Parameter measurement system, method and electronic device

Abstract

The application discloses a parameter measurement system, method and electronic equipment, and relates to the technical field of electronic element parameter measurement, wherein the parameter measurement system comprises a sampling module, a frequency synthesis module, a quadrature demodulation module, a first filtering module, a second filtering module, an adaptive adjustment module and a parameter calculation module; the quadrature demodulation module is connected with the sampling module and the frequency synthesis module; the first filtering module is connected with the quadrature demodulation module; the second filtering module is connected with the first filtering module; the adaptive adjustment module is connected with the first filtering module, and the adaptive adjustment module is used for adjusting a decimation factor of a decimation processing based on a test frequency; the parameter calculation module is connected with the second filtering module, and the parameter calculation module is used for calculating impedance of a measured piece. The adaptive adjustment module is arranged to adjust the decimation factor of the first filter, and thus, high-frequency and low-frequency measurement ranges can be compatible.

Description

Technical Field

[0001] This application relates to the field of electronic component parameter measurement technology, and in particular to a parameter measurement system, method and electronic device. Background Technology

[0002] In existing technologies, the LCR digital bridge (or impedance analyzer) is the most basic and core measuring instrument in electronic component production, inspection and circuit laboratories. It is mainly used to measure parameters such as inductance (L), capacitance (C), resistance (R) and impedance (Z). However, existing digital bridge systems cannot meet the needs of high-frequency and low-frequency measurements. If designed for high frequency, the reading will fluctuate drastically during low-frequency measurements. If designed for low frequency, its efficiency will be greatly reduced during high-frequency measurements. Summary of the Invention

[0003] This application aims to address at least one of the technical problems existing in the prior art. To this end, this application proposes a parameter measurement system, method, and electronic device that can adjust the decimation factor of a first filter through an adaptive adjustment module, while being compatible with both high-frequency and low-frequency measurement ranges.

[0004] The parameter measurement system according to a first aspect of this application includes: a sampling module, a frequency synthesis module, an orthogonal demodulation module, a first filtering module, a second filtering module, an adaptive adjustment module, and a parameter calculation module. The sampling module is used to acquire current and voltage signals of the device under test. The frequency synthesis module is used to generate an orthogonal reference signal based on a preset test frequency. The orthogonal demodulation module is connected to the sampling module and the frequency synthesis module. The orthogonal demodulation module is used to perform orthogonal detection processing on the current signal based on the orthogonal reference signal to obtain a first data stream. The orthogonal demodulation module is also used to perform orthogonal detection processing on the voltage signal based on the orthogonal reference signal to obtain a second data stream. The first filtering module is connected to the sampling module and the frequency synthesis module. A quadrature demodulation module is connected; the first filtering module is used to filter and downsample the first data stream and the second data stream, respectively; the second filtering module is connected to the first filtering module and is used to perform waveform shaping on the first data stream and the second data stream after processing by the first filtering module, respectively; the adaptive adjustment module is connected to the first filtering module and is used to adjust the decimation factor of the downsampling process based on the test frequency; the parameter calculation module is connected to the second filtering module and is used to calculate the impedance of the device under test based on the first data stream and the second data stream after processing by the second filtering module.

[0005] The parameter measurement system according to the embodiments of this application has at least the following beneficial effects: By setting a sampling module to acquire the current and voltage signals of the device under test; by setting a frequency synthesis module to generate an orthogonal reference signal; by setting an orthogonal demodulation module to perform orthogonal detection processing on the current and voltage signals based on the orthogonal reference signal to obtain a first data stream and a second data stream containing the desired DC component; by setting a first filtering module to filter and downsample the first and second data streams to remove high-frequency noise; by setting a second filtering module to perform waveform shaping and other processing on the first and second data streams processed by the first filtering module to remove aliasing remaining in the first filtering module; and by setting a parameter calculation module to calculate the first and second data streams processed by the first and second filtering modules to obtain the final required impedance of the device under test, while adaptively adjusting the mode... The design of the block facilitates the adjustment of the decimation factor of the first filter module based on the test frequency, to accommodate both high-frequency and low-frequency test conditions. The decimation factor is configured such that when the first filter module receives sample data with a decimation factor value, it retains only one sample data as a valid sample data. The bandwidth includes multiple retained valid sample data. Specifically, when the test frequency is high-frequency, the decimation factor of the first filter module is reduced to increase its bandwidth, resulting in an increase in the amount of data processed by the first filter module per unit time, thereby improving measurement efficiency. When the test frequency is low-frequency, the decimation factor of the first filter module is increased to reduce its bandwidth. A narrow bandwidth keeps the passband within the frequency range of the useful signal, reducing the passage of high-frequency noise, thus suppressing noise interference and avoiding reading fluctuations and instability, thereby achieving compatibility between low-frequency and high-frequency measurements.

[0006] According to some embodiments of this application, the sampling module includes a first sampling unit, a second sampling unit, a first analog-to-digital conversion unit, and a second analog-to-digital conversion unit. The first sampling unit is connected to the quadrature demodulation module through the first analog-to-digital conversion unit, and the second sampling unit is connected to the quadrature demodulation module through the second analog-to-digital conversion unit. The first sampling unit is used to sample the device under test to obtain a raw current signal, and the first analog-to-digital conversion unit is used to perform analog-to-digital conversion on the raw current signal to obtain the current signal. The second sampling unit is used to sample the device under test to obtain a raw voltage signal, and the second analog-to-digital conversion unit is used to perform analog-to-digital conversion on the raw voltage signal to obtain the voltage signal.

[0007] According to some embodiments of this application, the quadrature demodulation module includes a first quadrature demodulator and a second quadrature demodulator. The sampling module is connected to the first filtering module through the first quadrature demodulator, and the sampling module is also connected to the first filtering module through the second quadrature demodulator. The first quadrature demodulator is used to perform quadrature detection processing on the current signal based on the quadrature reference signal to obtain the first data stream. The second quadrature demodulator is used to perform quadrature detection processing on the voltage signal based on the quadrature reference signal to obtain the second data stream.

[0008] According to some embodiments of this application, the first filtering module includes a first integral comb filter and a second integral comb filter. The quadrature demodulation module is connected to the second filtering module through the first integral comb filter. The quadrature demodulation module is also connected to the second filtering module through the second integral comb filter. The first integral comb filter is used to filter and downsample the first data stream, and the second integral comb filter is used to filter and downsample the second data stream.

[0009] According to some embodiments of this application, the second filtering module includes a first finite-length unit impulse response filter and a second finite-length unit impulse response filter. The first filtering module is connected to the parameter calculation module through the first finite-length unit impulse response filter, and the first filtering module is also connected to the parameter calculation module through the second finite-length unit impulse response filter. The first finite-length unit impulse response filter is used to perform waveform shaping processing on the first data stream after processing by the first filtering module, and the second finite-length unit impulse response filter is used to perform waveform shaping processing on the second data stream after processing by the first filtering module.

[0010] According to some embodiments of this application, the adaptive adjustment module is connected to the second filtering module, and the adaptive adjustment module is further used to adjust the compensation coefficient of the second filtering module based on the extraction factor.

[0011] According to some embodiments of this application, a shift module is also included, through which the first filtering module is connected to the second filtering module.

[0012] According to the parameter measurement method of the second aspect of this application, the parameter measurement method is applied to the parameter measurement system of the first aspect of this application; The method includes: Obtain the test frequency; The extraction factor is adjusted based on the test frequency.

[0013] According to some embodiments of this application, adjusting the extraction factor based on the test frequency includes: If the test frequency is greater than the preset first frequency, then the preset first factor is used as the extraction factor. If the test frequency is less than the preset second frequency, then the preset second factor is used as the extraction factor, wherein the first frequency is greater than the second frequency and the first factor is less than the second factor; If the test frequency is greater than or equal to the second frequency and less than or equal to the first frequency, then the test frequency is used as an index parameter to index the corresponding variable parameter in a preset mapping table, which is used as the extraction factor. The mapping table is used to record the correspondence between the index parameter and the variable parameter.

[0014] An electronic device according to a third aspect of this application includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the parameter measurement system according to a first aspect of this application.

[0015] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0016] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is a framework diagram of the parameter measurement system according to an embodiment of this application; Figure 2 This is a flowchart illustrating the steps of the parameter measurement method according to an embodiment of this application. Figure 3 This is a schematic diagram of a specific process for step S102; Figure 4 This is a schematic diagram of the structure of an electronic device according to an embodiment of this application. Detailed Implementation

[0017] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0018] In the description of this application, it should be understood that the orientation descriptions, such as up, down, front, back, left, right, etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0019] In the description of this application, "several" means one or more, "more than" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.

[0020] In the description of this application, unless otherwise expressly defined, terms such as "setup," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this application in conjunction with the specific content of the technical solution.

[0021] Low-frequency measurement requirements: When the test frequency is low (e.g., 10Hz-100Hz), the signal period is long and susceptible to interference from power frequency (50Hz / 60Hz) and noise. In this case, the filter needs to have an extremely narrow passband bandwidth (e.g., <5Hz) and extremely high stopband attenuation to ensure stable readings (high accuracy). This typically means a very high filter order and a long settling time.

[0022] High-frequency measurement requirements: When the test frequency is high (e.g., 100kHz-2MHz), the signal period is extremely short, and the noise impact is relatively small, but the production line requires extremely fast test speeds (e.g., <5ms / test). In this case, the filter needs to have a wide bandwidth to shorten the step response time and improve the data throughput.

[0023] Currently, the LCR digital bridge (or impedance analyzer) is the most basic and core measuring instrument in electronic component production, inspection, and circuit laboratories. It is mainly used to measure parameters such as inductance (L), capacitance (C), resistance (R), and impedance (Z). However, existing digital bridge systems cannot meet the needs of high-frequency and low-frequency measurements. Their decimation factor settings are relatively fixed. Therefore, if designed for high frequency, it will introduce significant environmental interference during low-frequency measurements, causing the readings to fluctuate drastically. Conversely, if designed for low frequency, its response time will increase significantly during high-frequency measurements, thereby reducing the efficiency of the test.

[0024] Based on this, this application proposes a parameter measurement system, device, electronic device and storage medium, which aims to adjust the decimation factor of the first filter through an adaptive adjustment module, while being compatible with both high-frequency and low-frequency measurement ranges.

[0025] It is understood that the parameter measurement system of the first aspect embodiment of this application includes a sampling module, a frequency synthesis module, an orthogonal demodulation module, a first filtering module, a second filtering module, an adaptive adjustment module, and a parameter calculation module. The sampling module is used to acquire the current signal and voltage signal of the device under test. The frequency synthesis module is used to generate an orthogonal reference signal based on a preset test frequency. The orthogonal demodulation module is connected to the sampling module and the frequency synthesis module. The orthogonal demodulation module is used to perform orthogonal detection processing on the current signal based on the orthogonal reference signal to obtain a first data stream. The orthogonal demodulation module is also used to perform orthogonal detection processing on the voltage signal based on the orthogonal reference signal to obtain a second data stream. The system comprises: a data stream; a first filtering module connected to the quadrature demodulation module, used to filter and downsample the first and second data streams respectively; a second filtering module connected to the first filtering module, used to perform waveform shaping on the first and second data streams after processing by the first filtering module; an adaptive adjustment module connected to the first filtering module, used to adjust the decimation factor of the downsampling process based on the test frequency; and a parameter calculation module connected to the second filtering module, used to calculate the impedance of the device under test based on the first and second data streams after processing by the second filtering module.

[0026] The beneficial effects of the parameter measurement system in this application embodiment can be manifested as follows: By setting a sampling module to acquire the current and voltage signals of the device under test; by setting a frequency synthesis module to generate an orthogonal reference signal; by setting an orthogonal demodulation module to perform orthogonal detection processing on the current and voltage signals based on the orthogonal reference signal to obtain a first data stream and a second data stream containing the desired DC component; by setting a first filtering module to filter and downsample the first and second data streams to remove high-frequency noise; by setting a second filtering module to perform waveform shaping and other processing on the first and second data streams processed by the first filtering module to remove aliasing remaining from the first filtering module; and by setting a parameter calculation module to calculate the first and second data streams processed by the first and second filtering modules to obtain the final required impedance of the device under test, while the adaptive adjustment module… The design facilitates adjusting the decimation factor of the first filter module based on the test frequency, ensuring compatibility with both high-frequency and low-frequency test conditions. The decimation factor is configured such that when the first filter module receives sample data with a decimation factor value, it retains only one sample as a valid sample. The bandwidth includes multiple retained valid sample data. Specifically, when the test frequency is high, the decimation factor of the first filter module is decreased to increase its bandwidth, resulting in more data processed per unit time and improved measurement efficiency. When the test frequency is low, the decimation factor of the first filter module is increased to decrease its bandwidth. A narrow bandwidth keeps the passband within the frequency range of the useful signal, reducing the passage of high-frequency noise and suppressing noise interference. This prevents unstable readings due to fluctuations in distance, thus achieving compatibility between low-frequency and high-frequency measurements.

[0027] For example, in some embodiments, reference is made to Figure 1In this embodiment, the parameter measurement system of this application is applied in an FPGA. The first filtering module has low-pass filtering characteristics. The frequency synthesis module is connected to the device under test (DUT). The test frequency input by the user is transmitted to the frequency synthesis module through the adaptive adjustment module. The frequency synthesis module generates a sinusoidal excitation signal based on the test frequency and then applies the sinusoidal excitation signal to the DUT. The sampling module is also connected to the DUT to collect the current and voltage generated after the DUT inputs the sinusoidal excitation signal and converts them into voltage and current signals that can be processed by the quadrature demodulation module, and then outputs them to the quadrature demodulation module. The FPGA's storage unit stores the preset control word of the quadrature demodulation module. The storage unit is connected to the FPGA's main control module. The unit is connected, and the adaptive adjustment module is connected to the main control unit to obtain the control words issued by the main control unit and transmit them to the frequency synthesis module. After receiving the control words, the frequency synthesis module accumulates them through the accumulator in the frequency synthesis module, and then generates an orthogonal reference signal with the same frequency as the test frequency through the sine lookup table stored in the frequency synthesis module. The orthogonal reference signal includes a sine sequence and a cosine sequence. The quadrature demodulation module performs detection processing on the current signal and the voltage signal respectively. The detection processing of the current signal is as follows: the current signal is multiplied by the sine sequence and the cosine sequence respectively to obtain the first data stream; while the detection processing of the voltage signal is as follows: the voltage signal is multiplied by the sine sequence and the cosine sequence respectively to obtain the second data stream. Both the first and second data streams include in-phase DC components and quadrature DC components. These components are used to calculate the amplitude and phase of the current and voltage signals, respectively, to determine the impedance of the device under test (DUT). The calculated impedance is then decomposed into the resistance and reactance of the DUT, allowing for the subsequent derivation of its inductance and capacitance. Since the voltage and current signals obtained from the sampling are mixed AC signals, they are susceptible to high-frequency noise and power frequency interference. Directly measuring these signals makes it impossible to distinguish the resistance and reactance components. Therefore, the quadrature adjustment module essentially separates the amplitude and phase of the acquired current and voltage signals to allow for the separate calculation of resistance and inductance. The first filter is used to filter out high-frequency noise from the first and second data streams, thereby improving data accuracy. Simultaneously, the first filter downsamples the first and second data streams to reduce the amount of data to be processed and improve efficiency. The second filter module filters out aliasing remaining in the first and second data streams after passing through the first filter module, further suppressing interference. This allows the parameter calculation module to calculate the impedance of the device under test based on the first and second data streams after passing through the first and second filter modules sequentially. The parameter calculation module can also further decompose the calculated impedance into corresponding resistance and reactance, and then calculate the inductance and capacitance of the device under test.The adaptive adjustment module is used to adjust the decimation factor of the first filtering module. The decimation factor is configured so that for every decimation factor number of sample data received from the voltage or current signal, the first filtering module retains one sample data as a valid sample data. For example, with a decimation factor of 6, the first filtering module retains one valid sample data for every 6 received samples, without needing to perform subsequent calculations on all received samples. The user inputs the test frequency, and the adaptive adjustment module obtains the test frequency. When the test frequency is high, i.e., at a high frequency, the value of the decimation factor of the first filtering module is reduced, resulting in an increase in the number of valid sample data, leading to the most... The increased bandwidth allows for a corresponding increase in the amount of data processed by the first filtering module per unit time, thereby improving testing efficiency. Conversely, when the testing frequency is low, increasing the decimation factor of the first filtering module reduces the number of effective sample data, resulting in a narrower final bandwidth. Furthermore, the first filtering module's low-pass filtering characteristic ensures that the final output data retains more low-frequency characteristics, while noise is mostly in the mid- or high-frequency range, thus suppressing interference from mid- and high-frequency noise. In summary, the parameter measurement system of this application achieves compatibility between low and high frequencies through an adaptive adjustment module, improving the accuracy and efficiency of the final impedance calculation.

[0028] Furthermore, the adaptive adjustment module stores a mapping table that records the correspondence between sampling factors and test frequencies. For example, the largest test frequency recorded in the mapping table is used as the first frequency, and the smallest test frequency is used as the second frequency; the smallest sampling factor is used as the first factor, and the largest sampling factor is used as the second factor. The first frequency corresponds to the first factor, and the second frequency corresponds to the second factor. When the measured frequency is greater than the first frequency, the first factor is selected as the extraction factor. When the measured frequency is less than the second frequency, the second factor is selected as the extraction factor. The logic is as follows: inputs greater than the first frequency are considered high-frequency inputs, so the smallest recorded extraction factor, i.e., the first factor, is selected. Similarly, inputs less than the second frequency are considered low-frequency inputs, so the largest recorded extraction factor, i.e., the second factor, is selected. When the test frequency is less than or equal to the first frequency and greater than or equal to the second frequency, the first and second frequencies are divided into multiple frequency ranges, each corresponding to an extraction factor. When the measured frequency belongs to one of these frequency ranges, the adaptive adjustment module outputs the corresponding extraction factor to the first filtering module. The division of frequency ranges and the selection of corresponding extraction factors can be constructed using methods such as segmented stepwise or fine-grained lookup tables.

[0029] Furthermore, the parameter calculation module reads the data output by the second filtering module through the soft-core processor (NIOS / Microblaze) embedded in the FPGA, instead of using a microcontroller or numerical signal processor as in traditional technology. This greatly reduces the difficulty of the circuit board and the complexity of the software, thereby improving the integration of the parameter measurement system of this application.

[0030] It is understood that the sampling module includes a first sampling unit, a second sampling unit, a first analog-to-digital conversion unit, and a second analog-to-digital conversion unit. The first sampling unit is connected to the quadrature demodulation module through the first analog-to-digital conversion unit, and the second sampling unit is connected to the quadrature demodulation module through the second analog-to-digital conversion unit. The first sampling unit is used to sample the device under test to obtain the original current signal, and the first analog-to-digital conversion unit is used to perform analog-to-digital conversion on the original current signal to obtain the current signal. The second sampling unit is used to sample the device under test to obtain the original voltage signal, and the second analog-to-digital conversion unit is used to perform analog-to-digital conversion on the original voltage signal to obtain the voltage signal.

[0031] For example, in some embodiments, reference is made to Figure 1 In this embodiment, the first analog-to-digital converter is used to convert the continuously changing analog signal, i.e. the original current signal, acquired by the first acquisition unit into a discrete digital signal, i.e., a current signal, which can be processed by the quadrature demodulation module. Similarly, the second analog-to-digital converter is used to convert the continuously changing analog signal, i.e. the original voltage signal, acquired by the second acquisition unit into a discrete digital signal, i.e., a voltage signal, which can be processed by the quadrature demodulation module.

[0032] It is understandable that the quadrature demodulation module includes a first quadrature demodulator and a second quadrature demodulator. The sampling module is connected to the first filtering module through the first quadrature demodulator, and the sampling module is also connected to the first filtering module through the second quadrature demodulator. The first quadrature demodulator is used to perform quadrature detection processing on the current signal based on the quadrature reference signal to obtain the first data stream. The second quadrature demodulator is used to perform quadrature detection processing on the voltage signal based on the quadrature reference signal to obtain the second data stream.

[0033] For example, in some embodiments, reference is made to Figure 1In this embodiment, the detection processing of the current signal by the first quadrature demodulator is as follows: the current signal is multiplied by the sine and cosine sequences of the quadrature reference signal respectively to obtain a first data stream containing the in-phase DC component and the quadrature DC component, and the data rate of the first data stream is still the sampling rate of the first analog-to-digital converter unit to ensure accuracy; similarly, the detection processing of the voltage signal by the second quadrature demodulator is as follows: the voltage signal is multiplied by the sine and cosine sequences of the quadrature reference signal respectively to obtain a second data stream containing the in-phase DC component and the quadrature DC component, and the data rate of the second data stream is still the sampling rate of the second analog-to-digital converter unit to ensure accuracy.

[0034] It is understood that the first filtering module includes a first integral comb filter and a second integral comb filter. The quadrature demodulation module is connected to the second filtering module through the first integral comb filter. The quadrature demodulation module is also connected to the second filtering module through the second integral comb filter. The first integral comb filter is used to filter and downsample the first data stream, and the second integral comb filter is used to filter and downsample the second data stream.

[0035] For example, in some embodiments, reference is made to Figure 1 In this embodiment, the first quadrature demodulator is connected to the second filtering module through a first integral comb filter, and the second quadrature demodulator is connected to the second filtering module through a second integral comb filter. The integral comb filter, compared to other low-pass filters, eliminates the need for multipliers, saving resources; it has a simple structure while also offering ultra-high-speed performance. The first integral comb filter filters the first data stream to suppress high-frequency noise, thereby improving the accuracy of the first data stream. Downsampling reduces the amount of data in the first data stream, improving the efficiency of subsequent processing. Similarly, the second integral comb filter filters the second data stream to suppress high-frequency noise, thereby improving the accuracy of the second data stream. Downsampling reduces the amount of data in the second data stream, improving the efficiency of subsequent processing.

[0036] It is understood that the second filtering module includes a first finite-length unit impulse response filter and a second finite-length unit impulse response filter. The first filtering module is connected to the parameter calculation module through the first finite-length unit impulse response filter, and the first filtering module is also connected to the parameter calculation module through the second finite-length unit impulse response filter. The first finite-length unit impulse response filter is used to perform waveform shaping processing on the first data stream after it has been processed by the first filtering module, and the second finite-length unit impulse response filter is used to perform waveform shaping processing on the second data stream after it has been processed by the first filtering module.

[0037] For example, in some embodiments, reference is made to Figure 1In this embodiment, the first integral comb filter is connected to the parameter calculation module through a first finite-length unit impulse response filter, and the second integral comb filter is connected to the parameter calculation module through a second finite-length unit impulse response filter. The finite-length unit impulse response filter offers better linear phase characteristics and higher computational efficiency compared to other filters. The first and second data streams obtained through the quadrature demodulation module contain aliasing products, such as harmonic components, which need to be filtered out. However, the first filtering module may have an insufficient cutoff frequency, resulting in incomplete aliasing. Therefore, the first finite-length unit impulse response filter is needed to filter out the remaining aliasing products in the first data stream, and the second finite-length unit impulse response filter is needed to filter out the remaining aliasing products in the second data stream. Furthermore, even after processing by the first filtering module, some high-frequency noise may still be superimposed on the first and second data streams. The first and second finite-length unit impulse response filters can respectively filter out this remaining high-frequency noise in the first and second data streams, further improving the accuracy of the first and second data streams.

[0038] It should be noted that this application uses an integral comb filter to handle the large-fold decimation task and a finite-length unit impulse response filter to handle the spectrum shaping task. This cascaded structure avoids the problem of FPGA resource depletion caused by directly using a high-order finite-length unit impulse response filter at a high sampling rate, and achieves high performance indicators under low-cost hardware.

[0039] It is understandable that the adaptive adjustment module is connected to the second filtering module, and the adaptive adjustment module is also used to adjust the compensation coefficient of the second filtering module based on the extraction factor.

[0040] For example, in some embodiments, reference is made to Figure 1In this embodiment, the adaptive adjustment module is connected to the first finite-length unit impulse response filter and the second finite-length unit impulse response filter, respectively. When using an integral comb filter for large-factor decimation, i.e., when the decimation factor is large, passband droop is introduced. The decimation factor of the first filter module is adjusted by the adaptive adjustment module. Different decimation factors exhibit different droop characteristics. If the second filter module with a fixed compensation coefficient is used, it cannot accurately and dynamically compensate for different droop characteristics. Therefore, the mapping table of the adaptive adjustment module also records the correspondence between compensation coefficients and decimation factors. The compensation coefficients include a first coefficient and a second coefficient. The first coefficient corresponds to the first factor, and the second coefficient corresponds to the second factor. In a two-factor correspondence, when the adaptive adjustment module outputs the first factor to the first filter module, it also outputs the first coefficient to the second filter module. Similarly, when the adaptive adjustment module outputs the second factor to the second filter module, it also outputs the second coefficient to the second filter module. Between the first and second factors, the decimation factor is divided into multiple continuous ranges, each with a corresponding compensation coefficient. When the decimation factor generated by the adaptive adjustment module based on the measured frequency falls within a certain range, it outputs the corresponding compensation coefficient to the second compensation module, causing the second compensation module to refresh its internal convolution kernel based on the received compensation coefficient. The compensation coefficients are integrated into a coefficient library and stored in the FPGA's storage unit.

[0041] It is understood that the parameter measurement system of this application also includes a shift module, and the first filtering module is connected to the second filtering module through the shift module.

[0042] For example, in some embodiments, the shift module (not shown in the figures) includes a first shifter and a second shifter, a first integrating comb filter is connected to a first finite-length unit impulse response filter via the first shifter, and a second integrating comb filter is connected to a second finite-length unit impulse response filter via the second shifter. The integrating comb filter has a large DC gain G=R. N Where G is the DC gain and R is the decimation factor, which is a fixed value. The larger the decimation factor, the larger the DC gain, which may cause the output data to overflow. Therefore, shift modules are respectively set at the output terminals of the first integral comb filter and the second integral comb filter. Both the first shifter and the second shifter are adaptive barrel shifters, so that when the DC gain changes drastically, the shift module can automatically adjust the number of shifts according to the decimation factor. This allows the first data stream and the second data stream after passing through the first filtering module to be normalized to a uniform amplitude range through the shift module, so that they can be processed by the second filtering module.

[0043] It should be noted that the adaptive adjustment module is also connected to the system clock of the FPGA system, which causes the adaptive adjustment module to generate a global synchronization signal. This causes the current signal and voltage signal to pass through the quadrature demodulation module, the first filter module and the second filter module synchronously in sequence, avoiding asynchrony that would affect the subsequent calculation of phase and amplitude.

[0044] According to the parameter measurement method of the second aspect embodiment of this application, the parameter measurement method of this application is applied to the parameter measurement system of the first aspect embodiment of this application, with reference to... Figure 2 The parameter measurement method of this application includes, but is not limited to, steps S101 to S102.

[0045] Step S101: Obtain the test frequency.

[0046] Step S102: Adjust the extraction factor based on the test frequency.

[0047] In step S101 of some embodiments, the test frequency input by the user is obtained through the adaptive adjustment module.

[0048] In some embodiments, reference Figure 3 Step S102 may include, but is not limited to, steps S201 to S203.

[0049] Step S201: If the test frequency is greater than the preset first frequency, then the preset first factor is used as the extraction factor.

[0050] Step S202: If the test frequency is less than the preset second frequency, then the preset second factor is used as the extraction factor, wherein the first frequency is greater than the second frequency and the first factor is less than the second factor.

[0051] Step S203: If the test frequency is greater than or equal to the second frequency and less than or equal to the first frequency, then the test frequency is used as an index parameter to index the corresponding variable parameter in a preset mapping table as an extraction factor. The mapping table is used to record the correspondence between the index parameter and the variable parameter.

[0052] In step S201 of some embodiments, assuming that the preset first frequency is 100kHz and the corresponding first factor is 16, when the test frequency is greater than the first frequency, such as 120kHz, 150kHz, 200kHz, etc., the first factor will be used as the extraction factor by the adaptive adjustment module and output to the first filter module to widen the bandwidth of the first filter module.

[0053] In step S202 of some embodiments, assuming that the preset first frequency is 1kHz and the corresponding first factor is 4096, when the test frequency is less than the first frequency, such as 100Hz, 50Hz, 10Hz, etc., the adaptive adjustment module will output the second factor as the extraction factor to the first filter module to narrow the bandwidth of the first filter module.

[0054] In step S203 of some embodiments, the mapping table divides the first frequency and the second frequency into multiple frequency ranges. Each frequency range corresponds to a variable parameter, i.e., the extraction factor. The test frequency is used as an index parameter for indexing. When the index finds that the test frequency is within one of the frequency ranges, the variable parameter corresponding to that frequency range is output as the extraction factor. The design of the correspondence between the index parameter and the variable parameter, i.e. the correspondence between the test frequency and the extraction factor, can be constructed by a segmented ladder-like or fine-grained lookup table method.

[0055] In steps S201 to S203 of this embodiment, the adaptive adjustment module outputs different decimation factors to the first filter module for different test frequencies, thereby adjusting the bandwidth of the first filter module to accommodate both high-frequency and low-frequency inputs.

[0056] In the embodiments of this application, steps S101 to S102 adjust the extraction factor based on the test frequency to accommodate both low and high test frequencies, thereby ensuring the accuracy of subsequent calculations.

[0057] An embodiment of the third aspect of this application also provides an electronic device, which includes a memory 402 and a processor 401. The memory 402 stores a computer program, and the processor 401 executes the computer program to implement the parameter measurement system of the first aspect embodiment described above. This electronic device can be any smart terminal, including tablet computers, in-vehicle computers, etc.

[0058] Reference Figure 4 , Figure 4 This is a schematic diagram of the structure of an electronic device according to one embodiment. The electronic device includes: The processor 401 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this application. The memory 402 can be implemented as a read-only memory, static storage device, dynamic storage device, or random access memory (RAM). The memory 402 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 402 and is called and executed by the processor 401 to execute the TV bezel laser etching method of the embodiments of this application. Input / output interface 403 is used to implement information input and output; Communication interface 404 is used to enable communication and interaction between this device and other devices. Communication can be achieved via wired or wireless means. Bus 405 transmits information between the various components of the device; The processor 401, memory 402, input / output interface 403 and communication interface 404 are connected to each other within the device via bus 405.

[0059] The embodiments described in this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems.

[0060] Those skilled in the art will understand that the technical solutions shown in the figures do not constitute a limitation on the embodiments of this application, and may include more or fewer steps than shown, or combine certain steps, or different steps.

[0061] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0062] Those skilled in the art will understand that all or some of the steps in the methods disclosed above, as well as the functional modules / units in the systems and devices, can be implemented as software, firmware, hardware, or suitable combinations thereof.

[0063] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0064] It should be understood that in this application, "at least one (item)" means one or more, and "more than" means two or more. "And / or" is used to describe the relationship between related objects, indicating that three relationships can exist. For example, "A and / or B" can represent three cases: only A exists, only B exists, and both A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0065] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of the units described above is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0066] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0067] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0068] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes multiple instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing programs, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0069] Furthermore, it should be noted that in all specific embodiments of this application, when processing data related to user identity or characteristics, such as user information, user behavior data, user historical data, and user location information, user permission or consent will be obtained first. Moreover, the collection, use, and processing of this data will comply with relevant laws, regulations, and standards. Additionally, when embodiments of this application require access to sensitive personal information of users, separate permission or consent from the user will be obtained through pop-ups or redirects to confirmation pages. Only after obtaining the user's separate permission or consent will the necessary user-related data for the proper functioning of these embodiments be acquired.

[0070] The preferred embodiments of the present application have been described above with reference to the accompanying drawings, but this does not limit the scope of the claims of the present application. Any modifications, equivalent substitutions, and improvements made by those skilled in the art without departing from the scope and substance of the embodiments of the present application shall be within the scope of the claims of the present application.

Claims

1. A parameter measurement system, characterized in that, include: A sampling module, which is used to acquire the current signal and voltage signal of the device under test; A frequency synthesis module, which is used to generate an orthogonal reference signal based on a preset test frequency; The quadrature demodulation module is connected to the sampling module and the frequency synthesis module. The quadrature demodulation module is used to perform quadrature detection processing on the current signal based on the quadrature reference signal to obtain a first data stream. The quadrature demodulation module is also used to perform quadrature detection processing on the voltage signal based on the quadrature reference signal to obtain a second data stream. A first filtering module is connected to the orthogonal demodulation module. The first filtering module is used to filter and downsample the first data stream and the second data stream, respectively. The second filtering module is connected to the first filtering module. The second filtering module is used to perform waveform shaping processing on the first data stream and the second data stream after they have been processed by the first filtering module. An adaptive adjustment module is connected to the first filtering module, and the adaptive adjustment module is used to adjust the decimation factor of the downsampling process based on the test frequency; The parameter calculation module is connected to the second filtering module. The parameter calculation module is used to calculate the impedance of the device under test based on the first data stream and the second data stream after being processed by the second filtering module.

2. The parameter measurement system according to claim 1, characterized in that, The sampling module includes a first sampling unit, a second sampling unit, a first analog-to-digital conversion unit, and a second analog-to-digital conversion unit. The first sampling unit is connected to the quadrature demodulation module through the first analog-to-digital conversion unit, and the second sampling unit is connected to the quadrature demodulation module through the second analog-to-digital conversion unit. The first sampling unit is used to sample the device under test to obtain a raw current signal, and the first analog-to-digital conversion unit is used to perform analog-to-digital conversion on the raw current signal to obtain the current signal. The second sampling unit is used to sample the device under test to obtain a raw voltage signal, and the second analog-to-digital conversion unit is used to perform analog-to-digital conversion on the raw voltage signal to obtain the voltage signal.

3. The parameter measurement system according to claim 1, characterized in that, The quadrature demodulation module includes a first quadrature demodulator and a second quadrature demodulator. The sampling module is connected to the first filtering module through the first quadrature demodulator, and the sampling module is also connected to the first filtering module through the second quadrature demodulator. The first quadrature demodulator is used to perform quadrature detection processing on the current signal based on the quadrature reference signal to obtain the first data stream. The second quadrature demodulator is used to perform quadrature detection processing on the voltage signal based on the quadrature reference signal to obtain the second data stream.

4. The parameter measurement system according to claim 1, characterized in that, The first filtering module includes a first integral comb filter and a second integral comb filter. The quadrature demodulation module is connected to the second filtering module through the first integral comb filter. The quadrature demodulation module is also connected to the second filtering module through the second integral comb filter. The first integral comb filter is used to filter and downsample the first data stream, and the second integral comb filter is used to filter and downsample the second data stream.

5. The parameter measurement system according to claim 1, characterized in that, The second filtering module includes a first finite-length unit impulse response filter and a second finite-length unit impulse response filter. The first filtering module is connected to the parameter calculation module through the first finite-length unit impulse response filter, and the first filtering module is also connected to the parameter calculation module through the second finite-length unit impulse response filter. The first finite-length unit impulse response filter is used to perform waveform shaping processing on the first data stream after it has been processed by the first filtering module, and the second finite-length unit impulse response filter is used to perform waveform shaping processing on the second data stream after it has been processed by the first filtering module.

6. The parameter measurement system according to claim 1, characterized in that, The adaptive adjustment module is connected to the second filtering module, and the adaptive adjustment module is also used to adjust the compensation coefficient of the second filtering module based on the extraction factor.

7. The parameter measurement system according to claim 1, characterized in that, It also includes a shift module, through which the first filtering module is connected to the second filtering module.

8. A parameter measurement method, characterized in that, The parameter measurement method is applied to the parameter measurement system according to any one of claims 1 to 7; The method includes: Obtain the test frequency; The extraction factor is adjusted based on the test frequency.

9. The parameter measurement method according to claim 8, characterized in that, Adjusting the extraction factor based on the test frequency includes: If the test frequency is greater than the preset first frequency, then the preset first factor is used as the extraction factor. If the test frequency is less than the preset second frequency, then the preset second factor is used as the extraction factor, wherein the first frequency is greater than the second frequency and the first factor is less than the second factor; If the test frequency is greater than or equal to the second frequency and less than or equal to the first frequency, then the test frequency is used as an index parameter to index the corresponding variable parameter in a preset mapping table, which is used as the extraction factor. The mapping table is used to record the correspondence between the index parameter and the variable parameter.

10. An electronic device, characterized in that, The electronic device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the parameter measurement method according to any one of claims 8 to 9.

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