High spatial resolution high-energy industrial CT linear array detector and manufacturing method thereof
By combining the staggered design of the scintillation crystal linear array with the reflective layer, the spatial resolution of industrial CT detectors has been improved, solving the problems of high manufacturing difficulty and high cost in existing technologies. This has improved the detector's resolution and signal-to-noise ratio, while reducing manufacturing difficulty and cost.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHONGQING UNIV
- Filing Date
- 2026-03-24
- Publication Date
- 2026-06-02
AI Technical Summary
In order to improve the spatial resolution of existing industrial CT detectors, reducing the pixel size of photodiodes will increase the difficulty and cost of manufacturing processes, while using optical beam expanders or interpolation reconstruction algorithms will introduce artifacts, making it impossible to overcome the pixel limitation at the physical level.
By employing a scintillation crystal linear array design, X-rays are incident from the side. Through the misaligned scintillation crystal strips and reflective layer, combined with an optical isolation layer and photodiode array, directional output of scintillation light is achieved, thereby improving the spatial resolution and signal-to-noise ratio of the detector.
Without changing the photodiode array manufacturing process, the detector spatial resolution is doubled, the signal-to-noise ratio is improved, the manufacturing difficulty and cost are reduced, and the number of detector pixels is increased, resulting in a 2-fold increase in detection efficiency.
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Figure CN122131368A_ABST