Imaging light path debugging device

Abstract

The utility model relates to an imaging light path debugging device. An imaging optical path debugging device comprises a first mounting seat, an imaging optical element, a second mounting seat and a debugging optical element. The imaging optical element is arranged on the first mounting seat in a penetrating manner along a first direction; the second mounting seat is arranged opposite to the first mounting seat along the first direction, and the debugging optical element is arranged on one side, facing the first mounting seat along the first direction, of the second mounting seat; the debugging light source is arranged on the side, away from the first mounting base, of the second mounting base. Wherein the first mounting seat and the second mounting seat are connected along a first direction, so that the imaging optical element penetrates through one end of the first mounting seat to abut against the debugging optical element along the first direction, and a first optical axis of the imaging optical element and a second optical axis of the debugging optical element are overlapped with each other. The imaging light path debugging device can be used for improving the light path debugging precision of imaging light path debugging.

Description

Technical Field

[0001] The present application relates to the technical field of gene sequencers, and in particular to an imaging optical path debugging device. Background Art

[0002] The imaging components used in gene sequencers include imaging optical elements, etc. Before the imaging components are used, it is usually necessary to use debugging optical elements to adjust the imaging optical path of the imaging optical elements. However, the optical path debugging accuracy of traditional imaging optical path adjustment devices is low. Utility Model Content

[0003] Based on this, it is necessary to provide an imaging optical path debugging device to address the problem of low optical path debugging accuracy of traditional imaging optical path adjustment devices.

[0004] The present application provides an imaging optical path debugging device, comprising:

[0005] a first mounting seat;

[0006] An imaging optical element is arranged on the first mounting seat along a first direction, and the imaging optical element has a first optical axis arranged along the first direction;

[0007] a second mounting seat and a debugging optical element, wherein the second mounting seat is arranged opposite to the first mounting seat along the first direction, and the debugging optical element is arranged on a side of the second mounting seat facing the first mounting seat along the first direction; the debugging optical element has a second optical axis;

[0008] A debugging light source is arranged on a side of the second mounting seat away from the first mounting seat; a debugging light through hole for at least partially exposing the debugging optical element is arranged on a side of the second mounting seat facing the debugging light source;

[0009] Wherein, the first mounting seat and the second mounting seat are connected along the first direction, so that one end of the imaging optical element passing through the first mounting seat is against the debugging optical element along the first direction, and the first optical axis of the imaging optical element and the second optical axis of the debugging optical element are arranged to coincide with each other.

[0010] In one embodiment, the first mounting seat and the second mounting seat are connected along the first direction by means of magnetic attraction or clamping; or

[0011] The first mounting seat and the second mounting seat are connected along the first direction via a first elastic member.

[0012] In one embodiment, the imaging optical path debugging device further includes a first magnetic attraction member disposed on the first mounting seat, and a second magnetic attraction member disposed on the second mounting seat;

[0013] The first mounting seat and the second mounting seat are connected along the first direction by means of the first magnetic attraction member and the second magnetic attraction member.

[0014] In one embodiment, the first magnetic attraction member includes two magnetic attraction parts symmetrically arranged with the first optical axis as a reference object;

[0015] The imaging optical path debugging device includes two groups of magnetic attraction components corresponding to the magnetic attraction parts one by one, and each of the magnetic attraction components includes at least one second magnetic attraction part.

[0016] In one embodiment, the magnetic attraction component further includes an adjusting member, which is passed through the corresponding second magnetic attraction member along the first direction, and one end of the adjusting member passing through the corresponding second magnetic attraction member is movably provided on the second mounting seat along the first direction.

[0017] In one embodiment, a side of the second mounting seat facing the first mounting seat is provided with a plurality of step grooves corresponding to the magnetic attraction components one by one;

[0018] The magnetic attraction component also includes a second elastic member, and the second elastic member is arranged between the corresponding second magnetic attraction member and the corresponding step surface of the step groove.

[0019] In one embodiment, the first mounting seat is provided with a plug-in slot adapted to the first magnetic component, and the plug-in slot has a notch arranged along the first direction to expose the first magnetic component so that the first magnetic component is magnetically connected to the corresponding second magnetic component.

[0020] In one embodiment, the first magnetic attraction member includes two magnetic attraction parts symmetrically arranged around the first optical axis, and hand-held parts respectively connected to the two magnetic attraction parts;

[0021] The first mounting seat is provided with two plug-in slots which are matched one by one with the two magnetic attraction parts.

[0022] In one embodiment, the second mounting seat includes a first mounting portion and two second mounting portions arranged along the first direction on a side of the first mounting portion facing the first mounting seat;

[0023] The two second mounting portions are spaced apart along the second direction;

[0024] The debugging light via hole is provided on the first mounting portion, the debugging optical element is provided on the first mounting portion, and is arranged toward the debugging light via hole, and is limited to be located between two second mounting portions along the second direction;

[0025] The first direction and the second direction are perpendicular to each other.

[0026] In one embodiment, the second mounting seat is provided with a mounting groove which is arranged around the debugging light via and communicated with the debugging light via;

[0027] The debugging optical element is arranged on the bottom wall of the mounting groove so as to abut against the imaging optical element along the first direction when the first mounting seat and the second mounting seat are connected along the first direction.

[0028] In the technical solution of the present application, the imaging optical element can be passed through the first mounting seat along the first direction and pass through the first mounting seat along the first direction, and then the debugging optical element is set on the side of the second mounting seat facing the first mounting seat along the first direction, and then the first mounting seat and the second mounting seat are connected along the first direction, so that one end of the imaging optical element passing through the first mounting seat can be against the debugging optical element along the first direction, and the first optical axis of the imaging optical element and the second optical axis of the debugging optical element are arranged to coincide with each other, and finally the direction of the incident light emitted by the debugging light source is adjusted, the incident light can be incident on the debugging optical element through the debugging light via hole, and then reflected back by the debugging optical element, if the reflected light reflected back by the debugging optical element (i.e., the reflective lens) coincides with the incident light, it is judged that the imaging light is perpendicular to the imaging optical element (i.e., the tube lens), which indicates that the imaging light path debugging is completed. Because in the imaging optical path debugging device of the present application, the first mounting seat and the second mounting seat can be installed so that one end of the imaging optical element passing through the first mounting seat can be abutted against the debugging optical element along the first direction, and the first optical axis of the imaging optical element and the second optical axis of the debugging optical element can be overlapped with each other. Since the imaging optical element and the debugging optical element are installed in a direct fitting manner, and the debugging optical element does not contact the first mounting seat, and the imaging optical element does not contact the second mounting seat, the influence of the processing accuracy of the first mounting seat and the second mounting seat themselves on the imaging optical path debugging is reduced, so that the factors affecting the imaging optical path debugging are reduced to the processing accuracy of the imaging optical element and the debugging optical element themselves. Therefore, the imaging optical path debugging device can be used to improve the optical path debugging accuracy of the imaging optical path debugging. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] FIG. 1 shows a schematic structural diagram of an imaging optical path debugging device in an embodiment of the present application.

[0030] FIG. 2 shows an exploded schematic diagram of an imaging optical path debugging device in an embodiment of the present application.

[0031] FIG. 3 shows an exploded schematic diagram of a second mounting base and a magnetic attraction assembly in an embodiment of the present application.

[0032] Reference numerals:

[0033] 10. Imaging optical path debugging device;

[0034] 110, first mounting seat; 1101, plug-in slot; 1102, plug-in interface; 1103, opening; 1104, mounting hole;

[0035] 120. Imaging optical elements;

[0036] 130, second mounting seat; 131, first mounting portion; 132, second mounting portion; 1301, debugging light through hole; 1302, step groove; 1303, threaded hole; 1304, mounting groove; 1305, glue groove; 133, limit step;

[0037] 140. Debug optical components;

[0038] 150. Debug the light source;

[0039] 160, first magnetic attraction member; 161, magnetic attraction portion; 162, hand-held portion; 163, connecting portion; 164, finger through hole;

[0040] 170, magnetic attraction component; 171, second magnetic attraction component; 1711, step via; 172, adjustment component; 173, second elastic component. DETAILED DESCRIPTION

[0041] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0042] In the description of the present application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.

[0043] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0044] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0045] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0046] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only implementation method.

[0047] After research, it was found that during the imaging optical path debugging process, the debugging optical element needs to be fixed on the lens holder, and then the end face of the lens holder is fixed on the imaging optical element. As a result, the processing accuracy of the imaging optical element, the debugging optical element itself and the processing accuracy of the lens holder itself will affect the optical path debugging accuracy. This will lead to many factors affecting the optical path debugging accuracy, which in turn leads to low optical path debugging accuracy of traditional imaging optical path debugging devices.

[0048] Based on this, the present application designs an imaging optical path debugging device, aiming to solve the problem of low optical path debugging accuracy of traditional imaging optical path debugging devices.

[0049] FIG. 1 shows a schematic structural diagram of an imaging optical path debugging device 10 in an embodiment of the present application, and FIG. 2 shows an exploded schematic diagram of the imaging optical path debugging device 10 in an embodiment of the present application.

[0050] Referring to FIG. 1 and FIG. 2 , an imaging optical path debugging device 10 provided in an embodiment of the present application includes a first mounting seat 110 , an imaging optical element 120 , a second mounting seat 130 and a debugging optical element 140 .

[0051] The imaging optical element 120 may be a tube lens, and the debugging optical element 140 may be a reflective lens. The debugging optical element 140 is used to adjust the imaging optical path of the imaging optical element 120 .

[0052] Generally, the optical path debugging starts with the imaging optical path debugging, that is, the optical path debugging of the tube lens and the reflective lens. The debugged imaging optical path is used as the basis for debugging other optical paths. Therefore, the debugging accuracy of the imaging optical path will ultimately affect the imaging quality of the image. In the process of debugging the imaging optical path, the above-mentioned tube lens and the reflective lens need to be set in front of the camera in sequence, and then an incident light is emitted using the debugging light source 150. If the reflected light reflected by the reflective lens coincides with the incident light, it is determined that the imaging light is perpendicular to the tube lens, indicating that the imaging optical path debugging is completed.

[0053] The imaging optical element 120 is disposed on the first mounting seat 110 along the first direction F1, and the imaging optical element 120 has a first optical axis disposed along the first direction F1. The second mounting seat 130 is disposed opposite to the first mounting seat 110 along the first direction F1, and the debugging optical element 140 is disposed on a side of the second mounting seat 130 facing the first mounting seat 110 along the first direction F1, and the debugging optical element 140 has a second optical axis.

[0054] The first mounting seat 110 and the second mounting seat 130 are connected along the first direction F1, so that one end of the imaging optical element 120 passing through the first mounting seat 110 abuts against the debugging optical element 140 along the first direction F1, and the first optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 are arranged to coincide with each other. The debugging light source 150 is arranged on a side of the second mounting seat 130 away from the first mounting seat 110, and a debugging light through hole 1301 for at least partially exposing the debugging optical element 140 is provided on a side of the second mounting seat 130 facing the debugging light source 150.

[0055] The imaging optical path debugging device 10 of the present application can be used to install the imaging optical element 120 on the first mounting seat 110 along the first direction F1, and then install the debugging optical element 140 on the second mounting seat 130 along the first direction F1 toward the side of the first mounting seat 110, and then connect the first mounting seat 110 and the second mounting seat 130 along the first direction F1. In this way, the imaging optical element 120 can pass through one end of the first mounting seat 110 and connect with the debugging optical element 140 along the first direction F1. The optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 are offset from each other, and the first optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 are arranged to coincide with each other. Finally, the direction of the incident light emitted by the debugging light source 150 is adjusted. The incident light can be incident on the debugging optical element 140 through the debugging light via 1301, and then reflected back by the debugging optical element 140. If the reflected light reflected back by the debugging optical element 140 (i.e., the reflecting lens) coincides with the incident light, it is determined that the imaging light is perpendicular to the imaging optical element 120 (i.e., the tube lens), indicating that the imaging light path debugging is completed. Since in the imaging optical path debugging device 10 of the present application, the imaging optical element 120 can pass through one end of the first mounting seat 110 and abut against the debugging optical element 140 along the first direction F1 through the installation of the first mounting seat 110 and the second mounting seat 130, and the first optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 are made to coincide with each other, and since the imaging optical element 120 and the debugging optical element 140 are installed in a direct fitting manner, and the debugging optical element 140 does not contact the first mounting seat 110, and the imaging optical element 120 does not contact the second mounting seat 130, the influence of the processing accuracy of the first mounting seat 110 and the second mounting seat 130 on the imaging optical path debugging is reduced, so that the factors affecting the imaging optical path debugging are reduced to the processing accuracy of the imaging optical element 120 and the debugging optical element 140 themselves. Therefore, the imaging optical path debugging device 10 can be used to improve the optical path debugging accuracy of the imaging optical path debugging.

[0056] In some embodiments, the first mounting base 110 and the second mounting base 130 are connected along the first direction F1 by magnetic attraction or snap connection.

[0057] Alternatively, the first mounting seat 110 and the second mounting seat 130 are connected along the first direction F1 by means of a snap connection.

[0058] In this way, the connection strength between the first mounting seat 110 and the second mounting seat 130 can be improved, and it is also convenient to replace the first mounting seat 110 and / or the second mounting seat 130 as needed.

[0059] Alternatively, the first mounting seat 110 and the second mounting seat 130 are connected along the first direction F1 by magnetic attraction.

[0060] It can be that one of the first mounting seat 110 and the second mounting seat 130 is provided with a magnet, and the other includes a magnetic material or is provided with a magnetic member. For example, the first mounting seat 110 is made of magnetic steel, and the second mounting seat 130 is provided with a magnet; for another example, the first mounting seat 110 is provided with a magnetic member, and the second mounting seat 130 is provided with a magnet. No specific limitation is made here.

[0061] In this way, the first mounting seat 110 and the second mounting seat 130 can be connected to each other by means of magnetic attraction in the air, and the connection accuracy between the first mounting seat 110 and the second mounting seat 130 has a higher tolerance for the processing accuracy of the first mounting seat 110 and the second mounting seat 130 themselves, which is beneficial to further reduce the influence of the processing accuracy of the first mounting seat 110 and the second mounting seat 130 themselves on the imaging optical path debugging, and can improve the optical path debugging accuracy of the imaging optical path debugging.

[0062] In some other embodiments, the first mounting seat 110 and the second mounting seat 130 are connected along the first direction F1 via a first elastic member.

[0063] For example, the first elastic member (not shown in the figure) may be a spring or a rubber band.

[0064] In this way, since a first elastic member is provided between the first mounting seat 110 and the second mounting seat 130, the first mounting seat 110 and the second mounting seat 130 do not contact each other, and the connection accuracy between the first mounting seat 110 and the second mounting seat 130 has a higher tolerance for the processing accuracy of the first mounting seat 110 and the second mounting seat 130 themselves, which is beneficial to further reduce the influence of the processing accuracy of the first mounting seat 110 and the second mounting seat 130 themselves on the imaging optical path debugging, and can improve the optical path debugging accuracy of the imaging optical path debugging.

[0065] In some embodiments, the imaging optical path debugging device 10 also includes a first magnetic component 160 disposed on the first mounting seat 110, and a second magnetic component 171 disposed on the second mounting seat 130. The first mounting seat 110 and the second mounting seat 130 are connected along the first direction F1 by means of the first magnetic component 160 and the second magnetic component 171.

[0066] In this way, the first mounting seat 110 and the second mounting seat 130 can be connected along the first direction F1 with the help of the first magnetic attraction component 160 and the second magnetic attraction component 171, and can be connected to each other along the first direction F1 by means of air-space magnetic attraction, so that the first mounting seat 110 and the second mounting seat 130 are arranged close to each other by magnetic attraction force, and the connection accuracy between the first mounting seat 110 and the second mounting seat 130 has a higher tolerance for the processing accuracy of the first mounting seat 110 and the second mounting seat 130 themselves, which is conducive to further reducing the influence of the processing accuracy of the first mounting seat 110 and the second mounting seat 130 themselves on the imaging optical path debugging, and can improve the optical path debugging accuracy of the imaging optical path debugging.

[0067] In some embodiments, please refer to Figure 2, the first magnetic member 160 includes two magnetic parts 161 symmetrically arranged with the first optical axis as a reference object, and the imaging optical path debugging device 10 includes two groups of magnetic components 170 corresponding to the magnetic parts 161 one by one, and each magnetic component 170 includes at least one second magnetic member 171.

[0068] The two magnetic attraction portions 161 are symmetrically arranged with the plane passing through the first optical axis as a reference object. The plane passing through the first optical axis may be perpendicular to the second direction F2 or the third direction F3, and correspondingly, the two magnetic attraction portions 161 are arranged at intervals along the second direction F2 or the third direction F3; for example, the plane passing through the first optical axis is perpendicular to the second direction F2, and correspondingly, the two magnetic attraction portions 161 are arranged at intervals along the second direction F2.

[0069] The first direction F1, the second direction F2 or the third direction F3 are perpendicular to each other. For example, the first direction F1 is parallel to the left-right direction, the second direction F2 is parallel to the front-back direction, and the third direction F3 is parallel to the up-down direction.

[0070] By using two magnetic attraction parts 161 which are symmetrically arranged with the first optical axis as a reference object, the first mounting seat 110 and the second mounting seat 130 can be aligned, which is also beneficial for the imaging optical element 120 on the first mounting seat 110 and the debugging optical element 140 of the second mounting seat 130 to be aligned with each other, so that the first optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 are arranged to coincide with each other, thereby improving the optical path debugging accuracy of the imaging optical path debugging.

[0071] In this embodiment, each magnetic attraction assembly 170 includes two second magnetic attraction members 171 spaced apart from each other along the third direction F3.

[0072] In this way, four groups of first magnetic members 160 and second magnetic members 171 can be used to better align the first mounting seat 110 and the second mounting seat 130, which is also beneficial for better aligning the imaging optical element 120 on the first mounting seat 110 and the debugging optical element 140 of the second mounting seat 130, thereby making the first optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 coincide with each other.

[0073] In this embodiment, referring to FIG. 3 , the magnetic assembly 170 further includes an adjusting member 172 , which is passed through the corresponding second magnetic member 171 along the first direction, and one end of the adjusting member 172 passing through the corresponding second magnetic member 171 is movably disposed on the second mounting base 130 along the first direction F1 .

[0074] In this way, the position of the adjusting member 172 on the second mounting seat 130 along the first direction F1 can be adjusted as needed, thereby driving the adjustment of the position of the second magnetic member 171 relative to the second mounting seat 130 along the first direction F1. The second magnetic member 171 can be closer to or farther away from the first magnetic member 160 on the first mounting seat 110 along the first direction F1, and the size of the magnetic force between the first magnetic member 160 and the corresponding second magnetic member 171 can be changed, so as to be suitable for optical path debugging of different types and gaps of different sizes.

[0075] In some embodiments, a plurality of step grooves 1302 corresponding one to one with the magnetic assembly 170 are provided on the side of the second mounting seat 130 facing the first mounting seat 110. The magnetic assembly 170 also includes a second elastic member 173, which is provided between the corresponding second magnetic member 171 and the step surface of the corresponding step groove 1302.

[0076] For example, the second elastic member 173 may be a spring or a disc spring. Of course, the second elastic member 173 may also be replaced by a metal bellows.

[0077] In this embodiment, the adjusting member 172 has an external thread, and a threaded hole 1303 matching the external thread is provided on the step surface of the step groove 1302. For example, the adjusting member 172 is a bolt, and the second magnetic member 171 has a step through hole 1711. The head of the bolt abuts against the step surface of the step through hole 1711 along the first direction, and a section of the bolt provided with an external thread passes through the step through hole 1711 and is threadedly connected to the threaded hole 1303.

[0078] In this way, the adjusting member 172 can be embedded in the second magnetic member 171 , which is beneficial for the second magnetic member 171 to be better magnetically connected to the corresponding first magnetic member 160 .

[0079] In some embodiments, the first mounting base 110 is provided with a plug-in slot 1101 adapted to the first magnetic member 160 , and the plug-in slot 1101 has a notch arranged along the first direction F1 to expose the first magnetic member 160 so that the first magnetic member 160 is magnetically connected to the corresponding second magnetic member 171 .

[0080] Optionally, the cross section of the plug slot 1101 perpendicular to the third direction F3 is T-shaped, L-shaped or trapezoidal. For example, the cross section of the plug slot 1101 perpendicular to the third direction F3 is T-shaped.

[0081] In this way, the convenience of disassembling and assembling the first magnetic member 160 relative to the first mounting base 110 can be improved, and the replacement of the first magnetic member 160 is also convenient.

[0082] In this embodiment, please refer to Figure 2, the first magnetic member 160 includes two magnetic parts 161 symmetrically arranged with respect to the first optical axis, and a hand-held part 162 respectively connected to the two magnetic parts 161, and the first mounting seat 110 is provided with two plug-in slots 1101 which are matched with the two magnetic parts 161 one by one.

[0083] In this way, on the one hand, the hand-held portion 162 can be used to improve the convenience of disassembly and assembly of the first magnetic component 160 relative to the first mounting seat 110; on the other hand, by utilizing the two magnetic portions 161 symmetrically arranged with the first optical axis as a reference object, the first mounting seat 110 and the second mounting seat 130 can be centered, which is also beneficial for the imaging optical element 120 on the first mounting seat 110 and the debugging optical element 140 of the second mounting seat 130 to be centered with each other, thereby making the first optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 coincide with each other, thereby improving the optical path debugging accuracy of the imaging optical path debugging.

[0084] In this embodiment, a plug-in port 1102 communicating with the plug-in slot 1101 is disposed on the top of the first mounting seat 110 , and the hand-held portion 162 is disposed on the top side of the magnetic attraction portion 161 .

[0085] In this way, when debugging the imaging light debugging device, the hand-held part 162 can be used to insert the magnetic part 161 of the first magnetic part 160 into the corresponding plug-in slot 1101 through the plug-in interface 1102, so that fast up and down plugging and unplugging and disassembly can be achieved, which is convenient to operate and is beneficial to reducing the operating space when installing the first magnetic part 160, facilitating the debugging of the imaging light path, and thus helping to improve the debugging efficiency.

[0086] In this embodiment, the first magnetic attraction member 160 also includes a connecting portion 163 located between the magnetic attraction portion 161 and the hand-holding portion 162, and a finger hole 164 is defined between the hand-holding portion 162 and the connecting portion 163. When the magnetic attraction portion 161 is inserted into the corresponding plug-in slot 1101, the connecting portion 163 abuts against a side of the first mounting seat 110 where the plug-in port 1102 is set.

[0087] In this way, the positioning accuracy of the first magnetic component 160 on the first mounting seat 110 can be improved, and the magnetic force between the first magnetic component 160 and the corresponding second magnetic component 171 can be better utilized to improve the centering degree of the second mounting seat 130 relative to the first mounting seat 110, which is beneficial to better make the first optical axis of the imaging optical element 120 and the second optical axis of the debugging optical element 140 coincide with each other, thereby improving the optical path debugging accuracy of the imaging optical path debugging.

[0088] Optionally, an opening 1103 communicating with the insertion slot 1101 is provided at the bottom of the first mounting seat 110 .

[0089] In some embodiments, please refer to Figure 3, the second mounting seat 130 includes a first mounting portion 131 and two second mounting portions 132 arranged on the side of the first mounting portion 131 facing the first mounting seat 110 along the first direction F1, the two second mounting portions 132 are arranged at intervals along the second direction F2, the debugging light via 1301 is arranged on the first mounting portion 131, the debugging optical element 140 is arranged on the first mounting portion 131, and is arranged toward the debugging light via 1301, and is limited between the two second mounting portions 132 along the second direction F2, and the first direction F1 and the second direction F2 are perpendicular to each other.

[0090] Illustratively, the first direction F1 is parallel to the left-right direction, and the second direction F2 is parallel to the front-back direction.

[0091] It can be understood that a limiting step 133 is defined between the first mounting portion 131 and the second mounting portion 132, and the debugging optical element 140 can be limited between the two second mounting portions 132 and limited between the two limiting steps 133. In this way, the displacement of the debugging optical element 140 along the second direction F2 can be limited, and the consistency of the installation position during repeated installation in the second direction F2 can be improved, and the installation error during repeated installation can be reduced, which is beneficial to improving the optical path debugging accuracy of the imaging optical path debugging.

[0092] In this embodiment, a mounting groove 1304 is provided on the first mounting portion 131, which is arranged around the debugging light via 1301 and connected to the debugging light via 1301. The debugging optical element 140 is arranged on the bottom wall of the mounting groove 1304 to abut against the imaging optical element 120 along the first direction F1 when the first mounting seat 110 and the second mounting seat 130 are connected along the first direction F1.

[0093] Compared to threading the debugging optical element 140 to the second mounting seat 130, in the present application, the mounting groove 1304 is recessed in the first mounting portion 131, and the space reserved between the imaging optical element 120 and the bottom wall of the mounting groove 1304 can be used as long as it is larger than the thickness of the reflector, which is beneficial to reducing the space occupied by the imaging optical path debugging device 10 along the first direction F1, and further beneficial to applying the imaging optical path debugging device 10 to an optomechanical structure with a relatively narrow installation space.

[0094] Specifically, the debugging optical element 140 is bonded to the bottom wall of the mounting groove 1304. For example, a glue groove 1305 connected to the mounting groove 1304 is concavely provided on the bottom wall of the mounting groove 1304, and glue can be set in the glue groove 1305, and then the debugging optical element 140 is placed on the bottom wall of the mounting groove 1304, and the glue in the glue groove 1305 is solidified, so that the debugging optical element 140 can be well bonded to the bottom wall of the mounting groove 1304.

[0095] Compared to threading the debugging optical element 140 to the second mounting seat 130, in the present application, the debugging optical element 140 is bonded to the bottom wall of the mounting groove 1304, which can avoid the need for a larger operating space due to the threaded installation method, and is conducive to the application of the imaging optical path debugging device 10 in an optical-mechanical structure with a relatively narrow installation space.

[0096] In some embodiments, referring to FIG. 1 , a mounting hole 1104 for mounting and fixing at a preset position is provided on the first mounting seat 110 , and the first mounting seat 110 can be fixed at the preset position by means of the mounting hole 1104 to facilitate debugging of the imaging optical path.

[0097] When the imaging optical path debugging device 10 of the present application is used, the magnetic part 161 of the first magnetic member 160 can be inserted into the corresponding plug-in slot 1101 through the plug-in interface 1102 through the hand-held part 162, which can realize quick up and down plugging and unplugging, and the operation is convenient, which is conducive to reducing the operating space when the first magnetic member 160 is installed, and facilitates the debugging of the imaging optical path, thereby helping to improve the debugging efficiency. The first mounting seat 110 and the second mounting seat 130 can be connected by magnetic attraction with the help of the first magnetic member 160 and the second magnetic member 171. The debugging optical element 140 can be directly attached to the imaging optical element 120 through the magnetic attraction between the first magnetic member 160 and the second magnetic member 171, which reduces the influence of the processing accuracy of the first mounting seat 110 and the second mounting seat 130 on the imaging optical path debugging, so that the factors affecting the imaging optical path debugging are reduced to the processing accuracy of the imaging optical element 120 and the debugging optical element 140. Therefore, the imaging optical path debugging device 10 can be used to improve the optical path debugging accuracy of the imaging optical path debugging.

[0098] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0099] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent application shall be subject to the attached claims.

Claims

1. An imaging optical path debugging device, characterized in that: include: a first mounting seat; An imaging optical element is arranged on the first mounting seat along a first direction, and the imaging optical element has a first optical axis arranged along the first direction; a second mounting seat and a debugging optical element, wherein the second mounting seat is arranged opposite to the first mounting seat along the first direction, and the debugging optical element is arranged on a side of the second mounting seat facing the first mounting seat along the first direction; the debugging optical element has a second optical axis; A debugging light source is arranged on a side of the second mounting seat away from the first mounting seat; a debugging light through hole for at least partially exposing the debugging optical element is arranged on a side of the second mounting seat facing the debugging light source; Wherein, the first mounting seat and the second mounting seat are connected along the first direction, so that one end of the imaging optical element passing through the first mounting seat is against the debugging optical element along the first direction, and the first optical axis of the imaging optical element and the second optical axis of the debugging optical element are arranged to coincide with each other.

2. The imaging optical path debugging device according to claim 1, characterized in that: The first mounting seat and the second mounting seat are connected along the first direction by means of magnetic attraction or clamping; or The first mounting seat and the second mounting seat are connected along the first direction via a first elastic member.

3. The imaging optical path debugging device according to claim 2, characterized in that: The imaging optical path debugging device further includes a first magnetic attraction member disposed on the first mounting seat, and a second magnetic attraction member disposed on the second mounting seat; The first mounting seat and the second mounting seat are connected along the first direction by means of the first magnetic attraction member and the second magnetic attraction member.

4. The imaging optical path debugging device according to claim 3, characterized in that: The first magnetic attraction member includes two magnetic attraction parts which are symmetrically arranged with the first optical axis as a reference object; The imaging optical path debugging device includes two groups of magnetic attraction components corresponding to the magnetic attraction parts one by one, and each of the magnetic attraction components includes at least one second magnetic attraction part.

5. The imaging optical path debugging device according to claim 4, characterized in that: The magnetic attraction component also includes an adjusting member, which is inserted into the corresponding second magnetic attraction member along the first direction, and one end of the adjusting member that passes through the corresponding second magnetic attraction member is movably arranged on the second mounting seat along the first direction.

6. The imaging optical path debugging device according to claim 5, characterized in that: A plurality of step grooves corresponding to the magnetic suction components are provided on one side of the second mounting seat facing the first mounting seat; The magnetic attraction component also includes a second elastic member, and the second elastic member is arranged between the corresponding second magnetic attraction member and the corresponding step surface of the step groove.

7. The imaging optical path debugging device according to claim 3, characterized in that: The first mounting seat is provided with an inserting slot adapted to the first magnetic attraction component, and the inserting slot has a notch arranged along the first direction to expose the first magnetic attraction component so that the first magnetic attraction component is magnetically connected to the corresponding second magnetic attraction component.

8. The imaging optical path debugging device according to claim 7, characterized in that: The first magnetic attraction member includes two magnetic attraction parts symmetrically arranged with respect to the first optical axis, and hand-held parts respectively connected to the two magnetic attraction parts; The first mounting seat is provided with two plug-in slots which are matched one by one with the two magnetic attraction parts.

9. The imaging optical path debugging device according to any one of claims 1 to 8, characterized in that: The second mounting seat comprises a first mounting portion and two second mounting portions arranged along the first direction on one side of the first mounting portion facing the first mounting seat; The two second mounting portions are spaced apart along the second direction; The debugging light via hole is provided on the first mounting portion, the debugging optical element is provided on the first mounting portion, and is arranged toward the debugging light via hole, and is limited to be located between two second mounting portions along the second direction; The first direction and the second direction are perpendicular to each other.

10. The imaging optical path debugging device according to claim 9, characterized in that: The second mounting seat is provided with a mounting groove which is arranged around the debugging light via hole and is in communication with the debugging light via hole; The debugging optical element is arranged on the bottom wall of the mounting groove so as to abut against the imaging optical element along the first direction when the first mounting seat and the second mounting seat are connected along the first direction.

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