A method and apparatus for microscope operation analysis based on trajectory similarity
By constructing object operation trajectories and identifying multidimensional error vectors, the problem of quantitative analysis of continuous actions in microscope operation was solved, and accurate output of multidimensional analysis and improvement suggestions was achieved.
CN122412980APending Publication Date: 2026-07-17MOTIC CHINA GROUP CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- MOTIC CHINA GROUP CO LTD
- Filing Date
- 2026-04-20
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing technologies cannot fully characterize and quantify the continuous actions during microscope operation, making it difficult to achieve multi-dimensional analysis.
Method used
By collecting microscope operation behavior data, the object operation trajectory is constructed, and the multidimensional error vector is identified by trajectory similarity to determine the operation error type and output improvement suggestions.
Benefits of technology
It enables multi-dimensional analysis of the microscope operation process, provides precise improvement suggestions, and enhances the accuracy and standardization of evaluation.
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Figure CN122412980A_ABST
Abstract
本发明公开了一种基于轨迹相似度的显微镜操作分析方法和装置，方法包括采集针对显微镜的操作行为数据并进行时间对齐，构建对象操作轨迹；根据对象操作轨迹与预设的标准操作轨迹进行相似度偏差识别，生成多维误差向量；基于多维误差向量和多个典型错误模板之间的错误相似度，确定操作错误类型；按照操作错误类型匹配对应的改进建议信息并输出，从而基于连续轨迹的相似度偏差，准确有效地实现器件操作过程的多维度分析。
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