Panel anomaly detection method and apparatus, electronic device, and storage medium
By preprocessing and clustering the display screen images, structural family prototypes are determined for anomaly scoring, solving the accuracy problem of panel anomaly detection in existing technologies and achieving efficient panel anomaly detection and interpretable detection results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- ZHONGJIA MICROVISION (SHENZHEN) SEMICONDUCTOR TECHNOLOGY CO LTD
- Filing Date
- 2026-03-19
- Publication Date
- 2026-07-17
AI Technical Summary
The accuracy of existing technologies in detecting panel anomalies during display manufacturing is affected by fluctuations in processes, materials, and structures, leading to false positives and false negatives. In particular, detection methods based on fixed templates are highly sensitive, while methods based on labeled data are difficult to transfer across batches.
By preprocessing the panel image, standard image patches with the same size, angle, and phase are obtained. Multi-channel structural features are extracted and clustered to determine the prototype of the structural family. Anomaly scoring is performed based on the prototype, and the location information and evidence package of the abnormal region are output to achieve interpretability of the detection results.
It improves the accuracy of panel anomaly detection, reduces false detections and missed detections, and avoids detection errors caused by process, material and structural fluctuations by replacing fixed templates with structural family prototypes, thereby improving the interpretability of detection results.
Smart Images
Figure CN122415445A_ABST