generator is located when the frequency deviation is determined by the time synchronization of the wireless network device. In other words, an environmental frequency characteristic model of the local crystal oscillator can be constructed using a large amount of data.

[0080] Therefore, the time pulse generator converts the frequency deviation corresponding to the current environmental information into an estimated analog voltage value. Then, the time pulse generator can also correct its local crystal oscillator based on the estimated analog voltage value, without relying on network time synchronization.

[0081] Optionally, after the period for the wireless network device to time the time pulse generator has ended, the method further includes:

[0082] At the end of the cycle, the time pulse generator starts the timer; the time pulse generator determines the time uncertainty based on the timer's timing duration; the time pulse generator determines the time health status of the timer's timing duration based on the time uncertainty; if the time health status does not meet the preset requirements, the time pulse generator requests the wireless network device to start the next timing cycle, and the wireless network device is used to provide timing for the time pulse generator in the next timing cycle, that is, to execute the above steps S1-S3 again. The time uncertainty and the timer's timing duration satisfy the following relationship: U(t) = U_initial + (frequency stability × t) + (model residual × t); where U(t) is the time uncertainty, U_initial is the timer's start time, and t is the timer's timing duration.

[0083] In summary, by introducing a synchronizer and a time pulse generator, the synchronous start of the testing process was achieved, ensuring that multiple measuring instruments could be tested simultaneously and improving testing efficiency. The time pulse generator sends two pulse signals at precise moments, and the processing equipment calculates the time error based on the moment the measuring instrument receives the signal and a preset duration. This method reduces the impact of external interference and delays, improving the accuracy of time error determination. Furthermore, this method supports batch testing of multiple measuring instruments, reducing testing costs and time, and enhancing the system's scalability and practicality.

[0084] It should be understood that the memory in the embodiments of this application can be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory. The non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. The volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of random access memory (RAM) are available, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced synchronous DRAM (ESDRAM), synchronous linked DRAM (SLDRAM), and direct rambus RAM (DR RAM).

[0085] The above embodiments can be implemented, in whole or in part, by software, hardware (such as circuits), firmware, or any other combination thereof. When implemented using software, the above embodiments can be implemented, in whole or in part, as a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer programs are loaded or executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer program or instructions can be stored in a computer-readable storage medium or transferred from one computer-readable storage medium to another. For example, the computer program or instructions can be transferred from one website, computer, server, or scientific data center to another website, computer, server, or scientific data center via wired (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a scientific data storage device such as a server or scientific data center that contains one or more sets of available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium. A semiconductor medium can be a solid-state drive.

[0086] It should be understood that the term "and / or" in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. A and B can be singular or plural. Additionally, the character " / " in this article generally indicates an "or" relationship between the preceding and following related objects, but it can also represent an "and / or" relationship. Please refer to the context for a more accurate understanding.

[0087] In this application, "at least one" means one or more, and "more than one" means two or more. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of a single item or a plurality of items. For example, at least one of a, b, or c can mean: a, b, c, ab, ac, bc, or abc, where a, b, and c can be a single item or multiple items.

[0088] It should be understood that, in the various embodiments of this application, the order of the above-mentioned processes does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0089] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0090] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0091] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0092] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0093] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0094] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0095] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method of time error determination for a surveying instrument, characterized by, The method is applied to a testing system, which includes a processing device, a synchronizer, and a time pulse generator. The processing device, the synchronizer, and the time pulse generator are all connected to M measuring instruments under test, where M is an integer greater than 1. The synchronizer is connected to the time pulse generator. The synchronization machine trigger test process is started: When the test process is started, the time pulse generator sends a first pulse signal to the M measuring instruments at time t1, and sends a second pulse signal to the M measuring instruments at time t2 after time t1, with a preset time interval t between time t1 and time t2. When the test process is started, the processing device determines the time error of each of the M measuring instruments based on the time of the first pulse signal received by each of the M measuring instruments, the time of the second pulse signal received by each of the M measuring instruments, and the preset duration t. For the i-th measuring instrument among the M measuring instruments, the time when the i-th measuring instrument receives the first pulse signal is t3i, the time when the i-th measuring instrument receives the second pulse signal is t4i, and the time error T of the i-th measuring instrument satisfies the following relationship: T=t4i-t3i-t; The method further includes: The processing device determines the uncertainty of the i-th measuring instrument based on the measurement time T0i, where T0i = t4i - t3i; Wherein, if the time error T of the i-th measuring instrument is within a first preset range and the uncertainty is within a second preset range, it means that the time error of the i-th measuring instrument meets the experimental requirements; wherein, denotes the uncertainty, is a sampling interval time of the i-th measuring instrument, is an interpolation error, is a clock error of the i-th measuring instrument, is a trigger jitter, is an external trigger time deviation.

2. The method of claim 1, wherein, The time t1 and the time t2 are generated by the local crystal oscillator of the time pulse generator, and the method further includes: The time pulse generator requests the wireless network device to provide time synchronization for the time pulse generator; The time pulse generator determines the deviation value between the local clock of the time pulse generator and the local clock of the wireless network device corresponding to the multiple time synchronizations provided by the wireless network device, and there are multiple deviation values ​​in total; The time pulse generator corrects its local crystal oscillator based on the plurality of deviation values.

3. The method according to claim 2, characterized in that, The time pulse generator requests the wireless network device to provide time synchronization for the time pulse generator, including: The time pulse generator sends a time synchronization request to the wireless network device, and the time synchronization request includes the identity information of the user corresponding to the time pulse generator. The time pulse generator receives timing information from the wireless network device multiple times via a beam specifically configured for its use. The wireless network device verifies the user's identity information to determine that the user's beam access permission is a dedicated permission. This dedicated permission means that the wireless network device needs to configure a beam solely for communication between the time pulse generator and the wireless network device. Each received timing information is used to determine a corresponding deviation value.

4. The method of claim 3, wherein, The time pulse generator corrects its local crystal oscillator based on the plurality of deviation values, including: The time pulse generator determines the first frequency deviation based on two adjacent deviation values ​​among the plurality of deviation values; The time pulse generator performs adaptive filtering on the first frequency deviation to obtain a second frequency deviation. The adaptive filtering is as follows: when the local crystal oscillator of the time pulse generator is unstable or the signal quality of the beam is greater than the signal quality threshold, a large bandwidth is used for filtering; when the local crystal oscillator of the time pulse generator is stable or the signal quality of the beam is less than or equal to the signal quality threshold, a narrow bandwidth is used for filtering. The time pulse generator converts the second frequency deviation into an analog voltage value; The time pulse generator corrects its local crystal oscillator based on the analog voltage value.

5. The method of claim 4, wherein, After the period during which the wireless network device provides timing for the time pulse generator ends, the method further includes: The time pulse generator determines the frequency deviation corresponding to the current environmental information from the environmental frequency characteristic model based on the current environmental information. The environmental frequency characteristic model includes a one-to-one correspondence between different environmental information and different frequency deviations. The environmental information corresponding to a frequency deviation is the information of the environment in which the time pulse generator is located when the time pulse generator determines the frequency deviation through the timing of the wireless network device. The time pulse generator converts the frequency deviation corresponding to the current environmental information into an estimated analog voltage value. The time pulse generator corrects its local crystal oscillator based on the estimated analog voltage value.

6. The method of claim 5, wherein, After the period during which the wireless network device provides timing for the time pulse generator ends, the method further includes: The time pulse generator starts the timer at the end of the cycle; The time pulse generator determines the time uncertainty based on the timing duration of the timer; The time pulse generator determines the time health status of the timer's timing duration based on the time uncertainty; When the time health status does not meet the preset requirements, the time pulse generator requests the wireless network device to start the next time synchronization cycle, and the wireless network device is used to synchronize the time pulse generator in the next time synchronization cycle.

7. The method of claim 6, wherein, The time uncertainty and the timing duration of the timer satisfy the following relationship: U(t) = U_initial + (frequency stability × t) + (model residual × t); U(t) is the time uncertainty, U_initial is the start time of the timer, and t is the timing duration of the timer.

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