Push-pull force testing apparatus with multiple test tips

Abstract

The application relates to a push-pull force testing device with multiple testing cutters. The push-pull force testing device comprises a control device, a sample table, a testing cutter switching module, a plurality of testing cutter assemblies, and a transmission mechanism. The testing cutter switching module comprises a rotating base disc arranged vertically with the sample table. The plurality of testing cutter assemblies are arranged radially on the rotating base disc. The transmission mechanism is connected with the control device and the rotating base disc. The control device drives the rotating base disc to rotate by controlling the transmission mechanism, so that one of the plurality of testing cutter assemblies vertically points to the sample table. The scheme provided by the application can automatically switch the testing cutter assembly for different products, without the need of disassembling and reassembling the testing cutter, thereby reducing the disassembling operation, improving the production efficiency, and guaranteeing the testing precision.

Description

Technical Field

[0001] This application relates to the field of micro-solder joint strength testing technology, and in particular to a push-pull force testing device with multiple test tips. Background Technology

[0002] Since the mechanical strength of materials and components is crucial for ensuring product performance and safety, the requirements for strength testing of materials and components in industrial production are becoming increasingly stringent, especially in high-precision industries such as semiconductor packaging, electronic manufacturing, automotive parts manufacturing, and aerospace. Push-pull force testing has become an important basis for product reliability testing and a scientific basis for continuous product improvement and optimization.

[0003] Push-pull force testing equipment is a high-precision physical performance testing device that detects the strength and durability of samples by applying push or pull forces and measuring displacement. The equipment applies push or pull forces to the sample through a mechanical structure, force sensors measure the data, and a control and data processing system analyzes the data. Taking LED packaging as an example, the equipment can use a test probe (such as a hook) to pull gold wires at a microscopic level to detect whether the force meets the specifications, thereby detecting whether the gold wire bonding of the LED light assembly meets the standards. In IC packaging, to detect the bonding strength between the chip and the substrate, the equipment can apply a vertical push force using a test probe (such as a push pin) to simulate the mechanical stress in actual use, thereby detecting whether the product quality meets the standards.

[0004] In the prior art, patent CN210775019U discloses a push-pull force testing device, which mounts a push-pull force gauge on a horizontal moving mechanism and uses a lead screw drive to control the reciprocating movement of the force gauge to perform push or pull force tests on printed circuit board samples. However, in both electronics manufacturing and other fields, there are numerous product models, and different product models require different types of force and test head shapes for strength testing. Patent CN210775019U only provides a test head adapted to a single sample. When the model of the sample to be tested changes, the test head needs to be disassembled and replaced. Frequent manual disassembly and assembly of the test head not only affects testing efficiency, but the wear and tear caused by repeated disassembly and assembly can also easily affect the accuracy of the push-pull force testing device.

[0005] This application aims to address the shortcomings of existing equipment in terms of testing efficiency and accuracy in the field of high-precision physical performance testing, especially in semiconductor component manufacturing scenarios including LED packaging and IC packaging. Summary of the Invention

[0006] To overcome the problems existing in related technologies, this application provides a push-pull force testing device with multiple test heads. This push-pull force testing device can automatically change the appropriate test head for different test samples, reducing the frequency of disassembly and assembly operations, so as to ensure the accuracy of the push-pull force testing device.

[0007] The first aspect of this application provides a push-pull force testing device with multiple test blades, comprising: a controller; a sample stage; a test blade switching module, which includes a rotating chassis perpendicularly disposed to the sample stage; multiple test blade assemblies radially arranged on the rotating chassis; and a transmission mechanism controlled and connected to the controller, the transmission mechanism being connected to the rotating chassis, wherein the controller drives the rotating chassis to rotate by controlling the transmission mechanism, so that one of the multiple test blade assemblies points perpendicularly to the sample stage.

[0008] In some embodiments, the test blade assembly includes: a mounting base and a test blade mounted thereon, wherein the bottom of the mounting base is provided with at least one guide surface; a plurality of test blade fixing points are radially arranged on the rotating chassis, each test blade fixing point is provided with a mounting groove and a locking member, the inner wall of the mounting groove is provided with a guide surface corresponding to the guide surface, and the shape of the guide surface matches the shape of the guide surface; when the mounting base is inserted into the mounting groove along the guide surface and the guide direction of the guide surface, the locking member can abut against the mounting base to form a locking connection; when an external force is applied to disengage the locking member from the mounting base, the test blade assembly can exit the mounting groove along the guide direction.

[0009] In some embodiments, the test tip assembly includes: a limiting elastomer and a test tip; the limiting elastomer includes: a base and a limiting portion, the base of the limiting elastomer is mounted on the rotating chassis, and the limiting portion of the limiting elastomer has a receiving groove on its surface to receive the test tip and limit its movement; the limiting portion extends along the plane of the receiving groove opening to both sides of the groove opening to form an S-shaped spring, and the limiting portion is connected to the base through the S-shaped spring.

[0010] In some embodiments, the base includes a first protrusion structure and a first groove structure, both of which are located on the surfaces of the base and the limiting portion opposite to each other; the limiting portion includes a second protrusion structure corresponding to the shape of the first groove structure and a second groove structure corresponding to the shape of the first protrusion structure, wherein the first groove structure and the second protrusion structure are in clearance fit, and the first protrusion structure and the second groove structure are in clearance fit.

[0011] In some embodiments, the test tip switching module further includes: a test tip fixing bracket fixed on the rotating chassis, which includes a main spindle bracket and a plurality of wing frames connected thereto; the outer peripheral surface of the main spindle bracket is composed of a plurality of planes, and the inner peripheral surface of the main spindle bracket is a circular surface; the plurality of wing frames are arranged radially around the main spindle bracket, and each wing frame is a test tip fixing point for assembling the test tip assembly.

[0012] In some embodiments, the locking member includes: a buckle seat, a rotatable buckle head, a floating pin, and a locking limit block; the locking limit block and the mounting groove are disposed on the front side of the test tip fixing point and the locking limit block is located above the mounting groove, and the rotatable buckle head and the buckle seat are fixed on the back side of the test tip fixing point; the floating pin passes through the test tip fixing point, one end of the floating pin is connected to the rotation shaft of the rotatable buckle head, and the other end is connected to the locking limit block; when the rotatable buckle head rotates to engage with the buckle seat, the floating pin moves along the locking direction and drives the locking limit block to move towards the mounting groove, the locking direction being the direction from the front side of the test tip fixing point to the back side, until the locking limit block abuts against the mounting base placed in the mounting groove, forming a locking connection.

[0013] In some embodiments, the S-shaped spring sheet includes: a plurality of support plates and a curved plate connecting two adjacent support plates, wherein a distance sensor is provided between two adjacent support plates for monitoring the distance value between the two adjacent support plates.

[0014] In some embodiments, the controller is configured to: determine whether the transmission mechanism is in a working state; in response to the transmission mechanism being in a non-working state, acquire the static spacing value detected by the distance sensor; compare each static spacing value with the deformation safety value range to determine the target S-shaped spring, wherein at least one of the plurality of static spacing values ​​corresponding to the target S-shaped spring is outside the deformation safety value range; and output a prompt message to replace the test head assembly where the target S-shaped spring is located.

[0015] In some embodiments, the controller is configured to: determine whether the transmission mechanism is in a working state; in response to the transmission mechanism being in a working state, acquire the dynamic ranging result of the distance sensor on the test head assembly in a traveling state; and correct the force-displacement curve obtained from the push-pull force test based on the comparison result of the dynamic ranging result and the initial spacing value.

[0016] In some embodiments, when correcting the force-displacement curve obtained from the push-pull force test based on the comparison between the dynamic ranging result and the initial spacing value, the control device is configured to: correct the displacement error in the force-displacement curve based on the difference between the dynamic ranging result and its corresponding initial spacing value; and correct the force error in the force-displacement curve based on the difference between the dynamic ranging result and its corresponding initial spacing value and the material deformation correction coefficient of the S-shaped spring.

[0017] The technical solution provided in this application may include the following beneficial effects:

[0018] The push-pull force testing equipment provided in this application includes a test head switching module. This module features a rotating chassis with multiple test head assemblies arranged radially. The rotating chassis is perpendicular to the sample stage. Therefore, under the control of the controller, when the transmission mechanism rotates the rotating chassis to a suitable angle, the required test head assembly can be aligned with the sample stage, applying the necessary push or pull force to the sample. When the sample model changes, the controller can automatically switch the test head assembly by controlling the rotation angle, eliminating the need to disassemble and reassemble the test heads. This reduces disassembly and reassembly operations caused by sample changes, thereby improving testing efficiency and ensuring testing accuracy.

[0019] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and do not limit this application. Attached Figure Description

[0020] The above and other objects, features and advantages of this application will become more apparent from the more detailed description of exemplary embodiments thereof in conjunction with the accompanying drawings, wherein the same reference numerals generally represent the same components in the exemplary embodiments thereof.

[0021] Figure 1 This is a partial schematic diagram of the push-pull force testing device shown in the embodiments of this application;

[0022] Figure 2 This is a partial schematic diagram of a push-pull force testing device shown in some embodiments of this application;

[0023] Figure 3 This is a partial schematic diagram of a push-pull force testing device shown in some embodiments of this application;

[0024] Figure 4 This is a schematic flowchart illustrating the monitoring method for the test blade assembly shown in the embodiments of this application;

[0025] Figure 5 This is a schematic flowchart illustrating the test result correction method shown in the embodiments of this application;

[0026] 10-Control device, 20-Sample stage, 30-Test tip switching module, 31-Rotating chassis, 311-Mounting slot, 3111-Guide surface, 312-Locking element, 3121-Snap fastener, 3122-Rotable snap fastener, 3123-Floating pin, 3124-Locking limit block, 32-Test tip fixing bracket, 321-Spindle bracket, 322-Wing frame, 40-Test tip assembly, 41-Mounting base, 411-Guide surface, 42-Test tip, 43-Limiting elastomer, 431-Base, 432-Limiting part, 50-Transmission mechanism, 51-Z-axis moving mechanism. Detailed Implementation

[0027] Preferred embodiments of the present application will now be described in more detail with reference to the accompanying drawings. While preferred embodiments of the present application are shown in the drawings, it should be understood that the present application may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to make the present application more thorough and complete, and to fully convey the scope of the present application to those skilled in the art.

[0028] The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The singular forms “a,” “the,” and “the” used in this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used herein refers to and includes any or all possible combinations of one or more of the associated listed items.

[0029] It should be understood that although the terms "first," "second," "third," etc., may be used in this application to describe various information, this information should not be limited to these terms. These terms are only used to distinguish information of the same type from one another. For example, without departing from the scope of this application, first information may also be referred to as second information, and similarly, second information may also be referred to as first information. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0030] Existing push-pull force testing equipment only provides a single test head. When the model of the sample to be tested changes, due to the incompatibility of the compatible test heads, it is necessary to disassemble the test head on the push-pull force testing equipment and reinstall a test head of the appropriate model. Given the large number of product models, this frequent disassembly and reassembly of test heads during production is extremely inconvenient and negatively impacts production efficiency and equipment accuracy.

[0031] To address the aforementioned problems, this application provides a push-pull force testing device. The technical solution of this application embodiment is described in detail below with reference to the accompanying drawings.

[0032] Figure 1 This is a partial schematic diagram of the push-pull force testing device shown in an embodiment of this application. Figure 1 As shown in the embodiment of this application, the push-pull force testing device includes: a control device 10;

[0033] Sample stage 20;

[0034] The test tool switching module 30 includes a rotating base 31 that is perpendicular to the sample stage 20;

[0035] Multiple test head assemblies 40 are radially arranged on a rotating chassis 31;

[0036] The transmission mechanism 50 is connected to the control device 10 and is connected to the rotating chassis 31. The control device 10 drives the rotating chassis 31 to rotate by controlling the transmission mechanism 50 so that one of the multiple test blade assemblies 40 points vertically toward the sample stage 20.

[0037] Assuming the sample stage is located on the XY plane, the rotating chassis is set in the Z direction perpendicular to the XY plane. One of its multiple radial directions is parallel to the Z direction, i.e. perpendicular to the XY plane. Therefore, when multiple test blade assemblies are radially arranged on the rotating chassis, by rotating to adjust the specified test blade assembly to the specified radial direction, the specified test blade assembly can be used to apply a vertical pushing force or a vertical pulling force to the sample on the sample stage.

[0038] It should be noted that, in order for the test blade to be able to directly apply force, the test blade should be placed facing outwards when assembling the test blade assembly on the rotating chassis.

[0039] Furthermore, to ensure that the test blade is aligned with the sample on the sample stage, an X-axis moving mechanism and a Y-axis moving mechanism can be installed at the bottom of the sample stage. Both the X-axis and Y-axis moving mechanisms can be connected to a controller to adjust the position of the sample and align it with the test blade. As an example, the X-axis and / or Y-axis moving mechanisms can use electric guide rails. As another example, the X-axis and / or Y-axis moving mechanisms can use ball screws for transmission.

[0040] In this embodiment, the controller is connected to the transmission mechanism, which is connected to the rotating chassis. The controller drives the rotating chassis to rotate by controlling the transmission mechanism. As an example, the transmission mechanism includes a reducer and a motor. The rotating chassis is mounted on the reducer, and the motor is indirectly connected to the reducer via a belt drive or chain drive, etc. The reducer drives the rotating chassis to rotate. As another example, the transmission mechanism includes a reducer and a motor. The rotating chassis is mounted on the reducer, and the motor flange and the reducer input flange are directly bolted together. The motor shaft is directly inserted into the reducer shaft hole to achieve a transmission connection, and the reducer drives the rotating chassis to rotate. As yet another example, the transmission mechanism includes a reducer and a motor. The rotating chassis is mounted on the reducer, and the motor shaft and the reducer input shaft hole have a keyway with a flat key or spline embedded in it. Torque is transmitted through the key engagement to achieve transmission.

[0041] It should be noted that the above-described implementation methods of the transmission connection of various control devices-transmission mechanisms-rotating chassis are only examples, and other transmission connection methods are also applicable to this application.

[0042] Furthermore, the transmission mechanism 50 may also include a Z-axis moving mechanism 51. Figure 2 This is a partial schematic diagram of a push-pull force testing device shown in some embodiments of this application, such as... Figure 2 As shown, the test head switching module 30 is fixed on the Z-axis moving mechanism 51. The controller 10 controls the Z-axis moving mechanism 51 to drive the rotating chassis 31 to translate in the Z direction, shortening the distance between the test head and the sample to be tested, so that the test head can contact the sample and apply force. As an example, similar to the X-axis moving mechanism, the Z-axis moving mechanism adopts an electric guide rail, ball screw, or other transmission structure.

[0043] Due to space limitations in the push-pull force testing equipment, the number of test heads that can be assembled on the rotating chassis is also limited. When the test head switching module does not provide a test head compatible with the sample under test, the test head on the rotating chassis needs to be replaced. Alternatively, if a test head on the rotating chassis is damaged, it also needs to be removed and replaced. Disassembling and assembling test heads requires recalibrating their position and orientation to ensure they are radially aligned with the rotating chassis, making the operation relatively complex.

[0044] To improve the assembly efficiency of test blades, some embodiments of this application provide a test blade assembly. Figure 3 This is a partial schematic diagram of a push-pull force testing device shown in some embodiments of this application. The diagram is provided to facilitate understanding of the assembly method of the test head assembly and the test head switching module. Figure 3 The push-pull force testing equipment shown omits a set of test blade assemblies.

[0045] like Figure 3 As shown, the test cutter head assembly 40 includes: a mounting base 41 and a test cutter head 42 mounted thereon, and the bottom of the mounting base 41 is provided with at least one guide surface 411;

[0046] Multiple test tool fixing points are radially arranged on the rotating chassis 31. Each test tool fixing point is provided with a mounting groove 311 and a locking element 312. The inner wall of the mounting groove 311 is provided with a guide surface 3111 corresponding to the guide surface 411. The shape of the guide surface 411 matches the shape of the guide surface 3111.

[0047] When the mounting base 41 is inserted into the mounting groove 311 along the guiding direction of the guide surface 411 and the guide surface 3111, the locking member 312 can abut against the mounting base 41 to form a locking connection; when an external force is applied to make the locking member 312 disengage from the mounting base 41, the test cutter head assembly 40 can exit the mounting groove 311 along the guiding direction.

[0048] In this embodiment, the test head is not directly contacted and fixed to the rotating chassis. Instead, it is mounted on a mounting base to form a test head assembly, thereby indirectly assembling and fixing it to the rotating chassis through the mounting base. The rotating chassis provides multiple test head fixing points, each for assembling one test head assembly. Since the multiple test head fixing points are arranged radially, the assembled test head assembly is also radially arranged. In other words, the test head and the mounting base constitute a modular device. Each test head only needs to be positioned and calibrated once during the manufacturing of the test head assembly. When subsequently disassembling and assembling the test head assembly on the test head switching module, only the mounting base needs to be operated. The test head will not be damaged due to frequent disassembly and assembly, and the frequency of performing the complex positioning and calibration operation is also reduced.

[0049] To guide the assembly of the mounting base, each test tip fixing point is provided with a mounting slot for placing the mounting base. Furthermore, for ease of assembly and disassembly, the inner wall of the mounting slot has an inclined guide surface. The shape of this guide surface matches the guide surface at the bottom of the mounting base. Therefore, the direction in which the test tip assembly is inserted or withdrawn from the mounting slot can be determined based on the position of the guide surface and the guide surface, reducing the difficulty of assembly and disassembly and improving the efficiency of the test tip assembly assembly.

[0050] As an example, the guide surface can be a curved surface or other shaped surface additionally machined on the inner wall of the mounting groove, and correspondingly, the guide surface can be a matching shaped surface additionally machined on the mounting base. As another example, the guide surface can be the inner wall of the mounting groove itself, in which case the inner wall of the mounting groove is an inclined plane, and the inclination direction of the guide surface at the bottom of the mounting base is consistent with the inclination direction of the inner wall of the mounting groove.

[0051] In this embodiment, the locking element locks the mounting base within the mounting groove by abutting against it. As an example, the locking element can be a pressure plate, one end of which is positioned at the top of the mounting groove, and the other end abuts against the mounting base to form a locking connection. Further, both the pressure plate and the mounting base may have threaded holes; a screw passes through the threaded holes to lock the pressure plate onto the mounting base, forming the abutment. As another example, the locking element can employ a quick-release structure, allowing for rapid disassembly and installation without the need for additional tools. Figure 3 As shown, the locking component 312 includes: a buckle base 3121, a rotatable buckle head 3122, a floating pin 3123, and a locking limit block 3124. The locking limit block 3124 and the mounting groove 311 are positioned on the front of the test head fixing point, with the locking limit block 3124 located above the mounting groove 311. The rotatable buckle head 3122 and the buckle base 3121 are fixed to the back of the test head fixing point. The floating pin 3123 passes through the test head fixing point, with one end of the floating pin 3123... The rotating shaft of the rotatable buckle 3122 is connected to the other end of the locking limit block 3124. When the rotatable buckle 3122 is rotated to engage with the buckle seat 3121, the floating pin 3123 moves along the locking direction and drives the locking limit block 3124 to move towards the mounting groove 311. The locking direction is the direction from the front to the back of the test tool head fixing point, until the locking limit block 3124 abuts against the mounting base 41 placed in the mounting groove 311 to form a locking connection.

[0052] In this embodiment, the locking limit block functions similarly to the pressure plate described above. In the locked state, the locking limit block simultaneously presses against the top surface of the mounting base and the top of the mounting groove, thereby locking the mounting base within the mounting groove. Unlike the pressure plate, the locking limit block switches between the locked and unlocked states via a buckle, a rotatable buckle, and a floating pin. For ease of understanding, assume the test blade assembly is directly mounted on the rotating chassis. In this case, the locking limit block is located on the front of the rotating chassis, while the buckle and rotatable buckle are located on the back of the rotating chassis. The rotating chassis has a through hole through which the floating pin passes and can move up and down. One end of the floating pin is connected to the locking limit block. Therefore, when the floating pin moves up and down along the through hole, the locking limit block moves closer to or further away from the top of the mounting groove. The up-and-down movement of the floating pin is controlled by the rotation of the rotatable buckle. The other end of the floating pin is connected to the rotating shaft of the rotatable buckle. When the rotatable buckle rotates, the end of the floating pin is displaced, changing the distance between its end and the back of the rotating chassis, thus achieving upward or downward movement. When the rotatable buckle is engaged on the buckle seat, the rotatable buckle is in a locked state and the end of the floating pin moves to the farthest position from the back of the rotating chassis. Furthermore, the bottom of the locking limit block has an elastic element. When the rotatable buckle is in the locked state, the elastic element is compressed and applies elastic force to the mounting base to ensure that it is locked in the mounting groove.

[0053] The aforementioned locking mechanism allows for quick assembly and disassembly of the test head assembly simply by operating the rotatable buckle, further improving the efficiency of test head replacement in push-pull force testing equipment.

[0054] In theory, in order to reduce the disassembly of test head components and improve testing efficiency, the more test head components the test head switching module provides, the better. This requires the rotating chassis to provide a sufficiently large installation area. At the same time, the volume of the push-pull force testing equipment will also increase accordingly, which is not conducive to the placement and management of the equipment.

[0055] To integrate as many test head assemblies as possible onto the rotating chassis without increasing the size of the push-pull force testing equipment, some embodiments of this application provide a test head switching module, such as... Figure 3 As shown, in addition to the rotating chassis 31, the test head switching module 30 also includes a test head fixing bracket 32, which is fixed on the rotating chassis 31 and is used to support the test head assembly 40.

[0056] The test tool holder 32 includes a main spindle support 321 and multiple wings 322 connected to it. The multiple wings 322 are arranged radially around the main spindle support 321, and each wing 322 is a test tool fixing point, that is, each wing 322 is equipped with a test tool assembly 40. The outer peripheral surface of the main spindle support 321 is composed of multiple planes to facilitate the fixing of the wings 322. The polygonal outer peripheral surface can effectively disperse external forces, especially during the rotation of the rotating chassis, and can withstand the impact caused by motion inertia, centrifugal force, and motor vibration. Furthermore, the inner peripheral surface of the main spindle support 321 is a circular surface, which distributes the force evenly, effectively avoiding local stress concentration, reducing the probability of deformation of the test tool holder 32 during rotation, and minimizing the impact of local stress concentration on the test results.

[0057] Specifically, the spindle support 321 is a prism with a circular through hole in the axial direction, and the multiple wings 322 are multiple flat plates fixed to the outer prism surface and arranged radially. The mounting groove 311 is set on the flat plate. At this time, the mounting area provided to the test head assembly 40 is increased from the area of ​​a single rotating base to the sum of the areas of multiple planes perpendicular to the rotating base. This embodiment significantly increases the mounting area through the test head fixing bracket, enabling a single push-pull force testing device to integrate more test heads while maintaining its size. At the same time, the structural design of the spindle support reduces the negative impact of rotation on test heads and other parts, thereby ensuring the reliability of the test results.

[0058] In addition to structural improvements to the test head switching module to reduce the impact of rotation, other embodiments of this application also provide a test head assembly that similarly mitigates some of the impact caused by rotation through structural improvements.

[0059] In this embodiment, the test head assembly 40 includes a limiting elastic body 43 and a test head 42. The limiting elastic body 43 includes a base 431 and a limiting part 432. The base 431 of the limiting elastic body 43 is mounted on the rotating chassis 31. The surface of the limiting part 432 of the limiting elastic body 43 is provided with a receiving groove to receive and limit the test head. The groove wall restricts the displacement of the test head 42 in the left-right direction. Furthermore, the test head assembly 40 may also be provided with a tail fixing mechanism to fix the tail of the test head to the limiting elastic body, and a cover plate is provided on the top of the test head to restrict the displacement of the test head in the up-down direction.

[0060] Furthermore, the test head assembly 40 may also include a mounting base 41, which serves as an intermediate component to assemble the limiting elastic body 43 and the rotating chassis 31 together, thereby achieving an indirect connection between the test head 42 and the rotating chassis 31. The specific structure of the mounting base 41 has been described in detail in the embodiments shown above, and will not be repeated here.

[0061] Furthermore, if the test head switching module adopts the test head fixing bracket 32 ​​described in the previous embodiment, the mounting base 41 and the test head fixing bracket 32 ​​together serve as intermediate components to assemble the limiting elastic body 43 and the rotating chassis 31 together, thereby realizing the indirect connection between the test head 42 and the rotating chassis 31.

[0062] To mitigate the impact caused by motion inertia, centrifugal force, and motor vibration, the limiting portion 432 of the limiting elastomer 43 extends along the plane of the receiving groove opening to both sides of the groove opening to form an S-shaped spring piece 433. The limiting portion 432 is connected to the base 431 through the S-shaped spring piece 433. Figure 2 and Figure 3 As shown, two S-shaped spring pieces 433 extend from the two openings of the receiving groove to both sides, thus forming a limiting elastic body 43 with four S-shaped spring pieces 433. The arc-shaped structure of the S-shaped spring pieces 433 has a natural elastic deformation capability, which provides a certain buffer space in the radial direction of the rotating chassis. When the overall structure of the test head assembly is subjected to vibration, impact or external load, the S-shaped spring pieces 433 can absorb energy through their own tensile and compressive deformation, reduce vibration transmission, and avoid stress concentration and structural damage problems that are prone to occur in rigid connections. Especially in the application scenario of precision push-pull force testing equipment, it avoids the impact of stress concentration and structural damage on the accuracy of test results.

[0063] Furthermore, to limit the deformation range of the S-shaped spring and prevent excessive deformation that would shorten its service life, in some embodiments, it is assumed that the surface on the base opposite to the limiting portion is called the base mating surface, and the surface on the limiting portion opposite to the base is called the limiting portion mating surface. The base mating surface is provided with a first protrusion structure and a first groove structure, and the limiting portion mating surface is provided with a second protrusion structure and a second groove structure. The shape of the first protrusion structure matches the shape of the second groove structure, and the shape of the second protrusion structure matches the shape of the first groove structure. Specifically, the shapes of the first protrusion structure and the second groove structure are complementary, and the shapes of the second protrusion structure and the first groove structure are complementary, allowing the base mating surface and the limiting portion mating surface to nest together. Additionally, the first groove structure and the second protrusion structure are in a clearance fit, and the first protrusion structure and the second groove structure are in a clearance fit. Therefore, in a static state, the base mating surface and the limiting portion mating surface nest together but do not contact each other. Furthermore, the first protrusion structure and / or the second protrusion structure can adopt a dovetail structure to enhance the stability of the clearance fit.

[0064] This embodiment provides buffer protection in the radial and vertical directions of the rotating chassis through the S-shaped spring and the clearance fit between the base and the limiting part. At the same time, the clearance fit between the base and the limiting part also limits the deformation range of the S-shaped spring, preventing excessive deformation of the S-shaped spring and ensuring its service life.

[0065] It should be noted that in practical applications, either the test head switching module or the test head assembly can be improved using the methods described in the above embodiments, or both of the test head switching module and the test head assembly can be improved simultaneously using the methods described in the above two embodiments, thereby achieving better impact resistance.

[0066] Considering the limited service life of the S-shaped spring, in order to ensure timely replacement of S-shaped springs that have reached the end of their service life and to reduce the management cost of the test head assembly, some embodiments of this application provide a method for monitoring the test head assembly of the push-pull force testing device using this structural design.

[0067] In a push-pull force testing device using an S-shaped spring, the S-shaped spring comprises multiple support plates and a curved plate connecting adjacent support plates. The support plates, as the structural foundation, ensure the spring remains stable under stress, preventing excessive local deformation. The curved plate undergoes elastic deformation upon impact, consuming energy during this process to reduce vibration transmitted to other components; the distance between the support plates changes during this process. Based on this structure, to implement a monitoring method for the test cutter assembly, a distance sensor is first installed between adjacent support plates to monitor the distance between them, reflecting the deformation and absorbed energy. Then, the control device executes actions such as... Figure 4 The method shown is used to monitor the test head assembly.

[0068] Figure 4 This is a schematic flowchart illustrating the monitoring method for the test blade assembly shown in an embodiment of this application, as follows: Figure 4 As shown, in step S401, it is determined whether the transmission mechanism is in a working state;

[0069] In step S402, in response to the transmission mechanism being in a non-working state, the static distance value detected by the distance sensor is acquired;

[0070] In step S403, each static spacing value is compared with the deformation safety value range to determine the target S-shaped spring.

[0071] In step S404, a prompt message is output indicating that the test cutter head assembly containing the target S-shaped spring is to be replaced.

[0072] In this embodiment, step S401 requires determining whether the rotating chassis is rotating. If the transmission mechanism also includes a Z-axis moving mechanism, it is also necessary to determine whether the Z-axis moving mechanism is in operation. When both the rotating chassis and the Z-axis moving mechanism are stationary, the transmission mechanism is in a non-working state. At this time, the S-shaped spring can be considered as not bearing external loads. The distance sensor can detect the static distance value, which reflects the shape of the S-shaped spring and can be used to determine whether it still has the performance of deformation energy absorption.

[0073] Specifically, if the static spacing value is too small, it indicates that the curved panel between two adjacent support plates cannot provide sufficient compressive deformation space; if the static spacing value is too large, it indicates that the curved panel between two adjacent support plates cannot provide sufficient tensile deformation space. Therefore, a deformation safety value range can be set for each pair of adjacent support plates. For example, each deformation safety value range can be determined as follows: first, determine the elastic limit deformation based on the material type, stress mode, and usage environment of the S-shaped spring sheet; then, combine the elastic limit deformation and the initial spacing value of the adjacent support plates to form the deformation safety value range.

[0074] The elastic limit deformation can be obtained directly from the specifications of the specific material or through self-testing; there are no restrictions here.

[0075] In step S403 above, the target S-shaped spring meets the following condition: at least one of the multiple static spacing values ​​corresponding to the target S-shaped spring is outside the deformation safety value range, indicating that the deformation of the target S-shaped spring has exceeded its elastic limit deformation and no longer has the ability to absorb deformation energy, and it needs to be replaced. At this time, step S404 can be executed to prompt the operator to replace the test cutter head assembly. Different prompting methods can be selected according to the actual situation, such as voice alarm, warning light or other methods, which are not limited here.

[0076] It should be noted that since an S-shaped spring has multiple curved face plates and a test cutter head assembly contains multiple S-shaped springs, a test cutter head assembly can correspond to multiple static spacing values, and each S-shaped spring in the test cutter head assembly also corresponds to multiple static spacing values. As long as a static spacing value of one S-shaped spring in the test cutter head assembly reflects that it has reached its elastic limit deformation, a prompt message is output to replace the test cutter head assembly where the target S-shaped spring is located.

[0077] Considering that the S-shaped spring absorbs some energy through its own tensile and compressive deformation, in order to prevent errors caused by this energy and ensure the reliability of the push-pull force test results, some embodiments of this application provide a test result correction method for push-pull force test equipment using this structural design.

[0078] The distance sensor installed in the previous embodiment to monitor the performance of the S-shaped spring can also be used to provide a basis for correcting the test results.

[0079] The controller performs actions such as Figure 5 The method shown is used to correct the test results. Figure 5 This is a flowchart illustrating the test result correction method shown in the embodiments of this application, as follows: Figure 5 As shown, in step S501, it is determined whether the transmission mechanism is in a working state;

[0080] In step S502, in response to the transmission mechanism being in the working state, the dynamic distance measurement result of the distance sensor on the test head assembly in the traveling state is acquired;

[0081] In step S503, the force-displacement curve obtained from the push-pull force test is corrected based on the comparison between the dynamic distance measurement result and the initial spacing value.

[0082] In this embodiment, step S501 requires determining whether the rotating chassis is moving along the Z direction, i.e., whether the push-pull force testing device is performing the push-pull force testing process. When the rotating chassis is moving along the Z direction, the transmission mechanism is in working condition. At this time, the deformation of the S-shaped spring on the test cutter head assembly in the moving state will affect the detection result of the sensor on the test cutter head. Therefore, it is necessary to obtain the deformation of the S-shaped spring to compensate and correct the detection result.

[0083] Since only the sensor on one test head is collecting data during the test, in order to reduce interference from useless data and unnecessary consumption of computing resources, only the dynamic ranging results of the distance sensor on the test head assembly in motion are obtained.

[0084] The comparison between the dynamic ranging result and the initial spacing value reflects the deformation of the S-shaped spring at each moment, which causes the displacement error of the sensor on the test cutter head. Furthermore, the elastic potential energy absorbed by the S-shaped spring at each moment can be calculated using this deformation and the material type of the S-shaped spring; this elastic potential energy causes the force error of the sensor on the test cutter head. Based on this, step S503 is specifically performed as follows: The displacement error in the force-displacement curve is corrected based on the difference between the dynamic ranging result and its corresponding initial spacing value; and the force error in the force-displacement curve is corrected based on the difference between the dynamic ranging result and its corresponding initial spacing value and the material deformation correction coefficient of the S-shaped spring.

[0085] Furthermore, the dynamic ranging result from the distance sensor is a spacing-time curve. Based on this spacing-time curve and the initial spacing between adjacent support plates in the S-shaped spring, the deformation-time curve of the S-shaped spring during the test head's movement can be calculated. Even further, based on the deformation and material type of the S-shaped spring, the corresponding elastic force for each deformation can be calculated, thus generating an elastic force-S-shaped spring deformation curve.

[0086] Because the data acquisition from the sensors on the test cutter head is synchronized during the test head's movement, the elastic force-S-shaped spring deformation curve and the force-displacement curve obtained from the push-pull force test are aligned on the time axis. In other words, the elastic force-S-shaped spring deformation curve and the force-displacement curve obtained from the push-pull force test can essentially be considered as three-dimensional curves, with the three dimensions being length, force value, and time.

[0087] As an example, when performing step S503, the two curves mentioned above can be aligned on the time axis first, and then the two curves can be linearly superimposed on the length dimension and the force value dimension respectively, thereby correcting the displacement error and force value error in the force-displacement curve.

[0088] The above provides a simplified compensation method. As another example, the elastic-S-shaped spring deformation curve and force-displacement curve can be more accurately and intelligently corrected using a neural network model. For instance, historical test samples can be selected and tested using the push-pull force testing equipment of this embodiment to obtain the elastic-S-shaped spring deformation curve and the uncorrected force-displacement curve. Training samples are constructed using these two curves and the historical force-displacement curves of the historical test samples to train the neural network model, resulting in the final curve correction model. Subsequently, the elastic-S-shaped spring deformation curve of the sample to be tested and the obtained force-displacement curve are input into the curve correction model to automatically generate the corrected force-displacement curve.

[0089] For example, the selected neural network model can be a basic shallow neural network such as an error backpropagation neural network and a radial basis function neural network, or a deep neural network such as a convolutional neural network. As an example, the Physics Structure Informed Neural Networks (Ψ-NN) published in the international journal Nature Communications by a joint research team from the Institute of Mechanics and Tsinghua University can be selected.

[0090] The solution of this application has been described in detail above with reference to the accompanying drawings. In the above embodiments, the descriptions of each embodiment have different emphases; parts not described in detail in a certain embodiment can be referred to in the relevant descriptions of other embodiments. Those skilled in the art should also understand that the actions and modules involved in the specification are not necessarily essential to this application. Furthermore, it is understood that the steps in the method of this application embodiment can be adjusted, combined, and deleted according to actual needs, and the modules in the device of this application embodiment can be combined, divided, and deleted according to actual needs.

[0091] Furthermore, the methods illustrated in some embodiments of this application can also be implemented as a computer program or computer program product, which includes computer program code instructions for performing some or all of the steps in the methods described above in this application.

[0092] Alternatively, the methods illustrated in some embodiments of this application can also be implemented as a non-transitory machine-readable storage medium (or computer-readable storage medium, or machine-readable storage medium) storing executable code (or computer program, or computer instruction code) that, when executed by a processor of an electronic device (or electronic device, server, etc.), causes the processor to perform some or all of the steps of the methods described above according to this application.

[0093] Those skilled in the art will also understand that the various exemplary logic blocks, modules, circuits, and algorithm steps described in connection with the present application can be implemented as electronic hardware, computer software, or a combination of both.

[0094] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems and methods according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0095] The various embodiments of this application have been described above. These descriptions are exemplary and not exhaustive, nor are they limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen to best explain the principles, practical application, or improvement of the technology in the market, or to enable others skilled in the art to understand the embodiments disclosed herein.

Claims

1. A push-pull force testing device with multiple test blades, characterized in that, include: Controller (10); Sample stage (20); The test blade switching module (30) includes a rotating base (31) perpendicularly arranged to the sample stage (20) and a test blade fixing bracket (32) fixed on the rotating base (31). The test blade fixing bracket (32) includes a main shaft bracket (321) and multiple wings (322) connected thereto. The outer peripheral surface of the main shaft bracket (321) is composed of multiple planes, and the inner peripheral surface of the main shaft bracket (321) is a circular surface. The multiple wings (322) are arranged radially with the main shaft bracket (321) as the center. Each wing (322) is a test blade fixing point for assembling the test blade assembly (40). Multiple test blade fixing points are arranged radially on the rotating base (31). Each test blade fixing point is provided with a mounting groove (311) and a locking element (312). The inner wall of the mounting groove (311) is provided with a guide surface (3111). Multiple test blade assemblies (40) are radially arranged on the rotating chassis (31). Each test blade assembly (40) includes a mounting base (41) and test blades (42) mounted thereon. The mounting base (41) has at least one guide surface (411) at its bottom that corresponds to the guide surface (3111). The shape of the guide surface (411) matches the shape of the guide surface (3111). When the mounting base (41) is inserted into the mounting groove (311) along the guide surface (411) and the guide surface (3111), the locking member (312) can abut against the mounting base (41) to form a locking connection. When an external force is applied to disengage the locking member (312) from the mounting base (41), the test blade assembly (40) can exit the mounting groove (311) along the guide direction. The transmission mechanism (50) is connected to the control device (10) and is connected to the rotating chassis (31). The control device (10) drives the rotating chassis (31) to rotate by controlling the transmission mechanism (50) so that one of the plurality of test blade assemblies (40) points vertically to the sample stage (20).

2. The push-pull force testing device according to claim 1, characterized in that, The test blade assembly (40) includes: a limiting elastomer (43) and a test blade (42); The limiting elastomer (43) includes a base (431) and a limiting part (432). The base (431) of the limiting elastomer (43) is mounted on the rotating chassis (31). The limiting part (432) of the limiting elastomer (43) has a receiving groove on its surface to receive the test blade (42) and limit it. The limiting part (432) extends along the plane of the groove opening to both sides of the groove opening to form an S-shaped spring piece (433), and the limiting part (432) is connected to the base (431) through the S-shaped spring piece (433).

3. The push-pull force testing device according to claim 2, characterized in that, The base (431) includes a first protrusion structure and a first groove structure, both of which are located on the surfaces of the base (431) and the limiting part (432) opposite to each other; The limiting part (432) includes: a second protrusion structure corresponding to the shape of the first groove structure and a second groove structure corresponding to the shape of the first protrusion structure, wherein the first groove structure and the second protrusion structure are in clearance fit, and the first protrusion structure and the second groove structure are in clearance fit.

4. The push-pull force testing device according to claim 1, characterized in that, The locking component (312) includes: a buckle base (3121), a rotatable buckle head (3122), a floating pin (3123), and a locking limit block (3124). The locking limit block (3124) and the mounting groove (311) are disposed on the front of the test blade fixing point and the locking limit block (3124) is located above the mounting groove (311). The rotatable buckle (3122) and the buckle seat (3121) are fixed on the back of the test blade fixing point. The floating pin (3123) passes through the fixed point of the test cutter head. One end of the floating pin (3123) is connected to the rotating shaft of the rotatable buckle (3122), and the other end is connected to the locking limit block (3124). When the rotatable buckle (3122) rotates to engage with the buckle seat (3121), the floating pin (3123) moves along the locking direction and drives the locking limit block (3124) to move toward the mounting groove (311). The locking direction is the direction from the front to the back of the test blade fixing point, until the locking limit block (3124) abuts against the mounting base (41) placed in the mounting groove (311) to form a locking connection.

5. The push-pull force testing device according to claim 2, characterized in that, The S-shaped spring sheet (433) includes: multiple support plates and a curved plate connecting two adjacent support plates. A distance sensor is provided between two adjacent support plates to monitor the distance value between the two adjacent support plates.

6. The push-pull force testing device according to claim 5, characterized in that, The controller is configured to: Determine whether the transmission mechanism is in working condition; In response to the transmission mechanism being in a non-working state, the static distance value detected by the distance sensor is acquired; Each static spacing value is compared with the deformation safety value range to determine the target S-shaped spring clip, wherein at least one of the multiple static spacing values ​​corresponding to the target S-shaped spring clip is outside the deformation safety value range; Output a prompt message indicating that the test cutter head assembly containing the target S-shaped spring piece should be replaced.

7. The push-pull force testing device according to claim 5 or 6, characterized in that, The controller is configured to: Determine whether the transmission mechanism is in working condition; In response to the transmission mechanism being in operation, the dynamic ranging result of the distance sensor on the test head assembly in the traveling state is acquired; The force-displacement curve obtained from the push-pull force test is corrected based on the comparison between the dynamic distance measurement results and the initial spacing value.

8. The push-pull force testing device according to claim 7, characterized in that, When correcting the force-displacement curve obtained from the push-pull force test based on the comparison between the dynamic ranging result and the initial spacing value, the control device is configured to: The displacement error in the force-displacement curve is corrected based on the difference between the dynamic ranging result and its corresponding initial spacing value. The force error in the force-displacement curve is corrected based on the difference between the dynamic ranging result and its corresponding initial spacing value and the material deformation correction coefficient of the S-shaped spring.

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