A method and system for integrated testing of an aircraft landing gear and a hatch
By acquiring historical data to adjust the test environment, decomposing tasks to generate integrated test plans and injecting faults, the coordination problem of the landing gear and door integrated test system was solved, test efficiency and parameter optimization were achieved, and the overall test effect was improved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIJING QTCREATE TECH
- Filing Date
- 2026-04-23
- Publication Date
- 2026-07-17
AI Technical Summary
Existing landing gear and door integrated test system solutions lack coordination and are difficult to dynamically optimize control parameters, resulting in low test efficiency.
By acquiring historical integrated test data, adjusting test environment information, decomposing test tasks into sub-tasks, generating integrated test schemes, performing fault injection and load spectrum analysis, and adjusting control commands based on changes in loading data, the test schemes are optimized.
The test efficiency and scheme coordination of the landing gear and door integration test system were improved, the control parameters were optimized, and the overall test efficiency was enhanced.
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Figure CN122402804A_ABST