A polarization-based significant defect detection method

CN122243918APending Publication Date: 2026-06-19ZHEJIANG BODA OPTECH CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
ZHEJIANG BODA OPTECH CO LTD
Filing Date
2026-03-17
Publication Date
2026-06-19

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Abstract

This invention provides a polarization-based saliency defect detection method, comprising the following steps: (1) constructing a polarization image dataset based on polarization images; (2) building a polarization-based saliency defect detection network structure; and (3) inputting data for network training. This invention designs a novel network structure based on an optical model to extract the physical features of polarization images, utilizing the differences in polarization characteristics of different defects for saliency detection, thus providing a new solution for defect detection in industrial scenarios.
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