Stern-Gerlach magnetic analysis method

Abstract

This application relates to a Stern-Glach magnetic analysis method. The method includes: constructing a particle beam to be tested; the particle beam being atoms or molecules with bound electrons; generating a non-uniform magnetic field along the path of the particle beam, and synchronizing the arrival time of the particle beam to the non-uniform magnetic field with the generation time of the non-uniform magnetic field so that the particle beam is subjected to a pulse of the non-uniform magnetic field when passing through it; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam; obtaining the landing position of the particle beam after passing through the non-uniform magnetic field; and obtaining statistical information on the instantaneous magnetic moment of the particle beam based on the landing position. This method can detect the instantaneous magnetic moment of a particle beam.

Description

Technical Field

[0001] This application relates to the field of magnetic measurement technology, and in particular to a Stern-Glach magnetic analysis method. Background Technology

[0002] Traditional Stern-Glach magnetic analyzers employ a constant non-uniform magnetic field. The basic principle is that when an atomic beam is passed through a non-uniform magnetic field region, atoms with magnetic moments are subjected to a transverse force proportional to the projection of their magnetic moments, thus causing them to deflect on the detection screen.

[0003] However, in traditional Stern-Glach magnetic analysis apparatuses, the transit time of atoms through the magnetic field is typically on the order of microseconds to milliseconds, while the orbital period of electrons inside the atom is approximately 10^64 seconds. -15 Up to 10 -16 Seconds. During this long transit time, the electron has completed hundreds of millions of orbital periods, and the detector records the average magnetic moment. For single-electron s-orbital atoms (such as hydrogen and silver), because the electron orbital plane changes continuously, the time-averaged magnetic moment is zero, and traditional methods cannot directly observe its instantaneous magnetic moment. Summary of the Invention

[0004] Therefore, it is necessary to provide a Stern-Glach magnetic analysis method, apparatus, Stern-Glach magnetic analyzer, and readable storage medium capable of detecting instantaneous magnetic moments to address the aforementioned technical problems.

[0005] In a first aspect, this application provides a Stern-Glach magnetic analysis method. The method includes:

[0006] Construct a beam of particles to be tested; the beam of particles to be tested consists of atoms or molecules with bound electrons.

[0007] A non-uniform magnetic field is generated along the path of the particle beam to be tested, and the arrival time of the particle beam to be tested in the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the particle beam to be tested is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam to be tested.

[0008] Obtain the landing point position of the particle beam after passing through the non-uniform magnetic field;

[0009] Based on the landing point location, statistical information of the instantaneous magnetic moment of the particle beam under test is obtained.

[0010] In one embodiment, synchronizing the arrival time of the particle beam to be tested at the non-uniform magnetic field with the generation time of the non-uniform magnetic field includes:

[0011] When the particle beam to be tested reaches the detector, a trigger signal is generated by the detector and sent to the delay generator;

[0012] The arrival time of the particle beam to be tested to the non-uniform magnetic field is determined by the delay generator based on the trigger signal.

[0013] Based on the arrival time, the generation time of the non-uniform magnetic field is determined so that the arrival time is synchronized with the generation time.

[0014] In one embodiment, after obtaining statistical information on the instantaneous magnetic moment of the particle beam under test based on the landing point position, the method further includes:

[0015] By gradually increasing the pulse width of the non-uniform magnetic field, multiple adjusted non-uniform magnetic fields are obtained.

[0016] The particle beam to be tested is respectively incident into each of the adjusted non-uniform magnetic fields to obtain the deflection distribution width of the particle beam to be tested under each of the adjusted non-uniform magnetic fields.

[0017] Based on the deflection distribution widths, a width curve of the particle beam to be tested is generated; the width curve is used to reflect the change of the deflection distribution width of the particle beam to be tested with the pulse width.

[0018] The orbital period of the electrons in the particle beam under test is obtained based on the width curve.

[0019] In one embodiment, obtaining the deflection distribution width of the particle beam under each increased pulse width includes:

[0020] When the increased pulse width is less than or equal to the orbital period, the deflection distribution width is obtained as the first width;

[0021] When the increased pulse width is approximately equal to twice the orbital period, the deflection distribution width is obtained as a second width; the second width is less than the first width.

[0022] When the increased pulse width is greater than the preset duration, the structure of the deflection distribution of the particle beam under test is converted into a discrete peak structure.

[0023] In one embodiment, generating a non-uniform magnetic field along the path of the particle beam under test includes:

[0024] Deploy microstrip lines and photoconductive switches;

[0025] Based on the microstrip line and the photoconductive switch, the non-uniform magnetic field is generated in the path of the particle beam under test; wherein, the transmission line length between the photoconductive switch and the microstrip line is used to determine the pulse width of the non-uniform magnetic field.

[0026] In one embodiment, constructing the beam of particles to be tested includes:

[0027] The particle furnace is heated to a target temperature so that the particles placed in the particle furnace are converted into particle vapor;

[0028] The particle vapor is collimated to obtain the particle beam to be tested.

[0029] In one embodiment, the method further includes:

[0030] The particle beam under test is excited from the ground state to the excited state by pump light to obtain an excited-state particle beam;

[0031] Based on the delay time between the pump light and the probe light, the non-uniform magnetic field is triggered to generate, so that the excited-state particle beam is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field.

[0032] Obtain the landing point position of the excited-state particle beam after passing through the non-uniform magnetic field;

[0033] Based on the landing point position, statistical information of the instantaneous magnetic moment of the excited-state particle beam is obtained.

[0034] In one embodiment, the method further includes:

[0035] A clean material surface is prepared in an ultra-high vacuum, and the particle beam to be tested is incident on the material surface at a grazing angle to obtain a scattered particle beam.

[0036] During the interaction between the scattered particle beam and the material surface, the non-uniform magnetic field is applied to the scattered particle beam and the material surface, and the time when the scattered particle beam arrives at the material surface is synchronized with the time when the non-uniform magnetic field is generated.

[0037] Statistical information on the instantaneous magnetic moment of the scattered particle beam is obtained based on the landing position of the scattered particle beam after passing through the non-uniform magnetic field.

[0038] In one embodiment, after obtaining the statistical information of the instantaneous magnetic moment of the scattered particle beam, the method further includes:

[0039] The temperature of the material surface is adjusted to obtain multiple adjusted material surfaces;

[0040] The scattered particle beam is incident on each of the adjusted material surfaces to obtain statistical information on the instantaneous magnetic moments of the scattered particles on each of the plurality of adjusted material surfaces.

[0041] In one embodiment, the method further includes:

[0042] The density of the particle beam to be tested is reduced to a single particle;

[0043] A non-uniform magnetic field is generated along the path of the single particle, and the arrival time of the single particle to the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the single particle is subjected to the pulse effect of the non-uniform magnetic field when it passes through the non-uniform magnetic field.

[0044] Obtain the landing position of the single particle after passing through the non-uniform magnetic field.

[0045] Secondly, this application also provides a Stern-Glach magnetic analysis apparatus. The apparatus includes:

[0046] A particle beam construction module is used to construct a beam of particles to be tested; the particle beam to be tested is an atom with bound electrons or a molecule with bound electrons.

[0047] A magnetic field synchronization application module is used to generate a non-uniform magnetic field in the path of the particle beam under test, and to synchronize the arrival time of the particle beam under test to the non-uniform magnetic field with the generation time of the non-uniform magnetic field, so that the particle beam under test is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam under test.

[0048] The landing point acquisition module is used to acquire the landing point position of the particle beam after it passes through the non-uniform magnetic field.

[0049] The statistical information analysis module is used to obtain statistical information on the instantaneous magnetic moment of the particle beam under test based on the landing point position.

[0050] Thirdly, this application also provides a Stern-Glach magnetic analyzer. The Stern-Glach magnetic analyzer includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0051] Construct a beam of particles to be tested; the beam of particles to be tested consists of atoms or molecules with bound electrons.

[0052] A non-uniform magnetic field is generated along the path of the particle beam to be tested, and the arrival time of the particle beam to be tested in the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the particle beam to be tested is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam to be tested.

[0053] Obtain the landing point position of the particle beam after passing through the non-uniform magnetic field;

[0054] Based on the landing point location, statistical information of the instantaneous magnetic moment of the particle beam under test is obtained.

[0055] Fourthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, performs the following steps:

[0056] Construct a beam of particles to be tested; the beam of particles to be tested consists of atoms or molecules with bound electrons.

[0057] A non-uniform magnetic field is generated along the path of the particle beam to be tested, and the arrival time of the particle beam to be tested in the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the particle beam to be tested is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam to be tested.

[0058] Obtain the landing point position of the particle beam after passing through the non-uniform magnetic field;

[0059] Based on the landing point location, statistical information of the instantaneous magnetic moment of the particle beam under test is obtained.

[0060] The aforementioned Stern-Glach magnetic analysis method, apparatus, Stern-Glach magnetic analyzer, and computer-readable storage medium are used to construct a beam of particles to be tested. The particle beam consists of atoms or molecules with bound electrons. A non-uniform magnetic field is generated along the path of the particle beam, and the arrival time of the particle beam in the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field so that the particle beam is subjected to a pulse effect from the non-uniform magnetic field when it passes through it. The pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam. The landing position of the particle beam after passing through the non-uniform magnetic field is obtained. Based on the landing position, statistical information of the instantaneous magnetic moment of the particle beam is obtained. This method constructs a particle beam composed of atoms or molecules with bound electrons, precisely synchronizing the arrival time of the particle beam with the generation time of the non-uniform magnetic field. Simultaneously, the magnetic field pulse width is set according to the electron orbital period, ensuring the particle beam experiences precise pulse action as it passes through the non-uniform magnetic field. By measuring the landing point of the particle beam, the instantaneous magnetic moment statistics of the particle beam can be effectively obtained, achieving statistical measurement of the instantaneous magnetic moment of bound electrons. This avoids the dependence on steady-state magnetic moments in traditional methods and provides a new experimental means for studying the transient magnetism of electrons within atoms and molecules. Attached Figure Description

[0061] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0062] Figure 1 This is a schematic flowchart of the Stern-Glach magnetic analysis method in one embodiment;

[0063] Figure 2 This is a flowchart illustrating the steps of gradually increasing the pulse width of a non-uniform magnetic field in one embodiment.

[0064] Figure 3 This is a flowchart illustrating the Stern-Glach magnetic analysis method in another embodiment;

[0065] Figure 4 This is a structural block diagram of a Stern-Glach magnetic analysis device in one embodiment. Detailed Implementation

[0066] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0067] It should be noted that the terms "first," "second," etc., used in this application can be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from the second element. The terms "comprising" and "having," and any variations thereof, used in this application, are intended to cover non-exclusive inclusion. The term "multiple" used in this application refers to two or more. The term "and / or" used in this application refers to one of the embodiments, or any combination of multiple embodiments.

[0068] To more clearly illustrate the Stern-Glach magnetic analysis method provided in this disclosure, a specific embodiment is used to describe the above-mentioned Stern-Glach magnetic analysis method in detail below:

[0069] In traditional theory, the electron's magnetic moment is attributed to "intrinsic spin," a quantum property without a classical equivalent. However, this theoretical framework suffers from a fundamental dilemma: defining spin as an "intrinsic property without a classical equivalent" is essentially using mathematical construction to fill a gap in physical understanding.

[0070] This application presents a novel understanding of the formation mechanism of magnetic rectangles based on a dynamic spherical orbital model: the magnetic moment is an instantaneous manifestation of the periodic orbital motion of electrons, rather than an intrinsic property.

[0071] For a single-electron s-orbital atom, the electron undergoes periodic orbital motion on a sphere surrounding the atomic nucleus. This motion has the following key characteristics:

[0072] (1) The instantaneous magnetic moment always exists: At any instant, the orbital motion of the electron generates an instantaneous magnetic moment, the magnitude of which is always equal to that of the Bohr magneton, and the direction is along the normal to the instantaneous orbital plane. The formula for calculating the Bohr magneton is shown below:

[0073]

[0074] In the formula, μ(t) and μ B Represents the Bohr magneton; e represents the charge of the electron; h represents the reduced Planck constant; m e It represents the mass of an electron.

[0075] (2) Topological constraints result in zero time average: Due to the topological constraints of the spherical orbit, the electron needs to complete two revolutions (4π angles) to return to the same phase. Let the orbital period be T. orbit (The time it takes for an electron to complete one revolution), then a complete quantum period is: T quantum =2T orbit .

[0076] In the first and second cycles, the electron magnetic moments are in opposite directions, therefore the time-averaged magnetic moment over a complete cycle is zero.

[0077]

[0078] (3) Random distribution of instantaneous magnetic moment direction: In the absence of an external field, the orientation of the orbital plane is random, therefore the instantaneous magnetic moment projection μ z In [-μ B , +μ B The orbital plane has a continuous distribution within the interval. It does not have a stable quantized orientation.

[0079] (4) The orbital period is the intrinsic time scale of the system: T orbit Determined by the system's kinetic parameters, for example, approximately 1.52 × 10⁻⁶ for the ground state of a hydrogen atom. -16 s.

[0080] Furthermore, the traditional Stern-Glach experiment uses a constant magnetic field, where the transit time of a particle through the magnetic field is much longer than the orbital period. The detector records the time-averaged magnetic moment, which is zero for a single-electron s-orbit particle. However, the interaction between the magnetic moment and the magnetic field occurs at the instantaneous level. The force experienced by the instantaneous magnetic moment μ(t) in a non-uniform magnetic field is: The magnitude and direction of this force vary with the projection μ of the instantaneous magnetic moment. z (t) change.

[0081] The core of this application lies in compressing the pulse width of a non-uniform magnetic field to a level comparable to the electron orbital period, thereby "freezing" its instantaneous state within a time window during which the magnetic moment direction does not undergo a significant reversal. Therefore, the pulse width τ of the non-uniform magnetic field... p Must meet: .

[0082] Under these conditions, an electron can undergo at most one magnetic moment reversal during the magnetic field. The transverse velocity acquired by the particle is proportional to the integral of the instantaneous magnetic moment over the pulse time:

[0083]

[0084] Due to the initial μ z (t0) in [-μ B , +μ B The particles are continuously and randomly distributed within the interval, and the lateral velocity they acquire is also continuously distributed, eventually forming a continuous deflection distribution on the detector.

[0085] Because the instantaneous magnetic moment direction has a period of 2T orbit oscillation:

[0086]

[0087]

[0088] The net deflection of the particle is proportional to μ z (t) is the integral over the pulse time. For a particle beam with a random initial phase, the width of the deflection distribution varies with τ. p The following evolutionary patterns are observed:

[0089] When τ p ≤T orbit At this time, the integration interval covers at most one reversal, and the particle integral values ​​with different initial phases cover from -μ B τ p to +μ B τ p The entire range, therefore the deflection distribution exhibits a relatively wide continuous distribution.

[0090] When τ p ≈2T orbit When the integral interval covers a complete positive and negative cycle, for particles with random initial phases, the integral values ​​are narrowly distributed around zero, thus narrowing the deflection distribution width.

[0091] When τ p Given enough time, the system enters the traditional Stern-Glach mode, the orbital plane gradually precesses and eventually locks into two stable orientations, and the deflection distribution exhibits a discrete peak structure.

[0092] In one embodiment, such as Figure 1 As shown, a Stern-Glach magnetic analysis method is provided. This embodiment illustrates the application of this method to a Stern-Glach magnetic analyzer. In this embodiment, the method includes the following steps:

[0093] Step S101: Construct the particle beam to be tested; the particle beam to be tested consists of atoms or molecules with bound electrons.

[0094] Specifically, atomic or molecular beams with bound electrons are prepared as the particle beams to be tested.

[0095] The particle beam to be tested is preferably composed of atoms with a single-electron s orbital, including but not limited to hydrogen atoms, silver atoms, gold atoms, alkali metal atoms, etc.

[0096] Step S102: A non-uniform magnetic field is generated along the path of the particle beam to be tested, and the arrival time of the particle beam to be tested to the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the particle beam to be tested is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam to be tested.

[0097] The generation time refers to the starting time at which a non-uniform magnetic field is applied to the particle beam under test.

[0098] Specifically, the Stern-Glach magnetic analyzer applies a non-uniform magnetic field along the path of the particle beam to be tested. However, the generation time of the non-uniform magnetic field is not arbitrarily set, but is meticulously calculated based on the flight time of the particle beam and the arrival time of the particle beam to the non-uniform magnetic field. For example, the arrival time of the particle beam to the non-uniform magnetic field can be calculated based on the flight time of the particle beam, and then the non-uniform magnetic field can be controlled to delay the arrival time before it starts to be generated, so as to precisely synchronize the arrival time of the particle beam to the non-uniform magnetic field with the generation time of the non-uniform magnetic field, so that when the particle beam passes through the non-uniform magnetic field, it is deflected under the pulse action of the non-uniform magnetic field.

[0099] It should be noted that setting the pulse width of the non-uniform magnetic field is key to advancing magnetic measurements from the dimension of "average magnetic moment" to "instantaneous magnetic moment". By compressing the magnetic field's application time to the order of an electron orbital period, it is possible to "freeze" the instantaneous state of the magnetic moment before a significant change occurs in its direction, thus enabling direct observation of the instantaneous magnetic moment of a single-electron atom.

[0100] The pulse width refers to the duration of the pulse, which is the length of time from the start to the end of the non-uniform magnetic field.

[0101] A non-uniform magnetic field has a non-uniform gradient in space and is used to exert a transverse force on particles passing through it. The pulse width τ of the non-uniform magnetic field... p The following conditions must be met: .

[0102] Among them, T orbit Let τ be the orbital period of the electrons in the particle beam being measured. p When the magnetic moment direction is reversed at most once during the period of non-uniform magnetic field, the electron can "freeze" its initial instantaneous state within the time window during which the magnetic moment direction does not change significantly, thus realizing the direct detection of the instantaneous magnetic moment.

[0103] Step S103: Obtain the landing point of the particle beam after passing through the non-uniform magnetic field.

[0104] Specifically, when the particle beam to be measured passes through a non-uniform magnetic field, under the pulsed action of the non-uniform magnetic field, particles with bound electrons (such as atoms or molecules) will be deflected by a transverse force proportional to the projection of the magnetic moment. The amount of deflection is proportional to the projection μ of the instantaneous magnetic moment of the particle in the direction of the magnetic field gradient at the moment of magnetic field action. z The final landing positions of each particle in the particle beam under test are recorded by a position-sensitive detector to obtain the deflection distribution of the particle beam. The deflection distribution refers to the statistical distribution of the landing positions of the particles as they fall on the position-sensitive detector.

[0105] The landing point can be a two-dimensional coordinate position.

[0106] The position-sensitive detector can be composed of two microchannel plates (MCPs) and a delay line anode, with an effective detection area of ​​Φ40mm, a spatial resolution better than 50μm, and a vacuum degree better than 10. -6 Pa.

[0107] Step S104: Based on the landing point position, obtain the statistical information of the instantaneous magnetic moment of the particle beam to be tested.

[0108] Specifically, based on the deflection distribution, statistical information of the instantaneous magnetic moment of the particle beam under test is analyzed. This statistical information includes the deflection distribution range, deflection distribution width, and deflection distribution shape. For example, 10... 6 -10 7 The landing positions of each particle are used to generate a deflection distribution histogram.

[0109] For example, for a single-electron s-orbital atom, due to the random distribution of instantaneous magnetic moment directions, a continuously distributed deflection is expected, covering the area from -μ. B to +μ B The corresponding entire deflection range.

[0110] In the aforementioned Stern-Glach magnetic analysis method, a beam of particles to be tested, consisting of atoms or molecules with bound electrons, is constructed. The arrival time of the particle beam is precisely synchronized with the generation time of the non-uniform magnetic field. Simultaneously, the pulse width of the magnetic field is set according to the electron orbital period, so that the particle beam is subjected to precise pulse action when passing through the non-uniform magnetic field. Furthermore, by measuring the landing position of the particle beam, the instantaneous magnetic moment statistics of the particle beam to be tested can be effectively obtained, realizing the statistical measurement of the instantaneous magnetic moment of bound electrons. This avoids the dependence of traditional methods on steady-state magnetic moments and provides a new experimental means for studying the transient magnetism of electrons inside atoms and molecules.

[0111] In one embodiment, step S102 above, synchronizing the arrival time of the particle beam to be tested to the non-uniform magnetic field with the generation time of the non-uniform magnetic field, includes the following: when the particle beam to be tested arrives at the detector, a trigger signal is generated by the detector and sent to the delay generator; the arrival time of the particle beam to be tested to the non-uniform magnetic field is determined by the delay generator based on the trigger signal; and the generation time of the non-uniform magnetic field is determined according to the arrival time, so that the arrival time and the generation time are synchronized.

[0112] Specifically, the collimated and stable beam of the particle to be tested will enter the vacuum chamber and fly. When the beam of the particle to be tested reaches the detector, the detector generates a trigger signal and sends the trigger signal to the delay generator.

[0113] The delay generator sets the delay start of the pulse current source based on the arrival time of the particle beam under test (delay accuracy is 10). -15 The non-uniform magnetic field is generated synchronously when the particle beam to be measured arrives. When the current time matches the generation time, a pulsed current source is activated to generate a non-uniform magnetic field that acts on the particle beam to be measured passing through the non-uniform magnetic field.

[0114] In this embodiment, the arrival time of the particle beam under test is calculated to control the delayed start of the pulse current source of the delay generator, thereby synchronizing the generation time of the non-uniform magnetic field with the arrival time of the particle beam under test, laying the foundation for subsequent analysis of the statistical information of the instantaneous magnetic moment.

[0115] In one embodiment, such as Figure 2 As shown, in step S104 above, after obtaining the statistical information of the instantaneous magnetic moment of the particle beam to be measured based on the landing point position, the following content is also included:

[0116] In step S201, the pulse width of the non-uniform magnetic field is gradually increased to obtain multiple adjusted non-uniform magnetic fields.

[0117] Step S202: The particle beam to be tested is incident on each of the adjusted non-uniform magnetic fields to obtain the deflection distribution width of the particle beam under each adjusted non-uniform magnetic field.

[0118] Step S203: Generate the width curve of the particle beam to be tested based on the width of each deflection distribution; the width curve is used to reflect the change of the deflection distribution width of the particle beam to be tested with the pulse width.

[0119] Step S204: Based on the width curve, obtain the orbital period of the electrons in the particle beam to be tested.

[0120] Specifically, the pulse width τ of the non-uniform magnetic field can be gradually increased in steps of 0.01 fs. p Then, repeat steps S102 to S104, recording the deflection distribution width of the particle beam under each adjusted non-uniform magnetic field. Based on the deflection distribution width of the particle beam under the non-uniform magnetic field and the deflection distribution width under each adjusted non-uniform magnetic field, a pulse width curve is plotted. The width curve reflects the evolution of the deflection distribution width with the pulse width. The orbital period T of the electrons in the particle beam can also be accurately determined using the width curve. orbit .

[0121] In this embodiment, by changing the pulse width, the evolution of the deflection distribution width of the particle beam under test with the pulse width can be observed. This evolution law directly reflects the topological structure of "recovery after two rotations" and can also measure the fundamental physical quantity of the electron's orbital period.

[0122] In one embodiment, step S203 above, obtaining the deflection distribution width of the particle beam under each increased pulse width, includes the following: when the increased pulse width is less than or equal to the orbital period, the deflection distribution width is obtained as a first width; when the increased pulse width is approximately equal to twice the orbital period, the deflection distribution width is obtained as a second width; the second width is less than the first width; when the increased pulse width is greater than a preset duration, the structure of the deflection distribution of the particle beam under test is converted into a discrete peak structure.

[0123] Specifically, since the instantaneous magnetic moment direction has a period of 2T orbit The oscillation and deflection distribution width will exhibit the following characteristics:

[0124] (1) When τ p ≪T orbit At that time, the deflection distribution of the particle beam under test is a continuous distribution, covering the entire range from negative maximum deflection to positive maximum deflection;

[0125] (2) When τ p Gradually increase to near T orbit At that time, the deflection distribution width of the particle beam under test was still relatively large;

[0126] (3) When τ p ≤T orbit At that time, the deflection distribution exhibits a relatively wide continuous distribution;

[0127] (4) When τ p ≈2T orbit At this time, the deflection distribution width is the smallest, and the beam of particles to be measured is concentrated near the center;

[0128] (5) When τ p When it is large enough (entering the quasi-constant magnetic field mode), such as τ p If the duration exceeds the preset time, the deflection distribution of the particle beam under test gradually transitions into two discrete peaks.

[0129] In this embodiment, by changing the pulse width, the evolution of the deflection distribution width of the particle beam under test with the pulse width can be observed. This evolution law directly reflects the topological structure of "recovery after two rotations".

[0130] In one embodiment, step S102 above, generating a non-uniform magnetic field in the path of the particle beam under test, includes the following: deploying a microstrip line and a photoconductive switch; generating a non-uniform magnetic field in the path of the particle beam under test based on the microstrip line and the photoconductive switch; wherein, the transmission line length between the photoconductive switch and the microstrip line is used to determine the pulse width of the non-uniform magnetic field.

[0131] Specifically, a microstrip line structure is employed, with a characteristic impedance of 50Ω, a microstrip line width of 100 μm, and a length of 3.5 cm. A pulsed current source is deployed: based on a photoconductive switch (low-temperature gallium arsenide LT-GaAs), triggered by a femtosecond laser, capable of generating current pulses with a rise time <1 ps and a peak current of 10-50 A. A non-uniform magnetic field is generated along the path of the particle beam under test. The initial pulse width τ of the non-uniform magnetic field... p =0.1fs (less than the estimated period of the silver atom orbital).

[0132] The magnetic field gradient of the non-uniform magnetic field is as follows: .

[0133] The pulse width of the non-uniform magnetic field is adjustable from 0.1fs to 10ps with an adjustment accuracy of 0.01fs, which can be achieved by changing the transmission line length between the photoconductive switch and the microstrip line.

[0134] In this embodiment, a non-uniform magnetic field with variable pulse width was constructed, laying the foundation for subsequent analysis of instantaneous magnetic moment and study of the relationship between pulse width and deflection distribution.

[0135] In one embodiment, step S101, constructing the particle beam to be tested, includes the following: heating the particle furnace to a target temperature so that the particles placed in the particle furnace are converted into particle vapor; and collimating the particle vapor to obtain the particle beam to be tested.

[0136] In this embodiment, a silver atom beam is used as an example. Specifically, a high-temperature heated silver atom furnace is used, heated to 1000°C. Silver atom vapor passes through a collimation slit to form a stable silver atom beam. The silver atom beam then enters a vacuum chamber and travels at a speed of approximately 540 m / s. After two stages of collimation, the divergence angle of the silver atom beam is less than 0.1 mrad. A pulsed valve can be optionally installed to control the pulse width of the atom beam, or a laser ablation method can be used to generate the pulsed atom beam.

[0137] In one embodiment, the aforementioned Stern-Glach magnetic analysis method can also be used to measure the phase evolution of excited-state orbits, directly verifying the "two-turn recovery" topological structure. This embodiment includes the following: The particle beam to be tested is excited from the ground state to the excited state using a pump light, resulting in an excited-state particle beam; a non-uniform magnetic field is generated based on the delay time between the pump light and the probe light, so that the excited-state particle beam is subjected to a pulse effect from the non-uniform magnetic field when passing through it; the landing position of the excited-state particle beam after passing through the non-uniform magnetic field is obtained; and statistical information on the instantaneous magnetic moment of the excited-state particle beam is obtained based on the landing position.

[0138] It should be noted that, according to the dynamic spherical orbital model, a single-electron s orbital (whether in the ground state or excited state) exhibits spherical orbital characteristics. The electron undergoes periodic motion on the spherical surface, requiring two revolutions to return to the same phase. For alkali metal atoms (such as sodium and potassium), their ground state is ns1, and their excited states are (n+1)s1, (n+2)s1, etc., all of which conform to the requirements of the spherical orbital model.

[0139] In this embodiment, the particle beam under test is excited from the ground state to a higher s-orbit excited state by pump light, which can mark a clear starting moment. Subsequently, probe magnetic field pulses are applied with different delay times, and the instantaneous magnetic moment direction of the excited-state particle beam before de-excitation is measured, thereby directly observing the temporal evolution of the orbital phase.

[0140] Specifically, taking a sodium atom as an example: the ground state, 3s1, conforms to the spherical orbital model; the first excited state, 3p1, does not fully conform to the spherical orbital model (p orbitals have directionality); the second excited state, 4s1, conforms to the spherical orbital model and has a sufficiently long lifetime (on the order of nanoseconds). Therefore, this embodiment selects to excite to the 4s state (or a higher ns state, n≥4) to ensure that the object being measured is still an s orbital, strictly conforming to the topological predictions of the spherical orbital model.

[0141] The following modules can be added to the instrument based on steps S101 to S104 above:

[0142] (1) Tunable femtosecond laser system: Ti:sapphire femtosecond laser with optical parametric amplifier (OPA) can be tuned to the wavelength required for the 3s→4s two-photon resonance transition of sodium atoms (about 616nm); the pulse width is about 100fs and the repetition frequency is 1kHz; the beam is split into pump light and probe light, and the delay time is adjusted by optical delay line with an accuracy better than 0.1fs.

[0143] (2) Atomic beam source: generates sodium atomic beams with moderate density.

[0144] (3) Excitation region: The pump light is focused on the atomic beam, and some sodium atoms are excited from the 3s ground state to the 4s state through two-photon absorption.

[0145] (4) Detection and differentiation: Excited state and ground state atoms are differentiated by time-of-flight mass spectrometry or resonance fluorescence technology, and only the deflection information of excited state atoms is recorded.

[0146] The operation steps are as follows:

[0147] 1. A sodium atom beam is generated, perpendicularly intersecting the femtosecond laser beam;

[0148] 2. The pump light (two-photon resonance wavelength) excites some sodium atoms to the 4s state;

[0149] 3. Set the delay time Δt between the pump light and the probe light using an optical delay line;

[0150] 4. Detecting the magnetic field of the light-triggered pulse (τ) p ≈0.1×T orbit ), which acts on the excited-state sodium atom beam (i.e., the excited-state particle beam);

[0151] 5. The detector records the deflection distribution of the excited-state sodium atom beam, distinguishes between the excited-state sodium atoms and the ground-state nano atoms (the particle beam to be measured in step S101 above is the ground state), extracts the average deflection direction of the excited-state nano atoms, and forms statistical information on the instantaneous magnetic moment of the excited-state particle beam.

[0152] 6. Furthermore, the delay time Δt can be adjusted, for example, from 0 to several times the orbital period (e.g., 0-1000fs), with a step size better than 0.1fs;

[0153] 7. Analyze the change in the deflection direction of the excited-state particle beam with the delay time Δt, and fit the orbital period T. orbit and the laws governing phase evolution.

[0154] In practical applications, the orbital period T orbit The phase evolution laws include:

[0155] (1) The direction of deflection of excited-state atoms oscillates periodically with Δt, with a period of 2T. orbit ;

[0156] (2) At Δt=0 and Δt=2T orbit When the deflection directions are the same, it indicates that the orbital state has been restored;

[0157] (3) At Δt=T orbit When the deflection direction is reversed, it proves that "the phase sign reverses after one revolution";

[0158] (4) By fitting the period, the orbital period T of the 4s state of sodium atom can be directly determined. orbit .

[0159] In this embodiment, the s-orbital excited state is selected, which strictly conforms to the spherical orbital model and provides a clear physical picture; the lifetime of the excited state is long enough (on the order of nanoseconds) to facilitate time-delay scanning; it can also directly verify the topological structure and complement the experimental results of the ground-state particle beam.

[0160] In one embodiment, the aforementioned Stern-Glach magnetic analysis method can also be used to analyze the magnetic properties of a material surface. By measuring the instantaneous magnetic moment distribution of a particle beam scattered from the surface of a material (solid), the magnetic information of the particles on the material surface can be obtained. This embodiment includes the following: preparing a clean material surface in ultra-high vacuum; incident the particle beam to be tested onto the material surface at a grazing angle to obtain a scattered particle beam; during the interaction between the scattered particle beam and the material surface, applying a non-uniform magnetic field to the scattered particle beam and the material surface, and synchronizing the time when the scattered particle beam reaches the material surface with the time when the non-uniform magnetic field is generated; obtaining statistical information on the instantaneous magnetic moment of the scattered particle beam based on the landing position of the scattered particle beam after passing through the non-uniform magnetic field.

[0161] It should be noted that the magnetic properties of a material surface (such as surface magnetic anisotropy, surface magnetic moment, and surface Curie temperature) often differ significantly from those of the bulk phase, which is crucial for fields such as nanomagnetic devices, spintronics, and catalysis. Existing surface magnetic measurement techniques have limited spatial resolution and measure time-averaged magnetic moments, failing to acquire instantaneous information.

[0162] When a particle beam is scattered from a material surface at a grazing angle, there is a brief interaction time (τ) between the scattered particle beam and the material surface. int ~10 -14 Up to 10 -13 During this time, the instantaneous magnetic moments of the scattered particle beam particles are deflected by the local magnetic field on the material surface. By measuring the instantaneous magnetic moment distribution of the scattered particle beam, the local magnetic information of the material surface can be inferred.

[0163] Specifically, the following modules can be added to the instrument based on the instruments in steps S101 to S104 above:

[0164] (1) Ultra-high vacuum sample chamber: ultimate vacuum better than 10 -10 mbar, with a built-in heated / cooled sample holder (20-1000K), allows for three-dimensional translation and rotation of samples.

[0165] (2) Surface preparation and characterization system: including sputtering gun (surface cleaning), low energy electron diffractometer (LEED, surface structure analysis), Auger electron spectrometer (AES, surface composition analysis).

[0166] (3) Grazing atomic beam path: The atomic beam is incident on the sample surface at a grazing angle of 1°-10° and enters the detection module after scattering.

[0167] The operation steps are as follows:

[0168] 1. The material can be a single-crystal material. Clean single-crystal surfaces (such as Fe(001), Co(0001), Ni(001)) are prepared in ultra-high vacuum, and the surface structure and composition are confirmed by LEED and AES.

[0169] 2. A beam of silver atoms is generated as the particle beam to be tested and incident on the single crystal surface (i.e., the material surface) at a grazing angle to form a scattered particle beam;

[0170] 3. Applying a non-uniform magnetic field during the interaction between the scattered particle beam and the material surface ( This ensures that a non-uniform magnetic field is generated simultaneously when the scattered particle beam reaches the material surface;

[0171] 4. Record the deflection distribution of the scattered particle beam using a position-sensitive detector and compare it with the deflection distribution of the unscattered particle beam to be tested;

[0172] 5. By changing the temperature of the material (from low temperature to above the Curie temperature), measure the evolution of the deflection distribution of the instantaneous magnetic moment of the scattered particle beam as the temperature of the material changes.

[0173] 6. By changing the crystal planes or the surface coating of the material, measure the deflection distribution of the instantaneous magnetic moment on different surfaces.

[0174] In practical applications, the evolution of the deflection distribution of the instantaneous magnetic moment of the scattered particle beam with temperature variation and the instantaneous magnetic moment response information of different surfaces are shown below:

[0175] (1) The deflection distribution width of the instantaneous magnetic moment of the scattered particle beam varies with the surface magnetization.

[0176] (2) Near the Curie temperature, the deflection distribution width of the instantaneous magnetic moment of the scattered particle beam changes abruptly, reflecting the disappearance of magnetic order on the material surface;

[0177] (3) The deflection distribution of instantaneous magnetic moments on different crystal planes is different, reflecting the magnetic anisotropy of the material surface.

[0178] In this embodiment, the study of material surface magnetism is realized based on instantaneous magnetic moments; since atomic scattering is sensitive to single atomic layers, true surface selectivity can be achieved; it can also be used to verify the surface magnetic predictions of spherical orbital models.

[0179] In one embodiment, after obtaining the statistical information of the instantaneous magnetic moment of the scattered particle beam, the method further includes: adjusting the temperature of the material surface to obtain multiple adjusted material surfaces; and incident the scattered particle beam onto each adjusted material surface to obtain the statistical information of the instantaneous magnetic moment of the scattered particles under each of the multiple adjusted material surfaces.

[0180] The above embodiments have illustrated the evolution of the deflection distribution of the instantaneous magnetic moment of the scattered particle beam as a function of the material's temperature, and will not be repeated here.

[0181] In one embodiment, the Stern-Glach magnetic analysis method described above can also be used to measure the instantaneous magnetic moment of a single atom or a single molecule. This embodiment includes the following steps: reducing the density of the particle beam to a single particle; generating a non-uniform magnetic field along the path of the single particle, and synchronizing the arrival time of the single particle to the non-uniform magnetic field with the generation time of the non-uniform magnetic field, so that the single particle experiences a pulse effect from the non-uniform magnetic field when passing through it; and obtaining the landing position of the single particle after passing through the non-uniform magnetic field.

[0182] It should be noted that the measurement of single-particle magnetic moments is fundamental to realizing single-particle storage and quantum computing. Current technologies measure time-averaged signals and rely on complex probe structures.

[0183] This embodiment reduces the particle beam density to the single-particle level, with only one atom passing through the magnetic field region at a time. Through precise synchronization and single-particle detection, the instantaneous magnetic moment projection of each particle is recorded, and the cumulative statistical distribution is calculated.

[0184] Specifically, the instruments used in steps S101 to S104 can be improved. For example, a single-particle beam source can be set: a single-particle source can be prepared using laser cooling and trapping technology, or an ultra-low density particle beam can be used. Alternatively, a single-particle detector can be set: a microchannel plate with a delay line anode can be used to simultaneously record the arrival time and position of each particle. The implementation process is the same as steps S101 to S104, except that the particle beam to be measured is replaced with a single particle. Ultimately, statistical information such as the magnitude and direction distribution of the instantaneous magnetic moment of the single particle, the influence of inter-particle interactions on the instantaneous magnetic moment (when two particles pass through simultaneously), and a comparison of the magnetic moments of single particles of different elements can be obtained.

[0185] In this embodiment, by converting the study of the instantaneous magnetic moment of the particle beam into the study of the instantaneous magnetic moment of a single particle, the characterization of the magnetic moment of a single particle can be analyzed, as well as the statistical information of the instantaneous magnetic moment of a single particle can be analyzed.

[0186] In one embodiment, the Stern-Glach magnetic analysis method described above can also be used for educational demonstrations, including the following:

[0187] Specifically, by using iodine vapor I2 or alkali metal dimer K2, the valence electron orbital period can be adjusted to the picosecond-nanosecond level through vibrational energy levels, matching conventional pulse electronics.

[0188] Molecular beam source setup: I2 or K2 molecular beams are generated via a thermal evaporation furnace. Pulsed magnetic field setup: Helmholtz coil with pulsed power supply, pulse width adjustable from 1-100 ns. Detector setup: Fluorescent screen or thermal detector array, CCD camera recording. Vacuum system setup: Glass vacuum chamber, maintained by a mechanical pump. Synchronization control: Simple pulse generator.

[0189] The teaching demonstration included the following content:

[0190] (1) Constant magnetic field mode: shows a single peak (time-averaged magnetic moment is zero);

[0191] (2) Pulsed magnetic field mode (τ) p Small: Displays a continuous distribution (instantaneous magnetic moment exists);

[0192] (3) Change the pulse width: observe the evolution of the distribution width from wide to narrow to bimodal;

[0193] (4) Orbital period measurement: from the minimum width corresponding to τ p Estimate orbital period;

[0194] (5) Comparison with theory: Verification of 2T orbit Oscillation pattern.

[0195] In this embodiment, the concept of instantaneous magnetic moment can be intuitively demonstrated through teaching demonstrations, showing the transition from instantaneous measurement to time averaging, cultivating students' understanding of the essence of quantum measurement, and realizing cutting-edge physics experimental teaching at low cost.

[0196] In one embodiment, such as Figure 3 As shown, another Stern-Glach magnetic analysis method is provided. The method is illustrated using an Stern-Glach magnetic analyzer as an example, and includes the following steps:

[0197] Step S301: Construct the particle beam to be tested; the particle beam to be tested consists of atoms or molecules with bound electrons.

[0198] Step S302: A non-uniform magnetic field is generated along the path of the particle beam to be tested, and the arrival time of the particle beam to be tested to the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the particle beam to be tested is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam to be tested.

[0199] Step S303: Obtain the landing position of the particle beam after passing through the non-uniform magnetic field.

[0200] Step S304: Based on the landing point position, obtain the statistical information of the instantaneous magnetic moment of the particle beam to be tested.

[0201] Step S305: Gradually increase the pulse width of the non-uniform magnetic field to obtain multiple adjusted non-uniform magnetic fields.

[0202] Step S306: The particle beam to be tested is incident on each of the adjusted non-uniform magnetic fields to obtain the deflection distribution width of the particle beam under each adjusted non-uniform magnetic field.

[0203] Step S307: Generate the width curve of the particle beam to be tested based on the width of each deflection distribution; the width curve is used to reflect the change of the deflection distribution width of the particle beam to be tested with the pulse width.

[0204] Step S308: Based on the width curve, obtain the orbital period of the electrons in the particle beam to be tested.

[0205] The aforementioned Stern-Glach magnetic analysis method can achieve the following beneficial effects: by constructing a beam of particles to be tested composed of atoms or molecules with bound electrons, and precisely synchronizing the arrival time of the particle beam with the generation time of the non-uniform magnetic field, and setting the magnetic field pulse width according to the electron orbit period, the particle beam is subjected to precise pulse action when passing through the non-uniform magnetic field; furthermore, by measuring the landing position of the particle beam, the instantaneous magnetic moment statistics of the particle beam to be tested can be effectively obtained, realizing the statistical measurement of the instantaneous magnetic moment of bound electrons, avoiding the dependence of traditional methods on steady-state magnetic moments, and providing a new experimental means for studying the transient magnetism of electrons inside atoms and molecules.

[0206] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages in other steps. It is understood that the steps in different embodiments can be freely combined as needed, and all non-contradictory solutions formed by such combinations are within the scope of protection of this application.

[0207] Based on the same inventive concept, this application also provides a Stern-Glach magnetic analysis apparatus for implementing the Stern-Glach magnetic analysis method described above. The solution provided by this apparatus is similar to the implementation described in the above method; therefore, the specific limitations of one or more Stern-Glach magnetic analysis apparatus embodiments provided below can be found in the limitations of the Stern-Glach magnetic analysis method described above, and will not be repeated here.

[0208] In one embodiment, such as Figure 4 As shown, a Stern-Glach magnetic analysis apparatus 400 is provided, comprising:

[0209] Particle beam construction module 401 is used to construct a particle beam to be tested; the particle beam to be tested is an atom with bound electrons or a molecule with bound electrons.

[0210] The magnetic field synchronization application module 402 is used to generate a non-uniform magnetic field in the path of the particle beam to be tested, and to synchronize the arrival time of the particle beam to be tested to the non-uniform magnetic field with the generation time of the non-uniform magnetic field, so that the particle beam to be tested is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam to be tested.

[0211] The landing point acquisition module 403 is used to acquire the landing point position of the particle beam after it passes through a non-uniform magnetic field.

[0212] The statistical information analysis module 404 is used to obtain statistical information on the instantaneous magnetic moment of the particle beam under test based on the landing point position.

[0213] In one embodiment, the magnetic field synchronization application module 402 is further configured to generate a trigger signal through the detector when the particle beam to be tested arrives at the detector, and send the trigger signal to the delay generator; determine the arrival time of the particle beam to be tested to the non-uniform magnetic field based on the trigger signal through the delay generator; and determine the generation time of the non-uniform magnetic field according to the arrival time so that the arrival time is synchronized with the generation time.

[0214] In one embodiment, the Stern-Glach magnetic analysis device 400 further includes a width variation analysis module for gradually increasing the pulse width of the non-uniform magnetic field to obtain multiple adjusted non-uniform magnetic fields; incident the particle beam to be tested into each adjusted non-uniform magnetic field to obtain the deflection distribution width of the particle beam under each adjusted non-uniform magnetic field; generate a width curve of the particle beam to be tested based on each deflection distribution width; the width curve is used to reflect the change of the deflection distribution width of the particle beam to be tested with the pulse width; and obtain the orbital period of the electrons in the particle beam to be tested based on the width curve.

[0215] In one embodiment, the Stern-Glach magnetic analysis device 400 further includes a distribution width evolution module, which is used to obtain a first width when the increased pulse width is less than or equal to the orbital period; to obtain a second width when the increased pulse width is approximately equal to twice the orbital period; the second width is less than the first width; and when the increased pulse width is greater than a preset duration, the structure of the deflection distribution of the particle beam to be measured is converted into a discrete peak structure.

[0216] In one embodiment, the magnetic field synchronous application module 402 is also used to deploy a microstrip line and a photoconductive switch; based on the microstrip line and the photoconductive switch, a non-uniform magnetic field is generated in the path of the particle beam to be measured; wherein, the transmission line length between the photoconductive switch and the microstrip line is used to determine the pulse width of the non-uniform magnetic field.

[0217] In one embodiment, the particle beam construction module 401 is further configured to heat the particle furnace to a target temperature so that the particles placed in the particle furnace are converted into particle vapor; and to collimate the particle vapor to obtain the particle beam to be tested.

[0218] In one embodiment, the Stern-Glach magnetic analysis device 400 further includes a topology verification module for exciting a particle beam from its ground state to an excited state using a pump light to obtain an excited-state particle beam; triggering the generation of a non-uniform magnetic field based on the delay time between the pump light and the probe light, so that the excited-state particle beam is subjected to a pulse of the non-uniform magnetic field when it passes through the non-uniform magnetic field; obtaining the landing position of the excited-state particle beam after passing through the non-uniform magnetic field; and obtaining statistical information on the instantaneous magnetic moment of the excited-state particle beam based on the landing position.

[0219] In one embodiment, the Stern-Glach magnetic analysis device 400 further includes a surface magnetic analysis module for preparing a clean material surface in ultra-high vacuum, incident a particle beam to be tested onto the material surface at a grazing angle to obtain a scattered particle beam; during the interaction between the scattered particle beam and the material surface, a non-uniform magnetic field is applied to the scattered particle beam and the material surface, and the time when the scattered particle beam reaches the material surface is synchronized with the time when the non-uniform magnetic field is generated; based on the landing position of the scattered particle beam after passing through the non-uniform magnetic field, statistical information of the instantaneous magnetic moment of the scattered particle beam is obtained.

[0220] In one embodiment, the Stern-Glach magnetic analysis device 400 further includes a material temperature evolution module for adjusting the temperature of the material surface to obtain multiple adjusted material surfaces; and for incidenting a scattered particle beam onto each adjusted material surface to obtain statistical information on the instantaneous magnetic moments of the scattered particles under each of the multiple adjusted material surfaces.

[0221] In one embodiment, the Stern-Glach magnetic analysis device 400 further includes a single-particle analysis module for reducing the density of the particle beam to a single particle; generating a non-uniform magnetic field along the path of the single particle; synchronizing the arrival time of the single particle to the non-uniform magnetic field with the generation time of the non-uniform magnetic field so that the single particle is subjected to the pulse action of the non-uniform magnetic field when passing through it; and obtaining the landing position of the single particle after passing through the non-uniform magnetic field.

[0222] The modules in the aforementioned Stern-Glach magnetic analysis apparatus can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in hardware or independent of the processor within the Stern-Glach magnetic analyzer, or stored in software within the Stern-Glach magnetic analyzer's memory, allowing the processor to invoke and execute the corresponding operations of each module.

[0223] In one embodiment, a Stern-Glach magnetic analyzer is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above method embodiments.

[0224] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above method embodiments.

[0225] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0226] It should be noted that the information (including but not limited to device information, personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0227] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0228] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0229] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A Stern-Glach magnetic analysis method, characterized in that, The method includes: Construct a beam of particles to be tested; the beam of particles to be tested consists of atoms or molecules with bound electrons. A non-uniform magnetic field is generated along the path of the particle beam to be tested, and the arrival time of the particle beam to be tested in the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the particle beam to be tested is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field; the pulse width of the non-uniform magnetic field is set based on the orbital period of the electrons in the particle beam to be tested. Obtain the landing point position of the particle beam after passing through the non-uniform magnetic field; Based on the landing point location, statistical information of the instantaneous magnetic moment of the particle beam under test is obtained.

2. The method according to claim 1, characterized in that, The synchronization of the arrival time of the particle beam to be tested to the non-uniform magnetic field with the generation time of the non-uniform magnetic field includes: When the particle beam to be tested reaches the detector, a trigger signal is generated by the detector and sent to the delay generator; The arrival time of the particle beam to be tested to the non-uniform magnetic field is determined by the delay generator based on the trigger signal. Based on the arrival time, the generation time of the non-uniform magnetic field is determined so that the arrival time is synchronized with the generation time.

3. The method according to claim 1, characterized in that, After obtaining the statistical information of the instantaneous magnetic moment of the particle beam under test based on the landing point position, the method further includes: By gradually increasing the pulse width of the non-uniform magnetic field, multiple adjusted non-uniform magnetic fields are obtained. The particle beam to be tested is respectively incident into each of the adjusted non-uniform magnetic fields to obtain the deflection distribution width of the particle beam to be tested under each of the adjusted non-uniform magnetic fields. Based on the deflection distribution widths, a width curve of the particle beam to be tested is generated; the width curve is used to reflect the change of the deflection distribution width of the particle beam to be tested with the pulse width. The orbital period of the electrons in the particle beam under test is obtained based on the width curve.

4. The method according to claim 3, characterized in that, The step of obtaining the deflection distribution width of the particle beam under each increased pulse width includes: When the increased pulse width is less than or equal to the orbital period, the deflection distribution width is obtained as the first width; When the increased pulse width is approximately equal to twice the orbital period, the deflection distribution width is obtained as a second width; the second width is less than the first width. When the increased pulse width is greater than the preset duration, the structure of the deflection distribution of the particle beam under test is converted into a discrete peak structure.

5. The method according to claim 1, characterized in that, The generation of a non-uniform magnetic field along the path of the particle beam under test includes: Deploy microstrip lines and photoconductive switches; Based on the microstrip line and the photoconductive switch, the non-uniform magnetic field is generated in the path of the particle beam under test; wherein, the transmission line length between the photoconductive switch and the microstrip line is used to determine the pulse width of the non-uniform magnetic field.

6. The method according to claim 1, characterized in that, The construction of the particle beam to be tested includes: The particle furnace is heated to a target temperature so that the particles placed in the particle furnace are converted into particle vapor; The particle vapor is collimated to obtain the particle beam to be tested.

7. The method according to claim 1, characterized in that, The method further includes: The particle beam under test is excited from the ground state to the excited state by pump light to obtain an excited-state particle beam; Based on the delay time between the pump light and the probe light, the non-uniform magnetic field is triggered to generate, so that the excited-state particle beam is subjected to the pulse action of the non-uniform magnetic field when it passes through the non-uniform magnetic field. Obtain the landing point position of the excited-state particle beam after passing through the non-uniform magnetic field; Based on the landing point position, statistical information of the instantaneous magnetic moment of the excited-state particle beam is obtained.

8. The method according to claim 1, characterized in that, The method further includes: A clean material surface is prepared in an ultra-high vacuum, and the particle beam to be tested is incident on the material surface at a grazing angle to obtain a scattered particle beam. During the interaction between the scattered particle beam and the material surface, the non-uniform magnetic field is applied to the scattered particle beam and the material surface, and the time when the scattered particle beam arrives at the material surface is synchronized with the time when the non-uniform magnetic field is generated. Statistical information on the instantaneous magnetic moment of the scattered particle beam is obtained based on the landing position of the scattered particle beam after passing through the non-uniform magnetic field.

9. The method according to claim 8, characterized in that, After obtaining the statistical information of the instantaneous magnetic moment of the scattered particle beam, the method further includes: The temperature of the material surface is adjusted to obtain multiple adjusted material surfaces; The scattered particle beam is incident on each of the adjusted material surfaces to obtain statistical information on the instantaneous magnetic moments of the scattered particles on each of the plurality of adjusted material surfaces.

10. The method according to claim 1, characterized in that, The method further includes: The density of the particle beam to be tested is reduced to a single particle; A non-uniform magnetic field is generated along the path of the single particle, and the arrival time of the single particle to the non-uniform magnetic field is synchronized with the generation time of the non-uniform magnetic field, so that the single particle is subjected to the pulse effect of the non-uniform magnetic field when it passes through the non-uniform magnetic field. Obtain the landing position of the single particle after passing through the non-uniform magnetic field.

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