A porcelain insulator state identification method and system
By acquiring surface features of porcelain insulators using an image sensor, filtering out coordinates with brightness below a set level, linearly fitting the center points of the stripes, and generating an ideal projection reference, the problem of decreased accuracy and external interference in porcelain insulator condition identification in existing technologies is solved, and precise defect location is achieved.
CN122336352APending Publication Date: 2026-07-03PINGXIANG ZHONGWEI ELECTRIC CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- PINGXIANG ZHONGWEI ELECTRIC CO LTD
- Filing Date
- 2026-04-07
- Publication Date
- 2026-07-03
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Figure CN122336352A_ABST
Abstract
This invention relates to the field of pattern recognition technology, specifically to a method and system for identifying the state of porcelain insulators. The method includes the following steps: collecting pixel features from the surface of the porcelain insulator, screening and establishing a bright coordinate sequence, extracting a set of stripe center points, linearly fitting the horizontal and vertical coordinates to generate an ideal projection reference, comparing the deviation span with the damage boundary, locating surface defects, and obtaining the identification result. In this invention, by screening pixel features according to a set boundary to establish a bright coordinate sequence, integrating the sequence to extract a set of stripe center point coordinates, performing linear fitting on the horizontal and vertical coordinates of the center points to generate an ideal stripe projection reference, comparing the deviation span of each coordinate from the reference, and filtering out two-dimensional row and column coordinates exceeding the judgment limit, the comparison mechanism of directly constructing an ideal projection reference from the bright feature structure of the porcelain insulator effectively avoids external background interference and the drawbacks of overall texture averaging, enhancing the sensitivity of porcelain insulator state identification and achieving accurate location of the actual distribution of surface defects.
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