Chip pin alignment contact test device and method for non-feedback motor
By using a method that synchronizes the movement of a binocular camera and a probe, the chip pin positions can be identified and dynamically corrected in real time, solving the problem of insufficient testing accuracy and efficiency in highly integrated circuits and realizing efficient and accurate alignment contact testing in feedbackless motor scenarios.
Patent Information
- Application Number
- CN202610131248.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-30
- Publication Date
- 2026-05-15
AI Technical Summary
Existing chip pin alignment testing methods lack sufficient accuracy and efficiency in highly integrated circuits, failing to meet the needs of large-scale production, especially in scenarios with no feedback motors where there is a lack of effective automatic alignment methods.
The device uses a binocular camera to move synchronously with the probe, which identifies the pin position in real time and drives a feedbackless motor to align the probe with the contact pin. It then dynamically corrects the deviation by calculating the deviation information to achieve precise alignment.
It improves testing accuracy and efficiency, meets the batch testing needs of large-scale integrated circuit production, is suitable for feedbackless motor scenarios, simplifies operation steps, and improves the accuracy and reliability of test data.
Smart Images
Figure CN122043191A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of electromagnetic compatibility technology, and in particular to a chip pin alignment contact testing device and method for feedbackless motors. Background Technology
[0002] Currently, the alignment of test probes with the pins under test (DUT) in electrostatic discharge (ESD) testing of charged device models (CDMs) involves either pre-observing the DUT package to draw a pinout diagram, completing coordinate system calibration, probe path planning, and combining this with motor feedback to achieve alignment, or having an operator perform alignment through camera observation and calibration. However, with the rapid development of integrated circuit manufacturing technology, electronic components are becoming increasingly highly integrated and their feature sizes are shrinking. The minute positional movements of the DUT during testing have significantly impacted testing accuracy. This alignment method can no longer meet the ESD testing requirements of CDMs used in large-scale integrated circuit production. Summary of the Invention
[0003] The purpose of this invention is to provide a chip pin alignment contact test device and method for feedbackless motors. By automatically driving the test probe to align with the pin and correcting deviations in real time during the test process, the invention solves the problems of long time consumption, low efficiency and low accuracy in pin and test probe alignment.
[0004] To achieve the above objectives, the present invention is implemented using the following technical solution:
[0005] In a first aspect, the present invention provides a chip pin alignment contact testing device for a feedbackless motor, comprising:
[0006] Probes are used to make contact with pins to complete alignment contact tests;
[0007] A binocular camera moves synchronously with the probe to acquire images of the chip under test and calibration points, and sends them to the host computer, which then calculates the three-dimensional coordinate positions of each pin on the chip under test and the initial coordinate positions of the calibration points. The chip under test includes several pins arranged in sequence, which, along with the calibration points, are located at corresponding fixed positions on the test platform.
[0008] The host computer is also used to send test commands to the main control board based on the three-dimensional coordinate position of the first pin. The main control board drives the feedbackless motor based on the test commands, thereby driving the probe to complete the alignment contact test of the first pin.
[0009] The host computer is also used to determine whether the alignment contact test of the first pin is successful. If successful, the following steps are executed sequentially for each of the remaining pins:
[0010] The binocular camera The calibration point image is acquired and sent to the host computer, which then calculates the calibration point's first value. Each coordinate position;
[0011] The host computer is also used for the first calibration point. The probe's actual movement distance is calculated using the initial coordinate position and the current coordinate position. This actual movement distance is then compared with the preset theoretical movement distance to obtain deviation information. Finally, it is determined whether the deviation information exceeds a preset minimum deviation threshold.
[0012] When the deviation information exceeds the preset minimum deviation threshold, the host computer generates correction and test commands based on the deviation information and sends them to the main control board. The main control board then drives the probe to move to the next step based on the correction command. The three-dimensional coordinates of the pin are located, and the probe is driven to complete the test based on the test command. Alignment contact test of each pin;
[0013] When the deviation information is less than or equal to the preset minimum deviation threshold, the host computer sends a test command to the main control board, causing the main control board to drive the probe to complete the first test. Alignment contact test of each pin.
[0014] In conjunction with the first aspect, optionally, the relative position of the probe and the binocular camera is fixed, and the horizontal distance and vertical height difference between them remain constant, so that the center point of the image captured by the binocular camera and the probe maintain a known absolute positional relationship.
[0015] In conjunction with the first aspect, optionally, the formula for calculating the known absolute positional relationship is:
[0016] ;
[0017] In the formula, Let A be the coordinates of a point on the probe in the world coordinate system. Let point B be the coordinates of the center point of the image captured by the binocular camera in the world coordinate system on the test platform. The actual distance the probe moves in the three directions of the coordinate axis when point A contacts point B, driven by a non-feedback motor.
[0018] In conjunction with the first aspect, optionally, the method for calculating the three-dimensional coordinate position of each pin includes:
[0019] Based on the image of the chip under test, obtain the pixel coordinates of each pin; establish a set of transformation equations, and substitute the pixel coordinates of each pin into the set of transformation equations to calculate the three-dimensional coordinate position of each pin.
[0020] In conjunction with the first aspect, optionally, the system of transformation equations is as follows:
[0021] ;
[0022] In the formula: For pins Coordinate position in the world coordinate system; and For pins The corresponding pixel coordinate position in the pixel coordinate system; , , and , , These are the assumed transformation coefficients; The depth information obtained through binocular vision is the height distance from the pin to the binocular camera.
[0023] The above transformation equations related to and The formula simplifies to:
[0024] ;
[0025] In the formula: and In the pixel coordinate system shaft and The pixel equivalent of the axis; and This is the offset of the origin O in the physical coordinate system.
[0026] In conjunction with the first aspect, optionally, the solution for the pixel equivalent and the offset of the origin O in the physical coordinate system is as follows:
[0027] The pixel coordinates of the calibration point are input into the calibration equation set, and the pixel equivalent and the offset of the origin O in the physical coordinate system are obtained by solving the calibration equation set. The expression of the calibration equation set is as follows:
[0028] ;
[0029] ;
[0030] In the formula: These are the calibration points on the calibration plate; and This refers to the pixel coordinates of the calibration point in the pixel coordinate system. and This refers to the physical coordinate position of the calibration point in the physical coordinate system.
[0031] In conjunction with the first aspect, optionally, the testing device further includes a display screen, which is electrically connected to the binocular camera and the host computer, and is used to display the image of the chip under test and the calibration point image acquired by the binocular camera, the three-dimensional coordinate position of each pin, the coordinate position of the calibration point, and the alignment contact test results.
[0032] In conjunction with the first aspect, optionally, the display screen is also equipped with a control interface, which serves as an operation entry point for controlling the binocular camera and the host computer.
[0033] In conjunction with the first aspect, optionally, the testing device further includes a storage module, which is connected to the binocular camera and the host computer respectively, for acquiring and saving the images of the chip under test and calibration points captured by the binocular camera, the three-dimensional coordinate positions of each pin, the coordinate positions of the calibration points, and the alignment contact test results.
[0034] Secondly, the present invention also provides a chip pin alignment contact test method for feedbackless motors, comprising:
[0035] Make contact between the probe and the first pin of the chip under test;
[0036] A binocular camera that moves synchronously with the probe captures images of the chip under test and calibration points, and sends them to the host computer. The host computer then calculates the three-dimensional coordinate positions of each pin on the chip under test and the initial coordinate positions of the calibration points. The chip under test consists of several pins arranged in sequence, which, along with the calibration points, are located at corresponding fixed positions on the test platform.
[0037] The host computer sends a test command to the main control board based on the three-dimensional coordinate position of the first pin. The main control board drives a feedbackless motor based on the test command, thereby driving the probe to complete the alignment contact test of the first pin.
[0038] The host computer is used to determine whether the alignment contact test of the first pin is successful. If successful, the following steps are executed sequentially for the remaining pins:
[0039] Using the binocular camera The calibration point image is acquired and sent to the host computer, which then calculates the calibration point's first value. Each coordinate position;
[0040] Using the host computer based on the calibration point The probe's actual movement distance is calculated using the initial coordinate position and the current coordinate position. This actual movement distance is then compared with the preset theoretical movement distance to obtain deviation information. Finally, it is determined whether the deviation information exceeds a preset minimum deviation threshold.
[0041] When the deviation information exceeds the preset minimum deviation threshold, the host computer generates correction and test commands based on the deviation information and sends them to the main control board. The main control board then drives the probe to move to the next step based on the correction command. The three-dimensional coordinates of the pin are located, and the probe is driven to complete the test based on the test command. Alignment contact test of each pin;
[0042] When the deviation information is less than or equal to the preset minimum deviation threshold, the host computer sends a test command to the main control board, causing the main control board to drive the probe to complete the first test. Alignment contact test of each pin.
[0043] Compared with the prior art, the beneficial effects achieved by the present invention are as follows:
[0044] This invention utilizes images of the chip under test captured by a binocular camera to identify pin positions in real time and control the probe to align with the pins, simplifying the overall operation and reducing manual intervention. During testing, the first pin is aligned first to prevent malfunctions in subsequent tests due to factors such as the chip not being charged. Only after ensuring the first pin yields results are the remaining pins tested, improving efficiency. The actual probe movement distance is reflected by real-time monitoring of the relative displacement of the calibration point in the image captured by the moving binocular camera, compared with a preset theoretical probe movement distance to calculate deviation information. The deviation information is then compared with a preset minimum deviation threshold to determine whether a correction command needs to be generated and sent to the main control board. This achieves precise capture and dynamic correction of deviations during testing, improving test accuracy and the reliability of test data. It addresses the accuracy shortcomings of traditional manual alignment and conventional automated systems, and eliminates the need for motor feedback, specifically adapting to testing scenarios without feedback motors, filling a gap in existing technology for this scenario. It ensures both accuracy and efficiency, meeting the batch testing needs of large-scale integrated circuit production.
[0045] This invention fixes the positions of the binocular camera and the probe, keeping them in a known absolute position. When the probe moves without a feedback motor, the binocular camera moves synchronously with the probe. Therefore, the images captured by the binocular camera can reflect the real-time position and actual movement distance of the probe, improving the convenience and visualization of the test.
[0046] The present invention also includes a display screen connected to a binocular camera and a host computer, which allows users to observe the test situation in real time and operate the device through a control interface. This improves the practicality and convenience of the alignment contact test device and facilitates the orderly and effective conduct of alignment contact tests. Attached Figure Description
[0047] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0048] Figure 1 This is a flowchart illustrating a chip pin alignment contact test method for a feedbackless motor according to the present invention.
[0049] Figure 2 This is a schematic diagram of the coordinate system relationship of the camera imaging model of the present invention;
[0050] Figure 3 This is a schematic diagram of the calibration points on the calibration plate;
[0051] Figure 4 This is a schematic diagram of the calibration points on the test platform. Detailed Implementation
[0052] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the present invention or its application or use.
[0053] Example 1
[0054] like Figure 1 As shown, this embodiment provides a chip pin alignment contact testing device for feedbackless motors, including:
[0055] Probes are used to make contact with pins to complete alignment contact tests;
[0056] A binocular camera, moving synchronously with the probe, is used to acquire images of the chip under test (DUT) and calibration points, and sends these images to a host computer. The host computer then calculates the three-dimensional coordinates of each pin on the DUT and the initial coordinates of the calibration points. The DUT consists of several pins arranged sequentially, each located at a fixed position on the test platform corresponding to a calibration point. In specific implementation, such as... Figure 4 As shown, a point C is set as a calibration point on the test platform. At the start of the test, the binocular camera records the position of the calibration point and records it as the initial position. In the test, a binocular camera moving under the drive of a feedbackless motor observes and records the position of this point in real time. The relative displacement of the calibration point in the image captured by the binocular camera moving with the probe is calculated. Since the center point of the image captured by the binocular camera maintains a known absolute positional relationship with the probe, the actual movement distance of the probe can be calculated from the relative displacement through operations such as distance compensation.
[0057] The host computer is also used to send test commands to the main control board based on the three-dimensional coordinate position of the first pin. The main control board drives the feedbackless motor based on the test commands, thereby driving the probe to complete the alignment contact test of the first pin.
[0058] The host computer is also used to determine whether the alignment contact test of the first pin is successful. If successful, the following steps are executed sequentially for each of the remaining pins:
[0059] The binocular camera The calibration point image is acquired and sent to the host computer, which then calculates the calibration point's first value. There are coordinate positions, among which It is a positive integer;
[0060] The host computer is also used for the first calibration point. The probe's actual movement distance is calculated using the initial coordinate position and the current coordinate position. This actual movement distance is then compared with the preset theoretical movement distance to obtain deviation information. Finally, it is determined whether the deviation information exceeds a preset minimum deviation threshold.
[0061] When the deviation information exceeds the preset minimum deviation threshold, the host computer generates correction and test commands based on the deviation information and sends them to the main control board. The main control board then drives the probe to move to the next step based on the correction command. The three-dimensional coordinates of the pin are located, and the probe is driven to complete the test based on the test command. Alignment contact test of each pin;
[0062] When the deviation information is less than or equal to the preset minimum deviation threshold, the host computer sends a test command to the main control board, causing the main control board to drive the probe to complete the first test. Alignment contact test of each pin.
[0063] If the alignment contact test of the first pin fails, the process returns to reacquire the image of the chip under test and the calibration point image, and recalculates the three-dimensional coordinate position of each pin and the initial coordinate position of the calibration point until the alignment contact test of the first pin is successful.
[0064] In one specific embodiment of this example, the relative positions of the probe and the binocular camera are fixed, and the horizontal distance and vertical height difference between them remain constant, thereby ensuring that the center point of the image captured by the binocular camera maintains a known absolute positional relationship with the probe.
[0065] In one specific embodiment of this example, the formula for calculating the known absolute positional relationship is:
[0066] ;
[0067] In the formula, Let A be the coordinates of a point on the probe in the world coordinate system. Let point B be the actual coordinates of the center point of the image captured by the binocular camera in the world coordinate system on the test platform. The actual distance the probe moves in the three directions of the coordinate axis when point A contacts point B, driven by a non-feedback motor.
[0068] In one specific embodiment of this invention, the method for calculating the three-dimensional coordinate position of each pin includes:
[0069] Based on the image of the chip under test, obtain the pixel coordinates of each pin; establish a set of transformation equations, and substitute the pixel coordinates of each pin into the set of transformation equations to calculate the three-dimensional coordinate position of each pin.
[0070] In one specific embodiment of this example, the transformation equation set is as follows:
[0071] ;
[0072] In the formula: For pins Coordinate position in the world coordinate system; and For pins The corresponding pixel coordinate position in the pixel coordinate system; , , and , , These are the assumed transformation coefficients; The depth information obtained through binocular vision is the height distance from the pin to the binocular camera.
[0073] The above transformation equations related to and The formula simplifies to:
[0074] ;
[0075] In the formula: and In the pixel coordinate system shaft and The pixel equivalent of the axis; and This is the offset of the origin O in the physical coordinate system.
[0076] In one specific embodiment of this example, the method for calculating the pixel equivalent and the offset of the origin O in the physical coordinate system is as follows:
[0077] The pixel coordinates of the calibration point are input into the calibration equation set, and the pixel equivalent and the offset of the origin O in the physical coordinate system are obtained by solving the calibration equation set. The expression of the calibration equation set is as follows:
[0078] ;
[0079] ;
[0080] In the formula: For the calibration points on the calibration plate, and , Represents positive integers; and This refers to the pixel coordinates of the calibration point in the pixel coordinate system. and This refers to the physical coordinate position of the calibration point in the physical coordinate system.
[0081] In one specific embodiment of this invention, the testing device further includes a display screen, which is electrically connected to the binocular camera and the host computer, and is used to display the images of the chip under test and calibration points acquired by the binocular camera, the three-dimensional coordinate positions of each pin, the coordinate positions of the calibration points, and the alignment contact test results.
[0082] In one specific embodiment of this example, the display screen is further configured with a control interface, which serves as an operation entry point for controlling the binocular camera and the host computer.
[0083] In one specific embodiment of this example, the testing device further includes a storage module, which is electrically connected to the binocular camera and the host computer, and is used to acquire and save the images of the chip under test and calibration points captured by the binocular camera, the three-dimensional coordinate positions of each pin, the coordinate positions of the calibration points, and the alignment contact test results.
[0084] Example 2
[0085] This embodiment provides a chip pin alignment contact test method for feedbackless motors, including:
[0086] Make contact between the probe and the first pin of the chip under test;
[0087] A binocular camera that moves synchronously with the probe captures images of the chip under test and calibration points, and sends them to the host computer. The host computer then calculates the three-dimensional coordinate positions of each pin on the chip under test and the initial coordinate positions of the calibration points. The chip under test consists of several pins arranged in sequence, which, along with the calibration points, are located at corresponding fixed positions on the test platform.
[0088] The host computer sends a test command to the main control board based on the three-dimensional coordinate position of the first pin. The main control board drives a feedbackless motor based on the test command, thereby driving the probe to complete the alignment contact test of the first pin.
[0089] The host computer is used to determine whether the alignment contact test of the first pin is successful. If successful, the following steps are executed sequentially for the remaining pins:
[0090] Using the binocular camera The calibration point image is acquired and sent to the host computer, which then calculates the calibration point's first value. Each coordinate position;
[0091] Using the host computer to compare the calibration points Given the given coordinate position and initial coordinate position, the system obtains the deviation information and determines whether the deviation information is greater than the preset minimum deviation threshold.
[0092] When the deviation information exceeds the preset minimum deviation threshold, the host computer generates correction and test commands based on the deviation information and sends them to the main control board. The main control board then drives the probe to move to the next step based on the correction command. The three-dimensional coordinates of the pin are located, and the probe is driven to complete the test based on the test command. Alignment contact test of each pin;
[0093] When the deviation information is less than or equal to the preset minimum deviation threshold, the host computer sends a test command to the main control board, causing the main control board to drive the probe to complete the first test. Alignment contact test of each pin.
[0094] In one specific embodiment of the present invention, the binocular camera performs imaging based on a camera imaging model, such as... Figure 2 As shown, the linear imaging model describes the imaging process based on four coordinate systems: the world coordinate system, the world coordinate system, and the world coordinate system. Camera coordinate system Physical coordinate system and pixel coordinate system The three-dimensional coordinates of the target point are obtained by establishing a mapping relationship between spatial points and image points based on four coordinate systems.
[0095] The coordinates of any point in the world coordinate system and the corresponding image coordinates in the pixel coordinate system can be described by the camera imaging model, with the camera coordinate system and the image physical coordinate system serving as a transition in between.
[0096] Suppose the coordinates of a point in space in the world coordinate system are... The corresponding pixel coordinates are Physical coordinates are The coordinates of the origin O in the pixel coordinate system are: Let's further assume that the actual physical size of the imaged pixels in the x and y axes is... and Therefore, the relationship between the pixel coordinate system and the physical coordinate system can be established as follows:
[0097] ;
[0098] Represented in matrix form using homogeneous coordinates:
[0099] , ;
[0100] In the formula: A is the intrinsic parameter matrix of the binocular camera.
[0101] The relationship between the camera coordinate system and the physical coordinate system is as follows:
[0102] ;
[0103] In the formula, Effective focal length;
[0104] The world coordinate system represents the absolute coordinates of the objective world. The transformation relationship between it and the camera coordinate system can be represented by homogeneous R and T matrices. R is the rotation matrix, a 3×3 orthonormal matrix representing the rotation from the world coordinate system to the camera coordinate system. T is the translation vector, a 3×1 vector representing the translation from the world coordinate system to the camera coordinate system. Therefore, the relationship between the world coordinate system and the camera coordinate system can be expressed as:
[0105] ;
[0106] In the formula: It is a zero vector;
[0107] The relationship between the pixel coordinate system and the world coordinate system can also be obtained as follows:
[0108] ;
[0109] ;
[0110] After establishing the mapping relationship between the pixel coordinate system and the world coordinate system, based on the principle of binocular vision, the three-dimensional coordinate positions of the chip pins in the image are calculated using a stereo matching algorithm. Let the coordinates of the pin feature point (i.e., the center point of the chip pin) in the pixel coordinate system be... The corresponding coordinates in the world coordinate system are Establish a system of transformation equations:
[0111] ;
[0112] in, and These are assumed conversion coefficients, which are confirmed after calibration. This refers to the depth information obtained through binocular vision, specifically the height distance from the pin feature point to the binocular camera.
[0113] In one specific embodiment of the present invention, calibration is performed before the formal start of the chip pin alignment contact test. This provides a basis for establishing the correspondence between the world coordinate system, camera coordinate system, physical coordinate system, and pixel coordinate system, and provides a basis for calculating the three-dimensional coordinate positions of each pin and correcting deviations. The calibration process is as follows:
[0114] (1) such as Figure 4 Prepare a standard calibration plate (containing a dot matrix or grid pattern of known size) and place it in the test area. Assume that a square calibration plate with an alumina panel is used, model GP050, with a square side length of 5mm, a pattern array of 12×9, a pattern size of 36mm×27mm, an overall size of 50mm×50mm, and a calibration accuracy of ±0.01mm.
[0115] (2) Control the camera to acquire images of the calibration board from different heights and record multiple sets of pixel coordinates and corresponding physical coordinate data. Calibration is performed at different heights by adjusting the height of the fixed bracket. At this time, the upper left corner of the camera display is taken as the origin O of the image coordinates to establish an image coordinate system. The calibration coordinate system is set with the top left corner of the chessboard grid as the origin O, establishing the physical coordinates. A straight line starting from the origin O The direction is determined by selecting 10 points on the diagonal in sequence, such as... Figure 3 As shown.
[0116] (3) The calibration plates are orthogonally arranged and without rotation (the pixel axis is parallel to the physical axis, that is, the pixel coordinate axis u is parallel to the physical coordinate axis x, and the pixel coordinate axis v is parallel to the physical coordinate axis y). The transformation equations in the system... and Simplified to:
[0117] ;
[0118] In the formula: and In the pixel coordinate system shaft and The pixel equivalent of the axis; and This is the offset of the origin O in the physical coordinate system.
[0119] The pixel equivalent and The distance H between the camera display plane and the test platform, and the camera focal length Sensor size and camera resolution The decision is made, and the specific calculation formula is as follows:
[0120] ;
[0121] During actual calibration, the pixel coordinates and corresponding theoretical physical coordinates of 10 calibration points in the image are first measured (determined by the design dimensions of the calibration plate; the theoretical physical coordinates are given in Table 1).
[0122] The collected data is fitted using the least squares method, and the optimal conversion coefficient is found by minimizing the sum of squared residuals. , and , Complete the calibration from the pixel coordinate system to the physical coordinate system.
[0123] Minimize the sum of squared residuals in the x-direction. The calculation formula is:
[0124] ;
[0125] In order to make To obtain the minimum value, and Taking the partial derivatives of each equation and setting them to zero, we obtain the first system of equations:
[0126] ;
[0127] Similarly, on the y-axis, we can obtain a second set of equations, which, together with the first, form the calibration equation set:
[0128] ;
[0129] Of the three formulas above, For the calibration points on the calibration plate, and , Represents positive integers. For the first The pixel coordinates of each calibration point, , ) is the first The physical coordinates of each calibration point on the calibration plate are denoted as theoretical coordinates.
[0130] The obtained pixel coordinates Substitute into the calibration equations to obtain the pixel equivalent. , Offset from the origin O in the physical coordinate system , The optimal transformation coefficients are then substituted into the transformation equations to obtain the two-dimensional coordinates of the calibration point. .
[0131] (4) Adjust the height of the binocular camera, perform calibration conversion at different heights and record the results, and ensure that the maximum error within the test height range does not exceed ±0.05mm. If the error exceeds the standard, recalibrate.
[0132] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0133] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.
[0134] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.
[0135] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.
[0136] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.
[0137] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims. All of these forms are within the protection scope of the present invention.
[0138] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.
Claims
1. A chip pin alignment contact testing device for feedbackless motors, characterized in that, include: Probes are used to make contact with pins to complete alignment contact tests; A binocular camera moves synchronously with the probe to acquire images of the chip under test and calibration points, and sends them to the host computer, which then calculates the three-dimensional coordinate positions of each pin on the chip under test and the initial coordinate positions of the calibration points. The chip under test includes several pins arranged in sequence, which, along with the calibration points, are located at corresponding fixed positions on the test platform. The host computer is also used to send test commands to the main control board based on the three-dimensional coordinate position of the first pin. The main control board drives the feedbackless motor based on the test commands, thereby driving the probe to complete the alignment contact test of the first pin. The host computer is also used to determine whether the alignment contact test of the first pin is successful. If successful, the following steps are executed sequentially for each of the remaining pins: The binocular camera The calibration point image is acquired and sent to the host computer, which then calculates the calibration point's first value. Each coordinate position; The host computer is also used for the first calibration point. The probe's actual movement distance is calculated using the initial coordinate position and the current coordinate position. This actual movement distance is then compared with the preset theoretical movement distance to obtain deviation information. Finally, it is determined whether the deviation information exceeds a preset minimum deviation threshold. When the deviation information exceeds the preset minimum deviation threshold, the host computer generates correction and test commands based on the deviation information and sends them to the main control board. The main control board then drives the probe to move to the next step based on the correction command. The three-dimensional coordinates of the pin are located, and the probe is driven to complete the test based on the test command. Alignment contact test of each pin; When the deviation information is less than or equal to the preset minimum deviation threshold, the host computer sends a test command to the main control board, causing the main control board to drive the probe to complete the first test. Alignment contact test of each pin.
2. The chip pin alignment contact test device for feedbackless motors according to claim 1, characterized in that, The relative positions of the probe and the binocular camera are fixed, and the horizontal distance and vertical height difference between them remain constant, thereby ensuring that the center point of the image captured by the binocular camera maintains a known absolute positional relationship with the probe.
3. The chip pin alignment contact test device for feedbackless motors according to claim 2, characterized in that, The formula for calculating the known absolute positional relationship is: ； In the formula, Let A be the coordinates of a point on the probe in the world coordinate system. Let point B be the coordinates of the center point of the image captured by the binocular camera in the world coordinate system on the test platform. The actual distance the probe moves when point A contacts point B, driven by a non-feedback motor.
4. The chip pin alignment contact test device for feedbackless motors according to claim 1, characterized in that, The method for calculating the three-dimensional coordinate position of each pin includes: Based on the image of the chip under test, obtain the pixel coordinates of each pin; Establish a system of transformation equations, and substitute the pixel coordinates of each pin into the system of transformation equations to calculate the three-dimensional coordinate position of each pin.
5. The chip pin alignment contact test device for feedbackless motors according to claim 4, characterized in that, The transformation equations are as follows: ； In the formula: For pins Coordinate position in the world coordinate system; and For pins The corresponding pixel coordinate position in the pixel coordinate system; , , and , , These are the assumed transformation coefficients; The depth information obtained through binocular vision is the height distance from the pin to the binocular camera. The above transformation equations related to and The formula simplifies to: ； In the formula: and In the pixel coordinate system shaft and The pixel equivalent of the axis; and This is the offset of the origin O in the physical coordinate system.
6. The chip pin alignment contact test device for feedbackless motors according to claim 5, characterized in that, The method for solving the pixel equivalent and the offset of the origin O in the physical coordinate system is as follows: The pixel coordinates of the calibration point are input into the calibration equation set, and the pixel equivalent and the offset of the origin O in the physical coordinate system are obtained by solving the calibration equation set. The expression of the calibration equation set is as follows: ； ； In the formula: These are the calibration points on the calibration plate; and This refers to the pixel coordinates of the calibration point in the pixel coordinate system. and This refers to the physical coordinate position of the calibration point in the physical coordinate system.
7. The chip pin alignment contact testing device for feedbackless motors according to claim 1, characterized in that, The testing device also includes a display screen, which is electrically connected to the binocular camera and the host computer, and is used to display the images of the chip under test and calibration points captured by the binocular camera, the three-dimensional coordinate positions of each pin, the coordinate positions of the calibration points, and the alignment contact test results.
8. The chip pin alignment contact test device for feedbackless motors according to claim 7, characterized in that, The display screen is also equipped with a control interface, which serves as the operation entry point for controlling the binocular camera and the host computer.
9. The chip pin alignment contact test device for feedbackless motors according to claim 1, characterized in that, The testing device also includes a storage module, which is connected to the binocular camera and the host computer, respectively, and is used to acquire and save the images of the chip under test and calibration points captured by the binocular camera, the three-dimensional coordinate positions of each pin, the coordinate positions of the calibration points, and the alignment contact test results.
10. A chip pin alignment contact test method for feedbackless motors, characterized in that, include: Make contact between the probe and the first pin of the chip under test; A binocular camera that moves synchronously with the probe captures images of the chip under test and calibration points, and sends them to the host computer. The host computer then calculates the three-dimensional coordinate positions of each pin on the chip under test and the initial coordinate positions of the calibration points. The chip under test consists of several pins arranged in sequence, which, along with the calibration points, are located at corresponding fixed positions on the test platform. The host computer sends a test command to the main control board based on the three-dimensional coordinate position of the first pin. The main control board drives a feedbackless motor based on the test command, thereby driving the probe to complete the alignment contact test of the first pin. The host computer is used to determine whether the alignment contact test of the first pin is successful. If successful, the following steps are executed sequentially for the remaining pins: Using the binocular camera The calibration point image is acquired and sent to the host computer, which then calculates the calibration point's first value. Each coordinate position; Using the host computer based on the calibration point The probe's actual movement distance is calculated using the initial coordinate position and the current coordinate position. This actual movement distance is then compared with the preset theoretical movement distance to obtain deviation information. Finally, it is determined whether the deviation information exceeds a preset minimum deviation threshold. When the deviation information exceeds the preset minimum deviation threshold, the host computer generates correction and test commands based on the deviation information and sends them to the main control board. The main control board then drives the probe to move to the next step based on the correction command. The three-dimensional coordinates of the pin are located, and the probe is driven to complete the test based on the test command. Alignment contact test of each pin; When the deviation information is less than or equal to the preset minimum deviation threshold, the host computer sends a test command to the main control board, causing the main control board to drive the probe to complete the first test. Alignment contact test of each pin.