Fast calibration system and method for non-contact distributed fault location device
By extending Kalman filter modeling and dynamically adjusting the test strategy, the problems of wasted test resources and insufficient error detection in existing fault location device verification methods are solved, and efficient and accurate fault location device verification is achieved.
Patent Information
- Application Number
- CN202611068843.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2026-07-17
- Publication Date
- 2026-09-15
- Estimated Expiration
- 2046-07-17
AI Technical Summary
Existing fault location device verification methods cannot dynamically adjust the test range and step size, resulting in redundant testing in low-risk areas and insufficient testing in high-risk areas. Furthermore, they lack error evolution modeling, which affects verification efficiency and reliability.
An extended Kalman filter is used to establish an error state model. High-risk areas are identified through error state estimation, and second-stage test cases are automatically generated. The test range and step size are dynamically adjusted, and the test process is optimized by combining error gradient and model uncertainty.
It improved the utilization rate of testing resources, enhanced the ability to find error extreme points, improved the accuracy and reliability of verification results, reduced redundant testing, and improved verification efficiency.