TXS system channel response time automatic testing device based on wireless transmission function

By designing an automatic test device for the channel response time of the TXS system based on wireless transmission, the problems of frequent wiring and manual identification errors in the existing technology are solved, and efficient and accurate automated testing is achieved.

CN121750119APending Publication Date: 2026-03-27CNNC NUCLEAR POWER OPERATION MANAGEMENT CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-26
Publication Date
2026-03-27

AI Technical Summary

Technical Problem

Existing methods for testing the channel response time of TXS systems require frequent changes to wiring and signal generators, and the test results rely on manual waveform identification, which is prone to errors and inefficient.

Method used

Design an automatic test device for the channel response time of a TXS system based on wireless transmission. The device employs a wireless transmission module, a signal output module, a controller module, and an input acquisition module. It utilizes a programmable resistor array module and a high-precision timer to automate the test and reduce human error.

Benefits of technology

Wireless transmission control was achieved, reducing on-site wiring work, improving testing efficiency, shortening testing time, reducing human error in reading, and improving channel input accuracy and test result accuracy.

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Abstract

The invention belongs to the technical field of response time testing, and particularly relates to a TXS system channel response time automatic testing device based on a wireless transmission function. A handle is arranged on the shell, plastic covers are arranged on the two sides of the shell, the panel is installed on the shell through fixing screws, and a signal output module, a controller module, an input acquisition module, a wireless transmission module and an upper computer are arranged in the shell. The upper computer is connected with the signal output module, the controller module, the input acquisition module and the wireless transmission module, the signal output module, the controller module, the input acquisition module and the wireless transmission module are mutually connected, and the TXS system is connected with the signal output module and the input acquisition module. The wireless transmission controller is used for replacing hard wiring connection, so that the field wiring work is reduced, the test efficiency is improved, and the test time is greatly shortened.
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Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of response time test, and particularly relates to a TXS system channel response time automatic test device based on wireless transmission function. BACKGROUND

[0002] The reactor protection system based on the TXS platform is an important system for ensuring stable operation of the reactor, and relevant regulations have strict requirements on the channel response time of the protection system. According to literature retrieval, there is no automatic test technology and device for the channel response time of the TXS system at present, and the commonly used test method is to use a signal generator and a high-speed recorder for testing. This method has the following defects: the tester needs to frequently change the wiring and the test signal type, and different signal types need to use different signal generators, for example, an external current signal generator is needed for a current signal, and an external resistance box is needed for a resistance signal. The test result is recorded in the form of a waveform by the high-speed recorder, and the width of the waveform needs to be identified manually, and manual identification will have an error of millisecond level. The test result needs to be manually entered into the computer. SUMMARY

[0003] The application aims to provide a TXS system channel response time automatic test device based on wireless transmission function, and solve the above technical problems.

[0004] To achieve the above-mentioned purpose, the technical solution adopted by the application is as follows:

[0005] A TXS system channel response time automatic test device based on wireless transmission function, a handle is arranged on the shell, plastic covers are arranged on the two sides of the shell, a panel is installed on the shell through fixing screws, a signal output module, a controller module, an input acquisition module, a wireless transmission module and an upper computer are arranged in the shell; the upper computer is connected with the signal output module, the controller module, the input acquisition module and the wireless transmission module, the signal output module, the controller module, the input acquisition module and the wireless transmission module are connected with each other, and a TXS system is connected with the signal output module and the input acquisition module.

[0006] The shell is made of aluminum profile and is subjected to surface electrostatic spraying treatment.

[0007] The panel is made of aluminum alloy and is subjected to surface black oxidation treatment.

[0008] The controller module adopts a 32-bit Cortex-M3 processor, provides three power saving modes of sleep, stop and standby, and the minimum working circuit of the controller module includes a reset circuit, a download JTAG interface and an external crystal oscillator circuit. Active crystal oscillator is adopted for timing, the frequency is 10Mhz, the timing accuracy is microsecond level, and when the individual second level time channel is tested, the upper computer is used for frequency division, and the timing accuracy is 10 microseconds.

[0009] The signal output module adopts AD5750-2 driver chip, which is a single-channel, precise voltage / current output driver. The voltage output range is programmed as 0-5V, 0-10V, -5-+5V and -10-+10V, and 20% over-range setting is provided. The current output programming range is: 4-20mA, 0-20mA, -20-+20mA, with 2% over-range setting. The current output can be source current or passive current. The voltage and current output pins are connected together, and the output mode is selected according to the actual demand. The resistance output signal adopts a high-precision, high-step resolution programmable resistance array module. The programmable resistance array module uses electromagnetic relays + real resistance network. The resistance uses high-precision low-temperature drift non-inductive resistance, with an accuracy of 0.01% and a temperature coefficient of 2PPM, to realize programmable real resistance output. The output range is 0.001Ω-1MΩ, and the step precision is 0.001Ω.

[0010] The input acquisition module can acquire voltage and current signals, and can also acquire switching signals. When the acquisition object is current, an analog switch is switched to a high-precision sampling resistor in series to realize current-to-voltage conversion. When the input is a voltage signal, the switch is disconnected, and the voltage signal is not passed through the resistor. After the voltage signal is amplified, it is sent to the ADC for acquisition. The ADC conversion chip selects a 16-bit ADC with a standard SPI interface, and works in a single power supply mode to process ±10V and ±5V bipolar input signals. By using temperature drift curve correction technology and XFET technology, the nonlinearity of voltage change with temperature is minimized.

[0011] The upper computer has a human-machine interface, including a test operation interface, a data processing interface and a system setting interface, which can issue test commands and receive test results.

[0012] The wireless transmission module is powered by DC 5-36V, has an RJ45 interface, and can connect up to 32 devices with a maximum load capacity, with a communication distance of 1200 meters. The upper computer transmits signals through the wireless transmission module, and the transmission content includes cabinet information, channel information, signal type, response time test results.

[0013] For the same channel, three consecutive acquisitions are performed, and the maximum value is taken as the final value.

[0014] Ensure that there is no shutdown signal trigger before the test, determine the test channel, connect the test device output signal cable to the test channel, and the host computer sends a trigger signal to the test device according to the signal type of the determined channel, and for high value trigger, the trigger signal with a trigger value of 105% is sent by default, and for low value trigger, the trigger signal with a trigger value of 95% is sent by default, when the trigger signal is sent, the time point t0 is recorded, when the reactor protection system shutdown signal / special signal relay contact is reversed, the time point t1 is recorded, the reactor protection system channel response time t=t1-t0 is calculated, multiple tests are taken, the maximum value is taken as the channel response time, and the measured data is wirelessly transmitted to the host computer. The host computer automatically judges whether the data is qualified according to the judgment standard and draws a conclusion, and the test personnel exports or prints all the measured data according to the preset document template.

[0015] The beneficial effects obtained by the present application are:

[0016] The present application uses a wireless transmission controller to replace hard-wired connection, reduces field wiring work, improves test efficiency, and greatly shortens test time. The resistance signal simulation signal adopts a program-controlled resistance array module, the program-controlled resistance array module uses an electromagnetic relay + real resistance network, the resistance uses a high-precision low-temperature drift non-inductive resistance, the precision is 0.01%, the temperature coefficient is 2PPM, the programmable real resistance output can be realized, the output range is 0.001Ω-1MΩ, and the channel input precision is improved. The timing adopts crystal oscillator measurement, the error is microsecond level, compared with the traditional manual reading of high-speed recorder waveform test method, the human reading error is reduced. One channel test adopts three times of acquisition to take the maximum value method, and the uncertainty error of the channel is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 It is an appearance diagram of the TXS system channel response time automatic test device based on the wireless transmission function;

[0018] Figure 2 It is a structural diagram of the TXS system channel response time automatic test device based on the wireless transmission function;

[0019] Figure 3 It is a flow chart of the TXS system channel response time automatic test method based on the wireless transmission function. DETAILED DESCRIPTION

[0020] The present application will be described in detail below in combination with the drawings and specific embodiments.

[0021] A TXS system channel response time automatic test device based on wireless transmission function includes a signal output module 6, a controller module 7, an input acquisition module 8, a wireless transmission module 9, a host computer 10, a shell 1, a plastic cover 2, a handle 3, a panel 4, and a fixing screw 5.

[0022] The shell 1 is provided with a handle 3, and both sides of the shell 1 are provided with a plastic cover 2. A panel 4 is installed on the shell 1 by a fixing screw 5. The shell 1 is internally provided with a signal output module 6, a controller module 7, an input collection module 8, a wireless transmission module 9 and an upper computer 10. The upper computer 10 is connected with the signal output module 6, the controller module 7, the input collection module 8 and the wireless transmission module 9. The signal output module 6, the controller module 7, the input collection module 8 and the wireless transmission module 9 are connected with each other. The TXS system is connected with the signal output module 6 and the input collection module 8. The shell 1 is made of aluminum profile and is subjected to electrostatic spraying treatment on the surface. The plastic cover 2 is made of plastic. The panel 4 is made of aluminum alloy and is subjected to black oxidation treatment on the surface.

[0023] The controller module 7 is installed in the shell 1 and adopts single-chip microcomputer technology and a 32-bit Cortex-M3 processor to provide three power-saving modes of sleep, stop and standby. The minimum working circuit of the controller module 7 includes a reset circuit, a download JTAG interface and an external crystal oscillator circuit. Active crystal oscillator is adopted for timing, the frequency is 10Mhz, and the timing accuracy is microsecond level. When an individual second-level time channel is tested, the upper computer 10 is used for frequency division, and the timing accuracy is 10 microseconds.

[0024] The signal output module 6 adopts an AD5750-2 driver chip. The chip is a single-channel, precision voltage / current output driver. The voltage output range can be programmed as 0-5V, 0-10V, -5-+5V and -10-+10V, and 20% of the over-range setting is provided. The current output can be programmed as the following ranges: 4-20mA, 0-20mA, -20-+20mA, and 2% of the over-range setting is provided. The current output can be a source current or a passive current, so it can be interfaced with a wide range of sensors or actuators. The voltage and current output pins are connected together, and the output mode is selected according to the actual demand. The resistance output signal adopts a high-precision, high-step resolution programmable resistance array module. The programmable resistance array module uses an electromagnetic relay + real resistance network. The resistance adopts a high-precision, low-temperature-drift non-inductive resistance with an accuracy of 0.01% and a temperature coefficient of 2PPM. The programmable real resistance output can be realized, the output range is 0.001Ω-1MΩ, and the step precision is 0.001Ω.

[0025] The input acquisition module 8 can acquire both voltage and current signals and switch signals. When the acquisition object is current, an analog switch is switched to a high-precision sampling resistor in series to realize the conversion of current to voltage. When the input is a voltage signal, the switch is disconnected, and the voltage signal does not pass through the resistor. The voltage signal is sent to the ADC for acquisition after being amplified. The ADC conversion chip is a 16-bit ADC with a standard SPI interface and a single power supply working mode, which can process ±10V and ±5V bipolar input signals. By using temperature drift curve correction technology and XFET technology, the nonlinearity of voltage change with temperature can be minimized.

[0026] The host computer 10 has a human-machine interface, including a test operation interface, a data processing interface, and a system setting interface, and communicates wirelessly with the test device to issue test commands and receive test results.

[0027] The wireless transmission module 9 is powered by DC 5-36V and has an RJ45 interface with a maximum load capacity of 32 devices and a communication distance of 1200 meters. The host computer 10 communicates wirelessly with the test device to transmit signals. The transmission content includes cabinet information, channel information, signal type, response time test results, etc. For the same channel, the system continuously collects three times, and takes the maximum value as the final value.

[0028] System initialization ensures that no trip signal is triggered before the test. The test channel is determined, and the test device output signal cable is connected to the test channel. Trigger signal: the host computer sends a trigger signal to the test device according to the signal type of the determined channel. For high value trigger, the default trigger value is 105%, and for low value trigger, the default trigger value is 95%. Trigger time collection: when the trigger signal is sent, the time point t0 is recorded, and the return signal is collected. When the reactor protection system trip signal / special signal relay contact reverses, the time point t1 is recorded, and the reactor protection system channel response time is calculated. The test device calculates the channel response time t=t 1- t0. Multiple tests are taken to get the maximum value as the channel response time. Data wireless transmission: the test device transmits the measured data wirelessly to the host computer. Test conclusion: the host computer automatically judges whether the data is qualified according to the judgment standard and draws a conclusion. Data export: the test personnel can export or print all the measured data according to the preset document template.

Claims

1. A wireless transport function based (TXS) system channel response time automatic test apparatus, characterized by: A handle is arranged on the shell, plastic covers are arranged on both sides of the shell, the panel is installed on the shell through fixing screws, a signal output module, a controller module, an input acquisition module, a wireless transmission module and an upper computer are arranged in the shell; the upper computer is connected with the signal output module, the controller module, the input acquisition module and the wireless transmission module, the signal output module, the controller module, the input acquisition module and the wireless transmission module are connected with each other, and the TXS system is connected with the signal output module and the input acquisition module.

2. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: The shell is made of aluminum profile, and the surface is treated by electrostatic spraying.

3. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: The panel is made of aluminum alloy, and the surface is treated by black oxidation.

4. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: The controller module adopts a 32-bit Cortex-M3 processor, provides three power-saving modes of sleep, stop and standby, and the minimum working circuit of the controller module comprises a reset circuit, a download JTAG interface and an external crystal oscillator circuit; an active crystal oscillator is adopted for timing, the frequency is 10Mhz, the timing accuracy is microsecond level, and when an individual second-level time channel is tested, the upper computer is used for frequency division, and the timing accuracy is 10 microseconds.

5. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: The signal output module adopts an AD5750-2 driver chip, is a single-channel, precise voltage / current output driver, the voltage output range is programmed as 0-5V, 0-10V, -5-+5V and -10-+10V, 20% of the over-range setting is provided, the current output programming range is 4-20mA, 0-20mA and -20-+20mA, 2% of the over-range setting is provided, the current output can be source current or passive current, the voltage and current output pins are connected together, the output mode is selected according to actual requirements, the resistance output signal adopts a high-precision, high-step resolution program-controlled resistance array module, the program-controlled resistance array module uses an electromagnetic relay + real resistance network, the resistance adopts a high-precision, low-temperature-drift non-inductive resistance, the accuracy is 0.01%, the temperature coefficient is 2PPM, the programmable real resistance output is realized, the output range is 0.001Ω-1MΩ, and the step precision is 0.001Ω.

6. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: The input acquisition module can acquire voltage and current signals and also can acquire switching value signals; when the acquisition object is current, a high-precision sampling resistance connected in series is switched to realize current-to-voltage conversion; when the input is a voltage signal, the switch is disconnected, the voltage signal does not pass through the resistance, and the voltage signal is sent into an ADC for acquisition after amplification; the ADC conversion chip selects a 16-bit ADC, a standard SPI interface and a single power supply working mode, processes ±10V and ±5V bipolar input signals, and utilizes temperature drift curve correction technology and XFET technology to minimize the nonlinearity of voltage change with temperature.

7. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: The upper computer has a man-machine interface, including a test operation interface, a data processing interface and a system setting interface, test commands are issued, and test results are received.

8. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: The wireless transmission module is powered by DC 5-36V, has an RJ45 interface, the maximum load capacity can connect 32 devices, the communication distance is 1200 meters, and the upper computer transmits signals through the wireless transmission module; the transmission content includes cabinet information, channel information, signal type and response time test results.

9. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: For the same channel, three times in succession, take the maximum value as the final value.

10. The wireless transport function based (TXS) system channel response time automatic test apparatus of claim 1, wherein: Ensure that there is no shutdown signal trigger before the test, determine the test channel, connect the test device output signal cable to the test channel, and send the trigger signal to the test device according to the signal type of the determined channel. For high value trigger, the default trigger value is 105% of the trigger signal. For low value trigger, the default trigger value is 95% of the trigger signal. When the trigger signal is sent, record the time point t0. When the reactor protection system shutdown signal / special signal relay contact reverses, record the time point t1. Calculate the reactor protection system channel response time t=t1-t0. Test multiple times, take the maximum value as the channel response time, and transmit the measured data to the host computer wirelessly. The host computer automatically judges whether the data is qualified according to the judgment standard and draws a conclusion. The test personnel will export or print all the measured data according to the preset document template.