This invention discloses a
semiconductor visual inspection light source based on dual-band polarization coordination, comprising a fixed plate, a
first light source plate mounted at one end of the fixed plate, a
blue light source component mounted on the
first light source plate, a first optical plate mounted at one end of the
first light source plate, a diffuse optical component mounted on the first optical plate, a middle partition plate mounted at one end of the middle partition plate, a second
light source plate mounted at one end of the middle partition plate, a
red light source component mounted on the second
light source plate, and a second optical plate mounted at one end of the second light source plate, a polarization optical component mounted on the second optical plate. Observation windows are provided through the fixed plate, the first light source plate, the first optical plate, the middle partition plate, the second light source plate, and the second optical plate. It achieves dual-band polarization coordination through the combination of a
blue light source component and a diffuse optical component, and a
red light source component and a polarization optical component, effectively avoiding
crosstalk between the two light sources and simultaneously realizing surface imaging, subsurface structure imaging, and strong
metal reflection suppression.