Signal generating device, test system and test method

Abstract

This application relates to a signal generation device, a testing system, and a testing method. The signal generation device includes: a control module and multiple signal generation channels; each signal generation channel has a channel output terminal; the signal generation channels are configured to switch between multiple states; wherein, the multiple states include an analog output state and a digital output state; when in the analog output state, the signal generation channel generates an analog signal in response to the output signal of the control module, and outputs the analog signal through the channel output terminal; when in the digital output state, the signal generation channel generates a digital signal in response to the output signal of the control module, and outputs the digital signal through the channel output terminal.

Description

Technical Field

[0001] This application relates to the field of testing, and more particularly to a signal generation device, testing system and method. Background Technology

[0002] In the testing field, especially in HIL (Hardware-in-the-Loop) testing and RCP (Rapid Prototyping) testing, I / O boards are often required. I / O boards are equipped with various signal generation channels. The host can generate the information that needs to be sent. After the information passes through the signal generation channels, it generates the corresponding simulation test signals, which are then transmitted to the target object (such as the device under test, actuator, test bench, etc.).

[0003] In existing I / O boards, signal generation channels come in different types, such as digital signal generation channels and analog signal generation channels. Each channel has its own channel output terminal. Therefore, if an analog signal needs to be output, an analog signal generation channel and its channel output terminal are required. If a digital signal needs to be output, a digital signal generation channel and its channel output terminal are required. It can be seen that in the existing technology, the function of a single signal generation channel is limited. Summary of the Invention

[0004] Therefore, it is necessary to provide a signal generation device, a testing system, and a testing method to address the aforementioned technical problems.

[0005] In a first aspect, this application provides a signal generation device, including: a control module and multiple signal generation channels;

[0006] Each of the aforementioned signal generation channels has a channel output terminal;

[0007] The signal generation channel is configured to switch between multiple states; wherein the multiple states include analog output state and digital output state;

[0008] When in the analog output state, the signal generation channel generates an analog signal in response to the output signal of the control module, and outputs the analog signal through the channel output terminal.

[0009] When in the digital output state, the signal generation channel generates a digital signal in response to the output signal of the control module, and outputs the digital signal through the channel output terminal.

[0010] Secondly, this application provides a testing system, including the signal generation device involved in the first aspect and its alternative solutions;

[0011] The signal generation device is connected between the host and the target object; the control module is used to obtain information to be sent or descriptive information describing the information to be sent from the host, and to feed back a simulation test signal characterizing the information to be sent to the target object through the signal generation channel. The simulation test signal includes the analog signal and / or the digital signal; the target object includes: the device under test and / or auxiliary devices for testing.

[0012] Thirdly, this application provides a testing method, including:

[0013] The state of the designated signal generation channel in the signal generation device of the first aspect is configured to match the designated signal type of the designated signal input line of the target object; the designated signal generation channel is a signal generation channel that needs to be directly or indirectly connected to the designated signal input section during the test process;

[0014] During the testing of the target object, the host sends the information to be sent or the basic information used to generate the information to be sent to the designated signal generation channel, so that the information to be sent is transmitted from the designated signal generation channel to the designated signal input unit in the form of a signal of the designated signal type.

[0015] In the aforementioned signal generation device, testing system, and testing method, a single signal generation channel in the signal generation device has two types of states: analog output state and digital output state. Therefore, a single channel can be used to realize the functions of digital output and analog output, thus enriching the functions of a single signal generation channel. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of an application scenario in one embodiment of this application;

[0018] Figure 2 This is a schematic diagram of the structure of a signal generation device in one embodiment of this application. Figure 1 ;

[0019] Figure 3 This is a schematic diagram of the structure of a signal generation device in one embodiment of this application. Figure 2 ;

[0020] Figure 4This is a schematic diagram of the structure of a signal generation device in one embodiment of this application. Figure 3 ;

[0021] Figure 5 This is a circuit diagram of a voltage analog quantity generation circuit in one embodiment of this application;

[0022] Figure 6 This is a circuit diagram of a current analog quantity generation circuit in one embodiment of this application;

[0023] Figure 7 This is a circuit diagram of a digital quantity generation circuit in one embodiment of this application;

[0024] Figure 8 This is a schematic diagram of the structure of a signal generation device in one embodiment of this application. Figure 4 ;

[0025] Figure 9 This is a circuit diagram of a signal generation device in one embodiment of this application;

[0026] Figure 10 This is a circuit diagram of a signal generation device when the signal generation channel is in the voltage analog output state according to one embodiment of this application;

[0027] Figure 11 This is a circuit diagram of a signal generation device when the signal generation channel is in the current analog output state according to one embodiment of this application;

[0028] Figure 12 This is a circuit diagram of a signal generation device when the signal generation channel is in the voltage digital output state according to one embodiment of this application;

[0029] Figure 13 This is a circuit diagram of a signal generation device when the signal generation channel is in the current digital output state according to one embodiment of this application;

[0030] Figure 14 This is a schematic diagram of the resistor simulation circuit in one embodiment of this application;

[0031] Figure 15 This is a circuit diagram of a signal generation device when the signal generation channel is in a resistance simulation state according to one embodiment of this application;

[0032] Figure 16 This is a schematic diagram of the construction of a test system in one embodiment of this application. Figure 1 ;

[0033] Figure 17 This is a schematic diagram of the construction of a test system in one embodiment of this application. Figure 2 ;

[0034] Figure 18This is a schematic diagram of the switching principle of the selective connection device in one embodiment of this application;

[0035] Figure 19 This is a flowchart illustrating a testing method in one embodiment of this application. Detailed Implementation

[0036] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings, which illustrate embodiments of the present application. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this application will be thorough and complete.

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0038] It is understood that the terms “first,” “second,” etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.

[0039] It should be noted that when one element is considered to be "connected" to another element, it can be directly connected to the other element or connected to the other element through an intermediary element. Furthermore, in the following embodiments, "connection" should be understood as "electrical connection," "communication connection," etc., if there is transmission of electrical signals or data between the connected objects.

[0040] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising,” “including,” or “having,” etc., specify the presence of the stated feature, whole, step, operation, component, part, or combination thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof.

[0041] The application scenarios of the embodiments of this application can be, for example, Figure 1As shown in the diagram, a signal generation device is positioned between the target object and the host computer. This device can feed back information sent by the host computer (or information obtained based on the information sent by the host computer) to the target object in the required signal form, thereby realizing information transmission between the host computer and the target object. A test system including the signal generation device can include both the signal generation device and the host computer shown in the diagram. Communication between the signal generation device and the host computer is possible. Furthermore, the signal generation device can be connected to one target object or multiple target objects.

[0042] The target object can be any object or combination of objects that needs to receive information during the test, and the object usually refers to a hardware object.

[0043] In one example, the target object can be a device under test (DUT), specifically the hardware under test, such as a controller during the development and / or verification phases. This controller could be suitable for application in vehicles after development, such as a vehicle-mounted domain controller, or a controller for low-altitude aircraft or drones. In a further example, the DUT can refer to the hardware-in-the-loop (HIL) test device, and the host computer can include a real-time computer (RTPC) used in HIL testing, which can also be understood as an industrial control computer (ICC), typically configured with an embedded operating system. In other further examples, even if the target object is the DUT, the host computer can be a host computer running a desktop operating system (e.g., Windows), which interacts with the DUT via a signal generation device to achieve simulation testing. In yet another example, the host computer can also include both an ICC and a host computer.

[0044] In another example, the target object can be the actuator during rapid prototyping (RCP) testing. The host computer can be an industrial control computer used for RCP testing, which is usually equipped with an embedded operating system. The software under test (e.g., algorithm, model, etc.) can be located on the industrial control computer. The industrial control computer needs to control the actuator to test the functionality of the software. Thus, the actuator can be understood as an auxiliary device used for testing (testing the software under test).

[0045] In one example, the target object can also be an auxiliary device used for testing that provides corresponding auxiliary functions to the industrial control computer in the testing process (such as HIL testing, RCP testing, etc.). For example, it can be a test bench, simulation device, simulation bench, etc., used to simulate corresponding sensors and structural functions.

[0046] Therefore, the host computer can include an industrial control computer configured with an embedded operating system, a host computer configured with a desktop operating system, or both an industrial control computer and a host computer. The target object includes at least one of the following: a device under test (DUT), or an auxiliary device for testing (e.g., testing the DUT).

[0047] The industrial control computer and host computer mentioned here can be any circuit, circuit board, or device equipped with a processor. For example, an industrial control computer or host computer can refer to one or more circuit boards containing a processor. Furthermore, an industrial control computer or host computer can also include not only the circuit board containing the processor but also mechanical structures such as the casing. The processor refers to a processor that can run an operating system.

[0048] In one example, taking HIL testing, the industrial control computer runs the test and needs to interact with the user through a host computer. The user can then monitor and / or influence the test run by the industrial control computer through the host computer. The influence can include pre-test influence, such as configuring the test environment and test cases, or during the test.

[0049] Furthermore, the testing system can have one or more industrial control computers and one or more host computers. The testing system can be at least one of the following: a HIL testing system, an RCP testing system, a simulation testing system, or a back-injection testing system.

[0050] In the embodiments of this application, please refer to Figure 2 The signal generation device includes: a control module and multiple signal generation channels;

[0051] Each of the aforementioned signal generation channels has a channel output terminal;

[0052] The signal generation channel is configured to switch between multiple states; wherein the multiple states include analog output state and digital output state;

[0053] When in the analog output state, the signal generation channel generates an analog signal in response to the output signal of the control module, and outputs the analog signal through the channel output terminal; furthermore, when the analog signal is output, the signal output by the control module can at least characterize the magnitude or range of the analog signal; in a further example, the signal output by the control module may further include a signal characterizing whether the output is voltage or current, such as a signal transmitted to the electrical parameter control circuit, specifically a signal that can control the mode of the electrical parameter control circuit (voltage control mode or current control mode).

[0054] When in the digital output state, the signal generation channel generates a digital signal in response to the output signal of the control module, and outputs the digital signal through the channel output terminal; furthermore, when outputting the digital signal, the signal output by the control module can at least characterize the 0 / 1 state (or can be understood as a high / low level state) of the digital signal. In a further example, the signal output by the control module may further include a signal characterizing what voltage (or current) or what voltage (or current) range is used in the 0 or 1 state, such as a signal transmitted to the electrical parameter control circuit in the digital output state.

[0055] Since the signal generation device is connected between the host and the target object, the control module can at least be used to obtain the information to be sent from the host or to generate the basic information of the information to be sent, and to feed back the simulation test signal representing the information to be sent to the target object through the signal generation channel. The simulation test signal includes the analog signal and / or the digital signal, which can be used to represent (or can be understood as being used to transmit) the information to be sent.

[0056] The signal generation device can generate simulation test signals and perform various other calculations, such as generating information to be sent based on basic information. Therefore, the channel of the signal generation device can be primarily used for information transmission, or it can integrate signal simulation calculations into the control module. As can be seen, a single signal generation channel in the signal generation device has both analog and digital output states. Thus, a single channel can be used to achieve both analog and digital output functions, enriching the functionality of a single signal generation channel. The control module can be implemented using any circuit module with data processing capabilities. In one example, one or more FPGA circuits can be used; in other examples, the FPGA circuit can be replaced with or supplemented with other processor circuits. The control module may also include other peripheral devices. Furthermore, since a single signal generation channel in the prior art can also generate digital or analog signals based on the output signal of the control module, the logic of how the control module outputs a signal based on the information to be sent or its basic information, thereby causing the signal generation channel to output a digital or analog signal, can be understood by referring to the processing procedures in the prior art or improved processing procedures. Regardless of the method used to implement the control module, it does not depart from the scope of the embodiments of this application. The following description of specific embodiments in this specification mainly elaborates on the implementation method of the signal generation channel.

[0057] In one embodiment, the analog output state includes: a voltage analog output state for outputting a voltage analog signal through the channel output terminal, and a current analog output state for outputting a current analog signal through the channel output terminal.

[0058] Please refer to Figure 3 and Figure 4 The signal generation channel may include:

[0059] A voltage analog quantity generation circuit is used to generate a voltage analog quantity signal in response to the output signal of the control module (or in response to the control of the control module). Correspondingly, the information described by the output signal of the control module can be matched with the magnitude of the voltage analog quantity. For example, the control module can use digital signals to describe the voltage of the voltage analog quantity signal or the voltage range it is in. Furthermore, any circuit suitable for controlling the magnitude of the output voltage can be used as a voltage analog quantity generation circuit.

[0060] A current analog quantity generation circuit is used to generate a current analog quantity signal in response to the output signal of the control module (or in response to the control of the control module). Correspondingly, the information described by the output signal of the control module can be matched with the magnitude of the current analog quantity. For example, the control module can use digital signals to describe the current of the current analog quantity signal as large or within what voltage range. Furthermore, any circuit suitable for controlling the magnitude of the output voltage can be used as a current analog quantity generation circuit.

[0061] In some examples, the signal generation channel may have both a voltage analog signal generation circuit and a current analog signal generation circuit, or only one of them. Furthermore, both the voltage analog signal generation circuit and / or the current analog signal generation circuit can be considered as analog signal generation circuits.

[0062] The voltage analog quantity generation circuit can operate at least when the signal generation channel is in the voltage analog quantity output state, so as to output the voltage analog quantity signal through the channel output terminal;

[0063] like Figure 5 As shown, the voltage analog quantity generation circuit may include a digital-to-analog converter module DAC1, resistors R1 and R2, and operational amplifier OP1. It can form a closed loop for voltage feedback control.

[0064] The output of the digital-to-analog converter module DAC1 is connected to the first input of the operational amplifier OP1 via resistor R2; resistor R1 is connected between the second input of the operational amplifier OP1 and the output of the operational amplifier OP1, and the output of the operational amplifier OP1 is directly or indirectly connected to the channel output.

[0065] The digital-to-analog converter module DAC1 can be any device or combination of devices capable of digital-to-analog conversion, such as one or more digital-to-analog converters.

[0066] The analog current generation circuit can operate at least when the signal generation channel is in the analog current output state, so as to output the analog current signal through the channel output terminal.

[0067] like Figure 6 As shown, the voltage analog quantity generation circuit may include a digital-to-analog converter module DAC2, resistor R4, detection resistor R5, operational amplifier OP2, capacitor C1, transistors T1 and T2, and detection feedback circuitry. It can form a closed loop for current feedback.

[0068] The output of the digital-to-analog converter module DAC2 is connected to the first input of operational amplifier OP2 via resistor R4. Capacitor C1 is connected between the second input and output of operational amplifier OP2. The output of operational amplifier OP2 is also connected to the control terminals (e.g., base or gate) of transistors T1 and T2. The first terminal of transistor T1 is connected to the power supply, and the second terminal of transistor T1 is connected to the first terminal of transistor T2. The second terminal of transistor T2 is grounded. The first terminal of sensing resistor R5 is connected to the second terminal of transistor T1, and the second terminal of sensing resistor R5 is directly or indirectly connected to the channel output. The detection feedback circuit is used to detect the voltage of sensing resistor R5 and feed it back to the second terminal of operational amplifier OP2. The voltage of sensing resistor R5 reflects the magnitude of the current flowing through it, and thus the magnitude of the current output through the channel output. The voltage at the output of operational amplifier OP2 can control transistor T1, thereby changing the magnitude of the current output through the transistor. Furthermore, due to the feedback from the detection feedback circuit, the voltage at the output of operational amplifier OP2 changes according to the detected current through sensing resistor R5, thereby achieving the purpose of current feedback control.

[0069] Furthermore, the detection feedback circuit may include operational amplifier OP3 and resistor R3. The two input terminals of operational amplifier OP3 are respectively connected to the two ends of the detection resistor R5, and the output terminal of operational amplifier OP3 is connected to the second input terminal of operational amplifier OP2 via resistor R3. This allows a voltage signal representing the current magnitude to be fed back to the input terminal of operational amplifier OP2, thereby achieving feedback control. In addition, direct connections or other components may be used between operational amplifier OP3 and resistor R3, between resistor R3 and operational amplifier OP2, and between operational amplifier OP3 and detection resistor R5.

[0070] The digital-to-analog converter module DAC2 can be any device or combination of devices capable of digital-to-analog conversion, such as one or more digital-to-analog converters.

[0071] Please refer to Figure 3and Figure 4 In one example, the signal generation channel further includes a digital quantity generation circuit;

[0072] The digital signal generation circuit is used to generate the digital signal in response to the output signal of the control module when the signal generation channel is in the digital output state and under the power supply, wherein the power supply is a voltage source or a current source.

[0073] Furthermore, the digital output state includes: a voltage digital output state for outputting a voltage digital signal through the channel output terminal, and / or: a current digital output state for outputting a current digital signal through the channel output terminal;

[0074] In one example, different circuits can be used to implement the digital output states of voltage and current respectively, for example... Figure 4 As shown, the digital quantity generation circuit may include a voltage digital quantity generation circuit and a current digital quantity generation circuit.

[0075] Reference to Figure 7 For example, the voltage digital quantity generation circuit can be a scheme in which transistor T3 is connected to a voltage source, and the current digital quantity generation circuit can be a scheme in which transistor T3 is connected to a current source.

[0076] Specifically, the voltage digital quantity generation circuit may include an upper transistor (e.g., transistor T3), a lower transistor (e.g., transistor T4), and a driver. The output terminal of the driver is connected to the control terminals (e.g., base or gate) of the upper and lower transistors. The first terminal of the upper transistor is connected to a voltage source or a current source. The second terminal of the upper transistor is connected to the first terminal of the lower transistor. The second terminal of the lower transistor is grounded. The second terminal of the upper transistor is also directly or indirectly connected to the channel output terminal.

[0077] Furthermore, the voltage digital quantity generation circuit and the current digital quantity generation circuit can be different circuits, each using its own driver, high-side transistor, and low-side transistor, etc. Alternatively, the voltage digital quantity generation circuit and the current digital quantity generation circuit can be the same circuit, with a voltage source connected when used as a voltage digital quantity generation circuit and a current source connected when used as a current digital quantity generation circuit. This effectively saves components and reduces the space consumption of the circuit board.

[0078] The voltage and current sources can be voltage and current source circuits specifically designed for digital quantity generation circuits.

[0079] In some embodiments, since a single signal generation channel handles both digital and analog signal outputs, and the analog signal generation circuit can control voltage and / or current, to further save components and reduce board space consumption, some alternative solutions creatively conceive of using the analog signal generation circuit as a voltage and / or current source. Thus, for example... Figure 8 As shown, the analog quantity generation circuit (including the voltage analog quantity generation circuit and / or the current analog quantity generation circuit) can also be described as an electrical parameter control circuit. This electrical parameter control circuit is used to generate electrical signals of corresponding electrical parameters in response to the output signal of the control module, that is, electrical signals of corresponding voltage or electrical signals of corresponding current.

[0080] The “corresponding voltage electrical signal” can be understood as the required output voltage analog signal when the signal generation channel is in the voltage analog output state. That is, when the signal generation channel is in the voltage analog output state, the electrical parameter control circuit generates a corresponding voltage electrical signal as the voltage analog signal in response to the output signal of the control module in the voltage control mode.

[0081] The “corresponding voltage electrical signal” can be understood as being used as a voltage source to provide power to the digital quantity generation circuit when the signal generation channel is in the voltage digital quantity output state.

[0082] The “corresponding current electrical signal” can be understood as the required current analog signal when the signal generation channel is in the current analog output state. That is, when the signal generation channel is in the current analog output state, the electrical parameter control circuit generates a corresponding current electrical signal as the current analog signal in response to the output signal of the control module in the current control mode.

[0083] The “corresponding current electrical signal” can be understood as being used as a current source to provide power to the digital quantity generation circuit when the signal generation channel is in the voltage digital quantity output state.

[0084] As can be seen, when the signal generation channel is in the analog output state, the electrical signal generated by the controlled electrical parameter control circuit is used as the analog signal. When the signal generation channel is in the digital output state, the electrical signal generated by the controlled electrical parameter control circuit is used as a voltage source or current source. The digital signal generation circuit is used to: when the signal generation channel is in the digital output state, use the electrical signal (voltage or current) generated by the electrical parameter control circuit as a power source, and under the power supply of the power source, generate the digital signal in response to the output signal of the control module. The power source is either a voltage source or a current source.

[0085] In some embodiments, the electrical parameter control circuit (i.e., analog quantity generation circuit) may include a voltage control circuit (i.e., voltage analog quantity generation circuit) and a current control circuit (i.e., current analog quantity generation circuit) respectively. In other embodiments, voltage control and current control can also be achieved through different states of the same circuit. This can also be understood as: Figure 5 The circuit shown is Figure 6 The circuit shown, when combined, achieves different states of a single circuit through the reuse and integration of components. Figure 5 and Figure 6 The electrical parameter control circuit is configured to switch between voltage control mode and current control mode. The electrical parameter control circuit in voltage control mode can also be understood as a voltage analog quantity generation circuit and a voltage control circuit; similarly, the electrical parameter control circuit in current control mode can be understood as a current analog quantity generation circuit and a current control circuit.

[0086] Furthermore:

[0087] When the signal generation channel is in the voltage analog output state, the electrical parameter control circuit generates a corresponding voltage electrical signal as the voltage analog signal in response to the output signal of the control module in the voltage control mode.

[0088] When the signal generation channel is in the current analog output state, the electrical parameter control circuit generates a corresponding current electrical signal as the current analog signal in response to the output signal of the control module in the current control mode.

[0089] If the digital quantity generation circuit uses the electrical parameter control circuit as a voltage source or current source, then:

[0090] When the signal generation channel is in the voltage digital output state, the electrical parameter control circuit is in the voltage control mode, which is used to generate an electrical signal of the corresponding voltage as the voltage source.

[0091] When the signal generation channel is in the current analog output state, the electrical parameter control circuit is in the current control mode, which is used to generate an electrical signal of the corresponding current as the current source.

[0092] by Figure 9For example, in this example, a multiplexed digital-to-analog converter (DAC_M) can be used to multiplex DAC1 and DAC2. Therefore, the descriptions of DAC1 and DAC2 can also be applied to DAC_M. In this example, a multiplexed resistor (R_M) can be used to multiplex resistors (R2 and R4). Therefore, the descriptions of R2 and R4 can also be applied to multiplexed resistor (R_M). In this example, an operational amplifier (OP_M) can be used to multiplex operational amplifiers (OP1 and OP2). Therefore, the descriptions of OP1 and OP2 can also be applied to multiplexed operational amplifier (OP_M).

[0093] Based on this, in order to achieve the switching between the two states, switch module K1 and switch module K2 can be used. Switch module K1 can be implemented by one or more switches. Switch module K1 can be connected between op-amp OP_M, resistor R1, and capacitor C1. Switch module K2 can be connected to the detection feedback line and is responsible for controlling the on and off of the detection feedback line, for example, it can be connected between resistor R3 and op-amp OP_M.

[0094] Switch module K1 is used for:

[0095] like Figure 11 , Figure 13 As shown, in current control mode, capacitor C1 is connected between the second input and output terminals of the multiplexed operational amplifier OP_M, and resistor R1 is disconnected from the second input and output terminals of the multiplexed operational amplifier OP_M; thereby, it is possible to achieve... Figure 5 The circuit shown achieves closed-loop voltage control.

[0096] like Figure 10 , Figure 12 As shown, in voltage control mode, resistor R1 is connected between the second input and output terminals of the multiplexed operational amplifier OP_M, and capacitor C1 is disconnected from the second input and output terminals of the multiplexed operational amplifier OP_M; thereby, it is possible to achieve... Figure 6 The circuit shown implements closed-loop current control.

[0097] For further details, please refer to... Figure 10This can be understood as the circuit configuration in the voltage analog output state. In this state, switch module K1 is connected to resistor R1, and switch module K2 is disconnected. Through the electrical parameter control circuit in voltage control mode, a voltage analog signal can be generated. This voltage analog signal can be output through the channel output terminal. In the illustrated example, it can be output to the channel output terminal via transistor T3. Transistor T3 can be on at this time. In other examples, the output can also bypass transistor T3. For example, at least one of other switch modules, resistors, or fault simulation modules can be provided between the detection resistor R5 and the channel output terminal. If a switch module is provided, the output can be achieved without passing through transistor T3 by turning it on. Transistor T3 can be off. Furthermore, transistor T4 can be off. The on / off states of transistors T3 and T4 can be controlled by a driver, or normally open or normally closed transistors can be selected during the selection process.

[0098] In other examples, even if the voltage control circuit (i.e., the voltage analog quantity generation circuit) is an independent circuit and is not reused or integrated with the current control circuit (i.e., the current analog quantity generation circuit), at least one of other switching modules, resistors, fault simulation modules, etc., may be provided between the voltage control circuit (i.e., the voltage analog quantity generation circuit), the current control circuit (i.e., the current analog quantity generation circuit), and the channel output terminal.

[0099] For further details, please refer to... Figure 11 This can be understood as the circuit configuration in the current analog output state. In this configuration, switch module K1 is connected to capacitor C1, and switch module K2 is closed. Through the electrical parameter control circuit in current control mode, a current analog signal can be generated. This current analog signal can be output through the channel output terminal. In the illustrated example, it can be output to the channel output terminal via transistor T3. Transistor T3 can be on at this time. In other examples, the output can also bypass transistor T3. For example, at least one of the following can be provided between the detection resistor R5 and the channel output terminal: a switch module, a resistor, or a fault simulation module. If a switch module is provided, the output can be achieved without passing through transistor T3 by turning it on. Transistor T3 can be off. Furthermore, transistor T4 can be off. The on / off states of transistors T3 and T4 can be controlled by a driver, or normally open or normally closed transistors can be selected during the selection process.

[0100] In other examples, even if the current control circuit (i.e., the current analog quantity generation circuit) is an independent circuit and is not reused or integrated with the voltage control circuit (i.e., the voltage analog quantity generation circuit), at least one of other switching modules, resistors, fault simulation modules, etc., may be provided between the current control circuit (i.e., the current analog quantity generation circuit) and the channel output terminal.

[0101] For further details, please refer to... Figure 12This can be understood as the circuit configuration in the voltage digital output state. In this state, switch module K1 is connected to resistor R1, and switch module K2 is disconnected. Through the electrical parameter control circuit in voltage control mode, the required voltage source can be formed to power transistors T3 and T4. The driver can, under the control of the control module, drive transistor T3 to turn on and transistor T4 to turn off, pulling the channel output terminal up to the voltage source; or, drive transistor T3 to turn off and transistor T4 to turn on, pulling the channel output terminal down. If a switch module is located between the sensing resistor R5 and the channel output terminal, then this switch module can be disconnected.

[0102] For further details, please refer to... Figure 13 This can be understood as the circuit configuration in the current digital output state. In this state, switch module K1 is connected to capacitor C1, and switch module K2 is closed. Through the electrical parameter control circuit in current control mode, the required current source can be formed to power transistors T3 and T4. The driver can, under the control of the control module, drive transistor T3 to open and transistor T4 to close, pulling the current source up to the channel output terminal; or, drive transistor T3 to close and transistor T4 to open, pulling the channel output terminal down. If a switch module is located between the sensing resistor R5 and the channel output terminal, then this switch module can be disconnected.

[0103] It is evident that, for Figures 10 to 13 The circuit shown can switch between multiple states of the same signal generation channel by switching the switching module, fully realizing circuit reuse, effectively reducing components, and making efficient use of board space. This helps to reduce the size of the circuit board for the signal generation device, meeting the design requirements of smaller board standards, and also helps to accommodate more functions and / or channels in a limited board space. In particular, it avoids or reduces the overhead of providing a separate, more complex voltage and current source for the digital signal generation circuit.

[0104] Furthermore, in existing testing systems, signal generation channels generally only consider digital voltage and analog voltage. In the specific example of this application, both digital current and analog current signal generation are taken into account, which broadens the function of the signal generation channel and facilitates a wider range of simulation testing possibilities.

[0105] In this system, voltage and current sources can provide adjustable power for digital signal generation. For example, an electrical parameter control circuit can form adjustable voltage and current sources to meet different digital signal specifications. In some examples, the signal generation channel may also include other non-adjustable power sources providing voltage or current. Furthermore, the voltage and / or current sources, along with these non-adjustable power sources, can be connected to the digital signal generation circuit (e.g., connected to the first terminal of transistor T3) via a switching module. In this case, the switching module allows selective connection of one of the voltage, current, or non-adjustable power sources to the digital signal generation circuit (e.g., to the first terminal of transistor T3) to power it. There may be only one type of non-adjustable power source or multiple types.

[0106] Furthermore, in some embodiments, the multiple states of the signal generation channel may not be limited to voltage digital output state, current digital output state, voltage analog output state, and current analog output state. For example, it may also have a resistance simulation state, a customized signal output state, etc. Correspondingly, the signal generation channel may be equipped with a corresponding resistance simulation circuit, a customized signal output circuit, etc.

[0107] The multiple states also include the resistance simulation state;

[0108] When in the analog output state, the signal generation channel responds to the output signal of the control module and generates simulated resistance parameters at the channel output terminal, so that the target object (e.g., the device under test) connected to the channel output terminal can obtain simulated resistance information based on the simulated resistance parameters.

[0109] For example, if the electrical parameter for the resistance simulation is voltage, the target object can use the voltage at the output of the detection channel as the basis for simulating resistance information (e.g., resistance value), and different voltage detection results can represent different resistance values. Similarly, if the electrical parameter for the resistance simulation is current, the target object can use the current at the output of the detection channel as the basis for simulating resistance information (e.g., resistance value), and different voltage detection results can represent different resistance values. In some scenarios, this simulated resistance information can, for example, simulate the detection results of a sensor. Such sensors typically have a resistor whose resistance value changes with the detected object (temperature, pressure, etc.). The simulation of the detection result can be understood as a simulation of the resistance value, and the simulation of the resistance value can further be seen as a simulation of the electrical parameters used when measuring the resistance value.

[0110] Resistance simulation information can be the resistance value, the range of resistance values, or the detection result of the simulated sensor as reflected by the resistance value. Since all of these can directly or indirectly represent the magnitude or range of the resistance to be simulated, they can all be understood as a way of realizing resistance simulation information.

[0111] To achieve the above functions, such as Figure 14 As shown, a separate line is needed to detect and feedback the simulated resistance parameters at the channel output. That is, the signal generation channel includes a resistance simulation feedback line. If the simulated resistance information uses voltage as the simulated resistance parameter, then the resistance simulation feedback line is a voltage feedback line. To control the simulated resistance parameters, the signal generation channel may also include a resistance simulation control circuit, which can control the simulated resistance parameters at the channel output based on the feedback results from the resistance simulation feedback line. In one example, to further save components and reduce space usage so that the circuit can accommodate more channels and / or functions within a limited space, the resistance simulation control circuit can also reuse the electrical parameter control circuit. Specifically:

[0112] If the electrical parameter of the resistance simulation is voltage, then: the electrical parameter control circuit is in voltage control mode, which can control the voltage at the channel output terminal in response to the signal output by the control module and the feedback result of the resistance simulation feedback circuit. In this case, the signal output by the control module can be used to represent: the voltage or related information that the channel output terminal needs to achieve corresponding to the required simulated resistance information.

[0113] If the electrical parameter in the resistance simulation is current, then: the electrical parameter control circuit is in current control mode, which can control the current at the channel output terminal in response to the signal output by the control module and the feedback result of the resistance simulation feedback circuit. In this case, the signal output by the control module can be used to represent: the voltage or related information that the channel output terminal needs to reach, corresponding to the required simulated resistance information.

[0114] For further details, please refer to... Figure 15Taking the voltage as an example of the electrical parameter in the resistor simulation, the resistor simulation feedback circuit can include an operational amplifier OP4. Its two input terminals can be directly or indirectly connected to the two terminals of the channel output terminal. The output terminal of the operational amplifier OP4 can be directly or indirectly connected to the reference input terminal of the digital-to-analog converter module of the electrical parameter control circuit (for example, it can be the analog-to-digital converter module DAC_M when fully multiplexed; or, for example, if the digital-to-analog converter modules DAC1 and DAC2 are not multiplexed, it can be the digital-to-analog converter module DAC1). For example, if the digital-to-analog converter module includes one or more digital-to-analog converters, then the output terminal of the operational amplifier OP4 can be directly or indirectly connected to the reference input terminal of one of the digital-to-analog converters. As the voltage of the reference input terminal (which matches the voltage difference between the two terminals of the channel output terminal) changes, the signal output by the digital-to-analog converter module will change accordingly, thereby realizing closed-loop control and achieving the adjustment of the voltage as the electrical parameter in the resistor simulation.

[0115] In addition, a switch module K3 is provided between the resistance simulation feedback line and the channel output terminal to control whether the resistance simulation feedback line is connected to the channel output terminal. Specifically, when in resistance simulation state, the switch module K3 connects the resistance simulation feedback line to the channel output terminal. When not in resistance simulation state, one or more lines of the resistance simulation feedback line can be disconnected from the channel output terminal. Of course, it can also remain connected.

[0116] Between the resistor simulation feedback line and the reference input terminal of the digital-to-analog converter module of the electrical parameter control circuit, a switch module K4 can be provided to control whether the resistor simulation feedback line is connected to the digital-to-analog converter module. Specifically, when in resistor simulation state, the switch module K4 connects the resistor simulation feedback line to the reference input terminal. When not in resistor simulation state, the switch module K4 can disconnect the resistor simulation feedback line from the reference input terminal. At the same time, other reference circuits that provide references can be connected to the reference input terminal to provide a more stable voltage as a reference. This can prevent the reference from fluctuating with the voltage detection result of the channel output terminal in other states, thus affecting the accurate generation of signals in other states.

[0117] In the testing system provided in the embodiments of this application, such as Figure 16 As shown, a signal generating device is included, which can be positioned between the host and the target object. The number of signal generating devices can be one or more; the number of target objects can also be one or more. Various descriptions and examples of the signal generating device, host, and target objects can be found in the relevant sections of this instruction manual.

[0118] Since the signal generation channel of this application has at least two states, the same signal generation channel can be reused for different test tasks, thereby utilizing a limited number of signal generation channels to meet diverse signal requirements.

[0119] Specifically, when executing the first test task, at least one of the plurality of signal generation channels is in a first state, used to send first information to be sent from the host to the first target object corresponding to the first test task through a first type of signal;

[0120] When performing the second test task, the target signal generation channel is in a second state, which is used to send the second information to be sent from the host to the second target object corresponding to the first test task through the second type of signal;

[0121] The first state and the second state are different states among the plurality of states.

[0122] Furthermore, the first state can be any one of the following: digital voltage output state, digital current output state, analog voltage output state, analog current output state; but it is not limited to these. The second state can be any one of the following: digital voltage output state, digital current output state, analog voltage output state, analog current output state; but it is not limited to these.

[0123] In the above scheme, the same signal generation channel can be in different states when performing different tests, which helps to fully meet the diverse channel type requirements and changes in requirements.

[0124] Specifically, in the prior art, because the type of test signal generation channel is fixed, for example, there can be 5 analog current signal generation channels, 5 analog voltage signal generation channels, 5 digital current signal generation channels, and 5 digital current signal generation channels. In this case, if a test requires 4 analog current signal generation channels, the test system can meet the requirements. However, if another test requires 6 analog current signal generation channels, the existing test system is difficult to meet the requirements. But after adopting the specific solution of this application, it can be achieved that as long as the total number of signal generation channels can meet the requirements, a sufficient number of specific types of signal generation channels can be constructed through state changes.

[0125] Furthermore, for the aforementioned first and second test tasks, if existing technologies are used, it is often necessary to disconnect the first target object from the test system after the first test task is completed before the second target object of the second test task can be accessed.

[0126] For example, assuming the test system has two analog signal generation channels and two digital signal generation channels, when performing the first test task after connecting the first target object, if the first target object requires the use of two analog signal generation channels and one digital signal generation channel, while the second target object in the second test task requires the use of one analog signal generation channel, then the wiring of the second target object can only be completed after the first test task is finished. However, with the specific solution of this application, assuming there are a total of four signal generation channels, even if the first test task uses three signal generation channels, the second target object only needs to connect to the remaining signal generation channel, and then configure that signal generation channel to analog output state when executing the second test task.

[0127] As demonstrated by the examples above, because the state of the signal generation channels is changeable, it's not necessary to wait for one test task to complete before starting the wiring for another. During the execution of one test task, as long as there are remaining signal generation channels, the wiring between the target object of another test task and the remaining signal generation channels can be achieved. This simplifies the testing operation and improves processing efficiency. Furthermore, if the number of signal generation channels is sufficient—for example, enough to meet the needs of N sets of target objects for N test tasks (N greater than or equal to 2)—the wiring between the signal generation channels of N test tasks and each target object can be achieved simultaneously, thus facilitating centralized wiring for multiple test tasks.

[0128] In some embodiments, please refer to Figure 17 The test system also includes a selective switching device and a signal acquisition channel.

[0129] The selective switching device is connected to the signal generation channel and the signal acquisition channel; the selective switching device is also directly or indirectly connected to the target object through a universal connection part;

[0130] The universal connector is used to connect the signal output line of the target object. The universal connector may, for example... Figure 16 The connecting parts P1, P2, and P3 shown can be interfaces or terminals for selectively connecting devices to the outside, interfaces on the panel of the test system cabinet, or interfaces or terminals on connectors used to mate with the target object. Any medium that can achieve direct or indirect connection to the line of the target object can be considered a connecting part and can be used as a general-purpose connecting part.

[0131] In one embodiment, the universal connection unit is specifically used to: connect the signal output line of the third target object to be tested in the third test task when performing the third test task; and connect the signal input line of the fourth target object to be tested in the fourth test task when performing the fourth test task; in other words, the universal connection unit can connect the signal output line and the signal input line respectively when performing different test tasks.

[0132] Correspondingly, the selective connection device is used to: connect the general connection unit to the signal acquisition channel when performing the third test task, so that the information to be reported sent by the third target object can be transmitted to the host through the signal acquisition channel; and connect the general connection unit to the signal generation channel when performing the fourth test task, so that the corresponding information to be sent (e.g., the information to be sent sent by the host) can be transmitted to the fourth target object through the signal generation channel.

[0133] Among them, the third target object is, for example Figure 18 Target object 2, fourth target object, for example Figure 18 In the target object 1, the connecting part PX can be understood as the universal connecting part used in the above scheme.

[0134] It is evident that even if the same universal connector is used to connect the signal output line and the signal input line respectively during different tests, the selective switching device can still meet the signal transmission requirements of each test by selectively switching on the corresponding channels.

[0135] In contrast, existing technologies typically distinguish between different connection points in the external interfaces of testing systems, such as DI (Digital Input), DO (Digital Output), AI (Analog Input), and AO (Analog Output). These different connection points correspond to different channels within the testing system. For example, the DI connection point internally connects to the digital signal acquisition channels of each signal acquisition channel and externally connects to the digital signal output lines of the target object. The DO connection point internally connects to the digital signal output channels of each signal generation channel and externally connects to the digital signal input lines of the target object. The AI ​​connection point internally connects to the analog signal acquisition channels of each signal acquisition channel and externally connects to the analog signal output lines of the target object. The AO connection point internally connects to the analog signal output channels of each signal generation channel and externally connects to the analog signal input lines of the target object. If digital and analog signals are further categorized into digital and analog voltage and current signals, the number of such connection point and channel classifications becomes even greater. Wiring requires distinguishing between different connection points to connect the target object's lines, making the operation complex and prone to errors.

[0136] In the above-described solution of this application, a single universal connector can simultaneously handle digital / analog signal input and output functions, making full and effective use of connector resources. It also facilitates wiring and provides a high degree of flexibility in wiring. Specifically, the lines of the target object can be arbitrarily connected to any universal connector; only the selective connection device needs to be configured to ensure that the universal connector can be connected to the corresponding channel (signal generation channel or signal acquisition channel).

[0137] In some embodiments, please refer to Figure 17 The test system further includes a bus interaction channel; the selective connection device is connected between the general connection part, the signal generation channel, and the bus interaction channel.

[0138] The general connection unit is used to: connect the bus interaction line of the fifth target object to be tested in the fifth test task when performing the fifth test task, and connect the signal input unit of the sixth target object to be tested in the sixth test task when performing the sixth test task;

[0139] The selective connection device is used to connect the general connection unit to the bus interaction channel when performing the fifth test task, so that the host can communicate with the fifth target object using the bus interaction channel. When performing the sixth test task, the general connection unit is connected to the signal generation channel, so that the corresponding information to be sent (e.g., information to be sent by the host) can be transmitted to the sixth target object through the signal generation channel.

[0140] Among them, the fifth target object is, for example Figure 18 Target object 3, the sixth target object, for example Figure 16 In the target object 1, the connecting part PX can be understood as the universal connecting part used in the above scheme.

[0141] It is evident that even if the same universal connector is used to connect the signal output line and the bus interaction line respectively during different tests, the selective connection device can still meet the communication requirements of each test by selectively connecting the corresponding channels.

[0142] In contrast, in existing technologies, the external interfaces of testing systems typically distinguish between DI (digital input), DO (digital output), AI (analog input), and AO (analog output) connection points, and also include bus interaction connection points, such as those for CAN bus, LIN bus, Flexray bus, and DSI bus. These bus interaction lines are used to connect the target object to the corresponding bus. When wiring, it is necessary to distinguish between different connection points and connect the target object's lines, which is more complicated and prone to errors.

[0143] In the above-described solution of this application, a single universal connector can simultaneously perform digital / analog signal output and bus interaction functions, making full and effective use of connector resources. It also facilitates wiring and provides a high degree of flexibility in wiring. Specifically, the lines of the target object can be arbitrarily connected to any universal connector; only the selective connection device needs to be configured to ensure that the universal connector can be connected to the corresponding channel (signal generation channel or signal acquisition channel).

[0144] Since a bus is an interactive communication method and signal generation is a one-way communication method, the connection parts are generally not shared. However, the above-mentioned solution of this application creatively conceives of the sharing of the interactive communication medium and the one-way communication medium, and ensures that the signal transmission requirements can be met no matter how the wiring is done through a selective connection device. For example, a certain bus interactive line can be connected to a matching bus channel.

[0145] The selective connection device is configured to selectively connect the first connection part and the second connection part, so that the corresponding channels and lines are connected.

[0146] The first connection part can be understood as a medium used to connect corresponding channels (such as signal generation channel, signal acquisition channel, bus channel), and different first connection parts connect to different channels; the second connection part can be understood as a medium used to connect corresponding general connection parts, and different second connection parts connect to different general connection parts, or: the second connection part can also be a general connection part.

[0147] The selective connection freedom of the selective connection device includes at least two scenarios. In one scenario, all first connecting parts can selectively connect to all second connecting parts, that is, each first connecting part can selectively connect to any second connecting part. In the other scenario, selective connection can be achieved within a certain range. For example, if the total number of first connecting parts is M1 and the total number of second connecting parts is N2, M1 can be equal to or different from M2. Then, for the N1 first connecting parts in M1, they can selectively connect to the N2 second connecting parts in M2, where N1 < M1 and N2 < M2. That is, only the N1 first connecting parts and the N2 second connecting parts can achieve free selective connection, and they cannot connect to other second connecting parts other than the N2 second connecting parts.

[0148] Furthermore, the selective connection device can also be understood as any device whose circuitry can freely connect the first connection part and the second connection part. For example, it can be implemented using a switch matrix, relay matrix, or FPGA. The selective connection device may include one circuit board or a combination of multiple circuit boards containing this circuitry. The selective connection device can be configured to connect the first connection part and the second connection part under the control of an industrial control computer or a host computer. It can also be automatically or manually controlled by other devices (such as a host computer or server connected to the test system). This control process can be implemented by the host computer or bypass the host computer and directly control the selective connection device through other interfaces of the test system.

[0149] Please refer to Figure 19 This application also provides a testing method, including:

[0150] S10: Configure the state of the specified signal generation channel in the signal generation device to match the specified signal type of the specified signal input line of the target object;

[0151] The designated signal generation channel is a signal generation channel that needs to be directly or indirectly connected to the designated signal input unit during the test process.

[0152] S20: During the testing of the target object, the host sends the information to be sent or the basic information used to generate the information to be sent to the designated signal generation channel, so that the information to be sent is transmitted from the designated signal generation channel to the designated signal input line in the form of the designated signal type.

[0153] In a further example, before step S20, the following may also be included:

[0154] S30: Configure the selective switching device to connect a specified signal input line to a specified signal generation channel.

[0155] Steps S10 and / or S30 can be implemented by an industrial control computer or a host computer, while step S20 can be implemented by a host computer.

[0156] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0157] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A signal generation device for testing, characterized in that, include: The control module has multiple signal generation channels; Each of the aforementioned signal generation channels has a channel output terminal; The channel output terminal is used to connect to the target object, which is the device under test or an auxiliary device used for testing; The signal generation channel is configured to switch between multiple states; wherein the multiple states include analog output state and digital output state; When in the analog output state, the signal generation channel generates an analog signal in response to the output signal of the control module, and outputs the analog signal through the channel output terminal. When in the digital output state, the signal generation channel generates a digital signal in response to the output signal of the control module, and outputs the digital signal through the channel output terminal.

2. The signal generation device according to claim 1, characterized in that, The signal generation channel includes an electrical parameter control circuit; the electrical parameter control circuit is used to generate an electrical signal with corresponding electrical parameters in response to the output signal of the control module. When the signal generation channel is in the analog output state, the electrical signal generated by the controlled electrical parameter control circuit is used as the analog signal.

3. The signal generation device according to claim 2, characterized in that, The electrical parameter control circuit is configured to switch between voltage control mode and current control mode. The analog output states include: a voltage analog output state for outputting a voltage analog signal through the channel output terminal, and a current analog output state for outputting a current analog signal through the channel output terminal. When the signal generation channel is in the voltage analog output state, the electrical parameter control circuit generates a corresponding voltage electrical signal as the voltage analog signal in response to the output signal of the control module in the voltage control mode. When the signal generation channel is in the current analog output state, the electrical parameter control circuit generates a corresponding current electrical signal as the current analog signal in response to the output signal of the control module in the current control mode.

4. The signal generation device according to claim 2, characterized in that, The signal generation channel also includes a digital quantity generation circuit; The digital signal generation circuit is used to: when the signal generation channel is in the digital output state, use the electrical signal generated by the electrical parameter control circuit as the power source, and generate the digital signal in response to the output signal of the control module under the power supply of the power source, wherein the power source is a voltage source or a current source.

5. The signal generation device according to claim 4, characterized in that, The electrical parameter control circuit is configured to switch between voltage control mode and current control mode. The digital output states include: a voltage digital output state for outputting a voltage digital signal through the channel output terminal, and a current digital output state for outputting a current digital signal through the channel output terminal. When the signal generation channel is in the voltage digital output state, the electrical parameter control circuit is in the voltage control mode, which is used to generate an electrical signal of the corresponding voltage as the voltage source. When the signal generation channel is in the current analog output state, the electrical parameter control circuit is in the current control mode, which is used to generate an electrical signal of the corresponding current as the current source.

6. A testing system, characterized in that, Includes a host computer and the signal generation device according to any one of claims 1 to 5; The signal generation device is connected between the host and the target object; the control module is used to obtain the information to be sent from the host or to generate the basic information to be sent, and to feed back the simulation test signal representing the information to be sent to the target object through the signal generation channel. The simulation test signal includes the analog signal and / or the digital signal. The target object includes: the device under test and / or auxiliary devices used for testing.

7. The testing system according to claim 6, characterized in that, When performing the first test task, at least one of the plurality of signal generation channels is in a first state, which is used to send the first information to be sent to the first target object corresponding to the first test task through the first type of signal. When performing the second test task, the target signal generation channel is in a second state, which is used to send the second information to be sent to the second target object corresponding to the first test task through the second type of signal; Wherein, the first state and the second state are different states among the plurality of states.

8. The testing system according to claim 6, characterized in that, It also includes a selective switching device and a signal acquisition channel; the selective switching device is connected to the signal generation channel and the signal acquisition channel; the selective switching device is also directly or indirectly connected to the target object through a universal connection part; The general connection unit is used to: connect the signal output line of the third target object corresponding to the third test task when performing the third test task; and connect the signal input line of the fourth target object corresponding to the fourth test task when performing the fourth test task. The selective connection device is used to: connect the general connection unit to the signal acquisition channel when performing the third test task, so that the information to be reported sent by the third target object can be transmitted to the host through the signal acquisition channel; and connect the general connection unit to the signal generation channel when performing the fourth test task, so that the corresponding information to be sent can be transmitted to the fourth target object through the signal generation channel.

9. The testing system according to claim 6, characterized in that, It also includes a selective switching device, a universal connection part, and a bus interaction channel; the selective switching device is connected between the universal connection part, the signal generation channel, and the bus interaction channel; The general connection unit is used to: connect the bus interaction line of the fifth target object to be tested in the fifth test task when performing the fifth test task, and connect the signal input unit of the sixth target object to be tested in the sixth test task when performing the sixth test task; The selective connection device is used to connect the general connection unit to the bus interaction channel when performing the fifth test task, so that the host can communicate with the fifth target object using the bus interaction channel. When performing the sixth test task, the general connection unit is connected to the signal generation channel, so that the corresponding information to be sent can be transmitted to the sixth target object through the signal generation channel.

10. A testing method, characterized in that, include: The state of the designated signal generation channel in the signal generation device according to any one of claims 1 to 5 is configured as follows: matching the designated signal type of the designated signal input line of the target object; the designated signal generation channel is a signal generation channel that needs to be directly or indirectly connected to the designated signal input section during the test process; During the testing of the target object, the host sends the information to be sent or the basic information used to generate the information to be sent to the designated signal generation channel, so that the information to be sent is transmitted from the designated signal generation channel to the designated signal input line in the form of the designated signal type.

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