A method of resistance testing

Abstract

The application discloses a resistance testing method, and relates to the technical field of intelligent testing, and comprises the following steps: step S100, testing any resistance model of resistance, independently analyzing the testing result, and obtaining self characteristics; step S200, performing positive testing and reverse testing on the resistance to be tested according to the testing method, and obtaining positive result and reverse result; and step S300, dividing the grade of the resistance to be tested according to the positive result, the reverse result and the self characteristics. Through screening of effective historical data, the application improves the scientificity of subsequent analysis and the rationality of testing parameters, avoids irreversible damage to the resistance, improves the economy of testing, eliminates one-way system errors such as contact resistance, lead resistance and thermoelectric potential through mean value taking of positive and reverse testing and difference value analysis.

Description

Technical Field

[0001] This invention relates to the technical field of intelligent testing, and more particularly to a resistance testing method. Background Technology

[0002] In recent years, resistance testing technology has developed rapidly. The four-wire Kelvin connection method effectively eliminates the influence of contact resistance and lead resistance by separating the current lead and the voltage detection lead. The combination of the four-probe method and the van der Bauer method is suitable for non-destructive measurement of semiconductor wafer samples of any shape. To address the problem of thermoelectric potential interference in low resistance measurement, the new generation of instruments adopts advanced bias voltage compensation technology, which can suppress thermal noise from the laboratory to the temperature-varying production workshop and achieve stable measurement. It integrates machine learning algorithms to realize trend analysis of measurement data and predictive maintenance. The entire process from sample placement and parameter acquisition to result output is automated, including automatic sample introduction, automatic range switching and automatic calibration.

[0003] Currently, Chinese invention patent CN120594948A discloses a method and system for monitoring and locating contact resistance faults in thermostats. This method constructs an initial database based on different thermostat models, and uses a resistance fluctuation threshold monitoring method to perform low-energy real-time monitoring of the contact resistance in the thermostat. When contact resistance fluctuation is detected, an infrared thermal imaging module is activated to accurately determine the location information and fault degree of the contact resistance based on the relative temperature difference method and the resistance threshold fluctuation value. However, the related technology does not consider filtering the data obtained from repeated testing of a single model of resistor to obtain effective analysis data, which is not conducive to the rapid response of resistance testing and the scientific nature of test parameter settings, and has certain limitations. Summary of the Invention

[0004] The technical problem solved by this invention is that related technologies do not consider the screening of data obtained from repeated testing of a resistor of a certain type to obtain effective analytical data, which is not conducive to the rapid response of resistance testing and the scientific nature of test parameter settings, and has certain limitations.

[0005] To solve the above technical problems, the present invention provides the following technical solution: a resistance testing method, characterized in that, in step S100, a resistor of any type is tested, and the test results are independently analyzed to obtain its own characteristics; Step S200: According to the test method, perform positive and negative tests on the resistor under test to obtain positive and negative results; Step S300: Based on the positive and negative results and its own characteristics, classify the resistance to be tested into different levels.

[0006] As a preferred embodiment of the resistance testing method of the present invention, step S100 includes the following sub-steps: step S101, obtaining the resistor model and retrieving the resistor lookup table. Step S102: Input the resistor model into the resistor lookup table and match the theoretical resistance parameters corresponding to the resistor model. The resistance parameters include the theoretical resistance value, theoretical power rating, theoretical temperature coefficient, and theoretical tolerance. Step S103: Set test parameters based on the matched resistor parameters. The test parameters include test period, test voltage, test current, test duration and interval duration. The test voltage is a DC voltage, and the test current is a DC current. Step S104: According to the test parameters, the resistance is tested using the four-segment resistance test method to obtain the test results, which are expressed as voltage jitter and temperature accuracy.

[0007] As a preferred embodiment of the resistance testing method of the present invention, step S103 further includes the following steps: step S1031, obtaining historical test data, inputting the resistor model into the historical test data, and matching the historical test data corresponding to the resistor model. Historical test data includes historical test duration, historical test voltage, historical test current, and historical resistance temperature; Historical test duration refers to the duration of testing this type of resistor in any historical time period. Within this historical time period, there are N test cycles, and the duration of each test cycle is a sub-duration. There is an interval cycle between every two consecutive sub-durations, i.e., there are N-1 interval cycles. The expression for calculating the historical test duration is as follows: ; in, This refers to the historical test duration. For the testing period, For interval period; The historical test voltage corresponds to the test cycle, and the corresponding historical test voltage is configured within each test cycle. The historical test current corresponds to the test cycle, and the corresponding historical test current is configured within each test cycle. Historical resistance temperature corresponds to the test cycle and is expressed as the historical temperature value obtained by sampling the surface temperature of the resistor at a first frequency within any test cycle. The first frequency is different for different test cycles and is obtained according to a preset algorithm. Step S1032: Set screening conditions based on theoretical tolerance and theoretical temperature coefficient, and screen historical test data according to the screening conditions; The filtering criteria are: the tolerance corresponding to the historical test data is less than the theoretical tolerance, and the difference between the temperature coefficient corresponding to the historical test data and the theoretical temperature coefficient is less than or equal to the first value. Step S1033: Based on the historical test data obtained through screening, calculate the test cycle, test voltage, test current, test duration, and interval duration, and set the test cycle, test voltage, test current, test duration, and interval duration as test parameters.

[0008] As a preferred embodiment of the resistance testing method described in this invention, a calculation method is configured for the tolerance corresponding to historical test data. The calculation method for the tolerance corresponding to historical test data includes: obtaining any historical test duration, obtaining any test cycle within the historical test duration, obtaining the historical test voltage and historical test current corresponding to the test cycle, calculating a first ratio of the historical test voltage and historical test current, iterating through each of the first ratios within the historical test duration, calculating the average value of the first ratio, and setting the average value of the first ratio as the actual resistance value. Calculate the difference between the actual resistance value and the theoretical resistance value. The difference between the actual resistance value and the theoretical resistance value is represented as the tolerance corresponding to the historical test data.

[0009] As a preferred embodiment of the resistance testing method described in this invention, a calculation method is configured for the temperature coefficient corresponding to historical test data. The calculation method for the temperature coefficient corresponding to historical test data includes: obtaining historical resistance temperatures within any test cycle; obtaining any group of historical resistance temperatures that are adjacent in time; recording the first historical resistance temperature in the group of historical resistance temperatures that are adjacent in time as the first temperature; recording the second historical resistance temperature in the group of historical resistance temperatures that are adjacent in time as the second temperature; calculating a first difference between the second temperature and the first temperature; calculating a second ratio between the first difference and the first temperature; iterating through the second ratios corresponding to each group of historical resistance temperatures that are adjacent in time; calculating the average value of the second ratios; and setting the average value of the second ratios as the temperature coefficient corresponding to the historical test data.

[0010] In a preferred embodiment of the resistance testing method described in this invention, a calculation method is configured for a first frequency, wherein the calculation method for the first frequency is expressed as follows: ; in, The first frequency is given, and e is a constant. This refers to the historical test voltage and historical test current for the corresponding test cycle.

[0011] As a preferred embodiment of the resistance testing method of the present invention, the method for filtering historical test data according to the filtering conditions includes obtaining any historical test data and calculating the tolerance and temperature coefficient corresponding to the historical test data. Compare the tolerance and temperature coefficient corresponding to this historical test data with the screening criteria; If the tolerance and temperature coefficient corresponding to a historical test data point meet the screening criteria, the historical test data point will be retained. If the tolerance and temperature coefficient corresponding to a historical test data point do not meet the screening criteria, the historical test data point will be deleted. Iterate through each historical test data, repeat the steps of comparing it with the filtering criteria, and repeat the data retention or deletion operations. At this point, the screening of historical test data is completed.

[0012] As a preferred embodiment of the resistance testing method described in this invention, the method for calculating the test parameters includes obtaining the retained historical test parameters and obtaining the historical test duration, test cycle, historical test voltage, and historical test current corresponding to the historical test parameters. Calculate the average value of historical test duration and the average value of test cycle, and use them as the test duration and test cycle in the test parameters, respectively. Select the historical test voltage and historical test current corresponding to any test cycle, calculate the average value of historical test voltage and the average value of historical test current, and set the average value of historical test voltage and the average value of historical test current in the test parameters, respectively, corresponding to the test voltage and test current of that test cycle. Calculate the sum of test cycles, calculate the second difference between the test duration and the sum of test cycles, set the second difference as the test margin in the test parameters, count the first number of test cycles, calculate the difference between the first number and 1, calculate the ratio of the test margin to the difference between the first number and 1, and set the ratio of the test margin to the difference between the first number and 1 as the interval period in the test parameters. The test parameters are programmed into PLC code. Based on the PLC code, the resistor of this model is automatically tested. This includes obtaining the duration corresponding to the test cycle, which is recorded as the first duration, and obtaining the duration corresponding to the interval cycle, which is recorded as the second duration. The timer threshold is set to the first duration and the timer threshold is set to the second duration. The drive pulse is matched according to the test voltage and test current. When the resistor is connected, a start command is sent, and a drive pulse wave is sent. At the same time, the timer starts counting down from 0, with the timer unit being seconds. When the timer reaches the first duration, the timer is reset to 0, and the timer starts counting down from the second duration. When the timer value reaches 0, the next test cycle is triggered. That is, the drive pulse for the next cycle is matched according to the test voltage and test current for the next cycle, a start command is sent, and a drive pulse wave for the next cycle is sent. The steps corresponding to the timer, the steps corresponding to the timer, and the test cycle steps are repeated until the preset number of test cycles is completed. In each test cycle, the output voltage, resistor temperature, resistance value, and output current are automatically collected at the corresponding first frequency.

[0013] As a preferred embodiment of the resistance testing method described in this invention, a calculation method is provided for voltage jitter. The calculation method includes: calculating the difference between time-adjacent output voltages; calculating the ratio of the difference between time-adjacent output voltages to the previous voltage in this group of adjacent output voltages; taking the third ratio of the difference between time-adjacent output voltages to the previous voltage in this group of adjacent output voltages; iterating through the third ratios corresponding to each group of time-adjacent output voltages; calculating the average value of the third ratio; and setting the average value of the third ratio as the voltage jitter. For temperature accuracy, a calculation method is configured. The temperature accuracy calculation method includes: obtaining the resistance temperature of two adjacent time points within any test cycle, calculating the difference between the resistance temperatures, calculating the output voltage and output current corresponding to the acquisition time point with the same resistance temperature as these two adjacent time points within the test cycle, calculating the ratio of output voltage to output current, i.e. the actual resistance value, and calculating the difference between the actual resistance values ​​of these two adjacent time points. Calculate the fourth ratio of the difference between the resistance and temperature to the difference between the actual resistance values ​​at these two adjacent times. Calculate the ratio of the fourth ratio to the theoretical temperature coefficient. Set the ratio of the fourth ratio to the theoretical temperature coefficient as the temperature accuracy.

[0014] As a preferred embodiment of the resistance testing method described in this invention, the resistor to be tested is subjected to forward and reverse tests according to the test parameters. Among them, positive testing means that, corresponding to the time sequence of the test cycle, the test is performed in the order of increasing test voltage and increasing test current. Reverse testing means that, corresponding to the time sequence of the test cycle, the tests are performed in the order of test voltage from large to small and test current from large to small. A positive result is represented as the self-feature obtained through a positive test, and a negative result is represented as the self-feature obtained through a negative test. For the test parameters of the positive test and the test parameters of the negative test, there are setting methods. The setting methods include calculating the first product of the maximum test voltage and the maximum test current, calculating the second product between the minimum test voltage and the minimum test current, and calculating the difference between the first product and the second product. Calculate the third product between the first ratio and the theoretical power rating, and calculate the fourth product between the second ratio and the theoretical power rating, wherein the first ratio is less than the second ratio; Based on the difference between the first and second products, the third product, and the fourth product, a first constraint condition is set, which is expressed as follows: the difference between the first and second products is greater than or equal to the third product, and the difference between the first and second products is less than the fourth product. The method for classifying the resistance under test includes obtaining positive and negative results, calculating the average of the positive and negative results, calculating the difference between the average of the positive and negative results and the corresponding self-characteristic, which is recorded as the characteristic gap, and calculating the ratio of the characteristic gap to the corresponding self-characteristic. The characteristic gap includes a first characteristic gap and a second characteristic gap. The first characteristic gap is represented by the characteristic gap corresponding to voltage jitter, and the second characteristic gap is represented by the characteristic gap corresponding to temperature accuracy. Set the second and third values ​​as the voltage jitter threshold and temperature accuracy threshold, respectively. Compare the first feature difference with the second value, and compare the second feature difference with the third value. When the first characteristic difference is less than or equal to the second value, and the second characteristic difference is less than or equal to the third value, the resistor under test is set to the first level. When the first characteristic difference is less than or equal to the second value, and the second characteristic difference is greater than the third value, the resistor under test is set to the second level. When the first characteristic difference is greater than the second value, and the second characteristic difference is less than or equal to the third value, the resistor under test is set to the third level. When the first characteristic difference is greater than the second value, and the second characteristic difference is greater than the third value, the resistor under test is set to the fourth level. The quality of the resistors decreases progressively from the first level to the fourth level.

[0015] The beneficial effects of this invention are as follows: by screening effective historical data, the scientific nature of subsequent analysis and the rationality of test parameters are improved, irreversible damage to the resistor is avoided, the economy of testing is improved, and unidirectional systematic errors such as contact resistance, lead resistance, and thermoelectric potential are eliminated by taking the average value and difference analysis of forward and reverse tests. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the basic process of a resistance testing method provided in one embodiment of the present invention. Detailed Implementation

[0017] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0018] It should be understood that the step numbers used herein are for ease of description only and are not intended to limit the order in which the steps are performed. It should also be understood that the terminology used in this specification is for the purpose of describing specific embodiments only and is not intended to limit the invention.

[0019] As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0020] The terms “comprising” and “including” indicate the presence of the described feature, whole, step, operation, element and / or component, but do not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or collections thereof.

[0021] The term “and / or” refers to any combination of one or more of the associated listed items, as well as all possible combinations, and includes these combinations.

[0022] This application provides a resistance testing method, relating to the field of intelligent testing. This resistance testing method can be applied to a terminal, a server, or software running on either a terminal or a server. In some embodiments, the terminal can be a smartphone, tablet, laptop, desktop computer, etc.; the server can be configured as an independent physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, CDN, and big data and artificial intelligence platforms; the software can be an application implementing a resistance testing method, but is not limited to the above forms.

[0023] This application can also be used in numerous general-purpose or special-purpose computer system environments or configurations. Examples include: personal computers, server computers, handheld or portable devices, tablet devices, multiprocessor systems, microprocessor-based systems, set-top boxes, programmable consumer electronics devices, network PCs, minicomputers, mainframe computers, and distributed computing environments including any of the above systems or devices. This application can be described in the general context of computer-executable instructions executed by a computer, such as program modules. Generally, program modules include routines, programs, objects, components, data structures, etc., that perform specific tasks or implement specific abstract data types. This application can also be practiced in distributed computing environments where tasks are performed by remote processing devices connected via a communication network. In distributed computing environments, program modules can reside in local and remote computer storage media, including storage devices.

[0024] Example, refer to Figure 1 As an embodiment of the present invention, a resistance testing method is provided, including the following steps: Step S100, a resistor of any type is tested, and the test results are independently analyzed to obtain its own characteristics; Step S200: According to the test method, perform positive and negative tests on the resistor under test to obtain positive and negative results; Step S300: Based on the positive and negative results and its own characteristics, classify the resistance to be tested into different levels.

[0025] More preferably, the present invention improves the scientific nature of subsequent analysis and the rationality of test parameters by screening effective historical data, avoids irreversible damage to the resistor, improves the economy of testing, and eliminates unidirectional systematic errors such as contact resistance, lead resistance, and thermoelectric potential by taking the average value of forward and reverse tests and analyzing the difference.

[0026] Step S100 includes the following sub-steps: Step S101, obtain the resistor model and retrieve the resistor lookup table. Step S102: Input the resistor model into the resistor lookup table and match the theoretical resistance parameters corresponding to the resistor model. The resistance parameters include the theoretical resistance value, theoretical power rating, theoretical temperature coefficient, and theoretical tolerance. Step S103: Set test parameters based on the matched resistor parameters. The test parameters include test period, test voltage, test current, test duration and interval duration. The test voltage is a DC voltage, and the test current is a DC current. Step S104: According to the test parameters, the resistance is tested using the four-segment resistance test method to obtain the test results, which are expressed as voltage jitter and temperature accuracy.

[0027] More preferably, by testing, the voltage fluctuation, temperature accuracy, and resistance deviation sequence of the resistor under different operating conditions are obtained, and resistors with obvious problems are screened out to avoid energy waste in subsequent assembly and improve testing efficiency.

[0028] More preferably, the theoretical power rating is expressed as the maximum power that the resistor of this model can withstand, the theoretical temperature coefficient is expressed as the amount of change in resistance value of the resistor of this model when the temperature changes by 1°C, and the theoretical tolerance is expressed as the maximum permissible percentage deviation between the nominal resistance value and the actual measured value.

[0029] Step S103 also includes the following steps: Step S1031, obtain historical test data, input the resistor model into the historical test data, and match the historical test data corresponding to the resistor model; Historical test data includes historical test duration, historical test voltage, historical test current, and historical resistance temperature; Historical test duration refers to the duration of testing this type of resistor in any historical time period. Within this historical time period, there are N test cycles, and the duration of each test cycle is a sub-duration. There is an interval cycle between every two consecutive sub-durations, i.e., there are N-1 interval cycles. The expression for calculating the historical test duration is as follows: ; in, This refers to the historical test duration. For the testing period, For interval period; The historical test voltage corresponds to the test cycle, and the corresponding historical test voltage is configured within each test cycle. The historical test current corresponds to the test cycle, and the corresponding historical test current is configured within each test cycle. Historical resistance temperature corresponds to the test cycle and is expressed as the historical temperature value obtained by sampling the surface temperature of the resistor at a first frequency within any test cycle. The first frequency is different for different test cycles and is obtained according to a preset algorithm. Step S1032: Set screening conditions based on theoretical tolerance and theoretical temperature coefficient, and screen historical test data according to the screening conditions; The filtering criteria are: the tolerance corresponding to the historical test data is less than the theoretical tolerance, and the difference between the temperature coefficient corresponding to the historical test data and the theoretical temperature coefficient is less than or equal to the first value. Step S1033: Based on the historical test data obtained through screening, calculate the test cycle, test voltage, test current, test duration, and interval duration, and set the test cycle, test voltage, test current, test duration, and interval duration as test parameters.

[0030] More preferably, the resistance is tested using the corresponding historical test voltage and historical test current during the test cycle; Within the interval period, the historical test voltage and historical test current are adjusted so that the historical test voltage corresponding to the previous test cycle is adjusted to the test voltage of the next test cycle, and the historical test current corresponding to the previous historical test cycle is adjusted to the test current of the next test cycle.

[0031] A calculation method is configured for the tolerance corresponding to historical test data. The calculation method for the tolerance corresponding to historical test data includes: obtaining any historical test duration, obtaining any test cycle within the historical test duration, obtaining the historical test voltage and historical test current corresponding to the test cycle, calculating the first ratio of the historical test voltage and historical test current, iterating through each first ratio within the historical test duration, calculating the average value of the first ratio, and setting the average value of the first ratio as the actual resistance value. Calculate the difference between the actual resistance value and the theoretical resistance value. The difference between the actual resistance value and the theoretical resistance value is represented as the tolerance corresponding to the historical test data.

[0032] More preferably, by using the tolerances corresponding to historical test data, the manufacturing process deviations of the resistor can be dynamically calibrated to ensure parameter consistency between batches.

[0033] A calculation method is configured for the temperature coefficient corresponding to historical test data. The calculation method for the temperature coefficient corresponding to historical test data includes: obtaining the historical resistance temperature within any test cycle; obtaining any group of historical resistance temperatures that are adjacent in time; recording the first historical resistance temperature in the group of historical resistance temperatures that are adjacent in time as the first temperature; recording the second historical resistance temperature in the group of historical resistance temperatures that are adjacent in time as the second temperature; calculating the first difference between the second temperature and the first temperature; calculating the second ratio between the first difference and the first temperature; iterating through the second ratios corresponding to each group of historical resistance temperatures that are adjacent in time; calculating the average value of the second ratios; and setting the average value of the second ratios as the temperature coefficient corresponding to the historical test data.

[0034] More preferably, the temperature coefficient corresponding to the historical test data can be used to quantify the impact of temperature change on resistivity, which facilitates the subsequent screening of historical test data that meet the requirements.

[0035] A calculation method is configured for the first frequency, and the calculation method for the first frequency is expressed as follows: ; in, The first frequency is given, and e is a constant. This refers to the historical test voltage and historical test current for the corresponding test cycle.

[0036] More preferably, by accurately calculating the first frequency, the response characteristics of the resistor under dynamic operating conditions can be reflected in real time, thereby improving the scientific nature of the screening of historical test data and facilitating the scientific nature of subsequent analysis of test results.

[0037] The methods for filtering historical test data according to the filtering criteria include obtaining any historical test data and calculating the tolerance and temperature coefficient corresponding to that historical test data. Compare the tolerance and temperature coefficient corresponding to this historical test data with the screening criteria; If the tolerance and temperature coefficient corresponding to a historical test data point meet the screening criteria, the historical test data point will be retained. If the tolerance and temperature coefficient corresponding to a historical test data point do not meet the screening criteria, the historical test data point will be deleted. Iterate through each historical test data, repeat the steps of comparing it with the filtering criteria, and repeat the data retention or deletion operations. At this point, the screening of historical test data is completed.

[0038] The calculation method for test parameters includes obtaining the retained historical test parameters, and obtaining the historical test duration, test cycle, historical test voltage, and historical test current corresponding to the historical test parameters; Calculate the average value of historical test duration and the average value of test cycle, and use them as the test duration and test cycle in the test parameters, respectively. Select the historical test voltage and historical test current corresponding to any test cycle, calculate the average value of historical test voltage and the average value of historical test current, and set the average value of historical test voltage and the average value of historical test current in the test parameters, respectively, corresponding to the test voltage and test current of that test cycle. Calculate the sum of test cycles, calculate the second difference between the test duration and the sum of test cycles, set the second difference as the test margin in the test parameters, count the first number of test cycles, calculate the difference between the first number and 1, calculate the ratio of the test margin to the difference between the first number and 1, and set the ratio of the test margin to the difference between the first number and 1 as the interval period in the test parameters.

[0039] More preferably, by standardizing the test parameters, random errors in the testing process can be effectively eliminated, and data reproducibility and model generalization ability can be improved.

[0040] The test parameters are programmed into PLC code. Based on the PLC code, the resistor of this model is automatically tested. This includes obtaining the duration corresponding to the test cycle, which is recorded as the first duration, and obtaining the duration corresponding to the interval cycle, which is recorded as the second duration. The timer threshold is set to the first duration and the timer threshold is set to the second duration. The drive pulse is matched according to the test voltage and test current. When the resistor is connected, a start command is sent, and a drive pulse wave is sent. At the same time, the timer starts counting down from 0, with the timer unit being seconds. When the timer reaches the first duration, the timer is reset to 0, and the timer starts counting down from the second duration. When the timer value reaches 0, the next test cycle is triggered. That is, the drive pulse for the next cycle is matched according to the test voltage and test current for the next cycle, a start command is sent, and a drive pulse wave for the next cycle is sent. The steps corresponding to the timer, the steps corresponding to the timer, and the test cycle steps are repeated until the preset number of test cycles is completed. In each test cycle, the output voltage, resistor temperature, resistance value, and output current are automatically collected at the corresponding first frequency.

[0041] For voltage jitter, a calculation method is configured, which includes: calculating the difference between time-adjacent output voltages, calculating the ratio of the difference between time-adjacent output voltages to the previous voltage in this group of adjacent output voltages, taking the third ratio of the difference between time-adjacent output voltages to the previous voltage in this group of adjacent output voltages, iterating through the third ratios corresponding to each group of time-adjacent output voltages, calculating the average value of the third ratios, and setting the average value of the third ratios as the voltage jitter. For temperature accuracy, a calculation method is configured. The temperature accuracy calculation method includes: obtaining the resistance temperature of two adjacent time points within any test cycle, calculating the difference between the resistance temperatures, calculating the output voltage and output current corresponding to the acquisition time point with the same resistance temperature as these two adjacent time points within the test cycle, calculating the ratio of output voltage to output current, i.e. the actual resistance value, and calculating the difference between the actual resistance values ​​of these two adjacent time points. Calculate the fourth ratio of the difference between the resistance and temperature to the difference between the actual resistance values ​​at these two adjacent times. Calculate the ratio of the fourth ratio to the theoretical temperature coefficient. Set the ratio of the fourth ratio to the theoretical temperature coefficient as the temperature accuracy.

[0042] More preferably, by calculating the temperature accuracy and voltage fluctuation, a quantitative index of the resistor's own stability is obtained, which comprehensively reflects the thermoelectric coupling response characteristics of the resistor under dynamic load.

[0043] According to the test parameters, perform forward and reverse tests on the resistor under test; Among them, positive testing means that, corresponding to the time sequence of the test cycle, the test is performed in the order of increasing test voltage and increasing test current. Reverse testing means that, corresponding to the time sequence of the test cycle, the tests are performed in the order of test voltage from large to small and test current from large to small. A positive result is represented as the self-feature obtained through a positive test, and a negative result is represented as the self-feature obtained through a negative test.

[0044] For the test parameters of the positive test and the test parameters of the negative test, there are setting methods. The setting methods include calculating the first product of the maximum test voltage and the maximum test current, calculating the second product between the minimum test voltage and the minimum test current, and calculating the difference between the first product and the second product. Calculate the third product between the first ratio and the theoretical power rating, and calculate the fourth product between the second ratio and the theoretical power rating, wherein the first ratio is less than the second ratio; Based on the difference between the first and second products, the third product, and the fourth product, a first constraint condition is set, which is expressed as follows: the difference between the first and second products is greater than or equal to the third product, and the difference between the first and second products is less than the fourth product.

[0045] The method for classifying the resistance under test includes obtaining positive and negative results, calculating the average of the positive and negative results, calculating the difference between the average of the positive and negative results and the corresponding self-characteristic, which is recorded as the characteristic gap, and calculating the ratio of the characteristic gap to the corresponding self-characteristic. The characteristic gap includes a first characteristic gap and a second characteristic gap. The first characteristic gap is represented by the characteristic gap corresponding to voltage jitter, and the second characteristic gap is represented by the characteristic gap corresponding to temperature accuracy. Set the second and third values ​​as the voltage jitter threshold and temperature accuracy threshold, respectively. Compare the first feature difference with the second value, and compare the second feature difference with the third value. When the first characteristic difference is less than or equal to the second value, and the second characteristic difference is less than or equal to the third value, the resistor under test is set to the first level. When the first characteristic difference is less than or equal to the second value, and the second characteristic difference is greater than the third value, the resistor under test is set to the second level. When the first characteristic difference is greater than the second value, and the second characteristic difference is less than or equal to the third value, the resistor under test is set to the third level. When the first characteristic difference is greater than the second value, and the second characteristic difference is greater than the third value, the resistor under test is set to the fourth level. The quality of the resistors decreases progressively from the first level to the fourth level.

[0046] Further preferably, by screening effective historical data, the scientific nature of subsequent analysis and the rationality of test parameters are improved, irreversible damage to the resistor is avoided, the economy of testing is improved, and unidirectional systematic errors such as contact resistance, lead resistance, and thermoelectric potential are eliminated by taking the average value and difference analysis of forward and reverse tests.

[0047] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product implemented on one or more computer-usable storage media containing computer-usable program code. The storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as Static Random Access Memory (SRAM), Electrically Erasable Programmable Read-Only Memory (EEPROM), Erasable Programmable Read Only Memory (EPROM), Programmable Red-Only Memory (PROM), Read-Only Memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk. These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0048] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the protection scope of the present invention.

Claims

1. A resistance testing method, characterized in that, The process includes the following steps: Step S100, testing a resistor of any resistor model, independently analyzing the test results to obtain its own characteristics, the test results including output voltage, resistor temperature, resistance value and output current, and its own characteristics including voltage jitter and temperature accuracy. Before testing any resistor model, the historical test data is first filtered according to historical test data and screening conditions. Test parameters are obtained based on the retained historical test data, and the resistor model is tested based on the test parameters. For voltage jitter, a calculation method is configured, which includes: calculating the difference between time-adjacent output voltages, calculating the ratio of the difference between time-adjacent output voltages to the previous voltage in this group of adjacent output voltages, taking the third ratio of the difference between time-adjacent output voltages to the previous voltage in this group of adjacent output voltages, iterating through the third ratios corresponding to each group of time-adjacent output voltages, calculating the average value of the third ratios, and setting the average value of the third ratios as the voltage jitter. For temperature accuracy, a calculation method is configured. The temperature accuracy calculation method includes: obtaining the resistance temperature of two adjacent time points within any test cycle, calculating the difference between the resistance temperatures, calculating the output voltage and output current corresponding to the acquisition time point with the same resistance temperature as these two adjacent time points within the test cycle, calculating the ratio of output voltage to output current, i.e. the actual resistance value, and calculating the difference between the actual resistance values ​​of these two adjacent time points. Calculate the fourth ratio of the difference between the resistance and temperature to the difference between the actual resistance values ​​at these two adjacent times, calculate the ratio of the fourth ratio to the theoretical temperature coefficient, and set the ratio of the fourth ratio to the theoretical temperature coefficient as the temperature accuracy. Step S200: According to the test method, perform positive and negative tests on the resistor under test to obtain positive and negative results; Before performing forward and reverse tests, the test parameters are written into the PLC to obtain the PLC code. Based on the PLC code, the resistor of this model is automatically tested. The testing method includes: obtaining the duration corresponding to the test cycle, denoted as the first duration, and obtaining the duration corresponding to the interval cycle, denoted as the second duration; setting the timer threshold to the first duration and the timer threshold to the second duration; matching the drive pulse according to the test voltage and test current; sending a start command and drive pulse wave when the resistor is connected; simultaneously, the timer starts counting from 0, with the counting unit being seconds; when the timer reaches the first duration, the timer is reset to 0, and the timer starts counting down from the second duration; when the timer value reaches 0, the next test cycle is triggered, that is, matching the drive pulse of the next cycle according to the test voltage and test current of the next cycle, sending a start command and drive pulse wave of the next cycle, and repeating the steps corresponding to the timer, the steps corresponding to the timer, and the test cycle steps until the preset test cycle is completed; in each test cycle, the output voltage, resistor temperature, resistance value, and output current are automatically collected according to the corresponding first frequency. Positive testing means that, corresponding to the time sequence of the test cycle, the tests are performed in order of increasing test voltage and increasing test current. Reverse testing means that, corresponding to the time sequence of the test cycle, the tests are performed in descending order of test voltage and descending order of test current. A positive result is represented as the self-feature obtained through a positive test, and a negative result is represented as the self-feature obtained through a negative test. Step S300: Based on the positive and negative results and its own characteristics, classify the resistance to be tested into different levels.

2. The resistance testing method as described in claim 1, characterized in that, Step S100 includes the following sub-steps: Step S101, obtain the resistor model and retrieve the resistor lookup table. Step S102: Input the resistor model into the resistor lookup table and match the theoretical resistance parameters corresponding to the resistor model. The theoretical resistance parameters include the theoretical resistance value, theoretical power rating, theoretical temperature coefficient, and theoretical tolerance. Step S103: Set test parameters based on the matched resistor parameters. The test parameters include test period, test voltage, test current, test duration and interval duration. The test voltage is a DC voltage, and the test current is a DC current. Step S103 also The steps include: Step S1031, obtaining historical test data, inputting the resistor model into the historical test data, and matching the historical test data corresponding to the resistor model; Historical test data includes historical test duration, historical test voltage, historical test current, and historical resistance temperature; Historical test duration refers to the duration of testing this type of resistor in any historical time period. Within this historical time period, there are N test cycles, and the duration of each test cycle is a sub-duration. There is an interval cycle between every two consecutive sub-durations, i.e., there are N-1 interval cycles. The expression for calculating the historical test duration is as follows: ; in, This refers to the historical test duration. For the testing period, For interval period; The historical test voltage corresponds to the test cycle, and the corresponding historical test voltage is configured within each test cycle. The historical test current corresponds to the test cycle, and the corresponding historical test current is configured within each test cycle. Step S1032: Set screening conditions based on theoretical tolerance and theoretical temperature coefficient, and screen historical test data according to the screening conditions; Step S1033: Based on the historical test data obtained through screening, calculate the test cycle, test voltage, test current, test duration and interval duration, and set the test cycle, test voltage, test current, test duration and interval duration as test parameters; Methods for filtering historical test data include testing the resistance using the corresponding historical test voltage and historical test current within the test period; Within the interval period, the historical test voltage and historical test current are adjusted so that the historical test voltage corresponding to the previous test cycle is adjusted to the test voltage of the next test cycle, and the historical test current corresponding to the previous historical test cycle is adjusted to the test current of the next test cycle. Get any historical test duration, get any test cycle within that historical test duration, get the historical test voltage and historical test current corresponding to that test cycle, calculate the first ratio of the historical test voltage and historical test current, iterate through each of the first ratios within that historical test duration, calculate the average value of the first ratios, and set the average value of the first ratios as the actual resistance value. Calculate the difference between the actual resistance value and the theoretical resistance value. The difference between the actual resistance value and the theoretical resistance value is represented as the tolerance corresponding to the historical test data. Obtain the historical resistance temperature within any test cycle, obtain any group of historical resistance temperatures that are adjacent in time, record the first historical resistance temperature in the group of historical resistance temperatures that are adjacent in time as the first temperature, record the second historical resistance temperature in the group of historical resistance temperatures that are adjacent in time as the second temperature, calculate the first difference between the second temperature and the first temperature, calculate the second ratio between the first difference and the first temperature, iterate through the second ratios corresponding to each group of historical resistance temperatures that are adjacent in time, calculate the average value of the second ratios, and set the average value of the second ratios as the temperature coefficient corresponding to the historical test data. The calculation method for the first frequency is expressed as follows: ; in, The first frequency is given, and e is a constant. The historical test voltage and historical test current for the corresponding test cycle; Obtain any historical test data and calculate the tolerance and temperature coefficient corresponding to that historical test data; Compare the tolerance and temperature coefficient corresponding to this historical test data with the screening criteria; If the tolerance and temperature coefficient corresponding to a historical test data point meet the screening criteria, the historical test data point will be retained. If the tolerance and temperature coefficient corresponding to a historical test data point do not meet the screening criteria, the historical test data point will be deleted. Iterate through each historical test data, repeat the steps of comparing it with the filtering criteria, and repeat the data retention or deletion operations. At this point, the historical test data has been filtered. The calculation method for test parameters includes obtaining the retained historical test parameters, and obtaining the historical test duration, test cycle, historical test voltage, and historical test current corresponding to the historical test parameters; Calculate the average value of historical test duration and the average value of test cycle, and use them as the test duration and test cycle in the test parameters, respectively. Select the historical test voltage and historical test current corresponding to any test cycle, calculate the average value of historical test voltage and the average value of historical test current, and set the average value of historical test voltage and the average value of historical test current in the test parameters, respectively, corresponding to the test voltage and test current of that test cycle. Calculate the sum of test cycles, calculate the second difference between the test duration and the sum of test cycles, set the second difference as the test margin in the test parameters, count the first number of test cycles, calculate the difference between the first number and 1, calculate the ratio of the test margin to the difference between the first number and 1, and set the ratio of the test margin to the difference between the first number and 1 as the interval period in the test parameters. Step S104: According to the test parameters, the resistance is tested using the four-segment resistance test method to obtain the test results.

3. The resistance testing method as described in claim 1, characterized in that, For the test parameters of the positive test and the test parameters of the negative test, there are setting methods. The setting methods include calculating the first product of the maximum test voltage and the maximum test current, calculating the second product between the minimum test voltage and the minimum test current, and calculating the difference between the first product and the second product. Calculate the third product between the first ratio and the theoretical power rating, and calculate the fourth product between the second ratio and the theoretical power rating, wherein the first ratio is less than the second ratio; Based on the difference between the first and second products, the third product, and the fourth product, a first constraint condition is set, which is expressed as follows: the difference between the first and second products is greater than or equal to the third product, and the difference between the first and second products is less than the fourth product. The method for classifying the resistance under test includes obtaining positive and negative results, calculating the average of the positive and negative results, calculating the difference between the average of the positive and negative results and the corresponding self-characteristic, which is recorded as the characteristic gap, and calculating the ratio of the characteristic gap to the corresponding self-characteristic. The characteristic gap includes a first characteristic gap and a second characteristic gap. The first characteristic gap is represented by the characteristic gap corresponding to voltage jitter, and the second characteristic gap is represented by the characteristic gap corresponding to temperature accuracy. Set the second and third values ​​as the voltage jitter threshold and temperature accuracy threshold, respectively. Compare the first feature difference with the second value, and compare the second feature difference with the third value. When the first characteristic difference is less than or equal to the second value, and the second characteristic difference is less than or equal to the third value, the resistor under test is set to the first level. When the first characteristic difference is less than or equal to the second value, and the second characteristic difference is greater than the third value, the resistor under test is set to the second level. When the first characteristic difference is greater than the second value, and the second characteristic difference is less than or equal to the third value, the resistor under test is set to the third level. When the first characteristic difference is greater than the second value, and the second characteristic difference is greater than the third value, the resistor under test is set to the fourth level. The quality of the resistors decreases progressively from the first level to the fourth level.

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