A microcircuit fault detection method, device, storage medium and program product

Abstract

This invention discloses a method, device, storage medium, and program product for detecting faults in miniature circuits. The method includes: setting up a target monitoring node and a reference monitoring node on the same circuit branch, and acquiring the corrected temperature rise for each; dividing the corrected temperature rise of the reference node into multiple working intervals based on historical sample data, and establishing a compensation calculation relationship between the expected corrected temperature rise of the target node and the corrected temperature rise of the reference node and their variation characteristics within each interval; dynamically calculating the expected value and positive deviation during the monitoring process, and performing multi-level fault discrimination by accumulating the deviation through a window. This invention solves the problem of insufficient detection accuracy under different load conditions in existing technologies through an interval-based dynamic compensation mechanism, achieving early warning and accurate alarm for miniature circuit faults such as contact degradation. Furthermore, it eliminates the need for additional current sensing devices, offering advantages such as easy installation and strong adaptability, and is suitable for fault detection in confined spaces such as distribution boxes and cable trays.

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