Closed stock bin material level detection method and device
By combining dynamic baseline tracking, multi-frame fluctuation suppression algorithm and spectrum analysis with light source self-calibration, the signal interference and anomaly identification problems of optical level gauges in solid silos have been solved, achieving high-precision and stable level detection and control.
Patent Information
- Application Number
- CN202610621549.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-08
- Publication Date
- 2026-07-10
AI Technical Summary
Existing optical level gauges are susceptible to signal fluctuations and frequent false triggers due to dust interference in solid silos. Uneven material surfaces cause measurement fluctuations, and long-term operation can lead to light source attenuation and measurement drift. Furthermore, they cannot identify abnormal material conditions, resulting in low control accuracy of automatic feeding systems, frequent start-stop of actuators, and even overflow or material interruption.
The system employs dynamic baseline tracking and multi-frame fluctuation suppression algorithms to filter out interference, identifies abnormal material states through spectrum analysis, and combines a light source self-calibration mechanism and multi-level threshold control to achieve adaptive material level detection.
It improves the accuracy and stability of material level detection, reduces false triggering and signal jumps, ensures that the measurement error is within ±1% during long-term operation, avoids the risk of material overflow and material interruption, and extends the life of the actuator.