Intelligent identification and quantification method and system for high-resolution image of slope crack

By combining Retinex theory and an improved Canny edge detection algorithm with dynamic constraint determination, the topological structure of slope cracks is reconstructed, solving the problems of numerous breakpoints, omissions, and morphological distortion in existing crack identification results, and achieving efficient and reliable data support for slope monitoring.

CN122067112BActive Publication Date: 2026-06-23XIAN AERONAUTICAL UNIV
View PDF 2 Cites 0 Cited by

Patent Information

Application Number
CN202610518459.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2026-04-20
Publication Date
2026-06-23
Estimated Expiration
2046-04-20

Smart Images

  • Figure CN122067112B_ABST
    Figure CN122067112B_ABST
Patent Text Reader

Abstract

The application discloses a slope crack high-resolution image intelligent identification and quantification method and system, and relates to the technical field of image processing and computer vision. The method comprises the following steps: S1, performing multi-scale light balance processing and multi-scale Gaussian difference filtering processing based on the Retinex theory on the obtained slope high-resolution image in sequence to compensate for non-uniform illumination and suppress background noise; S2, using an improved Canny edge detection algorithm to extract the initial edge from the preprocessed image. The application performs multi-scale light balance and multi-scale Gaussian difference filtering based on the Retinex theory on the slope high-resolution image, effectively compensates for non-uniform illumination and suppresses background noise, solves the problems of light distortion and noise interference in the field scene, and uses the improved Canny edge detection algorithm to combine the gray gradient, direction consistency and texture continuity features to accurately mark the effective crack segments and avoid false crack misjudgment.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • Chip surface flaw detection method based on visual detection

    CN121633122A

  • Method for optimizing micro-crack segmentation based on deep learning and super-resolution reconstruction

    CN121883389A