Chip detection method and device, and related equipment
By adjusting the parameters of the Wi-Fi chip to generate a low duty cycle radio frequency signal and performing detection, the problem of poor testing results in low duty cycle environments in existing technologies has been solved, enabling the detection of defective chips and improving detection accuracy and product quality.
CN122419643APending Publication Date: 2026-07-17HEFEI BOE VIDEO TECH CO LTD +1
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HEFEI BOE VIDEO TECH CO LTD
- Filing Date
- 2026-05-29
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing technologies have poor performance in testing Wi-Fi chips in low duty cycle environments, and cannot effectively detect chips with poor performance.
Method used
By adjusting the parameters of the chip under test to generate an RF signal with a lower non-signaling duty cycle than the original, and then detecting these signals, a Wi-Fi signaling scenario in a low-temperature environment is simulated to determine whether the chip is defective.
Benefits of technology
The detection of defective chips has been improved, the accuracy of detection has been enhanced, the quality of the final product has been ensured, and chips with poor performance have been screened out in advance.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN122419643A_ABST
Abstract
本申请提供一种芯片的检测方法、装置及相关设备，本申请的技术方案，在需要对待检测芯片进行检测时，对待检测芯片的第一参数的取值进行调整，从而使得待检测芯片生低于原有射频信号的占空比的第二射频信号，由此对第二射频信号进行检测，从而判断待检测芯片是否为不良芯片，由此通过低占空比测试来模拟低温环境下的Wi‑Fi信令场景，完善了对不良芯片的检测。
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