Double-end engraving and milling machine with double probes

Abstract

The utility model provides a double-end engraving and milling machine with double probes, and relates to the technical field of numerical control machine tools. Comprising a workbench, a Y-axis driving assembly, an X-axis driving assembly, a Z-axis driving assembly and a probe assembly, the workbench is arranged on the Y-axis driving assembly in a sliding mode and driven by the Y-axis driving assembly to make reciprocating motion in the Y-axis direction. The X-axis driving assembly is located above the Y-axis driving assembly. The Z-axis driving assembly is arranged on the X-axis driving assembly in a sliding mode, and the Z-axis driving assembly is driven by the X-axis driving assembly to move in a reciprocating mode in the X-axis direction. The probe assembly is fixed to the outer side of the Z-axis driving assembly and comprises a probe protection box, a probe lifting air cylinder, a linear guide rail and a probe. The beneficial effects of the utility model are that a workpiece can be positioned and measured in the height direction, and the measuring and processing efficiency is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to numerical control machine tool technical field more specifically, the utility model relates to a double -end engraving machine with double probe. BACKGROUND

[0002] At present, various electronic consumer products on the market all need to be processed by numerical control machine tools, with the development of modern industry, especially the continuous development of precision machining technology, higher requirements are put forward for product positioning detection, size measurement and workpiece precision, therefore, online measurement of products on numerical control machine tools is particularly important in precision machining.

[0003] In the prior art, manual measurement of products is generally adopted, when it is necessary to measure the semi-finished product to be processed, the workpiece needs to be taken off from the worktable for measurement, and the semi-finished product needs to be fixed on the worktable again for reprocessing, so that the measurement process is very cumbersome and the processing efficiency is affected. Moreover, manual measurement is low in efficiency and low in measurement accuracy. SUMMARY

[0004] In order to overcome the shortcomings of the prior art, the application provides a double-end engraving machine with double probes, which can position and measure the height direction of the workpiece, and the efficiency of measurement and processing is improved compared with the manual measurement method.

[0005] The technical scheme adopted by the application to solve the technical problems is: a double-end engraving machine with double probes, which is improved in that it comprises a worktable, a Y-axis driving assembly, an X-axis driving assembly, a Z-axis driving assembly and a probe assembly;

[0006] The worktable is slidably arranged on the Y-axis driving assembly and is driven by the Y-axis driving assembly to reciprocate in the Y-axis direction; the X-axis driving assembly is located above the Y-axis driving assembly; the Z-axis driving assembly is slidably arranged on the X-axis driving assembly and is driven by the X-axis driving assembly to reciprocate in the X-axis direction;

[0007] The probe assembly is fixed to the outer side of the Z-axis driving assembly, and the probe assembly comprises a probe protection box, a probe lifting cylinder, a linear guide rail and a probe; the linear guide rail is fixed in the probe protection box in the vertical direction, and the probe is slidably mounted on the linear guide rail; the probe lifting cylinder is fixedly mounted on the probe protection box and located above the linear guide rail, and the cylinder rod top end of the probe lifting cylinder is fixedly connected with the probe; the probe comprises a probe pin extending towards the worktable.

[0008] In the above structure, the probe assembly further comprises a probe mounting block, a sliding block is slidably mounted on the linear guide rail, and the probe mounting block is fixedly mounted on the sliding block; the probe is fixed to the outer side of the probe mounting block.

[0009] In the above structure, the probe protection box comprises a top plate, a back plate, side vertical plates and a bottom plate;

[0010] The top plate, the bottom plate and the plurality of side vertical plates form a box-shaped probe protection box, the linear guide rail is fixed to the inner wall of the back plate, the probe lifting cylinder is fixed to the top plate, and the cylinder rod of the probe lifting cylinder extends into the interior of the probe protection box; the bottom plate is provided with a through hole for the probe to extend out.

[0011] In the above structure, a sealing plate cylinder is fixedly installed on the outer wall of the side vertical plate, a protection box sealing plate is installed on the cylinder rod of the sealing plate cylinder, and the through hole is opened or closed through the protection box sealing plate.

[0012] In the above structure, a probe support plate is fixedly arranged on the outer wall of the back plate, and the probe support plate is fixed to the outer side of the Z-axis driving assembly.

[0013] In the above structure, the double-head fine carving machine with double probes further comprises a bed body and a gantry, the Y-axis driving assembly is arranged on the bed body, the gantry is fixed to the bed body and located above the Y-axis driving assembly, and the X-axis driving assembly is fixed to the gantry in the X-axis direction.

[0014] In the above structure, two groups of Z-axis driving assemblies are arranged side by side on the X-axis driving assembly, and each group of Z-axis driving assemblies is fixedly installed with a probe assembly.

[0015] The probe assembly can position and detect the height direction of the workpiece, and the detection can be performed before, during and after the product machining, without the need to take the product off the workbench during the detection, so that the detection efficiency is improved, and the machining efficiency of the workpiece is improved compared with the manual measurement mode. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a structural schematic view of the double-head fine carving machine with double probes.

[0017] Figure 2 It is a structural schematic view of the probe assembly of the double-head fine carving machine with double probes.

[0018] In the figure: bed body 10, gantry 20, workbench 30, Y-axis drive assembly 40, X-axis drive assembly 50, Z-axis drive assembly 60, machining spindle 601, probe assembly 70, probe protection box 701, top plate 7011, back plate 7012, side stand 7013, bottom plate 7014, probe lifting cylinder 702, linear guide rail 703, probe 704, probe 705, probe mounting block 706, sealing plate cylinder 707, protection box sealing plate 708, probe support plate 709. DETAILED DESCRIPTION

[0019] The application will be further described below in conjunction with the drawings and examples.

[0020] The concept, specific structure and technical effects of the present application will be described clearly and completely in conjunction with the examples and drawings, so as to fully understand the purpose, features and effects of the present application. Obviously, the described examples are only a part of the examples of the present application, but not all the examples. Based on the examples of the present application, other examples obtained by those skilled in the art without creative labor are within the protection scope of the present application. In addition, all the coupling / connection relationships involved in the patent do not mean that the components are directly connected, but means that a better coupling structure can be composed by adding or reducing coupling accessories according to the specific implementation situation. The technical features in the present application can be combined interactively without conflict.

[0021] Referring to Figure 1 , Figure 2 The utility model discloses a double -end engraving machine of double probe, specifically, this double -end engraving machine of double probe includes bed body 10, gantry 20, workbench 30, Y -axis drive assembly 40, X -axis drive assembly 50, Z -axis drive assembly 60 and probe assembly 70, Y -axis drive assembly 40 sets up on bed body 10, workbench 30 is slidably arranged on Y -axis drive assembly 40, and through Y -axis drive assembly 40 drive, make it reciprocating motion in Y -axis direction. The gantry 20 is fixed on the bed body 10 and is located the top of Y -axis drive assembly 40, and X -axis drive assembly 50 is then along X -axis direction fixed on the gantry 20, Z -axis drive assembly 60 is slidably arranged on X -axis drive assembly 50, and through the drive of X -axis drive assembly 50, makes Z -axis drive assembly 60 reciprocating motion in X -axis direction, in this embodiment, two groups of Z -axis drive assembly 60 are arranged side by side on X -axis drive assembly 50, and each group of Z -axis drive assembly 60 is fixedly installed one probe assembly 70.

[0022] Continuing to refer to Figure 1As shown, through the above structure, the workbench 30 can be driven by the Y-axis drive assembly 40 to move along the Y-axis direction; the Z-axis drive assembly 60 comprises a machining spindle 601, and in the present scheme, two groups of Z-axis drive assemblies 60 comprise two machining spindles 601. The machining spindle 601 can reciprocate in the X-axis direction and the Z-axis direction under the cooperation of the X-axis drive assembly 50 and the Z-axis drive assembly 60, and can move in the XYZ three directions in cooperation with the workbench 30, so as to process the workpiece on the workbench 30; the probe assembly 70 is fixed to the front end of the Z-axis drive assembly 60, and the probe assembly 70 can be used for positioning and detecting the height direction of the workpiece. The detection can be carried out before, during and after the product processing, and the product does not need to be taken off from the workbench 30 during the detection process. Therefore, the detection efficiency is improved, and the workpiece processing efficiency is improved compared with the manual measurement mode.

[0023] In addition, for the above-mentioned X-axis drive assembly 50, Y-axis drive assembly 40 and Z-axis drive assembly 60, a structure form that a motor drives a screw rod to rotate and drives a sliding block to reciprocate on a sliding rail is adopted. Since this structure is relatively common in the field, the structure will not be described in detail in the present embodiment.

[0024] For the probe assembly 70, as shown in Figure 1 , Figure 2 The utility model provides a specific embodiment, in the embodiment, the probe assembly 70 includes probe protection box 701, probe lifting cylinder 702, linear guide rail 703 and probe 704, the linear guide rail 703 is fixed in the probe protection box 701 along the vertical direction, the probe 704 is slidably installed on the linear guide rail 703, the probe lifting cylinder 702 is fixedly installed on the probe protection box 701 and is located above the linear guide rail 703, the cylinder rod top end of the probe lifting cylinder 702 is fixedly connected with the probe 704, and the probe 704 comprises a probe 705 extending towards the workbench 30. During work, the probe is driven by the probe lifting cylinder 702 to realize lifting movement on the linear guide rail 703, drives the probe 704 and the probe 705 to realize lifting movement, and then through the cooperation of the X-axis drive assembly 50, the Y-axis drive assembly 40 and the Z-axis drive assembly 60, the probe 705 can detect the specified position of the workpiece. As for the detection mode of the probe 704, in a specific example, a sensor or the like is arranged in the probe 704. When the probe 705 contacts the surface of the workpiece, a feedback signal is generated in the probe, which is transmitted to a data processing terminal such as a computer. The measurement data can be obtained by analyzing the data. Since this part is a mature technology in the prior art, it will not be described in detail in the present embodiment.

[0025] In combination Figure 2 As shown in the above embodiment, further, the probe assembly 70 further comprises a probe mounting block 706, a sliding block is slidingly mounted on the linear guide rail 703, and the probe mounting block 706 is fixedly mounted on the sliding block; the probe is fixed outside the probe mounting block 706. As for the specific structure of the probe protection box 701, in the embodiment, the probe protection box 701 comprises a top plate 7011, a back plate 7012, side standing plates 7013 and a bottom plate 7014; the top plate 7011, the bottom plate 7014 and the plurality of side standing plates 7013 are enclosed to form the box-shaped probe protection box 701, the linear guide rail 703 is fixed on the inner wall of the back plate 7012, the probe lifting cylinder 702 is fixed on the top plate 7011, and the cylinder rod of the probe lifting cylinder 702 extends into the interior of the probe protection box 701; the bottom plate 7014 is preformed with a through hole for the probe 705 to extend out. A sealing plate cylinder 707 is fixedly mounted on the outer wall of the side standing plate 7013, a protection box sealing plate 708 is mounted on the cylinder rod of the sealing plate cylinder 707, and the through hole is opened or closed through the protection box sealing plate 708. In addition, a probe support plate 709 is fixedly arranged on the outer wall of the back plate 7012, and the probe support plate 709 is fixed outside the Z-axis driving assembly 60.

[0026] The above is a specific description of the preferred embodiment of the application, but the application is not limited to the above-mentioned embodiment, and those skilled in the art can make various equivalent modifications or replacements without departing from the spirit of the application, and these equivalent modifications or replacements are all included in the scope defined by the claims of the present application.

Claims

1. A double-head engraving machine with double probes, characterized in that, It includes a worktable, a Y-axis drive assembly, an X-axis drive assembly, a Z-axis drive assembly, and a probe assembly; The worktable is slidably mounted on the Y-axis drive assembly and is driven by the Y-axis drive assembly to reciprocate in the Y-axis direction. The X-axis drive assembly is located above the Y-axis drive assembly; the Z-axis drive assembly is slidably mounted on the X-axis drive assembly, and is driven by the X-axis drive assembly to reciprocate in the X-axis direction. The probe assembly is fixed to the outside of the Z-axis drive assembly. The probe assembly includes a probe protective box, a probe lifting cylinder, a linear guide rail, and a probe. The linear guide rail is fixed vertically inside the probe protective box, and the probe is slidably mounted on the linear guide rail. The probe lifting cylinder is fixedly mounted on the probe protective box and located above the linear guide rail. The top end of the cylinder rod of the probe lifting cylinder is fixedly connected to the probe. The probe includes a probe extending towards the worktable.

2. The double-head engraving machine with double probes according to claim 1, characterized in that, The probe assembly also includes a probe mounting block, a slider is slidably mounted on the linear guide rail, and the probe mounting block is fixedly mounted on the slider; the probe is fixed to the outside of the probe mounting block.

3. The dual-head engraver with dual probes of claim 1, wherein, The probe protection box includes a top plate, a back plate, side plates, and a bottom plate; The top plate, bottom plate, and multiple side plates are assembled to form a box-shaped probe protection box. The linear guide rail is fixed to the inner wall of the back plate. The probe lifting cylinder is fixed to the top plate, and its cylinder rod extends into the probe protection box. The bottom plate has a through hole for the probe to extend out.

4. The double-head engraving machine with double probes according to claim 3, characterized in that, A sealing cylinder is fixedly installed on the outer wall of the side plate. A protective box sealing plate is installed on the cylinder rod of the sealing cylinder, and the through hole is opened or closed through the protective box sealing plate.

5. The dual-head engraver with dual probes of claim 3, wherein, A probe support plate is fixedly installed on the outer wall of the back plate, and the probe support plate is fixed to the outside of the Z-axis drive assembly.

6. The dual-head engraver with dual probes of claim 1, wherein, The dual-head engraving machine with dual probes also includes a bed and a gantry frame. The Y-axis drive assembly is mounted on the bed, the gantry frame is fixed on the bed and located above the Y-axis drive assembly, and the X-axis drive assembly is fixed on the gantry frame along the X-axis direction.

7. The dual-head engraver with dual probes of claim 6, wherein, The X-axis drive assembly has two sets of Z-axis drive assemblies arranged side by side, and each set of Z-axis drive assemblies has a probe assembly fixedly installed on it.

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