Measurement knowledge intensive retrieval enhancement generation method, system and equipment

By constructing a multi-level metrology knowledge base with a structured index and vector database, and combining it with a large language model, the problems of accurate positioning and dynamic association in metrology knowledge retrieval are solved, enabling efficient and accurate acquisition of professional knowledge and supporting dynamic updates and traceability of metrology knowledge.

CN121935344APending Publication Date: 2026-04-28BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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Patent Information

Application Number
CN202511840356.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-08
Publication Date
2026-04-28

AI Technical Summary

Technical Problem

When faced with complex metrological tasks involving multiple levels and multiple fields, existing technologies suffer from low knowledge retrieval efficiency and weak semantic understanding capabilities, making it difficult to accurately locate and dynamically associate professional knowledge. This leads to delayed or insufficient technical decision-making, failing to meet the high requirements for accuracy, timeliness, and traceability of knowledge in scientific research and testing.

Method used

A multi-level metrology knowledge base structured index is constructed. By parsing the hierarchical semantic units in metrology procedure documents, a recursive and related index structure is generated. A vector database is also constructed to encode user queries and perform similarity matching with a large language model to generate response results that conform to metrology field standards.

Benefits of technology

It enables fine-grained organization and semantic association of professional knowledge, improves the accuracy and efficiency of knowledge retrieval, reduces computational load, supports dynamic updates of metrological knowledge, and meets the requirements of accurate knowledge location and traceability in the metrology field.

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Abstract

The invention provides a measurement knowledge intensive retrieval enhancement generation method and system. The method comprises the following steps: constructing a multi-level measurement knowledge base structured index; constructing a vector database based on a structured knowledge base corresponding to the structured index; and encoding a user query, performing similarity matching on the encoded query and the vector database, and inputting a matching result into the large language model to obtain a target response result. According to the method and the device, when the new rule is metered to be released, the new rule is analyzed into the semantic unit, the structured index and the coding vector update database are supplemented, the large model can generate the response based on the new knowledge, the large model does not need to be retrained, and the problem that knowledge update is lagged in a traditional method is solved.
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