Electronic device detection and feeding integrated device

Abstract

The application discloses an electronic device detection and feeding integrated equipment, and relates to the technical field of feeding equipment. The electronic device detection and feeding integrated equipment is used for detecting and feeding electronic devices. The electronic device comprises a main body and a connector. The electronic device detection and feeding integrated equipment comprises a driving device, a material taking device and a detection device. The material taking device is in transmission connection with the driving device. The driving device can drive the material taking device to move in space. The material taking device is used for picking up the main body. The detection device is in transmission connection with the driving device. The driving device can drive the detection device to move together with the material taking device. The detection device is used for connecting the connector. When the material taking device picks up the main body, the detection device can connect the connector. The electronic device detection and feeding integrated equipment can shorten the test process and improve the yield of assembled products by directly detecting the electronic device after picking up the electronic device and then feeding the electronic device.

Description

Technical Field

[0001] This invention relates to the field of feeding equipment technology, and in particular to an integrated feeding and testing equipment for electronic devices. Background Technology

[0002] AR glasses can perform numerous functions, determining the user's state by tracking their eye movement and activating corresponding features. In existing technology, AR glasses can achieve imaging by combining a single-layer ultra-thin holographic waveguide with a full-color MicroLED display. However, the full-color MicroLED display, being an electronic device, requires power-on testing before high-precision assembly with the waveguide to ensure its proper functioning.

[0003] In existing automated assembly lines, there is usually a separate power-on testing station, and a corresponding testing table for the electronic components is also set up. After the picking device picks up the electronic components from the supply station, it needs to move to the power-on testing station, place the electronic components on the testing table, and wait for the electronic components to pass the power-on test before the picking device continues to pick up electronic components and move them to the assembly station to complete the loading. The above process requires multiple positioning and picking of electronic components, which affects assembly accuracy, and it also requires a separate testing station and testing table, as well as a complicated picking, testing, and loading process. Summary of the Invention

[0004] This invention aims to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes an integrated testing and loading device for electronic components. After picking up the electronic components, it directly performs power-on testing and then loads them, which can shorten the testing process and improve the yield of the assembled finished product.

[0005] An integrated testing and loading device for electronic devices according to an embodiment of the present invention is used for testing and loading electronic devices, wherein the electronic devices include a body and a connector, and the integrated testing and loading device for electronic devices includes: Drive unit, material handling unit, and detection unit; The material picking device is connected to the driving device, and the driving device can drive the material picking device to move in space. The material picking device is used to pick up the main body. The detection device is connected to the driving device, and the driving device can drive the detection device and the material handling device to move together. The detection device is used to connect to the connector. When the material handling device picks up the main body, the detection device can connect to the connector.

[0006] The integrated electronic device loading and testing equipment according to embodiments of the present invention has at least the following advantages: The picking device and the testing device are mounted on the same driving device, allowing for the determination of their relative positions. When the picking device picks up an electronic device, the connector of the electronic device can correspond to the testing device. That is, after the picking device picks up the electronic device, the testing device can directly perform power-on testing on it, eliminating the need for a separate testing station and shortening the testing process for electronic devices. During the process of the driving device picking up the electronic device from the feeding station and moving it to the assembly station, the testing device can complete the power-on testing of the electronic device. Therefore, when the driving device reaches the assembly station, the picking device can directly complete the loading.

[0007] According to some embodiments of the present invention, the detection device includes a power-on component and a clamping component. The power-on component is provided with a contact mechanism, and the clamping component is provided with a pressure plate mechanism. The contact mechanism and the pressure plate mechanism are disposed opposite to each other. The clamping component can drive the pressure plate mechanism to move to change the distance between the contact mechanism and the pressure plate mechanism. When the picking device picks up the main body, the connector is located between the contact mechanism and the pressure plate mechanism.

[0008] According to some embodiments of the present invention, the contact mechanism includes a needle seat and a spring needle, the spring needle being fixed to the needle seat and disposed toward the pressure plate mechanism.

[0009] According to some embodiments of the present invention, the power-on assembly further includes a limiting block, the limiting block being fixed to the pin seat and located on the side of the pin seat facing the pressure plate mechanism, the spring pin passing through the limiting block, the pressure plate mechanism being able to drive the connector to move toward the limiting block and cause the connector to abut against the limiting block, and when the connector abuts against the limiting block, the spring pin is connected to the connector.

[0010] According to some embodiments of the present invention, the power-on assembly further includes a reset mechanism disposed between the needle seat and the pressure plate mechanism. The reset mechanism is movable to a first position along a first direction or to a second position along a direction opposite to the first direction. The direction from the pressure plate mechanism to the needle seat is defined as the first direction. In the first position, the end of the spring needle passes through the reset mechanism and is located between the reset mechanism and the pressure plate mechanism. In the second position, the spring needle is retracted between the reset mechanism and the needle seat.

[0011] According to some embodiments of the present invention, the reset mechanism includes a first elastic element and a movable block. The movable block is disposed between the needle seat and the pressure plate mechanism. One end of the first elastic element is connected to the needle seat, and the other end of the first elastic element is connected to the movable block. The first elastic element is configured to drive the movable block to move to a second position. The movable block is provided with a clearance hole. In the first position, the end of the spring needle passes through the clearance hole to the space between the movable block and the pressure plate mechanism. In the second position, the spring needle retracts to the space between the movable block and the needle seat.

[0012] According to some embodiments of the present invention, the detection device further includes a floating component disposed between the driving device and the power-on component, the floating component being capable of driving the power-on component to move to change the relative position between the power-on component and the material handling device.

[0013] According to some embodiments of the present invention, the floating component includes a connector, a base, and a second elastic member. The base is disposed between the driving device and the power-on component and is fixed to the power-on component. One end of the second elastic member is connected to the driving device, and the other end of the second elastic member is connected to the base. The connector is movably connected between the driving device and the base, such that the second elastic member is configured to be in a compressed state.

[0014] According to some embodiments of the present invention, a material carrier is further included, the material carrier having a plurality of placement positions for supporting the electronic device.

[0015] According to some embodiments of the present invention, the material carrier includes a support plate, the support plate having a plurality of limiting grooves and a plurality of through clearance grooves, each of the limiting grooves being connected to a clearance groove and forming a placement position, the electronic device being able to be placed in the limiting groove, and the connector being able to face the clearance groove.

[0016] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments, wherein: Figure 1 This is a schematic diagram of the integrated testing and loading equipment for electronic devices according to an embodiment of the present invention; Figure 2 This is a partial structural schematic diagram of the integrated testing and loading equipment for electronic devices according to an embodiment of the present invention; Figure 3This is a schematic diagram of the material handling device and the detection device according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the structure of an electronic device; Figure 5 This is an exploded view of the detection device according to an embodiment of the present invention; Figure 6 This is a top view of the detection device according to an embodiment of the present invention; Figure 7 This is a cross-sectional view of the detection device according to an embodiment of the present invention from the perspective of AA. Figure 8 This is a cross-sectional view of the detection device according to an embodiment of the present invention from the perspective of BB. Figure 9 This is a schematic diagram of the material loading device according to an embodiment of the present invention; Figure 10 This is a partial structural diagram of the support plate according to an embodiment of the present invention.

[0018] Icon labels: Main body 0001, connector 0002; Drive device 1000, material handling device 2000, suction nozzle assembly 2100, detection device 3000, power-on assembly 3100, contact mechanism 3110, needle seat 3111, spring needle 3112, limit block 3120, reset mechanism 3130, first elastic element 3131, movable block 3132, clearance hole 3133, pressing assembly 3200, pressure plate mechanism 3210, floating assembly 3300, connecting part 3310, base 3320, second elastic element 3330, material loading device 4000, placement position 4001, bearing plate 4100, limit groove 4110, clearance groove 4120. Detailed Implementation

[0019] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0020] In the description of this invention, it should be understood that the orientation descriptions, such as up, down, etc., are based on the orientation or positional relationship shown in the drawings and are only for the convenience of describing this invention and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention.

[0021] In the description of this invention, "multiple" refers to two or more. The use of "first" and "second" is for distinguishing technical features only and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features or their sequential relationship.

[0022] In the description of this invention, unless otherwise explicitly defined, terms such as "set up," "install," and "connect" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this invention in conjunction with the specific content of the technical solution.

[0023] Reference Figure 1 As shown, an embodiment of the present invention provides an integrated testing and loading device for electronic devices, which is used to test and load electronic devices. The electronic devices include a main body 0001 and a connector 0002. The integrated testing and loading device for electronic devices includes a driving device 1000, a picking device 2000, and a testing device 3000. Figure 4 This is a schematic diagram of the structure of an electronic device.

[0024] The picking device 2000 is connected to the driving device 1000, and the driving device 1000 can drive the picking device 2000 to move in space. The picking device 2000 is used to pick up the main body 0001. The detection device 3000 is connected to the driving device 1000, and the driving device 1000 can drive the detection device 3000 to move together with the picking device 2000. The detection device 3000 is used to connect to the connector 0002. When the picking device 2000 picks up the main body 0001, the detection device 3000 can connect to the connector 0002.

[0025] It should be understood that the ability of the drive device 1000 to move in space means that the drive device 1000 has a travel distance along the X, Y, and Z axes, as well as a rotational travel distance around the corresponding axes. The X, Y, and Z axes are mutually perpendicular. Preferably, a linear module can be set in the axis requiring a large range of movement, such as the travel distance between the feeding point and the assembly station. In the axis requiring a small range of movement, it can be achieved by an electric five-axis displacement angle fine-tuning component, for example, a small range of movement at the feeding point to accurately position the main body 0001 of the electronic device for precise pickup. The aforementioned linear module and electric five-axis displacement angle fine-tuning component are both commonly used drive mechanisms in the prior art, and their specific structures will not be described in detail in this application.

[0026] The picking device 2000 is used to pick up electronic components. In the embodiments of this application, the picking point of the picking device 2000 is located at the main body 0001. Preferably, the picking device 2000 picks up the main body 0001 by vacuum adsorption. For example, the picking device 2000 includes a suction nozzle assembly 2100, one end of which is connected to a vacuum pump, and the other end is used to contact the main body 0001 and adsorb the main body 0001.

[0027] The testing device 3000 is used to connect electronic components and perform power-on testing to ensure that the electronic components to be assembled are qualified parts. Specifically, the testing device 3000 is used to connect to connector 0002. The testing device 3000 has a corresponding testing circuit and power supply. After connecting to connector 0002, it can automatically power on and analyze whether the various functional modules of the electronic components are working properly. It should be understood that the testing circuit, analysis logic, and software of the testing device 3000 are prior art and will not be described in detail in this application.

[0028] Reference Figure 2 As shown, the picking device 2000 and the detection device 3000 are both mounted on the same driving device 1000. Therefore, the relative position between the picking device 2000 and the detection device 3000 can be determined based on the relative position between the main body 0001 of the electronic device and the connector 0002, so that when the picking device 2000 picks up the main body 0001, the connector 0002 can be connected to the detection device 3000 accordingly.

[0029] To ensure a stable connection between the testing device 3000 and the connector 0002 and to guarantee normal power-on testing, this application also provides the structure of some specific embodiments of the testing device 3000.

[0030] Reference Figure 3 As shown, it can be understood that the detection device 3000 includes a power-on component 3100 and a clamping component 3200. The power-on component 3100 is provided with a contact mechanism 3110, and the clamping component 3200 is provided with a pressure plate mechanism 3210. The contact mechanism 3110 and the pressure plate mechanism 3210 are arranged opposite to each other. The clamping component 3200 can drive the pressure plate mechanism 3210 to move to change the distance between the contact mechanism 3110 and the pressure plate mechanism 3210. When the picking device 2000 picks up the main body 0001, the connector 0002 is located between the contact mechanism 3110 and the pressure plate mechanism 3210.

[0031] In the embodiments of this application, more specifically, the connector 0002 of the electronic device is connected by the power-on component 3100, while the clamping component 3200 is used to drive the connector 0002 toward the power-on component 3100 and maintain the connector 0002 in contact with the power-on component 3100 for electrical connection. In a further structure, the power-on component 3100 is provided with a contact mechanism 3110, and the clamping component 3200 is provided with a pressure plate mechanism 3210, which drives the connector 0002 to move and maintains the connector 0002 in contact with the contact mechanism 3110 for electrical connection.

[0032] The contact mechanism 3110 and the pressure plate mechanism 3210 are arranged opposite to each other. When the connector 0002 is between the contact mechanism 3110 and the pressure plate mechanism 3210, the clamping component 3200 can drive the pressure plate mechanism 3210 to move to reduce the distance between the pressure plate mechanism 3210 and the contact mechanism 3110. That is, the contact mechanism 3110 and the pressure plate mechanism 3210 jointly clamp the connector 0002, and at the same time, the contact mechanism 3110 and the connector 0002 make contact to complete the electrical connection.

[0033] In some embodiments, the clamping assembly 3200 further includes a cylinder, and the pressure plate mechanism 3210 is drivenly connected to the cylinder. The cylinder pushes the pressure plate mechanism 3210 to move away from the contact mechanism 3110, or pulls the pressure plate mechanism 3210 to move towards the contact mechanism 3110.

[0034] Combination Figures 5 to 8 The structure of the detection device 3000 shown is further explained.

[0035] It is understood that the contact mechanism 3110 includes a needle seat 3111 and a spring needle 3112, the spring needle 3112 is fixed to the needle seat 3111, and the spring needle 3112 is positioned toward the pressure plate mechanism 3210.

[0036] After the picking device 2000 picks up the main body 0001, the connector 0002 will be positioned between the spring pin 3112 and the pressure plate mechanism 3210. The pressure plate mechanism 3210 moves towards the spring pin 3112, pressing the connector 0002 onto the spring pin 3112. Specifically, the metal contacts of the connector 0002 make contact and conduct with the spring pin 3112. It should be understood that the connector 0002 typically has multiple metal contacts, therefore the pin holder 3111 will have multiple spring pins 3112. The number of spring pins 3112 is the same as the number of metal contacts of the connector 0002, and the arrangement direction of the spring pins 3112 on the pin holder 3111 is also the same as the arrangement direction of the metal contacts on the connector 0002.

[0037] Understandably, the power-on assembly 3100 also includes a limiting block 3120, which is fixed to the pin seat 3111 and is located on the side of the pin seat 3111 facing the pressure plate mechanism 3210. The spring pin 3112 passes through the limiting block 3120, and the pressure plate mechanism 3210 can drive the connector 0002 to move toward the limiting block 3120, so that the connector 0002 abuts against the limiting block 3120. When the connector 0002 abuts against the limiting block 3120, the spring pin 3112 is connected to the connector 0002.

[0038] Specifically, the limiting block 3120 is used to contact the non-contact parts of the connector 0002 to limit the contact force between the metal contacts of the connector 0002 and the spring pin 3112. It's important to understand that as the connector 0002 moves towards the spring pin 3112, the contact force between the connector 0002 and the spring pin 3112 increases with the amount of displacement. If the contact force exceeds the design value, the spring pin 3112 will be damaged. On one hand, the contact force between the connector 0002 and the spring pin 3112 can be controlled by the movement distance of the pressure plate mechanism 3210; on the other hand, the limiting block 3120 can also serve as a physical limit. By selecting an appropriate thickness for the limiting block 3120, the length of the end of the spring pin 3112 extending out of the limiting block 3120 can be controlled. When the non-contact position of the connector 0002 contacts the limiting block 3120, the contact force between the contact position and the spring pin 3112 is ensured to be at an appropriate value. At this time, even if the pressure plate mechanism 3210 increases the pressure on the connector 0002, it will only increase the contact force between the connector 0002 and the limiting block 3120, and will not increase the contact force between the connector 0002 and the spring pin 3112.

[0039] It is understood that the power-on assembly 3100 also includes a reset mechanism 3130, which is disposed between the needle seat 3111 and the pressure plate mechanism 3210. The reset mechanism 3130 can move to a first position in a first direction or to a second position in a direction opposite to the first direction. The direction from the pressure plate mechanism 3210 to the needle seat 3111 is defined as the first direction. In the first position, the end of the spring needle 3112 passes through the reset mechanism 3130 and is located between the reset mechanism 3130 and the pressure plate mechanism 3210. In the second position, the spring needle 3112 is retracted between the reset mechanism 3130 and the needle seat 3111.

[0040] The reset mechanism 3130 is configured in the second position by default. At this time, the reset mechanism 3130 is between the spring pin 3112 and the pressure plate mechanism 3210. When the pressure plate mechanism 3210 drives the connector 0002 to move toward the spring pin 3112, the connector 0002 first contacts the reset mechanism 3130. Then the pressure plate mechanism 3210 continues to drive the connector 0002 to move toward the spring pin 3112. At this time, the reset mechanism 3130 is driven by external force to move to the first position, that is, the end of the spring pin 3112 can pass through the reset mechanism 3130 and be between the reset mechanism 3130 and the pressure plate mechanism 3210. In other words, the spring pin 3112 contacts the connector 0002 to complete the electrical connection.

[0041] When the pressure plate mechanism 3210 moves away from the spring pin 3112, the force applied to the connector 0002 is removed. The reset mechanism 3130 then moves to the default second position. This means the reset mechanism 3130 acts on the connector 0002 to actively disconnect the connector 0002 from the spring pin 3112, facilitating subsequent electronic component loading. It should also be understood that when the reset mechanism 3130 is in the second position, the spring pin 3112 retracts between the reset mechanism 3130 and the pin holder 3111, meaning the reset mechanism 3130 also provides storage and protection for the spring pin 3112.

[0042] It is understood that the reset mechanism 3130 includes a first elastic element 3131 and a movable block 3132. The movable block 3132 is disposed between the needle seat 3111 and the pressure plate mechanism 3210. One end of the first elastic element 3131 is connected to the needle seat 3111, and the other end of the first elastic element 3131 is connected to the movable block 3132. The first elastic element 3131 is configured to drive the movable block 3132 to move to a second position. The movable block 3132 is provided with a clearance hole 3133. In the first position, the end of the spring needle 3112 passes through the clearance hole 3133 and extends between the movable block 3132 and the pressure plate mechanism 3210. In the second position, the spring needle 3112 retracts between the movable block 3132 and the needle seat 3111.

[0043] When the pressure plate mechanism 3210 drives the connector 0002 to move toward the spring pin 3112, the connector 0002 first contacts the movable block 3132. Then, the pressure plate mechanism 3210 continues to drive the connector 0002 to move toward the spring pin 3112. At this time, the movable block 3132 is driven by external force to move to the first position. Simultaneously, the movable block 3132 squeezes the first elastic element 3131, causing the first elastic element 3131 to compress and store energy. After the movable block 3132 is in the first position, the end of the spring pin 3112 can pass through the movable block 3132 and be located between the movable block 3132 and the pressure plate mechanism 3210. That is, the spring pin 3112 contacts the connector 0002 to complete the electrical connection. The spring pin 3112 passes through the clearance hole 3133.

[0044] When the pressure plate mechanism 3210 moves away from the spring pin 3112, the force applied to the connector 0002 is removed, and the movable block 3132 is driven by the first elastic element 3131 to move to the second position. That is, the movable block 3132 acts on the connector 0002 to actively disconnect the connector 0002 from the spring pin 3112, which facilitates the subsequent loading of electronic components.

[0045] It is understood that the detection device 3000 also includes a floating component 3300, which is disposed between the drive device 1000 and the power-on component 3100. The floating component 3300 can drive the power-on component 3100 to move to change the relative position between the power-on component 3100 and the material handling device 2000.

[0046] The floating component 3300 provides the power-on component 3100 with the ability to fine-tune its position, specifically for changing the relative position between the power-on component 3100 and the picking device 2000. It's important to understand that although the positions of the main body 0001 and connector 0002 in the electronic device are relatively fixed, the picking device 2000's position when picking up the main body 0001 may have errors. These errors can be transmitted to the power-on component 3100 and connector 0002, potentially causing the deviation between them to exceed the upper limit and preventing power-on connection. With the floating component 3300 positioned between the power-on component 3100 and the drive device 1000, even if there is a deviation between the connector 0002 and the power-on component 3100, external forces on the power-on component 3100 will cause the floating component 3300 to adjust, ensuring normal contact and electrical connection between the connector 0002 and the power-on component 3100. Specifically, the floating component 3300 provides floating capability, and the spring pin 3112 is able to self-guide and align the metal contacts on the connector 0002.

[0047] It is understood that the floating component 3300 includes a connector 3310, a base 3320, and a second elastic member 3330. The base 3320 is disposed between the drive device 1000 and the power-on component 3100 and is fixed to the power-on component 3100. One end of the second elastic member 3330 is connected to the drive device 1000, and the other end of the second elastic member 3330 is connected to the base 3320. The connector 3310 is movably connected between the drive device 1000 and the base 3320, so that the second elastic member 3330 is configured to be in a compressed state.

[0048] Specifically, the drive device 1000 is provided with a fixed base, and the fixed base has a through connecting hole. The connecting member 3310 can be a connecting bolt. After passing through the connecting hole, the connecting member 3310 is threadedly connected to the base 3320. That is, the base 3320 and the connecting member 3310 can move relative to the drive device 1000, but the connecting hole limits the range of movement of the connecting member 3310. Further, the second elastic member 3330 connects the base 3320 and the drive device 1000. Specifically, the other end of the second elastic member 3330 is connected to the fixed base. At this time, the base 3320 can float. After the range of movement of the base 3320 is limited by the cooperation between the connecting member 3310 and the fixed base, the second elastic member 3330 can be compressed and maintained in a compressed state. At this time, the base 3320 can float under force. Preferably, the second elastic member 3330 can be multiple springs.

[0049] Reference Figure 9 As shown, it can be understood that it also includes a material carrier 4000, which has multiple placement positions 4001 for carrying electronic devices.

[0050] Reference Figure 10 As shown, it can be understood that the material loading device 4000 includes a support plate 4100, which has multiple limiting grooves 4110 and multiple through clearance grooves 4120. Each limiting groove 4110 is connected to a clearance groove 4120 and forms a placement position 4001. Electronic devices can be placed in the limiting groove 4110, and the connector 0002 can face the clearance groove 4120.

[0051] In some embodiments, the detection device 3000 includes a power-on assembly 3100 and a clamping assembly 3200, wherein the power-on assembly 3100 is provided with a contact mechanism 3110 and the clamping assembly 3200 is provided with a pressure plate mechanism 3210. It should be understood that, since the pressure plate mechanism 3210 and the contact mechanism 3110 are arranged opposite to each other, the connector 0002 needs to be moved from the side between the pressure plate mechanism 3210 and the contact mechanism 3110.

[0052] The drive unit 1000 first moves the picking device 2000 and the detection device 3000 above the placement position 4001 where the electronic device to be picked up is located. Then, the drive unit 1000 makes a fine adjustment to position the detection device 3000 above the clearance groove 4120. Next, the detection device 3000 moves down, allowing the pressure plate mechanism 3210 to pass through the clearance groove 4120. Then, the detection device 3000 and the picking device 2000 move laterally together until the picking device 2000 moves above the main body 0001, while the connector 0002 is positioned between the pressure plate mechanism 3210 and the contact mechanism 3110. When the detection device 3000 moves down, the clearance groove 4120 provides a passage for the pressure plate mechanism 3210 to pass through.

[0053] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of the present invention.

Claims

1. An integrated testing and loading device for electronic devices, used for testing and loading electronic devices, wherein the electronic devices include a body (0001) and a connector (0002), characterized in that, The integrated testing and loading equipment for electronic devices includes: Drive unit (1000); A material picking device (2000) is connected to the driving device (1000) for transmission. The driving device (1000) can drive the material picking device (2000) to move in space. The material picking device (2000) is used to pick up the main body (0001). A detection device (3000) is connected to the drive device (1000) for transmission. The drive device (1000) can drive the detection device (3000) and the material handling device (2000) to move together. The detection device (3000) is used to connect to the connector (0002). When the picking device (2000) picks up the main body (0001), the detection device (3000) can connect to the connector (0002).

2. The integrated testing and loading equipment for electronic devices according to claim 1, characterized in that, The detection device (3000) includes a power-on component (3100) and a clamping component (3200). The power-on component (3100) is provided with a contact mechanism (3110), and the clamping component (3200) is provided with a pressure plate mechanism (3210). The contact mechanism (3110) and the pressure plate mechanism (3210) are arranged opposite to each other. The clamping component (3200) can drive the pressure plate mechanism (3210) to move to change the distance between the contact mechanism (3110) and the pressure plate mechanism (3210). When the picking device (2000) picks up the main body (0001), the connector (0002) is located between the contact mechanism (3110) and the pressure plate mechanism (3210).

3. The integrated testing and loading equipment for electronic devices according to claim 2, characterized in that, The contact mechanism (3110) includes a needle seat (3111) and a spring needle (3112), the spring needle (3112) being fixed to the needle seat (3111) and the spring needle (3112) being disposed toward the pressure plate mechanism (3210).

4. The integrated testing and loading equipment for electronic devices according to claim 3, characterized in that, The power-on assembly (3100) further includes a limiting block (3120), which is fixed to the pin seat (3111) and is located on the side of the pin seat (3111) facing the pressure plate mechanism (3210). The spring pin (3112) passes through the limiting block (3120), and the pressure plate mechanism (3210) can drive the connector (0002) to move toward the limiting block (3120) and make the connector (0002) abut against the limiting block (3120). When the connector (0002) abuts against the limiting block (3120), the spring pin (3112) is connected to the connector (0002).

5. The integrated testing and loading equipment for electronic devices according to claim 3, characterized in that, The power-on assembly (3100) further includes a reset mechanism (3130), which is disposed between the needle seat (3111) and the pressure plate mechanism (3210). The reset mechanism (3130) can move to a first position along a first direction or to a second position along a direction opposite to the first direction. The direction from the pressure plate mechanism (3210) to the needle seat (3111) is defined as the first direction. In the first position, the end of the spring needle (3112) passes through the reset mechanism (3130) and is located between the reset mechanism (3130) and the pressure plate mechanism (3210). In the second position, the spring needle (3112) is retracted between the reset mechanism (3130) and the needle seat (3111).

6. The integrated testing and loading equipment for electronic devices according to claim 5, characterized in that, The reset mechanism (3130) includes a first elastic element (3131) and a movable block (3132). The movable block (3132) is disposed between the needle seat (3111) and the pressure plate mechanism (3210). One end of the first elastic element (3131) is connected to the needle seat (3111), and the other end of the first elastic element (3131) is connected to the movable block (3132). The first elastic element (3131) is configured to drive the movable block (3132) to move to the second position. The movable block (3132) is provided with a clearance hole (3133). In the first position, the end of the spring needle (3112) passes through the clearance hole (3133) and extends between the movable block (3132) and the pressure plate mechanism (3210). In the second position, the spring needle (3112) retracts between the movable block (3132) and the needle seat (3111).

7. The integrated testing and loading equipment for electronic devices according to claim 2, characterized in that, The detection device (3000) further includes a floating component (3300), which is disposed between the driving device (1000) and the power-on component (3100). The floating component (3300) can drive the power-on component (3100) to move to change the relative position between the power-on component (3100) and the material handling device (2000).

8. The integrated testing and loading equipment for electronic devices according to claim 7, characterized in that, The floating component (3300) includes a connector (3310), a base (3320), and a second elastic member (3330). The base (3320) is disposed between the drive device (1000) and the power-on component (3100), and the base (3320) is fixed to the power-on component (3100). One end of the second elastic member (3330) is connected to the drive device (1000), and the other end of the second elastic member (3330) is connected to the base (3320). The connector (3310) is movably connected between the drive device (1000) and the base (3320), so that the second elastic member (3330) is configured to be in a compressed state.

9. The integrated testing and feeding equipment for electronic devices according to claim 1, characterized in that, It also includes a material carrier (4000) having a plurality of placement positions (4001) for carrying the electronic device.

10. The integrated testing and feeding equipment for electronic devices according to claim 9, characterized in that, The material carrier (4000) includes a support plate (4100), which has multiple limiting grooves (4110) and multiple through clearance grooves (4120). Each limiting groove (4110) is connected to a clearance groove (4120) to form a placement position (4001). The electronic device can be placed in the limiting groove (4110), and the connector (0002) can face the clearance groove (4120).

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