An infrared focal plane detector testing device

Abstract

The utility model discloses an infrared focal plane detector testing device. The device moves the infrared focal plane detector to be tested to a sub-test module through a moving module, and the sub-test module pre-processes the detector by loading an electrical signal and collecting the response data of the detector, and the radiation source module in the test module tests the multiple detectors after pre-processing, and sets the center distance between the low-temperature and high-temperature radiation sources in the optical signal radiation source to be equal to the optical center distance of the apertures of two adjacent test machines, so that the response data of the detectors on the two adjacent test machines to the optical excitation signals provided by the low-temperature and high-temperature radiation sources can be collected at the same time, thereby improving the test efficiency; and during the test process, the material tray area corresponding to the detector that has been tested first and the detector with test abnormality can be replaced with a new product to be tested separately, without waiting for all detectors to be loaded and unloaded together, thus saving the pre-processing time and the time of centralized loading and unloading.

Description

Technical Field

[0001] The utility model relates to the field of infrared focal plane detectors, in particular to an infrared focal plane detector testing device. Background Art

[0002] Infrared radiation is a widespread electromagnetic wave radiation in nature. Any object above absolute zero (-273℃) continuously radiates infrared energy that is invisible to the naked eye. With the help of sensors, such as infrared focal plane detectors, radiation in the infrared band can be observed. Infrared detectors have been widely used in night vision observation and non-contact temperature measurement.

[0003] As a key sensor for observing infrared radiation, infrared focal plane detectors need to undergo a final performance test (FT) before leaving the factory to eliminate detectors with unqualified performance and to classify them according to the test results. The existing technology generally tests the performance parameters of infrared focal plane detectors manually, with operators manually taking and placing the infrared focal plane detectors to be tested and testing the infrared focal plane detectors one by one.

[0004] After the infrared focal plane detector is powered on, the internal temperature of the infrared focal plane detector will rise, and it will take some time to reach thermal equilibrium. During this period of time before the infrared focal plane detector reaches thermal equilibrium, the response data of the infrared focal plane detector is unstable. It is necessary to wait for the response data of the infrared focal plane detector to stabilize before the infrared focal plane detector to be tested can be tested. This results in a long time for testing a single infrared focal plane detector, resulting in low test efficiency and difficulty in achieving large-scale batch testing.

[0005] There are also some improved technologies, the main improvement is to use a robot to replace manual labor to achieve automatic loading and unloading, but the loading and unloading is generally based on the number of test stations. Multiple infrared focal plane detectors are loaded and unloaded together. Although it saves loading and unloading time, it is not flexible enough. If there is a problem with the test of one infrared focal plane detector, it will affect the test time of other infrared focal plane detectors. In addition, during the test, only the response data of one infrared focal plane detector under the radiation of the optical signal radiation source can be collected at a time, and the test efficiency is low. Summary of the invention

[0006] The utility model aims to provide an infrared focal plane detector testing device, which can improve the testing efficiency.

[0007] In order to achieve the above-mentioned purpose, the utility model provides an infrared focal plane detector testing device, comprising: a moving module, used to move and place a plurality of infrared focal plane detectors to be tested, the moving module comprising a material tray; a testing module, comprising at least one sub-test module and a radiation source module, the sub-test module comprising a testing tool and a testing machine, the testing tool being used to carry the infrared focal plane detectors to be tested conveyed by the moving module, the testing machine being able to pre-process the infrared focal plane detectors to be tested conveyed by the moving module, the pre-processing comprising loading an electrical signal to the infrared focal plane detectors to be tested, collecting response data of the infrared focal plane detectors to be tested, and waiting for the response data of the infrared focal plane detectors to be tested to be stable, the radiation source module comprising an optical signal radiation source, the optical signal radiation source being able to provide an optical excitation signal to the infrared focal plane detectors to be tested, so as to The focal plane detector is tested, and the test module is used to obtain the test result; the control module is electrically connected to the moving module and the test module, and is used to control the moving module to take and place and control the test module to test; the optical signal radiation source further includes a low-temperature radiation source and a high-temperature radiation source, and the test machine further includes an aperture. For the test module with multiple test machines, the center distance between the low-temperature radiation source and the high-temperature radiation source is equal to the optical center distance of the apertures of two adjacent test machines, so that the response data of the infrared focal plane detectors to the optical excitation signals provided by the low-temperature radiation source and the high-temperature radiation source on the two adjacent test machines can be collected at the same time; the material tray is used to place the multiple infrared focal plane detectors to be tested that have not been tested, and to place the multiple infrared focal plane detectors to be tested that have been classified according to the test results after the test.

[0008] The utility model moves the infrared focal plane detector to be tested to at least one sub-test module in the test module through a moving module, and the sub-test module pre-processes the infrared focal plane detector to be tested by loading an electrical signal and collecting the response data of the infrared focal plane detector to be tested, and the radiation source module in the test module tests the multiple infrared focal plane detectors to be tested after pre-processing, and sets the center distance between the low-temperature radiation source and the high-temperature radiation source in the optical signal radiation source in the radiation source module to be equal to the optical center distance of the apertures of two adjacent test machines, so that the response data of the infrared focal plane detectors to be tested on the two adjacent test machines to the optical excitation signals provided by the low-temperature radiation source and the high-temperature radiation source can be collected at the same time. Compared with the existing method that can only collect the response data of one infrared focal plane detector under low-temperature or high-temperature radiation at a time, the utility model improves the test efficiency; and in the test process of the utility model, the tray area of ​​the moving module corresponding to the infrared focal plane detector that has been tested first and the infrared focal plane detector with test abnormality can be replaced with a new product to be tested separately, without waiting for all infrared focal plane detectors to be loaded and unloaded together, saving pre-processing time and centralized loading and unloading time, and also improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0010] Figure 1 A schematic diagram of the architecture of an infrared focal plane detector testing device provided in one embodiment of the utility model.

[0011] Figure 2 A schematic diagram of a mobile module architecture of an infrared focal plane detector testing device provided in one embodiment of the utility model.

[0012] Figure 3 A schematic diagram of the architecture of a radiation source module in a test module of an infrared focal plane detector test device provided in an embodiment of the utility model.

[0013] Figure 4 A test schematic diagram of a test module of an infrared focal plane detector test device provided in one embodiment of the utility model.

[0014] Figure 5 A schematic diagram of the working process of a sub-test module of an infrared focal plane detector testing device provided in one embodiment of the utility model.

[0015] 110: mobile module; 111: tray; 112: top camera; 113: bottom camera;

[0016] 120: test module; 121: radiation source module; 130: control module; 140: base station;

[0017] 212: nozzle kit; 213: three-axis motion module; 214: visual unit;

[0018] 215: support frame; 216: slide rail; 217: gantry;

[0019] 322: radiation source mounting rail; 323: low temperature radiation source; 324: high temperature radiation source; 325: motor. DETAILED DESCRIPTION

[0020] The technical scheme in the embodiment of the utility model will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the embodiment described in the utility model is only a part of the embodiment of the utility model, not all of the embodiments. Based on the embodiment of the utility model, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the utility model.

[0021] The utility model provides an infrared focal plane detector test device, which can be used to test infrared focal plane detectors of various shell packaging forms, such as butterfly metal packaging, leadless chip carriers (LCC) ceramic packaging, ceramic packaging with pins, chip on board packaging (COB), etc. The utility model can replace the corresponding sub-test module of the infrared focal plane detector according to different packaging forms.

[0022] See also Figure 1 , which is a schematic diagram of the structure of an infrared focal plane detector testing device provided by an embodiment of the utility model. Figure 1 As shown, the infrared focal plane detector testing device includes a moving module 110 , a testing module 120 and a control module 130 .

[0023] Wherein, the moving module 110 is used to move and place a plurality of the infrared focal plane detectors to be tested. The control module 130 is electrically connected to the moving module 110, and is used to control the moving module 110 to take and place. The test module 120 includes at least one sub-test module and a radiation source module 121. The control module 130 is also electrically connected to the test module 120, and is used to control the test module 120 to perform a test. The sub-test module is used to carry and pre-process the infrared focal plane detectors to be tested transported by the moving module 110. The radiation source module 121 includes an optical signal radiation source, and the optical signal radiation source can provide an optical excitation signal to the infrared focal plane detector to be tested so as to test the infrared focal plane detector to be tested, and the test module 120 is also used to obtain a test result.

[0024] Specifically, the sub-test module includes a test fixture and a test machine: the test fixture is used to carry the infrared focal plane detector to be tested transported by the mobile module. The test fixture can be understood as a test seat of the infrared focal plane detector, which is used to load the infrared focal plane detector to be tested. The test machine can pre-process the infrared focal plane detector to be tested transported by the mobile module. The pre-processing includes loading electrical signals to the infrared focal plane detector to be tested, collecting response data of the infrared focal plane detector to be tested, and waiting for the stability of the response data.

[0025] Specifically, the mobile module 110 includes a material tray 111, and the material tray 111 is used to place the plurality of infrared focal plane detectors to be tested that have not been tested, and to place the plurality of infrared focal plane detectors to be tested that have been classified according to the test results after the test. With this test device, the material tray areas corresponding to the infrared focal plane detectors that have been tested first and the infrared focal plane detectors with abnormal tests can be replaced with new products to be tested separately during the test, without waiting for all the infrared focal plane detectors to be loaded and unloaded together, which saves preprocessing time and loading and unloading time, and also improves test efficiency.

[0026] Optionally, the device further comprises: a base 140 for placing the moving module 110, the testing module 120 and the control module 130; the material tray 111 is disposed on the base 140. A plurality of the infrared focal plane detectors to be tested are arranged in an array in the material tray 111.

[0027] Specifically, before testing the infrared focal plane detector to be tested, the infrared focal plane detector to be tested, which has not been tested, should be placed on the material tray 111 on the base 140, and then the infrared focal plane detector to be tested should be moved and placed. Optionally, the material tray 111 is fixed on the base 140 by limiting the frame of the material tray. The frame of the material tray 111 is limited by limiting the frame of the material tray 111 through limiting steps.

[0028] The control module 130 classifies the infrared focal plane detectors to be tested after the test is completed according to the test results of the test module 120, so as to control the moving module 110 to place the infrared focal plane detectors to be tested after the test is completed on the corresponding material tray 111 according to the classification results. Specifically, the test results are divided into test pass (test OK) and test fail (test NG), and the infrared focal plane detectors that pass the test are placed in the corresponding test pass area on the material tray 111, and the infrared focal plane detectors that fail the test are placed in the test fail area on the material tray 111.

[0029] Specifically, the optical signal radiation source may be, for example, a low temperature radiation source 323 (e.g., equal to or lower than 20° C.) and a high temperature radiation source 324 (e.g., equal to or higher than 35° C.). Figure 3 As shown. The selection criteria of the radiation source can refer to "GB-T17444-2013 Test Method for Characteristic Parameters of Infrared Focal Plane Array". For example, the selected radiation source can be a black body, and the black body parameters include: the surface source black body temperature is 293K and 308K. The test machine further includes an aperture; for the test module 120 with multiple test machines, the center distance H1 between the low-temperature radiation source 323 and the high-temperature radiation source 324 is equal to the optical center distance H2 of the apertures of two adjacent test machines (such as Figure 4 As shown in the figure, the response data of the infrared focal plane detectors to be tested on two adjacent test machines to the light excitation signals provided by the low-temperature radiation source 323 and the high-temperature radiation source 324 can be collected simultaneously. With this test device, the response data of the infrared focal plane detectors to be tested on two adjacent test machines to the light excitation signals provided by the low-temperature radiation source and the high-temperature radiation source can be collected simultaneously. Compared with the existing method of only collecting the response data of one infrared focal plane detector under low-temperature or high-temperature radiation at a time, the utility model improves the test efficiency.

[0030] See also Figure 2 , which is a schematic diagram of the mobile module architecture of the infrared focal plane detector testing device provided by an embodiment of the utility model. Figure 2 As shown, the moving module 110 further includes a nozzle kit 212 and a three-axis motion module 213 .

[0031] Among them, the suction nozzle kit 212 is used to take and place the infrared focal plane detector to be tested. The suction nozzle kit 212 sucks the infrared focal plane detector to be tested in sequence according to the array arrangement order of the infrared focal plane detector to be tested on the material tray 111. After the infrared focal plane detector to be tested is placed on the material tray 111, the suction nozzle kit 212 sucks the infrared focal plane detector to be tested placed on the material tray 111 in sequence by suction. At this time, the material tray 111 does not move, and the suction nozzle kit 212 will shift. When the infrared focal plane detector is tested, the suction nozzle kit 212 will no longer generate suction to suck the infrared focal plane detector to be tested, so the infrared focal plane detector to be tested is placed back in the material tray 111.

[0032] The three-axis motion module 213 includes at least two support frames 215, a slide rail 216 and a gantry 217. The support frames 215 are arranged on the base 140 and are respectively arranged on both sides of the material tray 111, so as to fix the three-axis motion module 213 on the base 140 and enable the operation range of the three-axis motion module 213 to cover the area where the material tray 111 is located. The slide rail 216 is arranged between the at least two support frames 215; the gantry 217 can be directly arranged in the slide rail 216 or indirectly arranged in the slide rail 216 by using the sliding accessories matched with the slide rail 216, so as to connect the nozzle kit 212 and move under the drive of the slide rail 216. Specifically, the gantry 217 can be installed with two parallel guide rails to connect the nozzle kit 212.

[0033] Specifically, when the moving module 110 moves the infrared focal plane detector to be tested, the suction nozzle kit 212 first sucks the infrared focal plane detector to be tested placed on the material tray 111, and then the three-axis motion module 213 drives the suction nozzle kit 212 on the gantry 217 to move via the slide rail 216.

[0034] Optionally, the mobile module 110 further includes a code recognition unit, which is electrically connected to the control module 130 and is used to recognize the code of the infrared focal plane detector to be tested. Optionally, the base 140 is provided with a through hole, which is located in the area where the material tray 111 is located, and the code recognition unit is located directly below the through hole of the base 140, and is electrically connected to the control module 130, and is used to recognize the code of the infrared focal plane detector to be tested. The code of the infrared focal plane detector to be tested includes information such as the infrared focal plane detector model and production number. Specifically, after the suction nozzle 212 kit sucks up the infrared focal plane detector to be tested, the infrared focal plane detector to be tested is moved to the top of the code recognition unit through the three-axis motion module 213, and the code recognition unit scans the code area at the bottom of the packaging shell of the infrared focal plane detector to be tested and reads the code information, and then transmits the code information to the control module 130 for recording, which is used for the control module 130 to generate a report of the infrared focal plane detector to be tested, thereby monitoring the test completion status of the infrared focal plane detector to be tested.

[0035] Optionally, the mobile module also includes a visual unit 214, which is used to provide machine vision guidance for the mobile module 110, so that the mobile module 110 moves the infrared focal plane detector to be tested according to the result of the visual guidance. Specifically, the visual unit 214 includes a top camera 112, which is used to provide machine vision guidance for the mobile module 110, and the machine vision is to use a machine instead of the human eye to make measurements and judgments. The top camera 112 can be a charge coupled device (CCD) or a complementary metal oxide semiconductor (CMOS). It can be understood that the top camera 112 converts the infrared focal plane detector to be tested into an image signal through an image capture device, and then performs image processing, and finally obtains the morphological information of the infrared focal plane detector to be tested, and converts it into a digital signal according to the pixel distribution, brightness, color and other information of the morphological information. The top camera 112 can extract the features of the infrared focal plane detector to be tested by calculation based on these signals, and compare them with the pre-acquired feature template to determine whether the infrared focal plane detector to be tested is on the mobile module 110, and then control the movement of the three-axis motion module 213 according to the result of the determination. The features can be, for example, edges, morphology, etc. The top camera 112 can be set on the gantry 217.

[0036] Specifically, before starting the test, the top camera 112 should be debugged first. First, the top camera 112 should take a photo of the infrared focal plane detector to be tested placed in the material tray 111 of the moving module 110, and then perform image processing on the above photo, and finally extract the edge contour line information of the above photo and save it as a feature template. Before moving the infrared focal plane detector to be tested, the top camera 112 should first move to the position above the first row and first column of the material tray, first take a photo of the position of the material tray 111 where the infrared focal plane detector to be tested is placed, and then extract the edge contour line information of the photo and compare it with the feature template. If the comparison results are consistent, the infrared focal plane detector to be tested is on the material tray 111, and can be moved by the three-axis motion module 213; if the comparison results are inconsistent, the infrared focal plane detector to be tested is not at the position of the material tray 111, and at this time, the top camera 112 takes a photo and compares the next detector storage position in the detector storage array of the material tray 111.

[0037] Optionally, the top camera 112 can also identify whether the infrared focal plane detector to be tested is on the sub-test module by the above method. In this case, the top camera 112 should first take a photo of the infrared focal plane detector to be tested placed on the sub-test module, then perform image processing on the photo, and finally extract edge line information of the photo and save it as a template.

[0038] Optionally, the visual unit 214 also includes a bottom camera 113, which is used to extract image features of the infrared focal plane detector to be tested, and to extract image features on the sub-test module. The bottom camera 113 can be set below the through hole of the base 140, parallel to the code recognition unit, and is used to extract the bottom image features of the infrared focal plane detector to be tested, and the bottom image features can be, for example, edges, shapes, pins or stitches, etc.; and to extract image features on the sub-test module, and the bottom image features can be, for example, solder joints, pins or stitches, grooves, hole positions, etc. At this time, the bottom camera 113 should first take a photo with the image features, and extract the image features, and establish a registration template according to the relative physical positions of the image features to align the relative positions.

[0039] The following description will be based on the bottom image feature as a pin or a stitch. Before the nozzle kit 212 moves the infrared focal plane detector to be tested to a sub-test module through the three-axis motion module 213, the sub-test module can communicate with the control module 130 and send an "idle" state to the control module 130. Then the three-axis motion module 213 moves the infrared focal plane detector to be tested to the position directly above the through hole of the base 140, and the bottom camera 113 takes a photo of the pin or stitch of the infrared focal plane detector to be tested at this time to obtain a pin or stitch photo. Then, the image feature extraction is performed on the obtained pin or stitch photo, and then it is compared with the registration template. If the above comparison result is that the pin or pin position of the infrared focal plane detector to be tested is inconsistent with the pin or pin position in the registration template, the control module 130 will control the three-axis motion module 213 to move according to the above comparison result until the pin or pin position of the infrared focal plane detector to be tested is consistent with the pin or pin position in the registration template, and then the control module 130 will control the three-axis motion module 213 to move, and put the detector after the pin or pin of the infrared focal plane detector is corrected into the corresponding "idle" state sub-test module.

[0040] Optionally, the bottom camera 113 can also obtain the code of the infrared focal plane detector to be tested, and in this case, there is no need to set up a code recognition unit. Specifically, the code of the infrared focal plane detector to be tested can be recognized through the photos taken by the bottom camera 113 through image processing, and then the code is recognized through external technology to read the information such as the model and production number of the infrared focal plane detector in the code.

[0041] The radiation source module 121 can provide a light excitation signal to the infrared focal plane detector to be tested. Specifically, when the infrared focal plane detector to be tested is moved to the sub-test module in the "idle" state by the three-axis motion module 213, the radiation source module 121 tests the infrared focal plane detector to be tested by radiating infrared rays. Before the test, the sub-test module in the "idle" state will pre-process the infrared focal plane detector to be tested that is moved to the above-mentioned sub-test module. After the pre-processing is completed, the infrared focal plane detector to be tested can receive the infrared radiation of the radiation source module 121 for testing, and then the test module 120 obtains the test results. The pre-processing, for example, includes loading an electrical signal to the infrared focal plane detector to be tested, collecting the response data of the infrared focal plane detector to be tested, and waiting for the response data to be stable.

[0042] See also Figure 3 , which is a schematic diagram of the radiation source module architecture in the test module of the infrared focal plane detector test device provided by an embodiment of the utility model. Figure 3 As shown, the radiation source module 121 includes a radiation source mounting rail 322 and a rail sliding component, an optical signal radiation source, a motor 325, and a motor controller. The radiation source mounting rail 322 and its matching rail sliding component are arranged on the support frame 215. The optical signal radiation source is arranged on the radiation source mounting rail 322, and is used to provide an infrared light excitation signal and move under the drive of the radiation source mounting rail 322. The motor 325 and the motor controller are arranged at the end of the radiation source mounting rail 322, and are controlled and started by the control module 130 to drive the rail sliding component.

[0043] The optical signal radiation source may be, for example, a low-temperature radiation source 323 (e.g., equal to or lower than 20°C) and a high-temperature radiation source 324 (e.g., equal to or higher than 35°C). The selection criteria of the radiation source may refer to the "GB-T17444-2013 Test Method for Characteristic Parameters of Infrared Focal Plane Array". For example, the selected radiation source may be a black body, and the black body parameters include: the surface source black body temperature is 293K and 308K. The low-temperature radiation source 323 and the high-temperature radiation source 324 are arranged on the radiation source mounting rail 322 to provide an infrared radiation source.

[0044] See also Figure 4 , which is a test schematic diagram of a test module of an infrared focal plane detector test device provided by an embodiment of the utility model. Figure 4 As shown, the optical signal radiation source is selected from a 20°C low temperature radiation source 323, a 35°C high temperature radiation source 324 and 6 sub-test modules, and the 6 sub-test modules are numbered from left to right in the order of 1 to 6. The center distance H1 between the low temperature radiation source 323 and the high temperature radiation source 324 is equal to the optical center distance H2 of the apertures of two adjacent test machines.

[0045] After the preprocessing of the infrared focal plane detector to be tested is completed, the control module 130 issues a test instruction to the radiation source module 121. At this time, the motor is started, so that the guide rail sliding component drives the 20°C low-temperature radiation source 323 and the 35°C high-temperature radiation source 324 to move on the radiation source mounting guide rail 322, and each moving distance is equal to the optical center distance H2. At this time, the 20°C low-temperature radiation source 323 first tests the infrared focal plane detector to be tested on the sub-test module labeled 1, and collects the response data of the infrared focal plane detector to low-temperature radiation; then the radiation source moves, and the 35°C high-temperature radiation source 324 follows closely to test the infrared focal plane detector to be tested on the sub-test module labeled 1 that has just been tested by the 20°C low-temperature radiation source 323, and collects the response data of the infrared focal plane detector to high-temperature radiation. At this time, the 20°C low-temperature radiation source 323 tests the infrared focal plane detector to be tested on the sub-test module labeled 2, and collects the response data of the infrared focal plane detector to low-temperature radiation; in this way, each time the radiation source is moved, the response data of the infrared focal plane detectors on adjacent sub-test modules to the low-temperature radiation source and the high-temperature radiation source can be collected at the same time.

[0046] See also Figure 5 , which is a schematic diagram of the working process of the sub-test module of the infrared focal plane detector test device provided by an embodiment of the utility model. Figure 5 As shown, the sub-test module includes a test fixture and a test machine. The test fixture is used to carry the infrared focal plane detector to be tested transported by the mobile module. The test fixture can be understood as a test seat of the infrared focal plane detector, which is used to load the infrared focal plane detector to be tested. The test machine can pre-process the infrared focal plane detector to be tested transported by the mobile module. The pre-processing includes loading an electrical signal to the infrared focal plane detector to be tested, collecting the response data of the infrared focal plane detector to be tested, and waiting for the response data to be stable. The test machine includes a test circuit board and a data acquisition card. The test circuit board is arranged below the test fixture, and is used to generate electrical signals such as control signals, DC bias and clock pulses to drive the infrared focal plane detector to be tested, and load them to the infrared focal plane detector to be tested. The data acquisition card is used to collect the response data of the infrared focal plane detector to be tested. The test machine also includes an aperture, which is arranged above the test fixture and is used to limit the light flux. The test machine also includes a power supply, which is used to power the test circuit board.

[0047] Optionally, the sub-test module includes a plurality of test fixtures, each of which includes a single test station. At this time, a sub-test module corresponds to a plurality of test stations, and a plurality of infrared focal plane detectors to be tested can be tested. Optionally, the sub-test module includes a single test fixture, and the test fixture includes a single test station, and the sub-test modules corresponding to the plurality of test fixtures are electrically connected according to a preset mapping relationship. At this time, the sub-test module can be understood as an individual component that exists independently, and can be flexibly assembled and disassembled according to the number of test stations required. If one of the test stations cannot test the infrared focal plane detector to be tested, since a sub-test module corresponds to a test station, an infrared focal plane detector to be tested can be tested, and the test station with a problem can be found and locked by the sub-test module, and the sub-test module corresponding to the test station that cannot be tested is shielded by the control module 130, so as to realize the normal test of other sub-test modules. Since the response data of the infrared focal plane detector is unstable during the period from the power-on of the infrared focal plane detector to the thermal equilibrium, the existing manual single infrared focal plane detector test needs to wait for a long time before the infrared focal plane detector to be tested can be tested. The test device provided in this embodiment includes sub-test modules of multiple test fixtures or includes a single test fixture and multiple sub-test modules corresponding to the test fixtures electrically connected according to a preset mapping relationship. Through preprocessing, other infrared focal plane detectors to be tested can be loaded and unloaded or tested (parallel testing) during this waiting time, thereby making full use of this waiting time, facilitating large-scale batch testing, and improving testing efficiency.

[0048] The sub-test module is used to carry the infrared focal plane detector to be tested transported by the mobile module 110, drive the infrared focal plane detector to be tested to work, and collect test data. The test data is calculated according to the method of GB / T-17444-2013 for performance parameters such as noise equivalent temperature difference (NETD) response rate, response rate non-uniformity, noise, and dead point distribution diagram, and a test report is formed, which will be transmitted to the control module 130.

[0049] The control module 130 includes a programmable logic controller (PLC). The programmable logic controller communicates with the three-axis motion module 213, the visual unit 214 and the code recognition unit in accordance with the transmission control protocol (TCP) / Internet protocol (IP). The programmable logic controller communicates with the radiation source module 121 in accordance with Siemens' real-time industrial Ethernet (ProfiNet, PN) bus protocol. The programmable logic controller communicates with the sub-test module via Modbus protocol or transmission control protocol / network protocol.

[0050] It should be noted that the terms "including" and "having" and their variations involved in the above documents are intended to cover non-exclusive inclusions. The terms "first", "second", etc. are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence, unless the context clearly indicates, and it should be understood that the data used in this way can be interchanged under appropriate circumstances. The term "one or more" depends at least in part on the context, and can be used to describe features, structures or characteristics in a singular sense, or can be used to describe a combination of features, structures or features in a plural sense. The term "based on" can be understood as not necessarily intended to express a set of exclusive factors, but can alternatively, also at least in part depending on the context, allow the presence of other factors that are not necessarily explicitly described. In addition, the embodiments of the present invention and the features in the embodiments can be combined with each other without conflict. In addition, in the above description, the description of known components and technologies is omitted to avoid unnecessary confusion of the concept of the utility model. In the above embodiments, each embodiment focuses on the differences from other embodiments, and the same / similar parts between the embodiments can be referred to each other.

[0051] The above is only a preferred embodiment of the present invention. It should be pointed out that ordinary technicians in this technical field can make several improvements and modifications without departing from the principle of the present invention. These improvements and modifications should also be regarded as the protection scope of the present invention.

Claims

1. An infrared focal plane detector testing device, used to test an infrared focal plane detector to be tested, characterized in that: include: A moving module, used for moving and placing a plurality of the infrared focal plane detectors to be tested, wherein the moving module comprises a material tray; A test module, comprising at least one sub-test module and a radiation source module, wherein the sub-test module comprises a test fixture and a test machine, wherein the test fixture is used to carry the infrared focal plane detector to be tested transported by the mobile module, and the test machine can pre-process the infrared focal plane detector to be tested transported by the mobile module, wherein the pre-processing comprises loading an electrical signal to the infrared focal plane detector to be tested, collecting response data of the infrared focal plane detector to be tested, and waiting for the response data to be stable, wherein the radiation source module comprises an optical signal radiation source, and the optical signal radiation source can provide an optical excitation signal to the infrared focal plane detector to be tested so as to test the infrared focal plane detector to be tested, and wherein the test module is used to obtain a test result; A control module, electrically connected to the mobile module and the test module, for controlling the mobile module to take and place and controlling the test module to test; The optical signal radiation source further includes a low-temperature radiation source and a high-temperature radiation source, and the test machine further includes an aperture. For a test module having multiple test machines, the center distance between the low-temperature radiation source and the high-temperature radiation source is equal to the optical center distance of the apertures of two adjacent test machines, so that the response data of the infrared focal plane detectors to be tested on two adjacent test machines to the optical excitation signals provided by the low-temperature radiation source and the high-temperature radiation source can be collected simultaneously; The material tray is used to place the plurality of infrared focal plane detectors to be tested that have not been tested, and to place the plurality of infrared focal plane detectors to be tested that have been classified according to the test results after the test is completed.

2. The infrared focal plane detector testing device according to claim 1, characterized in that: The device further comprises: a base for placing the moving module, the testing module and the control module; The material tray is arranged on the base platform.

3. The infrared focal plane detector testing device according to claim 2, characterized in that: The material tray is fixed on the base by limiting the frame of the material tray.

4. The infrared focal plane detector testing device according to claim 1, characterized in that: The control module classifies the infrared focal plane detectors to be tested after the test according to the test results of the test module, so as to control the moving module to place the infrared focal plane detectors to be tested after the test on the corresponding material tray according to the classification results.

5. The infrared focal plane detector testing device according to claim 2, characterized in that: The mobile module also includes: A nozzle kit, used for taking and placing the infrared focal plane detector to be tested; A three-axis motion module, comprising at least two support frames, a slide rail and a gantry; The support frame is arranged on the base, and is used to fix the three-axis motion module on the base, so that the operation range of the three-axis motion module can cover the area where the material tray is located; The slide rail is arranged between the at least two support frames; The gantry is arranged in the slide rail, is used for connecting the suction nozzle kit, and moves under the drive of the slide rail.

6. The infrared focal plane detector testing device according to claim 5, characterized in that: The radiation source module also includes a radiation source mounting rail and a rail sliding component, a motor and a motor controller; The radiation source mounting rail and the rail sliding component are arranged on the support frame; The optical signal radiation source is arranged on the radiation source mounting rail, and is used to provide an infrared light excitation signal and move under the drive of the radiation source mounting rail; The motor and the motor controller are arranged at the end of the radiation source installation rail, and are controlled and started by the control module to drive the rail sliding component.

7. The infrared focal plane detector testing device according to claim 1, characterized in that: The test machine also includes a test circuit board and a data acquisition card; The test circuit board is arranged below the test fixture, and is used to generate a control signal, a DC bias voltage, and a clock pulse for driving the infrared focal plane detector to be tested to work, and loads the control signal to the infrared focal plane detector to be tested; The data acquisition card is used to collect the response data of the infrared focal plane detector to be tested; The aperture is arranged above the testing fixture to limit the light flux.

8. The infrared focal plane detector testing device according to claim 1, characterized in that: The sub-test module includes a plurality of test fixtures, each of which includes a single test station; or The sub-test module includes a single test fixture, the single test fixture includes a single test station, and a plurality of sub-test modules corresponding to the test fixtures are electrically connected according to a preset mapping relationship.

9. The infrared focal plane detector testing device according to claim 1, characterized in that: The mobile module also includes: The code recognition unit is electrically connected to the control module and is used to recognize the code of the infrared focal plane detector to be tested.

10. The infrared focal plane detector testing device according to claim 1, characterized in that: The mobile module also includes: The visual unit is used to provide machine vision guidance for the mobile module, so that the mobile module moves the infrared focal plane detector to be tested according to the result of the visual guidance.

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