High-frequency transformer short circuit testing device

Abstract

The utility model discloses a high-frequency transformer short circuit testing device, which comprises a base, a fixed module and a slidable module, an adjustable distance exists between the fixed module and the slidable module, detachable female headers are arranged on the fixed module and the slidable module, the whole device is made of plastic parts, and the fixed module and the slidable module are integrally connected. A plurality of hollow pipeline structures which are uniformly distributed are arranged in the base, each hollow pipeline is provided with a jack, the base is provided with control buttons which are in one-to-one correspondence with the jacks on the detachable female header, and one side of the whole base is connected with a test wire which is used for being connected with an external test device. According to the utility model, different pin spacing requirements can be met, and meanwhile, the device can flexibly cope with the change of various pin row pitches.

Description

TECHNICAL FIELD

[0001] The utility model relates to high frequency transformer testing arrangement field especially relates to a high frequency transformer short circuit testing device. BACKGROUND

[0002] With the development of power electronics technology, high frequency transformer is widely used in switching power supply, inverter, electronic ballast and other power electronic equipment because of its small size, light weight and high efficiency. Especially in low power occasions, high frequency transformer is one of the indispensable key components, and the performance of high frequency transformer directly affects the stability and reliability of the whole system. In order to ensure the quality of high frequency transformer, the testing in the sample preparation stage is particularly important, especially the testing of short circuit inductance. Low power high frequency transformer usually adopts sandwich winding method, which can effectively reduce the influence of parasitic capacitance and improve the working frequency of transformer. In the sample preparation stage, the performance indicators of high frequency transformer need to be tested, including the measurement of important parameters such as short circuit inductance.

[0003] The traditional testing method is to manually short the untested pin, and then measure the inductance value of the specified pin. This method is acceptable when there are few samples, but it is low in efficiency and prone to errors when batch testing.

[0004] However, the inventors of the present application found that the above-mentioned technology at least has the following technical problems in the process of implementing the technical scheme of the embodiments of the present application:

[0005] 1. Different pin spacing will make the traditional testing device in the prior art difficult to adapt to various products;

[0006] 2. High frequency transformer has great testing difficulty and low testing efficiency when testing short circuit inductance in the sample preparation stage. SUMMARY

[0007] The embodiments of the present application provide a high frequency transformer short circuit testing device and a control system thereof, which solve the problems of difficulty in adapting to different pin key parameters, great testing difficulty and low efficiency when testing short circuit inductance in the sample preparation stage of high frequency transformer in the prior art, and achieve the technical effects of enhancing the adaptability of the testing device, improving the testing efficiency and ensuring the testing accuracy.

[0008] The present application provides a high frequency transformer short circuit testing device,

[0009] comprising: a base;

[0010] a fixing module fixedly installed on one side above the base;

[0011] a slidable module arranged on the other side of the fixing module, wherein the slidable module can

[0012] Sliding module; wherein, there is adjustable distance between the fixed module and the slidable module;

[0013] Detachable busbar, which is placed above the fixed module and the slidable module, and,

[0014] The fixed module and the slidable module are connected;

[0015] Control button, which is fixedly installed on the base and located at one end of the base, and has a distance from the fixed module and the slidable module;

[0016] Test line, which is fixedly installed on the side of the base and located at the

[0017] other side of the control button; further, there is a guide rail groove inside the base and arranged below the slidable

[0018] module;

[0019] Further, the slidable module is further provided with a double-motor-driven sliding rail inside, which is controlled by a motor assembly;

[0020] Further, the detachable busbar is composed of a plastic part outside, which prevents conduction, and there is a hollow and uniformly arranged pipeline structure in the plastic part, and the jack is located in the hollow pipeline of the plastic part and corresponds to the conductive metal pin below one by one;

[0021] Further, the fixed module and the slidable module are the same rectangular

[0022] structure; further, the jacks can be multiple and arranged in correspondence with the control button

[0023] ;

[0024] Further, the double-motor-driven sliding rail is a T-shaped structure, the motor assembly is provided with a motor mounting seat, the motor mounting seat is connected with the sliding rail, the double-motor-driven sliding rail is provided with a transmission gap communicated to the inside, and the control signal input source of the motor assembly is an MCU;

[0025] Further, the guide rail groove is a reverse T-shaped structure, and the gap between the guide rail grooves is greater than the transmission gap of the sliding rail;

[0026] The one or more technical solutions provided in the embodiments of the application have at least the following technical effects or advantages:

[0027]

[0028] ​1. Due to the adoption of detachable modular headers, the problem of traditional test devices being unable to adapt to various products due to different pin pitches is effectively solved, thereby enabling support for the testing needs of various products.

[0029] 2. Due to the adoption of an adjustable spacing design, the problem of high testing difficulty and low efficiency in short-circuit inductance testing of high-frequency transformers during the sample preparation stage is effectively solved, thereby improving the flexibility and efficiency of testing. Attached Figure Description

[0030] Figure 1 This is a perspective view of the external structure of the test device in the embodiments of this application;

[0031] Figure 2 This is a perspective view of the detachable nut structure in the embodiments of this application;

[0032] Figure 3 This is a perspective view of the external structure of the test device for exchanging the fixed module and the sliding module in an embodiment of this application.

[0033] Figure 4 This is a perspective view of the structure of the dual-drive motor slide rail in the embodiment of this application;

[0034] Figure 5 This is a cross-sectional view of the guide rail groove in an embodiment of this application;

[0035] In the diagram: (1) base; (2) fixed module; (3) sliding module; (4) detachable socket;

[0036] (5) Control button; (6) Test lead; (7) Plastic part; (8) Socket; (9) Conductive metal pin; (10) Dual motor drive slide rail; (11) Motor assembly; (12) Gearbox; (13) Guide rail groove; Detailed Implementation

[0037] To better understand the above technical solutions, the following detailed description, in conjunction with the accompanying drawings and specific embodiments, will illustrate the technical solutions. Obviously, the described embodiments are merely some, not all, of the embodiments of this utility model. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without creative effort are within the scope of protection of this utility model.

[0038] Example 1

[0039] like Figure 1 and Figure 2As shown, including base (1), fixed module (2) is arranged in the left side of base (1), and the slidable module (3) is arranged in the right side of base (1), and there is an adjustable spacing between the fixed module (2) and the slidable module (3), by sliding the slidable module (3), the adjustable spacing is increased or decreased, so as to solve the problem of different pin spacing of high frequency transformer, a detachable busbar (4) is arranged above the fixed module (2) and the slidable module (3), the outer part of the detachable busbar (4) is composed of a plastic part (7), the inner part is a hollow pipe structure uniformly distributed, each hollow pipe has a jack (8), each jack (8) has a corresponding conductive metal pin (9) below it

[0040] The jack (8) can be multiple, preferably 6, according to the different spacing of high frequency transformer pins, the detachable module can be replaced with different pin spacing busbar (4), a row of control buttons (5) are arranged on the left side of base (1), which is a cuboid structure, the control buttons (5) and the detachable busbar (4) have a control circuit board logic, and the control buttons (5) and the fixed module (2) and the slidable module (3) are a certain distance apart, the control buttons (5) are labeled 1-6 from left to right, and the jacks (8) on the detachable busbar (4) are in one-to-one correspondence.

[0041] In use, by pressing the control button (5) labeled 1, the conductive metal pins (9) corresponding to the control buttons (5) represented by 2-6 are short-circuited, so as to control the pins (9) to be tested, the test line (6) is connected to the base (1) on the right side of the base (1), the test line (6) is used to transmit the signal of the selected pin of the high frequency transformer to the external test instrument, so as to measure the inductance value.

[0042] Example two

[0043] As shown in Figure 2 And Figure 3 In the embodiments of the present application, the fixed module (2) and the slidable module (3) can be replaced, without affecting the use of the device, specifically:

[0044] The utility model relates to a high frequency transformer pin spacing adjustable test device, including base (1), the slidable module (3) is arranged in the left lateral direction of base (1), and the fixed module (2) is arranged in the right lateral direction of base (1), and there is adjustable spacing between fixed module (2), by the sliding of slidable module (3), drive adjustable spacing to be bigger or smaller, to solve the problem of different high frequency transformer pin spacing, and a detachable busbar (4) is arranged respectively in the upper position of fixed module (2) and slidable module (3), the outside of detachable busbar (4) is formed by plastic piece (7), and the inside presents the hollow pipe structure of uniform distribution, and each hollow pipe exists the jack (8), and the lower of each jack (8) exists the conductive metal pin (9) corresponding to it, the jack (8) can be multiple, and the detachable module is preferably 8, according to the different high frequency transformer pin spacing, can adopt detachable module to replace the busbar (4) of different pin spacing, and a row of control buttons (5) are arranged in the left position of base (1), and the control button (5) is cuboid three-dimensional structure, and there is control circuit board logic between control button (5) and detachable busbar (4), and control button (5) and fixed module (2) and slidable module (3) present a certain distance, and the control button (5) is respectively marked as 1-6 from left to right, and the jack (8) on detachable busbar (4) presents the one-to-one correspondence form.

[0045] When using, by the control button (5) of mark 1, let the conductive metal pin (9) corresponding to the control button (5) of mark 2-6 short circuit, to control the pin (9) to be tested, and the test line (6) is connected with base (1) in the right lateral direction of base (1) as a whole, and the test line (6) is used to transmit the signal of selected pin of high frequency transformer to external testing instrument, so as to carry out the measurement of inductance value.

[0046] Example three

[0047] As shown in Figure 4 and Figure 5 Double motor drive slide rail (10) is arranged to be installed in the inside of slidable module (3), and the double motor drive slide rail (10) includes slide rail I and slide rail II, and the slide rail I and slide rail II are symmetrical in structure and present T-shaped structure, and the slide rail I and slide rail II have transmission gaps communicated to the inside respectively, and the slide rail I and slide rail II are respectively provided with motor assembly (11) for driving respective slide rails, and the motor assembly (11) is vertically arranged, and the transmission assembly of slide rail includes gear box (12), and guide rail groove (13) is arranged in the inside of base (1) and presents inverted T structure, and there is a gap between the guide rail groove (13), and the gap between the guide rail groove (13) is greater than the transmission gap of slide rail I and slide rail II.

[0048] When the motor assembly (11) receives the signal of the ECU module, the motor drives the slide rails I and II to move left and right on the guide rail groove (13) through the gear box (13) inside the connection of the slide rails I and II, thereby realizing the left and right movement of the slidable module (3).

[0049] The above merely provides one specific embodiment of the present application, but not all the embodiments. The protection scope of the present application is not limited to this. All other embodiments obtained by those skilled in the art without creative labor, any modification, equivalent replacement and improvement within the spirit and principle of the present application, etc. should be included in the protection scope of the present application.

Claims

1. A short-circuit test device for a high-frequency transformer, characterized in that The short circuit test device comprises: a base (1), wherein the base (1) comprises guide rail grooves (13) arranged inside the base, a fixed module (2) fixedly installed on one side above the base (1), a slidable module (3) arranged on the other side of the fixed module (2), wherein the slidable module (3) comprises a double-motor driving slide rail (10) arranged inside the slidable module (3), a motor assembly (11) above the double-motor driving slide rail (10), wherein there is an adjustable distance between the fixed module (2) and the slidable module (3), a detachable busbar (4) above the fixed module (2) and the slidable module (3) and connected with the fixed module (2) and the slidable module (3), wherein the detachable busbar (4) comprises plastic pieces (7) with hollow and uniformly arranged pipeline structures, jacks (8) in the pipeline structures of the plastic pieces (7), and conductive metal pins (9) corresponding to the jacks (8) above, a control button (5) fixedly installed on the base (1) and located at one end of the base (1) and away from the fixed module (2) and the slidable module (3), a test line (6) fixedly installed on the side of the base (1) and located on the other side of the control button (5).

2. The short-circuit test device for a high-frequency transformer according to claim 1, wherein The fixed module (2) and the slidable module (3) are the same cuboid structure.

3. The short-circuit test apparatus for a high-frequency transformer according to claim 1, wherein The jacks (8) are several and correspondingly distributed with the control button (5).

4. The short-circuit test apparatus for a high-frequency transformer according to claim 1, wherein The double-motor driving slide rail (10) is a T-shaped structure, the motor assembly (11) is provided with a motor mounting seat connected with the slide rail (10), the double-motor driving slide rail (10) is provided with a transmission gap communicated to the inside, and the control signal input source of the motor assembly (11) is an MCU.

5. The short-circuit test apparatus for a high-frequency transformer according to claim 1, wherein The guide rail grooves (13) are arranged below the slidable module (3), the guide rail grooves (13) are a reverse T-shaped structure, and the gap between the guide rail grooves (13) is greater than the transmission gap of the slide rail (10).

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