Probe, contactor and processing device

Abstract

The utility model discloses a probe, a contactor and a processing device. The probe comprises a first body, a second body and a rotation structure. A first body having a contact surface defines a first direction through an extension trajectory. A second body connected to the first body extends in a second direction. The rotation structure with a rotation plane is arranged on the second body. Wherein the rotation plane coincides with a plane defined by the first direction and the second direction which intersect with each other. The first body and the second body are configured to synchronously rotate around the axis of the rotation structure, so that the contact surface is operated to leave the grid line or contact the grid line of the solar cell along the first direction to form electrical connection. The probe has a longer service life, and can form good and stable electric contact with a main grid line of a photovoltaic cell.

Description

Technical Field

[0001] The implementation mode of the utility model relates to the technical field of photovoltaic cell production equipment. Specifically, the application relates to a probe, a contactor and a processing device. Background Art

[0002] In the processing of solar cells, there are many production or testing processes that require electrical connection to the grid lines of the cells.

[0003] Meanwhile, when performing the above production or testing process, another process may be performed, such as EL testing (electrical connection and simultaneous photographing), electrical injection annealing (electrical connection and simultaneous illumination with a light source), power testing (electrical connection and simultaneous illumination), etc.

[0004] The industry uses probes to achieve the aforementioned electrical connection with the gate line. However, the needle body of the existing probe may be subjected to bending moment during use, which may cause the entire probe to bend and be damaged, and thus cannot be retracted, rebounded, or re-leaded out.

[0005] These situations result in a short service life of the probe, which requires frequent replacement and maintenance, thereby increasing the production cost of photovoltaic cells, and frequent maintenance is also very time-consuming. Utility Model Content

[0006] The present application aims to at least solve the problem of short service life and easy damage of the probe in the prior art. To this end, the example of the present application provides a probe, a contactor and a processing device for achieving electrical contact with the grid line of a solar cell for testing. The probe is not easily damaged during use, so it has a long service life and low cost.

[0007] The solution of this application example is implemented through the following contents.

[0008] In a first aspect, the present application describes a probe.

[0009] Probes include:

[0010] A first body in a first direction is defined by an extended trajectory and has a contact surface;

[0011] A second body connected to the first body and extending along a second direction; and

[0012] A rotating structure disposed on the second body and having a rotating plane;

[0013] The rotation plane coincides with a plane defined by the first direction and the second direction intersecting each other;

[0014] The first body and the second body are configured to rotate synchronously around the axis of the rotating structure, so that the contact surface is operated to leave the grid line, or to contact the grid line of the solar cell along the first direction to form an electrical connection.

[0015] By setting one end of the second body connected to the first body and the other end of the second body being rotatable, the first body for electrical contact moves along an arc to contact the battery sheet. Compared with the existing telescopic sleeve probe, the probe of the present application has a longer service life and significantly reduces maintenance costs.

[0016] Optionally, when projected along the first direction, the first body has a first pattern, the second body has a second pattern, and measured along the rotation axis direction of the rotation structure, the first width of the first pattern is greater than the second width of the second pattern; and / or the second body is in sheet shape, so as to reduce the shielding of the light received by the battery sheet in the vertical direction.

[0017] By setting the projection width of the second body to be smaller and the projection width of the first body to be larger, the shielding of the battery cell is significantly reduced, which is beneficial to the implementation of another process; at the same time, a better electrical contact effect is also guaranteed.

[0018] Optionally, to ensure stable contact with the end of the main grid line, the contact surface is a curved surface; or, the rotating structure is a hole, or a hole and a rotating part in the hole, and the contact surface is in stable contact with the end of the main grid line by operating its rotation; or, the probe described based on the above scheme is an L-shaped structure.

[0019] Optionally, the probe also includes: a third body extending in a direction parallel to the first direction, the first body being connected to the third body through the second body, so that the third body can more conveniently design and control the rotation amplitude or rotation angle of the probe to prevent the probe from exceeding the range of activity and accidentally interfering with other mechanisms.

[0020] Optionally, the first body, the second body and the third body are an integrated structure; and / or the probe is a Z-shaped structure; and / or the third body has a wiring portion for electrically connecting an external device to the probe, thereby providing a simple and quick way to connect the external device to the probe, allowing a suitable way to be selected during use to electrically connect to the probe. This increases the convenience and flexibility of operation.

[0021] Optionally, the third body has a limiting portion, and the setting of the limiting portion facilitates the motion control of the probe through the third body when the probe is in use.

[0022] Optionally, the probe further comprises a frame, and the rotary structure is rotatably connected to the frame. Optionally, an elastic member is disposed inside the frame, and the elastic member is constructed to limit the rotation range of the first body by interfering with the limiting portion, and the rotation angle of the probe is limited by the cooperation between the frame and the limiting portion. The elastic member is not limited to a variety of specific structural forms such as a spring, a shrapnel or an elastic block, and the probe can be driven by the force of such an elastic member.

[0023] Here, the elastic member can enhance the adaptive force applied to the third body of the probe, so that when the probe contacts the gate line, it can be subjected to force to produce a downward pressure to "press" the contact surface, so that the contact between the contact surface and the gate line can resist slight disturbances and obtain stable contact.

[0024] Optionally, the frame is provided with a longitudinal hole and a transverse hole connected to each other, the elastic member is installed in the longitudinal hole, the limiting portion is inserted into the transverse hole and abuts against the first end of the elastic member, the second end of the elastic member abuts against the inner wall of the longitudinal hole, and the elastic member is located above or below the limiting portion. Based on such a structure, the rotation amplitude is designed and controlled.

[0025] Optionally, the frame is provided with a mounting portion, the mounting portion has a mounting hole, and at least part of the hole wall of the mounting hole is flat. This structure prevents the structure installed in the mounting hole from producing relative rotation, ensures that the two can move synchronously, and improves the controllability of the frame.

[0026] Optionally, the mounting portion includes a first mounting body and a second mounting body separated by a gap at the hole wall of the mounting hole; the first mounting body and the second mounting body are configured to be able to be close to each other under force so as to achieve clamping and fixing, and the frame is designed to be divided into two parts, which can facilitate the installation or removal of components set in the mounting hole. In addition, since the first mounting body and the second mounting body are configured to be able to be close to each other under force, the mounting hole can also adapt to components of different specifications / sizes, thereby providing flexibility and universality of use.

[0027] Optionally, the probe is made of beryllium-copper alloy and the surface is gold-plated. The probe made of beryllium-copper alloy and gold-plated can have both excellent structural strength and electrical conductivity.

[0028] In a second aspect, the present application discloses a contactor. The contactor comprises:

[0029] A row of rods; and a plurality of the above-mentioned probes;

[0030] All the probes are sequentially arranged and installed on the row rods at intervals, so as to achieve synchronous electrical contact with a large number of grid lines in the photovoltaic cell sheet.

[0031] In a third aspect, the present application discloses a processing device for electrically contacting a solar cell.

[0032] The processing device includes: a base; a mounting frame mounted on the base through a UVW moving module; and the above-mentioned contactor, which is connected to the mounting frame; the probe in the contactor is used to electrically contact the grid line of the solar cell. The movement of the mounting frame is controlled by the UVW moving module so that the contact surface approaches the solar cell and achieves electrical contact at the corresponding position.

[0033] Optionally, the processing device comprises an insulating block, and the contactor is connected to the mounting frame via the insulating block.

[0034] The insulating block provides electrical isolation, thereby ensuring electrical isolation between the probe and the mounting frame, preventing other components in the processing device from being accidentally energized, thereby reducing potential problems caused by interference and other unintended energization.

[0035] Optionally, the processing device includes a driver having a driving output part, the driving output part is transmission-connected to the row rods, and the driver is used to drive the row rods to rotate to lift the probes on the row rods away from the solar cell sheets so that the side probes do not block the solar cell sheets.

[0036] By applying power to start the rotation of the row rod through the driver, the driving force applied to the probe can be the same, so the pressure when contacting the grid line is also the same, avoiding the cumbersome, inconsistent and low-precision problems of manual operation, and also avoiding accidental damage to the probe due to manual operation errors.

[0037] Optionally, the processing device further comprises a mounting plate, and the base is connected to the mounting plate;

[0038] And / or, the number of the contactors is two, and they are symmetrically connected to the mounting frame, so as to facilitate the implementation of contact measurement on both sides of the battery cell at the same time.

[0039] Optionally, when there are two contactors and they are symmetrically installed on the mounting frame, the processing device includes two drivers, the two drivers are installed on the mounting frame or the insulating block, the drive output parts of the two drivers are respectively connected to the row rods of the two contactors, and the two drivers independently drive the connected row rods to rotate to lift the probes on the corresponding row rods away from the solar cell panels.

[0040] Beneficial effects:

[0041] The probe can be used to provide contact along a first direction to achieve electrical connection with the grid line of the solar cell, so that other instruments and equipment can be electrically connected to the grid line of the solar cell through the probe, thereby providing convenience and possibility for measurement and testing operations of instruments and equipment.

[0042] In such a structure, the first body and the second body in the probe can synchronously move around the axis of the rotating structure, so that the contact surface of the first body is separated from the gate line or contacts the gate line along the first direction to form an electrical connection.

[0043] In such a solution, the first body and the second body of the probe are configured in a non-collinear manner (i.e., non-straight rod shape), so that the probe can have a smaller space occupation and flexible space layout freedom compared to a collinear configuration of the two bodies. In this way, during use, the probe can reserve more sufficient space for various operations.

[0044] More preferably, through the construction of the first body and the second body, combined with the setting of the rotating structure, the contact surface of the first body can take a more nearly facing posture to contact the battery cell, so that the probe can be subjected to less bending moment force. In this way, compared with a straight probe contacting the battery cell in an inclined manner, the probe in the present application is not easily damaged.

[0045] In other words, the probe in the present application has a long service life, thereby reducing the high expenditure cost caused by the need to frequently replace or repair the probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] By reading the detailed description below with reference to the accompanying drawings, the above and other purposes, features and advantages of the exemplary embodiments of the present application will become easy to understand. In the accompanying drawings, several embodiments of the present application are shown in an exemplary and non-limiting manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein:

[0047] Figure 1 A schematic diagram of the structure of the probe of an embodiment of the present application at one viewing angle;

[0048] Figure 2 Shows Figure 1 Schematic diagram of the structure of the probe in two other viewing angles;

[0049] Figure 3 A schematic diagram of the structure of another probe according to an embodiment of the present application;

[0050] Figure 4 for Figure 3 A schematic diagram of a cross-sectional structure of a probe;

[0051] Figure 5 A schematic diagram of the structure of a contactor according to an embodiment of the present application;

[0052] Figure 6 for Figure 5 A schematic diagram of the structure of the contactor and the mounting frame;

[0053] Figure 7 It is a schematic diagram of the structure of the processing device in the example of this application at one viewing angle;

[0054] Figure 8 It is a schematic diagram of the structure of the processing device in the example of this application from another perspective;

[0055] Fig. 9 This is a schematic diagram of the configuration of the contact surface of the probe and the gate line in the example of this application.

[0056] Explanation of the reference numerals: 100-probe; 100a-probe; 101-first body; 102-second body; 103-limiting part; 104-rotating structure; 105-wiring part; 106-third body; 107-contact surface; 201-frame; 202-mounting hole; 203-limiting plane; 204-first mounting body; 205-second mounting body; 206-gap; 207-elastic member; 300-contactor; 301-rod; 401-mounting frame; 402-insulating block; 501-mounting plate; 601-base; 602-motor; 603-screw; 604-bearing. DETAILED DESCRIPTION

[0057] The following will be combined with the drawings in the embodiments of the present disclosure to clearly and completely describe the technical solutions in the embodiments of the present disclosure. Obviously, the described embodiments are part of the embodiments of the present disclosure, rather than all of the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present disclosure.

[0058] In the production process of photovoltaic cells, the probe is a frequently used device. The cell includes at least fine grid lines and may also include main grid lines. The probe is used to form an electrical contact with the grid lines of the cell. Since the probe is used in many process links, it will be used frequently. Therefore, it is necessary to pay special attention to the service life of the probe. Otherwise, frequent replacement or maintenance of the probe will increase the complexity of the production process and production cost of the cell, and also extend the manufacturing cycle.

[0059] The current probe is configured in an inclined posture relative to the surface of the cell when in use, so it contacts the grid line of the cell in a manner of diagonally extending and retracting relative to the cell, which causes the probe to be subjected to bending moment. During frequent use, mechanical fatigue and damage are more likely to occur, thereby reducing the service life.

[0060] In view of this, in this application, a new probe and its application example are proposed, and please refer to Figures 1 to 9 To understand.

[0061] The structure of the probe 100 is as follows Figure 1 As shown. Different from the aforementioned application mode of being retracted and tilted relative to the cell and obliquely contacting the grid line of the cell, the probe 100 in the present application is configured in a rotatable manner and can also contact the grid line of the cell head-on by rotating. In this way, the probe 100 in the present application can adjust its posture by rotating so as to contact the grid line of the cell head-on.

[0062] Therefore, generally speaking, the probe 100 of the present application includes a portion of the structure that can be rotatably configured, and another portion of the structure that is in electrical contact with the grid lines of the cell.

[0063] As an example, Figure 1 As shown, the probe 100 includes a first body 101 , a second body 102 and a rotating structure 104 .

[0064] In the probe 100, the extension trajectory of the first body 101 defines a first direction, such as Figure 1 The extension track of the second body 102 connected to the first body 101 may define a second direction, such as Figure 1 In addition, the rotary structure 104 is provided to the second body 102; in a further probe structure, the rotary structure 104 may be provided at an extended portion of the second body, such as a third body described later.

[0065] In the second body 102 , the rotating structure 104 can be disposed at any appropriate position of the second body 102 without any particular limitation. For example, the rotating structure 104 can be disposed at the end of the second body 102 away from the first body 101 .

[0066] The first body 101 also has a contact surface 107 (which can be a flat surface or an arc surface) for contacting the grid line of the battery cell (specifically, the end of the main grid line, which is a Y-shaped PAD point, also called a harpoon point). The contact surface 107 cooperates with the harpoon point as shown in the following figure. Fig. 9 shown.

[0067] Thus, by connecting the probe 100 to a certain device, such as the frame 201 mentioned later, through the rotating structure 104, the contact surface 107 of the first body 101 can be directed toward the cell and directly contact the gate line by operating the rotating structure 104.

[0068] In the probe 100, the first body 101 and the second body 102 can be constructed as an integral structure, i.e., an integrally formed component. Alternatively, the first body 101 and the second body 102 can also be two independent components that are manufactured separately and then connected together by a connection method that meets strength requirements such as welding, bonding, or bolts.

[0069] As an optional implementation, in different examples, the rotating structure 104 can be implemented in different forms. For example, the rotating structure 104 can be a hole; for example, it is implemented by removing part of the material from the second body 102. Alternatively, the rotating structure 104 is a hole and a rotating member in the hole; for example, it is implemented by removing part of the material from the second body 102 and then filling the hole with a bearing 604 or a cylindrical rod or a similar structure. In the rotating structure 104 implemented as a hole, the probe 100 is configured to rotate through the hole of the second body 102 by configuring a pin in the hole.

[0070] In order to explain the rotation of the probe 100, a rotation plane may be defined for the rotation structure 104. Meanwhile, the plane defined by the aforementioned first direction and second direction (intersecting each other) is the plane defined by x and y.

[0071] In some examples, the probe 100 in the above scheme can be described as an L-shaped structure as a whole. Further, depending on the structure of the second body 102, the probe 100 can also be configured as a Z-shaped structure. For example, when the probe 100 has a third body 106. When the third body is connected to the second body 102, such as near the position of the rotating structure 104, the first body 101 and the third body 106 extend on both sides of the upper and lower sides of the extension track of the second body 102, a Z-shaped structure can be formed.

[0072] Since the first direction and the second direction intersect each other, the rotation plane can be defined to coincide with the plane defined by the first direction and the second direction. Based on such a structure, the first body 101 and the second body 102 can rotate synchronously around the axis of the rotation structure 104 (such as the axis of the pin mentioned above), so that the contact surface 107 of the first body 101 is operated to leave the grid line, or contact the grid line of the solar cell along the first direction to form an electrical connection.

[0073] It can be understood that when the probe 100 rotates clockwise around the axis, the contact surface 107 can approach or even contact the grid lines of the battery cell; accordingly, when the probe 100 rotates counterclockwise around the axis, the contact surface 107 can leave or even move away from the grid lines of the battery cell; and vice versa.

[0074] Since photovoltaic cells generate electricity under the action of light, they need the participation of light when working. Therefore, when doing tests, ensuring that the cells can receive light helps to ensure the accuracy and authenticity of the test results. Therefore, in some examples, the sizes of the first body 101 and the second body 102 can be designed.

[0075] As an alternative example, when projected along the extension direction (first direction) of the first body 101, the first body 101 has a first pattern, and the second body 102 has a second pattern. By designing the shape and size of the first pattern and the second pattern, it is possible to limit / lower / reduce the light blocking of the probe 100. Therefore, the rotation axis direction (such as the rotation axis direction) of the rotation structure 104 can be Figure 1 The first width W1 of the first figure is greater than the second width W0 of the second figure. Figure 2 Or it can be roughly described as the second body 102 being wider or thicker than the first body 101 based on the viewing angle of interest.

[0076] In the illustrated structure of the present application, the first body 101 and the second body 102 are implemented in a sheet shape; in other examples, they can also be implemented in a columnar shape, a rod shape, or a stick shape, etc.

[0077] In order to facilitate the design and control of the rotation amplitude or rotation angle of the probe 100, in an optional example, the probe 100 may be configured with the Z-shaped structure on the basis of the first body 101 and the second body 102. Figure 1 and Figure 2 The third body 106 is shown.

[0078] Similar to the connection configuration of the first body 101 and the second body 102, the second body 102 and the third body 106 can be an integral structure, or a structure that is separated and connected by bonding, welding, etc. As a feasible option, the first body 101, the second body 102 and the third body 106 are an integral structure. The first body 101 can be a crimping part, the second body 102 can be a connecting part, and the third body 106 can be an elastic limiting part 103. And these three parts can be made of block materials, rods, etc. by cutting or extrusion, stamping, etc.

[0079] The third body 106 is configured, for example, to extend in a direction opposite to the first direction, and the first body 101 is connected to the third body 106 via the second body 102. Therefore, the probe 100 can be the aforementioned Z-shaped structure.

[0080] As a structural design of the third body 106 to limit the rotation range of the probe 100, in some examples, the third body 106 may be provided with a reference Figure 1 The limiting part 103 is provided. Thus, the rotation range of the probe is limited by restricting the movable range of the limiting part 103.

[0081] In addition, the third body 106 may also be configured with a connection portion 105 for electrically connecting an external device (such as an EL detection device, a power detection device, etc.) to the probe 100. The connection portion 105 may be a conductor post or a connection hole; Figure 1 Alternatively, as an alternative, the wires of the external device can also be connected to the frame 201 that is connected to the third body mentioned later; the matching method between the frame and the third body can be referred to in Figure 3 .

[0082] The wiring part 105 is connected to the wiring terminals of an external device such as an external power supply or a detector. For example, a terminal with a clip or a wire can be directly connected to the wiring part 105 to form an electrical connection with the probe 100, so as to facilitate powering the probe 100 or measuring the electrical parameters (current, voltage, and power generation) of the solar cell when it is powered by light. In other examples, the power supply or the detector can also be directly connected to the probe row / row rod 301 to achieve electrical connection. When the power supply or the detector is directly connected to the probe row / row rod 301, since the probe row / row rod 301 itself has a certain resistance, there is no need to set up an additional variable resistor, saving costs.

[0083] In order to facilitate the installation of the probe 100 on the device so as to be operated to contact the gate line, in some examples, a probe 100a of a new structure includes a frame 201, such as Figure 3 As shown. On this basis, the swivel structure 104 is rotatably connected to the frame 201. For example, the frame 201 has a lug (which can also be described as a rotating part) and is provided with a hole. The second body 102 of the probe 100 body (for example, a third body that is specifically an extension of the second body) is also provided with a hole. In this way, the two holes are hinged by a pin.

[0084] At the same time, the frame 201 can also cooperate with the limiting portion 103 of the third body 106 to limit the rotation angle of the probe 100 .

[0085] For example, an elastic member 207 (such as a spring, a spring sheet or an elastic block, etc.) is disposed inside the frame 201 , and the elastic member 207 is configured to limit the rotation range of the first body 101 by interfering with the limiting portion 103 .

[0086] For example, the frame 201 is provided with a groove, and the elastic member 207 is in the groove. The limiting portion 103 slides in the groove. When the probe 100 rotates to a certain position, the limiting portion 103 and the elastic member 207 conflict with each other, so that the elastic force is limited and further rotation is prevented. Therefore, by configuring the depth or length of the groove, the size of the elastic member 207 can be designed so that the rotation range can be designed.

[0087] In such a structure, the rotating structure 104 can provide a rotation fulcrum. The limiting portion 103 can be subjected to force at one end, and the end where the contact surface 107 of the first body 101 is located can move through the movement of the limiting portion.

[0088] Similar to the above scheme, in some examples, the frame 201 is provided with a longitudinal hole and a transverse hole that are connected to each other. The longitudinal hole and the transverse hole can be two blind holes. The elastic member 207 is installed in the longitudinal hole (which can be parallel to the first direction). The limiting portion 103 can be inserted into the transverse hole (which can be parallel to the second direction) and abut against the first end of the elastic member 207, while the second end of the elastic member 207 abuts against the inner wall of the longitudinal hole, and the elastic member 207 (such as a tension spring or a compression spring) is located above or below the limiting portion 103; Figure 4 Therefore, one end of the position-limiting portion 103 that can be inserted into the transverse hole can be limitedly moved in the hole.

[0089] Through such a solution, the probe 100 can be driven to rotate by the force of the elastic member 207. Thus, the contact surface 107 of the first body 101 contacts the gate line, and the contact surface 107 is stably and firmly in electrical contact with the gate line through the aforementioned force, avoiding virtual contact.

[0090] After the frame 201 is configured in the probe 100, the method selected to fix the probe 100 can be designed for the frame 201. For example, the frame 201 is provided with a mounting portion, and the mounting portion has the following features: Figure 3 and Figure 4 The mounting hole 202 is provided. In this way, the probe 100 can be fixed by using the mounting hole 202. For example, the mounting hole 202 is a threaded hole, and the frame 201 is fixed by a bolt. Alternatively, a rod or a bar or a prism (which can be simply referred to as a rod) having an interference fit with the mounting hole 202 is fixed to the frame 201, and then the rod or the bar or the prism is fixed to achieve the installation of the probe 100.

[0091] In the illustrated structure of the present application, the mounting hole 202 is a truncated circular hole; that is, the hole wall of the mounting hole 202 is a combination of an arc surface and a plane. Correspondingly, the rod or bar can also be cylindrical and formed by cutting off a portion along the axial direction. This method can make the rod and the frame 201 more synchronized. That is, the rod will not slip and rotate in the mounting hole 202.

[0092] Therefore, as a preferred option, at least part of the hole wall of the mounting hole 202 is a plane ( Figure 3 and Figure 4 In addition to forming the aforementioned truncated circle, the mounting hole 202 can also be a square, triangular or hexagonal mounting hole according to the number of planes. In addition, the shape of the rod is adapted to the shape of the hole - the cross section of the probe row / row rod 301 is adapted to the shape of the mounting hole 202 / through hole, and can be inserted into the probe row. Advantage: Prevent relative rotation between the frame 201 and the probe row.

[0093] In order to facilitate the mating (connection and removal) of the rod with the mounting hole 202 of the frame 201, the frame 201 can be provided with multiple parts, for example, the mounting part includes a first mounting body 204 and a second mounting body 205 which are distinguished by a gap 206 at the hole wall of the mounting hole 202. Figure 3 and Figure 4 It can be known that there is a degree of freedom defined by the width of the gap 206 between the first mounting body 204 and the second mounting body 205 .

[0094] The first mounting body 204 and the second mounting body 205 can be tightened by bolts or screws to be close to each other, so that the width of the gap 206 is reduced, so that the rod in the mounting hole 202 is clamped, and combined with the structural design of the mounting hole 202 (truncated circle), the rod and the frame 201 can be fixed to each other. The movement of the probe 100 can be achieved by the movement of the rod, such as rotation. In other words, there is a degree of freedom determined by the gap 206 between the first mounting body 204 and the second mounting body 205; and, therefore, the two mounting bodies can be subjected to forces in opposite directions to approach each other, and also clamp the structure configured in the mounting hole 202, such as the rod.

[0095] Optionally, as known to those skilled in the art, the probe should be made of a conductive material, such as a metal or alloy such as copper or silver. According to experiments, among common conductive materials, when the material of the probe is a beryllium-copper alloy, the probe will have a higher structural strength, thereby significantly improving the service life of the probe and reducing production costs. After further experiments, gold plating was performed on the outer surface of the probe made of beryllium-copper alloy, which can significantly improve the conductivity. Therefore, compared with common metals or alloys such as copper and silver, a probe made of beryllium-copper alloy and gold-plated can have both excellent structural strength and conductivity.

[0096] The above content has given a detailed and clear description of the probe 100 . As an example of its application, a contact device based on the probe 100 will be discussed below.

[0097] In the example, considering that there are many grid lines in the photovoltaic cell, there is a need to electrically contact multiple groups of grid lines; accordingly, multiple probes 100 are configured. It may be troublesome or difficult to control each probe 100 individually, and the accuracy is difficult to ensure. Then, a rod can be provided to cooperate with the frame 201 to manufacture a device called a contactor 300.

[0098] This application Figure 5 In the structure shown, the contactor 300 includes a row bar 301 and a plurality of or at least one probe 100. The probe 100 is fixed to the row bar 301. When there are more than two probes 100, all the probes 100 are sequentially arranged and installed on the row bar 301. As an alternative solution, the spacing between the probes can be designed so that the distance between two adjacent probes 100 is the same.

[0099] For the contactor, the row bar 301, the frame 201 and the probe 100 can be made of metal or conductive materials, such as copper, aluminum, etc., so the three are connected to form a conductive link. Therefore, the test equipment of the battery cell can be connected to the row bar 301 to achieve electrical connection with the gate line through the probe 100.

[0100] As another example of application of the probe 100. The present application also discloses a processing device for electrically contacting a solar cell, such as Figure 6 , Figure 7 and Figure 8 shown.

[0101] The processing device includes a base 601, a mounting frame 401 mounted on the base 601 through a UVW moving module, and a contactor 300; and the contactor 300 is connected to the mounting frame 401. The probe 100 in the contactor 300 is used to electrically contact the grid line of the solar cell. Alternatively, the cable is connected through the aforementioned wiring portion 105, thereby electrically connecting to the grid line of the solar cell.

[0102] In the processing device, the contactor 300 can be configured as needed, and as an example, the number of the contactors 300 is two, and they are optionally symmetrically connected to the mounting frame 401 .

[0103] Furthermore, the processing device may be provided with a mounting plate 501. On this basis, the base 601 is connected to the mounting plate 501. The mounting plate 501 may be used to fix the processing device to other equipment.

[0104] In the processing device, the row rod 301 can also be driven by a driver, thereby rotating the probe 100, so as to control all the probes 100 on this side to be in electrical contact with the grid line or to be away from the grid line to avoid blocking. The driver can be set on the installation frame 401; or, in order to insulate the probe 100 from the installation frame 401, an insulating block 402 can be configured on the installation frame 401 to be bonded, bolted or clamped, and then the driver can be installed on the insulating block 402.

[0105] Therefore, the row bar 301 can be connected to the insulating block 402, and the row bar 301 can be rotated by the driver to drive the insulating block 402, thereby causing the probe 100 to move. Alternatively, the driver is installed on the insulating block 402, and the row bar 301 is connected to the output component of the driver (or the drive output part, which can be specifically expressed as an output shaft), and the row bar 301 is directly driven by the driver, thereby driving the probe 100 to move.

[0106] When the row rod 301 is driven by the driver to rotate, the elastic member 207 in the frame 201 can act on the third body 106 of the probe 100, so that the first body 101 moves, and then the contact surface 107 approaches the solar cell, or until it contacts the grid line (conductivity can be achieved by material selection configuration); or rotation in the other direction causes the probe 100 to be lifted away from the solar cell, so that all the probes 100 on this side have no obstruction to the solar cell.

[0107] In brief, the processing device is provided with an insulating block 402 , and the contactor 300 including the probe 100 is connected to the mounting frame 401 via the insulating block 402 , and the contactor 300 is operated directly or indirectly via the insulating block 402 .

[0108] It is feasible that when there are two contactors 300 and they are symmetrically mounted on the mounting frame 401, the processing device may also include two drivers. The two drivers are mounted on the mounting frame 401 or the insulating block 402, and the drive output parts of the two drivers are respectively connected to the row rods 301 of the two contactors 300.

[0109] In this way, the two drivers independently drive the connected row bars 301 to rotate so as to lift the probes 100 on the corresponding row bars 301 away from the solar cell. That is, the drivers can be driven simultaneously so that the two contactors 300 contact the grid lines of the solar cell at the same time, or one of them contacts the grid lines of the solar cell and the other is away from and does not block the solar cell, or the two contactors 300 are lifted away from the grid lines of the solar cell at the same time, and all the probes 100 do not block the solar cell.

[0110] In addition, the UVW moving module in the processing device is a multi-dimensional motion platform, which can also be called a uvw adjustment platform or a uvw motion platform. It can select common equipment in mechanical equipment, for example, the uvw adjustment platform can include a motor 602 module, and the motor 602 module includes a motor 602, a screw component, a slide rail and a bearing 604.

[0111] The motor 602 and the lead screw component that drive each other are connected to the base 601; the slide rail is connected to the lead screw 603, and the slide rail is driven by the lead screw 603; and the bearing 604 is respectively connected to the slide rail and the mounting frame 401, and is driven by the slide rail. That is, the motor 602 drives the lead screw 603, and the lead screw 603 moves to drive the (cross) slide rail, and then drives the bearing 604 to move.

[0112] The movement of the bearing 604 causes the mounting frame 401 to move, and the contactor 300 fixed to the mounting frame 401 moves accordingly. In the illustrated structure, the mounting frame 401 is a roughly quadrilateral structure. The battery cell is also a roughly rectangular structure.

[0113] Therefore, when contact with the grid line is required, the battery cell can be configured from one side (e.g., the idle side) of the mounting frame 401 to the area of ​​the mounting frame 401. Therefore, the number of motor 602 modules in the processing device can be designed to be three. In addition, the three motor 602 modules are respectively arranged on three sides (non-idle sides) of the four different sides of the mounting frame 401. By matching the three motor 602 modules, the combination of the movement of any one, two, or three of the three can make the mounting frame 401 have three axial degrees of freedom on the plane.

[0114] For example, Figure 7 and Figure 8 As shown, when the motors 602 at B and C drive the bearings 604 to move in the same direction and the motor 602 at A is stationary, the mounting frame 401 moves along the X-axis; when the motors 602 at B and C drive the bearings 604 in opposite directions and the motor 602 at A is stationary, the mounting frame 401 rotates in the horizontal plane; when the motors 602 at ABC work together, the adjustment of the mounting frame 401 in the horizontal plane along the X-axis, along the Y-axis, and along the T-axis (rotation) can be completed.

[0115] In summary, the probe 100, contactor 300 and processing device of the embodiment of the present application have a long service life, and will not increase the shielding area of ​​the battery cell when in use, and can also achieve stable and precise electrical connection of the grid line of the battery cell, thereby completing power-on, testing and other process processing.

[0116] Furthermore, since the probe 100 can adjust its posture by rotating and contact the gate line in a frontal contact manner, the interference problem between various structures in the test equipment and the probe 100 can be solved. Due to the stable contact, the contact position is not prone to relative movement during a small disturbance or a relatively large movement, reducing the adverse effects of the contact position.

[0117] In the above description of the present application, unless otherwise clearly specified and limited, the terms "fixed", "installed", "connected" or "connected" and the like should be understood in a broad sense. For example, with regard to the term "connection", it can be a fixed connection, a detachable connection, or an integral one; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal connection of two elements or the interaction relationship between two elements. Therefore, unless otherwise clearly defined in the present application, those skilled in the art can understand the specific meanings of the above terms in the present application according to the specific circumstances.

[0118] According to the above description of the present application, those skilled in the art may also understand that the terms used below, such as "upper", "lower", "length", "width", "top", "bottom", "inside", "outside", "axial", "longitudinal", "horizontal", "clockwise" or "counterclockwise", etc., which indicate the orientation or position relationship, are based on the orientation or position relationship shown in the drawings of the present application. It is only for the purpose of facilitating the explanation of the scheme of the present application and simplifying the description, rather than explicitly or implicitly indicating that the device or element involved must have the specific orientation, be constructed and operate in a specific orientation, so the above-mentioned orientation or position relationship terms cannot be understood or interpreted as limiting the scheme of the present application.

[0119] In addition, the terms "first" or "second" used in this application to refer to numbers or ordinals are only used for convenience of description and cannot be understood as explicitly or implicitly indicating relative importance or implicitly indicating the number of technical features indicated. At the same time, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of this application, the meaning of "plurality" is at least two, such as two, three or more, etc., unless otherwise clearly and specifically defined.

[0120] Although multiple embodiments of the present application have been shown and described herein, it will be appreciated by those skilled in the art that such embodiments are provided only by way of example. Those skilled in the art may think of many changes, modifications and alternatives without departing from the thought and spirit of the present application. It should be understood that in the process of practicing the present application, various alternatives to the embodiments of the present application described herein may be adopted. The attached claims are intended to define the scope of protection of the present application, and therefore cover equivalents or alternatives within the scope of these claims.

Claims

1. A probe, characterized in that: The probe comprises: A first body in a first direction is defined by an extended trajectory and has a contact surface; A second body connected to the first body and extending along a second direction; and A rotating structure disposed on the second body and having a rotating plane; The rotation plane coincides with a plane defined by the first direction and the second direction intersecting each other; The first body and the second body are configured to rotate synchronously around the axis of the rotating structure, so that the contact surface is operated to leave the grid line, or to contact the grid line of the solar cell along the first direction to form an electrical connection.

2. The probe according to claim 1, characterized in that Projected along the first direction, the first body has a first shape, the second body has a second shape, and measured along the rotation axis direction of the rotation structure, a first width of the first shape is greater than a second width of the second shape; And / or, the second body is in sheet shape.

3. The probe according to claim 1, characterized in that The contact surface is a curved surface; Alternatively, the rotary structure is a hole, or a hole and a rotating member in the hole; Alternatively, the probe is an L-shaped structure.

4. The probe according to any one of claims 1 to 3, characterized in that The probe further includes: a third body extending in a direction parallel to the first direction, and the first body is connected to the third body through the second body.

5. The probe according to claim 4, characterized in that: The first body, the second body and the third body are an integrated structure; And / or, the probe has a Z-shaped structure; And / or, the third body has a connection portion for electrically connecting an external device to the probe.

6. The probe according to claim 4, characterized in that The third body has a limiting portion.

7. The probe according to claim 6, characterized in that: The probe further comprises a frame, and the rotary structure is rotatably connected to the frame.

8. The probe according to claim 7, characterized in that: An elastic member is disposed inside the frame, and the elastic member is configured to limit the rotation range of the first body by interfering with the limiting portion.

9. The probe according to claim 8, characterized in that: The frame is provided with a longitudinal hole and a transverse hole which are connected to each other, the elastic member is installed in the longitudinal hole, the limiting portion is inserted into the transverse hole and abuts against the first end of the elastic member, the second end of the elastic member abuts against the inner wall of the longitudinal hole, and the elastic member is located above or below the limiting portion.

10. The probe according to claim 7, characterized in that: The frame body is provided with a mounting portion, the mounting portion has a mounting hole, and at least a portion of the hole wall of the mounting hole is a plane.

11. The probe according to claim 10, characterized in that: The mounting portion includes a first mounting body and a second mounting body separated by a gap at a hole wall of the mounting hole; The first installation body and the second installation body are configured to be able to be forced to approach each other.

12. The probe according to claim 1, characterized in that: The probe is made of beryllium-copper alloy and the surface is gold-plated.

13. A contactor, characterized in that: The contactor comprises: Row poles; and A plurality of probes according to any one of claims 1 to 12; All the probes are arranged in sequence and installed on the row rod at intervals.

14. A processing device for electrically contacting a solar cell, characterized in that: The processing device comprises: Base; A mounting frame mounted on the base via a UVW moving module; and The contactor according to claim 13, wherein the contactor is connected to the mounting frame; The probes in the contactor are used to electrically contact the grid lines of the solar cell.

15. The processing device according to claim 14, characterized in that The processing device includes an insulating block, and the contactor is connected to the mounting frame through the insulating block.

16. The processing device according to claim 14, characterized in that The processing device comprises a driver having a driving output part, wherein the driving output part is drivingly connected to the row of rods, and the driver is used for driving the row of rods to rotate so as to lift the probes on the row of rods away from the solar cell sheets.

17. The processing device according to claim 14, characterized in that The processing device also includes a mounting plate, and the base is connected to the mounting plate; And / or, the number of the contactors is two, and they are symmetrically connected to the mounting frame.

18. The processing device according to claim 17, characterized in that When there are two contactors and they are symmetrically installed on the mounting frame, the processing device includes two drivers, which are installed on the mounting frame or the insulating block. The driving output parts of the two drivers are respectively connected to the row rods of the two contactors, and the two drivers independently drive the connected row rods to rotate to lift the probes on the corresponding row rods away from the solar cell panels.

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