An oscillator burn-in platform and burn-in test method

By designing an oscillator aging platform and utilizing the electrical connections of aging fixtures, aging plates, and load plates, as well as a temperature control and heat dissipation device, the problems of clamp damage and voltage instability in traditional oscillator aging tests were solved, achieving efficient and reliable aging test results.

CN122193736APending Publication Date: 2026-06-12CASIC DEFENSE TECH RES & TEST CENT
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CASIC DEFENSE TECH RES & TEST CENT
Filing Date
2025-12-10
Publication Date
2026-06-12

AI Technical Summary

Technical Problem

Traditional oscillator aging test methods suffer from problems such as damage to device pins by clips, unstable voltage and current, high labor costs, low work efficiency, and unsatisfactory test results.

Method used

An oscillator aging platform was designed, including an aging fixture, an aging plate, an aging load plate, and a control module. The device under test is fixed through the fixture port, and the aging plate is electrically connected to the device pins to provide load and electrical signals. The control module adjusts the test parameters and, together with a temperature control device and a heat dissipation device, ensures that the case temperature is within a safe range.

Benefits of technology

It effectively suppresses temperature changes, prevents device damage, improves test efficiency and accuracy, reduces labor costs, and ensures the reliability and stability of test results.

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Abstract

The present disclosure provides an oscillator burn-in platform and a burn-in test method. The oscillator burn-in platform comprises: a burn-in fixture comprising a plurality of fixture ports, the burn-in fixture being used to fix a device under test; a burn-in board electrically connected with the fixture ports, electrically connected with pins of the device under test via the fixture ports, and used to perform a burn-in test on the device under test; a burn-in load board electrically connected with the burn-in board via wires, and used to provide a load for the burn-in test; and a control module electrically connected with the burn-in board, and used to control the burn-in test; wherein the device under test and the burn-in board are in different temperature environments during the burn-in test. The temperature change can be effectively inhibited to control the device shell temperature, a high-power resistor is placed outside the equipment, and a new burn-in tool is effectively ensured to work in a safe temperature range without being limited by the device state and personnel error.
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