Industrial detection methods, apparatuses, devices, products, and storage media
CN122335705APending Publication Date: 2026-07-03SHENZHEN INSTITUTE OF INFORMATION TECHNOLOGY
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN INSTITUTE OF INFORMATION TECHNOLOGY
- Filing Date
- 2026-03-27
- Publication Date
- 2026-07-03
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Figure CN122335705A_ABST
Abstract
This application discloses an industrial inspection method, apparatus, equipment, product, and storage medium, relating to the field of industrial vision inspection technology. The method includes: responding to an industrial inspection command, acquiring an image to be inspected for membrane defects; processing the image using a preset defect detection model to obtain a defect detection result. The preset defect detection model is obtained by quantizing a target defect detection model, which is obtained by structural pruning and lightweight reconstruction of an initial defect detection model. The structural pruning and lightweight reconstruction are used to reduce the number of model parameters and computational load. This application reduces the number of model parameters and computational load through structured pruning and lightweight reconstruction, and then quantizes the model, enabling the quantized model to be deployed on edge devices while improving the model's inference efficiency, achieving efficient model compression and real-time inference.
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