Mutant gene detection method
By using a specific fluorescently labeled base extension reaction method, the problems of insufficient cost and sensitivity in the prior art are solved, and high-sensitivity and multiplexed gene mutation detection is achieved, especially the measurement of gene mutation rate without omission under low-cost conditions.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HITACHI HIGH TECH CORP
- Filing Date
- 2023-12-18
- Publication Date
- 2026-07-10
AI Technical Summary
Existing technologies struggle to achieve highly sensitive and multiplexed gene mutation detection while keeping costs down, particularly in measuring mutation rates without omissions, especially in low-cost multiplex mutation detection where omissions are difficult to avoid.
The base extension reaction method employs a first pigment group and a second pigment group respectively, wherein one of the AT in the first pigment group is not fluorescently labeled and GC is fluorescently labeled, and one of the GC in the second pigment group is not fluorescently labeled and AT is fluorescently labeled, and the base extension reaction stops at the unlabeled base but stops at the fluorescently labeled base.
It enables comprehensive and complete measurement of gene mutation rates while suppressing costs, improves detection sensitivity, can detect mutation rates down to 1%, and avoids omissions in multiplex detection.
Smart Images
Figure CN122374465A_ABST