The utility model relates to the technical field of
semiconductor testing, in particular to a testing socket. The test socket comprises a mounting frame, a matching seat and a probe, the matching seat is fixed in the mounting frame, a stepped through hole is formed in the matching seat, the probe is accommodated in the stepped through hole, the stepped through hole comprises a limiting part and an adjusting part, the inner
diameter of the limiting part is matched with the inner
diameter of the probe, and the inner
diameter of the adjusting part is larger than that of the limiting part. The gap between the adjusting part and the probe is configured to reduce the
dielectric constant value of the test socket, the impedance of the
semiconductor chip to be tested is in direct proportion to the
axial length of the adjusting part and / or the inner diameter of the adjusting part, and the air in the gap between the adjusting part and the probe is utilized to reduce the overall
dielectric constant value of the test socket. The
axial length and / or the inner diameter of the adjusting part in the through hole of the connector can be adjusted according to actual requirements, the
dielectric constant value of the test socket can be adjusted, and compared with the mode of arranging test sockets of various test specifications in the prior art, the production cost is reduced.