A method, system, and readable storage medium for measuring a refractive index ellipsoid of a conoscopic polarimetry crystal
By employing a conical polarization interferometry method, combined with Mach-Zehnder interferometry and polarization interferometry, the problems of measurement complexity and poor stability in traditional methods are solved. This method enables accurate refractive index measurement and analysis of external force effects in birefringent crystals, and is suitable for precision measurement and optical system optimization.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIJING JIAOTONG UNIV
- Filing Date
- 2026-04-03
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies make it difficult to easily and accurately measure the principal refractive indices of ordinary and extraordinary rays in birefringent crystals. Furthermore, traditional methods are complex to operate, have poor stability, and are difficult to simultaneously measure the refractive index of birefringent crystals.
The conical polarization interferometry method is adopted, which combines the Mach-Zehnder interferometer system and the polarization interferometer system. A diverging linearly polarized beam is generated through a conical light source to measure the refractive index of ordinary and extraordinary light in the crystal. The interference fringe image is recorded using a high-resolution camera, and the optical path difference is calculated by fitting the radius using data processing software. Finally, a refractive index ellipsoid is constructed.
It enables simple and accurate measurement of the refractive index of birefringent crystals, improves measurement accuracy, supports the analysis of external forces and environmental influences, and is suitable for precision measurement and optical system optimization.
Smart Images
Figure CN122409581A_ABST