Method, apparatus and computer program product for high speed memory testing

Abstract

For testing a device under test (“DUT”) a test specification is converted in a computer system by a pin vector generator process, which includes generating test vectors. The DUT has numerous input pins and such a pin vector is for a signal to drive one such pin. The pin vectors are compressed and saved. Ones of the pin vectors are loaded, upon initialization of a test, into a pipeline having a series of memory stages and extending from the computer system to channel cards in a test head. The pipeline is operated in data transfer cycles, delivering W bits per cycle. The pin vectors are decompressed at the respective channel cards in decompressor read cycles. X bits are read per decompressor cycle, W being greater than X, so that the pipeline may perform its data transfer cycles less frequently than the decompressor performs its read cycles.

Description

BACKGROUND [0001] 1. Field of the Invention [0002] The present invention concerns testing of very large scale integrated-circuitry (“VLSI”) devices, and, more particularly, concerns high speed testing of such devices using test patterns. [0003] 2. Related Art [0004] Referring now to FIG. 1, a conventional test system 100 is shown for testing very large scale integrated circuitry (“VLSI”) devices, such as memory devices, application specific integrated circuits (“ASIC's”), and microprocessors. The test system 100 (also referred to herein as a “tester”) includes a main frame 120, a test head 130 and a product handler 140. A computer system 110 is used as an interface between an operator and the tester 100. The interface is used to control the tester 100, to load test programs into the main frame 120, to start testing, to collect test results, etc. [0005] Referring now to FIG. 2, details are shown of the test head 130 of the prior art test system 100. The test head 130 includes a housi...

AI Technical Summary

Benefits of technology

[0016] The foregoing need is addressed in the present invention. A process of the present invention (referred to herein as a pin vector generator or a bit vector generator) strips out patterns for each individual DUT signal pin (address pin, data pin, etc.) from conventional full-width test vectors. These full-width test vectors are from test patterns produced by a conventional test program. (They are referred to as full-width test vectors because they have widths equal to the whole address and data field width of the DUT.) The slicing of the conventional full-width test vectors by the...

Problems solved by technology

However, the patterns are all limited by the constraints of the ALU architecture.

That is, although such an ALU is programmable, the patterns that the ALU can generate still are not without substantial constraints because the ALU is designed for a certain limited set of op codes.

However, there is still a problem of synchronizing all the cards 131, which may number even in the hundreds.

This is a considerable problem at high ...

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