Parallelism measuring device of large-size outside micrometer

Abstract

A parallelism measuring device for a large-size outside micrometer belongs to the technical field of measuring instruments and comprises a micrometer body, mounting seats are arranged at two ends of the micrometer body, an upper measuring head is arranged on the mounting seat at one end of the micrometer body, and a lower measuring head is arranged on the mounting seat at the other end of the micrometer body. A measuring assembly is arranged between the upper measuring head and the lower measuring head. The measuring assembly comprises a dial gauge arranged between the upper measuring head and the lower measuring head, the bottom of the dial gauge is provided with a detection probe, the bottom of the detection probe is connected with a detection rod, the bottom of the detection rod is connected with a second connecting piece, the dial gauge is provided with a first connecting piece, and the first connecting piece is connected with the upper measuring head on the micrometer body. And the second connecting piece is connected with the lower measuring head on the micrometer body. A user can conveniently detect the parallelism of two measuring surfaces of the measuring head through the measuring assembly, and the user can conveniently observe the change of a pointer on a dial plate of the dial gauge in real time through the reflection mechanism in the detection process.

Description

Technical Field

[0001] This utility model belongs to the field of measuring instrument technology, specifically relating to a parallelism measuring device for a large-size outside micrometer. Background Technology

[0002] The outside micrometer is an indispensable high-precision measuring tool in the fields of mechanical manufacturing and precision machining, specifically designed for the accurate measurement of the outer diameter of workpieces. Its core structure consists of a measuring anvil and a micrometer screw forming a precision measuring surface. Fine adjustments to the measuring interval are achieved by rotating the micrometer sleeve. Combined with a dual-scale system of a fixed sleeve and a micrometer thimble, it can accurately read values ​​with millimeter-level and 0.01-millimeter-level precision, and can estimate to 0.001 mm. In use, the zero point must first be calibrated to ensure accurate measurement reference. Then, the workpiece surface is gently clamped, the micrometer sleeve is rotated to the contact point and locked. Finally, the precise dimension is calculated using the millimeter graduations on the fixed sleeve and the number of divisions on the micrometer thimble.

[0003] The measuring head of an outside micrometer is designed with a flat, smooth surface to ensure accurate contact with the workpiece surface during measurement. However, during prolonged use, frequent contact with the workpiece surface can cause wear on the two measuring heads. This wear can lead to the measuring head surfaces losing their original parallelism, thus adversely affecting measurement accuracy. Therefore, to ensure the accuracy of measurement results, it is necessary to check and calibrate the parallelism of the two planes of the measuring head after prolonged use of the outside micrometer. To this end, a parallelism measuring device for large-size outside micrometers is proposed. Utility Model Content

[0004] To address the shortcomings of existing technologies, a parallelism measuring device for a large-size outside micrometer is provided, comprising a micrometer body, mounting bases at both ends of the micrometer body, an upper measuring head on the mounting base at one end of the micrometer body, and a lower measuring head on the mounting base at the other end of the micrometer body, with a measuring assembly between the upper and lower measuring heads.

[0005] Furthermore, the measuring component includes an indicator disposed between the upper measuring head and the lower measuring head. The bottom of the indicator is provided with a detection probe that produces a slight change in compression or elongation when subjected to force. The bottom of the detection probe is connected to a detection rod, and the bottom of the detection rod is connected to a second connector. The indicator is provided with a first connector, which is connected to the upper measuring head on the micrometer body, and the second connector is connected to the lower measuring head on the micrometer body.

[0006] Furthermore, both the first and second connectors have rotating grooves at their inner edges, and detection balls are rotatably mounted on the rotating grooves. The first connector is connected to the surface of the upper measuring head through the detection balls, and the second connector is connected to the surface of the lower measuring head through the detection balls.

[0007] Furthermore, the detection rod is equipped with a differential head.

[0008] Furthermore, a reflective mechanism is provided at the bottom of the indicator.

[0009] Furthermore, the reflecting mechanism includes a connecting seat fixedly installed at the bottom of the indicator, a rotating arm rotatably mounted on the connecting seat, a mounting frame rotatably mounted at the end of the rotating arm, and a reflecting mirror fixedly mounted on the mounting frame.

[0010] Furthermore, both the connecting seat and the mounting frame are provided with mounting holes, and both ends of the rotating arm are fixedly mounted with movable shafts. One end of the rotating arm is rotatably mounted on the mounting hole of the connecting seat through the movable shaft, and the other end of the rotating arm is rotatably mounted on the mounting hole of the mounting frame through the movable shaft.

[0011] Furthermore, a resistance rubber ring is fitted onto the movable shaft.

[0012] Furthermore, the mounting frame has a slot, through which the reflector is mounted on the mounting frame.

[0013] The beneficial effects of this utility model are:

[0014] 1. In application, the first connecting piece must first be connected to the upper measuring head of the micrometer body, while the second connecting piece is connected to the lower measuring head. It is essential to ensure that the detection ball on the connecting piece is in contact with the surface of the measuring head. Subsequently, rotating the detection rod causes the detection ball to roll along the edge of the measuring head surface. If the measuring head surface is uneven, the detection ball will experience vertical displacement during rolling. This displacement can be detected by the indicator and presented as pointer deflection, facilitating the user's inspection of the parallelism between the two planes of the measuring head. Furthermore, by rotating the micrometer head, the distance between the first and second connecting pieces can be adjusted to accommodate measurement needs at different positions.

[0015] 2. In this application, the rotating arm and the mounting frame are angled via a movable shaft. After adjustment, a resistance ring restricts the movement of the rotating arm and the mounting frame to ensure that the reflector can be adjusted to a suitable angle. When the dial of the indicator rotates into the micrometer body, the reflector can effectively reflect the dial, allowing the user to monitor the pointer's changes in real time. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0017] Figure 2 This is a schematic diagram of the measuring component structure of this utility model;

[0018] Figure 3 This utility model Figure 2 A schematic diagram of the partial structure at point A;

[0019] Figure 4 This is a schematic diagram of the reflective mechanism of this utility model.

[0020] The diagram shows the following components: 1. Micrometer body; 2. Mounting base; 3. Upper measuring head; 4. Lower measuring head; 5. Measuring assembly; 501. First connecting piece; 502. Detection ball; 503. Indicator; 504. Detection probe; 505. Micrometer head; 506. Detection rod; 507. Second connecting piece; 6. Reflection mechanism; 601. Connecting base; 602. Mounting hole; 603. Movable shaft; 604. Resistance rubber ring; 605. Rotating arm; 606. Mounting frame; 607. Reflector. Detailed Implementation

[0021] A parallelism measuring device for a large-size outside micrometer, such as... Figures 1-4 As shown, the micrometer body 1 is provided with mounting bases 2 at both ends. An upper measuring head 3 is provided on the mounting base 2 at one end of the micrometer body 1, and a lower measuring head 4 is provided on the mounting base 2 at the other end of the micrometer body 1. A measuring component 5 is provided between the upper measuring head 3 and the lower measuring head 4.

[0022] The measuring component 5 includes an indicator 503 disposed between the upper measuring head 3 and the lower measuring head 4. The bottom of the indicator 503 is provided with a detection probe 504 for identifying the flatness of the two surfaces of the measuring head. The indicator (503) identifies the slight changes in compression or elongation that occur when the detection probe (504) is subjected to force. The bottom of the detection probe 504 is connected to a detection rod 506, and the bottom of the detection rod 506 is connected to a second connector 507. The indicator 503 is provided with a first connector 501. The first connector 501 is connected to the upper measuring head 3 on the micrometer body 1, and the second connector 507 is connected to the lower measuring head 4 on the micrometer body 1.

[0023] The first connector 501 and the second connector 507 are both provided with rotating grooves at their inner edges. Detection balls 502 are rotatably mounted on the rotating grooves. The first connector 501 is connected to the surface of the upper measuring head 3 through the detection balls 502, and the second connector 507 is connected to the surface of the lower measuring head 4 through the detection balls.

[0024] The detection rod 506 is equipped with a differential head 505.

[0025] The bottom of the indicator 503 is provided with a reflective mechanism 6.

[0026] The reflective mechanism 6 includes a connecting seat 601 fixedly installed at the bottom of the indicator 503, a rotating arm 605 rotatably installed on the connecting seat 601, a mounting frame 607 rotatably installed at the end of the rotating arm 605, and a reflector 606 fixedly installed on the mounting frame 607.

[0027] The connecting seat 601 and the mounting frame 607 are both provided with mounting holes 602. Both ends of the rotating arm 605 are fixedly mounted with movable shafts 603. One end of the rotating arm 605 is rotatably mounted on the mounting hole 602 of the connecting seat 601 through the movable shaft 603, and the other end of the rotating arm 605 is rotatably mounted on the mounting hole of the mounting frame 607 through the movable shaft.

[0028] The movable shaft 603 is fitted with a resistance rubber ring 604.

[0029] The mounting frame 607 has a slot, and the reflector 606 is mounted on the mounting frame 607 through the slot.

[0030] like Figure 1 As shown, this utility model provides a technical solution for a parallelism measuring device for a large-size outside micrometer, including a micrometer body 1, mounting seats 2 at both ends of the micrometer body 1, an upper measuring head 3 on the mounting seat 2 at one end of the micrometer body 1, a lower measuring head 4 on the mounting seat 2 at the other end of the micrometer body 1, a measuring component 5 between the upper measuring head 3 and the lower measuring head 4, and a reflective mechanism 6 at the bottom of the indicator 503. The measuring component 5 allows the user to conveniently detect the parallelism of the two measuring surfaces of the measuring head, and the reflective mechanism 6 allows the user to conveniently observe the pointer changes on the dial of the indicator 503 in real time during the detection process.

[0031] like Figure 2 and Figure 3 As shown, the measuring assembly 5 includes an indicator 503 disposed between the upper measuring head 3 and the lower measuring head 4. A detection probe 504 is provided at the bottom of the indicator 503. A detection rod 506 is connected to the detection probe 504. The indicator 503 is provided with a first connector 501. The detection rod 506 is provided with a second connector 507. Detection balls 502 are rotatably installed at the inner edges of the first connector 501 and the second connector 507. A micrometer head 505 is provided on the detection rod 506. Rotation grooves are opened inside the first connector 501 and the second connector 507. The detection balls 502 are rotatably installed in the first connector 501 and the second connector 507 respectively through the rotation grooves.

[0032] Specifically, when using this device, firstly, the first connector 501 needs to be connected to the upper measuring head 3 of the micrometer body 1, and then the second connector 507 needs to be connected to the lower measuring head 4. Ensure that the detection ball 502 on the connector is in close contact with the surface of the measuring head. Next, the operator can rotate the detection rod 506. When the detection rod 506 is rotated, the detection ball 502 will roll along the edge of the measuring head surface. The detection probe 504, when compressed or stretched under force, undergoes slight changes, causing a change in the pointer angular displacement of the indicator. If the two surfaces of the measuring head are not parallel, the detection ball 502, during the detection process, will contact different points on the two planes, causing the pointer of the indicator 503 to swing. The specific value can be read intuitively through the pointer deflection on the indicator 503, thus facilitating the user's judgment of the parallelism of the two planes of the measuring head. Furthermore, by rotating the micrometer head 505, the distance between the first connector 501 and the second connector 507 can be adjusted, thus adapting to micrometers of different sizes and greatly increasing the applicability and flexibility of the device.

[0033] like Figure 4 As shown, the reflecting mechanism 6 includes a connecting seat 601 fixedly installed at the bottom of the indicator 503. A rotating arm 605 is rotatably installed on the connecting seat 601. A mounting frame 606 is rotatably installed at the end of the rotating arm 605. A reflector 607 is fixedly installed on the mounting frame 606. Mounting holes 602 are provided on both the connecting seat 601 and the mounting frame 606. Movable shafts 603 are fixedly installed at both ends of the rotating arm 605. Resistance rubber rings 604 are sleeved on the movable shafts 603. A slot is provided on the mounting frame 606. The reflector 607 is installed on the mounting frame 606 through the slot.

[0034] Specifically, by adjusting the movable shaft 603, the rotating arm 605 and the mounting frame 606 can be flexibly adjusted in angle to adapt to different usage needs. After the angle adjustment process of the rotating arm 605 and the mounting frame 606 is completed, the resistance rubber ring 604 can effectively restrict the movement of the rotating arm 605 and the mounting frame 606. In this way, the reflector 607 can be precisely adjusted to a suitable angle to ensure that it can accurately reflect the dial of the indicator 503. When the dial of the indicator 503 is rotated into the interior of the micrometer body 1, the reflector 607 becomes particularly important because it can reflect the dial of the indicator 503, allowing the user to easily observe the pointer changes on the dial of the indicator 503 in real time, thereby enabling more accurate measurement work.

[0035] Working principle: When in use, first connect the first connector 501 to the upper measuring head 3 of the micrometer body 1 and the second connector 507 to the lower measuring head 4, and make the detection ball 502 on the connector abut against the surface of the measuring head. Then, the detection rod 506 can be rotated. After rotating the detection rod 506, the detection ball 502 will roll along the edge of the measuring head surface. If the measuring head surface is not flat, the detection ball 502 will jump up and down during the rolling process. The up and down jump of the detection ball 502 can be detected by the indicator 503 and displayed by the pointer offset on the indicator 503, which makes it convenient for users to check the parallelism of the two measuring surfaces of the measuring head. Furthermore, the rotating arm 605 and the mounting frame 606 can be adjusted in angle via the movable shaft 603. After the angle adjustment of the rotating arm 605 and the mounting frame 606 is completed, the resistance rubber ring 604 can restrict the movement of the rotating arm 605 and the mounting frame 606, thereby adjusting the reflector 607 to a suitable angle. When the dial of the indicator 503 is rotated into the micrometer body 1, the reflector 607 can reflect the dial of the indicator 503, making it convenient for the user to observe the pointer changes on the dial of the indicator 503 in real time.

[0036] The above description is only a preferred embodiment of the present utility model. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present utility model, and these improvements and modifications should also be considered within the protection scope of the present utility model.

Claims

1. A parallelism measuring device for a large-size outside micrometer, comprising a micrometer body (1), wherein mounting seats (2) are provided at both ends of the micrometer body (1), an upper measuring head (3) is provided on the mounting seat (2) at one end of the micrometer body (1), and a lower measuring head (4) is provided on the mounting seat (2) at the other end of the micrometer body (1), characterized in that, A measuring component (5) is provided between the upper measuring head (3) and the lower measuring head (4).

2. The parallelism measuring device of a large-size outside diameter micrometer according to claim 1, wherein The measuring component (5) includes an indicator (503) disposed between the upper measuring head (3) and the lower measuring head (4). The bottom of the indicator (503) is provided with a detection probe (504) that produces a small change in compression or elongation after being subjected to force. The bottom of the detection probe (504) is connected to a detection rod (506). The bottom of the detection rod (506) is connected to a second connector (507). The indicator (503) is provided with a first connector (501). The first connector (501) is connected to the upper measuring head (3) on the micrometer body (1), and the second connector (507) is connected to the lower measuring head (4) on the micrometer body (1).

3. The parallelism measuring device of a large-size outside diameter micrometer according to claim 2, wherein The first connector (501) and the second connector (507) are both provided with rotating grooves at their inner edges, and detection balls (502) are rotatably mounted on the rotating grooves. The first connector (501) is connected to the surface of the upper measuring head (3) through the detection balls (502), and the second connector (507) is connected to the surface of the lower measuring head (4) through the detection balls.

4. The parallelism measuring device of a large-size outside micrometer according to claim 2 or 3, characterized in that, The detection rod (506) is equipped with a differential head (505).

5. The parallelism measuring device of a large-size outside diameter micrometer according to claim 2, wherein The indicator (503) is provided with a reflective mechanism (6) at the bottom.

6. The parallelism measuring device of a large-size outside diameter micrometer according to claim 5, wherein The reflecting mechanism (6) includes a connecting seat (601) fixedly installed at the bottom of the indicator (503), a rotating arm (605) rotatably installed on the connecting seat (601), a mounting frame (607) rotatably installed at the end of the rotating arm (605), and a reflector (606) fixedly installed on the mounting frame (607).

7. The parallelism measuring device of a large-size outside micrometer according to claim 6, wherein Both the connecting seat (601) and the mounting frame (607) are provided with mounting holes (602). Both ends of the rotating arm (605) are fixedly mounted with movable shafts (603). One end of the rotating arm (605) is rotatably mounted on the mounting hole (602) of the connecting seat (601) through the movable shaft (603), and the other end of the rotating arm (605) is rotatably mounted on the mounting hole of the mounting frame (607) through the movable shaft.

8. The parallelism measuring device of a large-size outside micrometer according to claim 7, wherein A resistance rubber ring (604) is fitted on the movable shaft (603).

9. The parallelism measuring device of a large-size outside micrometer according to claim 6, wherein The mounting frame (607) has a slot, and the reflector (606) is mounted on the mounting frame (607) through the slot.

Images